CN110160644A - A kind of real-time light intensity test device of photoelectric encoder - Google Patents
A kind of real-time light intensity test device of photoelectric encoder Download PDFInfo
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- CN110160644A CN110160644A CN201810813705.3A CN201810813705A CN110160644A CN 110160644 A CN110160644 A CN 110160644A CN 201810813705 A CN201810813705 A CN 201810813705A CN 110160644 A CN110160644 A CN 110160644A
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- 238000012545 processing Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/0295—Constructional arrangements for removing other types of optical noise or for performing calibration
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
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Abstract
The invention discloses a kind of real-time light intensity test devices of photoelectric encoder, comprising: light source, optical code disk and photoelectric encoder chip；The light source is transmitted light source or reflection source；The photoelectric coding chip includes test photosensitive unit and calibration photosensitive components；It include code channel on the optical code disk；The test photosensitive unit includes one or more photosensitive units, and the photosensitive unit is arranged along code channel direction；The calibration photosensitive components include at least four photosensitive unit；Due to increasing calibration photosensitive components, therefore it can measure in real time since disturbing factor and equipment cause the instantaneous most highlight intensity value and most low light intensity value changed, by analog-to-digital conversion, accurate location information can be obtained by calculating, it can calibrate since environmental change and equipment deviation cause the inaccurate parameter situation obtained, so that photoelectric encoder is kept accuracy, therefore there is clear advantage.
Description
Technical field
The invention belongs to detection field more particularly to a kind of real-time light intensity test devices of photoelectric encoder.
Background technique
Photoelectric encoder is that one kind by photoelectric conversion converts the mechanical geometric displacement on the output shaft to pulse or number
The sensor of word amount；For transmission-type light source, light after collector lens become collimated light beam, light beam pass through barn door window and
Grating shadow is incident upon on silicon photocell by the optical code disk with etched grating, and for reflection-type light source, light is impinged upon with erosion
On the optical code disk for carving grating, by the reflection of grating shadow on silicon photocell, the optoelectronic induction array on photocell believes luminous intensity
It number is converted into Weak current signal, electric signal is treated as code-disc location information by post-module；
In photoelectric encoder work, there are several key factors to seriously affect the accuracy of output position, be first, the intensity of light source
It is influenced to change by temperature, humidity and product quality；The etching accuracy of grating, such as a diameter 20mm circumference
On, to etch 1024 or more fan-shaped gratings, the width in each grating and opaque gap is about 20um, this is wide
Degree is influenced by temperature, material homogeneity, revolving speed etc.；In facilities, the photosensitive array on photoelectricity chamber chip is needed to have no partially
The alignment grating of difference, so that the projection of grating can accurately fall in photosensitive region, so that chip being capable of amplitude peak induction light
Strong variation, when turning with deviation, the light of light transmission grating can become smaller, and the maximum light intensity of the sense organ of chip can be with encoder
Individual different huge differences occur；
Due to various factors influence, the minimum and maximum luminous intensity of the reality instantaneously obtained, and ideally set maximum and
Minimum light intensity is not identical, it is therefore desirable to find a kind of this problem of being able to solve.
Summary of the invention
In view of this, needing to overcome at least one of drawbacks described above in the prior art.The present invention provides a kind of light
The real-time light intensity test device of photoelectric coder.
The real-time light intensity test device of photoelectric encoder includes light source, optical code disk and photoelectric encoder chip；The light
Source is transmitted light source or reflection source；When light source is transmitted light source, the transmitted light source is mounted on the side of the optical code disk,
The photoelectric encoder chip is mounted on the other side of the optical code disk；When light source be reflection source when, the reflection source with
The photoelectric encoder chip is mounted on the same side of the optical code disk；The photoelectric coding chip include test photosensitive unit and
Calibrate photosensitive components；It include code channel on the optical code disk；The test photosensitive unit includes one or more test photosensitive units,
The test photosensitive unit is arranged along code channel direction；The calibration photosensitive components include N (N minimum takes 4) a calibration photosensitive unit；
Along code channel direction, (the code channel direction is using code-disc shaft as the tangent line of the concentric circles where axis grating to the calibration photosensitive components
On, determine direction tangentially clockwise or counterclockwise according to code-disc is practical) the width of photosurface be less than or equal to any one
A width (screen periods is defined as: grating along a direction of code channel for one screen periods of same code channel
Distance of the starting side to the starting side of adjacent gratings)；Herein, when there is several code channels, K refers to k-th code to K(
Road) it is a it is described calibration photosensitive components mounting condition: need meet can be in the origination side of a grating of same code channel
In side to the width of a cycle of the starting side of adjacent gratings, instantaneous largest light intensity amplitude pole can be perceived by least having one
Value Vmax(K)The photosensitive unit of (the largest light intensity amplitude extremum of k-th code channel) and one can perceive instantaneous minimum intensity of light extreme value
Vmin(K)The photosensitive unit of (the minimum intensity of light amplitude extremum of k-th code channel)；The test photosensitive unit is for detecting instantaneous light
Intensity values are denoted as Vx(K)(the instantaneous light intensity value of k-th code channel)；Can obtain herein at least one most strong light and a most dim light with
And one group by turning by force weak and light intensity that is growing in strength, for calculating and calibration measurement deviation.
According in this patent background technique described in the prior art, photoelectric encoder chip used at present, photoelectric coding
There was only test photosensitive unit described in application documents on chip, be not provided with calibration photosensitive components, solves only and comparing reason
(light source uses micro- auxiliary etc. using high-grade material, equipment technique using high standard device, code-disc) is opposite under conditions of thinking
More stable and subtly output position information, therefore the cost of encoder is caused can not have always been high any more；Although height is protected at instinct
Photoelectric encoder precision is demonstrate,proved, but with the reduction of time device stability itself is used, while by the environment shadow such as temperature, humidity
It rings, therefore precision can generate deviation, and after the completion of equipping, some factors are difficult to carry out secondary calibration, therefore reality output position
Setting precision will receive influence；And the real-time light intensity test device of photoelectric encoder disclosed by the invention, it is photosensitive due to increasing calibration
Component, therefore can measure in real time since disturbing factor and equipment cause the instantaneous most highlight intensity value and most low light intensity changed
Value can obtain the much higher location information of precision by calculating, and can calibrate due to environmental change by analog-to-digital conversion
And equipment deviation causes the inaccurate parameter situation obtained, so that photoelectric encoder is kept accuracy, in addition, the invention is so that by light
Source and photoelectric encoder chip are assemblied in the ipsilateral of the optical code disk, and grating, which is made into reflecting surface, more has feasibility, to make
Encoder is adapted to more Space configuration demands, therefore has clear advantage.
In addition, the disclosed real-time light intensity test device of photoelectric encoder also has following supplementary technology special according to the present invention
Sign:
Further, having M(M on the optical code disk is positive integer, and above-mentioned K value is less than or equal to the positive integer of M) a code channel (by
The grating stripe that adjacent grating is formed), the fan-shaped structure distribution of grating on the code channel, the grating along code channel direction
Width on width and same code channel between adjacent gratings is equal.
Further, the photosensitive unit shape of the photoelectric encoder chip be centered on the center of circle of the optical code disk into
The sector of row arrangement.
Further, it is same to be less than or equal to any one for the width of photosurface of the calibration photosensitive components along code channel direction
The width of one screen periods of code channel；The photosensitive unit is silicon photocell and other photocells, and is the identical (shape of shape
It is identical to refer to that size and shape are completely the same) sector structure or similar sector structure.
Further, a photosensitive unit satisfaction of the N (N is more than or equal to 4 positive integer) can be in a grating
Starting side to the width of a cycle of the starting side of adjacent gratings in, can at least perceive by by force to weak turn in the presence of one
The photosensitive unit of change and one can perceive the photosensitive unit for the transformation that grows from weak to strong.
Further, when N is equal to 4, the overall width of 4 wide photosensitive units is equal to the grating
Originate side to adjacent gratings originate side a cycle width.
Further, the instantaneous θ that is measured after calibration is by Vx(K)=(Vmax(K)- Vmin(K)) Sin θ acquisition, it can be further
θ value is found out using Taylor's formula.
Further, the light source includes infrared LED and other light sources.
Further, when light source is transmitted light source, the code channel is identical by shape, the light transmission that is alternately present and opaque
The grating composition that region is formed, center being equidistant to the shaft center of circle of the grating region；Transmitted light source with it is described
Photoelectric encoder chip is in the two sides of the optical code disk.
Further, when light source is reflection source, the code channel is identical by shape, it is reflective and non-reflective to be alternately present
The grating composition that region is formed, center being equidistant to the shaft center of circle of the grating region；Reflection source with it is described
Photoelectric encoder chip is in the same side of the optical code disk.
The additional aspect of the present invention and advantage will be set forth in part in the description, and will partially become from the following description
Obviously, or practice through the invention is recognized.
Detailed description of the invention
Above-mentioned and/or additional aspect of the invention and advantage will become from the following description of the accompanying drawings of embodiments
Obviously and it is readily appreciated that, in which:
Fig. 1 is the real-time light intensity structure of the detecting device schematic diagram of photoelectric encoder according to the present invention；
Fig. 2 is the schematic diagram of photoelectric encoder chip according to an embodiment of the invention.
In figure, 1 is transmitted light source, and 2 be optical code disk, and 3 be shaft, and 4 be code channel, and 5 be test photosensitive unit, and 6 be calibration light
Quick component, 601 be calibration photosensitive unit A, and 602 be calibration photosensitive unit B, and 603 be calibration photosensitive unit C, and 604 be that calibration is photosensitive
Cells D, 7 be data acquisition module, and 8 be data processing module, and 9 be terminal control module, and 10 be reflection source.
Specific embodiment
The embodiment of the present invention is described below in detail, examples of the embodiments are shown in the accompanying drawings, wherein from beginning to end
Same or similar label indicates same or similar element or element with the same or similar functions.Below with reference to attached
The embodiment of figure description is exemplary, and for explaining only the invention, and is not construed as limiting the claims.
In the description of the present invention, it is to be understood that, term " on ", "lower", "bottom", "top", "front", "rear",
The orientation or positional relationship of the instructions such as "inner", "outside", " cross ", " perpendicular " is to be based on the orientation or positional relationship shown in the drawings, and is only
For the convenience of describing the present invention and simplifying the description, rather than the device or element of indication or suggestion meaning must have specific side
Position is constructed and operated in a specific orientation, therefore is not considered as limiting the invention.
In the description of the present invention, it should be noted that unless otherwise clearly defined and limited, term " connection " " connects
It is logical ", " connected ", " connection ", " cooperation " shall be understood in a broad sense, for example, it may be being fixedly connected, be integrally connected, be also possible to
It is detachably connected；It can be the connection inside two elements；It can be directly connected, the indirect phase of intermediary can also be passed through
Even；" cooperation " can be the cooperation in face and face, be also possible to the cooperation a little with face or line and face, also include the cooperation of hole axle, right
For those skilled in the art, the concrete meaning of above-mentioned term in the present invention can be understood with concrete condition.
Inventive concept of the invention is as follows, calibrates photosensitive components by increasing, therefore can measure in real time due to disturbing factor
The instantaneous most highlight intensity value and most low light intensity value for causing variation with equipment can be obtained by analog-to-digital conversion by calculating
Accurate location information is obtained, can calibrate since environmental change and equipment deviation cause the inaccurate parameter situation obtained, make light
Photoelectric coder keeps accuracy, furthermore it is possible to which light source and photoelectric encoder chip to be assembled to ipsilateral, the grating in the optical code disk
It is made into reflecting surface, to adapt to more Space configuration demands, therefore there is clear advantage.
Relative position of the invention is described below with reference to accompanying drawings, wherein Fig. 1 is photoelectric encoder according to the present invention
Real-time light intensity structure of the detecting device schematic diagram；Fig. 2 is the signal of photoelectric encoder chip according to an embodiment of the invention
Figure.
As shown in Figure 1, according to an embodiment of the invention, the real-time light intensity test device of the photoelectric encoder include light source 1,
Optical code disk 2 and photoelectric encoder chip；The light source 1 shows for the position of transmitted light source or reflection source 10(such as Fig. 1 reflection source
It is intended to, position is set according to the design needs)；When light source 1 is transmitted light source, the light source 1 is mounted on the one of the optical code disk 2
Side, the photoelectric encoder chip are mounted on the light other side (as shown in Figure 1) of the optical code disk 2；When light source 1 is reflected light
When source 10, the reflection source 10 with fill light the same side that the photoelectric encoder chip is mounted on the optical code disk；It is described
Photoelectric coding chip includes test photosensitive unit 5 and calibration photosensitive components 6；It include grating and code channel 4, institute on the optical code disk 2
The fan-shaped structure of grating is stated to be evenly distributed on the code channel；The calibration photosensitive components 6 include N number of photosensitive unit, are such as implemented
Example in N=4 be include calibration photosensitive unit A601, calibration photosensitive unit B602, calibration photosensitive unit C603 and calibrate photosensitive unit
Tetra- photosensitive units of D604；The overall width along code channel direction of the calibration photosensitive unit is less than or equal to any one screen periods
Width along code channel direction；The installation of the calibration photosensitive unit is needed to meet and can be arrived in the starting side of a grating
In the width of a cycle of the starting side of adjacent gratings, instantaneous largest light intensity amplitude extremum can be perceived by least having one
Vmax(K)Photosensitive unit and one can perceive instantaneous minimum intensity of light extreme value Vmin(K)Photosensitive unit；The test photosensitive unit
5 are denoted as Vx for detecting instantaneous light intensity value(K)。
According in this patent background technique described in the prior art, photoelectric encoder chip used at present, photoelectric coding
There was only test photosensitive unit described in application documents on chip, be not provided with calibration photosensitive components, solves only and comparing reason
(light source uses micro- auxiliary etc. using high-grade material, equipment technique using high standard device, code-disc) is opposite under conditions of thinking
More stable and subtly output position information, therefore the cost of encoder is caused can not have always been high any more；Although height is protected at instinct
Photoelectric encoder precision is demonstrate,proved, but with the reduction of time device stability itself is used, while by the environment shadow such as temperature, humidity
Therefore sound, precision can again result in deviation, and after the completion of equipping, some factors are to be difficult to carry out secondary calibration, therefore reality
Output position precision will receive influence；
And the real-time light intensity test device of photoelectric encoder disclosed by the invention can be real due to increasing calibration photosensitive components
When measure since disturbing factor and equipment cause the instantaneous most highlight intensity value and most low light intensity value of variation, by modulus turn
It changes, the much higher accurate location information of precision can be obtained by calculating, and can calibrate due to environmental change and equipment
Deviation causes the inaccurate parameter situation obtained, and photoelectric encoder is made to keep accuracy；In addition, present invention can ensure that position is smart
Degree is no longer influenced by light intensity variation, and LED can downgrade, and luminous efficiency caused by LED aging, which reduces, no longer influences encoder
Precision reduces, and alignment error no longer influences the calculating of phase, and assembly precision can degrade without influencing measurement accuracy, therefore have
Clear advantage.
In addition, the real-time light intensity test device of photoelectric encoder disclosed according to the present invention also has following supplementary technology special
Sign:
According to some embodiments of the present invention, having M(M on the optical code disk is positive integer, and above-mentioned K value is just less than or equal to M
Integer) a code channel (grating stripe formed by adjacent grating), the fan-shaped structure distribution of grating is on the code channel, the grating
The width and same code channel along code channel direction on width between adjacent gratings it is equal.
According to some embodiments of the present invention, the photosensitive unit shape of the photoelectric encoder chip is with the optical code disk
The center of circle centered on the sector that is arranged.
According to some embodiments of the present invention, the width of the photosurface of the calibration photosensitive components along code channel direction is less than etc.
In the width of a screen periods of any one same code channel；The photosensitive unit be silicon photocell and other photocells, and
For the sector structure or similar sector structure of shape identical (shape is identical to refer to that size and shape are completely the same).
According to some embodiments of the present invention, a photosensitive unit satisfaction of the N (N is more than or equal to 4 positive integer) can
In the width of a cycle of the starting side of the starting side of a grating to adjacent gratings, at least there is an energy
Perceive the photosensitive unit by the transformation that grows from weak to strong can be perceived to the photosensitive unit of weak transformation and one by force.
According to some embodiments of the present invention, when N is equal to 4, the overall width of 4 wide photosensitive units is equal to
The starting side of one grating to adjacent gratings a cycle for originating side width, it is non-on a screen periods
The face of penetrating component or non-reflector segment is identical with the form and dimension of its corresponding penetration surface or reflective surface.
According to some embodiments of the present invention, the instantaneous θ that is measured after calibration is by Vx(K)=(Vmax(K)- Vmin(K)) Sin
θ is obtained, and further can find out θ value using Taylor's formula, when an only code channel, each parameter is denoted as Vx(K)、Vmax(K)With
Vmax(K)Corresponding several Vx Vmax and Vmax.
According to some embodiments of the present invention, the light source includes infrared LED and other light sources.
According to some embodiments of the present invention, when light source is transmitted light source, the code channel is identical by shape, is alternately present
Light transmission and light tight region formed grating composition, center being equidistant to the shaft center of circle of the grating region；
Transmitted light source and the photoelectric encoder chip are in the two sides of the optical code disk.
According to some embodiments of the present invention, when light source is reflection source, the code channel is identical by shape, is alternately present
Reflective and non-reflective region formed grating composition, center being equidistant to the shaft center of circle of the grating region；
Reflection source and the photoelectric encoder chip are in the same side of the optical code disk.
It is any to refer to that " one embodiment ", " embodiment ", " illustrative examples " etc. mean to combine embodiment description
Specific component, structure or feature are included at least one embodiment of the present invention.This specification everywhere this schematically
Statement is not necessarily referring to identical embodiment.Moreover, when combining any embodiment to describe specific component, structure or feature
When, advocated, component, structure or feature in conjunction with as the realization of other embodiments all fall within those skilled in the art
Within the scope of.
Although having carried out detailed retouch to a specific embodiment of the invention referring to multiple illustrative examples of the invention
It states, it must be understood that those skilled in the art can be designed that various other improvement and embodiment, these improve and implement
Example will be fallen within spirit and scope.Specifically, in aforementioned disclosure, attached drawing and the scope of the claims
Within, reasonable variations and modifications can be made in terms of the arrangement that components and/or sub-combination are laid out, without departing from
Spirit of the invention.In addition to components and/or the variations and modifications of layout aspect, range is by appended claims and its is equal
Object limits.
Claims (9)
1. a kind of real-time light intensity test device of photoelectric encoder characterized by comprising light source, optical code disk and photoelectric encoder
Chip；
The light source is transmitted light source or reflection source；When light source is transmitted light source, the transmitted light source is mounted on the light
The side of code-disc, the photoelectric encoder chip are mounted on the other side of the optical code disk；It is described when light source is reflection source
Reflection source and the photoelectric encoder chip are mounted on the same side of the optical code disk；
The photoelectric coding chip includes test photosensitive unit and calibration photosensitive components；It include code channel on the optical code disk；It is described
Testing photosensitive unit includes one or more test photosensitive units, and the test photosensitive unit is arranged along code channel direction；The school
Quasi- photosensitive components include N (N minimum takes 4) a calibration photosensitive unit；
The mounting condition of the calibration photosensitive components: needing to meet can be in the starting side of a grating of code channel to phase
In the width of a cycle of the starting side of adjacent grating, instantaneous largest light intensity amplitude extremum Vmax can be perceived by least having one
Photosensitive unit and a photosensitive unit that can perceive instantaneous minimum intensity of light extreme value Vmin；The test photosensitive unit is for detecting
Instantaneous light intensity value is denoted as Vx.
2. real-time light intensity test device according to claim 1, which is characterized in that have on the optical code disk M code channel (by
The grating stripe that adjacent grating is formed), the fan-shaped structure distribution of grating on the code channel, the grating along code channel direction
Width on width and same code channel between adjacent gratings is equal.
3. the real-time light intensity test device of photoelectric encoder according to claim 1, which is characterized in that the photoelectric encoder
The photosensitive unit shape of chip is the sector arranged centered on the center of circle of the optical code disk.
4. the real-time light intensity test device of photoelectric encoder according to claim 1, which is characterized in that photosensitive group of the calibration
Part is less than or equal to the width of a screen periods of any one same code channel along the width of the photosurface in code channel direction；The sense
Light unit is silicon photocell and other photocells, and is the identical sector structure of shape or similar sector structure.
5. the real-time light intensity test device of photoelectric encoder according to claim 1, which is characterized in that the N (N be greater than
Equal to 4 positive integer) a photosensitive unit satisfaction can be in the starting side to the starting side of adjacent gratings of a grating
A cycle width in, at least exist one can perceive by by force to the photosensitive unit of weak transformation and one can perceive by it is weak to
The photosensitive unit changed by force.
6. the real-time light intensity test device of photoelectric encoder according to claim 5, which is characterized in that when N is equal to 4,4
The overall width of the wide photosensitive unit is equal to the starting side to the starting side of adjacent gratings of the grating
The width of a cycle.
7. the real-time light intensity test device of photoelectric encoder according to claim 1, which is characterized in that the light source includes red
Outer LED and other light sources.
8. the real-time light intensity test device of photoelectric encoder according to claim 1, which is characterized in that when light source is transmitted light
The grating that the light transmission and light tight region that when source, the code channel is identical by shape, is alternately present are formed forms, the grating region
Center being equidistant to the shaft center of circle；Transmitted light source and the photoelectric encoder chip are the two of the optical code disk
Side.
9. the real-time light intensity test device of photoelectric encoder according to claim 1, which is characterized in that when light source is reflected light
The grating that the reflective and non-reflective region that when source, the code channel is identical by shape, is alternately present is formed forms, the grating region
Center being equidistant to the shaft center of circle；Reflection source is with the photoelectric encoder chip in the same of the optical code disk
Side.
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113834507A (en) * | 2021-09-18 | 2021-12-24 | 广东电网有限责任公司 | Code disc type disconnecting link state laser monitoring device |
| CN114460530A (en) * | 2022-02-14 | 2022-05-10 | 京信通信技术(广州)有限公司 | Antenna direction finding device and method |
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| US20120205528A1 (en) * | 2011-02-15 | 2012-08-16 | Avago Technologies Ecbu Ip (Singapore) Pte. Ltd. | Three-channel encoder using a single optical track |
| US20160209246A1 (en) * | 2015-01-21 | 2016-07-21 | Mitutoyo Corporation | Encoder |
| CN209027671U (en) * | 2018-07-23 | 2019-06-25 | 上海滕莘电子科技有限公司 | A kind of real-time light intensity test device of photoelectric encoder |
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| CN113834507A (en) * | 2021-09-18 | 2021-12-24 | 广东电网有限责任公司 | Code disc type disconnecting link state laser monitoring device |
| CN113834507B (en) * | 2021-09-18 | 2023-12-19 | 广东电网有限责任公司 | Code disc type knife switch state laser monitoring device |
| CN114460530A (en) * | 2022-02-14 | 2022-05-10 | 京信通信技术(广州)有限公司 | Antenna direction finding device and method |
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