CN107917758A - A kind of scan-type imaging spectrometer and its imaging method based on wollaston prisms - Google Patents
A kind of scan-type imaging spectrometer and its imaging method based on wollaston prisms Download PDFInfo
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- CN107917758A CN107917758A CN201711393236.6A CN201711393236A CN107917758A CN 107917758 A CN107917758 A CN 107917758A CN 201711393236 A CN201711393236 A CN 201711393236A CN 107917758 A CN107917758 A CN 107917758A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/2823—Imaging spectrometer
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
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- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
Abstract
A kind of scan-type imaging spectrometer and its imaging method based on wollaston prisms, belong to spectral imaging technology field.The present invention technical characterstic be：Including the camera lens set gradually, the polarizer, wollaston prism I, half-wave plate HWP, wollaston prism II, analyzer, detector.Incident light obtains linearly polarized light by the polarizer, obtains the separated light beam of two beams by prism group, then obtain two-beam in unidirectional oscillating component by analyzer and have certain optical path difference.The present invention using wollaston prism groups obtains the two beam coherent beams there are optical path difference, and coherent beam is superimposed on the detector, and different target points is imaged on the diverse location of detector, there is no index glass, improves the stability and shock resistance of system.Present invention omits preposition parallel light path, avoids slit, and light path is simple, using push away sweep by the way of obtain interference pattern of a certain target point under different optical path differences.
Description
Technical field
The present invention relates to a kind of imaging spectrometer and its imaging method, and in particular to a kind of based on wollaston prisms
Scan-type imaging spectrometer and its imaging method, belong to spectral imaging technology field.
Background technology
With the development of space technology, space optics, precision optical machinery, image procossing and data transmission technology, imaging
Target two-dimensional space information and one-dimensional spectral information i.e. three are studied and obtained to spectral technology as people in photoelectric remote-sensing field
Tie up the important means of information.Imaging spectrometer combines imaging technique and spectral technique, has accomplished spatial information and spectrum
The unification of information, so as to fulfill the discriminance analysis to target.In military aspect, imaging spectral technology is to camouflage, hidden target
There is a very strong detectivity, while also in scientific research, environmental protection and civilian etc. have vast potential for future development.
Dividing from interference pattern acquisition modes, the inteference imaging spectrometer of mainstream can be divided into spatial modulation type at present, when
Between modulation type.Time-modulation type interference spectroscope can be substantially reduced since there are the movement of index glass, its shock resistance and stability.It is empty
Between modulation type spectrometer since there is no moving component, have good stability, common are triangle common path (Sagnac) interference
Method and birefringence interference method.Having a defect that spectrally resolved ability is limited, optical system structure is relative complex, it is necessary to slit,
Limit luminous flux and signal-to-noise ratio.
The characteristics of space-time combined modulation type interference spectrum imaging technique combines spatial modulation type and time-modulation type, at certain
One moment can obtain the interference image of the specific optical path difference of a certain target point, and a certain target point can be obtained not by scanning
With the interference image under optical path difference, then spectral information is obtained by image processing system again.Movable member is free of in system, and
Without slit, therefore there is high stability, high-throughout advantage.
It is that the polarization based on Savart polariscopes is done that space-time combined modulation interference imaging spectral technology, which has a kind of scheme, at present
Imaging technique is related to, schematic diagram is as shown in Figure 4.System is by preset lens L0, collimating mirror L1, polarizer G, Savart polariscope, analyzing
Device A, imaging lens L2, detector C CD and image processing system composition, obtain optical path difference, time dimension obtains optical path difference in space dimension
Accumulation, most change to obtain the recovery of spectral information through Fourier afterwards.
But due to the preposition collimated light path added in its system in existing space-time combined modulation inteference imaging spectrometer
Part, adds the volume of imaging spectrometer, limits the miniaturization of inteference imaging spectrometer.
The content of the invention
The brief overview on the present invention is given below, in order to provide on the basic of certain aspects of the invention
Understand.It should be appreciated that this general introduction is not the exhaustive general introduction on the present invention.It is not intended to determine the pass of the present invention
Key or pith, nor is it intended to limit the scope of the present invention.Its purpose only provides some concepts in simplified form,
In this, as the preamble in greater detail discussed later.
In consideration of it, in order to overcome above-mentioned technical problem, the present invention provides a kind of scan-type based on wollaston prisms
Imaging spectrometer and its imaging method, do not have slit and preposition collimated light path part in the design, light path is simple, and are that point arrives
The imaging relations of point, energy are focused on a point, and noise is higher, realizes obtaining for the interference pattern in the range of larger optical path difference
Take.
Scheme one：The present invention provides a kind of scan-type imaging spectrometer based on wollaston prisms, including set successively
Put lens, the polarizer, wollaston prism groups I, half-wave plate, wollaston prism groups II, analyzer in same light path
And detector；The wollaston prism groups I and wollaston prism group II includes the first wedge and the second wedge, and first
Wedge and the second wedge compose a square prism；The optical axis of the first wedge in the wollaston prism groups I is put down in XY
In face, and it is parallel with X-axis forward direction, the optical axis of the second wedge in the wollaston prism groups I is in YZ planes, and described
When one wedge and the second wedge material are quartz, optical axis angle is with Z axis forward direction into 76.5 °；First wedge and the second wedge
When material is calcite, optical axis angle is with Z axis forward direction into 75 °；The optical axis of the first wedge in wollaston prism groups II is in XY
In plane, and it is parallel with X-axis forward direction, the optical axis of the second wedge in wollaston prism groups II is in YZ planes, and described first
When wedge and the second wedge material are quartz, optical axis angle is with Z axis forward direction into 103.5 °；First wedge and the second wedge material
Expect for quartz when, optical axis angle and Z axis forward direction are into 104.8 °；The half-wave plate be located at wollaston prism groups I and
Between wollaston prism groups II, for changing the polarization direction of two-beam.
Further：The polarization direction of the polarizer is in X/Y plane and at 45 ° with X, Y-axis forward direction.
Further：The polarization direction of the parallel polarizer of polarization direction of the analyzer.
Further：First wedge and the second wedge material for quartz when, its angle of wedge is θ=3.5 °, thickness t=
4.8mm；When first wedge and the second wedge material are calcite, its angle of wedge is θ=2 °, thickness t=3mm.
Scheme two：The spectrum that a kind of scan-type imaging spectrometer based on wollaston prisms proposed by the present invention is realized
Imaging method, specific steps：
The light that object is sent is converged by lens, and the light of convergence becomes linearly polarized light entrance after the polarizer
Wollaston prism groups I, half-wave plate, wollaston prism group II, linearly polarized light become two after wollaston prism groups
The orthogonal light of beam polarization state, two-beam oscillating component in the same direction is then obtained after analyzer and has certain light path again
Difference；
Two beam coherent beams on the detector determine by coherent superposition, the striped that the detector is located at wollaston prism groups
On plane, different target points is imaged on the diverse location of detector, has obtained the target image of superposition interference information；Lead to again
Overscanning can obtain interference image of a certain target point under different optical path differences, and spectrum letter is obtained by image processing system
Breath.
Beneficial effect：
Scan-type optical spectrum imagers of the invention based on wollaston prisms, first with birefringence device wollaston
Prism group produces optical path difference, avoids the movement of index glass, substantially increases its shock resistance and stability.Eliminate preposition collimated light
Road, reduces the volume of imaging spectrometer.The scheme of Space-Time Modulation is employed at the same time, and a certain target point is obtained not by scanning
Spectral information is obtained with the interference pattern under optical path difference, then by image processing system, slit is avoided, improves signal-to-noise ratio.
Brief description of the drawings
Fig. 1 is a kind of structure diagram of the interference spectrum imager based on wollaston prisms.
Fig. 2 is that a kind of pushing away for inteference imaging spectrometer sweeps schematic diagram.
Fig. 3 is a kind of light path point of wollaston prism groups in scan-type imaging spectrometer based on wollaston prisms
Analysis figure.
Fig. 4 is a kind of structure diagram of the polarization interference optical spectrum imagers of field-compensation type Savart polariscopes.
Embodiment
The one exemplary embodiment of the present invention is described hereinafter in connection with attached drawing.For clarity and conciseness,
All features of actual implementation mode are not described in the description.It should be understood, however, that developing any this actual implementation
It must be made during example much specific to the decision of embodiment, to realize the objectives of developer, for example, symbol
Conjunction and system and those relevant restrictive conditions of business, and these restrictive conditions may have with the difference of embodiment
Changed.In addition, it will also be appreciated that although development is likely to be extremely complex and time-consuming, to having benefited from the present invention
For those skilled in the art of disclosure, this development is only routine task.
Herein, it is also necessary to which explanation is a bit, in order to avoid having obscured the present invention because of unnecessary details, in the accompanying drawings
The apparatus structure closely related with scheme according to the present invention and/or processing step are illustrate only, and is eliminated and the present invention
The little other details of relation.
Embodiment 1：A kind of scan-type imaging based on wollaston prisms is present embodiments provided as shown in Figure 1
Spectrometer,
Including be successively set in same light path lens 1, the polarizer 2, wollaston prism groups I3, half-wave plate 4,
Wollaston prism groups II5, analyzer 6 and detector 7；The wollaston prism groups I3 and wollaston prism group II5
Include the first wedge and the second wedge, the first wedge and the second wedge compose a square prism, and material is quartz；It is described
The optical axis of the first wedge in wollaston prism groups I3 is in X/Y plane, and, the wollaston rib parallel with X-axis forward direction
The optical axis of the second wedge in microscope group I3 is in YZ planes, and with Z axis forward direction into 76.5 °；In wollaston prism groups II5
The optical axis of first wedge is in X/Y plane, and, the optical axis of second wedge in wollaston prism group II5 parallel with X-axis forward direction
In YZ planes, and with Z axis forward direction into 103.5 °；The half-wave plate 4 is located at wollaston prism group I3 and wollaston ribs
Between microscope group II5, for changing the polarization direction of two-beam.
Specifically：The polarization direction of the polarizer 2 is in X/Y plane and at 45 ° with X, Y-axis forward direction.
Specifically：The polarization direction of the parallel polarizer 2 of polarization direction of the analyzer 6.
More specifically：The angle of wedge of first wedge and the second wedge is θ=3.5 °, thickness t=4.8mm.
Embodiment 2：The present invention provides a kind of scan-type imaging spectrometer based on wollaston prisms, including successively
It is arranged on lens in same light path, the polarizer, wollaston prism groups I, half-wave plate, wollaston prism groups II, analyzing
Device and detector；The wollaston prism groups I and wollaston prism group II includes the first wedge and the second wedge, the
One wedge and the second wedge compose a square prism；Material is calcite.First in the wollaston prism groups I
The optical axis of wedge is and parallel with X-axis forward direction in X/Y plane, and the optical axis of the second wedge in the wollaston prism groups I exists
In YZ planes, and with Z axis forward direction into 75 °；The optical axis of the first wedge in wollaston prism groups II is in X/Y plane, and and X
Axis forward direction is parallel, and the optical axis of the second wedge in wollaston prism groups II is in YZ planes, and with Z axis forward direction into 104.8 °；
The half-wave plate is located between wollaston prism group I and wollaston prism groups II, for changing the polarization side of two-beam
To.
Further：The polarization direction of the polarizer is in X/Y plane and at 45 ° with X, Y-axis forward direction.
Further：The polarization direction of the parallel polarizer of polarization direction of the analyzer.
Further：The angle of wedge of first wedge and the second wedge is θ=2 °, thickness t=3mm.
Embodiment 3：A kind of scan-type imaging based on wollaston prisms is present embodiments provided as shown in Figure 1
The spectrum imaging method that spectrometer is realized, specific steps：
The light that object is sent is converged by lens 1, and the light of convergence becomes linearly polarized light entrance after the polarizer 2
Wollaston prism groups I3, half-wave plate 4, wollaston prism group II5, linearly polarized light become after wollaston prism groups
The light orthogonal into two beam polarization states, two-beam oscillating component in the same direction is then obtained after analyzer 6 and has one again
Determine optical path difference；
Two beam coherent beams coherent superposition on detector 7, the striped that the detector is located at wollaston prism groups are determined
On plane, different target points is imaged on the diverse location of detector 7, has obtained the target image of superposition interference information；Again
Interference image of a certain target point under different optical path differences can be obtained by scanning, spectrum letter is obtained by image processing system
Breath.
Specifically：The light that certain point is sent in target is incided after lens 1 on the polarizer 2, and light passes through the polarizer 2
After become linearly polarized light and enter wollaston prism group I3, linearly polarized light is divided into two beams after entering the first wedge：Ordinary light
(optical axis of the electric field perpendicular to crystal) and extraordinary ray (optical axis of the magnetic field perpendicular to crystal).
Since refractive index is different, the propagation path of two-beam is different.Two-beam separated afterwards incides the second wedge, by
90 ° are deflected relative to first piece of wedge in second piece of wedge optical axis direction, o light and e light polarization properties change, and former o light becomes
Deviation is produced for e light, former e light becomes to incide half-wave plate 4 by the rear surface of the second wedge again after deviation occurs for o light.
This two beams polarised light changes again by 4 rear polarizer direction of half-wave plate, and former H mode is changed into transverse magnetic wave, former horizontal
Magnetic wave is changed into H mode, incides wollaston prism group II5 afterwards, similarly produces optical path difference since transmission path is different, and two
Beam polarised light via analyzer 6 close beam into same polarization direction polarised light on imaging detector 7 coherent superposition.Different points
The diverse location being imaged on detector 7, finally obtained the target image containing interference information, spectrum is obtained after recovery
Information.Wedge is uniaxial crystal.
Inteference imaging spectrometer provided in this embodiment based on wollaston prisms needs just obtain after being scanned through
The complete interference pattern information of a certain target point, object angle of incident light is different, and obtained optical path difference is different, with imaging
The relative motion of spectrometer and object, tested object point constantly change relative to the field angle of instrument, will form interference pattern in space.
Scanning process is as shown in figure 3, using 5 detector pixels as signal (x1-x5) in figure, and measured target o'clock is after 5 times push away and sweep
Complete interference pattern is obtained, corresponds to the x1 at t1 moment, the x2 at t2 moment, the x3 at t3 moment, the x4 at t4 moment respectively, the t5 moment
x5.The interference information of a certain specified point is sometime obtained, all interference informations of a certain specified point are obtained after being scanned through.
Double wollaston prism groups are employed in this implementation, it is therefore an objective to fringe location face is removed inside prism, facilitates bar
Line positioning surface is overlapped with the image planes of system.The interference information that system obtains comes from wollaston prism groups, wollaston prisms
The optical path analysis of group is as shown in Figure 3.Wherein, for the optical axis direction of prism each parallel to the surface of prism, optical axis angle is respectively δ1
And δ2。
2. light is mapped to region by region is 1. oblique, incident light is divided into two beams, extraordinary ray electric field polarization by uniaxial crystal
Direction is parallel with optical axis direction (perpendicular to the plane of incidence), is H mode (TE ripples)；Ordinary light magnetic field polarization direction and optical axis direction
It is parallel, it is transverse magnetic wave (TM ripples), is had according to the law of refraction：
n1For region 1. refractive index.In birefringece crystal, wave vector meets the law of refraction, and (ripple prints for the light direction of propagation
Court of a feudal ruler direction vector) perpendicular to corrugated.In region, 2. middle Poynting vector is overlapped with wave vector, therefore region is 2., and 3. interface enters
Firing angle is：
In light through 2., 3. during region interface, since optical axis direction changes, TE ripples are changed into seeking from extraordinary ray
Ordinary light, therefore have：
TM ripples are changed into extraordinary ray from ordinary light, and the wave vector deflection of TM ripples isRadiation direction (Poynting vector
Direction) angle isHad according to the law of refraction：
θe3For the region 3. angle between middle wave vector and optical axis, ne(θe3) for the refractive index of region 3. middle e light, represent
For：
ψ is angle of the normal with the optical axis direction of region 3. of region ②He③ interfaces：
φeIt is the angle that light propagates (Poynting vector) direction and region 3. optical axis direction：
The angle of the light direction of propagation and normal is：
S in subscript is expressed as TM ripples Poynting vector (radiation direction) in region, and 3. middle ray refractive index is in region：
neS(θe3)=ne(θe3)cosθkS
θ in formulakSFor the angle between wave vector and the light direction of propagation.
3. 4. incidence angle that region arrives is：
Obtaining the angle of emergence by phase matched is：
In region 4. middle addition half-wave plate so that the polarization direction of light is rotated by 90 °, and TE ripples become TM ripples at this time, and TM ripples become
For TE ripples：
The angle of wedge of second piece of prism and first piece of prism are symmetrical on y-axis.
5. middle TE ripples are extraordinary ray in region, and TM ripples are ordinary light, and wave vector is overlapped with Poynting vector, had：
5. 6. incidence angle is arrived in region：
Into region 6. after due to optical axis direction of the optical axis direction with region 5. it is vertical, TE ripples are changed into ordinary from extraordinary ray
Light, TM ripples are extraordinary ray by ordinary light：
Angle between wave vector direction and optical axis is：
The light direction of propagation is：
7. 6. region is arrived has：
7. the angle of emergence in area is：
The ordinate of given incidence point can be obtained by the intersecting point coordinate of light and each interface.
The central axes of prism are defined as coordinate z-axis, and y-axis is defined as along prism length direction.It is γ to define the prism angle of wedge,
γ2=180 ° of-γ, thickness w, then prism length L=w/tan γ.The thickness for defining half-wave plate is d.Assuming that incident ordinate
For y0, then the intersection point of light and each interface be：
The present invention obtains the two beam coherent beams there are optical path difference using wollaston prism groups, and coherent beam is detecting
It is superimposed on device, different target points is imaged on the diverse location of detector, and there is no dynamic in conventional interference imaging spectrometer
Mirror, improves the stability and shock resistance of system.Present invention omits preposition parallel light path, avoids slit, and light path is simple, adopts
The mode swept with pushing away obtains interference pattern of a certain target point under different optical path differences.
Although disclosed embodiment is as above, its content is only to facilitate understand the technical side of the present invention
Case and the embodiment used, are not intended to limit the present invention.Any those skilled in the art to which this invention pertains, not
On the premise of departing from disclosed core technology scheme, any modification can be made in the form and details of implementation and is become
Change, but the protection domain that the present invention is limited, the scope that the appended claims that must still be subject to limits.
Claims (5)
- A kind of 1. scan-type imaging spectrometer based on wollaston prisms, it is characterised in that：Including being successively set on same light Lens (1), the polarizer (2), wollaston prism groups I (3), half-wave plate (4), wollaston prism groups II (5), inspection in road Inclined device (6) and detector (7)；The wollaston prism groups I (3) and wollaston prism groups II (5) include the first light Wedge and the second wedge, the first wedge and the second wedge compose a square prism；In the wollaston prism groups I (3) The optical axis of first wedge is in X/Y plane, and, second wedge in the wollaston prism group I (3) parallel with X-axis forward direction Optical axis in YZ planes, first wedge and the second wedge material for quartz when, optical axis angle is with Z axis forward direction into 76.5 °； When first wedge and the second wedge material are calcite, optical axis angle is with Z axis forward direction into 75 °；Wollaston prism groups II (5) optical axis of the first wedge in is and parallel with X-axis forward direction in X/Y plane, and second in wollaston prism groups II (5) The optical axis of wedge in YZ planes, first wedge and the second wedge material for quartz when, optical axis angle and Z axis forward direction into 103.5°；When first wedge and the second wedge material are quartz, optical axis angle is with Z axis forward direction into 104.8 °；The half-wave Piece (4) is located between wollaston prism groups I (3) and wollaston prism groups II (5), for changing the polarization side of two-beam To.
- A kind of 2. scan-type imaging spectrometer based on wollaston prisms according to claim 1, it is characterised in that： The polarization direction of the polarizer (2) is in X/Y plane and at 45 ° with X, Y-axis forward direction.
- A kind of 3. scan-type imaging spectrometer based on wollaston prisms according to claim 2, it is characterised in that： The polarization direction of the parallel polarizer of polarization direction (2) of the analyzer (6).
- A kind of 4. scan-type imaging spectrometer based on wollaston prisms according to claim 1, it is characterised in that： First wedge and the second wedge material for quartz when, its angle of wedge is θ=3.5 °, thickness t=4.8mm；First light When wedge and the second wedge material are calcite, its angle of wedge is θ=2 °, thickness t=3mm.
- 5. the spectrum imaging method that a kind of scan-type imaging spectrometer based on wollaston prisms is realized, specific steps：The light that object is sent is converged by lens (1), and the light of convergence becomes linearly polarized light entrance after the polarizer (2) Wollaston prism groups I (3), half-wave plate (4), wollaston prism groups II (5), linearly polarized light pass through wollaston prisms Become the orthogonal light of two beam polarization states after group, then obtain the vibration of two-beam in the same direction point after analyzer (6) again Measure and have certain optical path difference；Two beam coherent beams coherent superposition on detector (7), the detector are located at the fringe location of wollaston prism groups On face, different target points is imaged on the diverse location of detector (7), has obtained the target image of superposition interference information；Again Interference image of a certain target point under different optical path differences can be obtained by scanning, spectrum letter is obtained by image processing system Breath.
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| WO2021033177A1 (en) * | 2019-08-20 | 2021-02-25 | Woft Cam Ltd. | Scanning hyperspectral camera and method |
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|---|---|---|---|---|
| CN103822712A (en) * | 2014-03-04 | 2014-05-28 | 中国科学院光电研究院 | Imaging method and imaging spectrometer based on Wollaston prism light splitting |
| CN107356337A (en) * | 2017-07-13 | 2017-11-17 | 西安交通大学 | Compact miniature fast illuminated channel modulation full polarization imaging detection device and detection method |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN103822712A (en) * | 2014-03-04 | 2014-05-28 | 中国科学院光电研究院 | Imaging method and imaging spectrometer based on Wollaston prism light splitting |
| CN107356337A (en) * | 2017-07-13 | 2017-11-17 | 西安交通大学 | Compact miniature fast illuminated channel modulation full polarization imaging detection device and detection method |
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| WO2021033177A1 (en) * | 2019-08-20 | 2021-02-25 | Woft Cam Ltd. | Scanning hyperspectral camera and method |
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