CN110542845B - Multi-point withstand voltage automatic test equipment for aluminum substrate - Google Patents
Multi-point withstand voltage automatic test equipment for aluminum substrate Download PDFInfo
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- CN110542845B CN110542845B CN201910935890.8A CN201910935890A CN110542845B CN 110542845 B CN110542845 B CN 110542845B CN 201910935890 A CN201910935890 A CN 201910935890A CN 110542845 B CN110542845 B CN 110542845B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/18—Subjecting similar articles in turn to test, e.g. go/no-go tests in mass production
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Abstract
The utility model provides an aluminium base board is with withstand voltage automatic test equipment of multiple spot, includes charge structure, test base station, dust removal structure, destatics structure, withstand voltage test structure and blanking structure, charge structure sets up at test base station one end side, dust removal structure sets up and is close to charge structure department on the test base station, destatics the structure setting and lies in the one side that the charge structure was kept away from to the dust removal structure on the test base station, withstand voltage test structure sets up and lies in the one side of keeping away from destatics structure above the test base station, blanking structure sets up and keeps away from charge structure other end side at the test base station. During the withstand voltage test, the aluminum substrate to be tested is grabbed by the feeding structure and placed on the test base platform machine, after dust removal of the dust removal structure and static elimination of the static elimination structure, the aluminum substrate reaches the position of the withstand voltage test structure to be subjected to the withstand voltage test, and discharging is performed under the action of the discharging structure after the test is completed. All the structures cooperate with each other to complete the multipoint voltage withstanding test of the aluminum substrate.
Description
Technical Field
The invention relates to the field of aluminum substrates, in particular to multi-point withstand voltage automatic test equipment for an aluminum substrate.
Background
In LED product applications, it is often necessary to assemble a plurality of LEDs on a circuit substrate. The circuit substrate plays a role of bearing the LED module structure; on the other hand, it also plays a role of heat dissipation. Currently, aluminum substrates are often used as LED substrates.
The aluminum substrate is a metal-based copper-clad plate with good heat dissipation function, and a single-sided board generally comprises a three-layer structure, namely a circuit layer, an insulating layer and a metal base layer. In order to ensure that the aluminum substrate can safely and continuously work under the extreme working conditions of instantaneous overvoltage such as lightning, voltage fluctuation, opening and closing and the like, the high-voltage resistance test of the aluminum substrate is very important.
At present, a common test mode for high-voltage resistance test of an aluminum substrate is to artificially test a probe of a voltage resistance test device on a tested product back and forth point by point, and check whether a tested object is qualified, and the test mode has the following defects: 1) in the test process, the distance and the angle between the test probe and a tested product need to be controlled manually, and the operation error is large, so that the product percent of pass is influenced; 2) only one product can be tested at a time, and the testing efficiency is very low; 3) the handheld test probe is unsafe to test the product and has potential safety hazards.
Disclosure of Invention
The purpose of the invention is as follows: the invention aims to provide multi-point withstand voltage automatic test equipment for an aluminum substrate, which solves the problems of low high-voltage withstand test efficiency, potential safety hazards and the like of the aluminum substrate.
The technical scheme is as follows: the invention provides multi-point withstand voltage automatic test equipment for an aluminum substrate, which comprises a feeding structure, a test base station, a dust removal structure, a static electricity removal structure, a withstand voltage test structure and a blanking structure, wherein the feeding structure is arranged on one end side of the test base station, the dust removal structure is arranged on the test base station and close to the feeding structure, the static electricity removal structure is arranged on the test base station and positioned on one side of the dust removal structure, which is far away from the feeding structure, the withstand voltage test structure is arranged above the test base station and positioned on one side, which is far away from the static electricity removal structure, and the blanking structure is arranged on the other end side of the test base station, which is far away from the feeding structure. During the withstand voltage test, the aluminum substrate to be tested is grabbed by the feeding structure and placed on the test base platform machine, after dust removal of the dust removal structure and static elimination of the static elimination structure, the aluminum substrate reaches the position of the withstand voltage test structure to be subjected to the withstand voltage test, and discharging is performed under the action of the discharging structure after the test is completed. All the structures cooperate with each other to complete the multipoint voltage withstanding test of the aluminum substrate.
Furthermore, the feeding structure comprises a feeding fixed base plate, a first X-direction moving structure, a first Z-direction moving structure, a first rotating structure, a feeding gripper and a feeding table, the first X-direction moving structure is arranged below the feeding fixed base plate, the first Z-direction moving structure is arranged below the first X-direction moving structure, the first rotating structure is arranged below the first Z-direction moving structure, the feeding gripper is arranged below the first rotating structure, and the feeding table is located below the feeding fixed base plate. Under the combined action of the first X-direction moving structure, the first Z-direction moving structure and the first rotating structure of the feeding structure, the feeding gripper reaches the designated position of the feeding table, grips an aluminum substrate to be subjected to a pressure resistance test, which is placed on the feeding table, and places the aluminum substrate at the designated position of the test base.
Further, the test base station includes base, second X direction moving structure, mobile station, aluminium substrate anchor clamps and antistatic film, second X direction moving structure sets up on the base, the mobile station sets up on second X direction moving structure, aluminium substrate anchor clamps set up on the mobile station, antistatic film sets up at the mobile station upper surface. The aluminum substrate is placed on the mobile station and is fixed under the action of the aluminum substrate clamp. And the whole mobile station moves in the X direction under the action of the second X-direction moving structure, and continues to the next working procedure. The anti-static film is used for carrying out static isolation on the aluminum substrate, and adverse effects on a withstand voltage test caused by static generated in the moving process are prevented.
Furthermore, a first guide groove and a second guide groove are arranged on the base. The aluminum base plate clamp is matched with a guide block on a moving block in the aluminum base plate clamp for use, so that the aluminum base plate is convenient to clamp.
Further, the aluminum substrate clamp comprises a fixed block, a moving block, an air cylinder and an air cylinder fixing seat, wherein the moving block is arranged on one side of the fixed block, the air cylinder is arranged on the air cylinder fixing seat, and a plunger end of the air cylinder is connected with the moving block. Before a withstand voltage test, one end of the aluminum substrate is in contact with the fixed block, and the moving block moves towards the fixed block under the driving of the cylinder to clamp the aluminum substrate; after the withstand voltage test is finished, the moving block moves towards the direction far away from the fixed block under the driving of the air cylinder, and the aluminum substrate is loosened.
Furthermore, a first bulge is arranged on the fixing block. The clamping force to the aluminum substrate is improved.
Furthermore, a second bulge is arranged on the moving block; and a first guide block and a second guide block are further arranged at two ends of the moving block. The second bulge and the first bulge together improve the clamping force on the aluminum substrate. And the first guide block and the second guide block are matched with the first guide groove and the second guide groove on the base for use, so that the moving block can move linearly under the driving of the cylinder.
Furthermore, withstand voltage test structure includes withstand voltage test fixed baseplate, Y direction removal structure, second Z direction removal structure, second revolution mechanic and withstand voltage test pen fixed knot construct, Y direction removal structure sets up below withstand voltage test fixed baseplate, second Z direction removal structure sets up in Y direction removal structure below, second revolution mechanic sets up in second Z direction removal structure below, withstand voltage test pen fixed knot construct and sets up in second revolution mechanic below. When the mobile station fixed with the aluminum substrate moves to the position right below the voltage-withstanding test structure, the voltage-withstanding test pen arranged on the voltage-withstanding test pen fixing structure reaches the specified structure under the driving of the Y-direction moving structure, the second Z-direction moving structure and the second rotating structure, and is respectively contacted with the positive and negative welding points on the aluminum substrate, and then voltage-withstanding test is carried out.
Furthermore, an adjusting straight groove is arranged on the pressure-resistant test pen fixing structure. And adjusting the distance of the withstand voltage test pen for the aluminum substrates of different models.
Furthermore, the blanking structure comprises a blanking fixed base plate, a third X-direction moving structure, a third Z-direction moving structure, a third rotating structure, a blanking gripper, a first blanking table and a second blanking table, the third X-direction moving structure is arranged below the blanking fixed base plate, the third Z-direction moving structure is arranged below the third X-direction moving structure, the third rotating structure is arranged below the third Z-direction moving structure, the blanking gripper is arranged below the third rotating structure, and the first blanking table and the second blanking table are arranged below the blanking fixed base plate in parallel. After the pressure resistance detection is completed, the blanking gripper picks up the aluminum substrate under the common drive of the third X-direction moving structure, the third Z-direction moving structure and the third rotating structure, and places the aluminum substrate on a first blanking table for placing qualified products or a second blanking table for placing unqualified products according to the pressure resistance test result.
The technical scheme shows that the invention has the following beneficial effects: 1) the mechanization replaces the manual operation, and the continuous test improves the working efficiency and the working quality; 2) the number of operators is reduced, and the labor cost is reduced; 3) the direct contact of operators with high voltage is avoided, and the safety performance is improved.
Drawings
FIG. 1 is a perspective view of the present invention;
FIG. 2 is a perspective view of a loading structure;
FIG. 3 is a perspective view of a test station;
FIG. 4 is a left side view of the base;
FIG. 5 is a top view of the mounting block;
FIG. 6 is a perspective view of the moving block;
FIG. 7 is a perspective view of a voltage withstand test structure;
FIG. 8 is a bottom view of the pressure test pen holding structure;
fig. 9 is a perspective view of the second blanking table.
In the figure: the device comprises a feeding structure 1, a feeding fixed substrate 11, a first X-direction moving structure 12, a first Z-direction moving structure 13, a first rotating structure 14, a feeding gripper 15, a feeding table 16, a test base 2, a base 21, a first guide groove 211, a second guide groove 212, a second X-direction moving structure 22, a moving table 23, an aluminum substrate clamp 24, a fixed block 241, a first protrusion 2411, a moving block 242, a second protrusion 2421, a first guide block 2422, a second guide block 2423, a cylinder 243, a cylinder fixing seat 244, an antistatic membrane 25, a dust removing structure 3, an antistatic structure 4, a pressure-resistant test structure 5, a pressure-resistant test fixed substrate 51, a Y-direction moving structure 52, a second Z-direction moving structure 53, a second rotating structure 54, a pressure-resistant test pen fixing structure 55, an adjusting straight groove 551, a blanking structure 6, a blanking fixed substrate 61, a third X-direction moving structure 62, a third Z-direction moving structure 63, a third rotating structure 2, a test mechanism 2, a base 21, a base 23, a pressure-resistant test pen fixing structure, a cylinder fixing structure, a cylinder, a, Third revolution mechanic 64, unloading tongs 65, first unloading platform 66, second unloading platform 67, aluminium base board 7.
Detailed Description
Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the drawings are illustrative and intended to be illustrative of the invention and are not to be construed as limiting the invention.
In the description of the present invention, it is to be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "clockwise", "counterclockwise", and the like, indicate orientations and positional relationships based on those shown in the drawings, and are used only for convenience of description and simplicity of description, and do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus, are not to be considered as limiting the present invention.
Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present invention, unless otherwise specified, "a plurality" means two or more unless explicitly defined otherwise.
In the present invention, unless otherwise expressly specified or limited, the terms "mounted," "connected," "secured," and the like are to be construed broadly and can, for example, be fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood by those skilled in the art according to specific situations.
In the present invention, unless otherwise expressly stated or limited, "above" or "below" a first feature means that the first and second features are in direct contact, or that the first and second features are not in direct contact but are in contact with each other via another feature therebetween. Also, the first feature being "on," "above" and "over" the second feature includes the first feature being directly on and obliquely above the second feature, or merely indicating that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature includes the first feature being directly under and obliquely below the second feature, or simply meaning that the first feature is at a lesser elevation than the second feature.
Example one
As shown in fig. 1, the three-dimensional testing device comprises a feeding structure 1, a testing base platform 2, a dust removing structure 3, a static electricity removing structure 4, a pressure-resistant testing structure 5 and a blanking structure 6, wherein the feeding structure 1 is arranged on one end side of the testing base platform 2, the dust removing structure 3 is arranged on the testing base platform 2 and close to the feeding structure 1, the static electricity removing structure 4 is arranged on the testing base platform 2 and is positioned on one side of the dust removing structure 3 away from the feeding structure 1, the pressure-resistant testing structure 5 is arranged above the testing base platform 2 and is positioned on one side away from the static electricity removing structure 4, and the blanking structure 6 is arranged on the other end side of the testing base platform 2 away from the feeding structure 1.
As shown in fig. 2, the loading structure 1 is a perspective view, and includes a loading fixed substrate 11, a first X-direction moving structure 12, a first Z-direction moving structure 13, a first rotating structure 14, a loading gripper 15, and a loading table 16, where the first X-direction moving structure 12 is disposed below the loading fixed substrate 11, the first Z-direction moving structure 13 is disposed below the first X-direction moving structure 12, the first rotating structure 14 is disposed below the first Z-direction moving structure 13, the loading gripper 15 is disposed below the first rotating structure 14, and the loading table 16 is located below the loading fixed substrate 11.
As shown in fig. 3, the test base 2 includes a base 21, a second X-direction moving structure 22, a moving stage 23, an aluminum substrate holder 24 and an anti-static film 25, wherein the second X-direction moving structure 22 is disposed on the base 21, the moving stage 23 is disposed on the second X-direction moving structure 22, the aluminum substrate holder 24 is disposed on the moving stage 23, and the anti-static film 25 is disposed on the upper surface of the moving stage 23.
As shown in fig. 4, which is a left side view of the base 21, the base 21 is provided with a first guide groove 211 and a second guide groove 212.
The aluminum substrate clamp 24 comprises a fixed block 241, a moving block 242, an air cylinder 243 and an air cylinder fixing seat 244, wherein the moving block 242 is arranged on one side of the fixed block 241, the air cylinder 243 is arranged on the air cylinder fixing seat 244, and the plunger end of the air cylinder 243 is connected with the moving block 242.
As shown in fig. 5, which is a top view of the fixing base 241, a first protrusion 2411 is disposed on the fixing block 241.
As shown in fig. 6, a perspective view of the moving block 242 is shown, and a second protrusion 2421 is arranged on the moving block 242; a first guide block 2422 and a second guide block 2423 are further arranged at two ends of the moving block 242.
Fig. 7 is a perspective view of the pressure-resistant testing structure 5, which includes a pressure-resistant testing fixed substrate 51, a Y-direction moving structure 52, a second Z-direction moving structure 53, a second rotating structure 54, and a pressure-resistant testing pen fixing structure 55, wherein the Y-direction moving structure 52 is disposed above and below the pressure-resistant testing fixed substrate 51, the second Z-direction moving structure 53 is disposed below the Y-direction moving structure 52, the second rotating structure 54 is disposed below the second Z-direction moving structure 53, and the pressure-resistant testing pen fixing structure 55 is disposed below the second rotating structure 54.
As shown in fig. 8, a bottom view of the pressure test pen fixing structure 55 is shown, and an adjustment straight groove 551 is provided on the pressure test pen fixing structure 55.
As shown in fig. 9, the blanking structure 6 includes a blanking fixing substrate 61, a third X-direction moving structure 62, a third Z-direction moving structure 63, a third rotating structure 64, a blanking gripper 65, a first blanking table 66 and a second blanking table 67, the third X-direction moving structure 62 is disposed below the blanking fixing substrate 61, the third Z-direction moving structure 63 is disposed below the third X-direction moving structure 62, the third rotating structure 64 is disposed below the third Z-direction moving structure 63, the blanking gripper 65 is disposed below the third rotating structure 64, and the first blanking table 66 and the second blanking table 67 are disposed below the blanking fixing substrate 61 in parallel.
The foregoing is only a preferred embodiment of the present invention, and it should be noted that modifications can be made by those skilled in the art without departing from the principle of the present invention, and these modifications should also be construed as the protection scope of the present invention.
Claims (1)
1. The utility model provides an aluminium base board is with withstand voltage automatic test equipment of multiple spot which characterized in that: the testing device comprises a feeding structure (1), a testing base platform (2), a dust removing structure (3), a static electricity removing structure (4), a pressure-resistant testing structure (5) and a discharging structure (6), wherein the feeding structure (1) is arranged on one end side edge of the testing base platform (2), the dust removing structure (3) is arranged on the testing base platform (2) and is close to the feeding structure (1), the static electricity removing structure (4) is arranged on the testing base platform (2) and is positioned on one side, away from the feeding structure (1), of the dust removing structure (3), the pressure-resistant testing structure (5) is arranged above the testing base platform (2) and is positioned on one side, away from the static electricity removing structure (4), and the discharging structure (6) is arranged on the other end side edge, away from the feeding structure (1), of the testing base platform (2);
the test base (2) comprises a base (21), a second X-direction moving structure (22), a moving table (23), an aluminum substrate clamp (24) and an anti-static film (25), wherein the second X-direction moving structure (22) is arranged on the base (21), the moving table (23) is arranged on the second X-direction moving structure (22), the aluminum substrate clamp (24) is arranged on the moving table (23), and the anti-static film (25) is arranged on the upper surface of the moving table (23);
a first guide groove (211) and a second guide groove (212) are arranged on the base (21);
the aluminum substrate clamp (24) comprises a fixed block (241), a moving block (242), an air cylinder (243) and an air cylinder fixing seat (244), wherein the moving block (242) is arranged on one side of the fixed block (241), the air cylinder (243) is arranged on the air cylinder fixing seat (244), and a plunger end of the air cylinder is connected with the moving block (242);
a first bulge (2411) is arranged on the fixed block (241);
a second bulge (2421) is arranged on the moving block (242); a first guide block (2422) and a second guide block (2423) are further arranged at the two ends of the moving block (242);
the feeding structure (1) comprises a feeding fixed base plate (11), a first X-direction moving structure (12), a first Z-direction moving structure (13), a first rotating structure (14), a feeding gripper (15) and a feeding table (16), wherein the first X-direction moving structure (12) is arranged below the feeding fixed base plate (11), the first Z-direction moving structure (13) is arranged below the first X-direction moving structure (12), the first rotating structure (14) is arranged below the first Z-direction moving structure (13), the feeding gripper (15) is arranged below the first rotating structure (14), and the feeding table (16) is positioned below the feeding fixed base plate (11);
the pressure-resistant test structure (5) comprises a pressure-resistant test fixed substrate (51), a Y-direction moving structure (52), a second Z-direction moving structure (53), a second rotating structure (54) and a pressure-resistant test pen fixing structure (55), wherein the Y-direction moving structure (52) is arranged above and below the pressure-resistant test fixed substrate (51), the second Z-direction moving structure (53) is arranged below the Y-direction moving structure (52), the second rotating structure (54) is arranged below the second Z-direction moving structure (53), and the pressure-resistant test pen fixing structure (55) is arranged below the second rotating structure (54);
an adjusting straight groove (551) is arranged on the withstand voltage test pen fixing structure (55);
blanking structure (6) are including unloading fixed baseplate (61), third X direction moving structure (62), third Z direction moving structure (63), third revolution mechanic (64), unloading tongs (65), first unloading platform (66) and second unloading platform (67), third X direction moving structure (62) sets up in unloading fixed baseplate (61) below, third Z direction moving structure (63) set up in third X direction moving structure (62) below, third revolution mechanic (64) set up in third Z direction moving structure (63) below, unloading tongs (65) set up in third revolution mechanic (64) below, and first unloading platform (66) and second unloading platform (67) are located unloading fixed baseplate (61) below position side by side.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910935890.8A CN110542845B (en) | 2019-09-29 | 2019-09-29 | Multi-point withstand voltage automatic test equipment for aluminum substrate |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910935890.8A CN110542845B (en) | 2019-09-29 | 2019-09-29 | Multi-point withstand voltage automatic test equipment for aluminum substrate |
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| Publication Number | Publication Date |
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| CN110542845A CN110542845A (en) | 2019-12-06 |
| CN110542845B true CN110542845B (en) | 2022-03-25 |
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| CN201910935890.8A Active CN110542845B (en) | 2019-09-29 | 2019-09-29 | Multi-point withstand voltage automatic test equipment for aluminum substrate |
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| KR20080074559A (en) * | 2007-02-09 | 2008-08-13 | 주식회사 탑 엔지니어링 | Array tester |
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| CN107843814A (en) * | 2017-10-13 | 2018-03-27 | 乾乐欣展新材料技术（上海）有限公司 | A kind of online voltage-resisting test apparatus of aluminum-based copper-clad plate |
| CN207937559U (en) * | 2018-02-27 | 2018-10-02 | 广州市合成电子制品有限公司 | A kind of automatic testing equipment for printed circuit board |
| CN109378205A (en) * | 2018-11-26 | 2019-02-22 | 东莞市大忠电子有限公司 | A kind of the shaping test machine and its test technology of middle low-frequency transformer |
| CN208969134U (en) * | 2018-09-04 | 2019-06-11 | 东莞市诚志电子有限公司 | It is a kind of with the circuit board testing frame for destaticing dedusting function |
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2019
- 2019-09-29 CN CN201910935890.8A patent/CN110542845B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20080074559A (en) * | 2007-02-09 | 2008-08-13 | 주식회사 탑 엔지니어링 | Array tester |
| CN204731368U (en) * | 2015-04-23 | 2015-10-28 | 梅州市恒晖电子有限公司 | Rotating disc type aluminium base high-voltage testing device |
| CN107843814A (en) * | 2017-10-13 | 2018-03-27 | 乾乐欣展新材料技术（上海）有限公司 | A kind of online voltage-resisting test apparatus of aluminum-based copper-clad plate |
| CN207937559U (en) * | 2018-02-27 | 2018-10-02 | 广州市合成电子制品有限公司 | A kind of automatic testing equipment for printed circuit board |
| CN208969134U (en) * | 2018-09-04 | 2019-06-11 | 东莞市诚志电子有限公司 | It is a kind of with the circuit board testing frame for destaticing dedusting function |
| CN109378205A (en) * | 2018-11-26 | 2019-02-22 | 东莞市大忠电子有限公司 | A kind of the shaping test machine and its test technology of middle low-frequency transformer |
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| CN110542845A (en) | 2019-12-06 |
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