CN110455409A - A kind of inclined system of ultraphotic spectrum Muller matrix imaging survey - Google Patents
A kind of inclined system of ultraphotic spectrum Muller matrix imaging survey Download PDFInfo
- Publication number
- CN110455409A CN110455409A CN201810432051.XA CN201810432051A CN110455409A CN 110455409 A CN110455409 A CN 110455409A CN 201810432051 A CN201810432051 A CN 201810432051A CN 110455409 A CN110455409 A CN 110455409A
- Authority
- CN
- China
- Prior art keywords
- axis
- savart
- plate
- light
- optical axis
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000003384 imaging method Methods 0.000 title claims abstract description 64
- 239000011159 matrix material Substances 0.000 title claims abstract description 30
- 238000001228 spectrum Methods 0.000 title claims abstract description 25
- 230000003287 optical effect Effects 0.000 claims abstract description 68
- 230000010287 polarization Effects 0.000 claims abstract description 60
- 230000009897 systematic effect Effects 0.000 claims description 27
- 238000009738 saturating Methods 0.000 claims description 3
- 230000007613 environmental effect Effects 0.000 abstract description 4
- 238000000034 method Methods 0.000 abstract description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 abstract description 2
- 238000010008 shearing Methods 0.000 description 7
- 238000005259 measurement Methods 0.000 description 4
- 239000000243 solution Substances 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000006073 displacement reaction Methods 0.000 description 3
- 238000002347 injection Methods 0.000 description 3
- 239000007924 injection Substances 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/447—Polarisation spectrometry
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Polarising Elements (AREA)
Abstract
The present invention relates to optical image information acquisition technique fields, inclined system is surveyed in specially a kind of ultraphotic spectrum Muller matrix imaging, including scanning light source, the first Polarization Modulation module, the second Polarization Modulation module, image acquiring device, the first collimation lens, the first imaging lens, the second collimation lens, the second imaging lens, the first Polarization Modulation module includes the first savart polariscope and the second savart polariscope, the polarizer and half way up the mountain piece, and the second Polarization Modulation module includes third savart polariscope and the 4th savart polariscope, analyzer and half way up the mountain piece.The present invention is compared with Muller matrix traditional at present surveys inclined system, it is not influenced by external environmental factor, precision is higher, can disposably obtain the spectrum information, intensity image and Muller matrix image of target, it is possible to provide the information such as the shape shadow of target object, institutional framework, dielectric constant, water content.
Description
Technical field
The present invention relates to optical image information acquisition technique field, system partially is surveyed in specially a kind of ultraphotic spectrum Muller matrix imaging
System.
Background technique
It includes movable part that traditional Muller matrix, which is surveyed in inclined system, and accurate electric-control system is needed to remove control movable part
Part rotation, therefore this inclined system of survey is especially sensitive to external environmental factors such as vibration and temperature, varies slightly and influences it
Accuracy, and while measuring same article, needs to take multiple measurements, and easily generation measurement error causes metrical information inaccurate
Really.
Summary of the invention
For above-mentioned problem, inclined system is surveyed in a kind of ultraphotic spectrum Muller matrix imaging of the present invention, by setting scanning light source,
First Polarization Modulation module and the second Polarization Modulation module, by every a branch of light projected from scanning light source by the first Polarization Modulation
Module first cuts into 4 bunch polarised lights, which forms interference fringe and be located on sample, described dry
Striped is related to and modulates by two kinds of carrier frequency the Muller matrix of sample, then by modulated 4 bunch polarised light again by the second polarization
Modulation module cuts into 16 bunch polarised lights, to form the target image with interference fringe and be located in image acquiring device
On.Polarization Modulation module of the invention is free of movable part, effectively external environmental factor can be avoided to influence, measurement accuracy significantly mentions
Height can disposably obtain the spectrum information, intensity image and Muller matrix image of target, efficiently solve the above problem.
The technical solution adopted by the present invention is that:
Inclined system is surveyed in a kind of spectrum Muller matrix imaging of ultraphotic, including from front to back, the first collimation lens (2) for setting gradually, the
One imaging lens (4), the second collimation lens (5), the second imaging lens (7) and image acquiring device (8), it is characterised in that: described
Collimating lens (2) incident light side is provided with scanning light source (1), first collimation lens (2) and first imaging lens
(4) it is provided with the first Polarization Modulation module (3) between, is set between second collimation lens (5) and second imaging lens (7)
It is equipped with the second Polarization Modulation module (6), the scanning light source (1), the first collimation lens (2), the first imaging lens (4), the second standard
Straight lens (5), the second imaging lens (7), the central point of image acquiring device (8) and the first Polarization Modulation module (3), second
The central point of Polarization Modulation module (6) is respectively positioned on same straight line L;
First collimation lens (2) is the focal length f of the first collimation lens (2) at a distance from the scanning light source (1)1, described
First imaging lens (4) are the second collimation lens (5) focal length f at a distance from second collimation lens (5)2Twice of 2f2, described
Second imaging lens (7) are the focal length f of the second imaging lens (7) at a distance from described image acquisition device (8)3。
Any Ray Of Light that scanning light source issues forms parallel rays after the refraction of the first collimation lens and injects first partially
Shake modulation module, and incident ray is modulated into linearly polarized light by the first Polarization Modulation module first, then again by the first Polarization Modulation
Module first cuts into 4 bunch polarised lights in the horizontal direction again along the vertical direction, this 4 bunch polarised light is after the convergence of the first imaging lens
It forms interference fringe to be located on target object, the interference fringe modulates the Muller square of target object by two kinds of carrier frequency
Battle array injects the second Polarization Modulation mould after the second collimation lens is reflected into parallel linearly polarized light by modulated 4 bunch polarised light
Block, then it is inclined first to be cut into 4 bunch in the horizontal direction again along the vertical direction by the second Polarization Modulation module for each bunch polarised light
Shake light, and the polarization direction for forming 16 bunch polarised lights and this 16 bunch polarised light altogether is identical, last this 16 bunch polarised light warp
Second imaging lens form interference fringe and are located in image acquiring device image planes after assembling, form the object with interference fringe
Body image.Simultaneously because scanning light source can launch the light of a variety of different wave lengths, and the light action of different wave length is in target object
It is also different that the target object image with interference fringe was formed by when upper, so every by acquisition
A kind of light action is formed by the spectrum information that target object can be obtained with interference fringe image on target object.
Further, the first Polarization Modulation module (3) includes the first savart polariscope (11a) and the second savart polarisation
Mirror (11b) is arranged between the light-emitting surface of the first savart polariscope (11a) and the entering light face of the second savart polariscope (11b)
Have the first half-wave plate (12a), the entering light face of the first savart polariscope (11a) is additionally provided with the polarizer (10).
The incident light that each beam enters the first Polarization Modulation module is all first polarized device and is modulated into the identical line in polarization direction
Then polarised light is just cut into 4 bunch polarised lights, wherein first cutting into two bunch polarised lights by the first savart polariscope, pass through
Each bunch polarised light cuts into two bunch polarised lights by the second savart polariscope again after first half-wave plate, and it is inclined to form 4 bunch altogether
Shake light.
Further, the second Polarization Modulation module (6) includes third savart polariscope (14a) and the 4th savart polarisation
Mirror (14b) is arranged between the light-emitting surface of the third savart polariscope (14a) and the entering light face of the 4th savart polariscope (14b)
There is the second half way up the mountain piece (12b), the light-emitting surface of the 4th savart polariscope (14b) is additionally provided with analyzer (15).
The linearly polarized light that each beam enters the second Polarization Modulation module all cuts into 4 bunch polarised lights, each bunch polarization
Light first cuts into two bunch polarised lights by third savart polariscope, is cut into again by the 4th savart polariscope after the second half-wave plate
Two bunch polarised lights.
Further, the first savart polariscope (11a) includes the first savart plate (13) and the second Sa overlapped
Shoe plate (18a), the savart plate optical axis position determine by longitudinal axis X axis, horizontal axis Y-axis and systematic optical axis Z axis, the system light
Axis Z axis is parallel with the straight line L and the light direction of propagation is that Z axis is positive, the longitudinal axis X axis it is vertical vertically with the straight line L and
It is positive for X-axis upwards, it is that Y-axis is positive on the right side of the horizontal axis Y-axis and the straight line L horizontal vertical and the light direction of propagation, it is described
First savart plate (13) optical axis is in XZ plane and at 45 °, the second savart plate with X-axis forward direction, systematic optical axis Z axis forward direction
(18a) optical axis YZ plane and with systematic optical axis Z axis is positive, Y-axis negative sense is at 45 °;
The second savart polariscope (11b) includes the third savart plate (16) and the 4th savart plate (18b) overlapped, described
Third savart plate (16) optical axis is in XZ plane and at 45 °, the 4th savart plate with X-axis forward direction, systematic optical axis Z axis negative sense
(18b) optical axis is identical as the second savart plate (18a) optical axis, the first savart plate (13), the second savart plate (18a),
Three savart plates (16), the 4th savart plate (18b) thickness are identical.The 4th savart plate (18b) and the second savart plate (18a)
It is identical.
First savart plate or the second savart plate will cut into along the vertical direction two bunch polarization per a branch of incident ray polarized light
Light, then third savart plate or the 4th savart plate shear two bunch polarised lights after shearing in the horizontal direction again.
Further, the third savart polariscope (14a) includes the 5th savart plate (20) and the 6th Sa overlapped
Shoe plate (19a), the savart plate optical axis position determine by longitudinal axis X axis, horizontal axis Y-axis and systematic optical axis Z axis, the system light
Axis Z axis is parallel with the straight line L and the light direction of propagation is that Z axis is positive, the longitudinal axis X axis it is vertical vertically with the straight line L and
It is positive for X-axis upwards, it is that Y-axis is positive on the right side of the horizontal axis Y-axis and the straight line L horizontal vertical and the light direction of propagation, it is described
5th savart plate (20) optical axis is in XZ plane and at 45 °, the 6th savart plate with X-axis forward direction, systematic optical axis Z axis forward direction
(19a) optical axis YZ plane and with systematic optical axis Z axis is positive, Y-axis negative sense is at 45 °;
The 4th savart polariscope (14b) includes the 7th savart plate (21) and the 8th savart plate (19b) overlapped, described
7th savart plate (21) is in XZ plane and at 45 °, the 8th savart plate (19b) light with X-axis forward direction, systematic optical axis Z axis negative sense
Axis is identical with the 6th savart plate (19a) optical axis, the 5th savart plate (20), the 6th savart plate (19a), the 7th savart plate
(21), the 8th savart plate (19b) thickness is identical.The 6th savart plate (19a) and the 8th savart plate (19b) are identical.
5th savart plate or the 7th savart plate will cut into along the vertical direction two bunch polarization per a branch of incident ray polarized light
Light, then the 6th savart plate or the 8th savart plate shear two bunch polarised lights after shearing in the horizontal direction again.
Further, the 5th savart plate (20) is with a thickness of twice of first savart plate (13) thickness.
Second Polarization Modulation module savart plate thickness is twice of the first Polarization Modulation module savart plate thickness, is arranged in this way
Be in order to allow the shearing displacement of the second Polarization Modulation module to be twice of the first Polarization Modulation module shearing displacement, finally could be by target
16 Muller matrix array elements of object are modulated in same interference pattern by different space carrier frequencies.
Further, first half-wave plate (12a) and the second half-wave plate (12b) are achromatism half way up the mountain piece, polarization side
It is 22.5 ° to angle.First half-wave plate (12a) and the second half way up the mountain piece (12b) are identical, are achromatism half-wave plate (12).
Half way up the mountain piece plays the role of rotating the field direction of vibration of incident linearly polarized light into 45 °, while achromatism half first
Wave plate also makes the light of various different wave lengths phase-delay quantity after half-wave plate identical.
Further, the saturating vibration deflection of the polarizer (10) and analyzer (15) is 45 °.
All become the linearly polarized light that polarization direction is 45 ° by the parallel incoming rays of the polarizer;Analyzer makes from
The polarization direction for the linearly polarized light that eight savart plates project becomes at 45 °.
Further, the first collimation lens (2) focal length f1, the first imaging lens (4) focal length, the second collimation lens (5)
Focal length f2, the second imaging lens (7) focal length f3It is equal.
The first collimation lens of light directive that light source issues forms parallel rays directive the after the refraction of the first collimation lens
One Polarization Modulation module;The linearly polarized light projected from the first Polarization Modulation module forms interference fringe after the convergence of the first imaging lens
It is located on target object;By modulated linearly polarized light, directive second is collimated from different perspectives after target object reflects
Mirror forms parallel the second Polarization Modulation of linearly polarized light directive module after the refraction of the second collimation lens;From the second Polarization Modulation mould
The linearly polarized light that block projects converges in the image planes of image acquiring device through the second imaging lens, forms the target figure with interference fringe
Picture.
In conclusion by adopting the above-described technical solution, beneficial effects of the present invention:
1, inclined system is surveyed in a kind of ultraphotic spectrum Muller matrix imaging of the present invention, has merged the function of surveying spectrometer, derivometer and camera,
The spectrum information, intensity image and Muller matrix image of target object can be obtained simultaneously, it is possible to provide the shape shadow of target object, knot of tissue
The information such as structure, dielectric constant, water content have important application value in fields such as biomedical and materials.
2, inclined system is surveyed in a kind of ultraphotic spectrum Muller matrix imaging of the present invention, surveys inclined system phase with current traditional Muller matrix
Than, Polarization Modulation module therein is free of movable part, the influence of external environmental factor such as temperature, vibration can be effectively avoided, because
This measurement accuracy is higher.
Detailed description of the invention
In order to illustrate more clearly of example or technical solution in the prior art of the invention, below will to embodiment or
Required attached drawing, which is done, in description of the prior art simply introduces, it is clear that the accompanying drawings in the following description is only of the invention one
A little examples under the premise of not paying creativeness, can also obtain according to these attached drawings to those skilled in the art
Obtain other attached drawings.
Inclined system construction drawing is surveyed in a kind of ultraphotic spectrum Muller matrix imaging of Fig. 1;
Fig. 2 the first Polarization Modulation function structure chart;
Fig. 3 the second Polarization Modulation function structure chart;
Fig. 4 half-wave plate perspective view;
Fig. 5 polarizer perspective view;
Fig. 6 analyzer perspective view;
Inclined System Working Principle figure is surveyed in a kind of ultraphotic spectrum Muller matrix imaging of Fig. 7;
The a branch of linearly polarized light of Fig. 8 is cut into the working principle diagram of two bunch polarised lights by the first savart polariscope;
Two bunch polarised light of Fig. 9 is projected from the second savart plate front schemes;
Two bunch polarised light of Figure 10 is cut into the working principle diagram of four bunch polarised lights by the second savart polariscope;
Tetra- bunch polarised light of Figure 11 projects front elevation from the 4th savart plate;
The modulated 4 bunch polarised light of Figure 12 cuts into 8 bunch polarised light schematic diagrames by third savart polariscope;
The 4th savart polariscope perspective view of Figure 13;
Eight bunch polarised light of Figure 14 is projected from the 5th savart plate front schemes;
Eight bunch polarised light of Figure 15 is projected from the 6th savart plate front schemes;
16 bunch polarised light of Figure 16 is projected from the 7th savart plate front schemes;
16 bunch polarised light of Figure 17 is projected from the 8th savart plate front schemes;
In attached drawing, 1- scanning light source, the first collimation lens of 2-, the first Polarization Modulation of 3- module, the first imaging lens of 4-, 5- second are quasi-
Straight lens, the second Polarization Modulation of 6- module, the second imaging lens of 7-, 8- image acquiring device, 9- target object, the 10- polarizer,
The first savart of 11a- polariscope, the second savart of 11b- polariscope, 12- achromatism half-wave plate, the first half-wave plate of 12a-, 12b- second
Half-wave plate, the first savart of 13- plate, 14a- third savart polariscope, the 4th savart polariscope of 14b-, 15- analyzer, 16- second
Savart plate, 18a- third savart plate, the 4th savart plate of 18b-, the 6th savart plate of 19a-, the 8th savart plate of 19b-, the 5th Sa of 20-
Shoe plate, the 7th savart plate of 21-.
Specific embodiment
Below in conjunction with the attached drawing in present example, technical solution in the embodiment of the present invention carries out clear, complete
Ground description, it is clear that described embodiments are only a part of the embodiments of the present invention, instead of all the embodiments.Based on this
Embodiment in invention, those of ordinary skill in the art are obtained every other without making creative work
Embodiment shall fall within the protection scope of the present invention.
Embodiment:
Inclined system is surveyed in a kind of spectrum Muller matrix imaging of ultraphotic, including from front to back, the first collimation lens (2) for setting gradually, the
One imaging lens (4), the second collimation lens (5), the second imaging lens (7) and image acquiring device (8), first collimation lens
(2) incident light side is provided with scanning light source (1), is arranged between first collimation lens (2) and first imaging lens (4)
There is the first Polarization Modulation module (3), second is provided between second collimation lens (5) and second imaging lens (7) partially
Shake modulation module (6), the scanning light source (1), the first collimation lens (2), the first imaging lens (4), the second collimation lens (5),
Second imaging lens (7), the central point of image acquiring device (8) and the first Polarization Modulation module (3), the second Polarization Modulation mould
The central point of block (6) is respectively positioned on same straight line L;
First collimation lens (2) is the focal length f of the first collimation lens (2) at a distance from the scanning light source (1)1, described
First imaging lens (4) are the second collimation lens (5) focal length f at a distance from second collimation lens (5)2Twice of 2f2, described
Second imaging lens (7) are the focal length f of the second imaging lens (7) at a distance from described image acquisition device (8)3;First collimation
Lens (2) focal length f1, the first imaging lens (4) focal length, the second collimation lens (5) focal length f2, the second imaging lens (7) focal length f3Homogeneously
Deng;
As shown in Fig. 2, the first Polarization Modulation module (3) includes the first savart polariscope (11a) and the second savart polariscope
(11b) is provided between the light-emitting surface of the first savart polariscope (11a) and the entering light face of the second savart polariscope (11b)
The entering light face of first half-wave plate (12a), the first savart polariscope (11a) is additionally provided with the polarizer (10);
As shown in figure 3, the second Polarization Modulation module (6) includes third savart polariscope (14a) and the 4th savart polariscope
(14b) is provided between the light-emitting surface of the third savart polariscope (14a) and the entering light face of the 4th savart polariscope (14b)
Second half way up the mountain piece (12b), the light-emitting surface of the 4th savart polariscope (14b) are additionally provided with analyzer (15);
As shown in figure 8, the first savart polariscope (11a) includes the first savart plate (13) and the second savart plate overlapped
(18a), the savart plate optical axis position determine by longitudinal axis X axis, horizontal axis Y-axis and systematic optical axis Z axis, the systematic optical axis Z
Axis is parallel with the straight line L and the light direction of propagation is that Z axis is positive, and the longitudinal axis X axis is vertical vertical and upward with the straight line L
It is that Y-axis is positive for X-axis forward direction, on the right side of the horizontal axis Y-axis and the straight line L horizontal vertical and the light direction of propagation, described first
Savart plate (13) optical axis is in XZ plane and at 45 °, the second savart plate (18a) light with X-axis forward direction, systematic optical axis Z axis forward direction
Axis YZ plane and with systematic optical axis Z axis is positive, Y-axis negative sense is at 45 °;
As shown in Figure 10, the second savart polariscope (11b) includes the third savart plate (16) and the 4th savart overlapped
Plate (18b), third savart plate (16) optical axis XZ plane and with X-axis is positive, systematic optical axis Z axis negative sense is at 45 °, described the
Four savart plate (18b) optical axises are identical as the second savart plate (18a) optical axis, the first savart plate (13), the second savart plate
(18a), third savart plate (16), the 4th savart plate (18b) thickness are identical.
As shown in figure 12, the third savart polariscope (14a) includes the 5th savart plate (20) and the 6th overlapped
Savart plate (19a), the savart plate optical axis position determine by longitudinal axis X axis, horizontal axis Y-axis and systematic optical axis Z axis, the system
Optical axis Z axis is parallel with the straight line L and the light direction of propagation is that Z axis is positive, and the longitudinal axis X axis and the straight line L are vertical vertically
And it is positive for X-axis upwards, it is that Y-axis is positive on the right side of the horizontal axis Y-axis and the straight line L horizontal vertical and the light direction of propagation, institute
The 5th savart plate (20) optical axis is stated in XZ plane and at 45 °, the 6th savart plate with X-axis forward direction, systematic optical axis Z axis forward direction
(19a) optical axis YZ plane and with systematic optical axis Z axis is positive, Y-axis negative sense is at 45 °;
As shown in figure 13, the 4th savart polariscope (14b) includes the 7th savart plate (21) and the 8th savart overlapped
Plate (19b), the 7th savart plate (21) is in XZ plane and at 45 °, the 8th Sa with X-axis forward direction, systematic optical axis Z axis negative sense
Shoe plate (19b) optical axis is identical with the 6th savart plate (19a) optical axis, the 5th savart plate (20), the 6th savart plate
(19a), the 7th savart plate (21), the 8th savart plate (19b) thickness are identical;
The 5th savart plate (20) is with a thickness of twice of first savart plate (13) thickness;
As shown in figure 4, first half-wave plate (12a) and the second half-wave plate (12b) are achromatism half way up the mountain piece, polarization direction angle
It is 22.5 °, as shown in Figure 5 and Figure 6, the saturating vibration deflection of the polarizer (10) and analyzer (15) is 45 °.
What the polarizer of the invention and analyzer used is polarizing film, and savart plate is negative uniaxial crystal plate, such as Fig. 4 institute
Show, the optical axis of achromatism half-wave plate is 22.5 ° with Y-axis forward direction angle in X/Y plane, as shown in figure 5, polarizer optical axis is in XY
In plane, and X-axis is positive, Y-axis forward direction is at 45 °, as shown in fig. 6, analyzer optical axis is in X/Y plane, with X-axis is positive, Y-axis just
To at 45 °.
The course of work of the invention: as shown in fig. 7, placing mesh in the middle position of the first imaging lens and the second collimation lens
Object is marked, any Ray Of Light d that scanning light source issues forms parallel rays d ' after the refraction of the first collimation lens and injects first
Polarization Modulation module, due to the polarizer shake thoroughly deflection be 45 °, parallel incoming rays d ' becomes polarization side after the polarizer
To the linearly polarized light for 45 °, as shown in figure 8, since the first savart plate optical axis is in XZ plane, with X-axis is positive, Z axis forward direction at
45 °, therefore linearly polarized light d ' is that X-axis forward direction is divided into o light and e light by the first savart plate along vertical direction, o light emission enters the second Sa
Shoe plate becomes e light, and e light emission enters the second savart plate and becomes o light, since the second savart plate optical axis is in YZ plane, with Y-axis negative sense, Z
Axis forward direction is at 45 °, therefore e light is projected along after Y-axis negative sense horizontal refraction from the second savart plate, the injection direction of o light and injection
Direction, which is consistent, to be projected along injection direction from the second savart plate, as shown in figure 9, the linear distance of linearly polarized light d2 and d1
It is increased to single savart plate shearing displacement ΔTimes;As shown in figure 4, due to the first half-wave plate optical axis in X/Y plane with Y-axis just
To angle be 22.5 °, after the first half-wave plate, the light field direction of vibration of linearly polarized light d2 and d1 is rotated 45 °, such as Figure 10
Shown, then linearly polarized light d2 and d1 inject the second savart polariscope, since the optical axis of third savart plate is in XZ plane and X-axis
Forward direction, Z axis negative sense are at 45 °, therefore linearly polarized light d2 and d1 are that X-axis negative sense is divided by third savart plate along vertical direction respectively
O light and e light, similarly, o light emission become e light after entering the 4th savart plate, and e light emission becomes o light after entering the 4th savart plate, due to the 4th
Savart plate optical axis is at 45 ° with Y-axis negative sense, Z axis forward direction in YZ plane, therefore linearly polarized light d2 and d1 are respectively again by the 4th Sa
Shoe plate carries out horizontal shear along Y-axis negative sense, and as shown in figure 11, linearly polarized light d2 is cut into linearly polarized light d5 and d6, and line is inclined
Vibration light d1 is cut into linearly polarized light d3 and d4;Linearly polarized light d3, d4, d5, d6 form interference item after the convergence of the first imaging lens
Line is simultaneously located on target object, while these interference fringes modulate the Muller matrix of target object by two kinds of carrier frequency, connect
4 beams by modulated linearly polarized light the second collimation lens of directive after target object reflects, through the second collimation lens refraction after
Linearly polarized light d3 ', d4 ', d5 ', d6 ' that 4 beams project in parallel are formed, after this 4 bunch polarised light injects the second Polarization Modulation module,
Similarly, as shown in figure 14, each bunch polarised light is all that cut into two bunch inclined for X-axis forward direction by the 5th savart plate along the vertical direction
Shake light, and 4 bunch polarised lights are cut into 8 bunch polarised lights altogether, i.e. linearly polarized light d3 ' cuts into the linear polarization projected in parallel up and down
Light d7 and d8, linearly polarized light d4 ' cut into the linearly polarized light d11 and d12 projected in parallel up and down, and linearly polarized light d5 ' is cut into
The linearly polarized light d9 and d10 projected in parallel down, linearly polarized light d6 ' cut into the linearly polarized light d13 and d14 projected in parallel up and down,
Due to twice with a thickness of the first Polarization Modulation module savart plate thickness of the 5th savart plate, linearly polarized light d8 and d13 weight
It closes, but linearly polarized light d8 is o light, linearly polarized light d13 is e light, and then this 8 bunch polarised light is again by the 6th savart plate along level side
It is sheared to shearing along Y-axis negative sense, the 6th savart plate is entered according to o light emission and becomes e light, e light emission enters the 6th savart plate and becomes o light
And o light emission goes out direction and injects the principle that is consistent of direction, when which projects from the 6th savart plate such as Figure 15 with
Shown in Figure 14;
Then this 8 bunch polarised light is after the second half-wave plate, after the light field direction of vibration of each bunch polarised light is rotated 45 ° again
The 4th savart polariscope is injected, similarly each bunch polarised light is first that the negative sense of X-axis is sheared by the 7th savart plate along the vertical direction
At two bunch polarised lights, 8 bunch polarised lights are cut into 16 bunch polarised lights altogether, and as shown in figure 16, linearly polarized light d7 is cut into
D15 and d16, linearly polarized light d8 cut into d17 and d18, linearly polarized light d9 cuts into d19 and d20, linearly polarized light d10 is cut into
D21 and d22, linearly polarized light d11 cut into d23 and d24, linearly polarized light d12 cuts into d25 and d26, linearly polarized light d13 shearing
D29 and d30 are cut at d27 and d28, linearly polarized light d14, since the 7th savart plate is with a thickness of the first Polarization Modulation module Sa
Twice of shoe plate thickness, therefore linearly polarized light d27 and d30 are overlapped, linearly polarized light d23 and d22 are overlapped, linearly polarized light d15 and d18
It is overlapped, but linearly polarized light d27, linearly polarized light d23, linearly polarized light d15 are o light, linearly polarized light d30, linearly polarized light d22, line
Polarised light d18 is e light, and then o light emission becomes e light after entering the 8th savart plate, and e light emission becomes o light after entering the 8th savart plate, because
This this 16 bunch polarised light is injected after the 8th savart plate again by the 8th savart plate along Y-axis negative sense horizontal shear, as shown in figure 17, from
This 16 bunch polarised light through analyzer is modulated into the consistent linearly polarized light in polarization direction after 8th savart plate projects, then by the
Two imaging lens form interference fringe and are located in the image planes of image acquiring device after assembling, form the target figure with interference fringe
Picture, operator, which demodulates these interference fringes by corresponding algorithm, can obtain whole Muller matrix images of target object,
Interference fringe is formed by target object by the light action of acquisition different wave length simultaneously, the spectrum of target object can be obtained
Information.
The foregoing is merely illustrative of the preferred embodiments of the present invention, is not intended to limit the invention, all in the use of the new type
Spirit and principle within, any modification, equivalent replacement, improvement and so on should be included within the protection scope of invention.
Claims (9)
1. inclined system is surveyed in a kind of spectrum Muller matrix imaging of ultraphotic, including from front to back, the first collimation lens (2) for setting gradually,
First imaging lens (4), the second collimation lens (5), the second imaging lens (7) and image acquiring device (8), it is characterised in that: described
First collimation lens (2) incident light side is provided with scanning light source (1), first collimation lens (2) and first imaging
The first Polarization Modulation module (3) is provided between mirror (4), between second collimation lens (5) and second imaging lens (7)
It is provided with the second Polarization Modulation module (6), the scanning light source (1), the first collimation lens (2), the first imaging lens (4), second
Collimation lens (5), the second imaging lens (7), the central point of image acquiring device (8) and the first Polarization Modulation module (3), the
The central point of two Polarization Modulation modules (6) is respectively positioned on same straight line L;
First collimation lens (2) is the focal length f of the first collimation lens (2) at a distance from the scanning light source (1)1, described
One imaging lens (4) are the second collimation lens (5) focal length f at a distance from second collimation lens (5)2Twice of 2f2, described
Two imaging lens (7) are the focal length f of the second imaging lens (7) at a distance from described image acquisition device (8)3。
2. inclined system is surveyed in a kind of ultraphotic spectrum Muller matrix imaging according to claim 1, it is characterised in that: described first partially
Vibration modulation module (3) includes the first savart polariscope (11a) and the second savart polariscope (11b), the first savart polariscope
It is provided with the first half-wave plate (12a) between the light-emitting surface of (11a) and the entering light face of the second savart polariscope (11b), described first
The entering light face of savart polariscope (11a) is additionally provided with the polarizer (10).
3. inclined system is surveyed in a kind of ultraphotic spectrum Muller matrix imaging according to claim 1, it is characterised in that: described second partially
Vibration modulation module (6) includes third savart polariscope (14a) and the 4th savart polariscope (14b), the third savart polariscope
It is provided with the second half way up the mountain piece (12b) between the light-emitting surface of (14a) and the entering light face of the 4th savart polariscope (14b), the described 4th
The light-emitting surface of savart polariscope (14b) is additionally provided with analyzer (15).
4. inclined system is surveyed in a kind of ultraphotic spectrum Muller matrix imaging according to claim 2, it is characterised in that: first Sa
Watt polariscope (11a) includes the first savart plate (13) and the second savart plate (18a) overlapped, the savart plate optical axis position
It is determined by longitudinal axis X axis, horizontal axis Y-axis and systematic optical axis Z axis, the systematic optical axis Z axis is parallel with the straight line L and light passes
Broadcasting direction is that Z axis is positive, and the longitudinal axis X axis is vertical vertical with the straight line L and positive for X-axis upwards, the horizontal axis Y-axis and institute
Stating on the right side of straight line L horizontal vertical and the light direction of propagation is that Y-axis is positive, the first savart plate (13) optical axis XZ plane and with
X-axis is positive, systematic optical axis Z axis forward direction is at 45 °, the second savart plate (18a) optical axis YZ plane and with systematic optical axis Z axis just
It is at 45 ° to, Y-axis negative sense;
The second savart polariscope (11b) includes the third savart plate (16) and the 4th savart plate (18b) overlapped, described
Third savart plate (16) optical axis is in XZ plane and at 45 °, the 4th savart plate with X-axis forward direction, systematic optical axis Z axis negative sense
(18b) optical axis is identical as the second savart plate (18a) optical axis, the first savart plate (13), the second savart plate (18a),
Three savart plates (16), the 4th savart plate (18b) thickness are identical.
5. inclined system is surveyed in a kind of ultraphotic spectrum Muller matrix imaging according to claim 3, it is characterised in that: the third Sa
Watt polariscope (14a) includes the 5th savart plate (20) and the 6th savart plate (19a) overlapped, the savart plate optical axis position
It is determined by longitudinal axis X axis, horizontal axis Y-axis and systematic optical axis Z axis, the systematic optical axis Z axis is parallel with the straight line L and light passes
Broadcasting direction is that Z axis is positive, and the longitudinal axis X axis is vertical vertical with the straight line L and positive for X-axis upwards, the horizontal axis Y-axis and institute
Stating on the right side of straight line L horizontal vertical and the light direction of propagation is that Y-axis is positive, the 5th savart plate (20) optical axis XZ plane and with
X-axis is positive, systematic optical axis Z axis forward direction is at 45 °, the 6th savart plate (19a) optical axis YZ plane and with systematic optical axis Z axis just
It is at 45 ° to, Y-axis negative sense;
The 4th savart polariscope (14b) includes the 7th savart plate (21) and the 8th savart plate (19b) overlapped, described
7th savart plate (21) is in XZ plane and at 45 °, the 8th savart plate (19b) light with X-axis forward direction, systematic optical axis Z axis negative sense
Axis is identical with the 6th savart plate (19a) optical axis, the 5th savart plate (20), the 6th savart plate (19a), the 7th savart plate
(21), the 8th savart plate (19b) thickness is identical.
6. inclined system is surveyed in a kind of ultraphotic spectrum Muller matrix imaging according to claim 4 or 5, it is characterised in that: described the
Five savart plates (20) are with a thickness of twice of first savart plate (13) thickness.
7. inclined system is surveyed in a kind of ultraphotic spectrum Muller matrix imaging according to claim 2 or 3, it is characterised in that: described the
Half of wave plate (12a) and the second half-wave plate (12b) are achromatism half way up the mountain piece, and polarization direction angle is 22.5 °.
8. inclined system is surveyed in a kind of ultraphotic spectrum Muller matrix imaging according to claim 2 or 3, it is characterised in that: described
The saturating vibration deflection of inclined device (10) and analyzer (15) is 45 °.
9. inclined system is surveyed in a kind of ultraphotic spectrum Muller matrix imaging according to claim 1, it is characterised in that: described first is quasi-
Straight lens (2) focal length f1, the first imaging lens (4) focal length, the second collimation lens (5) focal length f2, the second imaging lens (7) focal length f3
It is equal.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201810432051.XA CN110455409A (en) | 2018-05-08 | 2018-05-08 | A kind of inclined system of ultraphotic spectrum Muller matrix imaging survey |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201810432051.XA CN110455409A (en) | 2018-05-08 | 2018-05-08 | A kind of inclined system of ultraphotic spectrum Muller matrix imaging survey |
Publications (1)
Publication Number | Publication Date |
---|---|
CN110455409A true CN110455409A (en) | 2019-11-15 |
Family
ID=68480379
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201810432051.XA Pending CN110455409A (en) | 2018-05-08 | 2018-05-08 | A kind of inclined system of ultraphotic spectrum Muller matrix imaging survey |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN110455409A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113702296A (en) * | 2021-09-29 | 2021-11-26 | 长春理工大学 | Water mist adhesion inhibiting system in atmosphere-sea mist simulation device |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106197670A (en) * | 2015-05-28 | 2016-12-07 | 广西师范学院 | A kind of double mode full polarization imaging surveys folk prescription method |
WO2017133810A1 (en) * | 2016-02-02 | 2017-08-10 | Robert Bosch Gmbh | Miniature spectrometer and method for switching a miniature spectrometer between imaging mode and spectrometer mode |
CN107356337A (en) * | 2017-07-13 | 2017-11-17 | 西安交通大学 | Compact miniature fast illuminated channel modulation full polarization imaging detection device and detection method |
-
2018
- 2018-05-08 CN CN201810432051.XA patent/CN110455409A/en active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106197670A (en) * | 2015-05-28 | 2016-12-07 | 广西师范学院 | A kind of double mode full polarization imaging surveys folk prescription method |
WO2017133810A1 (en) * | 2016-02-02 | 2017-08-10 | Robert Bosch Gmbh | Miniature spectrometer and method for switching a miniature spectrometer between imaging mode and spectrometer mode |
CN107356337A (en) * | 2017-07-13 | 2017-11-17 | 西安交通大学 | Compact miniature fast illuminated channel modulation full polarization imaging detection device and detection method |
Non-Patent Citations (3)
Title |
---|
WENYI REN等: "Bi-dimensional empirical mode decomposition based fringe-like pattern suppression in polarization interference imaging spectrometer", 《OPTICS COMMUNICATIONS》 * |
曹奇志等: "基于双折射晶体的快拍穆勒矩阵成像测偏原理分析", 《物理学报》 * |
曹奇志等: "空间调制稳态微型快拍成像测偏技术研究", 《物理学报》 * |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113702296A (en) * | 2021-09-29 | 2021-11-26 | 长春理工大学 | Water mist adhesion inhibiting system in atmosphere-sea mist simulation device |
CN113702296B (en) * | 2021-09-29 | 2022-03-04 | 长春理工大学 | Water mist adhesion inhibiting system in atmosphere-sea mist simulation device |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN1281921C (en) | 2D photoelectric auto collimation equipment and measuring method based on dynamic differential compensation process | |
US4188122A (en) | Interferometer | |
US3822942A (en) | Method of testing a length, angle, path difference or speed by detecting interference and apparatus therefor | |
CN104019762B (en) | High-precision long-range surface shape detector for optical surface | |
CN106918310B (en) | Contactless electro-optic crystal light pass surface normal and Z axis deviate angle measuring device and its measurement method | |
CN109916313B (en) | Grating displacement sensor based on secondary diffraction light interference | |
CN100570276C (en) | The two-dimensional transversal zeeman double-frequency laser linearity/coaxiality measurement mechanism | |
CN108106722A (en) | A kind of low temperature radiometer laser beam position and control system | |
CN104457571A (en) | Optical position measuring device | |
CN105509634B (en) | Interferometer | |
CN110455409A (en) | A kind of inclined system of ultraphotic spectrum Muller matrix imaging survey | |
CN109085558A (en) | Phased-array laser radar and its control method | |
CN211668748U (en) | Optical correction device for monitoring optical axis of reflecting telescope based on polarization beam splitting | |
CN105698710B (en) | A dynamic angle measurement apparatus and application thereof | |
KR20100099662A (en) | Method and apparatus for measuring tilt angle of reflective type liquid crystral cell | |
CN106225727A (en) | Array zeroing laser big working distance autocollimation and method | |
CN105158163A (en) | Large aperture uniaxial crystal light absorption coefficient measurement apparatus and method thereof | |
CN107340006A (en) | A kind of sensor main body and retro-reflection optoelectronic sensor | |
CN107917759B (en) | Polarization interference imaging spectrometer and production method based on stepped phase reflecting mirror | |
CN110455412A (en) | A kind of inclined system of birefringece crystal snap Muller matrix imaging survey | |
CN201532483U (en) | Assembling and adjusting mechanism for grating agglutination in spatial heterodyne interferometer | |
CN105181604A (en) | Multi-angle incident single shot ellipsometry measurement method | |
CN107917758B (en) | A kind of scan-type imaging spectrometer and its imaging method based on wollaston prism | |
CN113555766A (en) | Faraday laser based on pyramid array external cavity reflector and implementation method thereof | |
CN106225725A (en) | Portable array zeroing laser big working distance autocollimation and method |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
WD01 | Invention patent application deemed withdrawn after publication | ||
WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20191115 |