CN110333223A - The recognition methods of black phosphorus crystal orientation and device - Google Patents

The recognition methods of black phosphorus crystal orientation and device Download PDF

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CN110333223A
CN110333223A CN201910639342.0A CN201910639342A CN110333223A CN 110333223 A CN110333223 A CN 110333223A CN 201910639342 A CN201910639342 A CN 201910639342A CN 110333223 A CN110333223 A CN 110333223A
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crystal orientation
black phosphorus
target
identified
raman
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CN110333223B (en
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仇巍
李如冰
亢一澜
曲传咏
张茜
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Tianjin University
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/44Raman spectrometry; Scattering spectrometry ; Fluorescence spectrometry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/447Polarisation spectrometry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/65Raman scattering
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N2021/4792Polarisation of scatter light

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  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

The present invention provides a kind of recognition methods of black phosphorus crystal orientation and devices, this method comprises: the incident light for acquiring different polarization angle is irradiated the Raman diffused light spectrum information at generated target signature peak to black phosphorus to be identified under Raman system orthogonal polarization modes;The Raman diffused light spectrum information at target signature peak corresponding to the incident light to different polarization angle carries out data extraction, obtains target data pair;The crystal orientation of black phosphorus to be identified is determined according to fitting result to being fitted to target data by the Raman scattering effectiveness formula at target signature peak.The crystal orientation accuracy for the black phosphorus to be identified that the recognition methods of black phosphorus crystal orientation of the invention finally identifies is good, when being identified to the black phosphorus to be identified of different-thickness, finally obtained black phosphorus crystal orientation alleviates the technical problem of the recognition methods accuracy difference of existing black phosphorus crystal orientation than more consistent.

Description

The recognition methods of black phosphorus crystal orientation and device
Technical field
The present invention relates to the technical fields of semiconductor material, recognition methods and dress more particularly, to a kind of black phosphorus crystal orientation It sets.
Background technique
It is identified in relation to the crystal orientation of black phosphorus or phosphorus alkene, existing laboratory facilities mainly include based on TEM (Transmission Electron microscope, transmission electron microscope), AFM (Atomic Force Microscope, atomic force microscope) Deng the spectral classes means such as microscopic observation method, angular resolution conductivity method and infrared, Raman.Wherein, angular resolution conductivity side Method is the measurement of contact, and spatial resolution and angular resolution sensitivity are lower;The mode of microscopic observation be difficult to realize it is lossless, The quantitative measurment of line;The spectral resolution of infrared spectrometry and the spatial resolution of equipment are also difficult to meet the black of miniature scale Phosphate material accurately measures.The crystal orientation of black phosphorus can quickly, accurately, be contactlessly identified based on polarization Raman spectrum.
Currently, generalling use polarization configuration (the scatter light polarization direction detected and the excitation of parallel polarization (collaboration) Light polarization direction remains parallel) black phosphorus crystal orientation is identified.Under the polarization configuration, by with a fixed step size at one week (360 degree) continuously turn partially and acquire the Raman information under different polarization direction, fitting polarization angle and corresponding spectrum in range Middle Ag 2The relation curve of Raman signatures peak intensity, the angle where the extreme value of peak intensity in relation curve determine the crystalline substance of black phosphorus To.However, causing to pass through A using parallel polarization due to effects such as the birefringent and light absorptions of black phosphorusg 2Characteristic peak is identifying not With thickness black phosphorus crystal orientation when, be easy to appear misrecognition.As it can be seen that the recognition methods accuracy of existing black phosphorus crystal orientation is poor.
Summary of the invention
In view of this, the purpose of the present invention is to provide a kind of recognition methods of black phosphorus crystal orientation and device, it is existing to alleviate Black phosphorus crystal orientation recognition methods accuracy difference technical problem.
In a first aspect, the embodiment of the invention provides a kind of recognition methods of black phosphorus crystal orientation, comprising: vertical in Raman system Under polarization mode, the incident light for acquiring different polarization angle is irradiated the drawing at generated target signature peak to black phosphorus to be identified Graceful scattering spectrum information;The Raman diffused light spectrum information at target signature peak corresponding to the incident light to the different polarization angle Data extraction is carried out, target data pair is obtained, wherein the target data is to for incident light polarization angle and target signature peak The data pair that light intensity is constituted;By target Raman scattering effectiveness formula to the target data to being fitted, and according to fitting As a result the crystal orientation of the black phosphorus to be identified is determined, wherein the target Raman scattering effectiveness formula is that the Raman system is vertical The Raman scattering effectiveness formula at the target signature peak under polarization mode, the crystal orientation of the black phosphorus to be identified are described to be identified black The armchair direction of phosphorus.
Further, the target signature peak includes AgCharacteristic peak, the AgCharacteristic peak includes at least one of: Ag 1It is special Levy peak, Ag 2Characteristic peak.
Further, when the target signature peak is the Ag 1When characteristic peak, the target data is to for first object number According to right, wherein the first object data are to for the incident light polarization angle and the Ag 1Number between the light intensity of characteristic peak According to right;By target Raman scattering effectiveness formula to the target data to being fitted, and described in determining according to fitting result The crystal orientation of black phosphorus to be identified, comprising:
The target Raman scattering effectiveness formula such as formula (1)
Wherein,Indicate the Ag 1The light intensity of characteristic peak, a1、c1Indicate the A of the black phosphorus to be identifiedg 1The drawing of characteristic peak Graceful tensor element, φ1Indicate a1With the c1Between phase difference,Indicate the incident light polarization angle, θ1It is first Crystal orientation match value;By formula (1) to the first object data to being fitted, the first crystal orientation match value is obtained;Work as a1< c1When, the first crystal orientation match value is the crystal orientation of the black phosphorus to be identified;Work as a1>c1When, the first crystal orientation match value is just Handing over direction is the crystal orientation of the black phosphorus to be identified.
Further, when the target signature peak is the Ag 2When characteristic peak, the target data is to for the second number of targets According to right, wherein second target data is to for the incident light polarization angle and the Ag 2Number between the light intensity of characteristic peak According to right;By target Raman scattering effectiveness formula to the target data to being fitted, and described in determining according to fitting result The crystal orientation of black phosphorus to be identified, comprising:
The target Raman scattering effectiveness formula such as formula (2)
Wherein,Indicate the Ag 2The light intensity of characteristic peak, a2、c2Indicate the A of the black phosphorus to be identifiedg 2The drawing of characteristic peak Graceful tensor element, φ2Indicate a2With the c2Between phase difference,Indicate the incident light polarization angle, θ2It is second Crystal orientation match value;By formula (2) to second target data to being fitted, the second crystal orientation match value is obtained;Work as a2< c2When, the second crystal orientation match value is the crystal orientation of the black phosphorus to be identified;Work as a2>c2When, the second crystal orientation match value is just Handing over direction is the crystal orientation of the black phosphorus to be identified.
Further, when the target signature peak is the Ag 1Characteristic peak and the Ag 2When characteristic peak, the target data To the respectively described first object data to second target data pair;By target Raman scattering effectiveness formula to described Target data determines the crystal orientation of the black phosphorus to be identified according to fitting result to being fitted, comprising:
The target Raman scattering effectiveness formula is formula (1) and formula (2)
Wherein,Respectively indicate the Ag 1The light intensity of characteristic peak, Ag 2The light intensity of characteristic peak, a1、c1Described in expression The A of black phosphorus to be identifiedg 1The Raman tensor element of characteristic peak, φ1Indicate a1With the c1Between phase difference, a2、c2It indicates The A of the black phosphorus to be identifiedg 2The Raman tensor element of characteristic peak, φ2Indicate a2With the c2Between phase difference,Table Show the incident light polarization angle, θ1、θ2Respectively the first crystal orientation match value, the second crystal orientation match value;By formula (1) to described First object data obtain the first crystal orientation match value to being fitted, and by formula (2) to second target data pair It is fitted, obtains the second crystal orientation match value;Work as a1<c1And a2<c2When, the first crystal orientation match value and described second The average value of crystal orientation match value is the crystal orientation of the black phosphorus to be identified;Work as a1>c1And a2>c2When, the first crystal orientation match value and The orthogonal direction of the average value of the second crystal orientation match value is the crystal orientation of the black phosphorus to be identified.
Second aspect, the embodiment of the invention also provides a kind of identification devices of black phosphorus crystal orientation, comprising: acquisition module is used Produced by the incident light under Raman system orthogonal polarization modes, acquiring different polarization angle is irradiated black phosphorus to be identified Target signature peak Raman diffused light spectrum information;Data extraction module, for the incident light institute to the different polarization angle The Raman diffused light spectrum information at corresponding target signature peak carries out data extraction, obtains target data pair, wherein the number of targets According to the data pair constituted to the light intensity for incident light polarization angle and target signature peak;Fitting module, for passing through target Raman Scattering efficiency formula to being fitted, and determines the crystal orientation of the black phosphorus to be identified according to fitting result to the target data, Wherein, the target Raman scattering effectiveness formula is the Raman at the target signature peak under the Raman system orthogonal polarization modes Scattering efficiency formula, the crystal orientation of the black phosphorus to be identified are the armchair direction of the black phosphorus to be identified.
The embodiment of the present invention bring it is following the utility model has the advantages that
It in embodiments of the present invention, is to acquire the incident light of different polarization angle under Raman system orthogonal polarization modes The Raman diffused light spectrum information at generated target signature peak is irradiated to black phosphorus to be identified;Then, to different polarization angle Incident light corresponding to target signature peak Raman diffused light spectrum information carry out data extraction, obtain target data pair;Finally, By the Raman scattering effectiveness formula at target signature peak to target data to being fitted, and determine according to fitting result to be identified The crystal orientation of black phosphorus.The crystal orientation accuracy for the black phosphorus to be identified that the recognition methods of black phosphorus crystal orientation of the invention finally identifies is good, When identifying to the black phosphorus to be identified of different-thickness, finally obtained black phosphorus crystal orientation alleviates existing black phosphorus than more consistent The technical problem of the recognition methods accuracy difference of crystal orientation.
Other features and advantages of the present invention will illustrate in the following description, also, partly become from specification It obtains it is clear that understand through the implementation of the invention.The objectives and other advantages of the invention are in specification, claims And specifically noted structure is achieved and obtained in attached drawing.
To enable the above objects, features and advantages of the present invention to be clearer and more comprehensible, preferred embodiment is cited below particularly, and cooperate Appended attached drawing, is described in detail below.
Detailed description of the invention
It, below will be to specific in order to illustrate more clearly of the specific embodiment of the invention or technical solution in the prior art Embodiment or attached drawing needed to be used in the description of the prior art be briefly described, it should be apparent that, it is described below Attached drawing is some embodiments of the present invention, for those of ordinary skill in the art, before not making the creative labor It puts, is also possible to obtain other drawings based on these drawings.
Fig. 1 is a kind of flow chart of the recognition methods of black phosphorus crystal orientation provided in an embodiment of the present invention;
Fig. 2 is the schematic diagram of coordinate system provided in an embodiment of the present invention;
Fig. 3 a be it is provided in an embodiment of the present invention under orthogonal polarization modes, for the polarization angle and A of measurement point 1g 1It is special Levy the schematic diagram of the relation curve between the light intensity at peak;
Fig. 3 b be it is provided in an embodiment of the present invention under orthogonal polarization modes, for the polarization angle and A of measurement point 1g 2It is special Levy the schematic diagram of the relation curve between the light intensity at peak;
Fig. 4 a be it is provided in an embodiment of the present invention under orthogonal polarization modes, for the polarization angle and A of measurement point 2g 1It is special Levy the schematic diagram of the relation curve between the light intensity at peak;
Fig. 4 b be it is provided in an embodiment of the present invention under orthogonal polarization modes, for the polarization angle and A of measurement point 2g 2It is special Levy the schematic diagram of the relation curve between the light intensity at peak;
Fig. 5 a be it is provided in an embodiment of the present invention under orthogonal polarization modes, for the polarization angle and A of measurement point 3g 1It is special Levy the schematic diagram of the relation curve between the light intensity at peak;
Fig. 5 b be it is provided in an embodiment of the present invention under orthogonal polarization modes, for the polarization angle and A of measurement point 3g 2It is special Levy the schematic diagram of the relation curve between the light intensity at peak;
Fig. 6 be it is provided in an embodiment of the present invention under parallel polarization mode, for the polarization angle and A of measurement point 1g 2Feature The schematic diagram of relation curve between the light intensity at peak;
Fig. 7 be it is provided in an embodiment of the present invention under parallel polarization mode, for the polarization angle and A of measurement point 2g 2Feature The schematic diagram of relation curve between the light intensity at peak;
Fig. 8 be it is provided in an embodiment of the present invention under parallel polarization mode, for the polarization angle and A of measurement point 3g 2Feature The schematic diagram of relation curve between the light intensity at peak;
Fig. 9 is a kind of schematic diagram of the identification device of black phosphorus crystal orientation provided in an embodiment of the present invention.
Specific embodiment
In order to make the object, technical scheme and advantages of the embodiment of the invention clearer, below in conjunction with attached drawing to the present invention Technical solution be clearly and completely described, it is clear that described embodiments are some of the embodiments of the present invention, rather than Whole embodiments.Based on the embodiments of the present invention, those of ordinary skill in the art are not making creative work premise Under every other embodiment obtained, shall fall within the protection scope of the present invention.
For the identification convenient for understanding the present embodiment, first to a kind of black phosphorus crystal orientation disclosed in the embodiment of the present invention Method describes in detail.
Embodiment one:
According to embodiments of the present invention, a kind of embodiment of the recognition methods of black phosphorus crystal orientation is provided, it should be noted that The step of process of attached drawing illustrates can execute in a computer system such as a set of computer executable instructions, also, It, in some cases, can be to be different from shown in sequence execution herein although logical order is shown in flow charts The step of out or describing.
Fig. 1 is a kind of flow chart of the recognition methods of black phosphorus crystal orientation of the embodiment of the present invention, as shown in Figure 1, this method packet Include following steps:
Step S102 acquires the incident light of different polarization angle to be identified black under Raman system orthogonal polarization modes Phosphorus is irradiated the Raman diffused light spectrum information at generated target signature peak;
In embodiments of the present invention, Raman system is specifically Raman spectroscopy system, and Raman system orthogonal polarization modes are Refer to that the scatter light polarization direction of detection remains vertical with incident light polarization direction.Under the orthogonal polarization modes, such as Fig. 2 institute Show, wherein AC indicates the armchair direction of black phosphorus to be identified, i.e., the crystal orientation of black phosphorus to be identified;X-Y indicates that sample coordinate system, θ are The crystal orientation of black phosphorus to be identified and the angle of sample coordinate system X-axis,For incident light polarization direction eiWith sample coordinate system X-axis angle (i.e. incident light polarization angle).
Before the identification for carrying out black phosphorus crystal orientation, the preparation of black phosphorus to be identified is first carried out.When preparing black phosphorus to be identified, by block The black phosphorus monocrystalline of shape separates the black phosphorus thin slice of different thickness, and the black phosphorus thin slice removed is black phosphorus to be identified, should be wait know There is different thickness at the different location of other black phosphorus.
Adjusting Raman system is orthogonal polarization modes, and the continuously adjustable half-wave of optical axis direction is inserted into the optical path of incident light Piece.The change of incident light polarization angle can be realized by continuous rotation half-wave plate, found under optical microscopy different thickness to It identifies black phosphorus, focuses incident light to the surface of black phosphorus to be identified.If counterclockwise angle is positive, rotatable halfwave plate counterclockwise, every time 5 ° (being adjusted according to specific needs, the embodiment of the present invention is to the angle without concrete restriction) of rotation, 180 ° of corotating, Realize incident light polarization angleIt is rotated counterclockwise with 10 ° of step-lengths since 0 ° (X-direction in such as Fig. 2), 360 ° of corotating. And then the incident light (incident light under 37 different polarization angles as above) of different polarization angle is collected to be identified black Phosphorus is irradiated the Raman diffused light spectrum information at generated target signature peak.
Step S104, the Raman diffused light spectrum information at target signature peak corresponding to the incident light to different polarization angle into Row data are extracted, and obtain target data pair, wherein target data is to the light intensity structure for incident light polarization angle and target signature peak At data pair;
The drawing at generated target signature peak is irradiated to black phosphorus to be identified in the incident light for obtaining different polarization angle After graceful scattering spectrum information, the Raman diffused light spectrum information at target signature peak corresponding to the incident light to different polarization angle into Row data are extracted, and the data pair of the light intensity composition at incident light polarization angle and target signature peak are obtained.
Step S106, by target Raman scattering effectiveness formula to target data to being fitted, and according to fitting result Determine the crystal orientation of black phosphorus to be identified, wherein target Raman scattering effectiveness formula is that target is special under Raman system orthogonal polarization modes The Raman scattering effectiveness formula at peak is levied, the crystal orientation of black phosphorus to be identified is the armchair direction of black phosphorus to be identified.
Target data is being obtained to rear, further by the Raman scattering effectiveness formula at target signature peak to target data pair It is fitted, and then determines the crystal orientation of black phosphorus to be identified according to fitting result.The process will hereinafter be described, herein not It repeats again.
It in embodiments of the present invention, is to acquire the incident light of different polarization angle under Raman system orthogonal polarization modes The Raman diffused light spectrum information at generated target signature peak is irradiated to black phosphorus to be identified;Then, to different polarization angle Incident light corresponding to target signature peak Raman diffused light spectrum information carry out data extraction, obtain target data pair;Finally, By the Raman scattering effectiveness formula at target signature peak to target data to being fitted, and determine according to fitting result to be identified The crystal orientation of black phosphorus.The crystal orientation accuracy for the black phosphorus to be identified that the recognition methods of black phosphorus crystal orientation of the invention finally identifies is good, When identifying to the black phosphorus to be identified of different-thickness, finally obtained black phosphorus crystal orientation alleviates existing black phosphorus than more consistent The technical problem of the recognition methods accuracy difference of crystal orientation.
Above content carried out brief introduction to the recognition methods of black phosphorus crystal orientation of the invention, below to being directed to Particular content describes in detail.
In alternative embodiment of the invention, target signature peak includes AgCharacteristic peak, AgCharacteristic peak include it is following at least it One: Ag 1Characteristic peak, Ag 2Characteristic peak.
In an alternate embodiment of the present invention where, when target signature peak is Ag 1When characteristic peak, target data is to being first Target data pair, wherein first object data are to for incident light polarization angle and Ag 1Data pair between the light intensity of characteristic peak;
By target Raman scattering effectiveness formula to target data to being fitted, and determine according to fitting result to be identified The crystal orientation of black phosphorus, comprising:
Target Raman scattering effectiveness formula such as formula (1)
Wherein,Indicate Ag 1The light intensity of characteristic peak, a1、c1Indicate the A of black phosphorus to be identifiedg 1The Raman tensor member of characteristic peak Element, φ1Indicate a1With c1Between phase difference,Indicate incident light polarization angle, θ1For the first crystal orientation match value;
By formula (1) to first object data to being fitted, the first crystal orientation match value is obtained;
Work as a1<c1When, the first crystal orientation match value is the crystal orientation of black phosphorus to be identified;
Work as a1>c1When, the orthogonal direction of the first crystal orientation match value is the crystal orientation of black phosphorus to be identified.
In embodiments of the present invention, the measurement point of 3 different locations of same black phosphorus sample, and measurement point are measured altogether The number of plies of 1 corresponding black phosphorus to be identified is about 377 layers, and the number of plies of the corresponding black phosphorus to be identified of measurement point 2 is about 20 layers, and is surveyed The amount 3 corresponding black phosphorus numbers of plies to be identified of point are about 37 layers.With the corresponding incident light polarization angle of measurement point 1,2,3 and Ag 1Characteristic peak Light intensity between data to (as described above, having 37 pairs of data) as shown in the following table 1, table 2, table 3, wherein table 1 gives measurement The A in vertical polarization of point 1g 1Characteristic peak light intensity data of the characteristic peak at incident light different polarization direction, table 2 give measurement point 2 in vertical polarization Ag 1Characteristic peak light intensity data of the characteristic peak at incident light different polarization direction, table 3 give measurement point 3 The A in vertical polarizationg 1Characteristic peak light intensity data of the characteristic peak at incident light different polarization direction:
Table 1
Table 2
Table 3
Pass through the data in above-mentioned formula (1) fitting table 1, table 2, table 3, obtained matched curve such as Fig. 3 a, Fig. 4 a, figure Shown in 5a, and respectively -2.4 ° of crystal orientation of black phosphorus to be identified are obtained, -0.2 °, 0.1 °, and its size does not change substantially, also It is to identify that the black phosphorus crystal orientation to be identified of obtained different thickness is essentially the same (namely crystal orientation is unique), illustrates black phosphorus of the invention The recognition methods accuracy of crystal orientation is good, can the crystal orientation to the black phosphorus of different-thickness correctly identified.
In another alternative embodiment of the invention, when target signature peak is Ag 2When characteristic peak, target data is to being Two target datas pair, wherein the second target data is to for incident light polarization angle and Ag 2Data pair between the light intensity of characteristic peak;
By target Raman scattering effectiveness formula to target data to being fitted, and determine according to fitting result to be identified The crystal orientation of black phosphorus, comprising:
Target Raman scattering effectiveness formula such as formula (2)
Wherein,Indicate Ag 2The light intensity of characteristic peak, a2、c2Indicate the A of black phosphorus to be identifiedg 2The Raman tensor member of characteristic peak Element, φ2Indicate a2With c2Between phase difference,Indicate incident light polarization angle, θ2For the second crystal orientation match value;
By formula (2) to the second target data to being fitted, the second crystal orientation match value is obtained;
Work as a2<c2When, the second crystal orientation match value is the crystal orientation of black phosphorus to be identified;
Work as a2>c2When, the orthogonal direction of the second crystal orientation match value is the crystal orientation of black phosphorus to be identified.
In embodiments of the present invention, the measurement point of 3 different locations of same black phosphorus sample, and measurement point are measured altogether The number of plies of 1 corresponding black phosphorus to be identified is about 377 layers, and the number of plies of the corresponding black phosphorus to be identified of measurement point 2 is about 20 layers, and is surveyed The amount 3 corresponding black phosphorus numbers of plies to be identified of point are about 37 layers.With the corresponding incident light polarization angle of measurement point 1,2,3 and Ag 2Characteristic peak Light intensity data between data to (as described above, having 37 pairs of data) as shown in the following table 4, table 5, table 6, wherein table 4 gives The A in vertical polarization of measurement point 1g 2Characteristic peak light intensity data of the characteristic peak at incident light different polarization direction, table 5 give survey The A in vertical polarization of amount point 2g 2Characteristic peak light intensity data of the characteristic peak at incident light different polarization direction, table 6 give measurement The A in vertical polarization of point 3g 2Characteristic peak light intensity data of the characteristic peak at incident light different polarization direction:
Table 4
Table 5
Table 6
Pass through the data in above-mentioned formula (2) fitting table 4, table 5, table 6, obtained matched curve such as Fig. 3 b, Fig. 4 b, figure Shown in 5b, and respectively -2.1 ° of crystal orientation of black phosphorus to be identified are obtained, -1.4 °, -1.1 °, and its size does not change substantially, The black phosphorus crystal orientation to be identified of the different thickness exactly identified is essentially the same (namely crystal orientation is unique), illustrates of the invention black The recognition methods accuracy of phosphorus crystal orientation is good, can the crystal orientation to the black phosphorus of different-thickness correctly identified.
In another alternative embodiment of the invention, when target signature peak is Ag 1Characteristic peak and Ag 2When characteristic peak, target Data to respectively first object data to and the second target data pair;
By target Raman scattering effectiveness formula to target data to being fitted, and determine according to fitting result to be identified The crystal orientation of black phosphorus, comprising:
Target Raman scattering effectiveness formula is formula (1) and formula (2)
Wherein,Respectively indicate Ag 1The light intensity of characteristic peak, Ag 2The light intensity of characteristic peak, a1、c1Indicate to be identified black The A of phosphorusg 1The Raman tensor element of characteristic peak, φ1Indicate a1With c1Between phase difference, a2、c2Indicate the A of black phosphorus to be identifiedg 2It is special Levy the Raman tensor element at peak, φ2Indicate a2With c2Between phase difference,Indicate incident light polarization angle, θ1、θ2Respectively One crystal orientation match value, the second crystal orientation match value;
By formula (1) to first object data to being fitted, the first crystal orientation match value is obtained, and by formula (2) to the Two target datas obtain the second crystal orientation match value to being fitted;
Work as a1<c1And a2<c2When, the average value of the first crystal orientation match value and the second crystal orientation match value is black phosphorus to be identified Crystal orientation;
Work as a1>c1And a2>c2When, the orthogonal direction of the average value of the first crystal orientation match value and the second crystal orientation match value be to Identify the crystal orientation of black phosphorus.
The data of table 1, table 2, table 3 are fitted by above-mentioned formula (1), by above-mentioned formula (2) fitting table 4, table 5, table 6 Data, it is available:
For measurement point 1, crystal orientation=(- 2.4 ° -2.1 °) of corresponding black phosphorus to be identified/2=-2.25 °;
For measurement point 2, crystal orientation=(- 0.2 ° -1.4 °) of corresponding black phosphorus to be identified/2=-0.8 °;
For measurement point 3, crystal orientation=(0.1 ° -1.1 °) of corresponding black phosphorus to be identified/2=-0.5 °.
The result that three above application example obtains is essentially the same (namely crystal orientation is unique), illustrates that black phosphorus of the invention is brilliant To recognition methods accuracy it is good.
It is more accurate in order to the crystal orientation that illustrates that the recognition methods of the black phosphorus crystal orientation in the present invention finally identifies, under Face is with traditional method (being identified using the polarization configuration of parallel polarization (collaboration) to black phosphorus crystal orientation) to above-mentioned measurement Point is calculated, and carries out the number obtained in identification process to black phosphorus crystal orientation about the polarization configuration using parallel polarization (collaboration) According to the data as described in table 7 in following the description, table 8, table 9, following target Raman scattering effectiveness formula (3) is finally used
Wherein,Indicate A when parallel polarizationg 2The light intensity of characteristic peak, a, c indicate black phosphorus A to be identifiedg 2The Raman of characteristic peak Tensor element, φ indicate the phase difference between a and c,Indicate incident light polarization angle, θ is crystal orientation match value;
Data corresponding to parallel polarization mode in following table 7, table 8, table 9 are fitted, and to be fitted obtained Ag 2 Crystal orientation of the angle as black phosphorus to be identified corresponding to characteristic peak light intensity maximum value.
Table 7
Table 8
Table 9
Table 7, table 8, the data in table 9 are fitted, obtained matched curve can be obtained parallel as shown in Fig. 6, Fig. 7, Fig. 8 Polarization mode Ag 2Angle corresponding to the light intensity maximum value of characteristic peak is respectively 3.8 °, 98.4 °, 96.5 °.
Therefore, for measurement point 1,2,3, the first crystal orientation match value, the second crystal orientation match value under orthogonal polarization modes, A under the average value and parallel polarization mode of first crystal orientation match value and the second crystal orientation match valueg 2The light intensity maximum value of characteristic peak Corresponding angle (i.e. conventional method) is as shown in the table.
Table 10
It can be seen that method proposed by the present invention, crystal orientation identifies that angle is more consistent, and conventional method then occur it is conflicting or The inconsistent misrecognition phenomenon of result between measurement point, it was demonstrated that method of the invention is more effective, accurate.
From the above results, parallel polarization Mode Ag 2Angle corresponding to the light intensity maximum value of characteristic peak is in different surveys At amount point (i.e. on the black phosphorus of different thickness), biggish change is had occurred in size, will lead to the mistake of black phosphorus crystal orientation in this way Identification.And the crystal orientation for the black phosphorus to be identified that the present invention is obtained in different measurement points it is more consistent (because crystal orientation be it is unique, It is unrelated with thickness, so the crystal orientation finally obtained should be consistent), illustrate that the recognition methods of black phosphorus crystal orientation of the invention finally identifies Obtained crystal orientation is more accurate, can the crystal orientation to the black phosphorus of different-thickness correctly identified.
Embodiment two:
The embodiment of the invention also provides a kind of identification device of black phosphorus crystal orientation, the identification device of the black phosphorus crystal orientation is mainly used In the recognition methods for executing black phosphorus crystal orientation provided by above content of the embodiment of the present invention, below to provided in an embodiment of the present invention The identification device of black phosphorus crystal orientation does specific introduction.
Fig. 9 is a kind of schematic diagram of the identification device of black phosphorus crystal orientation according to an embodiment of the present invention, as shown in figure 9, this is black The identification device of phosphorus crystal orientation specifically includes that acquisition module 10, data extraction module 20 and fitting module 30, in which:
Acquisition module, under Raman system orthogonal polarization modes, the incident light of acquisition different polarization angle to treat knowledge Other black phosphorus is irradiated the Raman diffused light spectrum information at generated target signature peak;
Data extraction module, the Raman diffused light for target signature peak corresponding to the incident light to different polarization angle Spectrum information carries out data extraction, obtains target data pair, wherein target data is to for incident light polarization angle and target signature peak Light intensity constitute data pair;
Fitting module, for by target Raman scattering effectiveness formula to target data to being fitted, and according to fitting As a result the crystal orientation of black phosphorus to be identified is determined, wherein target Raman scattering effectiveness formula is mesh under Raman system orthogonal polarization modes The Raman scattering effectiveness formula of characteristic peak is marked, the crystal orientation of black phosphorus to be identified is the armchair direction of black phosphorus to be identified.
It in embodiments of the present invention, is to acquire the incident light of different polarization angle under Raman system orthogonal polarization modes The Raman diffused light spectrum information at generated target signature peak is irradiated to black phosphorus to be identified;Then, to different polarization angle Incident light corresponding to target signature peak Raman diffused light spectrum information carry out data extraction, obtain target data pair;Finally, By the Raman scattering effectiveness formula at target signature peak to target data to being fitted, and determine according to fitting result to be identified The crystal orientation of black phosphorus.The crystal orientation accuracy for the black phosphorus to be identified that the recognition methods of black phosphorus crystal orientation of the invention finally identifies is good, When identifying to the black phosphorus to be identified of different-thickness, finally obtained black phosphorus crystal orientation alleviates existing black phosphorus than more consistent The technical problem of the recognition methods accuracy difference of crystal orientation.
The technical effect of the identification device of black phosphorus crystal orientation provided by the embodiment of the present invention, realization principle and generation is with before The embodiment of the method stated in embodiment one is identical, and to briefly describe, Installation practice part does not refer to place, can refer to aforementioned side Corresponding contents in method embodiment.
It is apparent to those skilled in the art that for convenience and simplicity of description, the system of foregoing description It with the specific work process of device, can refer to corresponding processes in the foregoing method embodiment, details are not described herein.
In addition, in the description of the embodiment of the present invention unless specifically defined or limited otherwise, term " installation ", " phase Even ", " connection " shall be understood in a broad sense, for example, it may be being fixedly connected, may be a detachable connection, or be integrally connected;It can To be mechanical connection, it is also possible to be electrically connected;It can be directly connected, can also can be indirectly connected through an intermediary Connection inside two elements.For the ordinary skill in the art, above-mentioned term can be understood at this with concrete condition Concrete meaning in invention.
It, can be with if the function is realized in the form of SFU software functional unit and when sold or used as an independent product It is stored in a computer readable storage medium.Based on this understanding, technical solution of the present invention is substantially in other words The part of the part that contributes to existing technology or the technical solution can be embodied in the form of software products, the meter Calculation machine software product is stored in a storage medium, including some instructions are used so that a computer equipment (can be a People's computer, server or network equipment etc.) it performs all or part of the steps of the method described in the various embodiments of the present invention. And storage medium above-mentioned includes: that USB flash disk, mobile hard disk, read-only memory (ROM, Read-Only Memory), arbitrary access are deposited The various media that can store program code such as reservoir (RAM, Random Access Memory), magnetic or disk.
In the description of the present invention, it should be noted that term " center ", "upper", "lower", "left", "right", "vertical", The orientation or positional relationship of the instructions such as "horizontal", "inner", "outside" be based on the orientation or positional relationship shown in the drawings, merely to Convenient for description the present invention and simplify description, rather than the device or element of indication or suggestion meaning must have a particular orientation, It is constructed and operated in a specific orientation, therefore is not considered as limiting the invention.In addition, term " first ", " second ", " third " is used for descriptive purposes only and cannot be understood as indicating or suggesting relative importance.
Finally, it should be noted that embodiment described above, only a specific embodiment of the invention, to illustrate the present invention Technical solution, rather than its limitations, scope of protection of the present invention is not limited thereto, although with reference to the foregoing embodiments to this hair It is bright to be described in detail, those skilled in the art should understand that: anyone skilled in the art In the technical scope disclosed by the present invention, it can still modify to technical solution documented by previous embodiment or can be light It is readily conceivable that variation or equivalent replacement of some of the technical features;And these modifications, variation or replacement, do not make The essence of corresponding technical solution is detached from the spirit and scope of technical solution of the embodiment of the present invention, should all cover in protection of the invention Within the scope of.Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.

Claims (6)

1. a kind of recognition methods of black phosphorus crystal orientation characterized by comprising
Under Raman system orthogonal polarization modes, the incident light of acquisition different polarization angle, which is irradiated black phosphorus to be identified, to be produced The Raman diffused light spectrum information at raw target signature peak;
The Raman diffused light spectrum information at target signature peak corresponding to the incident light to the different polarization angle carries out data and mentions It takes, obtains target data pair, wherein the target data constitutes the light intensity for incident light polarization angle and target signature peak Data pair;
By target Raman scattering effectiveness formula to the target data to being fitted, and according to fitting result determine it is described to Identify the crystal orientation of black phosphorus, wherein the target Raman scattering effectiveness formula is described under the Raman system orthogonal polarization modes The Raman scattering effectiveness formula at target signature peak, the crystal orientation of the black phosphorus to be identified are the armchair side of the black phosphorus to be identified To.
2. the method according to claim 1, wherein the target signature peak includes AgCharacteristic peak, the AgFeature Peak includes at least one of: Ag 1Characteristic peak, Ag 2Characteristic peak.
3. according to the method described in claim 2, it is characterized in that, when the target signature peak is the Ag 1When characteristic peak, institute Target data is stated to for first object data pair, wherein the first object data are to for the incident light polarization angle and institute State Ag 1Data pair between the light intensity of characteristic peak;
By target Raman scattering effectiveness formula to the target data to being fitted, and according to fitting result determine it is described to Identify the crystal orientation of black phosphorus, comprising:
The target Raman scattering effectiveness formula such as formula (1)
Wherein,Indicate the Ag 1The light intensity of characteristic peak, a1、c1Indicate the A of the black phosphorus to be identifiedg 1The Raman tensor of characteristic peak Element, φ1Indicate a1With the c1Between phase difference,Indicate the incident light polarization angle, θ1It is quasi- for the first crystal orientation Conjunction value;
By formula (1) to the first object data to being fitted, the first crystal orientation match value is obtained;
Work as a1<c1When, the first crystal orientation match value is the crystal orientation of the black phosphorus to be identified;
Work as a1>c1When, the orthogonal direction of the first crystal orientation match value is the crystal orientation of the black phosphorus to be identified.
4. according to the method described in claim 3, it is characterized in that, when the target signature peak is the Ag 2When characteristic peak, institute Target data is stated to for the second target data pair, wherein second target data is to for the incident light polarization angle and institute State Ag 2Data pair between the light intensity of characteristic peak;
By target Raman scattering effectiveness formula to the target data to being fitted, and according to fitting result determine it is described to Identify the crystal orientation of black phosphorus, comprising:
The target Raman scattering effectiveness formula such as formula (2)
Wherein,Indicate the Ag 2The light intensity of characteristic peak, a2、c2Indicate the A of the black phosphorus to be identifiedg 2The Raman tensor of characteristic peak Element, φ2Indicate a2With the c2Between phase difference,Indicate the incident light polarization angle, θ2It is quasi- for the second crystal orientation Conjunction value;
By formula (2) to second target data to being fitted, the second crystal orientation match value is obtained;
Work as a2<c2When, the second crystal orientation match value is the crystal orientation of the black phosphorus to be identified;
Work as a2>c2When, the orthogonal direction of the second crystal orientation match value is the crystal orientation of the black phosphorus to be identified.
5. according to the method described in claim 4, it is characterized in that, when the target signature peak is the Ag 1Characteristic peak and described Ag 2When characteristic peak, the target data to the respectively described first object data to second target data pair;
By target Raman scattering effectiveness formula to the target data to being fitted, and according to fitting result determine it is described to Identify the crystal orientation of black phosphorus, comprising:
The target Raman scattering effectiveness formula is formula (1) and formula (2)
Wherein,Respectively indicate the Ag 1The light intensity of characteristic peak, Ag 2The light intensity of characteristic peak, a1、c1Indicate described wait know The A of other black phosphorusg 1The Raman tensor element of characteristic peak, φ1Indicate a1With the c1Between phase difference, a2、c2Described in expression The A of black phosphorus to be identifiedg 2The Raman tensor element of characteristic peak, φ2Indicate a2With the c2Between phase difference,Indicate institute State incident light polarization angle, θ1、θ2Respectively the first crystal orientation match value, the second crystal orientation match value;
By formula (1) to the first object data to being fitted, the first crystal orientation match value is obtained, and pass through formula (2) To second target data to being fitted, the second crystal orientation match value is obtained;
Work as a1<c1And a2<c2When, the average value of the first crystal orientation match value and the second crystal orientation match value is described to be identified The crystal orientation of black phosphorus;
Work as a1>c1And a2>c2When, the orthogonal direction of the average value of the first crystal orientation match value and the second crystal orientation match value is The crystal orientation of the black phosphorus to be identified.
6. a kind of identification device of black phosphorus crystal orientation characterized by comprising
Acquisition module, under Raman system orthogonal polarization modes, acquiring the incident light of different polarization angle to be identified black Phosphorus is irradiated the Raman diffused light spectrum information at generated target signature peak;
Data extraction module, the Raman diffused light for target signature peak corresponding to the incident light to the different polarization angle Spectrum information carry out data extraction, obtain target data pair, wherein the target data to for incident light polarization angle and target spy Levy the data pair that the light intensity at peak is constituted;
Fitting module, for by target Raman scattering effectiveness formula to the target data to being fitted, and according to fitting As a result the crystal orientation of the black phosphorus to be identified is determined, wherein the target Raman scattering effectiveness formula is that the Raman system is vertical The Raman scattering effectiveness formula at the target signature peak under polarization mode, the crystal orientation of the black phosphorus to be identified are described to be identified black The armchair direction of phosphorus.
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