CN110514979A - A kind of railcar traction drive IGBT module life-span prediction method - Google Patents
A kind of railcar traction drive IGBT module life-span prediction method Download PDFInfo
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- CN110514979A CN110514979A CN201910823894.7A CN201910823894A CN110514979A CN 110514979 A CN110514979 A CN 110514979A CN 201910823894 A CN201910823894 A CN 201910823894A CN 110514979 A CN110514979 A CN 110514979A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
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Abstract
The present invention relates to a kind of power electronics reliability fields, in particular to a kind of railcar traction drive IGBT module life-span prediction method, including the following steps are included: Step 1: traction drive IGBT loss estimation model is established according to railcar traction level/braking level and motor speed n；Step 2: establishing traction drive IGBT junction temperature estimation model based on Foster equivalent thermal network model and IGBT loss；Step 3: establishing traction drive IGBT Life Prediction Model based on rain flow method and Miner linear damage accumulation theory, according to the actual traction level of railcar/braking level and motor speed n, the loss of IGBT is obtained by look-up table to predict the service life of IGBT module, IGBT module accumulated damage can effectively be calculated and predict the module life, so as to make damage alarming to it, the generation of effective trouble saving, reduces security risk, reduces economic loss.
Description
Technical field
The present invention relates to a kind of power electronics reliability field, in particular to a kind of railcar traction drive IGBT
Module life prediction technique.
Background technique
With the increase of urban track traffic operating mileage, the probability of the component malfunction on vehicle also becomes increasingly
Greatly, and since the integrated level of equipment room on city rail vehicle is higher, after some component malfunction, it is likely that cause biggish
Chain reaction, this can seriously threaten the operational safety of train.Traction drive is the key subsystem of railcar, and
Its major function is all made of power electronic system.In power electronic system, IGBT is to be easiest to impaired one of device.
However it is existing currently, being predicted without technology for the railcar traction drive IGBT module service life.
Summary of the invention
The purpose of the present invention is to provide a kind of railcar traction drive IGBT module life-span prediction methods, are based on
The method of railcar traction level/braking level and motor speed n estimation IGBT loss, to carry out the service life of IGBT module
Prediction.
To achieve the goals above, the invention provides the following technical scheme:
A kind of railcar traction drive IGBT module life-span prediction method, comprising the following steps:
Step 1: establishing traction drive IGBT damage according to railcar traction level/braking level and motor speed n
Consumption estimation model；
Step 2: establishing the estimation of traction drive IGBT junction temperature based on Foster equivalent thermal network model and IGBT loss
Model；
Step 3: establishing the traction drive IGBT service life based on rain flow method and Miner linear damage accumulation theory
Prediction model.
Further, step 1 traction drive IGBT loss estimation pattern function be according to IGBT in switch and
What the loss under on state obtained, wherein IGBT switch state consumption energy mainly with motor speed, collector current,
The factors such as IGBT junction temperature are related, function model are as follows:
Psw=f (n, IC,Tj)
Wherein, n is motor speed, ICFor collector current, TJ isIGBT junction temperature；
The conduction loss of IGBT is the function of collector current and IGBT junction temperature, function model are as follows:
Pcond=f (IC,Tj)
Wherein, ICFor collector current, TjFor IGBT junction temperature；
The loss of IGBT is the function of motor speed, collector current and IGBT junction temperature, and collector current is traction/system
The function of dynamic level and speed, so the loss of IGBT is the function of traction/braking level, motor speed and IGBT junction temperature,
Model are as follows:
P=f (level, n, Tj)
Wherein, level be traction/braking level, n be motor speed, TjFor IGBT junction temperature；
Again by a certain specific traction/braking level, motor speed and IGBT junction temperature under, derive the loss function of IGBT
Rate, function model are as follows:
Wherein, P is the loss of IGBT, and T is the stator current primitive period, and u is IGBT collector emitter voltage, and i is
IGBT collector current.
Further, the traction drive IGBT junction temperature estimation model of the step 2 is to be based on installing on cooling system
Temperature sensor obtain IGBT module shell temperature, then by Foster equivalent thermal network model and IGBT loss and establish,
In, the relationship between the junction temperature and shell temperature of IGBT are as follows:
Tj=Tc+PZth(j-c)
Wherein, Zth(j-c)It is thermal resistance of the IGBT knot to shell；
Initial time, the loss of IGBT are 0, therefore:
Tj(0)=Tc(0)
In n-th of sampling instant nTsWhen, the junction temperature of IGBT are as follows:
Tj(nTs)=Tc(nTs)+P(nTs)×Zth(j-c)
Wherein, P (nTs) be IGBT loss, be traction/braking level, motor speed n and IGBT junction temperature TjFunction, lead
Draw/brake level, motor speed n can be obtained with real-time sampling, but the junction temperature T of IGBTjIt is the loss calculation by IGBT
It obtains, therefore is calculating nTs(n-1) T is used when the IGBT loss at momentsThe junction temperature at moment is calculated.In Traction Drive system
The junction temperature curve of IGBT can be obtained when system operation.
Further, the traction drive IGBT Life Prediction Model of the step 3 using rain flow method,
Coffin-Manson life model acquires the accumulated damage degree of IGBT, then is derived by Miner linear damage accumulation theory
The lifetime function model of IGBT, wherein the load cycle in IGBT junction temperature curve is extracted using rain Flow Technique method and is brought into calculating
Accumulated damage degree, function are as follows:
Wherein, niIt is the cycle-index under a certain range of stress, is the calculated result of rain flow method；NiIt is the stress model
Enclose lower failure cycle-index；
The accumulated damage degree of IGBT is finally acquired based on Coffin-Manson life model:
Wherein, k is Boltzmann constant, EaIt is activation energy, α, n are the results being fitted by experimental test data.
When the accumulated damage degree D of IGBT reaches 1, IGBT fails.It can according to Miner linear damage accumulation theory
:
Wherein, T2For the service life of IGBT, then D2It is 1；T1For the time that vehicle has been run, D1For run when
Between caused by accumulated damage.
Finally obtain the Life Prediction Model of IGBT:
T2=T1/D1。
The beneficial effects of the present invention are: being led to according to the actual traction level of railcar/braking level and motor speed n
Cross look-up table obtain IGBT loss to predict the service life of IGBT module, can effectively be calculated IGBT module accumulation
Injury tolerance and predict the module life, so as to make damage alarming to it, the generation of effective trouble saving reduces safety
Risk reduces economic loss.
Detailed description of the invention
Fig. 1 is that a kind of railcar traction drive IGBT module life-span prediction method provided in an embodiment of the present invention is pre-
Survey block diagram；
Fig. 2 is in a kind of railcar traction drive IGBT module life-span prediction method provided in an embodiment of the present invention
The relational graph of the energy and collector current that are turned on and off under each pulse；
Fig. 3 is in a kind of railcar traction drive IGBT module life-span prediction method provided in an embodiment of the present invention
The on state characteristic figure of IGBT module；
Fig. 4 is in a kind of railcar traction drive IGBT module life-span prediction method provided in an embodiment of the present invention
Traction invertor figure；
Fig. 5 is in a kind of railcar traction drive IGBT module life-span prediction method provided in an embodiment of the present invention
Foster equivalent thermal network illustraton of model；
Fig. 6 is in a kind of railcar traction drive IGBT module life-span prediction method provided in an embodiment of the present invention
Rain flow way working principle diagram.
Specific embodiment
The technical scheme in the embodiments of the invention will be clearly and completely described below, it is clear that described implementation
Example is only a part of the embodiments of the present invention, instead of all the embodiments.Based on the embodiments of the present invention, this field is common
Technical staff's every other embodiment obtained without making creative work belongs to the model that the present invention protects
It encloses.
With reference to attached drawing 1, a kind of railcar traction drive IGBT module life-span prediction method, comprising the following steps:
Step 1: establishing traction drive IGBT damage according to railcar traction level/braking level and motor speed n
Consumption estimation model；
Step 2: establishing the estimation of traction drive IGBT junction temperature based on Foster equivalent thermal network model and IGBT loss
Model；
Step 3: establishing the traction drive IGBT service life based on rain flow method and Miner linear damage accumulation theory
Prediction model.
The present invention obtains the loss of IGBT according to the actual traction level of railcar/braking level and motor speed, then
According to the actual operating condition of railcar, the junction temperature of estimation migration transmission system IGBT module is carried out, to realize IGBT mould
The life prediction of block avoids bent simply by virtue of velocity fitting and junction temperature mean value and the relationship of junction temperature fluctuation amplitude in the prior art
Line reduces the error of prediction come the irrationality predicted.
Further, for railcar traction drive, curve of traction characteristics and braking characteristic curve be there is,
When traction level/braking level is certain, current-order is fixed value under each speed, therefore the output current amplitude of inverter
And frequency-invariant, then the waveform of the collector current of IGBT at such speeds is certain.The loss of IGBT mainly includes leading to
State loss and switching loss, according to Fig.2, the energy of the switch state consumption of IGBT are mainly electric with gate electrode resistance, collector
The factors such as stream, IGBT junction temperature are related.For the traction convertor of same model, gate electrode resistance there's almost no difference.And it is single
Position clock switch number is related to stator frequency, can be approximated to be the function of motor speed, therefore the switching loss of IGBT is electricity
The function of machine revolving speed, collector current and IGBT junction temperature.That is:
Psw=f (n, IC,Tj)
Wherein, n is motor speed, ICFor collector current, TJ isIGBT junction temperature.
Further, collector current and collector emitter potentiometer when the conduction loss of IGBT is mainly by being connected
Calculate acquisition.According to Fig.3, according to the collector current and IGBT junction temperature for actually flowing through IGBT, collector hair can be obtained
Emitter voltage.Therefore, the conduction loss of IGBT is the function of collector current and IGBT junction temperature, it may be assumed that
Pcond=f (IC,Tj)
Wherein, ICFor collector current, TjFor IGBT junction temperature.
Further, since the loss of IGBT mainly includes switching loss and conduction loss, so the loss of IGBT is electricity
The function of machine revolving speed, collector current and IGBT junction temperature.And collector current is traction level/braking level and speed letter
Number, therefore the loss of IGBT is the function of traction level/braking level, motor speed and IGBT junction temperature, it may be assumed that
P=f (level, n, Tj)
Wherein, level be traction/braking level, n be motor speed, TjFor IGBT junction temperature.
Further, for IGBT module can be obtained by the method for off-line test with a traction convertor product
Loss and traction level/braking level, motor speed and IGBT junction temperature relationship.In off-line test, traction invertor
IGBT module is directly connected with cooling system, i.e., the shell temperature of IGBT module is consistent, is equal to cooling system temperature.Pass through traction
Level/braking level and motor speed determine the current-order of traction convertor, to carry out the control of current transformer.According to Fig. 4
It is shown, respectively under a certain specific traction level/braking level, motor speed and IGBT junction temperature, carry out the loss test of IGBT.
Wherein, IGBT junction temperature is obtained by infrared radiation thermometer, and the voltage of IGBT is directly measured by voltage measuring apparatus, and electric current passes through phase
Electric current and switch state arrive.With A case bridge arm S1For illustrate.In Fig. 4, work as Sa=1, iaWhen > 0, current path is red
Colo(u)r streak road, IGBT S1Electric current be A phase current.Similarly, work as Sa=1, iaWhen < 0, current path D1, IGBT S1Electric current be
0.The electric current on each IGBT can be obtained according to the switch state and phase current of every phase according to mentioned above principle.According on IGBT
Voltage and current information, can be in the hope of in a certain specific traction/braking level, motor speed n and IGBT junction temperature TjUnder, IGBT's
Loss power is i.e.:
Wherein, P is the loss of IGBT, and T is the stator current primitive period, and u is IGBT collector emitter voltage, and i is
IGBT collector current.
The loss and traction level/braking level, motor speed and IGBT junction temperature of IGBT is obtained by above-mentioned off-line test
Table, the loss of IGBT is obtained by look-up table when practical traction convertor is run.
Further, for the current transformer of actual motion, the mounting temperature sensor on cooling system is needed to obtain
The shell temperature of IGBT module.Relation function between the junction temperature and shell temperature of IGBT:
Tj=Tc+PZth(j-c)
Wherein, Zth(j-c)It is thermal resistance of the IGBT knot to shell.According to Fig.5, the IGBT based on Foster model is tied to shell
Thermal resistance parameters, wherein Foster model such as Fig. 5, in initial time, the loss of IGBT is 0, at this time:
Tj(0)=Tc(0)
In n-th of sampling instant nTsWhen, the junction temperature of IGBT are as follows:
Tj(nTs)=Tc(nTs)+P(nTs)×Zth(j-c)
Wherein, P (nTs) be IGBT loss, be traction level/braking level, motor speed n and IGBT junction temperature TjLetter
Number.Traction level/braking level, motor speed can be obtained with real-time sampling, but the junction temperature of IGBT is the damage by IGBT
What consumption was calculated, therefore calculating nTs(n-1) T is used when the IGBT loss at momentsThe junction temperature at moment is calculated.
According to above method, the junction temperature curve of IGBT can be obtained in traction drive operation.
Further, it to extract the load cycle in IGBT junction temperature curve, using rain flow method, extracts each load and follows
Junction temperature mean value T in ringm, junction temperature fluctuate Δ TjWith circulation number.Rain flow method according to figure 6, rain flow method is mentioned
The load cycle taken, which is brought into, calculates accumulated damage degree.
Wherein, niIt is the cycle-index under a certain range of stress, is the calculated result of rain flow method；NiIt is the stress model
Lower failure cycle-index is enclosed, using based on Coffin-Manson life model:
Wherein, k is Boltzmann constant, EaIt is activation energy, α, n are the results being fitted by experimental test data.
The accumulated damage degree of IGBT is acquired by the above process.When the accumulated damage degree D of IGBT reaches 1, IGBT
It fails.It can be obtained according to Miner linear damage accumulation theory:
Wherein, T2For the service life of IGBT, then D2It is 1；T1For the time that vehicle has been run, D1For run when
Between caused by accumulated damage.The then service life of IGBT are as follows:
T2=T1/D1
Thus the Life Prediction Model of IGBT is obtained.
It is obvious to a person skilled in the art that invention is not limited to the details of the above exemplary embodiments, Er Qie
In the case where without departing substantially from spirit or essential attributes of the invention, the present invention can be realized in other specific forms.Therefore, no matter
From the point of view of which point, the present embodiments are to be considered as illustrative and not restrictive, and the scope of the present invention is by appended power
Benefit requires rather than above description limits, it is intended that all by what is fallen within the meaning and scope of the equivalent elements of the claims
Variation is included within the present invention.Any reference signs in the claims should not be construed as limiting the involved claims.
In addition, it should be understood that although this specification is described in terms of embodiments, but not each embodiment is only wrapped
Containing an independent technical solution, this description of the specification is merely for the sake of clarity, and those skilled in the art should
It considers the specification as a whole, the technical solutions in the various embodiments may also be suitably combined, forms those skilled in the art
The other embodiments being understood that.
Claims (4)
1. a kind of railcar traction drive IGBT module life-span prediction method, which comprises the following steps:
Estimate Step 1: establishing traction drive IGBT loss according to railcar traction level/braking level and motor speed n
Count model；
Step 2: establishing traction drive IGBT junction temperature estimation mould based on Foster equivalent thermal network model and IGBT loss
Type；
Step 3: establishing traction drive IGBT life prediction based on rain flow method and Miner linear damage accumulation theory
Model.
2. a kind of railcar traction drive IGBT module life-span prediction method according to claim 1, feature
Be, step 1 traction drive IGBT loss estimation pattern function be according to IGBT switch and on state under
Loss obtains, wherein the energy of the switch state consumption of IGBT mainly with motor speed, collector current, IGBT junction temperature etc. because
It is plain related, function model are as follows:
Psw=f (n, IC,Tj)
Wherein, n is motor speed, ICFor collector current, TJ isIGBT junction temperature；
The conduction loss of IGBT is the function of collector current and IGBT junction temperature, function model are as follows:
Pcond=f (IC,Tj)
Wherein, ICFor collector current, TjFor IGBT junction temperature；
The loss of IGBT is the function of motor speed, collector current and IGBT junction temperature, and collector current is traction/retrostage
The function of position and speed, so the loss of IGBT is the function of traction/braking level, motor speed and IGBT junction temperature, model
Are as follows:
P=f (level, n, Tj)
Wherein, level be traction/braking level, n be motor speed, TjFor IGBT junction temperature；
Again by a certain specific traction/braking level, motor speed and IGBT junction temperature under, derive the loss power of IGBT,
Function model are as follows:
Wherein, P is the loss of IGBT, and T is the stator current primitive period, and u is IGBT collector emitter voltage, and i is IGBT collection
Electrode current.
3. a kind of railcar traction drive IGBT module life-span prediction method according to claim 1, feature
It is, the traction drive IGBT junction temperature estimation model of the step 2 is based on the temperature sensor installed on cooling system
The shell temperature of the IGBT module of acquisition, then be lost by Foster equivalent thermal network model and IGBT and established, wherein the junction temperature of IGBT
Relationship between shell temperature are as follows:
Tj=Tc+PZth(j-c)
Wherein, Zth(j-c)It is thermal resistance of the IGBT knot to shell；
Initial time, the loss of IGBT are 0, therefore:
Tj(0)=Tc(0)
In n-th of sampling instant nTsWhen, the junction temperature of IGBT are as follows:
Tj(nTs)=Tc(nTs)+P(nTs)×Zth(j-c)
Wherein, P (nTs) be IGBT loss, be traction/braking level, motor speed n and IGBT junction temperature TjFunction, traction/
Braking level, motor speed n can be obtained with real-time sampling, but the junction temperature T of IGBTjIt is to be obtained by the loss calculation of IGBT
, therefore calculating nTs(n-1) T is used when the IGBT loss at momentsThe junction temperature at moment is calculated.It is transported in traction drive
The junction temperature curve of IGBT can be obtained when row.
4. a kind of railcar traction drive IGBT module life-span prediction method according to claim 1, feature
It is, the traction drive IGBT Life Prediction Model of the step 3 uses rain flow method, Coffin-Manson service life
Model acquires the accumulated damage degree of IGBT, then the lifetime function mould of IGBT is derived by Miner linear damage accumulation theory
Type, wherein the load cycle in IGBT junction temperature curve is extracted using rain Flow Technique method and is brought into calculating accumulated damage degree, letter
Number are as follows:
Wherein, niIt is the cycle-index under a certain range of stress, is the calculated result of rain flow method；NiIt is under the range of stress
Fail cycle-index；
The accumulated damage degree of IGBT is finally acquired based on Coffin-Manson life model:
Wherein, k is Boltzmann constant, EaIt is activation energy, α, n are the results being fitted by experimental test data.
When the accumulated damage degree D of IGBT reaches 1, IGBT fails.It can be obtained according to Miner linear damage accumulation theory:
Wherein, T2For the service life of IGBT, then D2It is 1；T1For the time that vehicle has been run, D1Time to have run causes
Accumulated damage.
Finally obtain the Life Prediction Model of IGBT: T2=T1/D1。
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| CN112986707A (en) * | 2019-12-02 | 2021-06-18 | 北京新能源汽车股份有限公司 | Service life assessment method and device of power module and automobile |
| CN113125928A (en) * | 2021-04-20 | 2021-07-16 | 武汉大学 | IGBT module aging characterization method and system based on Miner theory |
| CN113267690A (en) * | 2021-05-06 | 2021-08-17 | 中车青岛四方车辆研究所有限公司 | Aging evaluation method for power module of traction converter |
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| CN113765058A (en) * | 2020-06-03 | 2021-12-07 | 株洲中车时代电气股份有限公司 | Chopper circuit protection method and system |
| CN113776591A (en) * | 2021-09-10 | 2021-12-10 | 中车大连机车研究所有限公司 | Data recording and fault analyzing device and method for locomotive auxiliary control unit |
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Application publication date: 20191129 |