CN110137221A - Verify structure and preparation method thereof - Google Patents
Verify structure and preparation method thereof Download PDFInfo
- Publication number
- CN110137221A CN110137221A CN201910345960.4A CN201910345960A CN110137221A CN 110137221 A CN110137221 A CN 110137221A CN 201910345960 A CN201910345960 A CN 201910345960A CN 110137221 A CN110137221 A CN 110137221A
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- Prior art keywords
- defining layer
- pixel defining
- detection
- opening
- forming
- Prior art date
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Links
- 238000002360 preparation method Methods 0.000 title abstract 3
- 238000001514 detection method Methods 0.000 claims abstract description 55
- 238000007789 sealing Methods 0.000 claims abstract description 28
- 239000000758 substrate Substances 0.000 claims abstract description 18
- 238000012795 verification Methods 0.000 claims description 36
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 35
- 239000010408 film Substances 0.000 claims description 23
- 239000011368 organic material Substances 0.000 claims description 23
- 238000000034 method Methods 0.000 claims description 16
- 239000000463 material Substances 0.000 claims description 14
- 229910010272 inorganic material Inorganic materials 0.000 claims description 11
- 239000011147 inorganic material Substances 0.000 claims description 11
- 238000004519 manufacturing process Methods 0.000 claims description 9
- 238000007641 inkjet printing Methods 0.000 claims description 7
- 238000007650 screen-printing Methods 0.000 claims description 7
- 239000010409 thin film Substances 0.000 claims description 7
- 239000004593 Epoxy Substances 0.000 claims description 6
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 claims description 6
- GVPFVAHMJGGAJG-UHFFFAOYSA-L cobalt dichloride Chemical compound [Cl-].[Cl-].[Co+2] GVPFVAHMJGGAJG-UHFFFAOYSA-L 0.000 claims description 6
- 239000002131 composite material Substances 0.000 claims description 6
- 229910000365 copper sulfate Inorganic materials 0.000 claims description 6
- ARUVKPQLZAKDPS-UHFFFAOYSA-L copper(II) sulfate Chemical compound [Cu+2].[O-][S+2]([O-])([O-])[O-] ARUVKPQLZAKDPS-UHFFFAOYSA-L 0.000 claims description 6
- 238000007639 printing Methods 0.000 claims description 6
- PFUVRDFDKPNGAV-UHFFFAOYSA-N sodium peroxide Chemical compound [Na+].[Na+].[O-][O-] PFUVRDFDKPNGAV-UHFFFAOYSA-N 0.000 claims description 6
- 239000007921 spray Substances 0.000 claims description 3
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 7
- 229910052760 oxygen Inorganic materials 0.000 description 7
- 239000001301 oxygen Substances 0.000 description 7
- 239000002184 metal Substances 0.000 description 4
- 229910052751 metal Inorganic materials 0.000 description 4
- 230000009545 invasion Effects 0.000 description 3
- 238000012360 testing method Methods 0.000 description 3
- 238000005538 encapsulation Methods 0.000 description 2
- 238000012544 monitoring process Methods 0.000 description 2
- 239000000843 powder Substances 0.000 description 2
- 229920002972 Acrylic fiber Polymers 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/80—Constructional details
- H10K50/84—Passivation; Containers; Encapsulations
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/80—Constructional details
- H10K50/84—Passivation; Containers; Encapsulations
- H10K50/842—Containers
- H10K50/8426—Peripheral sealing arrangements, e.g. adhesives, sealants
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/12—Active-matrix OLED [AMOLED] displays
- H10K59/122—Pixel-defining structures or layers, e.g. banks
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
Landscapes
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Electroluminescent Light Sources (AREA)
Abstract
The present invention provides a kind of verifying structure and preparation method thereof for verifying the leakproofness of OLED display panel.The verifying structure includes: substrate；Pixel defining layer, the pixel defining layer are located on the substrate, and the pixel defining layer has at least one opening；Steam detection structure, the steam detection structure are located in the opening of the pixel defining layer；Sealing structure, the sealing structure covers the pixel defining layer and steam detection structure, and constitutes seal chamber with institute's pixel defining layer.Verifying structure provided by the invention and preparation method thereof can reduce the cost of leakproofness verifying in the prior art, improve the accuracy of leakproofness verifying in the prior art.
Description
Technical Field
The invention relates to the field of electronic display, in particular to a verification structure and a manufacturing method thereof.
Background
The light emitting structure of the OLED display panel is very sensitive to water and oxygen, and a trace amount of water and oxygen can damage the organic light emitting material in the light emitting structure, affecting the performance and the service life of the display panel. Therefore, the OLED display panel needs to be tightly packaged, and the packaging structure needs to be verified.
The existing verification method comprises the following steps: the packaged OLED display panel works in a high-temperature and high-humidity environment, and the lighting and defect conditions of OLED devices under different environmental conditions are recorded. The cost of this verification method is relatively high due to the high cost of organic light emitting materials. Meanwhile, the light-up condition of the OLED device cannot be influenced by the invasion of trace water and oxygen, so that the detection method can easily ignore the tiny invasion path of the water and oxygen. In addition, this method cannot acquire the invasion path of water and oxygen, so that a targeted improvement cannot be taken.
In view of the foregoing, it is desirable to provide a more economical and efficient method for verifying the sealing condition of the display panel.
Disclosure of Invention
The invention provides a verification structure and a manufacturing method thereof, which aim to reduce the cost of the sealing verification in the prior art and improve the accuracy of the sealing verification in the prior art.
To solve the above problems, the present invention provides a verification structure for verifying the sealability of an OLED display panel, comprising:
a substrate;
a pixel defining layer on the substrate, the pixel defining layer having at least one opening;
the water vapor detection structure is positioned in the opening of the pixel defining layer;
and the sealing structure covers the pixel defining layer and the water vapor detection structure and forms a sealing cavity together with the pixel defining layer.
According to one aspect of the invention, the moisture detecting structure comprises a detection film, wherein the material of the detection film has the property of changing color when meeting water.
According to one aspect of the present invention, the material forming the detection thin film is a composite of an organic material and an inorganic material; wherein,
the inorganic material comprises one or more of anhydrous copper sulfate, anhydrous cobalt chloride and sodium peroxide;
the organic material comprises one or a combination of two of acrylic organic materials or epoxy organic materials.
According to one aspect of the present invention, the moisture detection structure further comprises a support, and the detection film covers a surface of the support exposed outside the opening of the pixel defining layer.
According to one aspect of the invention, the method for attaching the detection film to the surface of the support body is electrofluid spraying, ink-jet printing or screen printing.
According to one aspect of the present invention, the number of openings on the pixel defining layer is one; wherein the area of the opening is equal to the area of the display region in the OLED display panel corresponding to the verification structure.
According to one aspect of the present invention, the number of the openings on the pixel defining layer is plural; wherein the number of the openings is equal to the number of pixel points in a display area in the OLED display panel corresponding to the verification structure; the area of each opening is equal to the area of one pixel point in the display area of the OLED display panel corresponding to the verification structure.
Correspondingly, the invention also provides a manufacturing method of the verification structure, wherein the verification structure is used for verifying the sealing performance of the OLED display panel, and the method is characterized by comprising the following steps:
providing a substrate;
forming a pixel defining layer on the substrate, and forming at least one opening on the pixel defining layer;
forming a water vapor detection structure in the opening of the pixel defining layer;
and forming a sealing structure covering the pixel defining layer and the water vapor detection structure, wherein the sealing structure and the pixel defining layer form a sealing cavity.
According to one aspect of the invention, a method of forming the moisture detection structure comprises:
forming a support in the opening of the pixel defining layer;
and forming a detection film on the surface of the support body exposed out of the opening by electrofluid spray printing, ink-jet printing or screen printing.
According to one aspect of the present invention, the material forming the detection thin film is a composite of an organic material and an inorganic material; wherein,
the inorganic material comprises one or more of anhydrous copper sulfate, anhydrous cobalt chloride and sodium peroxide;
the organic material comprises one or a combination of two of acrylic organic materials or epoxy organic materials.
The verification structure provided by the invention adopts a water vapor detection structure to replace a light-emitting structure and part of a control circuit of the OLED display panel, so that the cost of the verification structure is greatly reduced. Meanwhile, the water vapor detection structure is very sensitive to moisture. Compare in OLED display panel, vapor monitoring structure not only can detect out that tiny vapor reveals, the sign that simultaneously can be accurate shows position and route that vapor revealed. The method and the device are convenient for technicians to optimize and repair the leaked sealing structure in a targeted manner, and greatly improve the reference significance of the detection result.
Drawings
FIG. 1 is a cross-sectional view of a prior art display panel;
FIG. 2 is a top view of a prior art display panel;
FIG. 3 is a partially enlarged schematic view of the display panel of FIG. 1;
FIG. 4 is a cross-sectional view of a display panel in an embodiment of the invention;
FIG. 5 is a top view of a display panel in an embodiment of the invention;
fig. 6 is a partially enlarged schematic view of the display panel in fig. 4.
Detailed Description
The following description of the various embodiments refers to the accompanying drawings that illustrate specific embodiments in which the invention may be practiced. The directional terms mentioned in the present invention, such as [ upper ], [ lower ], [ front ], [ rear ], [ left ], [ right ], [ inner ], [ outer ], [ side ], are only referring to the directions of the attached drawings. Accordingly, the directional terms used are used for explanation and understanding of the present invention, and are not used for limiting the present invention. In the drawings, elements having similar structures are denoted by the same reference numerals.
The prior art will first be briefly described. Referring to fig. 1 to 3, fig. 1 is a cross-sectional view of a display panel in the prior art, fig. 2 is a top view of the display panel in the prior art, and fig. 3 is a partially enlarged schematic view of the display panel in fig. 1.
In the prior art, when the sealing performance of the OLED display panel is tested, the OLED display panel is directly placed in a specific environment with certain humidity for detection. Referring to fig. 1, the OLED display panel generally includes a substrate 10, a control circuit 20 positioned over the substrate 10, a light emitting layer 30 positioned over the control circuit, and an encapsulation structure 40 covering the light emitting structure. The encapsulation structure 40 includes a first inorganic film 42, a first organic film 44, and a second inorganic film 46.
Specifically, the control circuit 20 is a thin film transistor layer, and a structure diagram of the thin film transistor layer is shown in fig. 3, and includes a substrate 200, an edge region 210 located above the substrate 200, a first gate dielectric layer 220 covering the edge region, a first gate metal layer 230 located above the first gate dielectric layer 220, a second gate dielectric layer 240 covering the first gate metal layer, a second gate metal layer 250 located above the second gate dielectric layer 240, a planarization layer 260 covering the second gate metal layer 250, a source-drain electrode 270 penetrating through the first gate dielectric layer 220, the second gate dielectric layer 240 and the planarization layer 260, a pixel definition layer 280 covering the source-drain electrode 270 and having an opening exposing the source-drain electrode 270, and an anode 290 electrically connected to the source-drain electrode 270 through the opening. The light emitting layer 30 is positioned over the anode 290.
The direct use of the OLED display panel for the sealing test has the following problems:
1. the OLED circuit structure after testing is damaged and cannot be used, so that the testing cost is high and the waste is serious.
2. The reaction of the OLED panel to the water vapor lags, and the tiny water vapor leakage condition cannot be detected.
3. Steam reveals can lead to partial pixel can't light, and the pixel that can't light can only roughly explain the position of revealing, and the unable accuracy is marked revealing the route, is unfavorable for later stage to optimize panel structure.
In view of the above problems, the present invention provides a verification structure and a manufacturing method thereof to reduce the cost of the sealing verification in the prior art and improve the accuracy of the sealing verification in the prior art.
The present invention will be described in detail below with reference to the accompanying drawings.
Referring to fig. 4 to 6, fig. 4 is a cross-sectional view of a display panel according to an embodiment of the present invention, fig. 5 is a top view of the display panel according to an embodiment of the present invention, and fig. 6 is a partially enlarged schematic view of the display panel in fig. 4.
The present invention provides a verification structure for verifying the sealability of an OLED display panel, comprising:
a substrate 10;
a pixel defining layer 20, the pixel defining layer 20 being located on the substrate 10, the pixel defining layer 20 having at least one opening;
a moisture detection structure 50, wherein the moisture detection structure 50 is located in the opening of the pixel defining layer 20;
a sealing structure 40, the sealing structure 40 covering the pixel defining layer 20 and the moisture detecting structure 50 and constituting a sealing cavity with the pixel defining layer 20.
In this embodiment, the water vapor detection structure 50 includes a detection film formed of a material that changes color upon water. The material forming the detection thin film may be a composite of an organic material and an inorganic material. The inorganic material includes, but is not limited to, one or more of anhydrous copper sulfate (white to blue upon water), anhydrous cobalt chloride (white to powder upon water), and sodium peroxide (white to yellow upon water). The organic material includes, but is not limited to, acrylic or epoxy organic materials, or combinations thereof.
Because the cost of the water-color-changing material is relatively high, preferably, the water vapor detection structure is formed by a support body and a detection film in practice. The support is used for simulating a light emitting structure in an OLED display panel, and the detection film covers a surface of the support exposed outside the opening of the pixel defining layer 20, and is used for detecting leaked water and oxygen.
Preferably, the method for attaching the detection film to the surface of the support body is electrofluid jet printing, ink jet printing or screen printing.
In the present embodiment, the number of the openings on the pixel defining layer 20 is one, and as shown in fig. 5, the area of the openings is equal to the area of the display region in the OLED display panel corresponding to the verification structure.
In other embodiments, the number of the openings on the pixel definition layer 20 is plural; wherein the number of the openings is equal to the number of pixel points in a display area in the OLED display panel corresponding to the verification structure; the area of each opening is equal to the area of one pixel point in the display area of the OLED display panel corresponding to the verification structure.
Correspondingly, the invention also provides a manufacturing method of the verification structure, wherein the verification structure is used for verifying the sealing performance of the OLED display panel, and the method is characterized by comprising the following steps:
providing a substrate 10;
forming a pixel defining layer 20 on the substrate 10, and forming at least one opening on the pixel defining layer 20;
forming a moisture detection structure 50 in the opening of the pixel defining layer 20;
a sealing structure 40 is formed overlying the pixel defining layer 20 and moisture detecting structure 50, the sealing structure 40 and the pixel defining layer 20 forming a sealed cavity.
Preferably, the method of forming the moisture detecting structure 50 includes:
forming a support in the opening of the pixel defining layer 20;
and forming a detection film on the surface of the support body exposed out of the opening by electrofluid spray printing, ink-jet printing or screen printing.
In this embodiment, the water vapor detection structure 50 includes a detection film formed of a material that changes color upon water. The material for forming the detection film is a composite of an organic material and an inorganic material. The organic material comprises one or more of anhydrous copper sulfate (changing from white to blue when meeting water), anhydrous cobalt chloride (changing from white to powder when meeting water) and sodium peroxide (changing from white to yellow when meeting water). The organic material comprises one or a combination of acrylic or epoxy organic materials, such as acrylic plastic or epoxy resin.
Because the cost of the water-color-changing material is relatively high, preferably, the water vapor detection structure is formed by a support body and a detection film in practice. The support is used for simulating a light emitting structure in an OLED display panel, and the detection film covers a surface of the support exposed outside the opening of the pixel defining layer 20, and is used for detecting leaked water and oxygen.
Preferably, the method for attaching the detection film to the surface of the support body is electrofluid jet printing, ink jet printing or screen printing.
The verification structure provided by the invention adopts a water vapor detection structure to replace a light-emitting structure and part of a control circuit of the OLED display panel, so that the cost of the verification structure is greatly reduced. Meanwhile, the water vapor detection structure is very sensitive to moisture. Compare in OLED display panel, vapor monitoring structure not only can detect out that tiny vapor reveals, the sign that simultaneously can be accurate shows position and route that vapor revealed. The method and the device are convenient for technicians to optimize and repair the leaked sealing structure in a targeted manner, and greatly improve the reference significance of the detection result.
In summary, although the present invention has been described with reference to the preferred embodiments, the above-described preferred embodiments are not intended to limit the present invention, and those skilled in the art can make various changes and modifications without departing from the spirit and scope of the present invention, therefore, the scope of the present invention shall be determined by the appended claims.
Claims (10)
1. A verification structure for verifying a hermeticity of an OLED display panel, the verification structure comprising:
a substrate;
a pixel defining layer on the substrate, the pixel defining layer having at least one opening;
the water vapor detection structure is positioned in the opening of the pixel defining layer;
and the sealing structure covers the pixel defining layer and the water vapor detection structure and forms a sealing cavity together with the pixel defining layer.
2. A verification structure according to claim 1, wherein said moisture-detecting structure comprises a detection film, wherein a material of said detection film has a water-color-change-upon-water property.
3. The authentication structure of claim 2, wherein a material forming the detection thin film is a composite of an organic material and an inorganic material; wherein,
the inorganic material comprises one or more of anhydrous copper sulfate, anhydrous cobalt chloride and sodium peroxide;
the organic material comprises one or a combination of two of acrylic organic materials or epoxy organic materials.
4. The authentication structure of claim 2, wherein the moisture detection structure further comprises a support, and the detection film covers a surface of the support exposed outside the opening of the pixel definition layer.
5. The authentication structure of claim 4, wherein the detection film is attached to the surface of the support by electrohydrodynamic printing, ink-jet printing or screen printing.
6. The authentication structure of claim 1, wherein the number of openings on the pixel definition layer is one; wherein the area of the opening is equal to the area of the display region in the OLED display panel corresponding to the verification structure.
7. The verification structure of claim 1, wherein the number of openings on the pixel definition layer is plural; wherein the number of the openings is equal to the number of pixel points in a display area in the OLED display panel corresponding to the verification structure; the area of each opening is equal to the area of one pixel point in the display area of the OLED display panel corresponding to the verification structure.
8. A method of fabricating a verification structure for verifying the hermeticity of an OLED display panel, the method comprising:
providing a substrate;
forming a pixel defining layer on the substrate, and forming at least one opening on the pixel defining layer;
forming a water vapor detection structure in the opening of the pixel defining layer;
and forming a sealing structure covering the pixel defining layer and the water vapor detection structure, wherein the sealing structure and the pixel defining layer form a sealing cavity.
9. The method of fabricating a verification structure according to claim 8, wherein the method of forming the moisture detection structure comprises:
forming a support in the opening of the pixel defining layer;
and forming a detection film on the surface of the support body exposed out of the opening by electrofluid spray printing, ink-jet printing or screen printing.
10. The method for manufacturing a verification structure according to claim 9, wherein the material forming the detection thin film is a composite of an organic material and an inorganic material; wherein,
the inorganic material comprises one or more of anhydrous copper sulfate, anhydrous cobalt chloride and sodium peroxide;
the organic material comprises one or a combination of two of acrylic organic materials or epoxy organic materials.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910345960.4A CN110137221A (en) | 2019-04-26 | 2019-04-26 | Verify structure and preparation method thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910345960.4A CN110137221A (en) | 2019-04-26 | 2019-04-26 | Verify structure and preparation method thereof |
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| CN110137221A true CN110137221A (en) | 2019-08-16 |
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| CN201910345960.4A Pending CN110137221A (en) | 2019-04-26 | 2019-04-26 | Verify structure and preparation method thereof |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114384715A (en) * | 2021-12-29 | 2022-04-22 | 武汉天马微电子有限公司 | Display panel and display device |
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| CN103292961A (en) * | 2012-12-24 | 2013-09-11 | 上海天马微电子有限公司 | Device and method for detecting packaging effect of organic light emitting diode |
| CN104821376A (en) * | 2015-04-24 | 2015-08-05 | 京东方科技集团股份有限公司 | Organic light emitting diode (OLED) panel, manufacturing method thereof and display device |
| CN106024842A (en) * | 2016-07-26 | 2016-10-12 | 京东方科技集团股份有限公司 | OLED display device and packaging effect maintenance method thereof |
| CN106920892A (en) * | 2017-01-24 | 2017-07-04 | 京东方科技集团股份有限公司 | A kind of encapsulating structure and preparation method thereof |
-
2019
- 2019-04-26 CN CN201910345960.4A patent/CN110137221A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103292961A (en) * | 2012-12-24 | 2013-09-11 | 上海天马微电子有限公司 | Device and method for detecting packaging effect of organic light emitting diode |
| CN104821376A (en) * | 2015-04-24 | 2015-08-05 | 京东方科技集团股份有限公司 | Organic light emitting diode (OLED) panel, manufacturing method thereof and display device |
| CN106024842A (en) * | 2016-07-26 | 2016-10-12 | 京东方科技集团股份有限公司 | OLED display device and packaging effect maintenance method thereof |
| CN106920892A (en) * | 2017-01-24 | 2017-07-04 | 京东方科技集团股份有限公司 | A kind of encapsulating structure and preparation method thereof |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN114384715A (en) * | 2021-12-29 | 2022-04-22 | 武汉天马微电子有限公司 | Display panel and display device |
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Application publication date: 20190816 |