CN110232948A - A kind of UFS stores the measure and system of UFS chip health degree in equipment - Google Patents
A kind of UFS stores the measure and system of UFS chip health degree in equipment Download PDFInfo
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- CN110232948A CN110232948A CN201910453247.1A CN201910453247A CN110232948A CN 110232948 A CN110232948 A CN 110232948A CN 201910453247 A CN201910453247 A CN 201910453247A CN 110232948 A CN110232948 A CN 110232948A
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
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Abstract
The invention discloses the measures and system of UFS chip health degree in a kind of UFS storage equipment, belong to technical field of memory, comprising: (1) data of predetermined amount of data are written into UFS to be measured storage equipment；(2) equipment is stored according to UFS to be measured and obtains the fisrt feature parameter for characterizing the wherein active volume of UFS chip, and the second feature parameter of the degree of wear for characterizing UFS chip in the forward and backward property parameters of write-in data；(3) it is input information with fisrt feature parameter and second feature parameter, is measured using health degree of the measurement model predetermined to UFS chip；Wherein, measurement model is used to measure the health degree of the UFS chip, active volume positive correlation of the measurement results with UFS chip and the degree of wear inverse correlation with UFS chip according to the active volume of characterization UFS chip and the parameter of the degree of wear.The present invention can in real time, accurately measure the health degree of UFS chip in UFS storage equipment, provide reliable support for the UFS Information Security for storing equipment.
Description
Technical field
The invention belongs to technical field of memory, more particularly, to UFS chip health degree in a kind of UFS storage equipment
Measure and system.
Background technique
UFS (Universal Flash Storage, Common Flash Memory storage) is embedded flash memory technology of new generation, it was both
A kind of storage standard is represented, also illustrates that a kind of storage equipment for using the storage standard.Compared to traditional magnetic disk, UFS stores equipment
Have many advantages, such as that high-performance, low energy consumption, anti-vibration and size are small, has clear superiority in the embedded devices such as mobile phone, plate
And extensive use.
UFS stores equipment utilization UFS chip stores data, and the primary storage medium of UFS chip is Nand Flash, Nand
There are limited P/E number (programmable/erasing times) by Flash.UFS chip can constantly be worn with using, and may wear to
After to a certain degree, UFS chip will break down or fail, and it is unavailable to will lead to entire UFS storage equipment at this time, result even in
The serious consequences such as loss of data.Therefore, the health status of real-time monitoring UFS chip has extremely important meaning.Use health
Degree can carry out quantization means to the health status of UFS chip, in the use process of UFS chip, under health degree meeting constantly
Therefore drop, performance can also be affected.In real time, the health degree for accurately measuring UFS chip, for the longevity of UFS chip
Life prediction, strong and weak classification and raising data storage safety etc. have great significance.
The existing method for measuring UFS chip health degree, mainly by statistical method, by largely going through
History data analyze and count, and obtain the relationship between characteristic parameter and UFS chip failure feature.On the one hand, these are based on system
The measure learned is counted, needs big data to support, therefore test period is often longer；On the other hand, these are based on statistics
Measure, often UFS chip can only be divided into strong UFS chip and weak UFS chip according to the length of bimetry, and can not
Ground provides the health degree value of UFS chip, and it is pre- further also can not to carry out the accurate service life to UFS chip based on this measurement results
It surveys and is classified.Further, since the failure characteristics of UFS chip extract difficulty in actual conditions, using existing based on statistical
Method measures the UFS chip in UFS storage equipment, and the accuracy of measurement results often cannot be guaranteed.
Summary of the invention
In view of the drawbacks of the prior art and Improvement requirement, the present invention provides UFS chip health in a kind of UFS storage equipment
The measure and system of degree, it is intended that in real time, accurately measurement UFS storage equipment in UFS chip health degree, be
The Information Security that UFS stores equipment provides reliable support.
To achieve the above object, according to one aspect of the present invention, it is strong to provide UFS chip in a kind of UFS storage equipment
The measure of Kang Du, comprising:
(1) data of predetermined amount of data are written into UFS to be measured storage equipment；
(2) equipment is stored according to UFS to be measured to obtain in the forward and backward property parameters of write-in data for characterizing wherein UFS core
The fisrt feature parameter of the active volume of piece, and the second feature parameter of the degree of wear for characterizing UFS chip；
It (3) is input information with fisrt feature parameter and second feature parameter, using measurement model predetermined to UFS
The health degree of chip is measured, to obtain the health degree value that UFS chip is current in UFS storage equipment to be measured；
Wherein, measurement model is used to measure the UFS core according to the active volume of characterization UFS chip and the parameter of the degree of wear
The active volume of the health degree of piece, measurement results and UFS chip is positively correlated, and the degree of wear inverse correlation with UFS chip.
UFS storage equipment can logically be divided into interface module, main control module and storage medium module, in actual use,
Only storage medium Module Fail just will lead to stored user data loss, influence Information Security；UFS storage is set
In standby, UFS chip is located at storage medium module, in real time, accurately measures the health degree of UFS chip, it will be able to store for UFS
The Information Security of equipment provides reliable support.The present invention is obtained by the method that data are written for characterizing UFS chip
The characteristic parameter of active volume and the degree of wear, and be input with these characteristic parameters, utilization measure model is good for UFS chip
Kang Du is measured, since active volume and the degree of wear are directly related with the health degree of UFS chip, and used measurement
The measurement results of model are consistent with the considered repealed feature of UFS chip, and the present invention is measured in the health degree to UFS chip
When, can exclusive PCR information, relatively accurately get the health degree of UFS chip, and avoid the dependence to big data,
Test period is substantially reduced, therefore can accomplish real-time metrics.Generally speaking, the present invention can in real time, accurately measure UFS
The health degree of UFS chip in equipment is stored, provides reliable support for the UFS Information Security for storing equipment.
Further, in step (1), the data cover of write-in stores all pieces of equipment to UFS to be measured；
In UFS chip, erasing operation executes in blocks, entire UFS storage equipment in, different blocks there may be
Biggish performance difference, the data cover of write-in can guarantee accessed feature to all pieces of UFS to be measured storage equipment
Parameter reflects the active volume and the degree of wear of UFS chip on the whole, measures to ensure that UFS chip health degree
Accuracy.
Further, fisrt feature parameter is the available block number of UFS to be measured storage equipment after data are written；Second feature ginseng
Number stores the raw Bit-Error-Rate of equipment for UFS to be measured after write-in data, the original mistake with UFS storage equipment to be measured before write-in data
The difference of code rate.
As it is further preferred that measurement model are as follows:
Wherein, F1And F2Fisrt feature parameter and second feature parameter are respectively indicated, Health indicates corresponding UFS chip
Health degree value；
The above-mentioned measurement model based on Fraction Model can accurately obtain the health degree value of UFS chip according to characteristic parameter,
Calculating is simplified simultaneously.
Further, UFS provided by the present invention stores the health degree measure of UFS chip in equipment, further includes:
If measuring the health degree value Health < H of obtained UFS chipTh, then determine the UFS in UFS storage equipment to be measured
Chip will fail；
Wherein, HThFor preset healthy threshold value.
Further, UFS provided by the present invention stores the health degree measure of UFS chip in equipment, further includes:
After measurement obtains the health degree value Health of UFS chip, according toIt predicts to be measured
UFS stores the remaining life of UFS chip in equipment；
Wherein, HmaxThe health degree value of wherein UFS chip when equipment begins to use, H are stored for UFSminEquipment is stored for UFS
The wherein health degree value of UFS chip when failure, L0The nominal service life of equipment is stored for UFS, L is the UFS chip of prediction
Remaining life.
Further, UFS provided by the present invention stores the health degree measure of UFS chip in equipment, further includes:
The Health Category of UFS chip is determined according to the health degree value Health that measurement obtains UFS chip；
Wherein, different Health Categories corresponds to different health degree value value ranges.
Other side according to the invention provides the measurement system of UFS chip health degree in a kind of UFS storage equipment
System, comprising: Data write. module, characteristic parameter obtain module and metric module；
Data write. module, for the data of predetermined amount of data to be written into UFS to be measured storage equipment；
Characteristic parameter obtains module, obtains for storing equipment according to UFS to be measured in the forward and backward property parameters of write-in data
For characterizing the fisrt feature parameter of the wherein active volume of UFS chip, and the degree of wear for characterizing UFS chip
Two characteristic parameters；
Metric module utilizes degree predetermined for being input information with fisrt feature parameter and second feature parameter
Amount model measures the health degree of UFS chip, to obtain the health degree value that UFS chip is current in UFS storage equipment to be measured；
Wherein, measurement model is used to measure the UFS core according to the active volume of characterization UFS chip and the parameter of the degree of wear
The active volume of the health degree of piece, measurement results and UFS chip is positively correlated, and the degree of wear inverse correlation with UFS chip.
In general, contemplated above technical scheme through the invention, can obtain it is following the utility model has the advantages that
(1) UFS provided by the present invention stores the measure and system of UFS chip health degree in equipment, passes through data
The method of write-in is obtained for characterizing the active volume of UFS chip and the characteristic parameter of the degree of wear, and with these characteristic parameters
For input, utilization measure model measures the health degree of UFS chip, due to active volume and the degree of wear and UFS chip
Health degree it is directly related, and the measurement results of used measurement model are consistent with the considered repealed feature of UFS chip,
The present invention when the health degree to UFS chip is measured, can exclusive PCR information, relatively accurately get UFS chip
Health degree, and avoid the dependence to big data, substantially reduce test period, therefore can accomplish real-time metrics.Always
For, the present invention can in real time, accurately measure the health degree of UFS chip in UFS storage equipment, store equipment for UFS
Information Security provides reliable support.
(2) UFS provided by the present invention stores the measure and system of UFS chip health degree in equipment, the number of write-in
All pieces for storing equipment according to UFS to be measured is covered can guarantee that accessed characteristic parameter reflects UFS chip on the whole
Active volume and the degree of wear, to ensure that the accuracy measured to UFS chip health degree.
(3) UFS provided by the present invention stores the measure and system of UFS chip health degree in equipment, preferred at it
In scheme, using the measurement model based on Fraction Model, the health degree value of UFS chip can be accurately obtained according to characteristic parameter,
Calculating is simplified simultaneously.
(4) UFS provided by the present invention stores the measure and system of UFS chip health degree in equipment, is based on institute's degree
The health degree value of the UFS chip measured can also be achieved life prediction and classification to UFS chip, store equipment factory for UFS
Reliable use and UFS later stores the applications such as producing line screening, quality classification before equipment factory, is each provided with reliable
Support.
Detailed description of the invention
Fig. 1 is the logical architecture schematic diagram that existing UFS stores equipment；
Fig. 2 is the measure flow chart that UFS provided in an embodiment of the present invention stores UFS chip health degree in equipment.
Specific embodiment
In order to make the objectives, technical solutions, and advantages of the present invention clearer, with reference to the accompanying drawings and embodiments, right
The present invention is further elaborated.It should be appreciated that the specific embodiments described herein are merely illustrative of the present invention, and
It is not used in the restriction present invention.As long as in addition, technical characteristic involved in the various embodiments of the present invention described below
Not constituting a conflict with each other can be combined with each other.
Before explaining in detail technical solution of the present invention, first to the logic of the UFS storage equipment involved in the present invention arrived
Framework is briefly introduced.UFS stores the logical architecture of equipment as shown in Figure 1, can logically be divided into interface module
(Interface), main control module (Controller) and storage medium module (NAND Flash)；Wherein, interface module is used for
The communication with host equipment is completed, main control module is for managing flash memory and executing Host Command, and storage medium module is for storing
Data；In actual use, only storage medium Module Fail just will lead to stored user data loss, influence data
Safety；UFS is stored in equipment, and UFS chip is located at storage medium module, in real time, accurately measures the health of UFS chip
Degree, it will be able to provide reliable support for the UFS Information Security for storing equipment.
Based on the logical architecture of UFS shown in FIG. 1 storage equipment, UFS chip in UFS storage equipment provided by the present invention
The measure of health degree, as shown in Figure 2, comprising:
(1) data of predetermined amount of data are written into UFS to be measured storage equipment；
In an optional embodiment, in step (1), the data cover of write-in stores the institute of equipment to UFS to be measured
There is block；
In UFS chip, erasing operation executes in blocks, entire UFS storage equipment in, different blocks there may be
Biggish performance difference, the data cover of write-in can guarantee accessed feature to all pieces of UFS to be measured storage equipment
Parameter reflects the active volume and the degree of wear of UFS chip on the whole, measures to ensure that UFS chip health degree
Accuracy；
(2) equipment is stored according to UFS to be measured to obtain in the forward and backward property parameters of write-in data for characterizing wherein UFS core
The fisrt feature parameter of the active volume of piece, and the second feature parameter of the degree of wear for characterizing UFS chip；
In an optional embodiment, fisrt feature parameter is the available of UFS to be measured storage equipment after data are written
Block number；Second feature parameter is the raw Bit-Error-Rate of UFS to be measured storage equipment after data are written, with UFS to be measured before write-in data
Store the difference of the raw Bit-Error-Rate of equipment；
The selection scheme of features described above parameter, only a kind of more preferred scheme, should not be construed as to of the invention
Unique to limit, other can be used for characterizing the parameter of UFS chip storage capacity and the degree of wear, can be used for the present invention；
It (3) is input information with fisrt feature parameter and second feature parameter, using measurement model predetermined to UFS
The health degree of chip is measured, to obtain the health degree value that UFS chip is current in UFS storage equipment to be measured；
Wherein, measurement model is used to measure the UFS core according to the active volume of characterization UFS chip and the parameter of the degree of wear
The active volume of the health degree of piece, measurement results and UFS chip is positively correlated, and the degree of wear inverse correlation with UFS chip；
In an optional embodiment, measurement model specifically:
Wherein, F1And F2Fisrt feature parameter and second feature parameter are respectively indicated, Health indicates corresponding UFS chip
Health degree value；
The above-mentioned measurement model based on Fraction Model can accurately obtain the health degree value of UFS chip according to characteristic parameter,
Calculating is simplified simultaneously；
The above-mentioned measurement model based on Fraction Model, only a kind of preferred measurement model, should not be construed as to the present invention
Unique restriction；As long as can guarantee that measurement results are consistent with the considered repealed mode of UFS chip, i.e. measurement results and UFS core
The active volume of piece is positively correlated, and the degree of wear inverse correlation with UFS chip, other specific measurement models can also be applied to this
In invention；For example, further basis the first spy can be given with dosage and the degree of wear to the influence degree of UFS chip health degree
Levy parameter and the corresponding weight coefficient of second feature parametric distribution；Other concrete models will not enumerate herein.
The measure of UFS chip health degree, is obtained by the method that data are written and is used for table in above-mentioned UFS storage equipment
The active volume of UFS chip and the characteristic parameter of the degree of wear are levied, and is input, utilization measure model pair with these characteristic parameters
The health degree of UFS chip is measured, since active volume and the degree of wear are directly related with the health degree of UFS chip, and
The measurement results of used measurement model are consistent with the considered repealed feature of UFS chip, UFS in above-mentioned UFS storage equipment
The measure of chip health degree when the health degree to UFS chip is measured, can exclusive PCR information, relatively accurately
The health degree of UFS chip is got, and avoids the dependence to big data, substantially reduces test period, therefore can do
To real-time metrics.Generally speaking, the measure of UFS chip health degree can in real time, accurately be spent in above-mentioned UFS storage equipment
The health degree of UFS chip in UFS storage equipment is measured, provides reliable support for the UFS Information Security for storing equipment.
To determine that UFS stores whether the UFS chip in equipment will fail, UFS chip health in above-mentioned UFS storage equipment
The measure of degree, may also include that
If measuring the health degree value Health < H of obtained UFS chipTh, then determine the UFS in UFS storage equipment to be measured
Chip will fail；
Wherein, HThFor preset healthy threshold value；Healthy threshold value HThIt can accordingly be set according to actual Information Security demand
It is fixed.
In order to realize the life prediction to UFS chip in UFS storage equipment, UFS chip health in above-mentioned UFS storage equipment
The measure of degree, may also include that
After measurement obtains the health degree value Health of UFS chip, according toIt predicts to be measured
UFS stores the remaining life of UFS chip in equipment；
Wherein, HmaxThe health degree value of wherein UFS chip when equipment begins to use, H are stored for UFSminEquipment is stored for UFS
The wherein health degree value of UFS chip when failure, L0The nominal service life of equipment is stored for UFS, L is the UFS chip of prediction
Remaining life.
To realize that the health degree for storing UFS chip in equipment to UFS is classified, UFS chip health in above-mentioned UFS storage equipment
The measure of degree, may also include that
The Health Category of UFS chip is determined according to the health degree value Health that measurement obtains UFS chip；
Wherein, different Health Categories corresponds to different health degree value value ranges.
The measure of UFS chip health degree, strong based on measured obtained UFS chip in above-mentioned UFS storage equipment
Health angle value realizes life prediction and classification to UFS chip, stores the reliable use after equipment factory for UFS, and
UFS stores the applications such as producing line screening, quality classification before equipment factory, is each provided with reliable support.
The present invention also provides the gauging systems of UFS chip health degree in a kind of UFS storage equipment, for realizing above-mentioned
UFS stores the measure of UFS chip health degree in equipment, which includes: Data write. module, characteristic parameter acquisition
Module and metric module；
Data write. module, for the data of predetermined amount of data to be written into UFS to be measured storage equipment；
Characteristic parameter obtains module, obtains for storing equipment according to UFS to be measured in the forward and backward property parameters of write-in data
For characterizing the fisrt feature parameter of the wherein active volume of UFS chip, and the degree of wear for characterizing UFS chip
Two characteristic parameters；
Metric module utilizes degree predetermined for being input information with fisrt feature parameter and second feature parameter
Amount model measures the health degree of UFS chip, to obtain the health degree value that UFS chip is current in UFS storage equipment to be measured；
Wherein, measurement model is used to measure the UFS core according to the active volume of characterization UFS chip and the parameter of the degree of wear
The active volume of the health degree of piece, measurement results and UFS chip is positively correlated, and the degree of wear inverse correlation with UFS chip；
In embodiments of the present invention, the specific embodiment of each module can refer to the description in above method embodiment,
This will not be repeated.
As it will be easily appreciated by one skilled in the art that the foregoing is merely illustrative of the preferred embodiments of the present invention, not to
The limitation present invention, any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should all include
Within protection scope of the present invention.
Claims (8)
1. the measure of UFS chip health degree in a kind of UFS storage equipment characterized by comprising
(1) data of predetermined amount of data are written into UFS to be measured storage equipment；
(2) it is obtained in the forward and backward property parameters of write-in data for characterizing wherein UFS core according to the UFS storage equipment to be measured
The fisrt feature parameter of the active volume of piece, and the second feature parameter of the degree of wear for characterizing the UFS chip；
It (3) is input information with the fisrt feature parameter and second feature parameter, using measurement model predetermined to institute
The health degree for stating UFS chip is measured, to obtain the health degree value that UFS chip is current in the UFS storage equipment to be measured；
Wherein, the measurement model is used to measure the UFS core according to the active volume of characterization UFS chip and the parameter of the degree of wear
The active volume of the health degree of piece, measurement results and UFS chip is positively correlated, and the degree of wear inverse correlation with UFS chip.
2. the measure of UFS chip health degree in UFS storage equipment as described in claim 1, which is characterized in that the step
Suddenly in (1), the data cover of write-in stores all pieces of equipment to the UFS to be measured.
3. the measure of UFS chip health degree in UFS storage equipment as claimed in claim 1 or 2, which is characterized in that institute
State the available block number that fisrt feature parameter is the UFS storage equipment to be measured after data are written；The second feature parameter is to write
The raw Bit-Error-Rate for entering the UFS storage equipment to be measured after data, it is original with UFS storage equipment to be measured described before write-in data
The difference of the bit error rate.
4. the measure of UFS chip health degree in UFS storage equipment as claimed in claim 1 or 2, which is characterized in that institute
State measurement model are as follows:
Wherein, F1And F2The fisrt feature parameter and the second feature parameter are respectively indicated, Health indicates corresponding UFS
Chip health degree value.
5. the measure of UFS chip health degree in UFS storage equipment as claimed in claim 1 or 2, which is characterized in that also
Include:
If measuring the health degree value Health < H of obtained UFS chipTh, then determine the UFS in the UFS storage equipment to be measured
Chip will fail；
Wherein, HThFor preset healthy threshold value.
6. the measure of UFS chip health degree in UFS storage equipment as claimed in claim 1 or 2, which is characterized in that also
Include:
After measurement obtains the health degree value Health of UFS chip, according toIt predicts described to be measured
UFS stores the remaining life of UFS chip in equipment；
Wherein, HmaxThe health degree value of wherein UFS chip when equipment begins to use, H are stored for UFSminEquipment failure is stored for UFS
The health degree value of Shi Qizhong UFS chip, L0The nominal service life of equipment is stored for UFS, L is the residue of the UFS chip of prediction
Service life.
7. the measure of UFS chip health degree in UFS storage equipment as claimed in claim 1 or 2, which is characterized in that also
Include:
The Health Category of the UFS chip is determined according to the health degree value Health that measurement obtains UFS chip；
Wherein, different Health Categories corresponds to different health degree value value ranges.
8. the gauging system of UFS chip health degree in a kind of UFS storage equipment characterized by comprising Data write. module,
Characteristic parameter obtains module and metric module；
The Data write. module, for the data of predetermined amount of data to be written into UFS to be measured storage equipment；
The characteristic parameter obtains module, for the property parameters forward and backward in write-in data according to the UFS storage equipment to be measured
Obtain the fisrt feature parameter for characterizing the wherein active volume of UFS chip, and the abrasion for characterizing the UFS chip
The second feature parameter of degree；
The metric module, for being input information with the fisrt feature parameter and second feature parameter, using pre-defined
Measurement model the health degree of the UFS chip is measured, worked as with obtaining UFS chip in the UFS to be measured storage equipment
Preceding health degree value；
Wherein, the measurement model is used to measure the UFS core according to the active volume of characterization UFS chip and the parameter of the degree of wear
The active volume of the health degree of piece, measurement results and UFS chip is positively correlated, and the degree of wear inverse correlation with UFS chip.
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