CN104198494A - On-line detection system for surface defects of plate strips - Google Patents

On-line detection system for surface defects of plate strips Download PDF

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Publication number
CN104198494A
CN104198494A CN201410406716.1A CN201410406716A CN104198494A CN 104198494 A CN104198494 A CN 104198494A CN 201410406716 A CN201410406716 A CN 201410406716A CN 104198494 A CN104198494 A CN 104198494A
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CN
China
Prior art keywords
surface imperfection
video camera
strip
grabbing device
detecting system
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Pending
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CN201410406716.1A
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Chinese (zh)
Inventor
仲兆准
林张弦
田文斌
庞登怀
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SUZHOU KELANCI ELECTRONIC SCIENCE & TECHNOLOGY Co Ltd
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SUZHOU KELANCI ELECTRONIC SCIENCE & TECHNOLOGY Co Ltd
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Priority to CN201410406716.1A priority Critical patent/CN104198494A/en
Publication of CN104198494A publication Critical patent/CN104198494A/en
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Abstract

The invention discloses an on-line detection system for surface defects of plate strips. The on-line detection system for the surface defects of the plate strips comprises a surface defect grabbing device (10), a processing device, a server (30), a mass memory (40) and a console (20), wherein the surface defect grabbing device (10) comprises at least two video cameras (11) and a lighting device (12); the lighting device (12) and the video cameras (11) are arranged on the same sides of plate strips (B); at least one video camera (11) is arranged on a light path of reflection light; at least one video camera (11) is arranged in a direction which is almost parallel to incident light, and meanwhile is not arranged on the light path of the reflection light. According to the technical scheme, the on-line detection system for the surface defects of the plate strips is capable of detecting transparent defects such as severe holes, edge cracks and the like even if the plate strip production speed is relatively high and the detection environment condition is relatively poor; the detection accuracy rate reaches 100%.

Description

A kind of on-line detecting system of Strip surface imperfection
Technical field:
The present invention relates to measure the unevenness of band, in particular to a kind of on-line detecting system of Strip surface imperfection.
Background technology:
Strip is one of major product of steel and iron industry, is widely used in the products such as machinery, automobile making, building, boats and ships, electrical equipment.The quality of Strip sole mass directly affects the quality condition of corresponding product.Strip is mainly processed acquisition by rolling, yet, owing to being subject to the impact of the factors such as rolling processing technology, relevant rolling equipment, on the surface of Strip, often exist dissimilar mass defect, such as hole, pit, iron mold, be mingled with, the defect such as skin lamination, fish-scale.The existence of these defects, has affected on the one hand the aesthetics on Strip surface, and these surface imperfection also exist certain impact to the antifatigue of Strip, anticorrosive, the performance such as resistance to wear on the other hand.Then, the Related product of being produced by this class Strip just exists potential safety hazard, affects the normal use of product, and the defective of Strip quality also can be caused the damage in fame to steel production enterprise simultaneously, affects steel production enterprise development from now on.Therefore, in the process of manufacture of Strip, introduce on-line detecting system its surface quality is detected, this has very important meaning to controlling and improving its quality.
In prior art, for general Strip surface defects detection, what conventionally adopt is contactless image model recognition detection method.This detection system detects by face battle array or line-scan camera taking panel strip surface image and then to the mode that image carries out pattern classification.Wherein, adopt the detection assembling system of line-scan camera, the defect type detecting as required, lighting device adopts single light field or single details in a play not acted out on stage, but told through dialogues mostly.The general light source using is Halogen lamp LED or LED array, and the light source of this kind of lighting system and video camera are distributed in the same side of Strip, can find most of defects.But when speed of production is higher, for serious hole, the detection of pass-through type defect such as is split in limit, require Detection accuracy to reach absolutely, and some sense environmental conditions is very poor, although the speed of high-speed line smear camera can meet the demands in this case, but traditional indirect illumination mode is difficult to meet the requirement of said detecting system illumination, particularly at cold rolling sour milling train group Strip, export this class position, in the very serious situation of steam mist of oil, especially when hole is positioned at the limit portion position of Strip, single reflective lighting system is difficult to meet the requirement of defects detection illumination.
Summary of the invention:
The technical matters that the present invention solves: Strip speed is higher producing, and sense environmental conditions is when poor, even if single indirect illumination mode coordinates high-speed line smear camera to be also difficult to serious hole, limit the pass-through type defects detection such as to split out.
The invention provides following technical scheme: a kind of on-line detecting system of Strip surface imperfection, comprise surface imperfection grabbing device, the treating apparatus that the data that described surface imperfection grabbing device is captured are processed, the server being connected with described treating apparatus, the massage storage being connected with server, the control desk being connected with server, described surface imperfection grabbing device comprises video camera, lighting device, described lighting device and position for video camera are in the same side of Strip, described lighting device produces parallel rays, the quantity of described video camera is at least two, wherein at least one video camera is placed in catoptrical light path, wherein at least one video camera is placed in incident light and is close in parallel direction, and not in catoptrical light path.
The incident illumination that the light source of lighting device produces is mapped on flawless Strip surface, mirror-reflection through Strip surface, reflected light is injected in the camera of the video camera (hereinafter referred to as video camera one) being placed in reflected light light path, and reflected light distributes at the uniform-illumination of camera regional.If Strip surface zero defect or while only having two-dimensional defect, the reflected light generating through Strip mirror-reflection can not injected to be placed in and be close in parallel direction with incident light and not in the camera of the video camera in reflected light light path (hereinafter referred to as video camera two).
The principle of work of above-mentioned video camera one: if detected Strip surface defectiveness exists, reflected light is subject to the impact of defect while arriving Strip surface, to change catoptrical reflection angle or intensity of reflected light, and cause defect part and Strip background in the image that video camera one photographs to produce gray difference.For 3 D defects, will cause reflected light angle to change, it is darker than Strip background that this kind of conversion shows as defect area in image.For two-dimensional defect, although can not cause the variation of reflected light angle, because defect area is different to the absorbability of incident light, intensity of reflected light can be influenced.When defect area color is brighter than Strip background, in image, show as defect part brighter; When defect area color is darker than Strip background, in image, show as defect part darker.
The principle of work of above-mentioned video camera two: if detected Strip surface has 3 D defects to exist, catoptrical reflection angle changes, and now just has part reflected light and injects in the camera of video camera two.In image, show as Strip background for dark-coloured, defect area is light tone.
Because two and three dimensions defect on the surface of reality production tabularium material all may exist, therefore, technical scheme provided by the invention is done above-mentioned design to video camera one and video camera two with arranging of lighting device, even Strip speed is higher producing, and when sense environmental conditions is poor, technical scheme provided by the invention the pass-through type defects detection such as also can be split serious hole, limit out, reaches Detection accuracy absolutely.
As of the present invention, further illustrate, the number of described video camera is determined by the width that detects required precision and Strip.
As of the present invention preferred, the lighting source of described lighting device can be incandescent lamp, optical fiber Halogen lamp LED, xenon lamp, fluorescent light or light emitting diode.
As a further improvement on the present invention, described surface imperfection grabbing device is arranged on the above and below of Strip production line.Conventionally, at the equal defectiveness of upper and lower surface of Strip, in order the upper and lower surface of Strip to be detected, in the upper and lower of Strip, all need to place camera and lighting device, for defect is taken.
As a further improvement on the present invention, described treating apparatus is concurrent computational system, described concurrent computational system comprises the computing machine of the data of processing described surface imperfection grabbing device crawl, the image pick-up card being connected with computing machine, the quantity of described computing machine is identical with the quantity of video camera, and a computing machine is connected with a video camera.Because each video camera is all connected with a computing machine, therefore, a plurality of video cameras are collection plate strip surface image simultaneously, the computing machine being connected with video camera can be to the image Parallel Processing gathering, in the situation that guaranteeing defects detection accuracy rate, above-mentioned improvement of the present invention can further improve the online real-time detection efficiency detecting of Strip cracks of metal surface.
As a further improvement on the present invention, described surface imperfection grabbing device also comprises protective cover, and described protective cover covers whole surface imperfection grabbing device.Described protective cover comprises skin and internal layer, and described skin is an one-piece construction, covers whole surface imperfection grabbing device, and described internal layer comprises the little protective cover of a plurality of independent each video camera of covering.Because environment on Strip production line is severe, for effectively guaranteeing the long-time normal work of video camera and lighting device, be required to be these devices and mix protective cover.
Accompanying drawing explanation:
Below in conjunction with accompanying drawing, the present invention is described further:
Fig. 1 is the structural representation of the on-line detecting system of a kind of Strip surface imperfection of the present invention;
Fig. 2 is that the light that in Fig. 1, lighting device 12 is radiated at the Strip B surface of defectiveness C moves towards schematic diagram.
Symbol description in figure:
10-surface imperfection grabbing device; 11-video camera; 12-lighting device; 13-protective cover;
20-control desk;
30-server;
40-massage storage;
50-concurrent computational system;
A-Strip production line;
B-Strip;
C-Strip surface imperfection.
Embodiment:
As shown in Figure 1, an on-line detecting system for Strip surface imperfection, comprises surface imperfection grabbing device 10, concurrent computational system 50, the server 30 being connected with concurrent computational system 50, the massage storage 40 being connected with server 30, the control desk 20 being connected with server 30.
As shown in Figure 1, described surface imperfection grabbing device 10 comprises and is arranged on two CCD thermal cameras 11 of Strip production line A top, a LED lighting device 12, and described lighting device 12 produces parallel rayss.Described surface imperfection grabbing device 10 also comprises 11, one the LED lighting devices 12 of two CCD thermal cameras that are arranged on Strip production line A below.Described surface imperfection grabbing device 10 also comprises protective cover 13, and described protective cover 13 covers whole surface imperfection grabbing device 10.
As shown in Figure 2, one of them the CCD thermal camera 11 that is arranged on Strip production line A top is placed in catoptrical light path, and another video camera 11 is placed in incident light and is close in parallel direction, and not in catoptrical light path.One of them the CCD thermal camera 11 that is arranged on Strip production line A below is placed in catoptrical light path, and another video camera 11 is placed in incident light and is close in parallel direction, and not in catoptrical light path.
Described concurrent computational system 50 comprises four computing machines of processing for image, the image pick-up card being connected with every computing machine.Each CCD thermal camera 11 is connected with every image pick-up card, and every image pick-up card is connected with every computing machine.
The specific works flow process of the on-line detecting system of Strip surface imperfection of the present invention is as follows: under the cooperation of LED lighting device 12, four CCD thermal cameras 11 are the image on taking panel band B surface simultaneously and in real time, and image is sent into concurrent computational system 50, then four computing machines in concurrent computational system 50 are processed the image of each CCD thermal camera collection concurrently, use image processing algorithm and algorithm for pattern recognition to carry out Treatment Analysis to Strip B surface image, and generate corresponding testing result.The testing result generating in concurrent computational system 50 can input to server 30, and server 30 is analyzed relatively these results, thereby draws the defect C distribution situation of whole Strip B, finally the surface quality of Strip B is carried out to overall assessment.Meanwhile, the related defects C distribution situation of Strip B also will be stored in the massage storage 40 being connected with server 30, so that the inspection in later stage.
Above content is only better embodiment of the present invention, for those of ordinary skill in the art, according to thought of the present invention, all will change in specific embodiments and applications, and this description should not be construed as limitation of the present invention.

Claims (6)

1. the on-line detecting system of a Strip surface imperfection, comprise surface imperfection grabbing device (10), the treating apparatus that the data that described surface imperfection grabbing device (10) is captured are processed, the server (30) being connected with described treating apparatus, the massage storage (40) being connected with server (30), the control desk being connected with server (20), described surface imperfection grabbing device (10) comprises video camera (11), lighting device (12), it is characterized in that: described lighting device (12) and video camera (11) are positioned at the same side of Strip (B), described lighting device (12) produces parallel rays, the quantity of described video camera (11) is at least two, wherein at least one video camera (11) is placed in catoptrical light path, wherein at least one video camera (11) is placed in incident light and is close in parallel direction, and not in catoptrical light path.
2. the on-line detecting system of a kind of Strip surface imperfection as claimed in claim 1, is characterized in that: the lighting source of described lighting device (12) is incandescent lamp, optical fiber Halogen lamp LED, xenon lamp, fluorescent light or light emitting diode.
3. the on-line detecting system of a kind of Strip surface imperfection as claimed in claim 1, is characterized in that: described surface imperfection grabbing device (10) is arranged on the above and below of Strip production line (A).
4. the on-line detecting system of a kind of Strip surface imperfection as claimed in claim 1, it is characterized in that: described treating apparatus is concurrent computational system (50), described concurrent computational system (50) comprises the computing machine of the data of processing described surface imperfection grabbing device (10) crawl, the image pick-up card being connected with computing machine, the quantity of described computing machine is identical with the quantity of video camera (11), and a computing machine is connected with a video camera (11).
5. the on-line detecting system of a kind of Strip surface imperfection as described in any one in claim 1~4; it is characterized in that: described surface imperfection grabbing device (10) also comprises protective cover (13), described protective cover (13) covers whole surface imperfection grabbing device (10).
6. the on-line detecting system of a kind of Strip surface imperfection as claimed in claim 5; it is characterized in that: described protective cover (13) comprises skin and internal layer; described skin is an one-piece construction; cover whole surface imperfection grabbing device (10), described internal layer comprises the little protective cover of a plurality of each video camera of independent covering (11).
CN201410406716.1A 2014-08-18 2014-08-18 On-line detection system for surface defects of plate strips Pending CN104198494A (en)

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CN104597057A (en) * 2015-02-02 2015-05-06 东华大学 Columnar diode surface defect detection device based on machine vision
CN107478657A (en) * 2017-06-20 2017-12-15 广东工业大学 Stainless steel surfaces defect inspection method based on machine vision
CN109313140A (en) * 2016-05-30 2019-02-05 鲍勃斯脱梅克斯股份有限公司 Quality control station for sheet material element processing machine and the lighting unit for quality control station
CN110656236A (en) * 2018-06-28 2020-01-07 宝山钢铁股份有限公司 Defect control method for laser scoring of surface of high-magnetic-induction oriented silicon steel
CN112588877A (en) * 2020-12-12 2021-04-02 天津理工大学 Method and special device for reshaping surface of ultra-large ring piece
CN112924464A (en) * 2021-01-29 2021-06-08 中国重型机械研究院股份公司 Horizontal inspection device for surface of plate strip
CN117871415A (en) * 2024-03-11 2024-04-12 天津大学四川创新研究院 Exposure type structural flaw detection system and method based on parallel light source

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Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104597057A (en) * 2015-02-02 2015-05-06 东华大学 Columnar diode surface defect detection device based on machine vision
CN109313140A (en) * 2016-05-30 2019-02-05 鲍勃斯脱梅克斯股份有限公司 Quality control station for sheet material element processing machine and the lighting unit for quality control station
CN107478657A (en) * 2017-06-20 2017-12-15 广东工业大学 Stainless steel surfaces defect inspection method based on machine vision
CN110656236A (en) * 2018-06-28 2020-01-07 宝山钢铁股份有限公司 Defect control method for laser scoring of surface of high-magnetic-induction oriented silicon steel
CN112588877A (en) * 2020-12-12 2021-04-02 天津理工大学 Method and special device for reshaping surface of ultra-large ring piece
CN112924464A (en) * 2021-01-29 2021-06-08 中国重型机械研究院股份公司 Horizontal inspection device for surface of plate strip
CN117871415A (en) * 2024-03-11 2024-04-12 天津大学四川创新研究院 Exposure type structural flaw detection system and method based on parallel light source

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