CN110672935B - Method, device, equipment and storage medium for diagnosing turnout failure indication fault - Google Patents
Method, device, equipment and storage medium for diagnosing turnout failure indication fault Download PDFInfo
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- CN110672935B CN110672935B CN201910853303.0A CN201910853303A CN110672935B CN 110672935 B CN110672935 B CN 110672935B CN 201910853303 A CN201910853303 A CN 201910853303A CN 110672935 B CN110672935 B CN 110672935B
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- 238000003745 diagnosis Methods 0.000 abstract description 6
- 238000013024 troubleshooting Methods 0.000 abstract description 2
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- G—PHYSICS
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B61—RAILWAYS
- B61L—GUIDING RAILWAY TRAFFIC; ENSURING THE SAFETY OF RAILWAY TRAFFIC
- B61L23/00—Control, warning or like safety means along the route or between vehicles or trains
- B61L23/04—Control, warning or like safety means along the route or between vehicles or trains for monitoring the mechanical state of the route
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0092—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring current only
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2632—Circuits therefor for testing diodes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
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Abstract
The embodiment of the disclosure provides a diagnosis method, a diagnosis device, equipment and a storage medium for turnout failure indication faults. The method comprises the following steps: acquiring turnout indication circuit current information of a turnout indication circuit current collector; and determining the fault type of the turnout loss indication according to the conditions of the half-wave current curve in the turnout indication circuit current information after the state conversion of the turnout is started and finished. In this way, the fault type of the turnout can be determined quickly and accurately, and the workload of troubleshooting is greatly reduced.
Description
Technical Field
Embodiments of the present disclosure relate generally to the field of rail transit technology, and more particularly, to a method, apparatus, device, and storage medium for diagnosing a turnout failure indication fault.
Background
In rail transit, switches enable trains to switch from one track to another. The switch conversion is controlled by an interlocking system, and the interlocking system drives the switch conversion by controlling the rotation of the point switch. The indication function of the turnout is that after the turnout is converted in place, the position information of the turnout is reflected to an interlocking system through a series of mechanical and electrical devices and control combinations, so that the train route arrangement is realized, and the normal operation of the rail transit is ensured. Once the function is lost, or the loss is indicated, four switches, a switch is squeezed and the like, the condition that the switch is unknown cannot be confirmed, the access is invalid, the train cannot continue to operate, and otherwise, the risk of switching off the track exists.
The indication of the failure is caused by various reasons, under the condition that the electrical equipment is normal, the main reason is the notch of the card, the main phenomenon is that the position of the notch of the indication rod is abnormal, and the indication contact group of the automatic switch cannot be connected, and the reasons comprise that a turnout is not locked or the depth of a static contact of the automatic switch driven into a movable contact is insufficient.
At present, the fault of the notch of the card is mainly judged by rotating a current curve, after the conversion of the alternating current turnout is finished, the current curve has a small step, if the small step is not existed, the failure indication is shown, but the failure indication fault can indicate that the branch circuit of the circuit diode is open-circuit except the notch of the card, so that the fault reason can not be judged only by rotating the current curve. Further, the indication circuit diode branch of the switch is located in the HZ24 box beside the rail, and the notch is located in the switch machine, so that it is impossible to determine whether the cause of the failure is a stuck notch or an indication circuit diode branch is open, which increases the workload of the inspection.
Disclosure of Invention
According to the embodiment of the disclosure, a diagnosis method and a diagnosis device for turnout failure indication faults are provided.
In a first aspect of the present disclosure, there is provided a method for diagnosing a turnout failure indication fault, comprising: acquiring turnout indication circuit current information of a turnout indication circuit current collector; and determining the fault type of the turnout loss indication according to the conditions of the half-wave current curve in the turnout indication circuit current information after the state conversion of the turnout is started and finished.
The above aspect and any possible implementation further provides an implementation in which the switch indication circuit current information includes: the transformer outputs current, flip diode branch current, positioning diode branch current and flip relay branch current.
The above-described aspect and any possible implementation further provides an implementation in which the transition state includes a switch from the locating state to the inverted state or a switch from the inverted state to the locating state.
The above-described aspect and any possible implementation manner further provide an implementation manner, where determining a fault type indicated by a turnout failure according to an occurrence condition of a half-wave current curve in the turnout indication circuit current information after a state transition of the turnout is started and completed includes: when the state conversion of the turnout starts, if a half-wave current curve exists in the transformer output current and the flip diode branch current, and after the state conversion of the turnout is completed, the half-wave current curve does not exist in the transformer output current and the flip diode branch current, the fault type indicated by the turnout failure is a switching and withdrawing machine card gap.
The above-described aspect and any possible implementation manner further provide an implementation manner, where determining a fault type indicated by a turnout failure according to an occurrence condition of a half-wave current curve in the turnout indication circuit current information after a state transition of the turnout is started and completed includes: when the state conversion of the turnout starts, if the half-wave current curve does not exist in the output current of the transformer and the inverted diode branch current, the fault type indicated by the turnout failure is diode open circuit.
The above-described aspect and any possible implementation manner further provide an implementation manner, where determining a fault type indicated by a turnout failure according to an occurrence condition of a half-wave current curve in the turnout indication circuit current information after a state transition of the turnout is started and completed includes: when the state conversion of the turnout starts, if the transformer output current, the inverted diode branch current and the inverted relay branch current all have half-wave current curves, and the sum of the amplitude of the half-wave current curve of the inverted diode branch current and the amplitude of the half-wave current curve of the inverted relay branch current is equal to the amplitude of the half-wave current curve of the transformer output current, the turnout failure indicates no fault.
The above-described aspect and any possible implementation manner further provide an implementation manner, where determining a fault type indicated by a turnout failure according to an occurrence condition of a half-wave current curve in the turnout indication circuit current information after a state transition of the turnout is started and completed includes: when the state conversion of the turnout starts, if the transformer output current and the flip diode branch current both have half-wave current curves, and after the state conversion of the turnout is completed, the transformer output current and the positioning diode branch current both have half-wave current curves, the turnout failure indicates no fault.
In a second aspect of the present disclosure, there is provided a diagnosis device for a turnout failure indication fault, comprising: the acquisition module is used for acquiring the turnout indication circuit current information of the turnout indication circuit current collector; and the determining module is used for determining the fault type of the turnout failure indication according to the conditions of the half-wave current curve in the turnout indication circuit current information after the state conversion of the turnout is started and finished.
In a third aspect of the present disclosure, there is provided a diagnostic apparatus for a switch failure indication fault, comprising a memory, a processor and a computer program stored on the memory and executable on the processor, the processor implementing the method according to the first aspect when executing the program.
In a fourth aspect of the present disclosure, a storage medium is provided, on which a computer program is stored, which program, when being executed by a processor, carries out the method according to the first aspect.
It should be understood that the statements herein reciting aspects are not intended to limit the critical or essential features of the embodiments of the present disclosure, nor are they intended to limit the scope of the present disclosure. Other features of the present disclosure will become apparent from the following description.
Drawings
The above and other features, advantages and aspects of various embodiments of the present disclosure will become more apparent by referring to the following detailed description when taken in conjunction with the accompanying drawings. In the drawings, like or similar reference characters designate like or similar elements, and wherein:
FIG. 1 illustrates a schematic diagram of an exemplary operating environment in which embodiments of the present disclosure can be implemented;
fig. 2 illustrates a switch back bit representation principle and current collection point schematic according to an embodiment of the present disclosure;
figure 3 illustrates a switch positioning representation principle and current collection point schematic according to an embodiment of the present disclosure;
FIG. 4 illustrates a flow chart of a method of diagnosing a turnout failure indication fault according to an embodiment of the present disclosure;
FIG. 5 illustrates a block diagram of a diagnostic device for a turnout loss indication fault according to an embodiment of the present disclosure;
FIG. 6 illustrates a block diagram of an exemplary electronic device capable of implementing embodiments of the present disclosure.
Detailed Description
To make the objects, technical solutions and advantages of the embodiments of the present disclosure more clear, the technical solutions of the embodiments of the present disclosure will be described clearly and completely with reference to the drawings in the embodiments of the present disclosure, and it is obvious that the described embodiments are some, but not all embodiments of the present disclosure. All other embodiments, which can be derived by a person skilled in the art from the embodiments disclosed herein without making any creative effort, shall fall within the protection scope of the present disclosure.
In addition, the term "and/or" herein is only one kind of association relationship describing an associated object, and means that there may be three kinds of relationships, for example, a and/or B, which may mean: a exists alone, A and B exist simultaneously, and B exists alone. In addition, the character "/" herein generally indicates that the former and latter related objects are in an "or" relationship.
FIG. 1 illustrates a schematic diagram of an exemplary operating environment 100 in which embodiments of the present disclosure can be implemented. Included in the operating environment 100 are MSS station machines 101 and switch indication circuit current collectors 103. MSS station machine 101 is connected to switch indication circuit current collector 103 through MSS cabinet 102. The turnout indication circuit current collector 103 is used for collecting indication circuit current information of the turnout. Although only one switch indicating circuit current collector 103 is shown in fig. 1, multiple switch indicating circuit current collectors 103 may be included in the operating environment 100.
The switch indication circuit current collector 103 collects the switch indication circuit current information and sends the collected information to the MSS station machine 101 through the MSS cabinet 102. The turnout indication circuit current information comprises transformer output current, flip diode branch current, positioning diode branch current and flip relay branch current.
The MSS station machine 101 detects whether a half-wave current curve exists in the switch indication circuit current information, and determines the fault type of switch failure indication according to the condition of the half-wave current curve after the switching state of the switch is started or completed.
Although in fig. 1, the switch indication circuit current collector 103 is used to collect the transformer output current, the flip diode branch current, the positioning diode branch current, and the flip relay branch current, the present disclosure is not limited thereto. In other embodiments of the present disclosure, the switch indication circuit current collector 103 may be a plurality of independent collectors, and is configured to collect the transformer output current, the flip diode branch current, the positioning diode branch current, and the flip relay branch current, respectively.
Taking the flip-bit representation principle and the current collection point schematic diagram, the positioning representation principle and the current collection point schematic diagram of a five-wire system ZD (J) -9 switch (hereinafter referred to as a switch) as an example, the switch machine is used for a railway electric centralized station yard and can be used for changing the opening direction of a turnout, locking a turnout switch rail and reflecting the position state of the turnout switch rail. The ball screw is adopted for speed reduction, so that the device has the characteristic of high efficiency; the motor adopts a three-phase alternating current 380V power supply, the single-core control distance of the cable is long, and the failure rate is low; the contact system adopts a beryllium bronze static contact group and a copper-tungsten alloy movable contact ring, the extending rod piece is rustproof by chrome plating, and the extending part is supported and dustproof by a polyethylene hole plugging ring and an oil felt dustproof ring. Each performance index meets the switching requirements of the turnout and other turnouts in the speed-up section.
Fig. 2 illustrates a switch back bit representation principle and current collection point schematic according to an embodiment of the disclosure.
Referring to fig. 2, the switch back indicates that there are two branches in the circuit, and assuming that the output current at the terminal 3 of the transformer BD1-7 is positive, the branch of the back relay is: BD1-7 pin 3 → R1/1-2 → 1DQJ 22-21 → 2DQJ 131-133 → FBJ pin 1-4 → collection point FJZ → X5 → 41-42 → V1-V2 → W2-W1 → X1 → collection point BB → 1DQJ 11-12 → BD1-7 pin 4; the flip diode branch circuit is as follows: BD1-7 pin 3 → R1\ 1-2 → 1DQJ 22-21 → 2DQJ 131-133 → 1DQJ 22-21 → 2DQJ 124-123 → collection point FEZ → X3 → 23-24 → 45-46 → R2\ 1-2 → Z2-1 → U1-U2 → W2-W1 → X1 → collection point BB → 1DQJ 11-12 → BD1-7 pin 4.
Wherein BB is a transformer collecting point, FEZ is a flip diode branch collecting point, FJZ is a flip relay branch collecting point, 23, 24, 25 and 26 are second power connection group connection points of the automatic switch, 41, 42, 45 and 46 are fourth connection group connection points of the automatic switch, BD1-7 is a transformer, and FBJ is a flip relay.
Fig. 3 illustrates a switch positioning representation principle and a current collection point schematic according to an embodiment of the disclosure.
Referring to fig. 3, the switch positioning indicates that there are two branches in the circuit, and assuming that the output current at the terminal 3 of the transformer BD1-7 is positive, the relay branch is positioned as follows: BD1-7 pin 3 → R1\ 1-2 → 1DQJ 22-21 → 2DQJ 131-132 → DBJ pin 4-1 → point of collection DJZ → X4 → 11-12 → V1-V2 → W2-W1 → X1 → point of collection BB → 1DQJ 11-12 → BD1-7 pin 4; the positioning diode branch circuit is: BD1-7 pin 3 → R1\ 1-2 → 1DQJ 22-21 → 2DQJ 131-132 → 1DQJ 22-21 → 2DQJ 124-123 → collection point DEZ → X2 → 33-34 → 15-16 → Z2-1 → R2\ 2-1 → U1-U2 → W2-W1 → X1 → collection point BB → 1DQJ 11-12 → BD1-7 pin 4.
Wherein BB is a transformer acquisition point, DEZ is a positioning diode branch acquisition point, DJZ is a positioning relay branch acquisition point, 11, 12, 15 and 16 are first contact group contacts of an automatic switch, 33, 34, 35 and 36 are third contact group contacts of the automatic switch, BD1-7 is a transformer, and DBJ is a positioning indicating relay.
When the switch machine starts to rotate from a reverse state to a positioning state, 1DQJ ℃, < 1 > DQJF ℃, < 2DQJ in the relay control circuit is not shifted, a three-phase power supply is connected into an X1 terminal, an X2 terminal and an X3 terminal of the switch machine, at the moment, a second contact group and a fourth contact group of the automatic switch of the switch machine are closed, a diode is connected into the circuit from a path X3 → 3 → 23-24 → 45-46 → 8, and at the moment, a current waveform of an X1 terminal (namely a waveform of a transformer output current) and a current waveform of an X3 terminal (namely a waveform of a reverse diode branch current) are collected.
After the switch is turned from the reverse state to the positioning state, the first contact group of the automatic switch is firstly switched on, if the third contact group is switched on in place, the diode is switched in the circuit from X2 → 2 → 33 to 34 → 15 to 16 → 7 because the control circuit is not switched off, and at the moment, the current waveform of the X1 terminal (namely the waveform of the output current of the transformer) and the current waveform of the X2 terminal (namely the waveform of the branch current of the positioning diode) are collected.
With continued reference to fig. 2, when the switch starts to rotate from the inverted state to the positioned state, the second winding 4 of the transformer is assumed to be the output end. In the diode branch, when the X1 terminal is positive voltage, the diode is conductive, and when the X1 terminal is negative voltage, the diode is non-conductive, and since the voltage applied to the transformer is alternating current, a half-wave current curve can be detected at the X1 terminal and the X3 terminal.
With continued reference to fig. 3, after the switch is turned from the inverted state to the positioned state, it is assumed that the second winding 4 of the transformer is the output end. In the diode branch, if the X1 terminal is positive, the diode is not conducting, no current passes at the X2 terminal, and if the X1 terminal is negative, the diode is conducting, and a half-wave current curve can be detected at the X2 terminal.
The process of the switch from the positioning state to the inversion state is similar to the process from the inversion state to the positioning state, and the only difference is that the positive and negative of the half-wave current curve are different, which is not described herein again.
FIG. 4 illustrates a flow chart of a method 400 of diagnosing a turnout failure indication fault according to an embodiment of the present disclosure. As shown in fig. 4, the method 400 includes the steps of:
in step 401, the MSS station machine 101 obtains the current information of the switch indication circuit collected by the switch indication circuit current collector 103.
The turnout indication circuit current information comprises transformer output current, flip diode branch current, positioning diode branch current and flip relay branch current which are obtained by respectively carrying out current acquisition on an acquisition point BB, an acquisition point FEZ, an acquisition point DEZ and an acquisition point FJZ of the turnout indication circuit by the turnout indication circuit current acquisition device 103.
In step 402, the MSS station 101 determines the type of fault indicated by a switch failure according to the occurrence of the half-wave current curve in the switch indication circuit current information at the start and after completion of the state transition of the switch.
The state conversion of the turnout comprises the conversion of the turnout from a positioning state to a reverse state or the conversion from the reverse state to the positioning state.
In some embodiments, when the state transition of the switch starts, if the half-wave current curves exist in both the transformer output current and the flip diode branch current, and after the state transition of the switch is completed, the half-wave current curves do not exist in both the transformer output current and the positioning diode branch current, the fault type indicated by the switch failure is a switch card gap.
After the turnout is converted from the inverted state to the positioning state, namely after the switch is rotated from the inverted state to the positioning state, if the output current of the transformer (namely the current at the X1 terminal) and the branch current of the positioning diode (namely the current at the X2 terminal) do not detect a half-wave current curve, the switch is in fault, and the fault type of the switch comprises a diode open circuit or a switch card gap; when the switch is switched from the inverted state to the positioning state, namely when the switch is switched from the inverted state to the positioning state, the transformer output current (namely the current at the X1 terminal) and the inverted diode branch current (namely the current at the X3 terminal) both detect a half-wave current curve, and then the diode in the diode branch has no fault, so that the fault type indicated by the switch failure can be judged to be a switch card gap.
In some embodiments, at the beginning of the state transition of the switch, if no half-wave current curve exists in the transformer output current and the flip diode branch current, the fault type indicated by the switch failure is a diode open circuit.
When the switch is started to be switched from the reverse state to the locating state, namely when the switch machine is started to be rotated from the reverse state to the locating state, if the output current of the transformer (namely the current at the X1 terminal) and the reverse diode branch current (namely the current at the X3 terminal) do not detect a half-wave current curve, the diode in the diode branch is broken, and therefore, the fault type indicated by the switch failure can be judged to be the diode breaking.
In some embodiments, when the state transition of the turnout begins, if a half-wave current curve exists in the transformer output current, the flip diode branch current and the flip relay branch current, and the sum of the amplitude of the half-wave current curve of the flip diode branch current and the amplitude of the half-wave current curve of the flip relay branch current is equal to the amplitude of the half-wave current curve of the transformer output current, the diode is free of fault.
When the switch starts to switch from the inverted state to the locating state, namely when the switch machine starts to rotate from the inverted state to the locating state, if the transformer output current (namely the current at the X1 terminal), the inverted diode branch current (namely the current at the X3 terminal) and the inverted relay branch current (namely the current at the X5 terminal) detect a half-wave current curve, and the sum of the amplitude of the half-wave current curve of the inverted diode branch current (namely the current at the X3 terminal) and the amplitude of the half-wave current curve of the inverted relay branch current (namely the current at the X5 terminal) is equal to the amplitude of the half-wave current curve of the transformer output current (namely the current at the X1 terminal), the diode is free of fault.
It should be noted that, when the diode is turned on, the impedance of the diode branch becomes small, and the current of the relay branch also becomes small, and at this time, the current at the terminal X1 is a superposition of the diode branch current (i.e., the current at the terminal X3) and the relay branch current (i.e., the current at the terminal X5).
In some embodiments, when the state transition of the switch starts, if both the transformer output current and the flip diode branch current have a half-wave current curve, and after the state transition of the switch is completed, both the transformer output current and the positioning diode branch current have a half-wave current curve, then there is no fault.
When the switch starts to switch from the inverted state to the locating state, that is, when the switch starts to rotate from the inverted state to the locating state, if the transformer output current (i.e., the current at the terminal X1) and the inverted diode branch current (i.e., the current at the terminal X3) detect a half-wave current curve, and after the switch finishes switching from the inverted state to the locating state, that is, after the switch finishes rotating from the inverted state to the locating state, the transformer output current (i.e., the current at the terminal X1) and the locating diode branch current (i.e., the current at the terminal X2) detect a half-wave current curve, then there is no fault.
According to the embodiment of the disclosure, the turnout indication circuit current information of the turnout indication circuit current collector is obtained, whether a half-wave current curve exists in the turnout indication circuit current information is detected, and the fault type of turnout failure indication is determined according to the condition of the half-wave current curve after the switching state of the turnout is started or completed, so that the fault type of the turnout can be determined quickly and accurately, and the workload of troubleshooting is greatly reduced.
It is noted that while for simplicity of explanation, the foregoing method embodiments have been described as a series of acts or combination of acts, it will be appreciated by those skilled in the art that the present disclosure is not limited by the order of acts, as some steps may, in accordance with the present disclosure, occur in other orders and concurrently. Further, those skilled in the art should also appreciate that the embodiments described in the specification are exemplary embodiments and that acts and modules referred to are not necessarily required by the disclosure.
The above is a description of embodiments of the method, and the embodiments of the apparatus are further described below.
Fig. 5 shows a schematic configuration diagram of a diagnosis device for a turnout loss indication fault according to an embodiment of the present disclosure. As shown in fig. 5, the apparatus includes:
the obtaining module 501 is configured to obtain the current information of the turnout indication circuit current collector.
The state conversion comprises the rotation from the positioning state to the inversion state or the rotation from the inversion state to the positioning state.
And the determining module 503 is configured to determine the fault type indicated by the switch failure according to the occurrence condition of the half-wave current curve in the switch indicating circuit current information after the state transition of the switch is started and completed.
In some embodiments, the determining module 503 is specifically configured to determine that the fault type indicated by the switch failure is a switch card gap if both the transformer output current and the flip diode branch current have a half-wave current curve and both the transformer output current and the flip diode branch current do not have a half-wave current curve after the state transition of the switch is completed when the state transition of the switch starts.
In some embodiments, the determining module 503 is specifically configured to determine that the fault type indicated by the switch failure is a diode open circuit if the half-wave current curve does not exist in the transformer output current and the flip diode branch current at the start of the state transition of the switch.
In some embodiments, the determining module 503 is specifically configured to determine that the switch indicates that the diode in the circuit is not faulty if the half-wave current curve exists in the transformer output current, the flip diode branch current and the flip relay branch current, and the sum of the amplitude of the half-wave current curve of the flip diode branch current and the amplitude of the half-wave current curve of the flip relay branch current is equal to the amplitude of the half-wave current curve of the transformer output current when the state transition of the switch starts.
In some embodiments, the determining module 503 is specifically configured to determine that there is no fault when the state transition of the switch starts, if both the transformer output current and the flip diode branch current have a half-wave current curve, and after the state transition of the switch is completed, both the transformer output current and the positioning diode branch current have a half-wave current curve.
It can be clearly understood by those skilled in the art that, for convenience and brevity of description, the specific working process of the described module may refer to the corresponding process in the foregoing method embodiment, and is not described herein again.
FIG. 6 illustrates a block diagram of an exemplary electronic device capable of implementing embodiments of the present disclosure. As shown, device 600 includes a Central Processing Unit (CPU)601 that may perform various appropriate actions and processes in accordance with computer program instructions stored in a Read Only Memory (ROM)602 or loaded from a storage unit 608 into a Random Access Memory (RAM) 603. In the RAM603, various programs and data necessary for the operation of the device 600 can also be stored. The CPU 601, ROM 602, and RAM603 are connected to each other via a bus 604. An input/output (I/O) interface 605 is also connected to bus 604.
A number of components in the device 600 are connected to the I/O interface 605, including: an input unit 606 such as a keyboard, a mouse, or the like; an output unit 607 such as various types of displays, speakers, and the like; a storage unit 608, such as a magnetic disk, optical disk, or the like; and a communication unit 609 such as a network card, modem, wireless communication transceiver, etc. The communication unit 609 allows the device 600 to exchange information/data with other devices via a computer network such as the internet and/or various telecommunication networks.
The processing unit 601 performs the various methods and processes described above, such as the method 400. For example, in some embodiments, the method 400 may be implemented as a computer software program tangibly embodied in a machine-readable medium, such as the storage unit 608. In some embodiments, part or all of the computer program may be loaded and/or installed onto the device 600 via the ROM 602 and/or the communication unit 609. The method 400 described above may be performed when a computer program is loaded into the RAM603 and executed by the CPU 601. Alternatively, in other embodiments, CPU 601 may be configured to perform method 400 by any other suitable means (e.g., by way of firmware).
The functions described herein above may be performed, at least in part, by one or more hardware logic components. For example, without limitation, exemplary types of hardware logic components that may be used include: a Field Programmable Gate Array (FPGA), an Application Specific Integrated Circuit (ASIC), an Application Specific Standard Product (ASSP), a system on a chip (SOC), a load programmable logic device (CPLD), and the like.
Program code for implementing the methods of the present disclosure may be written in any combination of one or more programming languages. These program codes may be provided to a processor or controller of a general purpose computer, special purpose computer, or other programmable data processing apparatus, such that the program codes, when executed by the processor or controller, cause the functions/operations specified in the flowchart and/or block diagram to be performed. The program code may execute entirely on the machine, partly on the machine, as a stand-alone software package partly on the machine and partly on a remote machine or entirely on the remote machine or server.
In the context of this disclosure, a machine-readable medium may be a tangible medium that can contain, or store a program for use by or in connection with an instruction execution system, apparatus, or device. The machine-readable medium may be a machine-readable signal medium or a machine-readable storage medium. A machine-readable medium may include, but is not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any suitable combination of the foregoing. More specific examples of a machine-readable storage medium would include an electrical connection based on one or more wires, a portable computer diskette, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.
Further, while operations are depicted in a particular order, this should be understood as requiring that such operations be performed in the particular order shown or in sequential order, or that all illustrated operations be performed, to achieve desirable results. Under certain circumstances, multitasking and parallel processing may be advantageous. Likewise, while several specific implementation details are included in the above discussion, these should not be construed as limitations on the scope of the disclosure. Certain features that are described in the context of separate embodiments can also be implemented in combination in a single implementation. Conversely, various features that are described in the context of a single implementation can also be implemented in multiple implementations separately or in any suitable subcombination.
Although the subject matter has been described in language specific to structural features and/or methodological acts, it is to be understood that the subject matter defined in the appended claims is not necessarily limited to the specific features or acts described above. Rather, the specific features and acts described above are disclosed as example forms of implementing the claims.
Claims (6)
1. A method of diagnosing a turnout failure indication fault, comprising:
acquiring turnout indication circuit current information of a turnout indication circuit current collector; the switch indication circuit current information includes: the transformer outputs current, flip diode branch current, positioning diode branch current and flip relay branch current;
determining the fault type of turnout failure indication according to the conditions of the half-wave current curve in the turnout indication circuit current information after the state conversion of the turnout is started and completed; the state conversion comprises the conversion of the turnout from a positioning state to a reverse state or the conversion from the reverse state to the positioning state; the process of converting from the positioning state to the inversion state is only different from the process of converting from the inversion state to the positioning state in that the positive and negative of the half-wave current curve are different;
the current collectors are independent current collectors and are used for respectively collecting the output current of the transformer, the reverse position diode branch current, the positioning diode branch current and the reverse position relay branch current;
the method for determining the fault type of turnout failure indication according to the conditions of the half-wave current curve in the turnout indication circuit current information after the state conversion of the turnout is started and completed comprises the following steps:
when the state conversion of the turnout starts, if a half-wave current curve exists in the transformer output current and the flip diode branch current, and after the state conversion of the turnout is completed, the half-wave current curve does not exist in the transformer output current and the flip diode branch current, the fault type indicated by the turnout failure is a switch card gap;
the method for determining the fault type of turnout failure indication according to the conditions of the half-wave current curve in the turnout indication circuit current information after the state conversion of the turnout is started and completed comprises the following steps:
when the state conversion of the turnout starts, if the half-wave current curve does not exist in the output current of the transformer and the inverted diode branch current, the fault type indicated by the turnout failure is diode open circuit.
2. The method of claim 1, wherein determining the type of fault indicated by a switch failure based on the presence of a half-wave current curve in the switch indicating circuit current information after the state transition of the switch has been initiated and completed comprises:
when the state conversion of the turnout starts, if the transformer output current, the inverted diode branch current and the inverted relay branch current all have half-wave current curves, and the sum of the amplitude of the half-wave current curve of the inverted diode branch current and the amplitude of the half-wave current curve of the inverted relay branch current is equal to the amplitude of the half-wave current curve of the transformer output current, the diode has no fault.
3. The method of claim 1, wherein determining the type of fault indicated by a switch failure based on the presence of a half-wave current curve in the switch indicating circuit current information after the state transition of the switch has been initiated and completed comprises:
when the state conversion of the turnout starts, if the half-wave current curves exist in the transformer output current and the flip diode branch current, and after the state conversion of the turnout is completed, the half-wave current curves exist in the transformer output current and the positioning diode branch current, and no fault exists.
4. A diagnostic device for a turnout failure indication fault, comprising:
the acquisition module is used for acquiring the turnout indication circuit current information of the turnout indication circuit current collector; the switch indication circuit current information includes: the transformer outputs current, flip diode branch current, positioning diode branch current and flip relay branch current;
the determining module is used for determining the fault type of turnout failure indication according to the conditions of the half-wave current curve in the turnout indication circuit current information after the state conversion of the turnout is started and completed; the state conversion comprises the conversion of the turnout from a positioning state to a reverse state or the conversion from the reverse state to the positioning state; the process of converting the positioning state to the inversion state is only different from the process of converting the inversion state to the positioning state in that the positive and negative of the half-wave current curve are different; the current collectors are independent current collectors and are used for respectively collecting the output current of the transformer, the reverse position diode branch current, the positioning diode branch current and the reverse position relay branch current;
the method for determining the fault type of turnout failure indication according to the conditions of the half-wave current curve in the turnout indication circuit current information after the state conversion of the turnout is started and completed comprises the following steps:
when the state conversion of the turnout starts, if a half-wave current curve exists in the transformer output current and the flip diode branch current, and after the state conversion of the turnout is completed, the half-wave current curve does not exist in the transformer output current and the flip diode branch current, the fault type indicated by the turnout failure is a switch card gap;
the method for determining the fault type of turnout failure indication according to the conditions of the half-wave current curve in the turnout indication circuit current information after the state conversion of the turnout is started and completed comprises the following steps:
when the state conversion of the turnout starts, if the half-wave current curve does not exist in the output current of the transformer and the inverted diode branch current, the fault type indicated by the turnout failure is diode open circuit.
5. A diagnostic apparatus for a switch failure indication fault comprising a memory, a processor and a computer program stored on the memory and executable on the processor, wherein the processor when executing the program implements a method as claimed in any one of claims 1 to 3.
6. A storage medium on which a computer program is stored, which program, when being executed by a processor, carries out the method according to any one of claims 1 to 3.
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| CN111645721A (en) * | 2020-04-30 | 2020-09-11 | 浙江大学 | Switch machine point rail position monitoring system with redundant configuration and switch machine |
| CN113534013B (en) * | 2021-07-27 | 2024-02-27 | 北京全路通信信号研究设计院集团有限公司 | Method, device and storage medium for predicting switch machine wiring faults |
| CN113933703B (en) * | 2021-09-23 | 2024-04-26 | 交控科技股份有限公司 | Switch machine power acquisition system, method, object controller and storage medium |
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