CN110134116B - Lock control plate testing method, device and tool - Google Patents
Lock control plate testing method, device and tool Download PDFInfo
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- CN110134116B CN110134116B CN201910492894.3A CN201910492894A CN110134116B CN 110134116 B CN110134116 B CN 110134116B CN 201910492894 A CN201910492894 A CN 201910492894A CN 110134116 B CN110134116 B CN 110134116B
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- 238000012360 testing method Methods 0.000 title claims abstract description 114
- 238000004891 communication Methods 0.000 claims abstract description 49
- 238000000034 method Methods 0.000 claims abstract description 16
- 230000009286 beneficial effect Effects 0.000 abstract description 2
- 230000002159 abnormal effect Effects 0.000 description 20
- 238000001514 detection method Methods 0.000 description 8
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0208—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the configuration of the monitoring system
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Abstract
The invention discloses a method, a device and a tool for testing a lock control plate, wherein the method for testing the lock control plate is applied to the test tool, the test tool comprises a control unit, and the method comprises the following steps executed by the control unit: establishing communication connection with the lock control plate; and after sending a control instruction to the lock control plate, acquiring the current state of the lock control plate, judging whether the current state of the lock control plate is matched with the control information carried by the control instruction, obtaining a judgment result, and judging whether the lock control plate is normal according to the judgment result. The invention has the beneficial effects that: the test tool and the method applied to the test tool are used for testing the lock control plate, so that the test efficiency of the lock control plate is greatly improved, the problems of low speed, troublesome operation, high possibility of error and large occupied space during the test of the lock control plate are solved, and the production efficiency and the yield of the lock control plate are greatly improved.
Description
Technical Field
The invention relates to the technical field of lock control plates, in particular to a method, a device and a tool for testing a lock control plate.
Background
In public places such as supermarkets, hospitals and schools, intelligent lockers are widely applied, a lock control plate is required to be used for controlling a cabinet door of the intelligent locker, and the last step of lock control plate production is testing.
Disclosure of Invention
Based on the problems in the prior art, the invention provides a lock control plate testing method, a lock control plate testing device and a lock control plate testing tool.
The invention provides a lock control plate testing method, which is applied to a testing tool, wherein the testing tool comprises a control unit, and the method comprises the following steps executed by the control unit:
establishing communication connection with the lock control plate;
and after sending a control instruction to the lock control plate, acquiring the current state of the lock control plate, judging whether the current state of the lock control plate is matched with control information carried by the control instruction, obtaining a judgment result, and judging whether the lock control plate is normal according to the judgment result.
Further, after sending the control instruction to the lock control plate, acquiring the current state of the lock control plate, judging whether the current state of the lock control plate is matched with the control information carried by the control instruction, obtaining a judgment result, and judging whether the lock control plate is normal according to the judgment result, wherein the step of:
sending a first control instruction of an output signal to the lock control plate;
acquiring the current output state of the lock control plate lattice output pin, and judging whether the current output state of the output pin is matched with the control information of the output signal carried by the first control instruction or not to obtain a first judgment result;
and judging whether the grid output pin of the lock control plate is normal or not according to the first judgment result.
Further, after sending the control instruction to the lock control plate, acquiring the current state of the lock control plate, judging whether the current state of the lock control plate is matched with the control information carried by the control instruction, obtaining a judgment result, and judging whether the lock control plate is normal according to the judgment result, wherein the step of:
sending a second control instruction for changing the dial switch value to the lock control plate;
acquiring a current dial switch value of the lock control plate, and judging whether the current dial switch value is matched with control information for changing the dial switch value carried by the second control instruction, so as to obtain a second judgment result;
and judging whether the dial switch of the lock control plate is normal or not according to the second judgment result.
Further, after sending the control instruction to the lock control plate, acquiring the current state of the lock control plate, judging whether the current state of the lock control plate is matched with the control information carried by the control instruction, obtaining a judgment result, and judging whether the lock control plate is normal according to the judgment result, wherein the step of:
sending a third control instruction for changing the temperature value to the lock control plate;
acquiring the current temperature value of the lock control plate, and judging whether the current temperature value is matched with the control information of the changed temperature value carried by the third control instruction to obtain a third judgment result;
and judging whether the temperature module of the lock control plate is normal or not according to the third judgment result.
Further, the step of establishing communication connection with the lock control plate comprises:
sending a test instruction to the lock control plate;
detecting whether response information of the lock control plate is received;
and when the response information of the lock control plate is received, judging that the communication interface of the lock control plate is normal and establishing communication connection with the lock control plate.
The invention also provides a lock control plate testing device, which is configured on the control unit of the testing tool and comprises:
the communication unit is used for establishing communication connection with the lock control plate;
and the judging unit is used for acquiring the current state of the lock control plate after sending a control instruction to the lock control plate, judging whether the current state of the lock control plate is matched with the control information carried by the control instruction to obtain a judgment result, and judging whether the lock control plate is normal according to the judgment result.
Further, the judging unit includes:
the first sending module is used for sending a first control instruction of an output signal to the lock control plate;
the first judgment module is used for acquiring the current output state of the lock control panel grid output pin, judging whether the current output state of the output pin is matched with the control information of the output signal carried by the first control instruction or not, and obtaining a first judgment result;
and the first testing module is used for judging whether the grid output pin of the lock control plate is normal or not according to the first judgment result.
Further, the judging unit includes:
the second sending module is used for sending a second control instruction for changing the dial switch value to the lock control plate;
the second judgment module is used for acquiring the current dial switch value of the lock control plate, judging whether the current dial switch value is matched with the control information for changing the dial switch value carried by the second control instruction or not and obtaining a second judgment result;
and the second testing module is used for judging whether the dial switch of the lock control plate is normal or not according to the second judgment result.
Further, the judging unit includes:
the third sending module is used for sending a third control instruction for changing the temperature value to the lock control plate;
the third judging module is used for acquiring the current temperature value of the lock control plate, judging whether the current temperature value is matched with the control information of the temperature changing value carried by the third control instruction, and obtaining a third judging result;
and the third testing module is used for judging whether the temperature module of the lock control plate is normal or not according to the third judgment result.
The invention further provides a test tool which comprises any one of the lock control plate test devices.
The invention has the beneficial effects that: the test tool and the method applied to the test tool are used for testing the lock control plate, so that the test efficiency of the lock control plate is greatly improved, the problems of low speed, troublesome operation, high possibility of error and large occupied space during the test of the lock control plate are solved, and the production efficiency and the yield of the lock control plate are greatly improved.
Drawings
Fig. 1 is a schematic block diagram of a test fixture according to an embodiment of the present invention;
FIG. 2 is a schematic flow chart of a lock control plate testing method according to an embodiment of the present invention;
FIG. 3 is a schematic block diagram of a lock control board testing device according to an embodiment of the present invention;
FIG. 4 is a schematic block diagram of a lock control panel testing device according to another embodiment of the present invention;
FIG. 5 is a schematic block diagram of a lock control panel testing device according to another embodiment of the present invention;
FIG. 6 is a schematic block diagram of a lock control panel testing apparatus according to still another embodiment of the present invention;
fig. 7 is a schematic block diagram of a lock control panel testing apparatus according to still another embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
In addition, the descriptions related to "first", "second", etc. in the present invention are only for descriptive purposes and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In addition, technical solutions between various embodiments may be combined with each other, but must be realized by a person skilled in the art, and when the technical solutions are contradictory or cannot be realized, such a combination should not be considered to exist, and is not within the protection scope of the present invention.
Referring to fig. 2, fig. 2 is a schematic flow chart of a method for testing a lock control board according to an embodiment of the present invention, in this embodiment, the method is applied to a test fixture, and as shown in fig. 1, the test fixture includes a display screen 50, a communication interface 20, a control button 30, a power supply 40, a control unit 10, and a plurality of test slots 60; the control unit 10 is electrically connected to the display screen 50, the communication interface 20, the control keys 30, the power supply 40 and the test grid 60, respectively, before testing, the communication interface of the lock control board is connected to the communication interface 20 of the test fixture, the grids of the lock control board are correspondingly connected to the test grid 60 one by one, the control keys 30 are used for inputting control signals to the test fixture, and the power supply 40 is used for supplying power to the test fixture. The method comprises the following steps performed by the control unit 10:
and S10, establishing communication connection with the lock control board.
In the present embodiment, the step S10 of establishing the communication connection with the lock control panel includes substeps S101 to S103.
And S101, sending a test instruction to the lock control plate.
In this embodiment, the test instruction sent by the test tool to the lock control plate may be any instruction, for example, an instruction for starting the lock control plate.
S102, detecting whether response information of the lock control plate is received.
In this embodiment, after the test fixture sends the test instruction to the lock control board, whether the response information of the lock control board is received is detected to determine whether the test instruction can be received by the lock control board.
S103, when the response information of the lock control plate is received, judging that the communication interface of the lock control plate is normal and establishing communication connection with the lock control plate.
In this embodiment, after the test fixture receives the response information of the lock control plate, it may be determined that the communication interface of the lock control plate is normal, or it may be determined that the test fixture has established communication connection with the lock control plate, and the information that the communication interface of the lock control plate is normal may be displayed through the display screen 50. When the test tool does not receive the response information of the lock control plate, it is determined that the lock control plate is not in communication connection with the test tool, the communication interface of the lock control plate is abnormal, and information that the communication interface of the lock control plate is abnormal is displayed on the display screen 50.
And S20, after the control instruction is sent to the lock control plate, the current state of the lock control plate is obtained, whether the current state of the lock control plate is matched with the control information carried by the control instruction or not is judged, a judgment result is obtained, and whether the lock control plate is normal or not is judged according to the judgment result.
In this embodiment, the current state of the lock control board may be a current state of the bin output pin, a current state of the temperature module, and/or a current state of the dial switch.
In this embodiment, the method for determining whether the current state of the lock control panel matches with the control information carried by the control instruction includes: judging whether the current state of the lock control plate is the state of the lock control plate after executing the control instruction, if so, judging that the obtained judgment result is matching, judging that the lock control plate is normal according to the matched judgment result, and displaying the normal information of the lock control plate on the display screen 50; if not, the obtained judgment result is mismatching, the abnormal lock control panel is judged according to the mismatching judgment result, and the information that the lock control panel is abnormal is displayed on the display screen 50.
In the embodiment, the lock control plate is tested by the test tool and the method applied to the test tool, so that the test efficiency of the lock control plate is greatly improved, the problems of low speed, troublesome operation, easy error and large occupied space during the test of the lock control plate are solved, and the production efficiency and the yield of the lock control plate are greatly improved.
Specifically, in this embodiment, after the step S20 of sending the control instruction to the lock control plate, the current state of the lock control plate is obtained, whether the current state of the lock control plate matches with the control information carried by the control instruction is determined, a determination result is obtained, and whether the lock control plate is normal or not is determined according to the determination result, including substeps S201 to S203.
S201, sending a first control instruction of an output signal to the lock control plate.
S202, acquiring the current output state of the output pin of the lock control panel grid, and judging whether the current output state of the output pin is matched with the control information of the output signal carried by the first control instruction or not to obtain a first judgment result.
And S203, judging whether the grid output pin of the lock control plate is normal or not according to the first judgment result.
In this embodiment, the control information carried by the first control instruction is output information of an output pin controlling a lock control panel lattice, the test tool obtains a current state of the output pin by detecting the state detection pin of the lock control panel, and determines whether the current state of the output pin matches with the control information of the output signal carried by the first control instruction, if the obtained first determination result is matching, it is determined that the output pin of the lock control panel lattice is normal, and if the obtained first determination result is not matching, it is determined that the output pin of the lock control panel lattice is abnormal. For example, the control information is to control the output high/low level of the conveying pin of the lock control plate, the test tool obtains the current state of the output pin through the detection state detection pin, judges whether the output pin outputs the high/low level, if so, the first judgment result is obtained and is matched, the output pin of the lock control plate lattice is judged to be normal, and the information that the output pin of the lock control plate lattice is normal is displayed on the display screen 50; if not, the first judgment result is obtained, the first judgment result is not matched, the abnormal lock control panel lattice output pin is judged, and the information that the abnormal lock control panel lattice output pin is abnormal is displayed on the display screen 50. It can be understood that the normal output pin of the lock control panel grid is the normal grid of the lock control panel.
In an optional embodiment, for example, in this embodiment, after the step S20 of sending the control instruction to the lock control panel, obtaining the current state of the lock control panel, determining whether the current state of the lock control panel matches with the control information carried in the control instruction, obtaining a determination result, and determining whether the lock control panel is normal according to the determination result further includes substeps 211 to S213.
S211, sending a second control instruction for changing the dial switch value to the lock control plate.
S212, the current dial switch value of the lock control plate is obtained, whether the current dial switch value is matched with the control information for changing the dial switch value carried by the second control instruction or not is judged, and a second judgment result is obtained.
And S213, judging whether the dial switch of the lock control plate is normal or not according to the second judgment result.
In this embodiment, after the test fixture controls the lock hole plate to change the dial switch value, the current dial switch value of the lock control plate is obtained, whether the current dial switch value is matched with the control information for changing the dial switch value carried by the second control instruction is judged, if the obtained second judgment result is matching, the dial switch of the lock control plate is judged to be normal, and the information that the dial switch of the lock control plate is normal is displayed on the display screen 50; if the second determination result is not matched, it is determined that the dial switch of the lock control panel is not normal, and information that the dial switch of the lock control panel is not normal is displayed on the display screen 50.
In an optional embodiment, for example, in this embodiment, after the step S20 of sending the control instruction to the lock control plate, obtaining the current state of the lock control plate, determining whether the current state of the lock control plate matches with the control information carried by the control instruction, obtaining a determination result, and determining whether the lock control plate is normal according to the determination result further includes substeps S221 to S223.
S221, sending a third control instruction for changing the temperature value to the lock control plate.
S222, acquiring the current temperature value of the lock control plate, and judging whether the current temperature value is matched with the control information of the changed temperature value carried by the third control instruction to obtain a third judgment result.
And S223, judging whether the temperature module of the lock control plate is normal or not according to a third judgment result.
In this embodiment, after the test fixture controls the lock hole plate to change the temperature value, the current temperature value of the lock control plate is obtained, whether the current temperature value is matched with the control information of the changed temperature value carried by the third control instruction is judged, if the obtained third judgment result is matching, it is judged that the temperature module of the lock control plate is normal, and the information that the temperature module of the lock control plate is normal is displayed on the display screen 50; if the third determination result is not matching, it is determined that the temperature module of the lock control panel is not normal, and information that the temperature module of the lock control panel is not normal is displayed on the display screen 50. In the present embodiment, the temperature module includes a temperature sensor and the like.
In this embodiment, when the communication interface, the lattice, the dial switch, and the temperature module of the lock control board are all tested to be normal, a normal test result of the lock control board is obtained, and when one of the communication interface, the lattice, the dial switch, and the temperature module is abnormal, an abnormal test result of the lock control board is obtained. In this embodiment, the communication interface, the lattice, the dip switch and the temperature module may be tested simultaneously, or may be tested sequentially, for example, after the communication interface of the lock control board is tested, the lattice of the lock control board is tested, after the lattice test of the lock control board is completed, the dip switch of the lock control board is tested, and after the dip switch of the lock control board is tested, the temperature module is tested. It will be appreciated that in other implementations, the test results that are normal for the lock control panel may be only one or more of the communication interface, the gate, the dip switch and the temperature module of the lock control panel.
Referring to fig. 3, fig. 3 is a schematic block diagram of a lock control board testing apparatus according to an embodiment of the present invention, and in this embodiment, the apparatus is configured to a control unit 10 of a testing tool, and includes a communication unit 100 and a determination unit 200.
The communication unit 100 is used for establishing communication connection with the lock control panel. In this embodiment, as shown in fig. 4, the communication unit 100 includes a detection module 101, a receiving module 102, and a determination module 103, where the detection module 101 is configured to send a test instruction to the lock control panel. In this embodiment, the test instruction sent by the test tool to the lock control plate may be any instruction, for example, an instruction for starting the lock control plate. The receiving module 102 is configured to detect whether the response message of the lock control panel is received. In this embodiment, after the test fixture sends the test instruction to the lock control board, whether the response information of the lock control board is received is detected to determine whether the test instruction can be received by the lock control board. The determination module 103 is configured to determine that the communication interface of the lock control panel is normal and establish communication connection with the lock control panel when receiving the response information of the lock control panel. In this embodiment, after the test fixture receives the response information of the lock control plate, it may be determined that the communication interface of the lock control plate is normal, or it may be determined that the test fixture has established communication connection with the lock control plate, and the information that the communication interface of the lock control plate is normal may be displayed through the display screen 50. When the test tool does not receive the response information of the lock control plate, it is determined that the lock control plate is not in communication connection with the test tool, the communication interface of the lock control plate is abnormal, and information that the communication interface of the lock control plate is abnormal is displayed on the display screen 50.
The judging unit 200 is configured to obtain a current state of the lock control panel after sending the control instruction to the lock control panel, judge whether the current state of the lock control panel matches with the control information carried by the control instruction, obtain a judgment result, and judge whether the lock control panel is normal according to the judgment result. In this embodiment, the current state of the lock control board may be a current state of the bin output pin, a current state of the temperature module, and/or a current state of the dial switch. In this embodiment, the method for determining whether the current state of the lock control panel matches with the control information carried by the control instruction includes: judging whether the current state of the lock control plate is the state of the lock control plate after executing the control instruction, if so, judging that the obtained judgment result is matching, judging that the lock control plate is normal according to the matched judgment result, and displaying the normal information of the lock control plate on the display screen 50; if not, the obtained judgment result is mismatching, the abnormal lock control panel is judged according to the mismatching judgment result, and the information that the lock control panel is abnormal is displayed on the display screen 50.
In the embodiment, the lock control plate is tested by the test tool and the method applied to the test tool, so that the test efficiency of the lock control plate is greatly improved, the problems of low speed, troublesome operation, easy error and large occupied space during the test of the lock control plate are solved, and the production efficiency of the lock control plate is greatly improved.
Specifically, in the present embodiment, as shown in fig. 5, the determination unit 200 includes a first sending module 201, a first determining module 202, and a first testing module 203. The first sending module 201 is configured to send a first control instruction of the output signal to the lock control panel. The first determining module 202 is configured to obtain a current output state of the output pin of the lock control panel, and determine whether the current output state of the output pin matches with control information of the output signal carried by the first control instruction, so as to obtain a first determining result. The first testing module 203 is configured to determine whether the lattice output pin of the lock control plate is normal according to the first determination result.
In this embodiment, the control information carried by the first control instruction is output information of an output pin controlling a lock control panel lattice, the test tool obtains a current state of the output pin by detecting the state detection pin of the lock control panel, and determines whether the current state of the output pin matches with the control information of the output signal carried by the first control instruction, if the obtained first determination result is matching, it is determined that the output pin of the lock control panel lattice is normal, and if the obtained first determination result is not matching, it is determined that the output pin of the lock control panel lattice is abnormal. For example, the control information is to control the output high/low level of the conveying pin of the lock control plate, the test tool obtains the current state of the output pin through the detection state detection pin, judges whether the output pin outputs the high/low level, if so, the first judgment result is obtained and is matched, the output pin of the lock control plate lattice is judged to be normal, and the information that the output pin of the lock control plate lattice is normal is displayed on the display screen 50; if not, the first judgment result is obtained, the first judgment result is not matched, the abnormal lock control panel lattice output pin is judged, and the information that the abnormal lock control panel lattice output pin is abnormal is displayed on the display screen 50. It can be understood that the normal output pin of the lock control panel grid is the normal grid of the lock control panel.
As shown in fig. 6, in an alternative embodiment, for example, in this embodiment, the determining unit 200 further includes a second sending module 211, a second determining module 212, and a second testing module 213. The second sending module 211 is configured to send a second control instruction for changing the dial switch value to the lock control panel. The second determining module 212 is configured to obtain a current dial switch value of the lock control panel, determine whether the current dial switch value matches with control information for changing the dial switch value, which is carried in the second control instruction, and obtain a second determining result. The second testing module 213 is configured to determine whether the dial switch of the lock control panel is normal according to the second determination result.
In this embodiment, after the test fixture controls the lock hole plate to change the dial switch value, the current dial switch value of the lock control plate is obtained, whether the current dial switch value is matched with the control information for changing the dial switch value carried by the second control instruction is judged, if the obtained second judgment result is matching, the dial switch of the lock control plate is judged to be normal, and the information that the dial switch of the lock control plate is normal is displayed on the display screen 50; if the second determination result is not matched, it is determined that the dial switch of the lock control panel is not normal, and information that the dial switch of the lock control panel is not normal is displayed on the display screen 50.
As shown in fig. 7, in an alternative embodiment, for example, in this embodiment, the determining unit 200 further includes a third sending module 221, a third determining module 222, and a third testing module 223. The third sending module 221 is configured to send a third control instruction for changing the temperature value to the lock control plate. The third determining module 222 is configured to obtain a current temperature value of the lock control plate, determine whether the current temperature value matches with control information of a modified temperature value carried by the third control instruction, and obtain a third determination result. The third testing module 223 is configured to determine whether the temperature module of the lock control plate is normal according to a third determination result.
In this embodiment, after the test fixture controls the lock hole plate to change the temperature value, the current temperature value of the lock control plate is obtained, whether the current temperature value is matched with the control information of the changed temperature value carried by the third control instruction is judged, if the obtained third judgment result is matching, it is judged that the temperature module of the lock control plate is normal, and the information that the temperature module of the lock control plate is normal is displayed on the display screen 50; if the third determination result is not matching, it is determined that the temperature module of the lock control panel is not normal, and information that the temperature module of the lock control panel is not normal is displayed on the display screen 50. In the present embodiment, the temperature module includes a temperature sensor and the like.
In this embodiment, when the communication interface, the lattice, the dial switch, and the temperature module of the lock control board are all tested to be normal, a normal test result of the lock control board is obtained, and when one of the communication interface, the lattice, the dial switch, and the temperature module is abnormal, an abnormal test result of the lock control board is obtained. In this embodiment, the communication interface, the lattice, the dip switch and the temperature module may be tested simultaneously, or may be tested sequentially, for example, after the communication interface of the lock control board is tested, the lattice of the lock control board is tested, after the lattice test of the lock control board is completed, the dip switch of the lock control board is tested, and after the dip switch of the lock control board is tested, the temperature module is tested. It will be appreciated that in other implementations, the test results that are normal for the lock control panel may be only one or more of the communication interface, the gate, the dip switch and the temperature module of the lock control panel.
The above description is only a preferred embodiment of the present invention, and not intended to limit the scope of the present invention, and all modifications of equivalent structures and equivalent processes, which are made by using the contents of the present specification and the accompanying drawings, or directly or indirectly applied to other related technical fields, are included in the scope of the present invention.
Claims (4)
1. A lock control plate testing method is characterized by being applied to a testing tool, wherein the testing tool comprises a control unit, and the method comprises the following steps executed by the control unit:
establishing communication connection with the lock control plate;
after sending a control instruction to the lock control plate, acquiring the current state of the lock control plate, judging whether the current state of the lock control plate is matched with control information carried by the control instruction or not to obtain a judgment result, and judging whether the lock control plate is normal or not according to the judgment result; wherein,
after sending a control instruction to the lock control plate, acquiring the current state of the lock control plate, judging whether the current state of the lock control plate is matched with control information carried by the control instruction, obtaining a judgment result, and judging whether the lock control plate is normal according to the judgment result, wherein the step of:
sending a first control instruction of an output signal to the lock control plate;
acquiring the current output state of the lock control plate lattice output pin, and judging whether the current output state of the output pin is matched with the control information of the output signal carried by the first control instruction or not to obtain a first judgment result;
judging whether the grid output pin of the lock control plate is normal or not according to the first judgment result; or,
after sending a control instruction to the lock control plate, acquiring the current state of the lock control plate, judging whether the current state of the lock control plate is matched with control information carried by the control instruction, obtaining a judgment result, and judging whether the lock control plate is normal according to the judgment result, wherein the step of:
sending a second control instruction for changing the dial switch value to the lock control plate;
acquiring a current dial switch value of the lock control plate, and judging whether the current dial switch value is matched with control information for changing the dial switch value carried by the second control instruction, so as to obtain a second judgment result;
judging whether the dial switch of the lock control plate is normal or not according to the second judgment result; or,
after sending a control instruction to the lock control plate, acquiring the current state of the lock control plate, judging whether the current state of the lock control plate is matched with control information carried by the control instruction, obtaining a judgment result, and judging whether the lock control plate is normal according to the judgment result, wherein the step of:
sending a third control instruction for changing the temperature value to the lock control plate;
acquiring the current temperature value of the lock control plate, and judging whether the current temperature value is matched with the control information of the changed temperature value carried by the third control instruction to obtain a third judgment result;
and judging whether the temperature module of the lock control plate is normal or not according to the third judgment result.
2. The lock control panel testing method according to claim 1, wherein the step of establishing a communication link with the lock control panel includes:
sending a test instruction to the lock control plate;
detecting whether response information of the lock control plate is received;
and when the response information of the lock control plate is received, judging that the communication interface of the lock control plate is normal and establishing communication connection with the lock control plate.
3. The utility model provides a lock control board testing arrangement which characterized in that, the device disposes in the control unit of test fixture, includes:
the communication unit is used for establishing communication connection with the lock control plate;
the judging unit is used for acquiring the current state of the lock control plate after sending a control instruction to the lock control plate, judging whether the current state of the lock control plate is matched with the control information carried by the control instruction to obtain a judgment result, and judging whether the lock control plate is normal according to the judgment result; wherein,
the judging unit includes:
the first sending module is used for sending a first control instruction of an output signal to the lock control plate;
the first judgment module is used for acquiring the current output state of the lock control panel grid output pin, judging whether the current output state of the output pin is matched with the control information of the output signal carried by the first control instruction or not, and obtaining a first judgment result;
the first test module is used for judging whether the grid output pin of the lock control plate is normal or not according to the first judgment result; or,
the judging unit includes:
the second sending module is used for sending a second control instruction for changing the dial switch value to the lock control plate;
the second judgment module is used for acquiring the current dial switch value of the lock control plate, judging whether the current dial switch value is matched with the control information for changing the dial switch value carried by the second control instruction or not and obtaining a second judgment result;
the second testing module is used for judging whether the dial switch of the lock control plate is normal or not according to the second judgment result; or,
the judging unit includes:
the third sending module is used for sending a third control instruction for changing the temperature value to the lock control plate;
the third judging module is used for acquiring the current temperature value of the lock control plate, judging whether the current temperature value is matched with the control information of the temperature changing value carried by the third control instruction, and obtaining a third judging result;
and the third testing module is used for judging whether the temperature module of the lock control plate is normal or not according to the third judgment result.
4. A test tool, characterized in that the test tool comprises the lock control plate test device according to claim 3.
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| CN201910492894.3A CN110134116B (en) | 2019-06-06 | 2019-06-06 | Lock control plate testing method, device and tool |
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| CN201910492894.3A CN110134116B (en) | 2019-06-06 | 2019-06-06 | Lock control plate testing method, device and tool |
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| CN110134116B true CN110134116B (en) | 2020-06-23 |
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| CN110542817A (en) * | 2019-09-12 | 2019-12-06 | 陕西瑞迅电子信息技术有限公司 | Intelligent express cabinet terminal test system |
| CN111127871B (en) * | 2019-12-25 | 2020-12-08 | 浙江柿子新能源科技有限公司 | Dial locking method |
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| CN107346128A (en) * | 2016-05-04 | 2017-11-14 | 深圳市祈飞科技有限公司 | Automated testing method and system for lock control plate |
| CN108364384B (en) * | 2018-02-05 | 2020-12-25 | 中科富创（北京）科技有限公司 | Intelligent express delivery cabinet lock control plate restart verification method, storage device and processing device |
| CN208848270U (en) * | 2018-10-22 | 2019-05-10 | 成都恒铸科技有限公司 | A kind of locker lock control system |
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Denomination of invention: Lock control board test method, device and tooling Effective date of registration: 20210531 Granted publication date: 20200623 Pledgee: Xi'an investment and financing Company limited by guarantee Pledgor: SHAANXI RUIXUN ELECTRONIC INFORMATION TECHNOLOGY Co.,Ltd. Registration number: Y2021610000120 |
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Date of cancellation: 20220610 Granted publication date: 20200623 Pledgee: Xi'an investment and financing Company limited by guarantee Pledgor: SHAANXI RUIXUN ELECTRONIC INFORMATION TECHNOLOGY CO.,LTD. Registration number: Y2021610000120 |