CN110658474A - Method and device for reducing dynamic impedance test error - Google Patents
Method and device for reducing dynamic impedance test error Download PDFInfo
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- CN110658474A CN110658474A CN201910842347.3A CN201910842347A CN110658474A CN 110658474 A CN110658474 A CN 110658474A CN 201910842347 A CN201910842347 A CN 201910842347A CN 110658474 A CN110658474 A CN 110658474A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
- G01R31/389—Measuring internal impedance, internal conductance or related variables
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0425—Test clips, e.g. for IC's
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
- Y02E60/10—Energy storage using batteries
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Abstract
The invention provides a device for reducing dynamic impedance test errors, which comprises: an insulating support frame; the first clamping piece is connected to the bottom plate of the insulating support frame; the second clamping piece is superposed on the first side above the first clamping piece and is used for being matched with the first clamping piece so as to clamp a tab of the battery to be tested; and the second side of the first clamping piece is provided with a third clamping piece and/or a fixing hole for providing a fixing point for dynamic impedance testing equipment or charging and discharging equipment. The battery dynamic impedance testing device comprises a first clamping piece, a second clamping piece, a third clamping piece and/or a fixing hole, wherein the first clamping piece and the second clamping piece are fixed on the first clamping piece, the third clamping piece and/or the fixing hole are fixed on the second clamping piece, and the third clamping piece and/or the fixing hole are fixed on the second clamping piece.
Description
Technical Field
The invention relates to the technical field of lithium ion batteries, in particular to a method and a device for reducing dynamic impedance test errors.
Background
The lithium ion battery has the obvious advantages of low energy consumption, high specific capacity and specific energy, high working voltage, environmental friendliness, good cycle performance, long service life and the like, and is widely applied to portable electronic equipment such as notebook computers, mobile phones, cameras and the like. In order to research the performance degradation mechanism, cycle life prediction, health state evaluation and the like of the lithium ion battery, parameters of the lithium ion battery in the operation process are often required to be tested, wherein a dynamic impedance spectrum is gradually adopted by researchers as a new research means.
In the dynamic impedance spectrum testing process, because the number of connecting circuits is large, the sizes of the contact resistors are uncertain, the sizes of the contact resistors are inconsistent, the error of the testing result is large, the practical application of the contact resistors is influenced, and the problem needs to be solved urgently.
Disclosure of Invention
In view of this, the invention provides a device and a method for reducing dynamic impedance test errors, and aims to solve the problem of overlarge measurement errors caused by inconsistent contact resistances at various positions of a connecting line in the dynamic impedance test process of the conventional battery.
In one aspect, the present invention provides an apparatus for reducing dynamic impedance test errors, comprising: an insulating support frame; the first clamping piece is connected to the bottom plate of the insulating support frame; the second clamping piece is superposed on the first side above the first clamping piece and is used for being matched with the first clamping piece so as to clamp a tab of the battery to be tested; and the second side of the first clamping piece is provided with a third clamping piece and/or a fixing hole for providing a fixing point for dynamic impedance testing equipment or charging and discharging equipment.
Further, in the above apparatus for reducing the dynamic impedance test error, the number of the third clamping pieces is plural, and each of the third clamping pieces is disposed at a position on the first clamping piece close to the first end at intervals along the vertical direction, so as to provide a clamping point for the dynamic impedance test equipment or the charging and discharging equipment.
Furthermore, in the above apparatus for reducing the dynamic impedance test error, the number of the fixing holes is multiple, and each fixing hole is disposed at a position on the first clamping piece close to the second end at intervals, so as to provide a connection point for the charging and discharging device or the dynamic impedance test device.
Furthermore, in the above device for reducing the dynamic impedance test error, a fastening member is disposed above the second clamping piece on the insulating support frame for pressing the second clamping piece.
Further, in the above apparatus for reducing dynamic impedance test error, the insulating support frame includes: a bottom plate, a top plate and two side plates; the two side plates are oppositely arranged on two sides of the bottom plate;
the roof is connected on two the top of curb plate, the roof is located the first side of first clamping piece and is located directly over the second clamping piece.
Further, in the above apparatus for reducing the dynamic impedance test error, the first clamping piece, the second clamping piece and the third clamping piece are all copper sheets.
In the invention, the battery to be tested is fixed through the first clamping piece and the second clamping piece, and the charging and discharging equipment or the dynamic impedance testing equipment is fixed through the third clamping piece and/or the fixing hole so as to determine the relative positions of the battery to be tested, the charging and discharging equipment and the dynamic impedance testing equipment, so that the contact resistance of the battery to be tested, which is connected with each equipment in the dynamic impedance test, is a determined value, the error of the dynamic impedance test of the battery is effectively reduced, and the accuracy and reliability of the dynamic impedance test result of the battery are improved. In addition, the device has the advantages of strong operability, small occupied volume, simple structure, easy processing and lower cost.
On the other hand, the invention also provides a method for reducing the dynamic impedance test error, which comprises the following steps: step 1, integrating charging and discharging equipment, dynamic impedance testing equipment and a battery to be tested on a device for reducing dynamic impedance testing errors; step 2, setting parameters of the charging and discharging equipment and the dynamic impedance testing equipment, starting testing, and measuring the common dynamic impedance data of the battery to be tested, the device for reducing the dynamic impedance testing error and each contact resistor; step 3, after the test is finished, detaching the battery to be tested, and connecting the simulation battery to the device for reducing the dynamic impedance test error in a position and mode of connecting the battery to be tested; step 4, setting parameters of each device in the same parameter setting mode as the step 2, starting testing, and measuring the common dynamic impedance data of the simulated battery, the device for reducing the dynamic impedance test error and each contact resistor; step 5, subtracting the resistance value of the standard resistor in the analog battery according to the data obtained in the step 4 to obtain the common resistance value of the device for reducing the dynamic impedance test error and each contact resistor; and 6, subtracting the common resistance value of the device for reducing the dynamic impedance test error and each contact resistor from the data in the step 2 to obtain the dynamic impedance of the battery to be tested.
Further, in the method for reducing the dynamic impedance test error, the dynamic impedance data in step 2 and step 4 are both the real part of the measured dynamic impedance curve.
Further, in the method for reducing the dynamic impedance test error, the analog battery is formed by connecting a standard resistor and a standard capacitor in parallel.
Further, in the method for reducing the dynamic impedance test error, the apparatus for reducing the dynamic impedance test error includes: an insulating support frame; the first clamping piece is laid on the bottom plate of the insulating support frame;
the second clamping piece is superposed on the first side above the first clamping piece and is used for being matched with the first clamping piece so as to clamp a tab of the battery to be tested; and a third clamping piece and/or a fixing hole are/is arranged on the second side above the first clamping piece and used for providing a fixing point for dynamic impedance testing equipment or charging and discharging equipment.
The method for reducing the dynamic impedance test error fixes the relative positions of the battery, the charge and discharge equipment and the dynamic impedance test equipment, fixes the contact resistance of the battery to be tested, which is connected with each equipment in the dynamic impedance test, and obtains the common resistance value of each test equipment and each contact resistance by utilizing the standard resistance calculation, thereby correcting the test result.
Drawings
Various other advantages and benefits will become apparent to those of ordinary skill in the art upon reading the following detailed description of the preferred embodiments. The drawings are only for purposes of illustrating the preferred embodiments and are not to be construed as limiting the invention. Also, like reference numerals are used to refer to like parts throughout the drawings. In the drawings:
FIG. 1 is a front view of an apparatus for reducing dynamic impedance test errors according to an embodiment of the present invention;
FIG. 2 is a left side view of an apparatus for reducing dynamic impedance test errors according to an embodiment of the present invention;
FIG. 3 is a top view of an apparatus for reducing dynamic impedance testing errors according to an embodiment of the present invention;
fig. 4 is a flowchart of a method for reducing dynamic impedance test errors according to an embodiment of the present invention.
Detailed Description
Exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. While exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be embodied in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art. It should be noted that the embodiments and features of the embodiments may be combined with each other without conflict. The present invention will be described in detail below with reference to the embodiments with reference to the attached drawings.
The embodiment of the device is as follows:
referring to fig. 1 to 3, the apparatus for reducing dynamic impedance test error according to the embodiment of the present invention includes: the clamping device comprises an insulating support frame 4, a first clamping piece 1 and a second clamping piece 2; wherein, the first clamping piece 1 is connected to the bottom plate 41 of the insulating support frame 4, and the second clamping piece 2 is superposed on the first side (the front side shown in fig. 1) above the first clamping piece 1 for cooperating with the first clamping piece 1 to clamp the tab of the battery to be tested; the second side (the rear side shown in fig. 1) of the first jaw 1 is provided with a third jaw 3 and/or a fixing hole 5 to provide a fixing point for a dynamic impedance testing device or a charging and discharging device. The first side and the second side in this embodiment are disposed opposite to each other.
Specifically, the insulating support frame 4 may be a door-shaped frame with a flat plate structure at the bottom, and the first clamping piece 1 may be bolted to the bottom plate 41 of the insulating support frame 4, and in practice, the first clamping piece 1 may just cover the bottom plate 41.
The second clamping piece 2 can be folded to the first side of the first clamping piece 1, and is used for cooperating with the first clamping piece 1 to clamp the tab of the battery to be tested under the action of the fastener, in practice, the insulating support frame 4 is arranged above the second clamping piece 2 and is provided with the fastener 6 for compressing the second clamping piece 2, and the corresponding position of the second clamping piece 2 is provided with a mounting hole which can be composed of a circular hole part and a chamfer surface arranged above the circular hole, for example, a chamfer angle of 45 degrees, so that the fastener 6 can be inserted and fastened.
The insulating support frame 4 includes: a bottom plate 41, a top plate 43 and two side plates 42; wherein, the two side plates 42 are oppositely arranged at two sides of the bottom plate 41; a top plate 43 is attached to the top ends of the two side plates 42, the top plate 43 being located on a first side (the front side as viewed in fig. 3) of the first jaw 1 and directly above the second jaw 2. The top plate 43 is provided with a connecting hole for passing the fastener 6. The bottom plate 41 and the top plate 43 may be rectangular plates, and the side plates may be square plates, wherein the length of the bottom plate 41 may be greater than that of the top plate 43, the width of the side plates and the top plate may be uniform, and the thickness of the bottom plate 41, the thickness of the side plates 42, and the thickness of the top plate 43 may be uniform.
The third clamping piece 3 can provide a clamping point for a charging and discharging instrument or a dynamic impedance device with a clamp and fix
The holes 5 may provide fastening points for the copper terminals of the charge and discharge meter or the dynamic impedance device. The second side of the first clamping piece 1 is provided with a third clamping piece 3 and/or a fixing hole, that is, the third clamping piece 3 or the fixing hole can be only arranged on the second side of the first clamping piece 1, or both the third clamping piece 3 and the fixing hole can be arranged on the second side of the first clamping piece 1, so that the clamping device is suitable for a charging and discharging instrument with a clamp or a copper terminal and a dynamic impedance device with a clamp or a copper terminal. The device for reducing the dynamic impedance test error provided by this embodiment should be provided with at least three connection points to connect the battery, the charging and discharging device and the dynamic impedance test device, the first clamping piece 1 and the second clamping piece 2 provide a connection point together, each third clamping piece 3 provides a connection point for the charging and discharging device or the dynamic impedance test device, and each fixing hole 5 provides a connection point for the excitation power line of the charging and discharging device or the dynamic impedance test device, in practice, for the connection point of the charging and discharging device or the dynamic impedance test device, two third clamping pieces 3 or two fixing holes 5 or one third clamping piece 3 and one fixing hole 5 may be provided.
In practice, the number of the third clamping pieces 3 may be multiple, and each third clamping piece 3 is disposed at a position on the first clamping piece 1 close to the first end (the left end shown in fig. 1) at an interval along the vertical direction, so as to provide a clamping point for the dynamic impedance testing device or the charging and discharging device.
The fixing holes 5 may be a plurality of fixing holes, and each fixing hole 5 is disposed at a position on the first clamping piece 1 near the second end (the right end shown in fig. 1) at intervals to provide a connection point for a charging and discharging device or a dynamic impedance testing device. Namely: when the second side of first clamping piece 1 had both been provided with third clamping piece 3, was provided with fixed orifices 5 again and when third clamping piece 3 and fixed orifices 5 were a plurality ofly, each third clamping piece 3 was close to the first end setting of first clamping piece 1, and each fixed orifices 5 was close to the second end setting of first clamping piece 1. In order to connect each test equipment and control each contact resistance, each third clamping piece 3 is equidistant, and each fixed orifices 5 is equidistant. Wherein, the fixed orifices 5 can be holes with internal threads, the aperture of each fixed orifice 5 can be determined according to the size of the wiring part of the equipment connected as required, and the apertures of each fixed orifice 5 can be the same or different. In this embodiment, the first clip piece 1, the second clip piece 2, and the third clip piece 3 are all copper sheets. The size of each clamping piece can be determined according to actual conditions. In this embodiment, the contact resistance includes the resistance of the battery-to-device contact portion and the resistance of the dynamic impedance device-to-device contact portion.
When the dynamic impedance test is actually performed, two devices for reducing the dynamic impedance test error provided by the embodiment can be selected to respectively fix the positive and negative electrode connectors of the corresponding equipment.
The above obviously shows that, the device for reducing the dynamic impedance test error provided in this embodiment fixes the battery to be tested through the first clamping piece and the second clamping piece, and fixes the charging and discharging device or the dynamic impedance test device through the third clamping piece and/or the fixing hole, so as to determine the relative positions of the battery to be tested, the charging and discharging device, and the dynamic impedance test device, so that the contact resistance of the battery to be tested, which is connected with each device in the dynamic impedance test, is a determined value, thereby effectively reducing the error of the dynamic impedance test of the battery, and improving the accuracy and reliability of the dynamic impedance test result of the battery. In addition, the device has the advantages of strong operability, small occupied volume, simple structure, easy processing and lower cost.
The method comprises the following steps:
referring to fig. 4, the method for reducing the dynamic impedance test error provided by the present invention includes the following steps:
and step S1, integrating the charging and discharging equipment, the dynamic impedance testing equipment and the battery to be tested into a device for reducing the dynamic impedance testing error.
Specifically, the device for reducing the dynamic impedance test error comprises: the clamping device comprises an insulating support frame 4, a first clamping piece 1 and a second clamping piece 2; wherein, the first clamping piece 1 is connected to the bottom plate 41 of the insulating support frame 4, and the second clamping piece 2 is superposed on the first side (the front side shown in fig. 1) above the first clamping piece 1 for cooperating with the first clamping piece 1 to clamp the tab of the battery to be tested; the second side (the rear side shown in fig. 1) of the first jaw 1 is provided with a third jaw 3 and/or a fixing hole 5 to provide a fixing point for a dynamic impedance testing device or a charging and discharging device. The first side and the second side in this embodiment are disposed opposite to each other. The embodiments of the apparatus for reducing the dynamic impedance test error can be referred to the above embodiments of the apparatus, and are not described herein again.
And step S2, setting parameters of the charging and discharging equipment and the dynamic impedance testing equipment, starting testing, and measuring the dynamic impedance data common to the battery to be tested, the device for reducing the dynamic impedance testing error and each contact resistor.
Specifically, parameters of the charging and discharging device and the dynamic impedance testing device may be set according to experimental requirements, for example, the excitation current of the dynamic impedance testing device may be set to 3A, the battery to be tested is charged and discharged at a rate of 0.5C, and the obtained dynamic impedance data common to the battery to be tested, each of the devices, and each of the contact resistors is a real part of the measured dynamic impedance curve.
And step S3, after the test is finished, detaching the battery to be tested, and connecting the simulation battery to the device for reducing the dynamic impedance test error in a position and mode of connecting the battery to be tested.
Specifically, the analog battery is formed by connecting a standard resistor and a standard capacitor in parallel.
Step S4 is to set parameters of each device in the same parameter setting manner as in step S2, start a test, and measure dynamic impedance data common to the simulated battery, the device for reducing dynamic impedance test error, and each contact resistor.
Specifically, when a device for reducing dynamic impedance test errors is used for connecting a battery to be tested and a simulation battery, the moment is kept consistent; the connecting part should be conductive, and the obtained dynamic impedance data common to the simulated battery, each piece of equipment and each contact resistor is the real part of the measured dynamic impedance curve. Since the ac impedance spectrum is generally analyzed by an equivalent circuit, in which the contact resistance part belongs to a part of the ohmic internal resistance, the pure resistance has only a real part, and the imaginary part is 0, the contact resistance affects only the data of the real part, and does not affect the data of the imaginary part, and thus, the dynamic impedance data in steps S2 and S4 is the data of the real part of the measured dynamic impedance curve.
And step S5, subtracting the resistance value of the standard resistor in the simulated battery according to the data obtained in the step S4 to obtain the common resistance value of the device for reducing the dynamic impedance test error and each contact resistor.
Specifically, the data obtained in step S4 is the real part data of the intersection with the real axis extracted from the dynamic impedance curve.
And step S6, subtracting the device for reducing the dynamic impedance test error and the common resistance value of each contact resistor from the data in the step S2 to obtain the dynamic impedance of the battery to be tested.
The invention is illustrated in detail below by means of a specific example:
(1) fixing the ternary lithium ion battery, the charging and discharging equipment and the dynamic impedance testing equipment on a device for reducing the dynamic impedance testing error in a bolt mode;
(2) setting parameters of a charge-discharge instrument, charging and discharging the battery at a multiplying power of 0.5C, simultaneously setting parameters of a dynamic impedance tester, wherein the exciting current is 3A, and when the SOC of the battery reaches 50%, carrying out dynamic impedance test to obtain a group of dynamic impedance real part data { a } of the batterynWhere n is the length of the array;
(3) after the test is finished, the ternary lithium ion battery is detached from the device for reducing the dynamic impedance test error, and the standard resistor of the analog battery (formed by connecting the standard resistor and the standard capacitor in parallel) is connected to the device in a position and mode of connecting the battery to be tested;
(4) setting the same parameters as those in the step (2), starting the test, and measuring a group of data { b) of the real dynamic impedance part of the batterynExtracting a real part Rs of an intersection point of the real part Rs and a real axis, wherein n is a sequence length curve;
(5) subtracting the standard resistor according to the data Rs in the step (4) to obtain a device for reducing the dynamic impedance test error and the resistance value R of each contact resistor;
(6) subtracting the resistance value R obtained in the step (5) from the data in the step (2) to obtain the modified real dynamic impedance part data { a) of the batteryn' where n is the length of the sequence.
The method for reducing the dynamic impedance test error fixes the relative positions of the battery, the charge and discharge equipment and the dynamic impedance test equipment, fixes the contact resistance of the battery to be tested, which is connected with each equipment in the dynamic impedance test, and obtains the common resistance value of each test equipment and each contact resistance by utilizing the standard resistance calculation, thereby correcting the test result.
It will be apparent to those skilled in the art that various changes and modifications may be made in the present invention without departing from the spirit and scope of the invention. Thus, if such modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalents, the present invention is also intended to include such modifications and variations.
Claims (10)
1. An apparatus for reducing dynamic impedance test error, comprising:
an insulating support frame;
the first clamping piece is connected to the bottom plate of the insulating support frame;
the second clamping piece is superposed on the first side above the first clamping piece and is used for being matched with the first clamping piece so as to clamp a tab of the battery to be tested;
and the second side of the first clamping piece is provided with a third clamping piece and/or a fixing hole for providing a fixing point for dynamic impedance testing equipment or charging and discharging equipment.
2. The apparatus for reducing the dynamic impedance test error of claim 1, wherein the third clamping pieces are disposed at intervals along the vertical direction on the first clamping piece near the first end for providing a clamping point for the dynamic impedance test device or the charging and discharging device.
3. The apparatus for reducing dynamic impedance test error of claim 2,
the fixing holes are arranged on the first clamping piece at intervals and close to the second end, and are used for providing connection points for charging and discharging equipment or dynamic impedance testing equipment.
4. The apparatus for reducing dynamic impedance testing errors of claim 1 wherein the insulating support frame is provided with a fastener above the second clip for compressing the second clip.
5. The apparatus for reducing dynamic impedance test error of claim 1, wherein the insulating support frame comprises: a bottom plate, a top plate and two side plates; wherein the content of the first and second substances,
the two side plates are oppositely arranged on two sides of the bottom plate;
the roof is connected on two the top of curb plate, the roof is located the first side of first clamping piece and is located directly over the second clamping piece.
6. The apparatus for reducing dynamic impedance test errors of claim 1 wherein the first, second and third clips are copper sheets.
7. A method for reducing dynamic impedance test errors, comprising the steps of:
step 1, integrating charging and discharging equipment, dynamic impedance testing equipment and a battery to be tested on a device for reducing dynamic impedance testing errors;
step 2, setting parameters of the charging and discharging equipment and the dynamic impedance testing equipment, starting testing, and measuring the common dynamic impedance data of the battery to be tested, the device for reducing the dynamic impedance testing error and each contact resistor;
step 3, after the test is finished, detaching the battery to be tested, and connecting the simulation battery to the device for reducing the dynamic impedance test error in a position and mode of connecting the battery to be tested;
step 4, setting parameters of each device in the same parameter setting mode as the step 2, starting testing, and measuring the common dynamic impedance data of the simulated battery, the device for reducing the dynamic impedance test error and each contact resistor;
step 5, subtracting the resistance value of the standard resistor in the analog battery according to the data obtained in the step 4 to obtain the common resistance value of the device for reducing the dynamic impedance test error and each contact resistor;
and 6, subtracting the common resistance value of the device for reducing the dynamic impedance test error and each contact resistor from the data in the step 2 to obtain the dynamic impedance of the battery to be tested.
8. The method for reducing the dynamic impedance test error of claim 7, wherein the dynamic impedance data in step 2 and step 4 are both the real part of the measured dynamic impedance curve.
9. The method for reducing the dynamic impedance test error of claim 7, wherein the analog battery is composed of a standard resistor and a standard capacitor connected in parallel.
10. The method of reducing dynamic impedance test error of claim 7, wherein the means for reducing dynamic impedance test error comprises:
an insulating support frame;
the first clamping piece is laid on the bottom plate of the insulating support frame;
the second clamping piece is superposed on the first side above the first clamping piece and is used for being matched with the first clamping piece so as to clamp a tab of the battery to be tested;
and a third clamping piece and/or a fixing hole are/is arranged on the second side above the first clamping piece and used for providing a fixing point for dynamic impedance testing equipment or charging and discharging equipment.
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