CN110411601A - Temperature checking method and detection circuit - Google Patents
Temperature checking method and detection circuit Download PDFInfo
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- CN110411601A CN110411601A CN201910736457.1A CN201910736457A CN110411601A CN 110411601 A CN110411601 A CN 110411601A CN 201910736457 A CN201910736457 A CN 201910736457A CN 110411601 A CN110411601 A CN 110411601A
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- Prior art keywords
- temperature
- sampling resistor
- checking method
- resistance value
- sensing package
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Temperature Or Quantity Of Heat (AREA)
Abstract
The present invention provides a kind of temperature checking method and detection circuit, temperature checking method following steps: temperature sensing package R1 and sampling resistor R2 is connected;The voltage U of sampling resistor R2 is measured, the voltage U that mainboard will test is converted into environment temperature, judges whether failure according to voltage U;If being then adjusted according to environment temperature to sampling resistor R2 and continuing to detect.Temperature checking method provided by the invention, the resistance value of sampling resistor R2 is adjustable, since the resistance value of temperature sensing package R1 can change with the variation of temperature, in current limiting temperature, mainboard can directly detect temperature sensing package R1 and be in open-circuit fault, lead to not judgement be due to environment temperature causes or temperature sensing package break down caused by problem.So that unit remains to continue at higher or lower temperature to work normally, normal detection, and it is unlikely to because temperature is too low or too high causes to report failure by mistake.
Description
Technical field
The invention belongs to temperature detection technical fields, are to be related to a kind of temperature checking method and detection electricity more specifically
Road.
Background technique
Shelter air conditioner use environment is very severe, substantially needs to meet -45 DEG C of working environment and -55 DEG C of storage
Temperature.
But for existing temperature sensing package, when working environment is in -45 DEG C, mainboard can directly detect temperature sensing package
In open-circuit fault, it can not judge that the environment temperature being in is too low or reason caused by failure occurs in temperature sensing package at this time,
It can only be judged as mainboard and break down at this time.
Summary of the invention
The purpose of the present invention is to provide a kind of temperature checking method and detection circuits, existing in the prior art to solve
It is difficult to the problem of judging the reason of breaking down.
To achieve the above object, the technical solution adopted by the present invention is that: provide a kind of temperature checking method, including such as
Lower step: temperature sensing package R1 and sampling resistor R2 is connected;Measure the voltage U of sampling resistor R2, the electricity that mainboard will test
Pressure U is converted into environment temperature, judges whether failure according to the voltage U;If then according to the environment temperature to the sampling
Resistance R2 is adjusted and continues to detect.
Further, the resistance value of the sampling resistor is turned down when the environment temperature is high temperature range.
Further, the high temperature range is that environment temperature is higher than 130 DEG C.
Further, the sampling resistor R2 is adjusted to the first preset resistive value when the environment temperature is high temperature range.
Further, the resistance value of the sampling resistor is tuned up when the environment temperature is under low temperature range.
Further, the low temperature range is that environment temperature is lower than -40 DEG C.
Further, the sampling resistor R2 is adjusted to the second preset resistive value when the environment temperature is low temperature range.
Another object of the present invention is to provide a kind of detection circuits, using the above temperature detecting method, including temperature sensing package
R1 and with the concatenated sampling resistor R2 of the temperature sensing package R1, the resistance value of the sampling resistor R2 is adjustable.
Further, the resistance value of the temperature sensing package R1 is 0.2891K Ω~361.8K Ω.
Further, the resistance value of the sampling resistor R2 is 10K Ω~100K Ω.
The beneficial effect of temperature checking method provided by the invention is: compared with prior art, sampling resistor of the present invention
The resistance value of R2 is adjustable, since the resistance value of temperature sensing package R1 can change with the variation of temperature, in current limiting temperature
In the case of mainboard can directly detect temperature sensing package R1 and be in open-circuit fault, lead to not judgement be since environment temperature causes or
Problem caused by temperature sensing package breaks down.So that unit remains to continue at higher or lower temperature to work normally, just
Often detection, and be unlikely to because temperature is too low or too it is high cause report by mistake failure.
Detailed description of the invention
It to describe the technical solutions in the embodiments of the present invention more clearly, below will be to embodiment or description of the prior art
Needed in attached drawing be briefly described, it should be apparent that, the accompanying drawings in the following description is only of the invention some
Embodiment for those of ordinary skill in the art without any creative labor, can also be according to these
Attached drawing obtains other attached drawings.
Fig. 1 is the structural schematic diagram of detection circuit provided in an embodiment of the present invention, and part-structure is not shown.
Specific embodiment
In order to which technical problems, technical solutions and advantages to be solved are more clearly understood, tie below
Accompanying drawings and embodiments are closed, the present invention will be described in further detail.It should be appreciated that specific embodiment described herein is only
To explain the present invention, it is not intended to limit the present invention.
Now temperature checking method provided in an embodiment of the present invention is illustrated.The temperature checking method, including it is as follows
Step: temperature sensing package R1 and sampling resistor R2 is connected;Voltage U, U=VCC/ (R1+R2) * R2 of sampling resistor R2 is measured, mainboard will
The voltage U detected is converted to environment temperature, carries out judging whether to break down according to voltage U.Wherein, U > 98%VCC or U <
2% is broken down.If the determination result is YES, then sampling resistor R2 is adjusted and continues to detect.
Temperature checking method provided by the invention, compared with prior art, the resistance value of sampling resistor R2 are adjustable, due to sense
The resistance value of thermometer bulb R1 can change with the variation of temperature, and in current limiting temperature, mainboard can be directly detected
Temperature sensing package R1 is in open-circuit fault, lead to not judgement be due to environment temperature causes or temperature sensing package break down caused by
Problem.So that unit is remained to continue to work normally at higher or lower temperature, normally be detected, and it is unlikely to because of temperature too
It is low or too it is high cause report by mistake failure.Wherein, current limiting temperature is 150 DEG C and -45 DEG C.
Further, as a kind of specific embodiment of temperature checking method provided by the invention, when environment temperature is
The resistance value of sampling resistor is turned down when high temperature range.When environment temperature is higher, the resistance value of temperature sensing package R1 can become because of hot environment
It is small, therefore will lead to the voltage U detected and can become larger, converting obtained environment temperature can also get higher, therefore, by sampling resistor
The resistance value of R2 is turned down, and the U detected can be made to become smaller, and the environment temperature converted is more in line with actual environment temperature.
Further, as a kind of specific embodiment of temperature checking method provided by the invention, high temperature range is ring
Border temperature is higher than 130 DEG C.
Further, as a kind of specific embodiment of temperature checking method provided by the invention, when environment temperature is
Sampling resistor R2 is adjusted to the first preset resistive value when high temperature range.Such as the resistance value of temperature sensing package R1 is 20K Ω, then by sampling resistor
The resistance value of R2 is adjusted to 10K Ω.
Further, as a kind of specific embodiment of temperature checking method provided by the invention, when environment temperature is
The resistance value of sampling resistor is tuned up when under low temperature range.When environment temperature is higher, the resistance value of temperature sensing package R1 can be due to hot environment
Become larger, therefore will lead to the voltage U detected to become smaller, converting obtained environment temperature can also be lower, therefore, by sampling electricity
The resistance value of resistance R2 tunes up, and the U detected can be made to become larger, the environment temperature converted is more in line with actual environment temperature.
Further, as a kind of specific embodiment of temperature checking method provided by the invention, low temperature range is ring
Border temperature is lower than -40 DEG C.
Further, as a kind of specific embodiment of temperature checking method provided by the invention, when environment temperature is
The sampling resistor R2 is adjusted to the second preset resistive value when low temperature range.Such as the resistance value of temperature sensing package R1 is 20K Ω, then it will sampling
The resistance value of resistance R2 is adjusted to 50K Ω.
Referring to Fig. 1, the detection circuit uses the above temperature detecting method the present invention also provides a kind of detection circuit,
Including temperature sensing package R1 and with the concatenated sampling resistor R2 of temperature sensing package R1.Voltage U by measuring sampling resistor R2 judges whether
It breaks down, U=VCC/ (R1+R2) * R2.Wherein the resistance value of sampling resistor R2 is adjustable.
Specifically, wherein VCC is temperature sensing package external power supply, R1 is the resistance value of temperature sensing package, and R2 is the resistance value of adjustable resistance, U
The voltage detected for mainboard.R1 is the resistance value of temperature sensing package, and with the variation of temperature, resistance value changes, it is corresponding
At a temperature of resistance value be it is fixed, in order to guarantee not report failure because of temperature under identical environment, by sampling resistor R2 by original
This fixed resistance is revised as adjustable resistance.It is higher sometimes in environment temperature since unit use environment is different
In the environment of, then at this time probably due to environment temperature is too high and reach fault detection value, thus report by mistake failure cause unit without
Method operates normally.At this point, adjusting the resistance value of sampling resistor R2, the resistance value of sampling resistor R2 is turned down, guarantees it in the feelings of high temperature
Temperature is normally detected under condition, judges that unit is run according to actual temperature.
If unit use environment is lower, at this time probably due to environment temperature is too low, so that the resistance value of temperature sensing package is become larger, arrive greatly
The value detected thinks that failure has occurred in it, but is actually to cause because environment temperature is too low, rather than really occur
Failure, this belongs to wrong report failure, determines that temperature sensing package does not break down at this time, but since actual conditions cause, it should
The resistance value R2 of sampling resistor is tuned up, guarantees that it in original temperature, normally detects temperature rather than directly quote failure.
Further, referring to Fig. 1, a kind of specific embodiment as detection circuit provided by the invention, temperature sensing package
The resistance value value range of R1 is 0.2891K Ω~361.8K Ω.Certainly, in other embodiments, can also according to the actual situation and
It needs, selects the resistance value of temperature sensing package R1.
Further, referring to Fig. 1, a kind of specific embodiment as detection circuit provided by the invention, sampling electricity
The resistance value for hindering R2 is 10K Ω~100K Ω.Certainly, in other embodiments, can also be sampled according to the actual situation with needs, selection
The resistance value of resistance R2.
The foregoing is merely illustrative of the preferred embodiments of the present invention, is not intended to limit the invention, all in essence of the invention
Made any modifications, equivalent replacements, and improvements etc., should all be included in the protection scope of the present invention within mind and principle.
Claims (10)
1. a kind of temperature checking method, which comprises the steps of: temperature sensing package R1 and sampling resistor R2 connects;It surveys
The voltage U of sampling resistor R2 is measured, the voltage U that mainboard will test is converted into environment temperature, is according to voltage U judgement
No failure;If being then adjusted according to the environment temperature to the sampling resistor R2 and continuing to detect.
2. temperature checking method as described in claim 1, it is characterised in that: will be described when the environment temperature is high temperature range
The resistance value of sampling resistor is turned down.
3. temperature checking method as claimed in claim 2, it is characterised in that: the high temperature range is that environment temperature is higher than 130
℃。
4. temperature checking method as claimed in claim 2, which is characterized in that will be described when the environment temperature is high temperature range
Sampling resistor R2 is adjusted to the first preset resistive value.
5. temperature checking method as described in claim 1, it is characterised in that: by institute when the environment temperature is under low temperature range
The resistance value for stating sampling resistor tunes up.
6. temperature checking method as claimed in claim 5, it is characterised in that: the low temperature range is that environment temperature is lower than -40
℃。
7. temperature checking method as claimed in claim 5, it is characterised in that: will be described when the environment temperature is low temperature range
Sampling resistor R2 is adjusted to the second preset resistive value.
8. a kind of detection circuit, it is characterised in that: using such as temperature checking method of any of claims 1-7, packet
Include temperature sensing package R1 and with the concatenated sampling resistor R2 of the temperature sensing package R1, the resistance value of the sampling resistor R2 is adjustable.
9. detection circuit as claimed in claim 8, it is characterised in that: the resistance value of the temperature sensing package R1 be 0.2891K Ω~
361.8KΩ。
10. detection circuit as claimed in claim 8, it is characterised in that: the resistance value of the sampling resistor R2 is 10K Ω~100K
Ω。
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CN201910736457.1A CN110411601A (en) | 2019-08-09 | 2019-08-09 | Temperature checking method and detection circuit |
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CN201910736457.1A CN110411601A (en) | 2019-08-09 | 2019-08-09 | Temperature checking method and detection circuit |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113126596A (en) * | 2021-03-31 | 2021-07-16 | 北京品驰医疗设备有限公司 | Charging test system of external control equipment for implanted medical instrument |
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CN204612829U (en) * | 2015-04-07 | 2015-09-02 | 青岛歌尔声学科技有限公司 | A kind of temperature sensing circuit and there is the electronic equipment of this circuit |
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CN207610796U (en) * | 2017-12-13 | 2018-07-13 | 深圳市赛尔美电子科技有限公司 | A kind of temperature sampling circuit of multichannel partial pressure control |
CN208421074U (en) * | 2018-08-06 | 2019-01-22 | 珠海格力智能装备有限公司 | The test device of temperature-sensitive circuit |
CN208568103U (en) * | 2018-07-25 | 2019-03-01 | 深圳和而泰小家电智能科技有限公司 | Temperature sensing circuit, temperature-detecting device and electronic equipment |
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Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
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JP2008164469A (en) * | 2006-12-28 | 2008-07-17 | Nissan Motor Co Ltd | Short-circuit failure detector of thermistor |
US20150063401A1 (en) * | 2013-09-02 | 2015-03-05 | Lsis Co., Ltd. | Temperature measurement apparatus using negative temperature coefficient thermistor |
CN204240528U (en) * | 2014-11-06 | 2015-04-01 | 格力电器(武汉)有限公司 | Environment temperature screening arrangement |
CN204612829U (en) * | 2015-04-07 | 2015-09-02 | 青岛歌尔声学科技有限公司 | A kind of temperature sensing circuit and there is the electronic equipment of this circuit |
CN205281289U (en) * | 2016-01-08 | 2016-06-01 | 珠海格力电器股份有限公司 | Temperature control circuit |
CN207610796U (en) * | 2017-12-13 | 2018-07-13 | 深圳市赛尔美电子科技有限公司 | A kind of temperature sampling circuit of multichannel partial pressure control |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
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CN113126596A (en) * | 2021-03-31 | 2021-07-16 | 北京品驰医疗设备有限公司 | Charging test system of external control equipment for implanted medical instrument |
CN113126596B (en) * | 2021-03-31 | 2024-01-26 | 北京品驰医疗设备有限公司 | Charging test system of external control equipment for implantable medical device |
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