CN110221261B - Radar waveform generation module test analysis method and device - Google Patents

Radar waveform generation module test analysis method and device Download PDF

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CN110221261B
CN110221261B CN201910576784.5A CN201910576784A CN110221261B CN 110221261 B CN110221261 B CN 110221261B CN 201910576784 A CN201910576784 A CN 201910576784A CN 110221261 B CN110221261 B CN 110221261B
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module
intermediate frequency
waveform generation
generation module
signal
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CN110221261A (en
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何运来
陆新权
周仁峰
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Leihua Electronic Technology Research Institute Aviation Industry Corp of China
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Leihua Electronic Technology Research Institute Aviation Industry Corp of China
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01SRADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/02Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S13/00
    • G01S7/40Means for monitoring or calibrating

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  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Radar Systems Or Details Thereof (AREA)

Abstract

The application provides a test analysis method and a device for a radar waveform generation module, belongs to the technical field of data processing, and is used for testing and analyzing a tested waveform generation module, wherein the method comprises the following steps: firstly, generating an instruction for controlling the generation of a radar signal, and sending the instruction to a measured waveform generation module; then filtering the broadband signal sent by the measured waveform generating module to obtain a first intermediate frequency signal, and carrying out frequency conversion processing on the narrowband signal sent by the measured waveform generating module to obtain a second intermediate frequency signal; then, performing analog-to-digital conversion on the first intermediate frequency signal and the second intermediate frequency signal; finally, data is formed that can be used for waveform analysis and comparison. By adopting the method, the test process is simplified, the detection equipment is saved, the data is directly analyzed on the upper computer after being collected, and the test efficiency is improved.

Description

Radar waveform generation module test analysis method and device
Technical Field
The application belongs to the technical field of data processing, and particularly relates to a test analysis method and device for a radar waveform generation module.
Background
With the development of radar technology, the testing requirements of each module of the radar are increasing. The radar waveform generation module belongs to a radar system and is used for generating radar waveform signals and controlling and managing the radio frequency module. The testing of the waveform generating module requires more instruments and equipment, and a frequency spectrograph, an oscilloscope, a signal source, a phase noise tester and the like are required. Because the test needs many instruments and has large volume, the experimental test environment is not easy to build. And the data measured by each instrument are independent from each other, and correlation analysis cannot be performed, so that much energy is consumed to integrate the data if the data needs to be analyzed.
In the process of testing waveform modules, there are problems: the required instruments are numerous, the data of each instrument is independent, a targeted data analysis function is lacked, the data storage is inconvenient, and the efficiency is low.
Disclosure of Invention
In order to solve at least one of the above technical problems, the present application provides a method and a system for testing and analyzing a radar waveform generation module, which implement integration of a test instrument, simplify a test environment and a test process, improve work efficiency, and implement functions of test data recording and data analysis.
In a first aspect of the present application, a method for testing and analyzing a radar waveform generation module is used for testing and analyzing a tested waveform generation module, and includes:
s1, generating a control instruction carrying a radar signal generated by the detected waveform generation module;
s2, sending the control command to the measured waveform generation module;
s3, filtering the broadband signal sent by the measured waveform generation module to obtain a first intermediate frequency signal, and performing frequency conversion processing on the narrowband signal sent by the measured waveform generation module to obtain a second intermediate frequency signal;
s4, performing analog-to-digital conversion on the processed first intermediate frequency signal and the processed second intermediate frequency signal;
and step S5, processing the converted data signals to generate data which can be used for waveform analysis and comparison.
Preferably, the control instruction includes controlling the measured waveform generation module to generate a radar signal at a specified clock frequency;
preferably, the frequency conversion processing of the narrowband signal sent by the generating module includes:
filtering the narrow-band signal generated by the measured waveform generation module; and
and amplifying the filtered narrow-band signal to obtain the second intermediate frequency signal.
Preferably, before filtering the narrowband signal generated by the measured waveform generating module, the method includes:
and the narrow-band signal generated by the tested waveform generation module can be selectively subjected to frequency mixing processing.
In a second aspect of the present application, a test analysis device for a radar waveform generation module is used for testing and analyzing a measured waveform generation module, and mainly includes:
the baseband intermediate frequency processing module is used for generating a control instruction for controlling the detected waveform generating module and is used for carrying out analog-to-digital conversion processing on the received first intermediate frequency signal and the second intermediate frequency signal;
the filtering module is respectively connected with the measured waveform generating module and the baseband intermediate frequency processing module and is used for receiving the broadband signal generated by the measured waveform generating module, generating a first intermediate frequency signal after filtering and transmitting the first intermediate frequency signal to the baseband intermediate frequency processing module;
the interface module is respectively connected with the measured waveform generation module and the baseband intermediate frequency processing module and is used for interactively transmitting control instructions and states between the measured waveform generation module and the baseband intermediate frequency processing module;
the down-conversion module is respectively connected with the measured waveform generation module and the baseband intermediate frequency processing module, and is used for converting the narrow-band signal received from the measured waveform generation module into a second intermediate frequency signal and transmitting the second intermediate frequency signal to the baseband intermediate frequency processing module;
and the performance analysis unit is connected with the baseband intermediate frequency processing module and is used for processing the digital signals sent by the baseband intermediate frequency processing module and generating data which can be used for waveform analysis and comparison.
Preferably, the device further comprises a clock module, which is respectively coupled to the measured waveform generating module and the baseband intermediate frequency processing module, and is used for generating a working clock required by the measured waveform generating module and a sampling reference clock used for generating the baseband intermediate frequency processing module.
Preferably, the down-conversion module includes:
the band-pass filter is used for filtering the narrow-band signal generated by the measured waveform generation module; and
and the program-controlled amplifier is used for amplifying the filtered narrow-band signal to obtain the second intermediate-frequency signal.
Preferably, the down-conversion module further includes a frequency mixing unit selectively disposed between the band-pass filter and the measured waveform generation module, and configured to mix the narrowband signal generated by the measured waveform generation module, and send the mixed signal to the band-pass filter.
In a third aspect of the present application, a computer device is characterized by comprising a processor, a memory, and a computer program stored on the memory and executable on the processor, wherein the processor executes the computer program for implementing the radar waveform generation module test analysis method as described above.
In a fourth aspect of the present application, a readable storage medium stores a computer program for implementing the radar waveform generation module test analysis method as described above when executed by a processor.
This application can be used for radar test field, and the advantage that has and effect as follows:
(1) The device can simultaneously test 5 different instruments required by the test of the front waveform generation module, and can complete the test only by the device.
(2) The data of each instrument is independent and the formats of the instruments are different before the device is invented, and the device can count the tested waveform data, control state data, timing data and the like on the instruments, so that the data can be analyzed more conveniently.
(3) Before the device is invented, test records all need to be participated manually, and the device can realize automatic test and record, so that the occupied time of test workers is prolonged.
(4) Before the device is invented, an oscilloscope is needed to collect data for analyzing waveform data, then matlab is used for analyzing the data, and the device directly analyzes the data on an upper computer after collecting the data, so that the test efficiency is improved.
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FIG. 1 is a flowchart of a radar waveform generation module test analysis method according to the present application.
FIG. 2 is a diagram of a system architecture of a radar waveform generating module test analysis device according to the present application.
Fig. 3 is a schematic structural diagram of a down conversion module according to the embodiment shown in fig. 2 of the present application.
Fig. 4 is a schematic structural diagram of a computer device 400 used for implementing the embodiment of the present application.
Detailed Description
In order to make the implementation objects, technical solutions and advantages of the present application clearer, the technical solutions in the embodiments of the present application will be described in more detail below with reference to the accompanying drawings in the embodiments of the present application. In the drawings, the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The described embodiments are some, but not all embodiments of the present application. The embodiments described below with reference to the drawings are exemplary and intended to be used for explaining the present application, and should not be construed as limiting the present application. All other embodiments obtained by a person of ordinary skill in the art without any inventive work based on the embodiments in the present application are within the scope of protection of the present application. Embodiments of the present application will be described in detail below with reference to the drawings.
According to a first aspect of the present application, a method for testing and analyzing a radar waveform generation module is used for testing and analyzing a tested waveform generation module, as shown in fig. 1, and mainly includes:
s1, generating a control instruction carrying a radar signal generated by a detected waveform generation module;
s2, sending the control command to the measured waveform generation module;
s3, filtering the broadband signal sent by the measured waveform generation module to obtain a first intermediate frequency signal, and performing frequency conversion processing on the narrowband signal sent by the measured waveform generation module to obtain a second intermediate frequency signal;
s4, performing analog-to-digital conversion on the processed first intermediate frequency signal and the processed second intermediate frequency signal;
and step S5, processing the converted data signals to generate data which can be used for waveform analysis and comparison.
In some optional embodiments, the control instructions comprise controlling the measured waveform generation module to generate a radar signal at a specified clock frequency;
in some optional embodiments, the frequency conversion processing on the narrowband signal transmitted by the generating module includes:
filtering the narrow-band signal generated by the measured waveform generation module; and
and amplifying the filtered narrow-band signal to obtain the second intermediate frequency signal.
In some optional embodiments, before filtering the narrowband signal generated by the measured waveform generation module, the method includes:
and the narrow-band signal generated by the tested waveform generation module can be selectively subjected to frequency mixing processing.
According to a second aspect of the present application, a test analysis device for a radar waveform generation module is used for testing and analyzing a measured waveform generation module, and as shown in fig. 2, the test analysis device mainly comprises a clock module 1, a filtering module 2, an interface module 3, a down-conversion module 4, a power module 6, a baseband intermediate frequency processing module 5, and a performance analysis and display control module 7.
Specifically, the baseband intermediate frequency processing module 5 is configured to generate a control instruction for controlling the measured waveform generating module, and perform analog-to-digital conversion processing on the received first intermediate frequency signal and the received second intermediate frequency signal;
the filtering module 2 is respectively connected with the measured waveform generating module and the baseband intermediate frequency processing module, and is used for receiving the broadband signal generated by the measured waveform generating module, generating a first intermediate frequency signal after filtering, and transmitting the first intermediate frequency signal to the baseband intermediate frequency processing module;
the interface module 3 is respectively connected with the measured waveform generation module and the baseband intermediate frequency processing module and is used for interactively transmitting control instructions and states between the measured waveform generation module and the baseband intermediate frequency processing module;
the down-conversion module 4 is respectively connected with the measured waveform generation module and the baseband intermediate frequency processing module, and is used for converting the narrow-band signal received from the measured waveform generation module into a second intermediate frequency signal and transmitting the second intermediate frequency signal to the baseband intermediate frequency processing module;
the performance analysis and display control module 7 comprises a performance analysis unit and a display unit, wherein the performance analysis unit is connected with the baseband intermediate frequency processing module and is used for processing the digital signals sent by the baseband intermediate frequency processing module to generate data which can be used for waveform analysis and comparison.
In this application, clock module 1 couples to respectively by survey waveform generation module and baseband intermediate frequency processing module for produce by survey waveform generation module required working clock, and be used for producing the sampling reference clock of baseband intermediate frequency processing module, the broadband signal input that awaits measuring waveform module 8 output passes through filtering module 2, and the signal is exported for baseband intermediate frequency processing module 5 after filtering. The RS485, TLL and LDVS differential lines of the waveform module to be tested 8 are connected into the interface module, and the interface module is connected with the baseband intermediate frequency processing module 5 through the LVDS differential lines. The narrow-band signal of the waveform module to be tested 8 is accessed to the down-conversion module 4, and the output signal of the down-conversion module 4 is accessed to the baseband intermediate frequency processing module 5. The output voltage of the power supply module 6 is connected to the waveform module to be tested. The baseband intermediate frequency processing module 5 is connected with the performance analysis and display control module 7 through a PCI bus.
In this embodiment, the clock module is used to generate a plurality of clocks required by the system operation, and a user can select two modes, namely an internal reference clock and an external reference clock, through the upper computer. The switching between the internal clock and the external clock is set through the software of the upper computer, and various external clock reference frequencies can be selected when the external clock is selected.
The embodiment integrates the modules, can adopt a unified clock module, can collect data at the same moment, and avoids the defect that the analysis result is inaccurate due to the fact that different instruments are not used for sampling data at the same moment in the prior art.
The intermediate frequency processing unit is communicated with the upper computer through a PCI bus interface, the upper computer sets the bandwidth of broadband and narrowband signal processing through a PCI bus, the number of recorded data frames is increased, and meanwhile, after recording is completed, the upper computer uploads data through the upper computer, and final waveform analysis and monitoring are completed through the upper computer.
The interface module has the main function of generating a control instruction for the operation of the test module and receiving a state signal output by the tested module. Collecting 50TTL state signals input by a module to be tested; setting sampling intervals of 50TTL signals; and displaying the state of the 50TTL signals.
The display module comprises a function interface of instruction sending, state monitoring, narrow-band analysis and wide-band analysis. The main functions of the waveform generation module test analysis system comprise: providing a clock signal, a control signal and an instruction signal required by normal work of the tested device; and receiving the TTL state signal output by the tested equipment, and displaying the TTL state signal through a human-computer interaction interface.
In some optional embodiments, the down-conversion module, as shown in fig. 3, mainly includes:
the band-pass filter is used for filtering the narrow-band signal generated by the measured waveform generation module; and
and the program-controlled amplifier is used for amplifying the filtered narrow-band signal to obtain the second intermediate-frequency signal.
In some optional embodiments, the down-conversion module further includes a frequency mixing unit selectively disposed between the band-pass filter and the measured waveform generation module, and configured to mix the narrow-band signal generated by the measured waveform generation module and send the mixed signal to the band-pass filter.
In this embodiment, the down-conversion module down-converts the radio frequency signal to an intermediate frequency signal, and the block diagram is shown in fig. 3. Firstly, a radio frequency input signal passes through a radio frequency switch 9, the radio frequency input signal and a mixing signal to obtain an intermediate frequency signal, and the intermediate frequency signal is output by a program control amplifier 14 after passing through a band-pass filter 13. The other path directly passes through the band-pass filter 10 and the program control amplifier 11 to output signals. The input radio frequency signal can set the switching of the radio frequency switch 9 through the software of the upper computer. When the mixing input is selected, the switch is switched to one way of mixing; when the radio frequency input is selected, the switch is switched to one path of filtering.
In a third aspect of the present application, a computer device includes a processor, a memory, and a computer program stored on the memory and executable on the processor, the processor executing the computer program for implementing a radar waveform generation module test analysis method.
In a fourth aspect of the present application, a readable storage medium stores a computer program for implementing the radar waveform generation module test analysis method as described above when executed by a processor. The computer-readable storage medium may be included in the apparatus described in the above embodiment; or may be present separately and not assembled into the device. The computer readable storage medium carries one or more programs which, when executed by the apparatus, process data in the manner described above.
Referring now to FIG. 4, shown is a schematic diagram of a computer device 400 suitable for use in implementing embodiments of the present application. The computer device shown in fig. 4 is only an example, and in the radar signal processing, the computer is usually replaced by a single chip for cost saving.
As shown in fig. 4, the computer apparatus 400 includes a Central Processing Unit (CPU) 401 that can perform various appropriate actions and processes in accordance with a program stored in a Read Only Memory (ROM) 402 or a program loaded from a storage section 408 into a Random Access Memory (RAM) 403. In the RAM403, various programs and data necessary for the operation of the device 400 are also stored. The CPU401, ROM402, and RAM403 are connected to each other via a bus 404. An input/output (I/O) interface 405 is also connected to bus 404.
The following components are connected to the I/O interface 405: an input section 406 including a keyboard, a mouse, and the like; an output section 407 including a display device such as a Cathode Ray Tube (CRT), a Liquid Crystal Display (LCD), and the like, and a speaker; a storage section 408 including a hard disk and the like; and a communication section 409 including a network interface card such as a LAN card, a modem, or the like. The communication section 409 performs communication processing via a network such as the internet. A drive 410 is also connected to the I/O interface 405 as needed. A removable medium 411 such as a magnetic disk, an optical disk, a magneto-optical disk, a semiconductor memory, or the like is mounted on the drive 410 as needed, so that a computer program read out therefrom is mounted in the storage section 408 as needed.
In particular, according to embodiments of the present application, the processes described above with reference to the flowcharts may be implemented as computer software programs. For example, embodiments of the present application include a computer program product comprising a computer program embodied on a computer readable medium, the computer program comprising program code for performing the method illustrated by the flow chart. In such an embodiment, the computer program may be downloaded and installed from a network through the communication section 409, and/or installed from the removable medium 411. The computer program performs the above-described functions defined in the method of the present application when executed by a Central Processing Unit (CPU) 401. Note that the computer storage media of the present application can be either computer readable signal media or computer readable storage media or any combination of the two. A computer readable storage medium may be, for example, but not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any combination of the foregoing. More specific examples of the computer readable storage medium may include, but are not limited to: an electrical connection having one or more wires, a portable computer diskette, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing. In the present application, a computer readable storage medium may be any tangible medium that can contain, or store a program for use by or in connection with an instruction execution system, apparatus, or device. In this application, however, a computer readable signal medium may include a propagated data signal with computer readable program code embodied therein, for example, in baseband or as part of a carrier wave. Such a propagated data signal may take any of a variety of forms, including, but not limited to, electro-magnetic, optical, or any suitable combination thereof. A computer readable signal medium may also be any computer readable medium that is not a computer readable storage medium and that can communicate, propagate, or transport a program for use by or in connection with an instruction execution system, apparatus, or device. Program code embodied on a computer readable medium may be transmitted using any appropriate medium, including but not limited to: wireless, wire, fiber optic cable, RF, etc., or any suitable combination of the foregoing.
The flowchart and block diagrams in the figures illustrate the architecture, functionality, and operation of possible implementations of systems, methods and computer program products according to various embodiments of the present application. In this regard, each block in the flowchart or block diagrams may represent a module, segment, or portion of code, which comprises one or more executable instructions for implementing the specified logical function(s). It should also be noted that, in some alternative implementations, the functions noted in the block may occur out of the order noted in the figures. For example, two blocks shown in succession may, in fact, be executed substantially concurrently, or the blocks may sometimes be executed in the reverse order, depending upon the functionality involved. It will also be noted that each block of the block diagrams and/or flowchart illustration, and combinations of blocks in the block diagrams and/or flowchart illustration, can be implemented by special purpose hardware-based systems which perform the specified functions or acts, or combinations of special purpose hardware and computer instructions.
The modules or units described in the embodiments of the present application may be implemented by software or hardware. The modules or units described may also be provided in a processor, the names of which in some cases do not constitute a limitation of the module or unit itself.
The above description is only for the specific embodiments of the present application, but the scope of the present application is not limited thereto, and any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope of the present application should be covered within the scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.

Claims (10)

1. A test analysis method of a radar waveform generation module is used for testing and analyzing a tested waveform generation module, and is characterized by comprising the following steps:
s1, generating a control instruction carrying a radar signal generated by the detected waveform generation module;
s2, sending the control command to the measured waveform generation module;
s3, filtering the broadband signal sent by the measured waveform generation module to obtain a first intermediate frequency signal, and performing frequency conversion processing on the narrowband signal sent by the measured waveform generation module to obtain a second intermediate frequency signal;
s4, performing analog-to-digital conversion on the processed first intermediate frequency signal and the processed second intermediate frequency signal;
and step S5, processing the converted data signals to generate data which can be used for waveform analysis and comparison.
2. The method of claim 1, wherein the control instructions comprise controlling the measured waveform generation module to generate a radar signal at a specified clock frequency.
3. The method for testing and analyzing a radar waveform generating module of claim 1, wherein the frequency conversion processing of the narrowband signal transmitted by the measured waveform generating module comprises:
filtering the narrow-band signal generated by the measured waveform generation module; and
and amplifying the filtered narrow-band signal to obtain the second intermediate frequency signal.
4. The method for testing and analyzing a radar waveform generating module of claim 3, wherein the filtering the narrowband signal generated by the measured waveform generating module comprises:
and mixing the narrow-band signals generated by the measured waveform generation module.
5. The utility model provides a radar waveform generation module test analytical equipment for testing and analysis are taken place to the waveform generation module that is surveyed, its characterized in that includes:
the baseband intermediate frequency processing module is used for generating a control instruction for controlling the detected waveform generating module and performing analog-to-digital conversion processing on the received first intermediate frequency signal and the received second intermediate frequency signal;
the filtering module is respectively connected with the measured waveform generating module and the baseband intermediate frequency processing module and is used for receiving the broadband signal generated by the measured waveform generating module, generating a first intermediate frequency signal after filtering and transmitting the first intermediate frequency signal to the baseband intermediate frequency processing module;
the interface module is respectively connected with the measured waveform generation module and the baseband intermediate frequency processing module and is used for interactively transmitting control instructions and states between the measured waveform generation module and the baseband intermediate frequency processing module;
the down-conversion module is respectively connected with the measured waveform generation module and the baseband intermediate frequency processing module, and is used for converting the narrow-band signal received from the measured waveform generation module into a second intermediate frequency signal and transmitting the second intermediate frequency signal to the baseband intermediate frequency processing module;
and the performance analysis unit is connected with the baseband intermediate frequency processing module and is used for processing the digital signals sent by the baseband intermediate frequency processing module and generating data which can be used for waveform analysis and comparison.
6. The apparatus of claim 5, further comprising a clock module, respectively coupled to the measured waveform generation module and the baseband IF processing module, for generating an operating clock required by the measured waveform generation module and a sampling reference clock for generating the baseband IF processing module.
7. The radar waveform generation module test analysis device of claim 5, wherein the down conversion module comprises:
the band-pass filter is used for filtering the narrow-band signal generated by the measured waveform generation module; and
and the program-controlled amplifier is used for amplifying the filtered narrow-band signal to obtain the second intermediate-frequency signal.
8. The apparatus of claim 7, wherein the down-conversion module further comprises a mixing unit disposed between the band-pass filter and the measured waveform generation module for mixing the narrowband signal generated by the measured waveform generation module and transmitting the mixed signal to the band-pass filter.
9. A computer device comprising a processor, a memory, and a computer program stored on the memory and executable on the processor, the processor executing the computer program for implementing the radar waveform generation module test analysis method of any one of claims 1 to 4.
10. A readable storage medium storing a computer program, wherein the computer program, when executed by a processor, is adapted to implement the radar waveform generation module test analysis method according to any one of claims 1 to 4.
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