CN105954950A - Array substrate and scanning line repairing method thereof - Google Patents

Array substrate and scanning line repairing method thereof Download PDF

Info

Publication number
CN105954950A
CN105954950A CN201610531997.2A CN201610531997A CN105954950A CN 105954950 A CN105954950 A CN 105954950A CN 201610531997 A CN201610531997 A CN 201610531997A CN 105954950 A CN105954950 A CN 105954950A
Authority
CN
China
Prior art keywords
described
public electrode
scan line
electrode wire
part
Prior art date
Application number
CN201610531997.2A
Other languages
Chinese (zh)
Inventor
陈建超
Original Assignee
深圳市华星光电技术有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 深圳市华星光电技术有限公司 filed Critical 深圳市华星光电技术有限公司
Priority to CN201610531997.2A priority Critical patent/CN105954950A/en
Publication of CN105954950A publication Critical patent/CN105954950A/en

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02FDEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH IS MODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THE DEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY, COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g. SWITCHING, GATING, MODULATING OR DEMODULATING; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF; FREQUENCY-CHANGING; NON-LINEAR OPTICS; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating, or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating, or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating, or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362Active matrix addressed cells
    • G02F1/136259Repairing; Defects
    • GPHYSICS
    • G02OPTICS
    • G02FDEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH IS MODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THE DEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY, COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g. SWITCHING, GATING, MODULATING OR DEMODULATING; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF; FREQUENCY-CHANGING; NON-LINEAR OPTICS; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating, or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating, or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating, or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362Active matrix addressed cells
    • G02F1/136286Wiring, e.g. gate line, drain line
    • GPHYSICS
    • G02OPTICS
    • G02FDEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH IS MODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THE DEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY, COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g. SWITCHING, GATING, MODULATING OR DEMODULATING; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF; FREQUENCY-CHANGING; NON-LINEAR OPTICS; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating, or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating, or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating, or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362Active matrix addressed cells
    • G02F1/136259Repairing; Defects
    • G02F2001/136263Line defect

Abstract

The invention provides an array substrate and a scanning line repairing method thereof. The array substrate comprises multiple scanning lines which are arranged at intervals and at least two first common electrode wires parallel to the scanning lines, wherein at least two first common electrode wires are arranged between two adjacently arranged scanning lines. The scanning line repairing method comprises the following steps: selecting at least one first common electrode wire as a repairing line from at least two first common electrode wires according to fracture location of the scanning line; and bridging the scanning lines at the two sides of the fracture position by utilizing the repairing line. The scanning line repairing method of the array substrate is high in successful rate.

Description

A kind of scan line method for repairing and mending of array base palte and array base palte

Technical field

The present invention relates to Display Technique field, particularly relate to a kind of array base palte and array base palte Scan line method for repairing and mending.

Background technology

Currently displaying technology quickly grows, and the resolution of display floater is more and more higher, wherein The scan line quantity of array base palte also gets more and more.The most existing 4k display floater, its array The scan line of substrate has 2160, and crack conditions easily occurs in substantial amounts of scan line.

Existing scan line method for repairing and mending is to remove pixel electrode ITO, generates and connects scan line fracture The tungsten layer of both sides, position.Which there is problems of pixel electrode ITO and easily occurs removing the most thorough The situation at the end, causes repairing unsuccessfully, and scan line success rate of mending is relatively low.

Summary of the invention

It is an object of the invention to provide the scan line repairing side of a kind of array base palte and array base palte Method, to solve the problem that in prior art, scan line success rate of mending is low.

For solving the problems referred to above, the present invention proposes the scan line method for repairing and mending of a kind of array base palte, its Middle array base palte includes spaced multi-strip scanning line and is parallel at least two of scan line First public electrode wire, arranges at least two first public affairs between two scan lines being wherein disposed adjacent Common-battery polar curve, scan line method for repairing and mending includes: according to the fracture position of scan line from least two article One public electrode wire select at least one the first public electrode wires as patch cord;Utilize patch cord The scan line of bridge joint fracture position both sides.

Wherein, scan line is arranged with layer with the first public electrode.

Wherein, the step utilizing the scan line of patch cord bridge joint fracture position both sides includes: from repairing Line intercepts part the first public electrode wire;Utilize repair layer by the scan line electricity of fracture position both sides It is connected to part the first public electrode wire.

Wherein, array base palte farther includes between two adjacent scan lines and public with first Common-battery polar curve a plurality of second public electrode wire connected vertically;From as at least one the of patch cord The step intercepting part the first public electrode wire in one public electrode wire farther includes: public from second Common-battery polar curve intercepts part the second public electrode wire being connected with part the first public electrode wire;Profit By repair layer, the scan line of fracture position both sides is electrically connected to the step of part the first public electrode wire Suddenly include: utilize repair layer that the scan line of fracture position both sides is electrically connected to part the second common electrical Polar curve.

Wherein, the first public electrode wire, the second public electrode wire and scan line are arranged with layer.

Wherein, one end of part the second public electrode wire is more leaned on compared to part the first public electrode wire Closely there is the scan line of fracture position, repair layer be arranged at one end of part the second public electrode wire with Between the scan line of fracture position both sides.

Wherein, according to the fracture position of scan line select from least two the first public electrode wires to Few first public electrode wire includes as the step of patch cord: retain at least two first public At least one the first public electrode wires in electrode wires keep the second public electrode not being intercepted Electrical connection between line.

For solving above-mentioned technical problem, the present invention proposes a kind of array base palte, including spaced Multi-strip scanning line and be parallel at least two the first public electrode wires of scan line, is disposed adjacent Article two, arranging at least two the first public electrode wires between scan line, at least one of which first is public Electrode wires is intercepted out part the first public electrode wire, and part the first public electrode wire electricity intercepted It is connected to the scan line of fracture position both sides.

Wherein, array base palte farther includes between two adjacent scan lines and public with first Common-battery polar curve a plurality of second public electrode wire connected vertically, wherein the second public electrode wire is intercepted Part the second public electrode wire that part the first public electrode wire gone out and intercept is connected, wherein intercepts Part the first public electrode wire be electrically connected to the scan line of fracture position both sides.

For solving above-mentioned technical problem, the present invention also proposes a kind of array base palte, this array base palte bag Include spaced multi-strip scanning line, be parallel at least two the first public electrode wires of scan line with And between two articles of adjacent scan lines and connected vertically with the first public electrode wire a plurality of Two public electrode wires, arrange between two scan lines being wherein disposed adjacent at least two first public Electrode wires.

Array base palte in the scan line method for repairing and mending of array base palte of the present invention includes spaced Multi-strip scanning line and be parallel at least two the first public electrode wires of scan line, the most adjacent sets Between two scan lines put, at least two the first public electrode wires, the method for repairing and mending of scan line are set Then include: from least two the first public electrodes, select at least one according to the fracture position of scan line Bar the first public electrode wire, as patch cord, utilizes the first public electrode wire bridge joint as patch cord The scan line of fracture position both sides.Between every two scan lines, at least two the first public electrodes are set Line, compares the situation generally only arranging a public electrode wire, a plurality of in array base palte of the present invention Public electrode wire increases the storage electric capacity between public electrode wire and scan line, and utilizes public Electrode wires, as patch cord, generates less tungsten layer and can connect scan line fracture position both sides, real Now breaking part is repaired.

Accompanying drawing explanation

Fig. 1 is the flow process signal of scan line method for repairing and mending first embodiment of array base palte of the present invention Figure;

Fig. 2 is the structural representation of array base palte in scan line method for repairing and mending shown in Fig. 1;

Fig. 3 is the flow process signal of scan line method for repairing and mending second embodiment of array base palte of the present invention Figure;

Fig. 4 is the structural representation of array base palte in scan line method for repairing and mending shown in Fig. 3;

Fig. 5 is the repairing schematic diagram of infall scan line fracture in scan line method for repairing and mending shown in Fig. 3;

Fig. 6 is the repairing signal of scan line fracture at non-crossing in scan line method for repairing and mending shown in Fig. 3 Figure;

Fig. 7 is the structural representation of array base palte the first embodiment of the present invention;

Fig. 8 is the structural representation of array base palte the second embodiment of the present invention.

Detailed description of the invention

For making those skilled in the art be more fully understood that technical scheme, below in conjunction with attached Figure and detailed description of the invention are to inventing a kind of array base palte and the scan line of array base palte provided Method for repairing and mending is described in further detail.

Refer to scan line method for repairing and mending the first embodiment party that Fig. 1, Fig. 1 are array base paltes of the present invention The schematic flow sheet of formula.

First in present embodiment, the structure of array base palte refers to Fig. 2, Fig. 2 is to sweep shown in Fig. 1 Retouch the structural representation of array base palte in lines mending method.

This array base palte 200 includes spaced multi-strip scanning line 21 and is parallel to scan line A plurality of first public electrode wire 22 of 21, is arranged between two scan lines 21 being wherein disposed adjacent Article at least two, the first public electrode wire 22, is provided with two article in present embodiment array base palte 200 One public electrode wire 22, arranges three or the array of above first public electrode in other embodiments In substrate, the method for repairing and mending of scan line all can in like manner be released.

In this array base palte 200, the method for repairing and mending of scan line comprises the following steps:

S101: according to the fracture position of scan line select from least two the first public electrode wires to Few first public electrode wire is as patch cord.

S102: utilize the scanning of the first public electrode wire bridge joint fracture position both sides as patch cord Line.

For array base palte 200, the crack conditions of scan line 21 can be divided into two kinds, and one is Fracture position A is at the infall ((1) refering in Fig. 2) with data wire, and two is fracture position With the non-crossing of data wire at ((2) refering in Fig. 2).

Scan line 21 is repaired, is i.e. that the scan line of both sides by fracture position A connects again Pick up.

In present embodiment, first public electrode wire 22 in selecting two is as patch cord; It being cut off at h1 and h2, part the first public electrode wire 22 between h1 to h2 is as bridge Beam;Then form repair layer 23, generally tungsten layer, part the first public electrode wire 22 is connected To scan line 21;Formed repair layer 23 and part the first public electrode wire 22 bridge fracture position The scan line 21 of both sides.

Present embodiment utilize a part for the first public electrode wire to bridge fracture position both sides Scan line, therefore generate less tungsten layer and can connect the scan line of fracture position both sides, accordingly The success rate that can improve repairing to a certain extent.

Refer to the scan line method for repairing and mending second that Fig. 3 and Fig. 4, Fig. 3 are array base paltes of the present invention The schematic flow sheet of embodiment, Fig. 4 is array base palte in scan line method for repairing and mending shown in Fig. 3 Structural representation.

Array base palte 400 in Fig. 4 includes spaced multi-strip scanning line 41 and is parallel to A plurality of first public electrode wire 43 of scan line, between two scan lines 41 being wherein disposed adjacent At least two the first public electrode wires 43 are set, array base palte 100 also include be positioned at adjacent two Between bar scan line 41 and with the first public electrode wire 43 a plurality of second public electrode connected vertically Line 44.

In general, array base palte 400 also including, interval is arranged and vertical with scan line 41 Data wire 42, scan line 41 and data wire 42 are partitioned into each pixel cell, each pixel cell In be provided with pixel electrode 45, the shape that pixel electrode 45 dissipates in surrounding.And from being perpendicular to battle array The direction of row substrate 400 is observed, and the second public electrode wire 44 does not has coincidence part with pixel electrode 45 Point.

Wherein, first public electrode wire the 43, second public electrode wire 44 and scan line 41 are at array Arrange with layer on substrate.I.e. in array base palte 100 manufacture process, the first public electrode wire 43, Second public electrode wire 44 and scan line 41 are formed at same layer by photoetching process, the most successively Form insulating barrier, data wire 42, another insulating barrier and pixel electrode 45.

In the array base palte 400 of present embodiment, scan line method for repairing and mending includes step:

S301: according to the fracture position of scan line select from least two the first public electrode wires to Few first public electrode wire is as patch cord.

In this step, at least one the at least two article of first public electrode wire are the most also retained One public electrode wire keeps the electrical connection between the second public electrode wire not being intercepted.The most a plurality of Will not be all as patch cord in first public electrode wire.

S302: from public as intercepting part first at least one the first public electrode wires of patch cord Common-battery polar curve, intercepts from the second public electrode wire and is connected with part the first public electrode wire intercepted Part the second public electrode wire;

As it was noted above, repair layer can be utilized to incite somebody to action after the first public electrode wire intercepting part The scan line of fracture position both sides is electrically connected to part the first public electrode wire intercepted.

Also step S303 can be carried out after intercepting part the second public electrode wire.

S303: utilize repair layer that the scan line of fracture position both sides is electrically connected to the part the intercepted Two public electrode wires.

Wherein, one end of part second public electrode wire of intercepting is public compared to the part first intercepted Closer to there is the scan line of fracture position in common-battery polar curve, repair layer is arranged at the part second of intercepting Between one end and the scan line of fracture position both sides of public electrode wire.

Specifically, the fracture position A of scan line 41 may at the infall with data wire 42, It is likely at non-crossing.When fracture occurs in infall scan line, refer to Fig. 5, Fig. 5 is the repairing schematic diagram of infall scan line fracture in scan line method for repairing and mending shown in Fig. 3.First First choose one first public electrode wire 43 as patch cord, and at h1 and h2, intercept part the One public electrode wire 43;Then intercept and part the first public electrode at v1, v2, v3, v4 Part the second public electrode wire 44 that line 43 connects;Eventually form repair layer 46, generally tungsten layer, The scan line 41 of fracture position A both sides is connected to part the second public electrode wire 44 intercepted.

Wherein, the first public electrode wire 43 is blocked at h1, h2;Second public electrode wire 44 Block at v1, v2, v3, v4;The part intercepted out is as connecting fracture position A both sides Bridge part, and this bridging part is connected to scan line 41, it is therefore desirable to disconnect with public electrode wire, In order to avoid causing scan line 41 to be in common electric voltage.

When at non-crossing, fracture occurs in scan line, referring to Fig. 6, Fig. 6 is Fig. 3 institute Show the repairing schematic diagram that in scan line method for repairing and mending, at non-crossing, scan line ruptures.Choose one equally One public electrode wire 43, as patch cord, intercepts part the first public electrode wire at h1 and h2 43;Part the second public electrode being connected with part the first public electrode wire is intercepted at v1 and v2 Line 44;Eventually form repair layer 46, be connected to the scan line 41 of fracture position A both sides intercept Part the second public electrode wire 44.

Compared to the method for repairing and mending in above-mentioned array base palte 200, required repairing in present embodiment Mend layer 46 less.And understand in conjunction with Fig. 4, observe from the direction being perpendicular to array base palte 400, Second public electrode wire 44 does not has intersection, hence along the second common electrical with pixel electrode 45 Repair layer 46 and pixel electrode 45 that polar curve 44 is formed do not have intersection yet, i.e. repair in formation When mending layer 46, it is not necessary to erasing pixel electrode 45.It is greatly improved the success that scan line 41 is repaired Rate.

Refer to the structural representation that Fig. 7, Fig. 7 are array base palte the first embodiments of the present invention. Present embodiment array base palte 700, including spaced multi-strip scanning line 71 and be parallel to sweep Retouch a plurality of first public electrode wire 72 of line, arrange between two scan lines 71 being disposed adjacent to Few two the first public electrode wires 72, at least one of which the first public electrode wire 72 is intercepted out Part the first public electrode wire 72, and intercept part the first public electrode wire 72 be electrically connected to break Split the scan line 71 of both sides, position.

Wherein, array base palte 700 may also include between two adjacent scan lines 71 and With the first public electrode wire 72 a plurality of second public electrode wire 73 connected vertically, wherein second is public Common-battery polar curve 73 is intercepted out the part second being connected with part the first public electrode wire 72 intercepted Public electrode wire 73, part the first public electrode wire 72 wherein intercepted is electrically connected to fracture position The scan line 71 of both sides, can pass through intercepted part the second public electrode 73 and be formed Tungsten layer is connected to the scan line 71 of fracture position both sides, it is possible to only passes through formed tungsten layer and is connected to The scan line 71 of fracture position both sides.Present embodiment array base palte 700 and above-mentioned array base palte 400 are similar to, and specifically repeat no more.

Refer to the structural representation that Fig. 8, Fig. 8 are array base palte the second embodiments of the present invention. Present embodiment array base palte 800 includes spaced multi-strip scanning line 81, is parallel to scan line A plurality of first public electrode wire 82 and between two adjacent scan lines and public with first Common-battery polar curve a plurality of second public electrode wire 83 connected vertically, two be wherein disposed adjacent scanning At least two the first public electrode wires 82 are set between line 81.

Present embodiment array base palte 800 realizes method and the above-mentioned array base palte that scan line is repaired 400 scan line method for repairing and mending are similar to, and specifically repeat no more.Therefore present embodiment array base palte 800 Scan line success rate of mending higher.

The foregoing is only embodiments of the present invention, not thereby limit the patent model of the present invention Enclosing, every equivalent structure utilizing description of the invention and accompanying drawing content to be made or equivalence flow process become Change, or be directly or indirectly used in other relevant technical fields, be the most in like manner included in the present invention's In scope of patent protection.

Claims (10)

1. the scan line method for repairing and mending of an array base palte, it is characterised in that described array base palte bag Include spaced multi-strip scanning line and to be parallel at least two of described scan line first public Electrode wires, arranges at least two described first public affairs between two the described scan lines being wherein disposed adjacent Common-battery polar curve, described scan line method for repairing and mending includes:
Fracture position according to described scan line selects from described at least two the first public electrode wires Select the first public electrode wire described at least one as patch cord;
Described patch cord is utilized to bridge the described scan line of described fracture position both sides.
Scan line method for repairing and mending the most according to claim 1, it is characterised in that described scanning Line is arranged with layer with described first public electrode.
Scan line method for repairing and mending the most according to claim 1, it is characterised in that described utilization The step of the described scan line that described patch cord bridges described fracture position both sides includes:
Described first public electrode wire of part is intercepted from described patch cord;
Utilize repair layer that the described scan line of described fracture position both sides is electrically connected to described part First public electrode wire.
Scan line method for repairing and mending the most according to claim 3, it is characterised in that described array Substrate farther include between two adjacent described scan lines and with described first common electrical Polar curve a plurality of second public electrode wire connected vertically;
Described from as intercepting portion described at least one the first public electrode wires of described patch cord The step dividing described first public electrode wire farther includes:
From described second public electrode wire, intercepting is connected with described part the first public electrode wire Described second public electrode wire of part;
It is described that to utilize repair layer the described scan line of described fracture position both sides to be electrically connected to described The step of part the first public electrode wire includes:
Described repair layer is utilized the described scan line of described fracture position both sides to be electrically connected to described Part the second public electrode wire.
Scan line method for repairing and mending the most according to claim 4, it is characterised in that described first Public electrode wire, described second public electrode wire and described scan line are arranged with layer.
Scan line method for repairing and mending the most according to claim 4, it is characterised in that described part One end of second public electrode wire compared to described part the first public electrode wire closer to existing Stating the described scan line of fracture position, the part second that described repair layer is arranged at described intercepting is public Between described one end and the described scan line of described fracture position both sides of electrode wires.
Scan line method for repairing and mending the most according to claim 4, it is characterised in that described basis The fracture position of described scan line select from described at least two described first public electrode wires to Few described first public electrode wire includes as the step of patch cord:
Described at least two described first public electrode wires described in reservation at least one, first is public Common-battery polar curve keeps the electrical connection between described second public electrode wire not being intercepted.
8. an array base palte, it is characterised in that described array base palte includes spaced a plurality of Scan line and be parallel at least two the first public electrode wires of described scan line, is disposed adjacent Article two, at least two described first public electrode wires, at least one of which are set between described scan line Described first public electrode wire is intercepted out described first public electrode wire of part, and the part intercepted First public electrode wire is electrically connected to the described scan line of fracture position both sides.
Array base palte the most according to claim 8, it is characterised in that described array base palte enters One step includes hanging down between two adjacent described scan lines and with described first public electrode wire Direct-connected a plurality of second public electrode wire connect, wherein said second public electrode wire is intercepted out and cuts Described second public electrode wire of part that part the first public electrode wire taken connects, wherein intercepts Part the first public electrode wire is electrically connected to the described scan line of described fracture position both sides.
10. an array base palte, it is characterised in that described array base palte includes spaced many Bar scan line, it is parallel at least two the first public electrode wires of described scan line and is positioned at adjacent Two described scan lines between and with described first public electrode wire connected vertically a plurality of second Public electrode wire, arranges at least two articles described between the two articles of described scan lines being wherein disposed adjacent One public electrode wire.
CN201610531997.2A 2016-07-07 2016-07-07 Array substrate and scanning line repairing method thereof CN105954950A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201610531997.2A CN105954950A (en) 2016-07-07 2016-07-07 Array substrate and scanning line repairing method thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201610531997.2A CN105954950A (en) 2016-07-07 2016-07-07 Array substrate and scanning line repairing method thereof

Publications (1)

Publication Number Publication Date
CN105954950A true CN105954950A (en) 2016-09-21

Family

ID=56900448

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201610531997.2A CN105954950A (en) 2016-07-07 2016-07-07 Array substrate and scanning line repairing method thereof

Country Status (1)

Country Link
CN (1) CN105954950A (en)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0512840A2 (en) * 1991-05-08 1992-11-11 Sharp Kabushiki Kaisha An active matrix display device
CN102156365A (en) * 2009-12-08 2011-08-17 乐金显示有限公司 Liquid crystal display device and method for manufacturing the same and method for repairing the same
CN201984264U (en) * 2010-10-29 2011-09-21 北京京东方光电科技有限公司 Thin film transistor array baseplate, liquid crystal display device and repaired array baseplate
CN103529574A (en) * 2012-07-04 2014-01-22 精工爱普生株式会社 Electro-optic device and electronic apparatus

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0512840A2 (en) * 1991-05-08 1992-11-11 Sharp Kabushiki Kaisha An active matrix display device
CN102156365A (en) * 2009-12-08 2011-08-17 乐金显示有限公司 Liquid crystal display device and method for manufacturing the same and method for repairing the same
CN201984264U (en) * 2010-10-29 2011-09-21 北京京东方光电科技有限公司 Thin film transistor array baseplate, liquid crystal display device and repaired array baseplate
CN103529574A (en) * 2012-07-04 2014-01-22 精工爱普生株式会社 Electro-optic device and electronic apparatus

Similar Documents

Publication Publication Date Title
CN1318905C (en) Liquid crystal display with high aperture ratio
CN101211026B (en) Display substrate, liquid crystal display apparatus comprising same and its mending method
CN100504558C (en) Active matrix substrate and display device
CN100374942C (en) Active matrix substrate and display equipment and manufacturing method thereof
CN103488009B (en) Array substrate, control method and liquid crystal display device
CN102540595B (en) Array substrate, manufacturing method thereof and liquid crystal panel
CN103217844B (en) Display panel and display device
CN101644863B (en) TFT-LCD pixel structure and manufacturing method thereof
CN100417992C (en) Liquid crystal display device
CN101943821B (en) Liquid crystal display device
KR100318539B1 (en) thin film transistor panels for liquid crystal displays
CN105580065B (en) Display panel and the display device for having the display panel
CN101221973B (en) Organic light emitting display device and method for fabricating the same
CN104049420A (en) Liquid crystal display
CN102621749B (en) Liquid crystal display
CN104656331A (en) Display panel
CN101295717B (en) Thin-film transistor panel and its production method
CN101833200B (en) Horizontal electric field type liquid crystal display device and manufacturing method thereof
US7081706B2 (en) Plasma display panel and method of forming the same
CN102243401A (en) Liquid crystal display device
US8264631B2 (en) Common repair structures for close bus in a liquid crystal display
CN105759522B (en) The broken wire repair method of TFT substrate
US8921864B2 (en) TFT-LCD array substrate and manufacturing method thereof
CN102289113A (en) Liquid crystal display device, and manufacture method and driving method of liquid display device
CN102087451A (en) Active matrix substrate, display device, and active matrix substrate inspecting method

Legal Events

Date Code Title Description
PB01 Publication
C06 Publication
SE01 Entry into force of request for substantive examination
C10 Entry into substantive examination