CN110656236A - Defect control method for laser scoring of surface of high-magnetic-induction oriented silicon steel - Google Patents
Defect control method for laser scoring of surface of high-magnetic-induction oriented silicon steel Download PDFInfo
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- CN110656236A CN110656236A CN201810682985.9A CN201810682985A CN110656236A CN 110656236 A CN110656236 A CN 110656236A CN 201810682985 A CN201810682985 A CN 201810682985A CN 110656236 A CN110656236 A CN 110656236A
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- C—CHEMISTRY; METALLURGY
- C21—METALLURGY OF IRON
- C21D—MODIFYING THE PHYSICAL STRUCTURE OF FERROUS METALS; GENERAL DEVICES FOR HEAT TREATMENT OF FERROUS OR NON-FERROUS METALS OR ALLOYS; MAKING METAL MALLEABLE, e.g. BY DECARBURISATION OR TEMPERING
- C21D11/00—Process control or regulation for heat treatments
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- C—CHEMISTRY; METALLURGY
- C21—METALLURGY OF IRON
- C21D—MODIFYING THE PHYSICAL STRUCTURE OF FERROUS METALS; GENERAL DEVICES FOR HEAT TREATMENT OF FERROUS OR NON-FERROUS METALS OR ALLOYS; MAKING METAL MALLEABLE, e.g. BY DECARBURISATION OR TEMPERING
- C21D1/00—General methods or devices for heat treatment, e.g. annealing, hardening, quenching or tempering
- C21D1/04—General methods or devices for heat treatment, e.g. annealing, hardening, quenching or tempering with simultaneous application of supersonic waves, magnetic or electric fields
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- C—CHEMISTRY; METALLURGY
- C21—METALLURGY OF IRON
- C21D—MODIFYING THE PHYSICAL STRUCTURE OF FERROUS METALS; GENERAL DEVICES FOR HEAT TREATMENT OF FERROUS OR NON-FERROUS METALS OR ALLOYS; MAKING METAL MALLEABLE, e.g. BY DECARBURISATION OR TEMPERING
- C21D1/00—General methods or devices for heat treatment, e.g. annealing, hardening, quenching or tempering
- C21D1/06—Surface hardening
- C21D1/09—Surface hardening by direct application of electrical or wave energy; by particle radiation
Abstract
The invention discloses a defect control method for laser scoring of the surface of high magnetic induction grain-oriented silicon steel, which comprises the following steps: selecting a camera with corresponding resolution according to requirements, and adjusting the imaging angle and the object distance of the camera to ensure that the notch imaging is clear; photographing the surface of the scored strip steel by a camera, and acquiring each scoring length; calculating the current average etching loss rate through a unit L1 system; and judging the poor defect grade of the cutting line according to the calculated average cutting loss rate. The method has accurate judgment and identification conditions, completely replaces manual intervention control, and has obvious advantages in judgment accuracy, objectivity and adjustment timeliness compared with the prior manual control.
Description
Technical Field
The invention relates to laser scoring of the surface of high magnetic induction oriented silicon steel, in particular to a defect control method for laser scoring of the surface of high magnetic induction oriented silicon steel.
Background
The laser scoring technology is characterized in that optical devices (such as a plane mirror, a concave mirror, a collimating mirror, a focusing mirror and the like) are utilized (and corresponding auxiliary equipment is equipped, such as an air compressor, a dust remover, a cooler and the like), non-parallel light output by a laser is integrated and focused, the energy of the non-parallel light is highly concentrated, the shaped laser beam is used for instantly heating and cooling strip steel by utilizing the laser heat effect at the same interval in the direction vertical to the rolling direction of the strip steel, local thermal stress tensile stress and pressure stress are formed in a laser scanning area, the width of a main magnetic domain is reduced and refined by the stress effect, under the action of an external alternating electromagnetic field, the eddy current loss of the silicon steel sheet in the direction vertical to the magnetic domain is reduced according to the electromagnetic induction law, and the macroscopic expression shows that the iron loss value of the silicon steel sheet is reduced, so that the.
The problems existing in the prior art are as follows:
1. practice tests prove that if the insulating coating film on the surface of the silicon steel surface material has obvious etching damage traces (coating damage, nick defect for short) after laser irradiation, the corrosion resistance of an etching damage area is obviously reduced, the interlayer resistance of the laminated silicon steel surface material is greatly reduced, and the huge risk of breakdown exists after the transformer is manufactured;
2. the silicon steel material bottom layer (magnesium silicate bottom layer formed in the high-temperature annealing process) has the defects of uniformly distributed watermarks, poor bottom layer, crystal exposure and the like in the transverse direction of the surface of the strip steel due to the difference of the length direction and the width direction of the strip steel during the high-temperature process annealing process due to the process characteristics, and the defects are different in black and white degree and bottom layer thickness. The dark part absorbs heat seriously, and the insulation coating and the bottom layer are damaged because the dark part cannot bear high power in the laser scoring scanning process, and the light part easily reflects the laser and absorbs relatively less heat, so that the scoring improvement effect is not obvious.
3. There is significant hysteresis and feasibility with manual intervention. Because the regularity of the distribution of the defects on the surface of the strip steel is not strong, the adjustment is carried out after the surface defects are manually identified, on one hand, the adjustment is delayed, more importantly, due to the difference of defect judgment among people, the expected effect is difficult to effectively achieve, the overall operation stability of the system is low, the controlled degree is low, and the stability of the process is not facilitated. On the other hand, due to the artificial characteristics, there may be a possibility that the power is reduced to the lower limit to maintain the production.
Disclosure of Invention
The invention aims to provide a defect control method for laser scoring of the surface of high-magnetic-induction oriented silicon steel, which is characterized in that the defect of poor scoring is avoided by establishing online active feedback control, combining surface data and a process database, detecting and feeding back according to online surface quality according to an online real-time surface monitoring system and automatically adaptively adjusting process parameters.
A defect control method for laser scoring of the surface of high magnetic induction oriented silicon steel comprises the following steps:
A. selecting a camera with corresponding resolution according to requirements, and adjusting the imaging angle and the object distance of the camera to ensure that the notch imaging is clear;
B. photographing the surface of the scored strip steel by a camera, and acquiring each scoring length;
C. calculating the current average etching loss rate through a unit L1 system;
D. and judging the poor defect grade of the cutting line according to the calculated average cutting loss rate.
The calculation formula of the pre-average etching loss rate is as follows:
An＝(∑Wm)/mW0*100％，
in the formula (I), the compound is shown in the specification,
Wmdetecting the etching length of the mth etching line in the feedback period;
W0the original width of the strip steel;
n: the nth detection feedback period, a natural constant;
An: and the average etching loss rate of the nth detection feedback period.
The method for judging the poor defect grade of the score line comprises the following steps:
when the average etching loss rate is 0-10%, the material grade is 1 grade, and the material can be supplied;
when the average etching loss rate is 10-25%, the material grade is 2 grade, and the material can be supplied;
when the average etching loss rate is 25-40%, the physical grade is 3 grade, and degradation treatment is performed;
when the average scratch rate is 40-100%, the real object grade is 4 grade, and the goods can not be delivered.
And E, online adjustment feedback processing:
starting feedback control and setting the next notch power according to the following formula:
Pn+1＝Pn×(1-(An-0.25)/10)
Pn: detecting the laser power input in the nth detection period;
Pn+1: detecting the laser power after feedback adjustment for the nth time;
An: and the average etching loss rate of the nth detection feedback period.
The starting feedback control specifically comprises the following steps:
when A isnWhen the rate is more than or equal to 40 percent, starting feedback control, increasing the subscript n by 1 every time of adjustment, continuing to detect and adjust after running for 200m, repeating the steps, and accumulating AnIf the value is reduced by less than 5%, stopping the adjustment, and withdrawing the laser scoring operation;
when 40% is more than or equal to AnWhen the rate is more than or equal to 25 percent, starting feedback control, increasing the subscript n by 1 every time of adjustment, continuing to detect and adjust after running for 200m, and repeating the steps until An<25％；
When 25% is more than or equal to An and more than or equal to 10%, the unit normally produces according to the current power, and feedback control is not started;
when An is less than or equal to 10 percent, starting feedback control, increasing the subscript n by 1 every time of adjustment, continuing to detect and adjust after running for 200m, and repeating the steps until AnFeedback was stopped > 10%.
By adopting the technical scheme of the invention, the judgment and identification conditions are accurate, manual intervention control is completely replaced, and the judgment accuracy, objectivity and adjustment timeliness of the judgment are obviously superior to those of the prior manual control.
Drawings
In the present invention, like reference numerals refer to like features throughout, wherein:
FIG. 1 is a schematic diagram of a camera arrangement of the present invention;
fig. 2 is a schematic diagram of the scratch length after the camera of the present invention shoots.
Detailed Description
The technical scheme of the invention is further explained by combining the drawings and the embodiment.
The invention discloses a defect control method for laser scoring of the surface of high magnetic induction grain-oriented silicon steel, which specifically comprises the following steps:
firstly, the camera can accurately identify the defect of poor surface scoring line, namely, the optical angle of the camera is tested under the condition of the existing camera, the camera can accurately analyze the current poor scoring grade (the grade is also the standard grade for the release in factories) of the surface of the strip steel, the first grade and the second grade can be directly delivered for use, and the defect that the defect cannot be directly released to users when the defect exceeds the third grade or more.
The first step is as follows: determining bright field imaging or dark field imaging
And under the condition of keeping the resolution (the transverse resolution: 0.25mm/pixel and the longitudinal resolution: 0.25mm/pixel) unchanged, judging to adopt bright field imaging or dark field imaging according to pictures under different imaging angles.
For example: under the test parameter conditions shown in table 1, the detection effect of the notch defect under the bright field condition (the included angle between the light source and the normal is 20 degrees, and the included angle between the camera and the normal is 20 degrees) can be judged to be the best by detecting the poor condition of the surface notch and reflecting the detection effect under different conditions, as shown in fig. 1 and table 1, in fig. 1, 1 is strip steel, 2 is the normal, 3 is an incident light source, 4 is the camera, H is the object distance, alpha is the included angle between the camera and the normal, and beta is the included angle between the light source and the normal.
TABLE 1Bright and dark field imaging conditions
The second step is that: determining transverse longitudinal resolution and object distance
Under the condition that the angle of the light source of the camera is fixed (the included angle between the light source and the normal is 20 degrees, and the included angle between the camera and the normal is 20 degrees), the transverse resolution and the longitudinal resolution are changed, and image acquisition is carried out.
And (4) test conclusion: under the bright field angle (the included angle between the light source and the normal is 20 degrees, and the included angle between the camera and the normal is 20 degrees), when the longitudinal resolution is 0.04mm/pixel, the 2-level and 3-level nicks can be clearly detected.
As the longitudinal resolution is extremely high and reaches 0.04mm/pixel, the line frequency of the cameras reaches 60KHz according to the unit speed, 1K cameras are required to be selected, and in order to reduce the number of the cameras to control the hardware cost of the whole system, the software corrects the transverse resolution from 0.04mm to 0.4mm, and the high resolution is maintained without change in the longitudinal direction. The image effect after software correction is good, and the requirements of subsequent image processing and identification are met.
In summary, in order to ensure accurate identification of the level of the surface scoring imperfection, the following conditions can be adopted for the imaging mode:
1. and (4) bright field imaging. By adopting a bright field imaging mode, the included angle between a reference light source and a normal is 20 degrees, and the included angle between a camera and the normal is 20 degrees;
2. camera parameters. Longitudinal resolution of 0.04mm/pixel or above, transverse resolution of 0.4mm/pixel or above, and object distance of 995mm by using 1K camera or above.
The third step: surface scale damage grade discrimination standard (detection)
Photographing the surface of the scored strip steel by a camera, and acquiring each scoring length; as shown in fig. 2, a section of scored strip steel surface (strip steel running direction from left to right) is cut, the score lines are distributed perpendicular to the strip steel running direction, and the strip steel width is W0In a detection period, after the surface of the steel strip passes through the surface camera after laser scoring, m scoring lines are uniformly distributed on the surface of the steel strip in total, and the length of a dotted line in the graph is represented as a scoring length.
In the nth detection feedback period, each score line has a score loss length marked as W after detectionmAfter the value is sent to the unit L1 system, the current average damage rate An can be automatically calculated. The calculation logic is:
in the nth detection feedback period, the lengths of the m cutting lines in the period are summed and divided by m W0That is, the etching loss rate A in the nth detection feedback periodnThe calculation formula is as follows:
An＝(∑Wm)/mW0*100％
in the formula (I), the compound is shown in the specification,
Wmdetecting the etching length of the mth etching line in the feedback period;
W0the original width of the strip steel;
n: the nth detection feedback period, a natural constant;
An: and the average etching loss rate of the nth detection feedback period.
According to the existing score line poor defect judgment grade standard, the product grades are divided into 1, 2, 3 and 4 (the 1-2 grades can be directly released, the 3 grades need to be degraded, and the 4 grades can not be delivered). The etching loss rate A is calculated according to the cameranThe corresponding sample plate is compared by combining the existing release standard, the surface grade can be directly reflected by the average scratch rate, and the corresponding relation is shown in table 2:
TABLE 2 correlation between etching loss rate and grade
| Rank of | |
|
|
4 stage |
| Ratio of etching damage | ≤10％ | 10％-25％ | 25％-40％ | ＞40％ |
1. Average etching loss ratio AnWhen the content is 0-10%, the material grade is 1 grade, and the material can be supplied;
2. average etching loss ratio AnWhen the content is 10-25%, the material grade is 2 grade, and the material can be supplied;
3. average etching loss ratio AnWhen the content is 25-40%, the physical grade is 3 grade, and the degradation treatment is carried out;
4. average etching loss ratio AnAt 40-100%, the product grade is 4, and the product cannot be delivered.
Fourthly, adjusting feedback processing on line
The main reason for damaging the surface coating of the strip steel by the laser in the laser scoring process is caused by overhigh laser energy, overlong laser residence time and poor thermal shock resistance of the bottom layer of the strip steel, so the surface scoring condition is reflected mainly through online surface detection, and the laser scoring parameters are adjusted through a control system, so that the surface scoring rate is prevented from exceeding the release standard to be degraded to the maximum extent. The control logic is as follows:
1. the L1 system of the machine set automatically collects the width (W) of the strip steel0) The steel coil parameters are used as reference values;
2. setting initial laser scoring process parameters F (P, S, J, L) according to production needs and process control requirements, setting a rear machine set to carry out scoring production according to the parameters, and mainly carrying out feedback adjustment on laser power P in the scheme (note: P: power, S: scanning speed, J: defocusing amount, and L: line spacing);
3. when the surface of the steel coil after laser scoring passes through the camera, the camera detects the surface etching loss length and calculates the average etching loss rate A of the current surfacen；
An＝(∑Wm)/m W0*100％
4. The unit L1 system sends the average etching loss rate in real time when the nth detection period (the current power is P)n) Average etching loss ratio A ofnWhen a level of three or more levels is reached, feedback control is started and follows the following equationFormula for next set notch power Pn+1：
Pn+1＝Pn×(1-(An-0.25)/10)
Pn: detecting the laser power input in the nth detection period;
Pn+1: detecting the laser power after feedback adjustment for the nth time;
An: and the average etching loss rate of the nth detection feedback period.
5. The logic for starting the feedback control is (integrated control based on the magnitude of An value and combined with the judgment level):
a、Anwhen the rate is more than or equal to 40 percent, starting the feedback control of the 4 th step, increasing the subscript n by 1 every time of adjustment, continuously detecting and adjusting after running for 200m, and stopping adjustment if the cumulative An value is reduced by less than 5 percent after repeated adjustment for 5 times, and stopping the operation of laser scoring and withdrawing;
b、40％≥Anwhen the rate is more than or equal to 25 percent, starting the feedback control of the 4 th step, increasing the subscript n by 1 every time of adjustment, continuing to detect and adjust after running for 200m, and repeating the steps until An<25％；
c、25％≥AnWhen the power is more than or equal to 10%, the unit normally produces according to the current power, and does not start feedback control;
d、Anstarting the 4 th step feedback control when the rate is less than or equal to 10 percent, increasing the footmark n by 1 every time of adjustment, continuing to detect and adjust after running for 200m, and repeating the steps until AnFeedback was stopped > 10%.
Examples
The test run is carried out on a silicon steel laser scoring production line of a certain steel enterprise, two rolls of laser scoring products with the specification of 0.23mm are adopted for the test, and the feedback control result is shown in table 3;
TABLE 3 examples
From the above two experimental cases:
18847862300 after 8 times of adjustment (i.e. 8 th detection feedback period), the damage rate is reduced to 24.82%, and reaches the level 2 product control standard;
18848546400, after 5 adjustments (i.e., the 5 th detection feedback cycle), the scratch rate was reduced from 48.23% to 44.12%, which proves that the scratch rate after the large adjustments still reached the release standard, i.e., the laser scoring operation was stopped for the roll.
In conclusion, the defect control method of the invention has the advantages of accurate judgment and identification, completely replacing manual intervention control, and having obvious superiority in the accuracy, objectivity and timeliness of judgment compared with the prior manual control.
Those of ordinary skill in the art will realize that the foregoing description is illustrative of one or more embodiments of the present invention and is not intended to limit the invention thereto. Any equivalent changes, modifications and equivalents of the above-described embodiments are within the scope of the invention as defined by the appended claims, and all such equivalents are intended to fall within the true spirit and scope of the invention.
Claims (5)
1. A defect control method for laser scoring of the surface of high magnetic induction oriented silicon steel comprises the following steps:
A. selecting a camera with corresponding resolution according to requirements, and adjusting the imaging angle and the object distance of the camera to ensure that the notch imaging is clear;
B. photographing the surface of the scored strip steel by a camera, and acquiring each scoring length;
C. calculating the current average etching loss rate through a unit L1 system;
D. and judging the poor defect grade of the cutting line according to the calculated average cutting loss rate.
2. The method for controlling the defects of the laser scoring of the surface of the high magnetic induction grain-oriented silicon steel as claimed in claim 1, wherein the method comprises the following steps: the calculation formula of the pre-average etching loss rate is as follows:
An＝(∑Wm)/mW0*100％，
in the formula (I), the compound is shown in the specification,
WmexamineMeasuring the etching length of the mth etching line in the feedback period;
W0the original width of the strip steel;
n: the nth detection feedback period, a natural constant;
An: and the average etching loss rate of the nth detection feedback period.
3. The method for controlling the defects of the laser scoring of the surface of the high magnetic induction grain-oriented silicon steel as claimed in claim 1 or 2, wherein: the method for judging the poor defect grade of the score line comprises the following steps:
when the average etching loss rate is 0-10%, the material grade is 1 grade, and the material can be supplied;
when the average etching loss rate is 10-25%, the material grade is 2 grade, and the material can be supplied;
when the average etching loss rate is 25-40%, the physical grade is 3 grade, and degradation treatment is performed;
when the average scratch rate is 40-100%, the real object grade is 4 grade, and the goods can not be delivered.
4. The method for controlling the defects of the laser scoring of the surface of the high magnetic induction grain-oriented silicon steel as claimed in claim 1, wherein the method comprises the following steps: and E, online adjustment feedback processing:
starting feedback control and setting the next notch power according to the following formula:
Pn+1＝Pn×(1-(An-0.25)/10)
Pn: detecting the laser power input in the nth detection period;
Pn+1: detecting the laser power after feedback adjustment for the nth time;
An: and the average etching loss rate of the nth detection feedback period.
5. The method for controlling the defects of the laser scoring of the surface of the high magnetic induction grain-oriented silicon steel as claimed in claim 4, wherein the method comprises the following steps: the starting feedback control specifically comprises the following steps:
when A isnWhen the rate is more than or equal to 40%, starting feedback control, and adjusting the foot onceMarking n to increase by 1, running for 200m, continuing to detect and adjust, repeating the steps, and accumulating AnIf the value is reduced by less than 5%, stopping the adjustment, and withdrawing the laser scoring operation;
when 40% is more than or equal to AnWhen the rate is more than or equal to 25 percent, starting feedback control, increasing the subscript n by 1 every time of adjustment, continuing to detect and adjust after running for 200m, and repeating the steps until An<25％；
When 25% is more than or equal to An and more than or equal to 10%, the unit normally produces according to the current power, and feedback control is not started;
when An is less than or equal to 10 percent, starting feedback control, increasing the subscript n by 1 every time of adjustment, continuing to detect and adjust after running for 200m, and repeating the steps until AnFeedback was stopped > 10%.
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Application publication date: 20200107 |