CN106768457B - A kind of thermistor temp Acquisition Circuit and its self checking method - Google Patents
A kind of thermistor temp Acquisition Circuit and its self checking method Download PDFInfo
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- CN106768457B CN106768457B CN201710002523.3A CN201710002523A CN106768457B CN 106768457 B CN106768457 B CN 106768457B CN 201710002523 A CN201710002523 A CN 201710002523A CN 106768457 B CN106768457 B CN 106768457B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
- G01K7/22—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K19/00—Testing or calibrating calorimeters
Abstract
The invention discloses a kind of thermistor temp Acquisition Circuit and its self checking methods, Acquisition Circuit includes MCU, partial pressure branch, self-test branch and sampling filter capacitor, after MCU control self-test branch conducting, Acquisition Circuit starts to execute self-checking function, when the difference of the actual samples voltage and theoretical sampled voltage that determine partial pressure branch output is not within the scope of preset difference value, determine that Acquisition Circuit breaks down.Compared to traditional Acquisition Circuit, Acquisition Circuit disclosed by the invention increases self-checking function, by Acquisition Circuit self-test, can find the case where sample circuit breaks down in time, to which technical staff can adopt an effective measure in time, sampling error caused by avoiding because of sample circuit failure.
Description
Technical field
The present invention relates to temperature acquisition technical fields, more specifically, be related to a kind of thermistor temp Acquisition Circuit and
Its self checking method.
Background technique
Thermistor is a kind of device that temperature variation is converted to change in resistance amount.Thermistor is mainly used at present
Temperature collection circuit samples the temperature value that thermistor detects.The working principle of thermistor temp Acquisition Circuit
Are as follows: the change in resistance amount of thermistor is converted into voltage variety first, then by processing chip by voltage variety by
Analog signal is converted to digital signal, is handled by the voltage variety to digital signal form, obtains thermistor inspection
The temperature value measured.
It follows that the functional reliability of thermistor temp Acquisition Circuit, directly affects and adopts to the temperature of thermistor
Sample precision.The present inventor has found that there are a defects for traditional thermistor temp Acquisition Circuit: working as heat after study
When quick electrical resistance collection circuit itself breaks down, technical staff can not have found this case in time, so as to cause thermistor
There are large errors for sampling of the Acquisition Circuit to thermistor.
Summary of the invention
In view of this, the present invention discloses a kind of thermistor temp Acquisition Circuit and its self checking method, to solve tradition heat
Quick resistance temperature Acquisition Circuit, sampling error problem caused by breaking down because of itself.
A kind of thermistor temp Acquisition Circuit, comprising: micro-control unit MCU, partial pressure branch, self-test branch and sampling filter
Wave capacitor；
The partial pressure branch includes: the thermistor to be collected and first resistor of series connection, and the one of the partial pressure branch
End connects to power supply, the other end ground connection of the partial pressure branch, the output end of the partial pressure branch and the signal acquisition of the MCU
End connection；
One end of the sampling filter capacitor with it is described partial pressure branch output end and the signal acquisition terminal it is public
End connection, the other end ground connection of the sampling filter capacitor；
One end of the self-test branch is connect with the first signal output end of the MCU, the other end of the self-test branch
It is connect with the output end of the partial pressure branch, the control terminal of the self-test branch is connect with the second signal output end of the MCU；
Each resistance when the MCU obtains self-test branch disconnection, in the partial pressure branch；Pass through described second
Signal output end exports conductivity control signal to the self-test branch, controls the self-test branch conducting；Believe by described first
Number output end exports self-test signal to the self-test branch, and acquires the actual samples voltage of the partial pressure branch output；According to
The partial pressure branch output is calculated in each resistance in the resistance value of the self-test branch and the partial pressure branch
Theoretical sampled voltage；Judge the difference of the actual samples voltage and the theoretical sampled voltage whether in preset difference value range
It is interior, determine whether thermistor temp Acquisition Circuit breaks down, and determining the difference not described default
When in difference range, determine that the thermistor temp Acquisition Circuit breaks down.
Preferably, the self-test branch includes: second resistance and switch；
One end of the second resistance is connect with first signal output end, and the other end of the second resistance passes through institute
It states switch to connect with the output end of the partial pressure branch, the control terminal of the switch is connect with the second signal output end.
Preferably, the second resistance includes: a resistance or the resistance circuit that is made up of multiple elements.
Preferably, the switch includes: the switching circuit for switching or being made up of multiple elements.
Preferably, further includes: current-limiting resistance, one end of the current-limiting resistance are connect with the output end of the partial pressure branch,
The other end of the current-limiting resistance is connect with the common end of the sampling filter capacitor and the MCU.
A kind of self checking method of thermistor temp Acquisition Circuit, comprising:
When obtaining the disconnection of self-test branch, each resistance in branch is divided；
Conductivity control signal is exported to the self-test branch by second signal output end, the self-test branch is controlled and leads
It is logical；
Self-test signal is exported to the self-test branch by the first signal output end；
Acquire the actual samples voltage of the partial pressure branch output；
According to each resistance in the resistance value of the self-test branch and the partial pressure branch, it is calculated described point
Press the theoretical sampled voltage of branch output；
Calculate the difference of the actual samples voltage and the theoretical sampled voltage；
Judge the difference whether within the scope of preset difference value；
If the difference not within the scope of the preset difference value, determines that the thermistor temp Acquisition Circuit occurs
Failure.
Preferably, after the judgement thermistor temp Acquisition Circuit breaks down, further includes:
Closing control signal is exported to the self-test branch by the second signal output end, controls the self-test branch
It closes.
Preferably, further includes:
If the difference within the scope of the preset difference value, determines that the thermistor temp Acquisition Circuit is normal.
Preferably, the self-test signal includes: high level signal and low level signal.
Preferably, when the acquisition self-test branch disconnects, each resistance divided in branch includes:
When acquiring self-test branch disconnection, the sampled voltage of the partial pressure branch output；
According to the resistance value of first resistor in the sampled voltage and the partial pressure branch, it is calculated in the partial pressure branch
The current resistance value of thermistor to be collected.
From above-mentioned technical solution it is found that the invention discloses a kind of thermistor temp Acquisition Circuit and its from procuratorial organ
Method, Acquisition Circuit includes MCU, partial pressure branch, self-test branch and sampling filter capacitor, after MCU control self-test branch conducting,
Acquisition Circuit starts to execute self-checking function, when the difference for the actual samples voltage and theoretical sampled voltage for determining partial pressure branch output
When not within the scope of preset difference value, determine that Acquisition Circuit breaks down.It is disclosed by the invention to adopt compared to traditional Acquisition Circuit
Collector increases self-checking function, by Acquisition Circuit self-test, can find the case where sample circuit breaks down in time, thus
Technical staff can adopt an effective measure in time, sampling error caused by avoiding because of sample circuit failure.
Detailed description of the invention
In order to more clearly explain the embodiment of the invention or the technical proposal in the existing technology, to embodiment or will show below
There is attached drawing needed in technical description to be briefly described, it should be apparent that, the accompanying drawings in the following description is only this
The embodiment of invention for those of ordinary skill in the art without creative efforts, can also basis
Disclosed attached drawing obtains other attached drawings.
Fig. 1 is a kind of circuit diagram of thermistor temp Acquisition Circuit disclosed by the embodiments of the present invention；
Fig. 2 is the circuit diagram of another thermistor temp Acquisition Circuit disclosed by the embodiments of the present invention；
Fig. 3 is a kind of self checking method flow chart of thermistor temp Acquisition Circuit disclosed by the embodiments of the present invention；
Fig. 4 is a kind of equivalent circuit diagram of thermistor temp Acquisition Circuit disclosed by the embodiments of the present invention；
Fig. 5 is a kind of equivalent circuit diagram of thermistor temp Acquisition Circuit disclosed by the embodiments of the present invention；
Fig. 6 is the self checking method flow chart of another thermistor temp Acquisition Circuit disclosed by the embodiments of the present invention.
Specific embodiment
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete
Site preparation description, it is clear that described embodiments are only a part of the embodiments of the present invention, instead of all the embodiments.It is based on
Embodiment in the present invention, it is obtained by those of ordinary skill in the art without making creative efforts every other
Embodiment shall fall within the protection scope of the present invention.
The embodiment of the invention discloses a kind of thermistor temp Acquisition Circuit and its self checking methods, to solve traditional thermal
Resistance temperature Acquisition Circuit, sampling error problem caused by breaking down because of itself.
Referring to Fig. 1, a kind of circuit diagram of thermistor temp Acquisition Circuit disclosed by the embodiments of the present invention, the Acquisition Circuit
It include: MCU (Microcontroller Unit, micro-control unit) 11, partial pressure branch 12, self-test branch 13 and sampling filter electricity
Container C1.
Wherein,
Partial pressure branch 12 include: series connection thermistor to be collected and first resistor, divide branch 12 one end with
Power supply VCC connection, the other end ground connection of partial pressure branch 12, the signal acquisition terminal AD0 of the output end and MCU11 that divide branch 12 connect
It connects.
Specifically, as shown in Figure 1, partial pressure branch 12 includes the resistance R1 and resistance R2 being connected in series, wherein heat to be collected
Quick resistance can be resistance R1, or resistance R2, when thermistor to be collected is resistance R1, first resistor is resistance
R2；Equally, when thermistor to be collected is resistance R2, first resistor is resistance R1.Thermistor to be collected is in partial pressure branch
Specific location in 12, depend on the actual needs, the present invention is it is not limited here.
Wherein, output end Vin of the common end of resistance R1 and resistance R2 as partial pressure branch 12, for exporting to be collected
The sampled voltage signal of thermistor.
One end of sampling filter capacitor C1 connects with the output end of partial pressure branch 12 and the common end of signal acquisition terminal AD0
It connects, the other end ground connection of sampling filter capacitor C1, sampling filter capacitor C1 is used to filter out the harmonic wave in sampled voltage signal.
One end of self-test branch 13 and the first signal output end P1.0 connection of MCU11, the other end of self-test branch 13 with
Divide the output end Vin connection of branch 12, the second signal output end P1.1 connection of 13 control terminal of self-test branch and MCU11.
The process of self-test of thermistor temp Acquisition Circuit is specific as follows:
When MCU11 obtains self-test branch 13 and disconnects, divide each resistance in branch 12 (i.e. resistance R1 and resistance R2's
Resistance value)；Conductivity control signal is exported to self-test branch 13 by second signal output end P1.1, control self-test branch 13 is connected；
Self-test signal is exported to self-test branch 13 by the first signal output end P1.0, and acquires the actual samples that partial pressure branch 12 exports
Voltage；According to each resistance in the resistance value of self-test branch 13 and partial pressure branch 12, it is calculated what partial pressure branch 12 exported
Theoretical sampled voltage；Judge the difference of the actual samples voltage and the theoretical sampled voltage whether in preset difference value range
It is interior, determine whether thermistor temp Acquisition Circuit breaks down, and determining the difference not described default
When in difference range, determine that the thermistor temp Acquisition Circuit breaks down.
It should be noted that when thermistor temp Acquisition Circuit does not break down, the actual samples of MCU11 acquisition
Voltage is same or similar with the theoretical sampled voltage being calculated, i.e. the difference of actual samples voltage and theoretical sampled voltage is pre-
If in difference range；If actual samples voltage and the theoretical sampled voltage gap being calculated it is larger, i.e., actual samples voltage and
The difference of theoretical sampled voltage then shows that thermistor temp Acquisition Circuit breaks down not within the scope of preset difference value.
Wherein, the specific data depend on the actual needs of preset difference value range, the present invention is it is not limited here.
In summary, thermistor temp Acquisition Circuit disclosed by the invention, when MCU11 control self-test branch 13 is connected
Afterwards, Acquisition Circuit starts to execute self-checking function, when the actual samples voltage and theoretical sampled voltage for determining that partial pressure branch 12 exports
Difference not within the scope of preset difference value when, determine Acquisition Circuit break down.Compared to traditional Acquisition Circuit, the present invention is public
The Acquisition Circuit opened increases self-checking function, by Acquisition Circuit self-test, can find the feelings that Acquisition Circuit breaks down in time
Condition, so that technical staff can adopt an effective measure in time, sampling error caused by avoiding because of sample circuit failure.
In order to further optimize the above embodiments, as shown in Figure 1, self-test branch 13 may include: second resistance R3 and switch
K1；
One end of second resistance R3 is connect with the first signal output end P1.0, and the other end of second resistance R3 passes through switch K1
It is connect with the output end of partial pressure branch 12, the control terminal of switch K1 is connect with second signal output end P1.1.
Wherein, second resistance R3 includes a resistance or the resistance circuit that is made up of multiple elements.As second resistance R3
For be made up of multiple elements resistance circuit when, second resistance R3 shown in Fig. 1 is equivalent series and parallel compensated resistance.
Equally, switch K1 includes the switching circuit for switching or being made up of multiple elements.When switch K1 is by multiple members
When the switching circuit of part composition, switch K1 shown in Fig. 1 is equivalent switch circuit.
Specifically, MCU11 exports conductivity control signal, control switch K1 to switch K1 by second signal output end P1.1
Conducting, to realize that self-test branch 13 is connected；MCU11 exports self-test letter to self-test branch 13 by the first signal output end P1.0
Number, so that Acquisition Circuit is entered self-test state.
It should be noted that second resistance R3 needs to select suitable resistance value according to the actual needs of sample circuit, also
It is to say, after the resistance value selection of second resistance R3 should be to guarantee that sample circuit does not carry out self-test and enters self-test, makes output end Vin's
Sampled voltage has apparent difference.
To avoid MCU11 from burning because sampled voltage is excessive, as shown in Fig. 2, one kind disclosed in another embodiment of the present invention
The circuit diagram of thermistor temp Acquisition Circuit, on the basis of embodiment shown in Fig. 1, Acquisition Circuit further include: current-limiting resistance
R4；
One end of current-limiting resistance R4 is connect with the output end Vin of partial pressure branch 12, the other end of current-limiting resistance R4 and sampling
Filter condenser C1 is connected with the common end of MCU11 (specially signal acquisition terminal AD0).
Corresponding with foregoing circuit embodiment, the invention also discloses a kind of thermistor temp Acquisition Circuits from procuratorial organ
Method.
As shown in figure 3, a kind of self checking method flow chart of thermistor temp Acquisition Circuit disclosed by the embodiments of the present invention,
This method is applied to the MCU11 in Fig. 1, comprising steps of
Step S301, when obtaining the disconnection of self-test branch 13, each resistance in branch 12 is divided；
Specifically, being used as thermistor to be collected in only resistance R1 and resistance R2 in bleeder circuit 12 shown in fig. 1
Resistance value it is unknown, and another be known resistance value resistance, therefore, obtain partial pressure branch 12 in each resistance namely acquisition
The resistance value of thermistor to be collected.
The process for obtaining the resistance value of thermistor to be collected specifically includes:
When acquiring the disconnection of self-test branch 13, the sampled voltage V of the partial pressure output of branch 12AD0；
According to sampled voltage VAD0With (the i.e. electricity of known resistance value in resistance R1 and resistance R2 of first resistor in partial pressure branch 12
Resistance) resistance value, the current resistance value of thermistor to be collected in partial pressure branch 12 is calculated.
It is assumed that thermistor to be collected is the resistance R2 in Fig. 1, first resistor is the resistance R1 in Fig. 1, then MCU11 root
The current resistance value of thermistor to be collected is calculated according to formula (1), formula (1) is specific as follows:
In formula, R1 indicates the resistance value of resistance R1, and R2 indicates the resistance value of resistance R2 namely the resistance value of thermistor to be collected, n
It is known quantity, wherein n takes different numerical value, such as 8,10,12 numerical value according to the difference of MCU11 for the sampling resolution of MCU11.
Due to sampled voltage VAD0, resistance R1 resistance value and n it is known that therefore according to the available heat to be collected of formula (1)
The resistance value R2 of quick resistance.
Step S302, conductivity control signal is exported to self-test branch 13 by second signal output end P1.1, controls self-test
Branch 13 is connected；
Specifically, MCU11 exports conductivity control signal, control switch K1 to switch K1 by second signal output end P1.1
Conducting realizes that control self-test branch 13 is connected.
Step S303, self-test signal is exported to self-test branch 13 by the first signal output end P1.0；
Wherein, self-test signal includes low level signal and high level signal.
Step S304, the actual samples voltage that acquisition partial pressure branch 12 exports；
Specifically, when MCU11 exports high level signal to self-test branch 13 by the first signal output end P1.0, second
The end voltage of the connecting pin resistance R3 and MCU11 is pulled up, and the actual samples voltage of at this moment MCU11 is denoted as Vin0, in this feelings
Under condition, the equivalent circuit of circuit shown in Fig. 2 is as shown in Figure 4.
When MCU11 exports low level signal to self-test branch 13 by the first signal output end P1.0, second resistance R3
It is pulled down with the end voltage of the connecting pin MCU11, the actual samples voltage of at this moment MCU11 is denoted as Vin1, in this case, figure
The equivalent circuit of circuit shown in 2 is as shown in Figure 5.
Step S305, according to each resistance in the resistance value of self-test branch 13 and partial pressure branch 12, partial pressure is calculated
The theoretical sampled voltage that branch 12 exports；
Specifically, when MCU11 exports high level signal to self-test branch 13 by the first signal output end P1.0,
MCU11 is calculated in circuit shown in Fig. 4 according to formula (2), the first theoretical sampled voltage V that partial pressure branch 12 exportsAD1, public
Formula (2) is specific as follows:
In formula, R3 indicates the resistance value of resistance R3, and R2 is the resistance value for the thermistor to be collected being calculated in formula (1).
When MCU11 exports low level signal to self-test branch 13 by the first signal output end P1.0, MCU11 is according to public affairs
Formula (3) is calculated in circuit shown in Fig. 5, the second theoretical sampled voltage V that partial pressure branch 12 exportsAD2, formula (3) is specific such as
Under:
In formula, R3 indicates the resistance value of resistance R3, and R2 is the resistance value for the thermistor to be collected being calculated in formula (1).
Step S306, the difference of actual samples voltage and theoretical sampled voltage is calculated；
Specifically, when MCU11 exports high level signal to self-test branch 13 by the first signal output end P1.0, according to
Formula (4) calculates the theoretical sampled voltage V of actual samples voltage Vin0 and firstAD1Difference △ V1, formula (4) is specific as follows:
ΔV1=Vin0-VAD1(4)；
When MCU11 exports low level signal to self-test branch 13 by the first signal output end P1.0, according to formula (5)
Calculate the theoretical sampled voltage V of actual samples voltage Vin1 and secondAD2Difference △ V2Formula (5) is specific as follows:
ΔV2=Vin1-VAD2(5)。
Step S307, the difference is judged whether within the scope of preset difference value, if not, thening follow the steps S308；
Specifically, judging difference △ V respectively1Whether within the scope of preset difference value and difference △ V2Whether in preset difference value
In range.
Step S308, determine that thermistor temp Acquisition Circuit breaks down.
Specifically, working as difference △ V1With difference △ V2Any one of not within the scope of preset difference value when, then determine temperature-sensitive
Resistance temperature Acquisition Circuit breaks down.
It should be noted that MCU11 exports height to self-test branch 13 by the first signal output end P1.0 in the present embodiment
Level signal and the sequence of low level signal can depend on the actual needs, for example, MCU11 passes through the first signal output end first
P1.0 exports high level signal to self-test branch 13, when MCU11 adopts thermistor temp according to step S304~step S308
Whether collector breaks down after the completion of judgement；Low level letter is exported to self-test branch 13 by the first signal output end P1.0 again
Number, then determined according to step S304~step S308 whether thermistor temp Acquisition Circuit breaks down.
Or MCU11 passes through the first signal output end P1.0 first and exports low level signal to self-test branch 13, works as MCU11
Whether broken down after the completion of judgement according to step S304~step S308 to thermistor temp Acquisition Circuit；Pass through first again
Signal output end P1.0 exports high level signal to self-test branch 13, then according to step S304~step S308 to thermistor
Whether temperature collection circuit, which breaks down, is determined.
In order to further optimize the above embodiments, as shown in fig. 6, a kind of thermistor temperature disclosed in another embodiment of the present invention
The self checking method flow chart for spending Acquisition Circuit on the basis of embodiment shown in Fig. 3, after step S307, can also include
Step:
If S309, the difference within the scope of the preset difference value, are determining the thermistor temp Acquisition Circuit just
Often.
After the completion of judgement of whether breaking down to thermistor temp Acquisition Circuit, MCU11 can control self-test branch 13
It closes.
Therefore, it after step S308 and step S309, further comprises the steps of:
Step S310, closing control signal is exported to self-test branch 13 by second signal output end P1.1, controls self-test
Branch 13 is closed.
In summary, the self checking method of thermistor temp Acquisition Circuit disclosed by the invention, when MCU11 controls self-test branch
After road 13 is connected, Acquisition Circuit starts to execute self-checking function, when the actual samples voltage and theory for determining that partial pressure branch 12 exports
When the difference of sampled voltage is not within the scope of preset difference value, determine that Acquisition Circuit breaks down.Compared to traditional Acquisition Circuit,
Acquisition Circuit disclosed by the invention increases self-checking function, by Acquisition Circuit self-test, can find that Acquisition Circuit occurs in time
The case where failure, avoids sampling caused by because of sample circuit failure and miss so that technical staff can adopt an effective measure in time
Difference.
Finally, it is to be noted that, herein, relational terms such as first and second and the like be used merely to by
One entity or operation are distinguished with another entity or operation, without necessarily requiring or implying these entities or operation
Between there are any actual relationship or orders.Moreover, the terms "include", "comprise" or its any other variant meaning
Covering non-exclusive inclusion, so that the process, method, article or equipment for including a series of elements not only includes that
A little elements, but also including other elements that are not explicitly listed, or further include for this process, method, article or
The intrinsic element of equipment.In the absence of more restrictions, the element limited by sentence "including a ...", is not arranged
Except there is also other identical elements in the process, method, article or apparatus that includes the element.
Each embodiment in this specification is described in a progressive manner, the highlights of each of the examples are with other
The difference of embodiment, the same or similar parts in each embodiment may refer to each other.
The foregoing description of the disclosed embodiments enables those skilled in the art to implement or use the present invention.
Various modifications to these embodiments will be readily apparent to those skilled in the art, as defined herein
General Principle can be realized in other embodiments without departing from the spirit or scope of the present invention.Therefore, of the invention
It is not intended to be limited to the embodiments shown herein, and is to fit to and the principles and novel features disclosed herein phase one
The widest scope of cause.
Claims (10)
1. a kind of thermistor temp Acquisition Circuit characterized by comprising micro-control unit MCU, partial pressure branch, self-test branch
Road and sampling filter capacitor；
It is described partial pressure branch include: series connection thermistor to be collected and first resistor, it is described partial pressure branch one end with
Make the common end of power supply connection, the other end ground connection of the partial pressure branch, the thermistor to be collected and the first resistor
Output end for the partial pressure branch is connect with the signal acquisition terminal of the MCU；
One end of the sampling filter capacitor is public with the signal acquisition terminal of the output end for dividing branch and the MCU
End connection, the other end ground connection of the sampling filter capacitor；
One end of the self-test branch is connect with the first signal output end of the MCU, the other end of the self-test branch and institute
The output end connection of partial pressure branch is stated, the control terminal of the self-test branch is connect with the second signal output end of the MCU；
Each resistance when the MCU obtains self-test branch disconnection, in the partial pressure branch；Pass through the second signal
Output end exports conductivity control signal to the self-test branch, controls the self-test branch conducting；It is defeated by first signal
Outlet exports self-test signal to the self-test branch, and acquires the actual samples voltage of the partial pressure branch output；According to described
The theory of the partial pressure branch output is calculated in each resistance in the resistance value of self-test branch and the partial pressure branch
Sampled voltage；Judge the difference of the actual samples voltage and the theoretical sampled voltage whether within the scope of preset difference value, it is right
Whether thermistor temp Acquisition Circuit, which breaks down, is determined, and is determining the difference not in the preset difference value model
When enclosing interior, determine that the thermistor temp Acquisition Circuit breaks down.
2. thermistor temp Acquisition Circuit according to claim 1, which is characterized in that the self-test branch includes:
Two resistance and switch；
One end of the second resistance is connect with first signal output end, and the other end of the second resistance is opened by described
It closes and is connect with the output end of the partial pressure branch, the control terminal of the switch is connect with the second signal output end.
3. thermistor temp Acquisition Circuit according to claim 2, which is characterized in that the second resistance includes: one
A resistance or the resistance circuit being made up of multiple elements.
4. thermistor temp Acquisition Circuit according to claim 2, which is characterized in that the switch includes: one and opens
The switching circuit for closing or being made up of multiple elements.
5. thermistor temp Acquisition Circuit according to claim 1, which is characterized in that further include: current-limiting resistance, it is described
One end of current-limiting resistance is connect with the output end of the partial pressure branch, the other end of the current-limiting resistance and sampling filter electricity
Container is connected with the common end of the signal acquisition terminal of the MCU.
6. a kind of self checking method of thermistor temp Acquisition Circuit characterized by comprising
When obtaining the disconnection of self-test branch, each resistance in branch is divided；
Conductivity control signal is exported to the self-test branch by second signal output end, controls the self-test branch conducting；
Self-test signal is exported to the self-test branch by the first signal output end；
Acquire the actual samples voltage of the partial pressure branch output；
According to each resistance in the resistance value of the self-test branch and the partial pressure branch, the partial pressure branch is calculated
The theoretical sampled voltage of road output；
Calculate the difference of the actual samples voltage and the theoretical sampled voltage；
Judge the difference whether within the scope of preset difference value；
If the difference not within the scope of the preset difference value, determines that event occurs in the thermistor temp Acquisition Circuit
Barrier.
7. self checking method according to claim 6, which is characterized in that determine the thermistor temp acquisition electricity described
After road is broken down, further includes:
Closing control signal is exported to the self-test branch by the second signal output end, the self-test branch is controlled and closes
It closes.
8. self checking method according to claim 6, which is characterized in that further include:
If the difference within the scope of the preset difference value, determines that the thermistor temp Acquisition Circuit is normal.
9. self checking method according to claim 6, which is characterized in that the self-test signal includes: high level signal and low
Level signal.
10. self checking method according to claim 6, which is characterized in that when the acquisition self-test branch disconnects, divide branch
In each resistance include:
When acquiring self-test branch disconnection, the sampled voltage of the partial pressure branch output；
According to the resistance value of first resistor in the sampled voltage and the partial pressure branch, it is calculated in the partial pressure branch wait adopt
Collect the current resistance value of thermistor.
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| CN108519790B (en) * | 2018-03-19 | 2020-01-14 | 珠海格力电器股份有限公司 | Control method and device of electromagnetic chuck and electromagnetic chuck |
| CN109085370A (en) * | 2018-08-31 | 2018-12-25 | 高新兴创联科技有限公司 | Locomotive speed acquisition device and control method |
| CN111351593A (en) * | 2018-12-20 | 2020-06-30 | 海鹰航空通用装备有限责任公司 | Unmanned aerial vehicle battery temperature detection system and method |
| CN110530408A (en) * | 2019-09-27 | 2019-12-03 | 深圳市海浦蒙特科技有限公司 | A kind of Transducer-fault Detecting Method, detection circuit and detector |
| CN112857608A (en) * | 2021-02-22 | 2021-05-28 | 东莞永胜医疗制品有限公司 | NTC temperature measurement circuit, respirator and respirator power-on self-test method |
| CN113406981B (en) * | 2021-05-17 | 2023-06-16 | 青岛海尔生物医疗科技有限公司 | Circuit, method and device for controlling temperature of cell incubator and incubator |
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| CN104678854B (en) * | 2015-01-31 | 2018-09-11 | 广东美的制冷设备有限公司 | Remote controler, temperature sampling control system and control method |
| CN104731129A (en) * | 2015-01-31 | 2015-06-24 | 广东美的制冷设备有限公司 | Remote control unit and temperature sampling control system and method |
| CN104748313A (en) * | 2015-03-31 | 2015-07-01 | 广东美的制冷设备有限公司 | Air conditioner and temperature sampling device used for air conditioner |
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