CN110267033B - Spliced flat panel detector and splicing method thereof, imaging system and imaging method thereof - Google Patents
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Abstract
The invention discloses a spliced flat panel detector and a splicing method thereof, an imaging system and an imaging method thereof. The invention can enlarge the effective detection area, control the splicing seam between two detectors to be smaller than the size of one pixel, correct the image through the subsequent image algorithm so as to achieve the effect of seamless splicing, realize that a larger object can obtain complete imaging through one-time exposure, and avoid the risk of failure of splicing the image after the original secondary shooting.
Description
Technical Field
The invention relates to the field of imaging of flat panel detectors, in particular to a spliced flat panel detector, a splicing method thereof, an imaging system and an imaging method thereof.
Background
The X-ray flat panel detector imaging replaces the traditional CCD and is widely applied to medicine, industrial detection, safety inspection and pet treatment. Because the X-ray can not deflect like the visible light, the object to be measured must be placed between the X-ray source and the detector, and the object is inspected and imaged by the detector with the same size as the object to be measured after the X-ray penetrates. The existing flat panel detector has many advantages over the traditional imaging devices such as CCD solid-state cameras and image intensifiers of vacuum tubes, and particularly can be manufactured in a very large size to meet various application requirements. But is limited by the fabrication equipment, process level, and imaging capabilities of large monolithic detectors, with a practical maximum dimension of about 17 inches x17 inches. When the size of the imaging device exceeds the size, such as human long bone spine imaging, industrial product large-size imaging, security inspection of oversized objects, X-ray shooting of large animals and the like, the whole imaging device cannot perform one-time imaging, and a complete image can be formed only by performing image splicing after two or more exposures are performed. The problems thus posed include: low efficiency, image splicing defects, and excessive X-ray dose, and can even lead to misjudgment of X-ray images by operation and examination and diagnosis personnel.
Disclosure of Invention
In order to solve the problem that a small-size flat plate in the prior art cannot completely cover an interested area in clinical use, the invention provides a spliced flat plate detector and a splicing method thereof, an imaging system and an imaging method thereof, which can realize that a larger object can obtain complete imaging through one-time exposure, and the technical scheme is as follows:
in one aspect, the invention provides a spliced flat panel detector, which comprises a first flat panel detector and a second flat panel detector which are spliced and arranged, wherein the width of a spliced seam between imaging effective areas of the first flat panel detector and the second flat panel detector is less than or equal to the size of one pixel.
Further, the first flat panel detector comprises a first TFT screen and a first substrate sensor glass, the second flat panel detector comprises a second TFT screen and a second substrate sensor glass, and the distance between the first TFT screen and the second TFT screen is smaller than or equal to the size of one pixel.
Furthermore, the splicing surface of the first substrate sensor glass and the second substrate sensor glass is an inclined surface with the same inclination angle, and the included angle between the inclined surface and the horizontal plane ranges from 75 degrees to 85 degrees.
In another aspect, the present invention provides a flat panel detector splicing method, including:
arranging a first TFT screen on the first substrate sensor glass, and enabling the distance from the effective area of the first TFT screen to the first edge of the first substrate sensor glass to be less than one third of the size of a pixel;
arranging a second TFT screen on the second substrate sensor glass, wherein the distance from the effective area of the second TFT screen to the second edge of the second substrate sensor glass is less than one third of the size of a pixel;
the first edge of the first substrate sensor glass is spliced to the second edge of the second substrate sensor glass.
Further, before the splicing the first edge of the first substrate sensor glass with the second edge of the second substrate sensor glass, further comprising: the side surface of the first edge of the first substrate sensor glass is set to be an inclined surface with an included angle of 90 degrees + N with the horizontal plane, the side surface of the second edge of the second substrate sensor glass is set to be an inclined surface with an included angle of 90 degrees-N with the horizontal plane, and the angle range of N is 5-15 degrees.
On the other hand, the invention provides an imaging system with a spliced flat panel detector, which comprises an X-ray source, a spliced flat panel detector, a detector driver, a data acquisition system and an imaging component, wherein the spliced flat panel detector at least comprises a first flat panel detector and a second flat panel detector which are spliced and arranged, and the detector driver at least comprises a first flat panel driving circuit corresponding to the first flat panel detector and a second flat panel driving circuit corresponding to the second flat panel detector; the first flat panel detector and the second flat panel detector are both connected with the input end of a data acquisition system, and the output end of the data acquisition system is connected with the input end of the imaging component.
Further, the first flat panel detector and the second flat panel detector are both TFT flat panel detectors, the first flat panel detector comprises a first TFT screen and first substrate sensor glass, the second flat panel detector comprises a second TFT screen and second substrate sensor glass, and the distance between the first TFT screen and the second TFT screen is smaller than or equal to the size of one pixel.
Furthermore, the splicing surfaces of the first flat plate detector and the second flat plate detector are inclined surfaces with the same inclination angle, and the included angle between the inclined surfaces and the horizontal plane ranges from 75 degrees to 85 degrees.
Further, the X-ray source comprises an X-ray high-voltage generator and an X-ray bulb tube.
In another aspect, the present invention provides an imaging method based on the above imaging system, including the following steps:
s1, placing the object to be measured between the X-ray source and the spliced flat panel detector;
s2, the first flat panel detector photoelectrically converts the X-ray penetrating through the object to be measured into a first analog electrical signal, and then the first flat panel driving circuit converts the analog electrical signal into a first digital electrical signal; the second flat panel detector photoelectrically converts the X-ray penetrating through the object to be measured into a second analog electric signal, and then the second flat panel driving circuit converts the analog electric signal into a second digital electric signal;
s3, acquiring the first digital electric signal and the second digital electric signal, and calculating the image digital electric signal of the gap spliced between the first flat panel detector and the second flat panel detector in the following way:
the slit pixel digital signal is AVERAGE (a left adjacent pixel digital signal of the slit pixel, and a right adjacent pixel digital signal of the slit pixel);
and S4, outputting the first digital electric signal, the second digital electric signal and the image digital electric signal of the gap to an imaging component for image display.
The spliced flat panel detector imaging system provided by the invention can produce the following beneficial effects:
a. the maximum size of the existing flat plate is expanded to be twice of the original size, and the area of an effective detection area can be expanded to be four times of the original size;
b. the seam of the middle splicing can be controlled to be smaller than the size of one pixel, and the image is corrected through a subsequent image algorithm, so that the effect of seamless splicing can be achieved;
c. in the prior practical use, the two-time imaging shooting is reduced to only one-time shooting, the working efficiency is improved, the real clinical low-dose shooting is realized, and the risk of failure in splicing images after the prior secondary shooting is avoided.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed to be used in the description of the embodiments will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.
FIG. 1 is a schematic diagram of an imaging system with a tiled flat panel detector according to an embodiment of the present invention;
fig. 2 is a schematic diagram of a single structure of a first flat panel detector according to an embodiment of the present invention;
FIG. 3 is a schematic diagram of a splicing structure of a spliced flat panel detector according to an embodiment of the present invention;
FIG. 4 is a cross-sectional view of a tiled flat panel detector having slanted tiling planes provided by embodiments of the present invention.
Wherein the reference numerals include: 1-an X-ray source, 21-a first flat panel detector, 211-a first TFT screen, 212-a first substrate sensor glass, 22-a second flat panel detector, 221-a second TFT screen, 222-a second substrate sensor glass, 31-a first flat panel driving circuit, 32-a second flat panel driving circuit, 4-a data acquisition system, and 5-an imaging component.
Detailed Description
In order to make the technical solutions of the present invention better understood, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It should be noted that the terms "first," "second," and the like in the description and claims of the present invention and in the drawings described above are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. In the description of the present invention, the terms "upper", "lower", "front", "rear", "left", "right", "top", "bottom", "inner", "outer", and the like indicate orientations or positional relationships based on those shown in the drawings, and are only for convenience in describing the present invention and simplifying the description, but do not indicate or imply that the referred device or element must have a specific orientation, be constructed in a specific orientation, and be operated, and thus, should not be construed as limiting the present invention. It is to be understood that the terms so used are interchangeable under appropriate circumstances such that the embodiments of the invention described herein are, for example, capable of operation in sequences other than those illustrated or otherwise described herein. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, apparatus, article, or device that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or device.
In one embodiment of the present invention, a tiled flat panel detector is provided, as shown in fig. 3, and includes a first flat panel detector 21 and a second flat panel detector 22 arranged in a tiled manner, and a width of a seam between imaging effective areas of the first flat panel detector 21 and the second flat panel detector 22 is smaller than or equal to a size of one pixel.
As shown in fig. 2, the first flat panel detector 21 includes a first TFT panel 211 and a first substrate sensor glass 212, and similarly, the second flat panel detector 22 includes a second TFT panel 221 and a second substrate sensor glass 222 (not shown), and a distance between the first TFT panel 211 and the second TFT panel 221 is smaller than or equal to a size of one pixel.
In a preferred embodiment of the present invention, the joint surface of the first substrate sensor glass 212 and the second substrate sensor glass 222 is an inclined surface with the same inclination angle, and after the joint, as shown in fig. 4, the included angle between the inclined surface and the horizontal plane is preferably in the range of 75-85 ° (preferably 80 °).
In an embodiment of the present invention, a flat panel detector splicing method is provided, including:
arranging a first TFT screen on the first substrate sensor glass, and enabling the distance from the effective area of the first TFT screen to the first edge of the first substrate sensor glass to be less than one third of the size of a pixel;
arranging a second TFT screen on the second substrate sensor glass, wherein the distance from the effective area of the second TFT screen to the second edge of the second substrate sensor glass is less than one third of the size of a pixel;
the first edge of the first substrate sensor glass is spliced to the second edge of the second substrate sensor glass.
That is, referring to fig. 2, the imaging active area of the first TFT screen 211 is controlled by the TFT manufacturing process to a distance g <1/3 pixel size from the edge of the first substrate sensor glass 212, where g represents the distance from the active imaging area to the sensor glass edge, and this distance has a value <1/3 pixel size.
The two TFTs with the size of 17 × 17 are spliced to obtain the spliced flat panel detector of fig. 3, and the first TFT screen 211 and the second TFT screen 221 are placed on the glass of the substrate. The distance G between the effective areas on the left side and the right side is controlled to be 2-3G <1 pixel size, the size of a middle splicing seam can be controlled to be smaller than that of one pixel, and therefore the image is corrected through a subsequent image algorithm, and the seamless splicing effect can be achieved.
In a preferred embodiment of the present invention, before the splicing the first edge of the first substrate sensor glass with the second edge of the second substrate sensor glass, further comprises: as shown in fig. 4, the side of the first edge of the first substrate sensor glass is set to be an inclined plane having an angle of 90 ° + N with the horizontal plane, and the side of the second edge of the second substrate sensor glass is set to be an inclined plane having an angle of 90 ° -N with the horizontal plane, where N is in the range of 5-15 °. The distance G between the left effective area and the right effective area can be further reduced by setting the splicing surface as an inclined slope.
In an embodiment of the present invention, an imaging system with a tiled flat panel detector is provided, as shown in fig. 1, the imaging system includes an X-ray source 1, a tiled flat panel detector, a detector driver, a data acquisition system 4 and an imaging component 5, the X-ray source 1 includes an X-ray high voltage generator and an X-ray bulb, the tiled flat panel detector includes at least a first flat panel detector 21 and a second flat panel detector 22 arranged in a tiled manner, the detector driver includes at least a first flat panel driving circuit 31 corresponding to the first flat panel detector 21 and a second flat panel driving circuit 32 corresponding to the second flat panel detector 22; the first flat panel detector 21 and the second flat panel detector 22 are both connected to an input end of the data acquisition system 4, and an output end of the data acquisition system 4 is connected to an input end of the imaging component 5.
In the embodiment of the present invention, the first flat panel detector 21 and the second flat panel detector 22 are both TFT flat panel detectors, the first flat panel detector 21 includes a first TFT screen 211 and a first substrate sensor glass 212, the second flat panel detector 22 includes a second TFT screen 221 and a second substrate sensor glass 222, and a distance between the first TFT screen 211 and the second TFT screen 221 is smaller than or equal to a size of one pixel.
In a preferred embodiment of the present invention, the joint surfaces of the first flat panel detector 21 and the second flat panel detector 22 are inclined surfaces with the same inclination angle, and the included angle between the inclined surfaces and the horizontal surface is 75-85 °.
In an embodiment of the present invention, there is provided an imaging method based on the above imaging system, the imaging method including the steps of:
s1, placing the object to be measured between the X-ray source and the spliced flat panel detector;
s2, the first flat panel detector photoelectrically converts the X-ray penetrating through the object to be measured into a first analog electrical signal, and then the first flat panel driving circuit converts the analog electrical signal into a first digital electrical signal; the second flat panel detector photoelectrically converts the X-ray penetrating through the object to be measured into a second analog electric signal, and then the second flat panel driving circuit converts the analog electric signal into a second digital electric signal;
s3, acquiring the first digital electric signal and the second digital electric signal, and calculating the image digital electric signal of the gap spliced between the first flat panel detector and the second flat panel detector in the following way:
the slit pixel digital signal is AVERAGE (a left adjacent pixel digital signal of the slit pixel, and a right adjacent pixel digital signal of the slit pixel); by the method, the G between the effective imaging areas of the two TFTs can achieve the effect of seamless splicing after image processing and repairing, and large-size flat panel detection is realized.
And S4, the first digital electric signal, the second digital electric signal and the image digital electric signal of the gap are output to an imaging part for image display, two times of imaging shooting are reduced to only one time of shooting in the original practical use, the working efficiency is improved, the real clinical low-dose shooting is realized, and the risk of image splicing failure after the original secondary shooting is avoided.
The invention can enlarge the effective detection area, control the splicing seam between two detectors to be smaller than the size of one pixel, correct the image through the subsequent image algorithm so as to achieve the effect of seamless splicing, realize that a larger object can obtain complete imaging through one-time exposure, and avoid the risk of failure of splicing the image after the original secondary shooting.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents, improvements and the like that fall within the spirit and principle of the present invention are intended to be included therein.
Claims (5)
1. The spliced TFT flat panel detector is characterized by comprising a first flat panel detector (21) and a second flat panel detector (22) which are spliced and arranged, wherein the first flat panel detector (21) and the second flat panel detector (22) are both TFT flat panel detectors; the first flat panel detector (21) comprises a first TFT screen (211) and first substrate sensor glass (212), the second flat panel detector (22) comprises a second TFT screen (221) and second substrate sensor glass (222), the splicing surfaces of the first substrate sensor glass (212) and the second substrate sensor glass (222) are inclined surfaces which are mutually attached, the splicing surfaces of the first substrate sensor glass (212) and the second substrate sensor glass (222) are inclined surfaces with the same inclination angle, and the included angle range between the inclined surfaces and the horizontal plane is 75-85 degrees;
the width of a spliced seam between imaging effective areas of the first flat panel detector (21) and the second flat panel detector (22) is smaller than or equal to the size of one pixel, and the distance between the first TFT screen (211) and the second TFT screen (221) is smaller than or equal to the size of one pixel; and the digital signals of the pixels corresponding to the gaps spliced between the imaging effective areas of the first flat panel detector (21) and the second flat panel detector (22) are obtained by averaging the digital signals of the pixels adjacent to the left side of the pixels corresponding to the gaps and the digital signals of the pixels adjacent to the right side of the pixels corresponding to the gaps.
2. A TFT flat panel detector splicing method is characterized by comprising the following steps:
arranging a first TFT screen on the first substrate sensor glass, and enabling the distance from the effective area of the first TFT screen to the first edge of the first substrate sensor glass to be less than one third of the size of a pixel;
arranging a second TFT screen on the second substrate sensor glass, wherein the distance from the effective area of the second TFT screen to the second edge of the second substrate sensor glass is less than one third of the size of a pixel;
setting a first edge of the first substrate sensor glass and a second edge of the second substrate sensor glass as inclined surfaces, setting a side surface of the first edge of the first substrate sensor glass as an inclined surface with an included angle of 90 degrees + N with a horizontal plane, and setting a side surface of the second edge of the second substrate sensor glass as an inclined surface with an included angle of 90 degrees-N with the horizontal plane, wherein the angle range of N is 5-15 degrees; splicing a first edge of the first substrate sensor glass and a second edge of the second substrate sensor glass to enable the distance between the first TFT screen and the second TFT screen to be smaller than or equal to the size of one pixel; and the digital signals of the pixels corresponding to the gaps spliced between the effective areas of the first TFT screen and the second TFT screen are obtained by averaging the digital signals of the pixels adjacent to the left side of the pixels corresponding to the gaps and the digital signals of the pixels adjacent to the right side of the pixels corresponding to the gaps.
3. An imaging system with a tiled TFT flat panel detector, comprising an X-ray source (1), a tiled TFT flat panel detector according to claim 1, a detector driver, a data acquisition system (4) and an imaging component (5), the detector driver comprising at least a first flat panel drive circuit (31) corresponding to the first flat panel detector (21) and a second flat panel drive circuit (32) corresponding to the second flat panel detector (22); the first flat panel detector (21) and the second flat panel detector (22) are both connected with the input end of the data acquisition system (4), and the output end of the data acquisition system (4) is connected with the input end of the imaging component (5).
4. The imaging system according to claim 3, characterized in that the X-ray source (1) comprises an X-ray high voltage generator and an X-ray bulb.
5. An imaging method based on the imaging system of claim 3 or 4, characterized by comprising the steps of:
s1, placing the object to be measured between the X-ray source and the spliced TFT flat panel detector;
s2, the first flat panel detector photoelectrically converts the X-ray penetrating through the object to be measured into a first analog electrical signal, and then the first flat panel driving circuit converts the analog electrical signal into a first digital electrical signal; the second flat panel detector photoelectrically converts the X-ray penetrating through the object to be measured into a second analog electric signal, and then the second flat panel driving circuit converts the analog electric signal into a second digital electric signal;
s3, acquiring the first digital electric signal and the second digital electric signal, and calculating the image digital electric signal of the gap spliced between the first flat panel detector and the second flat panel detector in the following way:
the slit pixel digital signal is AVERAGE (a left adjacent pixel digital signal of the slit pixel, and a right adjacent pixel digital signal of the slit pixel);
and S4, outputting the first digital electric signal, the second digital electric signal and the image digital electric signal of the gap to an imaging component for image display.
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PCT/CN2019/120300 WO2021008054A1 (en) | 2019-07-18 | 2019-11-22 | Spliced flat panel detector and splicing method therefor, and imaging system and imaging method therefor |
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CN110987982A (en) * | 2019-12-19 | 2020-04-10 | 江苏康众数字医疗科技股份有限公司 | X-ray high-absorptivity detection system and image imaging method |
CN111710749B (en) * | 2020-04-23 | 2022-09-09 | 中国科学院上海技术物理研究所 | Long-line detector splicing structure based on multi-substrate secondary splicing and implementation method |
WO2022082421A1 (en) * | 2020-10-20 | 2022-04-28 | 江苏康众数字医疗科技股份有限公司 | Spliceable detector array, imaging system and imaging method |
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CN107610596B (en) * | 2017-09-26 | 2020-08-18 | 深圳英伦科技股份有限公司 | 2D and 3D ultra-large-size ultra-high-definition seamless spliced display screen based on LCD, OLED and QLED devices |
CN108652656B (en) * | 2018-05-21 | 2024-04-12 | 北京达影科技有限公司 | Composite detector, volume imaging system and method |
CN110267033B (en) * | 2019-07-18 | 2022-06-14 | 江苏康众数字医疗科技股份有限公司 | Spliced flat panel detector and splicing method thereof, imaging system and imaging method thereof |
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CN103531601A (en) * | 2013-10-24 | 2014-01-22 | 重庆大学 | Large-area CMOS (complementary metal-oxide-semiconductor) image sensor for detecting X-rays directly |
CN107693039A (en) * | 2017-11-14 | 2018-02-16 | 广州华端科技有限公司 | X-ray detection device, cone-beam CT-systems and its imaging method |
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