CN107917758B - A kind of scan-type imaging spectrometer and its imaging method based on wollaston prism - Google Patents
A kind of scan-type imaging spectrometer and its imaging method based on wollaston prism Download PDFInfo
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Abstract
A kind of scan-type imaging spectrometer and its imaging method based on wollaston prism, belongs to spectral imaging technology field.The invention patent is technically characterized by comprising the steps as follows: the camera lens including setting gradually, the polarizer, wollaston prism I, half-wave plate HWP, wollaston prism II, analyzer, detector.Incident light obtains linearly polarized light by the polarizer, obtains the separated light beam of two beams by prism group, obtains two-beam in unidirectional oscillating component using analyzer and have certain optical path difference.The present invention obtains the two beam coherent beams there are optical path difference using wollaston prism group, and coherent beam is superimposed on the detector, and different target points is imaged on the different location of detector, and index glass is not present, improves the stability and shock resistance of system.Present invention omits preposition parallel light paths, avoid slit, and optical path is simple, using push away sweep by the way of obtain interference pattern of a certain target point under different optical path differences.
Description
Technical field
The present invention relates to a kind of imaging spectrometer and its imaging methods, and in particular to a kind of based on wollaston prism
Scan-type imaging spectrometer and its imaging method belong to spectral imaging technology field.
Background technique
With the development of space technology, space optics, precision machinery, image procossing and data transmission technology, imaging
Spectral technology has become people and target two-dimensional space information and one-dimensional spectral information i.e. three is studied and obtained in photoelectric remote-sensing field
Tie up the important means of information.Imaging spectrometer combines imaging technique and spectral technique, has accomplished spatial information and spectrum
The unification of information, to realize the discriminance analysis to target.In military aspect, imaging spectral technology is to camouflage, hidden target
Have a very strong detectivity, at the same also scientific research, environmental protection and in terms of have vast potential for future development.
Dividing from interference pattern acquisition modes, the inteference imaging spectrometer of mainstream can be divided into spatial modulation type at present, when
Between modulation type.Time-modulation type interference spectroscope is since there are the movement of index glass, shock resistance and stability will be greatly reduced.It is empty
Between modulation type spectrometer since there is no moving component, have good stability, common are triangle common path (Sagnac) interference
Method and birefringence interference method.Having a defect that spectrally resolved ability is limited, optical system structure is relative complex, slit is needed,
Limit luminous flux and signal-to-noise ratio.
The characteristics of space-time combined modulation type interference spectrum imaging technique combines spatial modulation type and time-modulation type, at certain
One moment can obtain the interference image of the specific optical path difference of a certain target point, by scanning available a certain target point not
With the interference image under optical path difference, spectral information then is obtained using image processing system.Movable member is free of in system, and
Without slit, therefore there is high stability, high-throughput advantage.
It is that the polarization based on Savart polariscope is dry that space-time combined modulation interference imaging spectral technology, which has a kind of scheme, at present
Imaging technique is related to, schematic diagram is as shown in Figure 4.System is by preset lens L0, collimating mirror L1, polarizer G, Savart polariscope, analyzing
Device A, imaging lens L2, detector C CD and image processing system composition obtain optical path difference in space dimension, and time dimension obtains optical path difference
Accumulation, most change to obtain the recovery of spectral information through Fourier afterwards.
However the preposition collimated light path in existing space-time combined modulation inteference imaging spectrometer due to being added in its system
Part increases the volume of imaging spectrometer, limits the miniaturization of inteference imaging spectrometer.
Summary of the invention
It has been given below about brief overview of the invention, in order to provide about the basic of certain aspects of the invention
Understand.It should be appreciated that this summary is not an exhaustive overview of the invention.It is not intended to determine pass of the invention
Key or pith, nor is it intended to limit the scope of the present invention.Its purpose only provides certain concepts in simplified form,
Taking this as a prelude to a more detailed description discussed later.
In consideration of it, in order to overcome the above technical problems, the present invention provides a kind of scan-types based on wollaston prism
Imaging spectrometer and its imaging method do not have slit and preposition collimated light path part in the design, and optical path is simple, and are that point arrives
The imaging relations of point, energy focus on a point, and noise is relatively high, realizes obtaining for the interference pattern within the scope of larger optical path difference
It takes.
Scheme one: the present invention provides a kind of scan-type imaging spectrometers based on wollaston prism, including successively set
Set lens, the polarizer, wollaston prism group I, half-wave plate, wollaston prism group II, analyzer in same optical path
And detector；The wollaston prism group I and wollaston prism group II includes the first wedge and the second wedge, and first
Wedge and the second wedge compose a rectangular prism；The optical axis of the first wedge in the wollaston prism group I is flat in XY
In face, and positive parallel with X-axis, the optical axis of the second wedge in the wollaston prism group I is in YZ plane, and described the
When one wedge and the second wedge material are quartz, optical axis angle and Z axis forward direction are at 76.5 °；First wedge and the second wedge
When material is calcite, optical axis angle and Z axis forward direction are at 75 °；The optical axis of the first wedge in wollaston prism group II is in XY
In plane, and it is positive parallel with X-axis, the optical axis of the second wedge in wollaston prism group II is in YZ plane, and described first
When wedge and the second wedge material are quartz, optical axis angle and Z axis forward direction are at 103.5 °；First wedge and the second wedge material
When material is quartzy, optical axis angle and Z axis forward direction are at 104.8 °；The half-wave plate be located at wollaston prism group I and
Between wollaston prism group II, for changing the polarization direction of two-beam.
Further: the polarization direction of the polarizer is in X/Y plane and at 45 ° with X, Y-axis forward direction.
Further: the polarization direction of the parallel polarizer of the polarization direction of the analyzer.
Further: when first wedge and the second wedge material are quartz, the angle of wedge is θ=3.5 °, with a thickness of t=
4.8mm；When first wedge and the second wedge material are calcite, the angle of wedge is θ=2 °, with a thickness of t=3mm.
A kind of scheme two: spectrum that the scan-type imaging spectrometer based on wollaston prism is realized proposed by the present invention
Imaging method, specific steps:
The light that object issues is converged by lens, and the light of convergence becomes linearly polarized light entrance after the polarizer
Wollaston prism group I, half-wave plate, wollaston prism group II, linearly polarized light become two after wollaston prism group
The orthogonal light of beam polarization state, then using obtaining two-beam oscillating component in the same direction after analyzer and have certain light path
Difference；
Coherent superposition, the striped that the detector is located at wollaston prism group are fixed on the detector for two beam coherent beams
On plane, different target points is imaged on the different location of detector, has obtained the target image of superposition interference information；Lead to again
Interference image of the available a certain target point under different optical path differences is over-scanned, obtains spectrum letter by image processing system
Breath.
The utility model has the advantages that
The present invention is based on the scan-type optical spectrum imagers of wollaston prism, first with birefringent device wollaston
Prism group generates optical path difference, avoids the movement of index glass, substantially increases its shock resistance and stability.Preposition collimated light is omitted
Road reduces the volume of imaging spectrometer.The scheme for using Space-Time Modulation simultaneously obtains a certain target point not by scanning
With the interference pattern under optical path difference, spectral information is obtained using image processing system, avoids slit, improves signal-to-noise ratio.
Detailed description of the invention
Fig. 1 is a kind of structural schematic diagram of interference spectrum imager based on wollaston prism.
Fig. 2 is that a kind of pushing away for inteference imaging spectrometer sweeps schematic diagram.
Fig. 3 is a kind of optical path point of wollaston prism group in the scan-type imaging spectrometer based on wollaston prism
Analysis figure.
Fig. 4 is a kind of structural schematic diagram of the polarization interference optical spectrum imagers of field-compensation type Savart polariscope.
Specific embodiment
Exemplary embodiment of the invention is described hereinafter in connection with attached drawing.For clarity and conciseness,
All features of actual implementation mode are not described in the description.It should be understood, however, that developing any this actual implementation
Much decisions specific to embodiment must be made during example, to realize the objectives of developer, for example, symbol
Restrictive condition those of related to system and business is closed, and these restrictive conditions may have with the difference of embodiment
Changed.In addition, it will also be appreciated that although development is likely to be extremely complex and time-consuming, to having benefited from the present invention
For those skilled in the art of disclosure, this development is only routine task.
Here, and also it should be noted is that, in order to avoid having obscured the present invention because of unnecessary details, in the accompanying drawings
Illustrate only with closely related apparatus structure and/or processing step according to the solution of the present invention, and be omitted and the present invention
The little other details of relationship.
Embodiment 1: a kind of scan-type imaging based on wollaston prism is present embodiments provided as shown in Fig. 1
Spectrometer,
Including be successively set in same optical path lens 1, the polarizer 2, wollaston prism group I3, half-wave plate 4,
Wollaston prism group II5, analyzer 6 and detector 7；The wollaston prism group I3 and wollaston prism group II5
It include the first wedge and the second wedge, the first wedge and the second wedge compose a rectangular prism, and material is quartz；It is described
The optical axis of the first wedge in wollaston prism group I3 in X/Y plane, and with positive parallel, the wollaston rib of X-axis
The optical axis of the second wedge in microscope group I3 is in YZ plane, and with Z axis forward direction at 76.5 °；In wollaston prism group II5
The optical axis of first wedge in X/Y plane, and with positive parallel, the optical axis of the second wedge in wollaston prism group II5 of X-axis
In YZ plane, and with Z axis forward direction at 103.5 °；The half-wave plate 4 is located at wollaston prism group I3 and wollaston rib
Between microscope group II5, for changing the polarization direction of two-beam.
Specifically: the polarization direction of the polarizer 2 is in X/Y plane and at 45 ° with X, Y-axis forward direction.
Specifically: the polarization direction of the parallel polarizer 2 of the polarization direction of the analyzer 6.
More specifically: the angle of wedge of first wedge and the second wedge is θ=3.5 °, with a thickness of t=4.8mm.
Embodiment 2: the present invention provides a kind of scan-type imaging spectrometers based on wollaston prism, including successively
Lens, the polarizer, wollaston prism group I, half-wave plate, wollaston prism group II, analyzing in same optical path are set
Device and detector；The wollaston prism group I and wollaston prism group II includes the first wedge and the second wedge, and
One wedge and the second wedge compose a rectangular prism；Material is calcite.First in the wollaston prism group I
The optical axis of wedge is and positive parallel with X-axis in X/Y plane, and the optical axis of the second wedge in the wollaston prism group I exists
In YZ plane, and with Z axis forward direction at 75 °；The optical axis of the first wedge in wollaston prism group II is in X/Y plane, and and X
Axis is positive parallel, and the optical axis of the second wedge in wollaston prism group II is in YZ plane, and with Z axis forward direction at 104.8 °；
The half-wave plate is located between wollaston prism group I and wollaston prism group II, for changing the polarization side of two-beam
To.
Further: the polarization direction of the polarizer is in X/Y plane and at 45 ° with X, Y-axis forward direction.
Further: the polarization direction of the parallel polarizer of the polarization direction of the analyzer.
Further: the angle of wedge of first wedge and the second wedge is θ=2 °, with a thickness of t=3mm.
Embodiment 3: a kind of scan-type imaging based on wollaston prism is present embodiments provided as shown in Fig. 1
The spectrum imaging method that spectrometer is realized, specific steps:
The light that object issues is converged by lens 1, and the light of convergence becomes linearly polarized light entrance after the polarizer 2
Wollaston prism group I3, half-wave plate 4, wollaston prism group II5, linearly polarized light become after wollaston prism group
At the orthogonal light of two beam polarization states, then using obtaining two-beam oscillating component in the same direction after analyzer 6 and have one
Determine optical path difference；
Two beam coherent beams coherent superposition on detector 7, the striped that the detector is located at wollaston prism group are fixed
On plane, different target points is imaged on the different location of detector 7, has obtained the target image of superposition interference information；Again
By scanning interference image of the available a certain target point under different optical path differences, spectrum letter is obtained by image processing system
Breath.
Specifically: the light that certain point issues in target is incident on the polarizer 2 after lens 1, and light passes through the polarizer 2
After become linearly polarized light and enter wollaston prism group I3, linearly polarized light is divided into two beams: ordinary light after entering the first wedge
(optical axis of the electric field perpendicular to crystal) and extraordinary ray (optical axis of the magnetic field perpendicular to crystal).
Due to refractive index difference, the propagation path of two-beam is different.Two-beam separated later is incident on the second wedge, by
90 ° are deflected relative to first piece of wedge in second piece of wedge optical axis direction, o light and e light polarization property change, and former o light becomes
Deviation is generated for e light, former e light becomes using the rear surface of the second wedge to be incident on half-wave plate 4 after deviation occurs for o light.
This two beams polarised light changes again by 4 rear polarizer direction of half-wave plate, and former H mode becomes transverse magnetic wave, former horizontal
Magnetic wave becomes H mode, is incident on wollaston prism group II5 later, similarly due to transmission path difference generate optical path difference, two
Beam polarised light via analyzer 6 close beam at the polarised light of same polarization direction the coherent superposition on imaging detector 7.Different points
The different location being imaged on detector 7 finally obtained the target image containing interference information, obtain spectrum after restoring
Information.Wedge is uniaxial crystal.
Inteference imaging spectrometer needs provided in this embodiment based on wollaston prism can just obtain after being scanned
The complete interference pattern information of a certain target point, object angle of incident light is different, and obtained optical path difference is different, with imaging
The relative motion of spectrometer and object, tested object point constantly change relative to the field angle of instrument, will form interference pattern in space.
Scanning process is as shown in figure 3, using 5 detector pixels as signal (x1-x5) in figure, and measured target o'clock is after 5 times push away and sweep
Complete interference pattern is obtained, the x1 at t1 moment, the x2 at t2 moment, the x3 at t3 moment, the x4 at t4 moment are respectively corresponded, the t5 moment
x5.The interference information for sometime obtaining a certain specified point obtains all interference informations of a certain specified point after being scanned.
Double wollaston prism groups are used in this implementation, it is therefore an objective to fringe location face be removed inside prism, item is facilitated
Line positioning surface is overlapped with the image planes of system.The interference information that system obtains comes from wollaston prism group, wollaston prism
The optical path analysis of group is as shown in Figure 3.Wherein, for the optical axis direction of prism each parallel to the surface of prism, optical axis angle is respectively δ1
And δ2。
2. light is mapped to region by region is 1. oblique, incident light is divided into two bundles by uniaxial crystal, extraordinary ray electric field polarization
Direction is parallel with optical axis direction (perpendicular to the plane of incidence), is H mode (TE wave)；Ordinary light magnetic field polarization direction and optical axis direction
In parallel, it is transverse magnetic wave (TM wave), is had according to the law of refraction:
n1For region 1. refractive index.In birefringece crystal, wave vector meets the law of refraction, the light direction of propagation (wave print
Court of a feudal ruler direction vector) perpendicular to corrugated.Region 2. in Poynting vector be overlapped with wave vector, therefore region is 2., and 3. interface enters
Firing angle are as follows:
It is passed through 2. in light, 3. during region interface, since optical axis direction changes, TE wave is become seeking from extraordinary ray
Ordinary light, therefore have:
TM wave becomes extraordinary ray from ordinary light, and the wave vector deflection of TM wave isRadiation direction (Poynting vector
Direction) angle isHad according to the law of refraction:
θe3For region 3. in angle between wave vector and optical axis, ne(θe3) be region 3. in e light refractive index, indicate
Are as follows:
ψ is the normal of the region interface ②He③ and the angle of the optical axis direction of region 3.:
φeIt is the angle that light propagates (Poynting vector) direction and region 3. optical axis direction:
The angle of the light direction of propagation and normal are as follows:
S in subscript is expressed as TM wave Poynting vector (radiation direction) in region, region 3. in ray refractive index are as follows:
neS(θe3)=ne(θe3)cosθkS
θ in formulakSFor the angle between wave vector and the light direction of propagation.
3. incidence angle 4. is arrived in region are as follows:
The angle of emergence is obtained by phase matched are as follows:
Region 4. in half-wave plate is added so that the polarization direction of light is rotated by 90 °, TE wave becomes TM wave at this time, and TM wave becomes
For TE wave:
The angle of wedge of second piece of prism and first piece of prism are symmetrical about y-axis.
5. middle TE wave is extraordinary ray in region, and TM wave is ordinary light, and wave vector is overlapped with Poynting vector, has:
5. 6. incidence angle is arrived in region are as follows:
Into region 6. after due to optical axis direction it is vertical with the optical axis direction of region 5., TE wave becomes ordinary from extraordinary ray
Light, TM wave are extraordinary ray by ordinary light:
Angle between wave vector direction and optical axis are as follows:
The light direction of propagation are as follows:
7. 6. region is arrived has:
7. the angle of emergence in area are as follows:
The ordinate of given incidence point can be obtained by the intersecting point coordinate of light Yu each interface.
The central axes of prism are defined as coordinate z-axis, are y-axis along prism length direction definition.The definition prism angle of wedge is γ,
γ2=180 ° of-γ, with a thickness of w, then prism length L=w/tan γ.Define half-wave plate with a thickness of d.Assuming that incident ordinate
For y0, then the intersection point of light and each interface are as follows:
The present invention obtains the two beam coherent beams there are optical path difference using wollaston prism group, and coherent beam is detecting
It is superimposed on device, different target points is imaged on the different location of detector, and there is no dynamic in conventional interference imaging spectrometer
Mirror improves the stability and shock resistance of system.Present invention omits preposition parallel light paths, avoid slit, and optical path is simple, adopts
Interference pattern of a certain target point under different optical path differences is obtained with the mode swept is pushed away.
Although disclosed embodiment is as above, its content is only to facilitate understand technical side of the invention
Case and the embodiment used, are not intended to limit the present invention.Any those skilled in the art to which this invention pertains, not
Under the premise of being detached from disclosed core technology scheme, any modification and change can be made in form and details in implementation
Change, but protection scope defined by the present invention, the range that the appended claims that must still be subject to limits.
Claims (1)
1. a kind of scan-type imaging spectrometer based on wollaston prism, it is characterised in that: including being successively set on same light
Lens (1), the polarizer (2), wollaston prism group I(3 in road), half-wave plate (4), wollaston prism group II(5),
Analyzer (6) and detector (7)；The wollaston prism group I(3) and wollaston prism group II(5) it include first
Wedge and the second wedge, the first wedge and the second wedge compose a rectangular prism；The wollaston prism group I(3) in
The first wedge optical axis in X/Y plane, and with the second light in parallel, the wollaston prism group I(3 of X-axis forward direction)
The optical axis of wedge is in YZ plane, when first wedge and the second wedge material are quartz, optical axis angle and Z axis forward direction at
76.5°；When first wedge and the second wedge material are calcite, optical axis angle and Z axis forward direction are at 75 °；Wollaston rib
Microscope group II(5) in the first wedge optical axis in X/Y plane, and in parallel, the wollaston prism group II(5 of X-axis forward direction)
The second wedge optical axis in YZ plane, when first wedge and the second wedge material are quartz, optical axis angle and Z axis are just
To at 103.5 °；When first wedge and the second wedge material are quartz, optical axis angle and Z axis forward direction are at 104.8 °；It is described
Half-wave plate (4) is located at wollaston prism group I(3) and wollaston prism group II(5) between, for changing the inclined of two-beam
Shake direction；
Working principle is:
The light that object issues is converged by lens (1), and the light of convergence becomes linearly polarized light entrance after the polarizer (2)
Wollaston prism group I(3), half-wave plate (4), wollaston prism group II(5), linearly polarized light pass through wollaston prism
Become the orthogonal light of two beam polarization states after group, then using obtaining the vibration of two-beam in the same direction point after analyzer (6)
It measures and has certain optical path difference；
Two beam coherent beams coherent superposition on detector (7), the detector are located at the fringe location of wollaston prism group
On face, different target points is imaged on the different location of detector (7), has obtained the target image of superposition interference information；Again
By scanning interference image of the available a certain target point under different optical path differences, spectrum letter is obtained by image processing system
Breath；
Specifically:
Region before defining the first wedge of wollaston prism group I is region, in wollaston prism group the first wedge of I
Portion is region, the second wedge of wollaston prism group I inside is region, half-wave plate inside is region, wollaston
It is region inside the first wedge of prism group II, the second wedge of wollaston prism group II inside is region, wollaston
To being region before detector after the second wedge of prism group II；
Light is by regionIt is oblique to be mapped to region, incident light is divided into two bundles by uniaxial crystal, extraordinary ray electric field polarization direction
It is parallel with optical axis direction, i.e., it is H mode, i.e. TE wave perpendicular to the plane of incidence；Ordinary light magnetic field polarization direction and optical axis direction are flat
Row is transverse magnetic wave, i.e. TM wave, is had according to the law of refraction:
For regionRefractive index；In birefringece crystal, wave vector meets the law of refraction, and Poynting vector direction is perpendicular to wave
Face；In regionMiddle Poynting vector is overlapped with wave vector, therefore region, regionInterface incidence angle are as follows:
。
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