CN110430001A - A kind of carrier wave optimization method and system - Google Patents
A kind of carrier wave optimization method and system Download PDFInfo
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- CN110430001A CN110430001A CN201910815255.6A CN201910815255A CN110430001A CN 110430001 A CN110430001 A CN 110430001A CN 201910815255 A CN201910815255 A CN 201910815255A CN 110430001 A CN110430001 A CN 110430001A
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/30—Monitoring; Testing of propagation channels
- H04B17/309—Measuring or estimating channel quality parameters
- H04B17/354—Adjacent channel leakage power
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L5/00—Arrangements affording multiple use of the transmission path
- H04L5/0001—Arrangements for dividing the transmission path
- H04L5/0003—Two-dimensional division
- H04L5/0005—Time-frequency
- H04L5/0007—Time-frequency the frequencies being orthogonal, e.g. OFDM(A), DMT
- H04L5/001—Time-frequency the frequencies being orthogonal, e.g. OFDM(A), DMT the frequencies being arranged in component carriers
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Abstract
The present disclosure discloses a kind of carrier wave optimization method and system, method includes: to measure adjacent channel power leakage ratio when terminal is in designated state；Based on the adjacent channel power leakage ratio that measurement obtains, corresponding powering mode is determined.The adjacent channel power leakage ratio that the disclosure can be obtained according to measurement, corresponding adjustment powering mode, effectively to guarantee the surplus of ACLR.
Description
Technical field
This disclosure relates to electronic technology field more particularly to a kind of carrier wave optimization method and system.
Background technique
Currently, terminal is usually calibrated under ET (Envelop tracking, envelope tracking) mode, ACLR
(Adjacent Channel Leakage Ratio, adjacent channel leakage ratio) has enough surpluses；But in particular carrier,
Since uplink signal bandwidth is different from normal mode, the surplus of ACLR can be reduced.
Therefore, in particular carrier, how effectively to guarantee the surplus of ACLR, be a urgent problem to be solved.
Summary of the invention
In view of this, the disclosure provides the following technical solutions:
A kind of carrier wave optimization method, comprising:
When terminal is in designated state, adjacent channel power leakage ratio is measured；
Based on the adjacent channel power leakage ratio that measurement obtains, corresponding powering mode is determined.
Preferably, the adjacent channel power leakage ratio obtained based on measurement, determines corresponding powering mode, wraps
It includes:
It determines that the adjacent channel power leakage ratio that measurement obtains is greater than first threshold, powering mode is adjusted to envelope
Tracking mode.
Preferably, the adjacent channel power leakage ratio obtained based on measurement, determines corresponding powering mode, wraps
It includes:
Determine that the adjacent channel power leakage ratio that measurement obtains is less than or equal to the first threshold, by powering mode tune
It is whole to track mode or full voltage powering mode for mean power.
Preferably, the adjacent channel power leakage ratio that the determining measurement obtains is less than or equal to the first threshold,
Powering mode is adjusted to mean power tracking mode, comprising:
Determine that the adjacent channel power leakage ratio that measurement obtains is greater than second threshold and is less than or equal to first threshold
Powering mode is tracked mode by envelope tracking mode adjustment for mean power by value.
Preferably, the adjacent channel power leakage ratio that the determining measurement obtains is less than or equal to the first threshold,
Powering mode is adjusted to full voltage powering mode, comprising:
Determine that the obtained adjacent channel power leakage ratio of measurement is less than or equal to the second threshold, by powering mode by
The mean power tracking mode adjustment is full voltage powering mode.
Preferably, described when terminal is in designated state, measure adjacent channel power leakage ratio, comprising:
When terminal is in up-link carrier polymerization state, adjacent channel power leakage ratio is measured.
Preferably, described when terminal is in up-link carrier polymerization state, measurement adjacent channel power leakage ratio includes:
When terminal is in up-link carrier polymerization state, the power of adjacent channel and the power of present channel are measured；
The ratio of the power of power and the present channel based on the adjacent channel, obtains the adjacent channel power
Leakage ratio.
A kind of carrier wave optimization system, comprising:
Measurement module, for measuring adjacent channel power leakage ratio when terminal is in designated state；
Determining module, the adjacent channel power leakage ratio for being obtained based on measurement, determines corresponding powering mode.
Preferably, the adjacent channel power leakage ratio that the determining module is obtained in execution based on measurement, determining pair
When the powering mode answered, it is specifically used for:
It determines that the adjacent channel power leakage ratio that measurement obtains is greater than first threshold, powering mode is adjusted to envelope
Tracking mode.
Preferably, the adjacent channel power leakage ratio that the determining module is obtained in execution based on measurement, determining pair
When the powering mode answered, it is specifically used for:
Determine that the adjacent channel power leakage ratio that measurement obtains is less than or equal to the first threshold, by powering mode tune
It is whole to track mode or full voltage powering mode for mean power.
Preferably, the determining module is less than or equal in the adjacent channel power leakage ratio that execution determines that measurement obtains
The first threshold is specifically used for when powering mode is adjusted to mean power tracking mode:
Determine that the adjacent channel power leakage ratio that measurement obtains is greater than second threshold and is less than or equal to first threshold
Powering mode is tracked mode by envelope tracking mode adjustment for mean power by value.
Preferably, the determining module is less than or equal in the adjacent channel power leakage ratio that execution determines that measurement obtains
The first threshold is specifically used for when powering mode is adjusted to full voltage powering mode:
Determine that the obtained adjacent channel power leakage ratio of measurement is less than or equal to the second threshold, by powering mode by
The mean power tracking mode adjustment is full voltage powering mode.
Preferably, the measurement module is specifically used for:
When terminal is in up-link carrier polymerization state, adjacent channel power leakage ratio is measured.
Preferably, the measurement module is being executed when terminal is in up-link carrier polymerization state, measures adjacent channel function
Rate leakage than when, be specifically used for:
When terminal is in up-link carrier polymerization state, the power of adjacent channel and the power of present channel are measured；
The ratio of the power of power and the present channel based on the adjacent channel, obtains the adjacent channel power
Leakage ratio.
It can be seen from the above technical proposal that a kind of carrier wave optimization method disclosed in the disclosure, is in specified shape in terminal
When state, adjacent channel power leakage ratio is measured, is then based on the adjacent channel power leakage ratio that measurement obtains, determines and corresponds to
Powering mode.The adjacent channel power leakage ratio that the disclosure can be obtained according to measurement, corresponding adjustment powering mode, to have
The surplus of the guarantee ACLR of effect.
Detailed description of the invention
In order to illustrate more clearly of the embodiment of the present disclosure or technical solution in the prior art, to embodiment or will show below
There is attached drawing needed in technical description to be briefly described, it should be apparent that, the accompanying drawings in the following description is only this
Disclosed embodiment for those of ordinary skill in the art without creative efforts, can also basis
The attached drawing of offer obtains other attached drawings.
Fig. 1 is a kind of method flow diagram of carrier wave optimization method embodiment 1 disclosed in the disclosure；
Fig. 2 is a kind of method flow diagram of carrier wave optimization method embodiment 2 disclosed in the disclosure；
Fig. 3 is a kind of method flow diagram of carrier wave optimization method embodiment 3 disclosed in the disclosure；
Fig. 4 is a kind of method flow diagram of carrier wave optimization method embodiment 4 disclosed in the disclosure；
Fig. 5 is a kind of method flow diagram of carrier wave optimization method embodiment 5 disclosed in the disclosure；
Fig. 6 is a kind of structural schematic diagram of carrier wave optimization system embodiment 1 disclosed in the disclosure；
Fig. 7 is a kind of structural schematic diagram of carrier wave optimization system embodiment 2 disclosed in the disclosure；
Fig. 8 is a kind of structural schematic diagram of carrier wave optimization system embodiment 3 disclosed in the disclosure；
Fig. 9 is a kind of structural schematic diagram of carrier wave optimization system embodiment 4 disclosed in the disclosure；
Figure 10 is a kind of structural schematic diagram of carrier wave optimization system embodiment 5 disclosed in the disclosure.
Specific embodiment
Below in conjunction with the attached drawing in the embodiment of the present disclosure, the technical solution in the embodiment of the present disclosure is carried out clear, complete
Site preparation description, it is clear that described embodiment is only disclosure a part of the embodiment, instead of all the embodiments.It is based on
Embodiment in the disclosure, it is obtained by those of ordinary skill in the art without making creative efforts every other
Embodiment belongs to the range of disclosure protection.Below in conjunction with the attached drawing in the embodiment of the present disclosure, in the embodiment of the present disclosure
Technical solution be clearly and completely described, it is clear that described embodiment is only disclosure a part of the embodiment, and
The embodiment being not all of.Based on the embodiment in the disclosure, those of ordinary skill in the art are not making creative work
Under the premise of every other embodiment obtained, belong to the disclosure protection range.
As shown in Figure 1, for a kind of method flow diagram of carrier wave optimization method embodiment 1 disclosed in the disclosure, the method
It may comprise steps of:
S101, when terminal is in designated state, measure adjacent channel power leakage ratio；
When needing the carrier wave to terminal to optimize, it is first determined the current state of terminal, in the current state of terminal
When meeting designated state, adjacent channel power leakage ratio is measured.
S102, the adjacent channel power leakage ratio obtained based on measurement, determine corresponding powering mode.
After measurement obtains adjacent channel power leakage ratio, further according to the obtained adjacent channel power leakage of measurement
Than corresponding adjustment powering mode, that is, the different adjacent channel power leakages powering mode more different than that can correspond to passes through tune
Whole powering mode makes it possible to effectively guarantee the surplus of ACLR.
In conclusion in the above-described embodiments, when needing the carrier wave to terminal to optimize, firstly, being in terminal
When designated state, adjacent channel power leakage ratio is measured, is then based on the adjacent channel power leakage ratio that measurement obtains, really
Fixed corresponding powering mode.The adjacent channel power leakage ratio that the disclosure can be obtained according to measurement, corresponding adjustment power supply mould
Formula, effectively to guarantee the surplus of ACLR.
As shown in Fig. 2, for a kind of method flow diagram of carrier wave optimization method embodiment 2 disclosed in the disclosure, the method
It may comprise steps of:
S201, when terminal is in up-link carrier polymerization state, measure adjacent channel power leakage ratio；
When needing the carrier wave to terminal to optimize, it is first determined the current state of terminal, in the current state of terminal
When meeting up-link carrier polymerization state, adjacent channel power leakage ratio is measured.
S202, the adjacent channel power leakage ratio obtained based on measurement, determine corresponding powering mode.
After measurement obtains adjacent channel power leakage ratio, further according to the obtained adjacent channel power leakage of measurement
Than corresponding adjustment powering mode, that is, the different adjacent channel power leakages powering mode more different than that can correspond to passes through tune
Whole powering mode makes it possible to effectively guarantee the surplus of ACLR.
In conclusion in the above-described embodiments, when needing the carrier wave to terminal to optimize, firstly, being in terminal
When up-link carrier polymerization state, adjacent channel power leakage ratio is measured, is then based on the adjacent channel power that measurement obtains
Ratio is revealed, determines corresponding powering mode.The disclosure can be obtained when terminal is in up-link carrier polymerization state according to measurement
Adjacent channel power leakage ratio, corresponding adjustment powering mode, effectively to guarantee the surplus of ACLR.
As shown in figure 3, for a kind of method flow diagram of carrier wave optimization method embodiment 3 disclosed in the disclosure, the method
It may comprise steps of:
S301, when terminal is in up-link carrier polymerization state, measure adjacent channel power leakage ratio；
When needing the carrier wave to terminal to optimize, it is first determined the current state of terminal, in the current state of terminal
When meeting up-link carrier polymerization state, adjacent channel power leakage ratio is measured.
S302, it determines that the adjacent channel power leakage ratio that measurement obtains is greater than first threshold, powering mode is adjusted to wrap
Network tracks mode.
After measurement obtains adjacent channel power leakage ratio, further judgement measures obtained adjacent channel power leakage ratio
Whether it is greater than first threshold, when adjacent channel power leakage ratio is greater than first threshold, shows that ACLR there are enough surpluses, this
When, powering mode is adjusted to ET (Envelop tracking, envelope tracking) mode, makes it possible to fill in guarantee ACLR surplus
Under the premise of foot, make terminal power saving as far as possible.
In conclusion in the above-described embodiments, the can be greater than determining adjacent channel power leakage ratio that measurement obtain
When one threshold value, powering mode is adjusted to envelope tracking mode, makes it possible to make end under the premise of guaranteeing that ACLR surplus is sufficient
Hold power saving as far as possible.
As shown in figure 4, for a kind of method flow diagram of carrier wave optimization method embodiment 4 disclosed in the disclosure, the method
It may comprise steps of:
S401, when terminal is in up-link carrier polymerization state, measure adjacent channel power leakage ratio；
When needing the carrier wave to terminal to optimize, it is first determined the current state of terminal, in the current state of terminal
When meeting up-link carrier polymerization state, adjacent channel power leakage ratio is measured.
S402, it determines that the adjacent channel power leakage ratio that measurement obtains is less than or equal to first threshold, powering mode is adjusted
Mode or full voltage powering mode are tracked for mean power.
After measurement obtains adjacent channel power leakage ratio, further judgement measures obtained adjacent channel power leakage ratio
Whether it is greater than first threshold, when adjacent channel power leakage ratio is greater than first threshold, shows that ACLR there are enough surpluses.Work as warp
Judgement is crossed, when the adjacent channel power leakage ratio measured is less than or equal to first threshold, in order to make ACLR have enough surpluses,
At this point, powering mode is adjusted to APT (average power tracking, mean power tracking) mode, alternatively, will power supply
Mode adjustment is full voltage powering mode.Wherein, the supply voltage of APT mode and full voltage powering mode ratio ET mode is high, supplies
Piezoelectric voltage is higher, enables to ACLR value better, and then can guarantee that ACLR has sufficient surplus.
In conclusion in the above-described embodiments, can determine that the adjacent channel power leakage ratio for measuring and obtaining is less than
When first threshold, i.e., in the insufficient situation of ACLR surplus, powering mode is adjusted to mean power tracking mode or full electricity
Powering mode is pressed, by improving supply voltage, guarantees that ACLR has sufficient surplus.
As shown in figure 5, for a kind of method flow diagram of carrier wave optimization method embodiment 5 disclosed in the disclosure, the method
It may comprise steps of:
S501, when terminal is in up-link carrier polymerization state, measure adjacent channel power leakage ratio；
When needing the carrier wave to terminal to optimize, it is first determined the current state of terminal, in the current state of terminal
When meeting up-link carrier polymerization state, adjacent channel power leakage ratio is measured.
S502, it determines that the adjacent channel power leakage ratio that measurement obtains is greater than first threshold, powering mode is adjusted to wrap
Network tracks mode；
After measurement obtains adjacent channel power leakage ratio, further judgement measures obtained adjacent channel power leakage ratio
Whether it is greater than first threshold, when adjacent channel power leakage ratio is greater than first threshold, shows that ACLR there are enough surpluses, this
When, powering mode is adjusted to ET (Envelop tracking, envelope tracking) mode, makes it possible to fill in guarantee ACLR surplus
Under the premise of foot, make terminal power saving as far as possible.
S503, determine that the adjacent channel power leakage ratio that measurement obtains is greater than second threshold and is less than or equal to first threshold,
Powering mode is tracked into mode by envelope tracking mode adjustment for mean power；
After measurement obtains adjacent channel power leakage ratio, further judgement measures obtained adjacent channel power leakage ratio
Whether it is greater than second threshold and is less than or equal to first threshold and shows ACLR when adjacent channel power leakage ratio is greater than first threshold
There are enough surpluses to show that ACLR's is remaining when adjacent channel power leakage ratio is greater than second threshold and is less than or equal to first threshold
Amount is slightly insufficient, at this point, by ET mode adjustment, for APT, (average power tracking, mean power are chased after by powering mode
Track) mode.Wherein, the supply voltage ratio ET mode of APT mode is high, and supply voltage is higher, enables to ACLR value better, in turn
It can guarantee that ACLR has sufficient surplus；
S504, determine that the adjacent channel power leakage ratio that measurement obtains is less than or equal to second threshold, by powering mode by putting down
Equal powerinjected method mode adjustment is full voltage powering mode.
After measurement obtains adjacent channel power leakage ratio, further judgement measures obtained adjacent channel power leakage ratio
Whether it is less than or equal to second threshold and shows that the surplus ratio of ACLR exists when adjacent channel power leakage ratio is less than or equal to second threshold
Adjacent channel power leakage ratio is greater than second threshold and lower when being less than or equal to first threshold, at this point, by powering mode by APT mould
Formula is adjusted to full voltage powering mode.Wherein, the supply voltage ratio APT mode of full voltage powering mode is high, and supply voltage is higher,
It enables to ACLR value better, and then can guarantee that ACLR has sufficient surplus.
In conclusion in the above-described embodiments, the can be greater than determining adjacent channel power leakage ratio that measurement obtain
When one threshold value, powering mode is adjusted to envelope tracking mode, makes it possible to make end under the premise of guaranteeing that ACLR surplus is sufficient
Hold power saving as far as possible；Second threshold can be greater than and less than or equal to the first threshold determining the adjacent channel power leakage ratio that measurement obtains
When value, i.e., in the insufficient situation of ACLR surplus, powering mode is tracked into mode by ET mode adjustment for mean power, by suitable
When improving supply voltage, guarantee that ACLR has sufficient surplus；The adjacent channel power leakage for measuring and obtaining can determined than small
When being equal to second threshold, that is, be greater than second threshold in adjacent channel power leakage ratio in the surplus ratio of ACLR and be less than or equal to
When lower when first threshold, by powering mode by APT mode adjustment be full voltage powering mode, improve supply voltage so that
ACLR value is better, and then can guarantee that ACLR has sufficient surplus.
Specifically, in the above-described embodiments, when terminal is in up-link carrier polymerization state, measurement adjacent channel power is let out
One of implementation of dew ratio, which may is that, will emit function by FBRX (feedback receive, Feedback of Power receive)
Rate, which is coupled to, receives LAN (low noise amplifier, low-noise amplifier), when measuring transmission power, can cut
The power that channel is faced in some time measurements is changed, the power of the power and present channel of the adjacent channel then obtained according to measurement
Ratio obtains adjacent channel power leakage ratio.
As shown in fig. 6, for a kind of structural schematic diagram of carrier wave optimization system embodiment 1 disclosed in the disclosure, the system
May include:
Measurement module 601, for measuring adjacent channel power leakage ratio when terminal is in designated state；
When needing the carrier wave to terminal to optimize, it is first determined the current state of terminal, in the current state of terminal
When meeting designated state, adjacent channel power leakage ratio is measured.
Determining module 602, the adjacent channel power leakage ratio for being obtained based on measurement, determines corresponding powering mode.
After measurement obtains adjacent channel power leakage ratio, further according to the obtained adjacent channel power leakage of measurement
Than corresponding adjustment powering mode, that is, the different adjacent channel power leakages powering mode more different than that can correspond to passes through tune
Whole powering mode makes it possible to effectively guarantee the surplus of ACLR.
In conclusion in the above-described embodiments, when needing the carrier wave to terminal to optimize, firstly, being in terminal
When designated state, adjacent channel power leakage ratio is measured, is then based on the adjacent channel power leakage ratio that measurement obtains, really
Fixed corresponding powering mode.The adjacent channel power leakage ratio that the disclosure can be obtained according to measurement, corresponding adjustment power supply mould
Formula, effectively to guarantee the surplus of ACLR.
As shown in fig. 7, for a kind of structural schematic diagram of carrier wave optimization system embodiment 2 disclosed in the disclosure, the system
May include:
Measurement module 701, for measuring adjacent channel power leakage ratio when terminal is in up-link carrier polymerization state；
When needing the carrier wave to terminal to optimize, it is first determined the current state of terminal, in the current state of terminal
When meeting up-link carrier polymerization state, adjacent channel power leakage ratio is measured.
Determining module 702, the adjacent channel power leakage ratio for being obtained based on measurement, determines corresponding powering mode.
After measurement obtains adjacent channel power leakage ratio, further according to the obtained adjacent channel power leakage of measurement
Than corresponding adjustment powering mode, that is, the different adjacent channel power leakages powering mode more different than that can correspond to passes through tune
Whole powering mode makes it possible to effectively guarantee the surplus of ACLR.
In conclusion in the above-described embodiments, when needing the carrier wave to terminal to optimize, firstly, being in terminal
When up-link carrier polymerization state, adjacent channel power leakage ratio is measured, is then based on the adjacent channel power that measurement obtains
Ratio is revealed, determines corresponding powering mode.The disclosure can be obtained when terminal is in up-link carrier polymerization state according to measurement
Adjacent channel power leakage ratio, corresponding adjustment powering mode, effectively to guarantee the surplus of ACLR.
As shown in figure 8, for a kind of structural schematic diagram of carrier wave optimization system embodiment 3 disclosed in the disclosure, the system
May include:
Measurement module 801, for measuring adjacent channel power leakage ratio when terminal is in up-link carrier polymerization state；
When needing the carrier wave to terminal to optimize, it is first determined the current state of terminal, in the current state of terminal
When meeting up-link carrier polymerization state, adjacent channel power leakage ratio is measured.
Determining module 802, for determining that the adjacent channel power leakage ratio that measurement obtains is greater than first threshold, by mould of powering
Formula is adjusted to envelope tracking mode.
After measurement obtains adjacent channel power leakage ratio, further judgement measures obtained adjacent channel power leakage ratio
Whether it is greater than first threshold, when adjacent channel power leakage ratio is greater than first threshold, shows that ACLR there are enough surpluses, this
When, powering mode is adjusted to ET (Envelop tracking, envelope tracking) mode, makes it possible to fill in guarantee ACLR surplus
Under the premise of foot, make terminal power saving as far as possible.
In conclusion in the above-described embodiments, the can be greater than determining adjacent channel power leakage ratio that measurement obtain
When one threshold value, powering mode is adjusted to envelope tracking mode, makes it possible to make end under the premise of guaranteeing that ACLR surplus is sufficient
Hold power saving as far as possible.
As shown in figure 9, for a kind of structural schematic diagram of carrier wave optimization system embodiment 4 disclosed in the disclosure, the system
May include:
Measurement module 901, for measuring adjacent channel power leakage ratio when terminal is in up-link carrier polymerization state；
When needing the carrier wave to terminal to optimize, it is first determined the current state of terminal, in the current state of terminal
When meeting up-link carrier polymerization state, adjacent channel power leakage ratio is measured.
Determining module 902 will be for for determining that the obtained adjacent channel power leakage ratio of measurement is less than or equal to first threshold
Power mode is adjusted to mean power tracking mode or full voltage powering mode.
After measurement obtains adjacent channel power leakage ratio, further judgement measures obtained adjacent channel power leakage ratio
Whether it is greater than first threshold, when adjacent channel power leakage ratio is greater than first threshold, shows that ACLR there are enough surpluses.Work as warp
Judgement is crossed, when the adjacent channel power leakage ratio measured is less than or equal to first threshold, in order to make ACLR have enough surpluses,
At this point, powering mode is adjusted to APT (average power tracking, mean power tracking) mode, alternatively, will power supply
Mode adjustment is full voltage powering mode.Wherein, the supply voltage of APT mode and full voltage powering mode ratio ET mode is high, supplies
Piezoelectric voltage is higher, enables to ACLR value better, and then can guarantee that ACLR has sufficient surplus.
In conclusion in the above-described embodiments, can determine that the adjacent channel power leakage ratio for measuring and obtaining is less than
When first threshold, i.e., in the insufficient situation of ACLR surplus, powering mode is adjusted to mean power tracking mode or full electricity
Powering mode is pressed, by improving supply voltage, guarantees that ACLR has sufficient surplus.
It as shown in Figure 10, is a kind of structural schematic diagram of carrier wave optimization system embodiment 5 disclosed in the disclosure, the system
May include:
Measurement module 1001, for measuring adjacent channel power leakage ratio when terminal is in up-link carrier polymerization state；
When needing the carrier wave to terminal to optimize, it is first determined the current state of terminal, in the current state of terminal
When meeting up-link carrier polymerization state, adjacent channel power leakage ratio is measured.
Determining module 1002 will power for determining that the adjacent channel power leakage ratio that measurement obtains is greater than first threshold
Mode adjustment is that envelope tracks mode；
After measurement obtains adjacent channel power leakage ratio, further judgement measures obtained adjacent channel power leakage ratio
Whether it is greater than first threshold, when adjacent channel power leakage ratio is greater than first threshold, shows that ACLR there are enough surpluses, this
When, powering mode is adjusted to ET (Envelop tracking, envelope tracking) mode, makes it possible to fill in guarantee ACLR surplus
Under the premise of foot, make terminal power saving as far as possible.
Determining module 1002 is also used to determine that the adjacent channel power leakage ratio that measurement obtains is greater than second threshold and is less than
Equal to first threshold, powering mode is tracked into mode by envelope tracking mode adjustment for mean power；
After measurement obtains adjacent channel power leakage ratio, further judgement measures obtained adjacent channel power leakage ratio
Whether it is greater than second threshold and is less than or equal to first threshold and shows ACLR when adjacent channel power leakage ratio is greater than first threshold
There are enough surpluses to show that ACLR's is remaining when adjacent channel power leakage ratio is greater than second threshold and is less than or equal to first threshold
Amount is slightly insufficient, at this point, by ET mode adjustment, for APT, (average power tracking, mean power are chased after by powering mode
Track) mode.Wherein, the supply voltage ratio ET mode of APT mode is high, and supply voltage is higher, enables to ACLR value better, in turn
It can guarantee that ACLR has sufficient surplus；
Determining module 1002, the adjacent channel power leakage ratio for being also used to determine that measurement obtains are less than or equal to second threshold,
It is full voltage powering mode that powering mode, which is tracked mode adjustment by mean power,.
After measurement obtains adjacent channel power leakage ratio, further judgement measures obtained adjacent channel power leakage ratio
Whether it is less than or equal to second threshold and shows that the surplus ratio of ACLR exists when adjacent channel power leakage ratio is less than or equal to second threshold
Adjacent channel power leakage ratio is greater than second threshold and lower when being less than or equal to first threshold, at this point, by powering mode by APT mould
Formula is adjusted to full voltage powering mode.Wherein, the supply voltage ratio APT mode of full voltage powering mode is high, and supply voltage is higher,
It enables to ACLR value better, and then can guarantee that ACLR has sufficient surplus.
In conclusion in the above-described embodiments, the can be greater than determining adjacent channel power leakage ratio that measurement obtain
When one threshold value, powering mode is adjusted to envelope tracking mode, makes it possible to make end under the premise of guaranteeing that ACLR surplus is sufficient
Hold power saving as far as possible；Second threshold can be greater than and less than or equal to the first threshold determining the adjacent channel power leakage ratio that measurement obtains
When value, i.e., in the insufficient situation of ACLR surplus, powering mode is tracked into mode by ET mode adjustment for mean power, by suitable
When improving supply voltage, guarantee that ACLR has sufficient surplus；The adjacent channel power leakage for measuring and obtaining can determined than small
When being equal to second threshold, that is, be greater than second threshold in adjacent channel power leakage ratio in the surplus ratio of ACLR and be less than or equal to
When lower when first threshold, by powering mode by APT mode adjustment be full voltage powering mode, improve supply voltage so that
ACLR value is better, and then can guarantee that ACLR has sufficient surplus.
Specifically, in the above-described embodiments, when terminal is in up-link carrier polymerization state, measurement adjacent channel power is let out
One of implementation of dew ratio, which may is that, will emit function by FBRX (feedback receive, Feedback of Power receive)
Rate, which is coupled to, receives LAN (low noise amplifier, low-noise amplifier), when measuring transmission power, can cut
The power that channel is faced in some time measurements is changed, the power of the power and present channel of the adjacent channel then obtained according to measurement
Ratio obtains adjacent channel power leakage ratio.
It should be noted that all the embodiments in this specification are described in a progressive manner, each embodiment weight
Point explanation is the difference from other embodiments, and the same or similar parts between the embodiments can be referred to each other.
For device or system class embodiment, since it is basically similar to the method embodiment, so be described relatively simple, it is related
Place illustrates referring to the part of embodiment of the method.
It should also be noted that, herein, relational terms such as first and second and the like are used merely to one
Entity or operation are distinguished with another entity or operation, without necessarily requiring or implying between these entities or operation
There are any actual relationship or orders.Moreover, the terms "include", "comprise" or its any other variant are intended to contain
Lid non-exclusive inclusion, so that the process, method, article or equipment including a series of elements is not only wanted including those
Element, but also including other elements that are not explicitly listed, or further include for this process, method, article or equipment
Intrinsic element.In the absence of more restrictions, the element limited by sentence "including a ...", it is not excluded that
There is also other identical elements in process, method, article or equipment including the element.
The step of method described in conjunction with the examples disclosed in this document or algorithm, can directly be held with hardware, processor
The combination of capable software module or the two is implemented.Software module can be placed in random access memory (RAM), memory, read-only deposit
Reservoir (ROM), electrically programmable ROM, electrically erasable ROM, register, hard disk, moveable magnetic disc, CD-ROM or technology
In any other form of storage medium well known in field.
The foregoing description of the disclosed embodiments makes professional and technical personnel in the field can be realized or use the disclosure.
Various modifications to these embodiments will be readily apparent to those skilled in the art, as defined herein
General Principle can be realized in other embodiments without departing from the spirit or the scope of the present disclosure.Therefore, the disclosure
It is not intended to be limited to the embodiments shown herein, and is to fit to and the principles and novel features disclosed herein phase one
The widest scope of cause.
Claims (10)
1. a kind of carrier wave optimization method, comprising:
When terminal is in designated state, adjacent channel power leakage ratio is measured；
Based on the adjacent channel power leakage ratio that measurement obtains, corresponding powering mode is determined.
2. according to the method described in claim 1, the adjacent channel power leakage ratio obtained based on measurement, determination pair
The powering mode answered, comprising:
It determines that the adjacent channel power leakage ratio that measurement obtains is greater than first threshold, powering mode is adjusted to envelope tracking
Mode.
3. according to the method described in claim 2, the adjacent channel power leakage ratio obtained based on measurement, determination pair
The powering mode answered, comprising:
It determines that the adjacent channel power leakage ratio that measurement obtains is less than or equal to the first threshold, powering mode is adjusted to
Mean power tracks mode or full voltage powering mode.
4. according to the method described in claim 3, the adjacent channel power leakage ratio that the determining measurement obtains is less than etc.
In the first threshold, powering mode is adjusted to mean power tracking mode, comprising:
Determine that the adjacent channel power leakage ratio that measurement obtains is greater than second threshold and is less than or equal to the first threshold, it will
Powering mode is that mean power tracks mode by envelope tracking mode adjustment.
5. according to the method described in claim 4, the adjacent channel power leakage ratio that the determining measurement obtains is less than etc.
In the first threshold, powering mode is adjusted to full voltage powering mode, comprising:
Determine that the adjacent channel power leakage ratio that measurement obtains is less than or equal to the second threshold, by powering mode by described
It is full voltage powering mode that mean power, which tracks mode adjustment,.
6. according to the method described in claim 1, described when terminal is in designated state, measurement adjacent channel power leakage
Than, comprising:
When terminal is in up-link carrier polymerization state, adjacent channel power leakage ratio is measured.
7. according to the method described in claim 6, described when terminal is in up-link carrier polymerization state, measurement adjacent channel function
Rate reveals ratio
When terminal is in up-link carrier polymerization state, the power of adjacent channel and the power of present channel are measured；
The ratio of the power of power and the present channel based on the adjacent channel, obtains the adjacent channel power leakage
Than.
8. a kind of carrier wave optimization system, comprising:
Measurement module, for measuring adjacent channel power leakage ratio when terminal is in designated state；
Determining module, the adjacent channel power leakage ratio for being obtained based on measurement, determines corresponding powering mode.
9. system according to claim 8, the measurement module is specifically used for:
When terminal is in up-link carrier polymerization state, adjacent channel power leakage ratio is measured.
10. system according to claim 9, the measurement module is in up-link carrier polymerization state in terminal in execution
When, when measuring adjacent channel power leakage ratio, it is specifically used for:
When terminal is in up-link carrier polymerization state, the power of adjacent channel and the power of present channel are measured；
The ratio of the power of power and the present channel based on the adjacent channel, obtains the adjacent channel power leakage
Than.
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