CN110417392A - Smps开关的热保护 - Google Patents

Smps开关的热保护 Download PDF

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CN110417392A
CN110417392A CN201910338166.7A CN201910338166A CN110417392A CN 110417392 A CN110417392 A CN 110417392A CN 201910338166 A CN201910338166 A CN 201910338166A CN 110417392 A CN110417392 A CN 110417392A
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switch
variable resistance
circuit
external switch
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CN110417392B (zh
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赫尔曼纳斯·约翰内斯·埃芬
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En Zhi Pu Co Ltd
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    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02H—EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
    • H02H5/00—Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal non-electric working conditions with or without subsequent reconnection
    • H02H5/04—Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal non-electric working conditions with or without subsequent reconnection responsive to abnormal temperature
    • H02H5/042—Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal non-electric working conditions with or without subsequent reconnection responsive to abnormal temperature using temperature dependent resistors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K3/00—Thermometers giving results other than momentary value of temperature
    • G01K3/005—Circuits arrangements for indicating a predetermined temperature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/01—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using semiconducting elements having PN junctions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2621—Circuits therefor for testing field effect transistors, i.e. FET's
    • G01R31/2628—Circuits therefor for testing field effect transistors, i.e. FET's for measuring thermal properties thereof
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02H—EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
    • H02H7/00—Emergency protective circuit arrangements specially adapted for specific types of electric machines or apparatus or for sectionalised protection of cable or line systems, and effecting automatic switching in the event of an undesired change from normal working conditions
    • H02H7/10—Emergency protective circuit arrangements specially adapted for specific types of electric machines or apparatus or for sectionalised protection of cable or line systems, and effecting automatic switching in the event of an undesired change from normal working conditions for converters; for rectifiers
    • H02H7/12—Emergency protective circuit arrangements specially adapted for specific types of electric machines or apparatus or for sectionalised protection of cable or line systems, and effecting automatic switching in the event of an undesired change from normal working conditions for converters; for rectifiers for static converters or rectifiers
    • H02H7/1203—Circuits independent of the type of conversion
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
    • H02M1/00—Details of apparatus for conversion
    • H02M1/32—Means for protecting converters other than automatic disconnection
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/08—Modifications for protecting switching circuit against overcurrent or overvoltage
    • H03K17/082—Modifications for protecting switching circuit against overcurrent or overvoltage by feedback from the output to the control circuit
    • H03K17/0822—Modifications for protecting switching circuit against overcurrent or overvoltage by feedback from the output to the control circuit in field-effect transistor switches
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/28—Modifications for introducing a time delay before switching
    • H03K17/284—Modifications for introducing a time delay before switching in field effect transistor switches
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
    • H03K17/56—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
    • H03K17/687—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/40—Testing power supplies
    • G01R31/42—AC power supplies
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02H—EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
    • H02H5/00—Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal non-electric working conditions with or without subsequent reconnection
    • H02H5/04—Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal non-electric working conditions with or without subsequent reconnection responsive to abnormal temperature
    • H02H5/044—Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal non-electric working conditions with or without subsequent reconnection responsive to abnormal temperature using a semiconductor device to sense the temperature
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
    • H02M1/00—Details of apparatus for conversion
    • H02M1/32—Means for protecting converters other than automatic disconnection
    • H02M1/327—Means for protecting converters other than automatic disconnection against abnormal temperatures
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/08—Modifications for protecting switching circuit against overcurrent or overvoltage
    • H03K2017/0806—Modifications for protecting switching circuit against overcurrent or overvoltage against excessive temperature
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
    • H03K2217/0027—Measuring means of, e.g. currents through or voltages across the switch

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  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Electronic Switches (AREA)
  • Semiconductor Integrated Circuits (AREA)

Abstract

公开一种用于测量外部开关的温度的电路。所述电路包括：可变电阻器；开关，其串联耦合到所述可变电阻器；固定值电阻器，其耦合到所述可变电阻器；和比较器，其耦合在所述可变电阻器与所述固定值电阻器之间。所述电路被配置成将在所述外部开关处于导通状态时所述外部开关的漏极与源极之间的电压降与所述可变电阻器处的电压降进行比较且基于所述比较输出信号以指示超温。

Description

SMPS开关的热保护
技术领域
本发明公开一种用于测量外部开关的温度的电路。
背景技术
电源几乎用于每个电子装置，主要用于将可能因电力线条件和负载因素而变化的交流电(AC)或直流电(DC)输入转换成恒定的直流电(DC)输出电压，以为电子装置的内部电路系统供电。
被设计成将波动的输入电压转换为恒定的更低输出电压的电源可通过线性转换器实现。然而，此类线性电源具有效率低下的特征。如果线性电源用于递送更大输出电流或功率，那么效率会变得明显不利。
当需要更高效率时，经常使用开关模式电源(SMPS)。SMPS包括电源开关，所述电源开关是任何SMPS的关键元件。电源开关在过热时可能受损。
发明内容
提供此发明内容来以简化形式介绍下文在具体实施方式中进一步描述的概念选择。此概述并非意图识别所要求保护的主题的关键特征或基本特征，也并非意图用于限制所要求保护的主题的范围。
在一个实施例中，公开一种用于测量外部开关的温度的电路。所述电路包括：可变电阻器；开关，其串联耦合到可变电阻器；固定值电阻器，其耦合到可变电阻器；和比较器，其耦合在可变电阻器与固定值电阻器之间。所述电路被配置成将在外部开关处于导通状态时外部开关的漏极与源极之间的电压降与可变电阻器处的电压降进行比较且基于所述比较输出信号以指示超温。
在一些例子中，开关被配置成仅当外部开关被接通时被接通，且开关经由驱动外部开关的栅极的驱动信号被接通。驱动信号经由延迟电路耦合到开关。延迟电路基于外部开关的饱和特性引入预定延迟。比较器被配置成维持输出，直到比较器的输入处的电压差反向为止。可变电阻器被配置成改变温度阈值。
在一个例子中，公开一种集成电路。所述IC包括用于测量外部开关的温度的电路。所述电路包括：可变电阻器；开关，其串联耦合到可变电阻器；固定值电阻器，其耦合到可变电阻器；和比较器，其耦合在可变电阻器与固定值电阻器之间。所述电路被配置成将在外部开关处于导通状态时外部开关的漏极与源极之间的电压降与可变电阻器处的电压降进行比较且基于所述比较输出信号以指示超温。IC还包括：用于接收驱动开关的驱动信号的端口；用于输出超温信号的端口；用于从外部开关的漏极接收输入的端口；和用于从外部开关的源极接收输入的端口。
附图说明
为了可详细地理解本发明的上述特征，可通过参考实施例来更加具体地描述上文简要概括的本发明，所述实施例中的一些在附图中示出。然而，应注意，附图仅示出本发明的典型实施例，且因此不应被视为限制本发明的范围，这是因为本发明可准许其它同等有效的实施例。在结合附图阅读此描述之后，所要求保护的主题的优点对本领域的技术人员而言将变得显而易见，附图中，相同的附图标号用于指代相同的元件，且其中：
图1描绘曲线图，其示出开关的导通电阻与温度之间的关系；且
图2描绘根据本公开的一个或多个实施例的开关模式电源(SMP)开关保护电路的示意图。
应注意，图示未按比例绘制。已经省略图式转变之间的中间步骤以免混淆本公开。那些中间步骤对于本领域的技术人员来说是已知的。
具体实施方式
已经省略或不在描述中详细描述许多熟知的制造步骤、组件和连接件，以免混淆本公开。
晶体管的导通状态电阻(RDS(on))是在导通状态期间晶体管的漏极与源极之间的电阻。如图1中所示出，RDS(on)随温度改变而变化。因此，可至少粗略地通过测量RDS(on)来测量晶体管的温度。
测量开关模式电源(SMP)的开关晶体管对于保护开关晶体管免于由于过热而受损是重要的。SMPS可被设计成改变开关频率或通过基于温度测量切断开关而将SMPS置于旁路模式。本文中所描述的实施例使用RDS(on)来测量温度且当温度超出预选阈值时输出信号。
图2描绘SMPS开关保护电路100的示意图和SMPS 130的局部示意图。应注意，仅示出描述本公开的实施例所必要的几个组件以免混淆本公开。SMPS 130的完整电路对本领域的技术人员熟知。通常，SMPS130包括电源开关132、电感器134和电阻器136。包括驱动器电路138以使用预选固定或可变频率的脉冲接通或断开电源开关132。
在一些实施例中，SMPS开关保护电路100可为具有引脚106、112、116、118和120的独立集成电路。引脚106用于从同样由开关驱动器138使用的同一信号源140接收输入，所述开关驱动器138驱动电源开关132的栅极。引脚112用于输出超温信号。引脚116、118、120被配置成耦合到电源开关132、电阻器136和电感器134。在其它实施例中，电路100可并入于SMPS 130本身中。在一些例子中，SMPS开关保护电路100可靠近SMPS 120的驱动器138制造在同一硅晶片中。
包括延迟块108以使电源开关132开关脉冲延迟预选时间。开关脉冲被延迟以允许电源开关132在被接通之后、在开关104被接通之前达到饱和状态。在一些实施例中，延迟可基于电源开关132的饱和特性预设。包括可变电阻器102以设定预设温度阈值，在所述预设温度阈值以上时，比较器110应输出超温信号。可变电阻器102可耦合到输入，所述输入可用于改变温度阈值，在所述温度阈值以上时，超温信号被触发。可变电阻器102、固定电阻器122和例如电阻器136、电源开关132和电感器134等组件形成惠斯通电桥。
当电源开关132被接通时，在预设延迟之后，开关104被接通。比较器102比较在一侧上由RDS(on)和电阻器136分压的电压与由可变电阻器102和电阻器122分压的电压。比较器102还可包括锁存信号114以允许维持比较器102的输出处的相同输出，直到比较器102的输入端处的输入电压反向为止。在一些实施例中，锁存信号114可从延迟块108导出。当电源开关132的RDS(on)由于温度增加而增加时，引脚118处的电压下降，从而使比较器102产生超温信号。
超温信号可由SMPS 120使用以减少驱动电源开关132的信号的开关频率或占空比或开关脉冲。在一些实施例中，可中断电源开关132的开关且当产生超温信号时将SMPS置于旁路模式中。
这些实施例中的一些或全部可组合，一些可被完全省略，且可添加额外过程步骤，同时仍实现本文中所描述的产品。因此，本文中所描述的主题可以许多不同变化体现，且所有此类变化涵盖在权利要求书的范围内。
虽然已借助于例子和根据具体实施例描述一个或多个实施方案，但是应理解，一个或多个实施方案不限于所公开的实施例。相反地，意图涵盖对本领域的技术人员来说将显而易见的各种修改和类似布置。因此，所附权利要求书的范围应被赋予最广义的解释，以便涵盖所有此类修改和类似布置。
除非在本文中另外指出或明显与内容相矛盾，否则在描述元件的情况下(尤其在以上权利要求书的情况下)使用术语“一(a/an)”和“所述”以及类似指示物应理解为涵盖单数和复数。除非在本文中另外指出，否则对本文中值范围的叙述仅意图充当单独提及属于所述范围的每一单独值的速记方法，且每一单独值并入本说明书中，如同在本文中单独地叙述一般。此外，上述描述仅出于说明的目的，而不是出于限制的目的，因为寻求保护的范围由附属权利要求及其任何等效物来限定。除非另外要求，否则本文中所提供的对任何和所有例子或示例性语言(例如，“例如”)的使用仅仅是意图更好地说明主题，而并非对主题的范围造成限制。在附属权利要求和书面描述二者中使用术语“基于”和指示产生结果的条件的其它类似短语并不意图排除产生所述结果的其它条件。本说明书中的任何语言都不应理解为指示实践本发明所必需的任何非要求保护的元件。
本文中描述了优选实施例，包括本发明人已知的用于实现所要求保护的主题的最佳模式。当然，在阅读上述描述之后，本领域的技术人员将清楚那些优选实施例的变化形式。本发明人期望本领域的技术人员适时采用此类变化，且本发明人意图以不同于本文中特定描述的其它方式来实践本发明所要求保护的主题。因此，所要求保护的主题包括可适用法律所准许的在附属权利要求中叙述的主题的所有变化和等效物。此外，除非本文另外指出或以其它方式明显与上下文相矛盾，否则本发明涵盖上文所描述的元件以其所有可能的变化形式的任何组合。

Claims (8)

1.一种用于测量外部开关的温度的电路，其特征在于，所述电路包括：
可变电阻器；
开关，其串联耦合到所述可变电阻器；
固定值电阻器，其耦合到所述可变电阻器；和
比较器，其耦合在所述可变电阻器与所述固定值电阻器之间；
其中所述电路被配置成将在所述外部开关处于导通状态时所述外部开关的漏极与源极之间的电压降与所述可变电阻器处的电压降进行比较且基于所述比较输出信号以指示超温。
2.根据权利要求1所述的电路，其特征在于，所述开关被配置成仅当所述外部开关被接通时被接通。
3.根据权利要求2所述的电路，其特征在于，所述开关被配置成经由驱动所述外部开关的栅极的驱动信号被接通。
4.根据权利要求3所述的电路，其特征在于，所述驱动信号经由延迟电路耦合到所述开关。
5.根据权利要求4所述的电路，其特征在于，所述延迟电路被配置成基于所述外部开关的饱和特性引入预定延迟。
6.根据权利要求1所述的电路，其特征在于，所述比较器被配置成维持输出，直到所述比较器的输入处的电压差反向为止。
7.根据权利要求1所述的电路，其特征在于，所述可变电阻器被配置成改变温度阈值。
8.一种集成电路，其特征在于，包括：
根据权利要求1所述的电路；
用于接收驱动所述开关的驱动信号的端口；
用于输出超温信号的端口；
用于从所述外部开关的漏极接收输入的端口；和
用于从所述外部开关的源极接收输入的端口。
CN201910338166.7A 2018-04-30 2019-04-24 Smps开关的热保护 Active CN110417392B (zh)

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US15/966,557 2018-04-30
US15/966,557 US10833500B2 (en) 2018-04-30 2018-04-30 Thermal protection of SMPS switch

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CN110417392A true CN110417392A (zh) 2019-11-05
CN110417392B CN110417392B (zh) 2024-04-09

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