CN110376809A - Broken string repairs structure, display panel and broken wire repair method - Google Patents

Broken string repairs structure, display panel and broken wire repair method Download PDF

Info

Publication number
CN110376809A
CN110376809A CN201910504015.4A CN201910504015A CN110376809A CN 110376809 A CN110376809 A CN 110376809A CN 201910504015 A CN201910504015 A CN 201910504015A CN 110376809 A CN110376809 A CN 110376809A
Authority
CN
China
Prior art keywords
line
common wire
data line
pixel electrode
scan line
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201910504015.4A
Other languages
Chinese (zh)
Inventor
王光加
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HKC Co Ltd
Chuzhou HKC Optoelectronics Technology Co Ltd
Original Assignee
HKC Co Ltd
Chuzhou HKC Optoelectronics Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by HKC Co Ltd, Chuzhou HKC Optoelectronics Technology Co Ltd filed Critical HKC Co Ltd
Priority to CN201910504015.4A priority Critical patent/CN110376809A/en
Publication of CN110376809A publication Critical patent/CN110376809A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362Active matrix addressed cells
    • G02F1/136259Repairing; Defects
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362Active matrix addressed cells
    • G02F1/136286Wiring, e.g. gate line, drain line
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362Active matrix addressed cells
    • G02F1/136259Repairing; Defects
    • G02F1/136263Line defects

Landscapes

  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Mathematical Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)

Abstract

The present invention relates to a kind of broken strings to repair structure, display panel and broken wire repair method.It includes substrate that the broken string, which repairs structure,;Pixel electrode unit, pixel electrode unit are set on substrate;At least two scan lines, at least two scan lines are set on substrate parallel, and scan line is set to the side of pixel electrode unit;At least two data lines, at least two data lines are set on substrate parallel, and data line and scan line are enclosed picture element matrix, and pixel electrode unit is located in picture element matrix;Active switch, active switch are set on substrate, and active switch is correspondingly connected with pixel electrode unit, scan line and data line;And common wire, common wire is grid-shaped to be set on substrate, and is located in picture element matrix, and pixel electrode unit is located in the grid of common wire.Scheme provided by the invention, can data line to broken string and scan line repair, guarantee product quality.

Description

Broken string repairs structure, display panel and broken wire repair method
Technical field
The present invention relates to liquid panel technique fields, repair structure, display panel and broken string more particularly to a kind of broken string Restorative procedure.
Background technique
Thin Film Transistor-LCD (TFT-LCD, Thin Film Transistor-Liquid Crystal Display) because having many advantages, such as that Low emissivity, that small in size, low energy consumption, fuselage is thin, high image quality is widely used in hand is mechanical, electrical Depending on, all kinds of electronics and IT products such as notebook, display.Thin Film Transistor-LCD includes liquid crystal display panel and backlight mould Group, wherein liquid crystal display panel includes color membrane substrates (Color Filter Substrate, CF Substrate, also referred to as colorized optical filtering Plate base), thin-film transistor array base-plate (Thin Film Transistor Substrate, TFT Substrate) and light It covers (Mask), there are transparent electrodes for the relative inner of aforesaid substrate.One layer of liquid crystal molecule (Liquid is pressed from both sides between two plate bases Crystal, LC), the direction of rotation of liquid crystal molecule is controlled by applying driving voltage on two plate bases, thus by backlight mould The light refraction of group, which comes out, generates picture.
As the requirement of rate respectively to liquid crystal display is higher and higher, so it is also more and more harsh that condition is made.Wherein TFT (Thin Film Transistor, thin film transistor (TFT)) substrate be made be it is the most complicated in being entirely made, because of high-resolution, So the line width of data line and scan line is smaller and smaller.In the process, just break it is easy to appear data line and scan line Situation influences product quality.
Above content is only used to facilitate the understanding of the technical scheme, and is not represented and is recognized that above content is existing skill Art.
Summary of the invention
Based on this, the present invention provides a kind of broken string and repairs structure, display panel and broken wire repair method, can be to the number of broken string It is repaired according to line and scan line, guarantees product quality.
To achieve the above object, the following technical solutions are proposed by the present invention:
A kind of broken string reparation structure, comprising:
Substrate;
Pixel electrode unit, the pixel electrode unit are set on the substrate;
At least two scan lines, at least two scan lines are set to parallel on the substrate, and the scan line is set to institute State the side of pixel electrode unit;
At least two data lines, at least two data lines are set to parallel on the substrate, the data line with it is described Scan line is enclosed picture element matrix, and the pixel electrode unit is located in the picture element matrix;
Active switch, the active switch are set on the substrate, the active switch and the pixel electrode unit, institute It states scan line and the data line is correspondingly connected with;And
Common wire, the common wire is grid-shaped to be set on the substrate, and is located in the picture element matrix, the pixel Electrode unit is located in the grid of the common wire;It is described public when the data line or/and the scan line break The data line or/and the scan line of line and broken string are correspondingly connected with, for repairing the data line or/and the scanning Line.
Optionally, the common wire includes at least two the first common wires and at least two the second common wires, at least two First common wire is set to parallel on the substrate, and at least two second common wires are set to parallel on the substrate, institute It states the first common wire and second common wire is enclosed the grid.
Optionally, the pixel electrode unit includes at least one pixel electrode, and the pixel electrode is located at the grid It is interior;
The outer side wall of each pixel electrode is equipped with four common wires, and two of them are first common wire, First common wire is parallel with the scan line, two other be second common wire, second common wire with it is described Data line is parallel.
Optionally, the substrate includes the first metal layer being stacked and second metal layer, the data line or described Scan line is set to the first metal layer;
The common wire includes the main section parallel with the data line or the scan line, and with the data line or The overlapping transition line of the scan line, the main line body are set to the first metal layer, and the transition line is set to described the Two metal layers.
Optionally, the substrate includes the first metal layer and second metal layer, and the data line or the scan line are set to The first metal layer, the common wire are set to the second metal layer.
In addition, the present invention also proposes a kind of display panel, including breaks repair structure as described above.
In addition, the present invention also proposes that a kind of broken string as described above repairs the broken wire repair method of structure, which is characterized in that Include the following steps:
The scan line or data line for detecting broken string, the scan line or data line for defining broken string are route to be repaired;
The common wire at route both ends to be repaired is connected with the connection to be repaired.
Optionally, " scan line or data line of broken string are being detected, the scan line or data line for defining broken string are multiple line to be repaired When road ", include the following steps:
It detects every scan line or whether every data line breaks;
If detecting, certain scan line or certain data line break, further the scan line or broken string of detection broken string Data line specific broken string quantity and specific broken position.
Optionally, at " common wire at route both ends to be repaired is connected with the connection to be repaired ", including such as Lower step:
It detects that the specific broken string quantity of certain scan line of broken string or certain data line of broken string only has at one, and detects Specific broken position accordingly to this;
By the common wire of the pixel electrode two sides at the specific broken position at this of scan line or data line, with broken string The data line of scan line or broken string is attached conducting from the both ends of specific broken position.
Optionally, at " common wire at route both ends to be repaired is connected with the connection to be repaired ", including such as Lower step:
It detects that the specific broken string quantity of certain scan line of broken string or certain data line of broken string only has many places, and detects To every place specific broken position accordingly;
It is and disconnected respectively by the common wire of the pixel electrode two sides at the specific broken position of many places of scan line or data line The scan line of line or the data line of broken string are attached conducting from the both ends of specific broken position.
In the technical solution that the application proposes, by the way that latticed common wire is arranged at least two data lines and at least two Scan line is enclosed in the picture element matrix set, when data line or scan line break, can to data line or scan line into Row repairs conducting.Moreover, not needing to set common wire by the way that common wire to be arranged in data line and the picture element matrix of scan line The periphery in data line and scan line is set, the peripheral space of common wire occupancy can be saved in this way, which is being repaired into structure When being fabricated to display panel, the purpose of narrow frame can reach.Moreover, being served not only as by the way that latticed common wire is arranged Repair line also acts as shielded layer or storage capacitance, realizes multiple functions.
Detailed description of the invention
In order to more clearly explain the embodiment of the invention or the technical proposal in the existing technology, to embodiment or will show below There is attached drawing needed in technical description to be briefly described, it should be apparent that, the accompanying drawings in the following description is only this Some embodiments of invention for those of ordinary skill in the art without creative efforts, can be with The structure shown according to these attached drawings obtains other attached drawings.
Fig. 1 is the planar structure simplified schematic diagram that broken string repairs structure described in the embodiment of the present invention;
Fig. 2 is the part knot that broken string described in one embodiment of the invention repairs structure (when repairing to P1 broken position) Structure simplified schematic diagram;
Fig. 3 is the part knot that broken string described in one embodiment of the invention repairs structure (when repairing to P2 broken position) Structure simplified schematic diagram;
Fig. 4 is that the process step of broken wire repair method described in the embodiment of the present invention illustrates simple block diagram;
The process step that Fig. 5 is the step S100 of broken wire repair method described in the embodiment of the present invention illustrates simple block diagram;
The process step that Fig. 6 is the step S200 of broken wire repair method described in one embodiment of the invention illustrates simple block diagram;
The process step that Fig. 7 is the step S200 of broken wire repair method described in another embodiment of the present invention illustrates simple frame Figure.
Drawing reference numeral explanation:
Label Title Label Title
100 Data line 200 Scan line
300 Common wire 400 Pixel electrode
500 Active switch
The embodiments will be further described with reference to the accompanying drawings for the realization, the function and the advantages of the object of the present invention.
Specific embodiment
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete Site preparation description, it is clear that described embodiment is only a part of the embodiments of the present invention, instead of all the embodiments.Base Embodiment in the present invention, it is obtained by those of ordinary skill in the art without making creative efforts it is all its His embodiment, shall fall within the protection scope of the present invention.
It is to be appreciated that if related in the embodiment of the present invention directionality instruction (such as up, down, left, right, before and after, top, Bottom ...), then directionality instruction is only used for explaining opposite between each component under a certain particular pose (as shown in the picture) Positional relationship, motion conditions etc., if the particular pose changes, directionality instruction is also correspondingly changed correspondingly.
In addition, being somebody's turn to do " first ", " second " etc. if relating to the description of " first ", " second " etc. in the embodiment of the present invention Description be used for description purposes only, be not understood to indicate or imply its relative importance or implicitly indicate indicated skill The quantity of art feature." first " is defined as a result, the feature of " second " can explicitly or implicitly include at least one spy Sign.It in addition, the technical solution between each embodiment can be combined with each other, but must be with those of ordinary skill in the art's energy It is enough realize based on, will be understood that the knot of this technical solution when conflicting or cannot achieve when occurs in the combination of technical solution Conjunction is not present, also not the present invention claims protection scope within.
As the rate respectively to liquid crystal display requires higher and higher, required that condition is made is also more and more harsh.Wherein TFT (Thin Film Transistor, thin film transistor (TFT)) substrate be made be it is the most complicated in being entirely made, because of high-resolution, So the line width of data line and scan line is smaller and smaller.In the process, just break it is easy to appear data line and scan line Situation influences product quality.And be to solve the problem of that the case where data line and scan line break influences product quality, the present invention It is proposed that a kind of broken string repairs structure.
As shown in Figure 1 to Figure 3, a kind of broken string proposed by the present invention repairs structure, including substrate, the pixel on substrate Electrode unit, scan line 200, data line 100, active switch 500 and common wire 300, and active switch 500 and pixel electrode Unit, scan line 200 and data line 100 are correspondingly connected with.In the present embodiment, aforesaid substrate can be TFT (Thin Film Transistor, thin film transistor (TFT)) substrate.Moreover, above-mentioned data line 100 is staggered with scan line 200, in the present embodiment Middle scan line 200 and data line 100 can be arranged in a mutually vertical manner.Wherein scan line 200 is used for transmission scanning signal, data line 100 It is used for transmission data-signal, active switch 500 receives the scanning signal that the scan line 200 that lotus root connects is transmitted, the data that conducting lotus root connects Line 100, which transmits data-signal, gives pixel electrode unit.When data line 100 or scan line 200 break, number can not be just transmitted It is believed that number give pixel electrode unit, to just will affect the normal work of pixel electrode unit.And at least two scan lines 200 are simultaneously Row is set on substrate, and at least two data lines 100 are also set on substrate parallel, and interlaced a plurality of (including two and two More than) multiple (including two and two or more) picture element matrixs skies are enclosed between scan line 200 and multiple data lines 100 Between, and pixel electrode unit is located in these picture element matrixs, so that multiple pixel electrode units are set to substrate in matrix form On, so that scan line 200 is located at the side of pixel electrode unit, data line 100 is located at the other side of pixel electrode unit.And And multiple active switches 500 are also set on substrate, active switch 500 is correspondingly arranged with pixel electrode unit.In addition, in this reality It applies in example, which can be set as thin film transistor (TFT).
It is set on substrate moreover, at least two common wires 300 (Com line) are grid-shaped, and is located at all data lines 100 It encloses and is set in the picture element matrix to be formed with all scan lines 200.Moreover, when data line 100 or/and scan line 200 occur to break When line, common wire 300 can be used for repair data line 100 or/and scan line 200.By the way that latticed common wire 300 is arranged in extremely Lack two data lines 100 and at least two scan lines 200 are enclosed in the picture element matrix region set, in data line 100 or scan line 200 when breaking, and reparation conducting can be carried out to data line 100 or scan line 200, so that data-signal can be with normal transmission Pixel electrode unit is given, to guarantee the normal work of pixel electrode unit.Moreover, by being arranged common wire 300 in data line 100 and scan line 200 picture element matrix in, do not need the periphery that common wire 300 is arranged in data line 100 and scan line 200, The peripheral space that the occupancy of common wire 300 can be saved in this way can reach when the broken string is repaired structure fabrication into display panel The purpose of narrow frame.Moreover, serving not only as repair line by the way that latticed common wire 300 is arranged, also acting as shielded layer Or storage capacitance, realize multiple functions.
Further, above-mentioned common wire 300 may include at least two the first common wires and at least two the second common wires, until Few two the first common wires are set on substrate parallel, and at least two the second common wires are set on substrate parallel, the first common wire and Second common wire is enclosed the grid in picture element matrix.Every first common wire is set to parallel in a scan line 200 Side and the side for being located at a pixel electrode unit;And every second common wire is set on the inside of a data line 100, simultaneously parallel Positioned at the other side of a pixel electrode unit.Will the common wire 300 of part be arranged in parallel with scan line 200, by other portion The common wire 300 divided is arranged in parallel with data line 100.Moreover, these common wires 300 are respectively positioned on 200 inside of scan line or are located at 200 inside of data line, that is, be respectively positioned on data line 100 and scan line 200 enclosed in the picture element matrix region set, so that common wire 300 are not take up data line 100 and scan line 200 encloses space except the picture element matrix region set.
Moreover, pixel electrode unit may include at least one pixel electrode 400, pixel electrode is located at the first common wire and Two common wires are enclosed in the grid in picture element matrix, and multiple pixel electrodes 400 are set on substrate in matrix form.And And the outer side wall of each pixel electrode unit or each pixel electrode 400 be equipped at least two common wires 300, wherein at least one The first common wire of item is parallel with scan line 200, and in addition at least one the second common wires are parallel with data line 100.In this way, available Common wire 300 to around pixel electrode unit data line 100 and scan line 200 repair, can also be 400 weeks to pixel electrode The data line 100 and scan line 200 enclosed is repaired, it can the space size of a pixel electrode 400 is to repair minimum list Position can also be that minimum repairs unit with multiple pixel electrodes 400, by disconnecting the part route of common wire 300, common wire is connected 300 and data line 100 or scan line 200, to achieve the purpose that repair data line 100 or scan line 200.Also, due to public affairs Conllinear 300 reparation unit may diminish to the space size of a pixel electrode 400, so same data can be repaired simultaneously Line 100 or with the multiple broken string in scan line 200.
Moreover, in some embodiments, the outer side wall of each pixel electrode unit or each pixel electrode 400 is equipped with two Common wire 300, wherein first common wire is parallel with scan line 200, in addition second common wire and data line 100 are flat Row.I.e. in the present embodiment, one the first common wire is set in the inside of every scan line 200, this can be scanned from side Line 200 is repaired;Similarly, one the second common wire is set in the inside of every data line 100, it can be from side to the data Line 100 is repaired.
In addition, in further embodiments, the outer side wall of each pixel electrode unit or each pixel electrode 400 is equipped with four Common wire 300, two of them are the first common wire, parallel with scan line 200, and two other is the second common wire and data Line 100 is parallel.I.e. in the present embodiment, the two sides of every scan line 200 between two scan lines 200 on the outermost side It is provided with first common wire, then the scan line 200 of corresponding inside can repair it from any side of two sides;Together Reason, the two sides of every data line 100 between two data lines 100 on the outermost side be provided with one it is second public Line, then the data line 100 of corresponding inside can repair it from any side of two sides.
Specifically, above-mentioned broken string repair structure may include n item be parallel to each other scan line 200 (such as G1, G2, G3 ..., Gn, wherein n is integer greater than 1) and n item be parallel to each other data line 100 (such as D1, D2, D3 ..., Dn, wherein n is the integer greater than 1), two the first public affairs being parallel to each other are equipped on the inside of every two adjacent scan lines 200 Collinearly, two the second common wires being parallel to each other are equipped in the inside of every two adjacent data lines 100.Two first public Conllinear and two the second common wires are disposed around around a pixel electrode 400 (or pixel electrode unit), corresponding two numbers It is disposed around outside this two first common wires and two the second common wires according to line 100 and two scan lines 200.When some or certain it is several It, can be to corresponding when scan line 100 or data line 200 at pixel electrode 400 (or pixel electrode unit) position break First common wire or the second common wire connection conducting scan line 200 or number at pixel electrode 400 (or pixel electrode unit) position According to line 100, the multiple broken string on same signal line (scan line or data line) can be repaired in this way.
For example, as shown in Fig. 2, in one embodiment, it may include three parallel arrangement of data lines that broken string, which repairs structure, D1, D2, D3 and two scan lines G1, G2 disposed in parallel, this two scan lines G1, G2 and three data line D1, D2, D3 It is staggered, and forms the picture for accommodating two pixel electrodes (or pixel electrode unit) between these data lines and scan line Prime matrix.In addition, broken string repair structure may also include with the parallel arrangement of four common wire C1, C2 of data line D1, D2, D3, C3, C4 (being the first common wire), and with scan line G1, G2 parallel arrangement of two common wires C5, C6 (be second public Line), this four common wires C1, C2, C3, C4 and the interlaced formation of two common wires C5, C6 are latticed, and pixel electrode (or Pixel electrode unit) it is located in grid.Moreover, wherein common wire C1, C2 is located between data line D1 and D2, common wire C3, C4 is located between data line D2 and D3, and common wire C5, C6 are located between scan line G1 and G2.It is sent out at the P1 point of data line D2 When raw broken string, the P11 point and P13 point of common wire C5, the P12 point of common wire C2 and P15 point and common wire C6 can be disconnected P14 point and P16 point lead common wire C5 (at the intervening portion of common wire C5 and data line D2) with data line D2 at P17 point Lead to and common wire C6 (common wire C6 at the intervening portion of data line D2) at P18 point is connected with data line D2, to make Common wire C5 P11 point and P13 point between line segment be connected with the line segment between the P12 of common wire C2 point and P15 point and It is connected, and makes so that the line segment between the P14 point and P16 point of common wire C6 is with common wire C2's with data line D2 at P17 point Line segment between P12 point and P15 point is connected and is connected at P18 point with data line D2, public so as to pass through data line D2 Line C5, C6, C2 get around the conducting of P1 point, to repair the data line D2 to break at P1 point.
In addition, as shown in figure 3, in another embodiment, it may include three parallel arrangement of data lines that broken string, which repairs structure, D1, D2, D3 may also include two scan lines G3, G4 disposed in parallel, this two scan lines G3, G4 and three data line D1, D2, D3 are staggered, and are formed between these data lines and scan line and to accommodate two pixel electrodes (or pixel electrode list Member) picture element matrix.It may also include and parallel arrangement of four common wires of data line D1, D2, D3 in addition, broken string repairs structure C1, C2, C3, C4 (being the first common wire), and with scan line G3, G4 parallel arrangement of two articles of common wires C7, C8 (be Two common wires), this four common wires C1, C2, C3, C4 and the interlaced formation of two common wires C7, C8 are latticed, and pixel is electric Pole (or pixel electrode unit) is located in grid.Moreover, wherein common wire C1, C2 is located between data line D1 and D2, it is public Line C3, C4 are located between data line D2 and D3, and common wire C7, C8 are located between scan line G3 and G4.As the P2 of data line D2 At point when breaking, the P21 point and P23 point of common wire C7, the P22 point of common wire C3 and P25 point and public can be disconnected The P24 point and P26 point of line C8 makes common wire C7 at P27 point (at the intervening portion of common wire C7 and data line D2) and data Line D2 is connected and common wire C8 (common wire C8 at the intervening portion of data line D2) at P28 point is connected with data line D2, So that the line segment between the P21 point and P23 point of common wire C7 and the line segment between the P22 point and P25 point of common wire C3 are led It is logical and be connected at P27 point with data line D2, and make so that line segment between the P24 point and P26 point of common wire C8 with it is public Line segment between the P22 point of line C2 and P25 point is connected and is connected at P28 point with data line D2, so as to keep data line D2 logical It crosses common wire C7, C8, C3 and gets around the conducting of P2 point, to repair the data line D2 to break at P2 point.For other or more The broken string repair mode of reparation when breaking at a position, every place is identical as aforesaid way.In this way, same data line or sweeping Line is retouched when many places are broken, common wire is also can use and it is repaired respectively.Moreover, these common wires are arranged at On the inside of these data lines and scan line (non-periphery), it is not take up peripheral space.
In addition, in some embodiments, aforesaid substrate may include the first metal layer being stacked and second metal layer, i.e., Settable multiple metal layers on substrate, convenient for different routes to be arranged on different metal layers.Moreover, above-mentioned data line 100 or scan line 200 can be set to the first metal layer on.Above-mentioned common wire 300 may include flat with data line 100 or scan line 200 Capable main section, and the transition line overlapping with data line 100 or scan line 200, main line body are set to the first metal layer, transition Line segment is set to second metal layer.The main part of common wire 300 and data line or scan line can be arranged in same metal layer On, space can be saved;And by being in addition arranged one at the cross-line position of common wire 300 and data line 100 or scan line 200 Layer metal is transferred, and can avoid short circuit.
In addition, in further embodiments, aforesaid substrate may include the first metal layer being stacked and second metal layer, Data line 100 or scan line 200 are set to the first metal layer, and common wire 300 is set to second metal layer.It can be directly by common wire 300 It is arranged on different metal layers from data line 100 or scan line 200, can avoid short circuit.
In addition, the present invention also proposes a kind of display panel, including breaks repair structure as described above.The broken string reparation knot Structure by the way that netted common wire is arranged, at least two data lines and at least enclose in the region set by two scan lines, in data line Or scan line can carry out reparation conducting to data line or scan line when breaking.Moreover, by being arranged common wire in number According to the inside of line and scan line, the periphery that common wire is arranged in data line and scan line is not needed, can be saved so public The peripheral space that line occupies can reach the purpose of narrow frame when the broken string is repaired structure fabrication into display panel.Moreover, By the way that netted common wire is arranged, repair line is served not only as, shielded layer or storage capacitance are also acted as, realizes a variety of function Energy.
In addition, as shown in figure 4, repair structure for above-mentioned broken string, also a kind of corresponding broken wire repair method of the present invention, Include the following steps:
The scan line or data line of S100, detection broken string, the scan line or data line for defining broken string are route to be repaired;I.e. Whether detection scan line 200 or data line 100 break, and scan line 200 or the data line 100 that broken string is arranged are to be repaired Line;
S200, the common wire 300 at route both ends to be repaired is connected with the connection to be repaired.Detect scanning When line 200 or data line 100 break, using broken string 100 both ends of scan line 200 or data line common wire to broken string Position carries out bridge joint conducting, realizes the connection of the data line to the scan line or broken string of broken string.
Moreover, further including following steps that is, before " scan line or data line of detection broken string " before step S100:
Latticed common wire 300 is set at least two scan lines 200 and at least two data lines 100 to enclose to set to be formed In picture element matrix region (i.e. display area), pixel electrode unit is located in the grid of common wire.And make part common wire 300 (i.e. the first common wire) is parallel with scan line 200, and part common wire 300 (i.e. the second common wire) is parallel with data line 100, so that Every first common wire is located at the inside of a scan line 200, and every second common wire is located at the inside of a data line 100, So that common wire 300 does not appear in display area periphery, occupied space can be reduced, realizes narrow frame.
It further, can be at least two scan lines 200 and at least two data lines 100 enclose the picture element matrix area for setting and being formed (i.e. display area) is arranged at least one pixel electrode 400 or pixel electrode unit (a pixel electrode unit may include in domain At least one pixel electrode), and active switch corresponding with pixel electrode;
One the first common wire is set to the side of a pixel electrode 400 or a pixel electrode unit, and by one Second common wire is set to the other side of a pixel electrode 400 or a pixel electrode unit, while making two scan lines 200 In pixel electrode 400 outside and so that two data lines 100 is located at the outside of the pixel electrode 400, and this first Common wire is located between this two scan lines 200, this second common wire is located between this two datas line 100;
Alternatively, two the first common wires are respectively arranged on to the two sides of a pixel electrode 400 or a pixel electrode unit, And two the second common wires are set to the another two sides of a pixel electrode 400 or a pixel electrode unit, while making two to sweep The outside that line 200 is displaced the outside an of pixel electrode 400 and two data lines 100 is made to be displaced the pixel electrode 400 is retouched, And this two first common wires are located between this two scan lines 200, this two second common wires are located at this two datas line 100 Between.
Moreover, as shown in figure 5, in the step s 100, " detecting the scan line or data line of broken string, defining sweeping for broken string Retouch line or data line be route to be repaired " when, it may also include the steps of:
Whether S110, every scan line 200 of detection or every data line 100 break;I.e. to it is interlaced at least Whether two data lines 100 and at least two scan lines 200 are detected detect every scan line 200 or every data line 100 Break;
If S120, detecting that certain scan line 200 or certain data line 100 break, further detection is broken The specific broken string quantity and specific broken position of the data line 100 (route i.e. to be repaired) of scan line 200 or broken string.Work as detection Have when breaking to scan line 200 or data line 100, it is also necessary to it is disconnected that how many detect on scan line 200 or data line 100 (i.e. specific broken position, can be specific to some for the specific location that line generation (i.e. specifically broken string quantity) and each broken string occur At pixel electrode position), each broken position is repaired so as to subsequent.
In addition, as shown in figure 5, in step s 200, " by the common wire at route both ends to be repaired and the multiple line to be repaired Further include following steps when road connection conducting ":
S210, it detects that the specific broken string quantity of certain route to be repaired only has at one, and detects corresponding specific disconnected Line position;Detect scan line 200 or data line 100 only at a position (at a pixel electrode position or a picture At plain electrode unit position, at the position P1) break;
S220, by route to be repaired this at specific broken position at pixel electrode 400 or pixel electrode unit two The common wire 300 of side is attached conducting from the both ends of specific broken position with route to be repaired.It is i.e. right using common wire 300 Scan line 200 or data line 100 break this at carry out reparation conducting at position.
Moreover, the scan line 200 or data line of broken string can be passed through when 400 two sides of pixel electrode are set to common wire 300 The common wire 300 of 100 (route i.e. to be repaired) two sides repairs broken position;And when 400 side of pixel electrode is equipped with public affairs When conllinear 300,300 pairs of the common wire broken strings of scan line 200 or data line 100 (route i.e. to be repaired) side of broken string can be passed through It is repaired position.
Moreover, as shown in fig. 6, in step s 200, " by the common wire at route both ends to be repaired and the multiple line to be repaired Further include following steps when road connection conducting ":
S230, it detects that the specific broken string quantity of certain route to be repaired only has many places, and detects that every place has accordingly Body broken position;Detect that scan line 200 or data line 100 break at multiple positions;
S240, respectively by the common wire of 400 two sides of pixel electrode at the specific broken position of many places of route to be repaired 300, conducting is attached from the both ends of specific broken position with route to be repaired.I.e. using common wire 300 to scan line or number Reparation conducting is carried out at each position broken according to line, so that entire scan line or data line carry out reparation conducting.
Moreover, the scan line 200 or data line of broken string can be passed through when 400 two sides of pixel electrode are set to common wire 300 The common wire 300 of 100 two sides repairs broken position;And when 400 side of pixel electrode is equipped with common wire 300, it can lead to The common wire 300 for crossing 100 side of scan line 200 or data line of broken string repairs broken position.
In technical solution proposed by the present invention, when repeatedly broken string occurs for same data line or scan line, can it repair; Repair line cabling on the inside of viewing area, is not take up peripheral space, can reduce the width of frame, realizes narrow frame.
The foregoing is merely alternative embodiments of the invention, are not intended to limit the scope of the invention, all at this Under the inventive concept of invention, using equivalent structure transformation made by description of the invention and accompanying drawing content, or directly/use indirectly It is included in other related technical areas in scope of patent protection of the invention.

Claims (10)

1. a kind of broken string repairs structure characterized by comprising
Substrate;
Pixel electrode unit, the pixel electrode unit are set on the substrate;
At least two scan lines, at least two scan lines are set to parallel on the substrate, and the scan line is set to the picture The side of plain electrode unit;
At least two data lines, at least two data lines are set to parallel on the substrate, the data line and the scanning Line is enclosed picture element matrix, and the pixel electrode unit is located in the picture element matrix;
Active switch, the active switch are set on the substrate, and the active switch and the pixel electrode unit described are swept It retouches line and the data line is correspondingly connected with;And
Common wire, the common wire is grid-shaped to be set on the substrate, and is located in the picture element matrix, the pixel electrode Unit is located in the grid of the common wire;When the data line or/and the scan line break, the common wire with The data line or/and the scan line of broken string are correspondingly connected with, for repairing the data line or/and the scan line.
2. broken string according to claim 1 repairs structure, which is characterized in that the common wire includes at least two first public It is collinearly set on the substrate parallel at least two the second common wires, at least two first common wires, at least two institutes It states the second common wire to be set to parallel on the substrate, first common wire and second common wire are enclosed the net Lattice.
3. broken string according to claim 2 repairs structure, which is characterized in that the pixel electrode unit includes at least one Pixel electrode, the pixel electrode are located in the grid;
The outer side wall of each pixel electrode is equipped with four common wires, and two of them are first common wire, described First common wire is parallel with the scan line, and two other is second common wire, second common wire and the data Line is parallel.
4. broken string according to claim 1 repairs structure, which is characterized in that the substrate includes the first gold medal being stacked Belong to layer and second metal layer, the data line or the scan line are set to the first metal layer;
The common wire includes the main section parallel with the data line or the scan line, and with the data line or described The overlapping transition line of scan line, the main line body are set to the first metal layer, and the transition line is set to second gold medal Belong to layer.
5. broken string according to claim 1 repairs structure, which is characterized in that the substrate includes the first gold medal being stacked Belong to layer and second metal layer, the data line or the scan line are set to the first metal layer, and the common wire is set to described Second metal layer.
6. a kind of display panel, which is characterized in that repair structure including the broken string as described in any one of claim 1 to 5.
7. a kind of broken string as described in any one of claim 1 to 5 repairs the broken wire repair method of structure, feature exists In including the following steps:
The scan line or data line for detecting broken string, the scan line or data line for defining broken string are route to be repaired;
The common wire at route both ends to be repaired is connected with the connection to be repaired.
8. broken wire repair method according to claim 7, which is characterized in that " scan line or data line of detection broken string, The scan line or data line for defining broken string are route to be repaired " when, include the following steps:
It detects every scan line or whether every data line breaks;
If detecting, certain scan line or certain data line break, further the number of the scan line of detection broken string or broken string According to the specific broken string quantity of line and specific broken position.
9. broken wire repair method according to claim 8, which is characterized in that " by the common wire at route both ends to be repaired Be connected with the connection to be repaired " when, include the following steps:
It detects that the specific broken string quantity of certain route to be repaired only has at one, and detects position of specifically breaking accordingly at this It sets;
By route to be repaired this at specific broken position at pixel electrode two sides common wire, with route to be repaired from tool The both ends of body broken position are attached conducting.
10. broken wire repair method according to claim 8, which is characterized in that " by the common wire at route both ends to be repaired Be connected with the connection to be repaired " when, include the following steps:
It detects that the specific broken string quantity of certain route to be repaired only has many places, and detects that every place specifically breaks position accordingly It sets;
Respectively by the common wire of the pixel electrode two sides at the specific broken position of many places of route to be repaired, with route to be repaired Conducting is attached from the both ends of specific broken position.
CN201910504015.4A 2019-06-11 2019-06-11 Broken string repairs structure, display panel and broken wire repair method Pending CN110376809A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201910504015.4A CN110376809A (en) 2019-06-11 2019-06-11 Broken string repairs structure, display panel and broken wire repair method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201910504015.4A CN110376809A (en) 2019-06-11 2019-06-11 Broken string repairs structure, display panel and broken wire repair method

Publications (1)

Publication Number Publication Date
CN110376809A true CN110376809A (en) 2019-10-25

Family

ID=68250190

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201910504015.4A Pending CN110376809A (en) 2019-06-11 2019-06-11 Broken string repairs structure, display panel and broken wire repair method

Country Status (1)

Country Link
CN (1) CN110376809A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110764328A (en) * 2019-10-28 2020-02-07 合肥京东方显示技术有限公司 Display substrate, maintenance method thereof and display device
CN110967886A (en) * 2019-12-26 2020-04-07 Tcl华星光电技术有限公司 Array substrate and broken line repairing method thereof
WO2021196871A1 (en) * 2020-03-31 2021-10-07 京东方科技集团股份有限公司 Array substrate and manufacturing method therefor, and touch display device
WO2022068653A1 (en) * 2020-09-30 2022-04-07 荣耀终端有限公司 Display apparatus, driving chip, and electronic device

Citations (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20040059672A (en) * 2002-12-28 2004-07-06 엘지.필립스 엘시디 주식회사 Liquid crystal display apparatus including repair line and manufacturing method thereof
EP2159632A1 (en) * 2007-06-28 2010-03-03 Sharp Kabushiki Kaisha Active matrix substrate, liquid crystal panel, liquid crystal display unit, liquid crystal display device, television receiver, and method of manufacturing liquid crystal panel
TW201039031A (en) * 2009-04-17 2010-11-01 Chunghwa Picture Tubes Ltd Display panel having repair structure and method of repairing display panel
CN102023429A (en) * 2009-09-17 2011-04-20 北京京东方光电科技有限公司 TFT-LCK array substrate and method for manufacturing same and method for repairing broken lines
CN102169267A (en) * 2011-05-23 2011-08-31 深圳市华星光电技术有限公司 Flat display panel and repairing method thereof
CN201984264U (en) * 2010-10-29 2011-09-21 北京京东方光电科技有限公司 Thin film transistor array baseplate, liquid crystal display device and repaired array baseplate
US20120200819A1 (en) * 2009-02-06 2012-08-09 Wei-Kai Huang Flat display panel and method of repairing the same
TW201239488A (en) * 2011-03-31 2012-10-01 Chimei Innolux Corp Pixel array substrate, liquid crystal display and repairing method for pixel array substrate
CN103885262A (en) * 2013-12-30 2014-06-25 深圳市华星光电技术有限公司 TFT-LCD (thin film transistor-liquid crystal display) array substrate and data line disconnection restoring method thereof
CN104298035A (en) * 2014-09-23 2015-01-21 京东方科技集团股份有限公司 Array substrate, method for repairing broken data line of array substrate and display device
CN104516133A (en) * 2015-01-27 2015-04-15 深圳市华星光电技术有限公司 Array baseplate and broken line repairing method thereof
CN104932161A (en) * 2015-06-30 2015-09-23 京东方科技集团股份有限公司 Array substrate, manufacturing method and restoration method thereof, and display device
CN105954950A (en) * 2016-07-07 2016-09-21 深圳市华星光电技术有限公司 Array substrate and scanning line repairing method thereof
CN106773427A (en) * 2017-03-10 2017-05-31 京东方科技集团股份有限公司 Data wire method for maintaining and array base palte
CN106950774A (en) * 2017-05-12 2017-07-14 京东方科技集团股份有限公司 Array base palte and preparation method thereof and method for maintaining, display device
US20180348586A1 (en) * 2016-02-15 2018-12-06 Boe Technology Group Co., Ltd. Array substrate and repair method, display panel and display apparatus
CN109445212A (en) * 2018-12-12 2019-03-08 惠科股份有限公司 A kind of display device and its restorative procedure and display

Patent Citations (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20040059672A (en) * 2002-12-28 2004-07-06 엘지.필립스 엘시디 주식회사 Liquid crystal display apparatus including repair line and manufacturing method thereof
EP2159632A1 (en) * 2007-06-28 2010-03-03 Sharp Kabushiki Kaisha Active matrix substrate, liquid crystal panel, liquid crystal display unit, liquid crystal display device, television receiver, and method of manufacturing liquid crystal panel
US20120200819A1 (en) * 2009-02-06 2012-08-09 Wei-Kai Huang Flat display panel and method of repairing the same
TW201039031A (en) * 2009-04-17 2010-11-01 Chunghwa Picture Tubes Ltd Display panel having repair structure and method of repairing display panel
CN102023429A (en) * 2009-09-17 2011-04-20 北京京东方光电科技有限公司 TFT-LCK array substrate and method for manufacturing same and method for repairing broken lines
CN201984264U (en) * 2010-10-29 2011-09-21 北京京东方光电科技有限公司 Thin film transistor array baseplate, liquid crystal display device and repaired array baseplate
TW201239488A (en) * 2011-03-31 2012-10-01 Chimei Innolux Corp Pixel array substrate, liquid crystal display and repairing method for pixel array substrate
CN102169267A (en) * 2011-05-23 2011-08-31 深圳市华星光电技术有限公司 Flat display panel and repairing method thereof
CN103885262A (en) * 2013-12-30 2014-06-25 深圳市华星光电技术有限公司 TFT-LCD (thin film transistor-liquid crystal display) array substrate and data line disconnection restoring method thereof
CN104298035A (en) * 2014-09-23 2015-01-21 京东方科技集团股份有限公司 Array substrate, method for repairing broken data line of array substrate and display device
CN104516133A (en) * 2015-01-27 2015-04-15 深圳市华星光电技术有限公司 Array baseplate and broken line repairing method thereof
CN104932161A (en) * 2015-06-30 2015-09-23 京东方科技集团股份有限公司 Array substrate, manufacturing method and restoration method thereof, and display device
US20180348586A1 (en) * 2016-02-15 2018-12-06 Boe Technology Group Co., Ltd. Array substrate and repair method, display panel and display apparatus
CN105954950A (en) * 2016-07-07 2016-09-21 深圳市华星光电技术有限公司 Array substrate and scanning line repairing method thereof
CN106773427A (en) * 2017-03-10 2017-05-31 京东方科技集团股份有限公司 Data wire method for maintaining and array base palte
CN106950774A (en) * 2017-05-12 2017-07-14 京东方科技集团股份有限公司 Array base palte and preparation method thereof and method for maintaining, display device
CN109445212A (en) * 2018-12-12 2019-03-08 惠科股份有限公司 A kind of display device and its restorative procedure and display

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110764328A (en) * 2019-10-28 2020-02-07 合肥京东方显示技术有限公司 Display substrate, maintenance method thereof and display device
CN110967886A (en) * 2019-12-26 2020-04-07 Tcl华星光电技术有限公司 Array substrate and broken line repairing method thereof
WO2021196871A1 (en) * 2020-03-31 2021-10-07 京东方科技集团股份有限公司 Array substrate and manufacturing method therefor, and touch display device
US12001622B2 (en) 2020-03-31 2024-06-04 Beijing Boe Display Technology Co., Ltd. Array substrate and manufacturing method thereof, and touch display device
WO2022068653A1 (en) * 2020-09-30 2022-04-07 荣耀终端有限公司 Display apparatus, driving chip, and electronic device
US11935498B2 (en) 2020-09-30 2024-03-19 Honor Device Co., Ltd. Display apparatus with signal repair circuit, drive chip therefor, and related electronic device

Similar Documents

Publication Publication Date Title
CN110376809A (en) Broken string repairs structure, display panel and broken wire repair method
CN100374949C (en) Liquid crystal display device and manufacturing method thereof
KR100497052B1 (en) Liquid crystal display device
EP0772183B1 (en) Matrix-type display capable of being repaired by pixel unit and a repair method therefor
CN104635391B (en) Array base palte and its manufacture method for liquid crystal display device
CN100444231C (en) Liquid crystal display and driving method thereof
CN1773357B (en) Thin film transistor array panel to improve connection with test line
US8259245B2 (en) Liquid crystal display and photomask for manufacturing the same
JP4068518B2 (en) Display device substrate and manufacturing method thereof
CN110208995A (en) A kind of array substrate, display panel and display device
CN107219953A (en) A kind of flexible touch-control display panel and preparation method thereof, display device
KR101318305B1 (en) Array substrate and display apparatus using the same
KR19990014339A (en) LCD Display
WO2017138469A1 (en) Active-matrix substrate and display panel
JPH022585A (en) Pixel array having zig-zag three primary color
CN102799033A (en) Display panel, production method thereof and display device
CN107450247A (en) Dot structure and array base palte
CN105988241A (en) Curved display device
US8582044B2 (en) Liquid crystal display and repairing method thereof
CN108873550A (en) A kind of array substrate and display device of electronic paper
CN107505791A (en) Array base palte and display panel
CN101556780B (en) Liquid crystal display panel
CN107490915A (en) Array base palte and display panel
KR101429904B1 (en) Liquid crystal display device and method for repairing the same
KR101107708B1 (en) Substrate for Thin Film Transistor Array in Liquid Crystal Display Device

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
RJ01 Rejection of invention patent application after publication

Application publication date: 20191025

RJ01 Rejection of invention patent application after publication