CN112595956A - Test system of intelligence lock PCBA board - Google Patents
Test system of intelligence lock PCBA board Download PDFInfo
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- CN112595956A CN112595956A CN202011399593.5A CN202011399593A CN112595956A CN 112595956 A CN112595956 A CN 112595956A CN 202011399593 A CN202011399593 A CN 202011399593A CN 112595956 A CN112595956 A CN 112595956A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2803—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP] by means of functional tests, e.g. logic-circuit-simulation or algorithms therefor
Abstract
The invention provides a test system for an intelligent lock PCBA board, which comprises: the test system comprises a test computer, upper computer test software configured on the test computer and a test tool; the test fixture comprises: the test board is arranged on the bearing structure; the test board is connected with the test point of the tested board through the test probe; the test board is in communication connection with the test computer; the upper computer testing software is at least used for configuring testing parameters and generating testing instructions of corresponding testing tasks; the test computer is at least used for operating the upper computer test software and sending the test instruction to the test board so that the test board can test the tested board. The test system realizes automatic test of the PCBA board of the intelligent lock, and saves a large amount of manual test time.
Description
Technical Field
The invention relates to the technical field of automatic testing, in particular to a testing system of an intelligent lock PCBA board.
Background
Along with the continuous development of science and technology, the intelligence lock is owing to have functions such as fingerprint unblank, cell-phone APP (application) bluetooth unblank and password unblank, and the convenience of use has been improved to a very big degree, receives people's welcome more and more. Due to the large demand of the smart lock market, the commodity quantity of the domestic smart lock market reaches ten million sets at present, and a large number of matched PCBA (printed Circuit Board Assembly) boards are obviously needed.
In order to improve market competitiveness, the function of intelligence lock becomes more and more abundant, and the design of the inside PCBA board of intelligence lock also becomes more and more complicated so, to numerous PCBA boards, all need carry out the non-defective products screening to it before the equipment of whole lock to improve the quality of intelligence lock.
However, the current screening of the good products of PCBA board is all carried out through artificial mode, can occupy a large amount of time, has increased the human cost of intelligence lock.
In addition, the test items of the PCBA are tested in a manual mode, so that the test result is easily influenced by subjective judgment of different people, the test standards cannot be unified, and the consistency of the PCBA in batch production cannot be guaranteed.
In addition, the conventional manual test mode needs manual statistics of test results, also needs more manpower and time, is easy to make mistakes and cannot realize the test data of the PCBA board of remote monitoring statistics.
Disclosure of Invention
In view of the above, in order to solve the above problems, the present invention provides a testing system for a PCBA board of an intelligent lock, which has the following technical scheme:
a test system of an intelligent lock PCBA board, the test system comprising: the test system comprises a test computer, upper computer test software configured on the test computer and a test tool;
the test fixture comprises: the test board is arranged on the bearing structure;
the test board is connected with the test point of the tested board through the test probe;
the test board is in communication connection with the test computer;
the upper computer testing software is at least used for configuring testing parameters and generating testing instructions of corresponding testing tasks;
the test computer is at least used for operating the upper computer test software and sending the test instruction to the test board so that the test board can test the tested board.
Optionally, in the above test system, the test system further includes:
the printing subsystem is connected with the testing computer;
and the printing subsystem is used for printing the parameter information of the tested plate.
Optionally, in the above test system, the test system further includes: a server;
and the server is used for receiving the test record of the tested board uploaded by the upper computer test software.
Optionally, in the above test system, the test fixture further includes: the tested plate clamp is arranged on the bearing structure;
and the tested plate is fixed on the tested plate clamp.
Optionally, in the above test system, the test fixture further includes: a detection device;
the detection device is used for detecting whether the plate to be detected is fixed on the plate to be detected clamp or not.
Optionally, in the above test system, the test task at least includes:
the method comprises the following steps of firmware downloading test, Bluetooth communication test, voice test, voltage acquisition test, GPIO test, power consumption test, key chip test, NB module networking test and radio frequency card swiping test.
Optionally, in the above test system, when performing the firmware download test,
the upper computer test software sends a firmware downloading test instruction to the test board;
the test board downloads the firmware to the board to be tested based on the firmware downloading test instruction;
and the test board acquires a downloading result and feeds the downloading result back to the upper computer test software.
Optionally, in the above test system, when performing the bluetooth communication test,
the upper computer test software sends a Bluetooth communication test instruction to the test board;
and the test board acquires the physical address of the Bluetooth module in the tested board based on the Bluetooth communication test instruction, completes the Bluetooth communication test with the Bluetooth module according to the physical address and feeds back the test result to the upper computer test software.
Optionally, in the above test system, when performing the voice test,
the upper computer test software sends a voice test instruction to the test board;
the test board generates a voice playing instruction based on the voice test instruction so as to control the tested board to play voice;
and the test board judges the voice test result of the tested board based on the voice playing result and feeds the test result back to the upper computer test software.
Optionally, in the above test system, when performing the voltage acquisition test,
the upper computer test software sends a voltage acquisition instruction to the test board;
the test board controls the tested board to carry out voltage acquisition based on the voltage acquisition instruction;
and the test board judges a voltage acquisition test result of the tested board based on the voltage acquisition result and feeds the test result back to the upper computer test software.
Optionally, in the test system, when the GPIO test is performed,
the upper computer test software sends a GPIO test instruction to the test board;
the test board controls the tested board to output a high level or a low level to the configuration of the GPIO pins to be tested based on the GPIO test instruction;
and the test board acquires the level signal of the GPIO pin to be tested, judges the GPIO test result of the test board and feeds the test result back to the upper computer test software.
Optionally, in the above test system, when performing the power consumption test,
the power consumption test comprises a sleep power consumption test and a normal power consumption test;
when the sleep power consumption test is performed,
the upper computer test software sends a sleep power consumption test instruction to the test board;
the test board controls the tested board to enter a sleep mode based on the sleep power consumption test instruction;
the test board acquires a sleep voltage signal of the tested board in the sleep mode, judges a sleep power consumption test result of the tested board and feeds the test result back to the upper computer test software;
when the normal power consumption test is performed,
the upper computer test software sends a normal power consumption test instruction to the test board;
the test board controls the tested board to enter a normal working mode based on the normal power consumption test instruction;
and the test board acquires a normal working voltage signal of the tested board in the normal working mode, judges a normal power consumption test result of the tested board and feeds the test result back to the upper computer test software.
Optionally, in the above test system, when the key chip test is performed,
the upper computer test software sends a key chip test instruction to the test board;
and the test board establishes communication connection with the key chip of the board to be tested based on the key chip test instruction, and feeds back a communication result to the upper computer test software.
Optionally, in the test system, when the NB module networking test is performed,
the components of the NB module networking comprise: the system comprises an NB module, an SIM card and an NB antenna;
the upper computer test software sends an NB module networking test instruction to the test board;
the test board controls the NB module to establish communication connection with a main control chip of the tested board based on the NB module networking test instruction, the NB module establishes communication connection with the SIM card, the NB module establishes communication connection with a network system through the NB antenna, and a communication result is fed back to the upper computer test software.
Optionally, in the test system, when the radio frequency card swiping test is performed,
the upper computer test software sends a radio frequency card swiping test instruction to the test board;
the test board controls a radio frequency card reading circuit in the tested board to start working based on the radio frequency card swiping test instruction;
the test board obtains the card reading information of the radio frequency card reading circuit and feeds the card reading information back to the upper computer test software.
Compared with the prior art, the invention has the following beneficial effects:
the invention provides a test system of an intelligent lock PCBA board, which comprises: the test system comprises a test computer, upper computer test software configured on the test computer and a test tool; the test fixture comprises: the test board is arranged on the bearing structure; the test board is connected with the test point of the tested board through the test probe; the test board is in communication connection with the test computer; the upper computer testing software is at least used for configuring testing parameters and generating testing instructions of corresponding testing tasks; the test computer is at least used for operating the upper computer test software and sending the test instruction to the test board so that the test board can test the tested board.
The test system realizes automatic test of the PCBA board of the intelligent lock, and saves a large amount of manual test time.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the provided drawings without creative efforts.
Fig. 1 is a schematic structural diagram of a test system for an intelligent lock PCBA board according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of a test task in a test system for an intelligent lock PCBA board according to an embodiment of the present invention;
fig. 3 is a schematic diagram of detecting a board to be tested in a testing system for an intelligent lock PCBA board according to an embodiment of the present invention;
FIG. 4 is a diagram illustrating a firmware download test according to an embodiment of the present invention;
FIG. 5 is a diagram illustrating a voice test according to an embodiment of the present invention;
fig. 6 is a schematic diagram of a GPIO test according to an embodiment of the present invention;
FIG. 7 is a schematic diagram of a power consumption test according to an embodiment of the present invention;
fig. 8 is a schematic diagram of an NB module networking test according to an embodiment of the present invention;
fig. 9 is a schematic diagram of a card swiping test of a radio frequency card according to an embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
In order to make the aforementioned objects, features and advantages of the present invention comprehensible, embodiments accompanied with figures are described in further detail below.
Referring to fig. 1, fig. 1 is a schematic structural diagram of a test system for an intelligent lock PCBA board according to an embodiment of the present invention.
The test system comprises:
the test system comprises a test computer, upper computer test software configured on the test computer and a test tool;
the test fixture comprises: the test board is arranged on the bearing structure;
the test board is connected with the test point of the tested board through the test probe;
the test board is in communication connection with the test computer;
the upper computer testing software is at least used for configuring testing parameters and generating testing instructions of corresponding testing tasks;
the test computer is at least used for operating the upper computer test software and sending the test instruction to the test board so that the test board can test the tested board.
In this embodiment, the upper computer test software is used to configure test parameters of the test fixture, including but not limited to content such as test items and production information.
A tester can start testing the tested board through the configured upper computer testing software.
Meanwhile, the upper computer test software can also display the state information of the current tested board in real time, such as whether each tested module of the tested board is normal, the test quantity of the tested board in a certain test period, the corresponding number of the tested board and the like.
The test computer and the test board are in communication connection in a USB (universal serial bus) line mode, and are used for receiving a test instruction issued by the upper computer test software and feeding back a test result to the upper computer test software.
The test board is connected with the test points of the board to be tested through the test probes to complete communication between the test board and the board to be tested so as to test functions of the board to be tested.
Further, based on the above embodiment of the present invention, as shown in fig. 1, the test system further includes:
the printing subsystem is connected with the testing computer;
and the printing subsystem is used for printing the parameter information of the tested plate.
In this embodiment, the printing subsystem includes, but is not limited to, a printer for printing information of the board under test, such as test run number and ID information, and the printed label may be attached to the board under test for easy identification and management of the board under test.
Further, based on the above embodiment of the present invention, as shown in fig. 1, the test system further includes: a server;
and the server is used for receiving the test record of the tested board uploaded by the upper computer test software.
In this embodiment, the server is configured to receive a test record uploaded by the upper computer test software, and after the time for uploading the test record and the content of the uploaded test record are set, the upper computer test software automatically uploads test data to the server through a network, thereby implementing remote monitoring of the board data to be tested.
According to the above description, the test system for the intelligent lock PCBA board provided by the embodiment of the invention has the advantages that the test standard is unified, the test flow is simplified, the labor cost of the intelligent lock is reduced by reducing the test time, the production yield is improved, and meanwhile, the test result is automatically counted through the function of reporting data by the upper computer test software, so that the remote monitoring of the test data of the tested board is realized.
Further, based on the above-mentioned embodiment of the present invention, referring to fig. 2, fig. 2 is a schematic diagram of a test task in a test system of an intelligent lock PCBA board provided in an embodiment of the present invention.
The test tasks at least comprise:
the method comprises the following steps of firmware downloading test, Bluetooth communication test, voice test, voltage acquisition test, GPIO test, power consumption test, key chip test, NB module networking test and radio frequency card swiping test.
In this embodiment, the NB module networking test is NB-IOT (narrow Band Internet of ings) module networking test.
Further, based on the above-mentioned embodiment of the present invention, referring to fig. 3, fig. 3 is a schematic diagram of detecting a board to be tested in a testing system of an intelligent lock PCBA board provided in an embodiment of the present invention.
The test fixture further comprises: the tested plate clamp is arranged on the bearing structure;
and the tested plate is fixed on the tested plate clamp.
The test fixture further comprises: a detection device; the detection device comprises but is not limited to a sampling resistor, a power supply of a detected plate and other devices.
The detection device is used for detecting whether the plate to be detected is fixed on the plate to be detected clamp or not.
In this embodiment, before a firmware download test is performed, the test fixture needs to detect whether a board to be tested is placed in the board clamp, when the board to be tested does not exist in the board clamp of the test fixture, a current flowing through the sampling resistor is zero, a voltage value obtained after a voltage signal is collected by the ADC module in the test board is approximately zero, and at this time, the test board detects that no board to be tested exists in the board clamp, and transmits a detection result to the upper computer test software.
When a tested plate exists in a tested plate clamp of the test tool, current flows through the sampling resistor, after voltage signals are collected by an ADC (analog to digital converter) module in the test plate, a corresponding voltage value is obtained to represent and detect the tested plate, at the moment, upper computer test software is informed that the tested plate is detected, and the upper computer test software executes subsequent steps based on the detection result, such as firmware downloading test.
Further, based on the above-mentioned embodiment of the present invention, referring to fig. 4, fig. 4 is a schematic diagram of a firmware download test according to an embodiment of the present invention.
When the firmware download test is performed,
the upper computer test software sends a firmware downloading test instruction to the test board;
the test board downloads the firmware to the board to be tested based on the firmware downloading test instruction;
and the test board acquires a downloading result and feeds the downloading result back to the upper computer test software.
In this embodiment, when a firmware download test is performed, the upper computer test software initiates a test instruction, that is, a firmware download test instruction, which is transmitted to the test board on the test fixture through the USB cable, and after the test board analyzes the firmware download test instruction, the test board controls the downloader to download the firmware to the board to be tested through the firmware download interface SED via the GPIO interface.
The test board can judge whether the firmware of the current tested board is successfully downloaded according to the state indication pin of the downloader, namely a downloading result, and feeds the downloading result back to the upper computer test software to finish the firmware downloading test of the tested board.
Further, according to the above-described embodiment of the present invention, when the bluetooth communication test is performed,
the upper computer test software sends a Bluetooth communication test instruction to the test board;
and the test board acquires the physical address of the Bluetooth module in the tested board based on the Bluetooth communication test instruction, completes the Bluetooth communication test with the Bluetooth module according to the physical address and feeds back the test result to the upper computer test software.
In this embodiment, after the firmware download test is completed, the board under test performs operations such as power down, delay, power up again and the like on the board under test according to an instruction sent by the upper computer test software, so that the board under test is powered up again after the firmware download is completed, the downloaded firmware is executed, and the downloaded firmware is used for receiving the instruction of the board under test and completing related operations.
When the upper computer test software initiates a test instruction, namely a Bluetooth communication test instruction, the test board firstly interacts with the tested board through data to obtain a physical address of a Bluetooth module of the tested board, the test board completes Bluetooth communication test with the Bluetooth module of the tested board according to the physical address, and a result of success or failure of the Bluetooth communication test is fed back to the upper computer test software.
And the upper computer test software marks the tested board, stores the test record, displays the test abnormal result on an interface and prompts a tester to replace the new tested board for new test.
Further, based on the above-mentioned embodiment of the present invention, referring to fig. 5, fig. 5 is a schematic diagram of a voice test according to an embodiment of the present invention.
When the voice test is to be performed, the voice test,
the upper computer test software sends a voice test instruction to the test board;
the test board generates a voice playing instruction based on the voice test instruction so as to control the tested board to play voice;
and the test board judges the voice test result of the tested board based on the voice playing result and feeds the test result back to the upper computer test software.
In this embodiment, the upper computer test software initiates a test instruction, i.e., a voice test instruction, to the test board, and the test board generates a voice playing instruction to the board under test based on the voice test instruction, so as to control the board under test to play voice.
At the moment, the voice chip of the tested board passes through the test point near the loudspeaker seat to be collected by the test board, the voice can be judged to be normally played according to the collection result, if the voice chip is abnormal and the voice cannot be played, the test board cannot detect the voice signal, and then the voice test abnormality of the tested board is judged.
And finally, feeding back the test result to the upper computer test software.
Further, according to the above-mentioned embodiment of the present invention, when the voltage acquisition test is performed,
the upper computer test software sends a voltage acquisition instruction to the test board;
the test board controls the tested board to carry out voltage acquisition based on the voltage acquisition instruction;
and the test board judges a voltage acquisition test result of the tested board based on the voltage acquisition result and feeds the test result back to the upper computer test software.
In this embodiment, the upper computer test software initiates a test instruction, i.e., a voltage acquisition instruction, to the test board, and the test board sends the voltage acquisition instruction to the board to be tested to control the board to be tested to perform voltage acquisition after receiving the voltage acquisition instruction.
The voltage for supplying power to the tested board is fixed, so that the voltage value measured by the tested board through the ADC circuit is also fixed, the tested board sends the acquired voltage value to the test board through the serial port, the test board judges whether the voltage acquisition circuit of the tested board is normal or not according to whether the voltage value is in a correct range or not, and the test result is fed back to the upper computer test software.
Further, based on the above embodiment of the present invention, referring to fig. 6, fig. 6 is a schematic diagram of a GPIO test provided in the embodiment of the present invention.
When the GPIO test is performed, the GPIO test,
the upper computer test software sends a GPIO test instruction to the test board;
the test board controls the tested board to output a high level or a low level to the configuration of the GPIO pins to be tested based on the GPIO test instruction;
and the test board acquires the level signal of the GPIO pin to be tested, judges the GPIO test result of the test board and feeds the test result back to the upper computer test software.
In this embodiment, the upper computer test software initiates a test instruction, that is, a GPIO test instruction, to the test board, the test board controls the board under test to configure and output a high level or a low level to the GPIO pin under test based on the GPIO test instruction, a level signal of the board under test is acquired by the test GPIO module of the test board to obtain a measured IO level value, and the GPIO test on the board under test is completed by determining whether the IO level value satisfies a test expectation.
And finally, feeding back the test result to the upper computer test software.
Further, based on the above-mentioned embodiment of the present invention, referring to fig. 7, fig. 7 is a schematic diagram of a power consumption test according to an embodiment of the present invention.
When the power consumption test is performed,
the power consumption test comprises a sleep power consumption test and a normal power consumption test;
when the sleep power consumption test is performed,
the upper computer test software sends a sleep power consumption test instruction to the test board;
the test board controls the tested board to enter a sleep mode based on the sleep power consumption test instruction;
the test board acquires a sleep voltage signal of the tested board in the sleep mode, judges a sleep power consumption test result of the tested board and feeds the test result back to the upper computer test software;
when the normal power consumption test is performed,
the upper computer test software sends a normal power consumption test instruction to the test board;
the test board controls the tested board to enter a normal working mode based on the normal power consumption test instruction;
and the test board acquires a normal working voltage signal of the tested board in the normal working mode, judges a normal power consumption test result of the tested board and feeds the test result back to the upper computer test software.
In this embodiment, the power consumption of the smart lock during use includes at least two types, one of which is normal power consumption and the other is sleep power consumption.
Specifically, when the intelligent lock is used, such as unlocking, a hardware circuit of the intelligent lock enters a working state, and the total current of the system is generally milliampere level; when the intelligent lock completes unlocking and other actions, or detects that the intelligent lock is not triggered for a long time, namely no one operates, the intelligent lock automatically enters a sleep mode, the total current of the system is generally microampere, and the system waits to be awakened again by external operation such as unlocking by fingerprints or unlocking by passwords and enters a normal working mode after sleeping.
In the invention, the design can effectively prolong the service life of the battery module of the intelligent lock, and once the normal power consumption or the sleep power consumption of the intelligent lock exceeds the upper limit of the designed range, the service life of the battery module is greatly shortened, even the intelligent lock system cannot normally work, therefore, the invention further tests the power consumption of the intelligent lock:
through two kinds of sampling resistance of series connection access in being surveyed the board circuit, normal consumption sampling resistance and sleep consumption sampling resistance, during the power consumption test, host computer test software sends test instruction promptly sleep consumption test instruction extremely survey the board, in order to control it gets into the sleep mode to be surveyed the board, intelligent locking system electric current is microampere level this moment, survey the board control relay simultaneously and insert sleep consumption sampling resistance series connection in the power supply line of being surveyed the board, sleep consumption sampling resistance converts the electric current into sleep voltage signal, this sleep voltage signal is gathered by the ADC module of surveying the board, and convert to the current value, judge this current value, just can test out whether normal by the sleep consumption of being surveyed the board.
Similarly, the upper computer test software sends a test instruction, namely a normal power consumption test instruction to the test board to control the tested board to enter a normal working mode, the test board controls the relay to connect the normal power consumption sampling resistor in series into a power circuit of the tested board, the connection of the sleep power consumption sampling resistor is disconnected, the normal power consumption sampling resistor converts current into a normal voltage signal, the normal voltage signal is collected by the ADC module of the test board and converted into a current value, the current value is judged, and whether the normal power consumption of the tested board is normal or not can be tested.
And finally, feeding back the test result to the upper computer test software.
Further, according to the above-mentioned embodiment of the present invention, when the key chip test is performed,
the upper computer test software sends a key chip test instruction to the test board;
and the test board establishes communication connection with the key chip of the board to be tested based on the key chip test instruction, and feeds back a communication result to the upper computer test software.
In the embodiment, the password unlocking function of the intelligent lock is realized by the special key chip, when a user presses the numbers on the door lock panel, the capacitance values near the numbers are changed, the numbers of the keys are acquired and converted by the key special chip, and the detection of the input password is completed.
If the key value cannot be normally acquired due to poor welding of the key chip or other reasons, the password function of the intelligent lock cannot be normally used.
Therefore, the production yield and the service life of the PCBA board of the intelligent lock can be greatly improved through the detection of the key chip of the intelligent lock in the embodiment of the invention.
Further, based on the above embodiments of the present invention, referring to fig. 8, fig. 8 is a schematic diagram of an NB module networking test according to an embodiment of the present invention.
When the NB module networking test is performed,
the components of the NB module networking comprise: the system comprises an NB module, an SIM card and an NB antenna;
the upper computer test software sends an NB module networking test instruction to the test board;
the test board controls the NB module to establish communication connection with a main control chip of the tested board based on the NB module networking test instruction, the NB module establishes communication connection with the SIM card, the NB module establishes communication connection with a network system through the NB antenna, and a communication result is fed back to the upper computer test software.
In this embodiment, the smart lock completes the connection with the network through the NB module integrated inside, for example, to realize the remote connection between the mobile phone APP and the smart lock.
As shown in fig. 8, the components networked by the NB module in the board under test mainly include three parts, namely, the NB module, the SIM card, and the NB antenna, and when any part has a problem, the board under test cannot be connected to the network, and therefore, the three parts are tested in the embodiment of the present invention.
The communication between the NB module and the main control chip of the tested board, the communication between the NB module and the SIM card, and the communication between the NB module and the network system through the NB antenna are respectively tested, and all test results are fed back to the test board through the serial port and then fed back to the upper computer test software.
Further, based on the above-mentioned embodiment of the present invention, referring to fig. 9, fig. 9 is a schematic diagram of a card swiping test of a radio frequency card according to an embodiment of the present invention.
When the radio frequency card swiping test is carried out,
the upper computer test software sends a radio frequency card swiping test instruction to the test board;
the test board controls a radio frequency card reading circuit in the tested board to start working based on the radio frequency card swiping test instruction;
the test board obtains the card reading information of the radio frequency card reading circuit and feeds the card reading information back to the upper computer test software.
In the embodiment, the radio frequency identification technology can complete non-contact communication between the card reader and the radio frequency card, and the application of the radio frequency identification technology to the intelligent lock can provide a card swiping door opening mode for a user, so that the use of the user is facilitated.
When the radio frequency card reading circuit part of the intelligent lock is abnormal, a user cannot unlock the intelligent lock in a card swiping mode, and therefore the radio frequency card swiping function of the intelligent lock is tested.
The upper computer test software sends a test instruction, namely a radio frequency card swiping test instruction, to the test board so as to control the radio frequency card reading circuit of the tested board to enter a working state, if the radio frequency card reading circuit can work normally, the radio frequency card reading circuit can read information of a radio frequency card installed on the test tool through an RFID technology, and if the radio frequency card reading circuit is abnormal, the information of the radio frequency card cannot be read, so that the radio frequency card swiping test of the tested board is completed.
And finally, feeding back the test result to the upper computer test software.
Through the above description, the test system of the PCBA board of the intelligent lock provided by the above embodiment of the present invention can download the firmware and test the functional module of the PCBA board used in the production process of the intelligent lock, so that a large amount of manual test time is saved.
In addition, the test system saves the complexity that the power consumption of the measurement system can be tested only by professional equipment (such as a universal meter and a power consumption tester), ensures the uniformity of the power consumption test standard of the system by a quantitative method, and improves the consistency of products.
And the assembly test of the PCBA boards to be tested in batch is completed through the cooperation of the upper computer test software, the test board and the test tool, the test process and the test result can be displayed in real time, the test result is stored in a test computer in a document format, and the unique number of each PCBA board to be tested and the label printed by the printer can be searched, so that the portability of problem tracing, production flow control and product quality control is greatly improved, and the cost of batch production of the intelligent lock is reduced.
Finally, the test data of the PCBA to-be-tested board can be automatically uploaded to the designated server through the network, so that the automatic remote monitoring of the PCBA test process is realized, the labor expenditure is reduced, and the accuracy and timeliness of statistics are improved.
The above detailed description is made on the testing system of the intelligent lock PCBA board provided by the present invention, and the principle and the implementation of the present invention are explained in the present document by applying specific examples, and the description of the above examples is only used to help understanding the method and the core idea of the present invention; meanwhile, for a person skilled in the art, according to the idea of the present invention, there may be variations in the specific embodiments and the application scope, and in summary, the content of the present specification should not be construed as a limitation to the present invention.
It should be noted that, in the present specification, the embodiments are all described in a progressive manner, each embodiment focuses on differences from other embodiments, and the same and similar parts among the embodiments may be referred to each other. The device disclosed by the embodiment corresponds to the method disclosed by the embodiment, so that the description is simple, and the relevant points can be referred to the method part for description.
It is further noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include or include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the invention. Thus, the present invention is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims (15)
1. A test system for an intelligent lock PCBA board, the test system comprising: the test system comprises a test computer, upper computer test software configured on the test computer and a test tool;
the test fixture comprises: the test board is arranged on the bearing structure;
the test board is connected with the test point of the tested board through the test probe;
the test board is in communication connection with the test computer;
the upper computer testing software is at least used for configuring testing parameters and generating testing instructions of corresponding testing tasks;
the test computer is at least used for operating the upper computer test software and sending the test instruction to the test board so that the test board can test the tested board.
2. The test system of claim 1, further comprising:
the printing subsystem is connected with the testing computer;
and the printing subsystem is used for printing the parameter information of the tested plate.
3. The test system of claim 1, further comprising: a server;
and the server is used for receiving the test record of the tested board uploaded by the upper computer test software.
4. The test system of claim 1, wherein the test fixture further comprises: the tested plate clamp is arranged on the bearing structure;
and the tested plate is fixed on the tested plate clamp.
5. The test system of claim 4, wherein the test fixture further comprises: a detection device;
the detection device is used for detecting whether the plate to be detected is fixed on the plate to be detected clamp or not.
6. The test system according to claim 1, wherein the test tasks comprise at least:
the method comprises the following steps of firmware downloading test, Bluetooth communication test, voice test, voltage acquisition test, GPIO test, power consumption test, key chip test, NB module networking test and radio frequency card swiping test.
7. The test system of claim 6, wherein when performing the firmware download test,
the upper computer test software sends a firmware downloading test instruction to the test board;
the test board downloads the firmware to the board to be tested based on the firmware downloading test instruction;
and the test board acquires a downloading result and feeds the downloading result back to the upper computer test software.
8. The test system of claim 6, wherein when performing the Bluetooth communication test,
the upper computer test software sends a Bluetooth communication test instruction to the test board;
and the test board acquires the physical address of the Bluetooth module in the tested board based on the Bluetooth communication test instruction, completes the Bluetooth communication test with the Bluetooth module according to the physical address and feeds back the test result to the upper computer test software.
9. The test system of claim 6, wherein, when performing the voice test,
the upper computer test software sends a voice test instruction to the test board;
the test board generates a voice playing instruction based on the voice test instruction so as to control the tested board to play voice;
and the test board judges the voice test result of the tested board based on the voice playing result and feeds the test result back to the upper computer test software.
10. The test system of claim 6, wherein when performing the voltage acquisition test,
the upper computer test software sends a voltage acquisition instruction to the test board;
the test board controls the tested board to carry out voltage acquisition based on the voltage acquisition instruction;
and the test board judges a voltage acquisition test result of the tested board based on the voltage acquisition result and feeds the test result back to the upper computer test software.
11. The test system of claim 6, wherein when performing the GPIO test,
the upper computer test software sends a GPIO test instruction to the test board;
the test board controls the tested board to output a high level or a low level to the configuration of the GPIO pins to be tested based on the GPIO test instruction;
and the test board acquires the level signal of the GPIO pin to be tested, judges the GPIO test result of the test board and feeds the test result back to the upper computer test software.
12. The test system of claim 6, wherein when performing the power consumption test,
the power consumption test comprises a sleep power consumption test and a normal power consumption test;
when the sleep power consumption test is performed,
the upper computer test software sends a sleep power consumption test instruction to the test board;
the test board controls the tested board to enter a sleep mode based on the sleep power consumption test instruction;
the test board acquires a sleep voltage signal of the tested board in the sleep mode, judges a sleep power consumption test result of the tested board and feeds the test result back to the upper computer test software;
when the normal power consumption test is performed,
the upper computer test software sends a normal power consumption test instruction to the test board;
the test board controls the tested board to enter a normal working mode based on the normal power consumption test instruction;
and the test board acquires a normal working voltage signal of the tested board in the normal working mode, judges a normal power consumption test result of the tested board and feeds the test result back to the upper computer test software.
13. The test system of claim 6, wherein when performing the key chip test,
the upper computer test software sends a key chip test instruction to the test board;
and the test board establishes communication connection with the key chip of the board to be tested based on the key chip test instruction, and feeds back a communication result to the upper computer test software.
14. The test system of claim 6, wherein when performing the NB module networking test,
the components of the NB module networking comprise: the system comprises an NB module, an SIM card and an NB antenna;
the upper computer test software sends an NB module networking test instruction to the test board;
the test board controls the NB module to establish communication connection with a main control chip of the tested board based on the NB module networking test instruction, the NB module establishes communication connection with the SIM card, the NB module establishes communication connection with a network system through the NB antenna, and a communication result is fed back to the upper computer test software.
15. The test system of claim 6, wherein when performing the radio frequency card swipe test,
the upper computer test software sends a radio frequency card swiping test instruction to the test board;
the test board controls a radio frequency card reading circuit in the tested board to start working based on the radio frequency card swiping test instruction;
the test board obtains the card reading information of the radio frequency card reading circuit and feeds the card reading information back to the upper computer test software.
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113721089A (en) * | 2021-08-04 | 2021-11-30 | 广州安凯微电子股份有限公司 | Automatic testing arrangement of intelligence lock and system |
| CN114088991A (en) * | 2021-11-08 | 2022-02-25 | 广东乐心医疗电子股份有限公司 | Circuit board testing method, device and system |
Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105182371A (en) * | 2015-10-08 | 2015-12-23 | 上海华测导航技术股份有限公司 | GNSS product automatic test method based on function test |
| CN105374202A (en) * | 2015-12-14 | 2016-03-02 | 四川长虹电子部品有限公司 | Radio frequency remote controller automatic test system |
| US20180003764A1 (en) * | 2016-07-01 | 2018-01-04 | Intel Corporation | Systems and methods for wireless device testing |
| CN108037444A (en) * | 2017-12-29 | 2018-05-15 | 广州市中海达测绘仪器有限公司 | GNSS PCBA automatization test systems and its application process |
| CN108184243A (en) * | 2018-01-08 | 2018-06-19 | 东莞市慧眼数字技术有限公司 | Signal tester and signal test system based on NB-IOT networks |
| CN109918241A (en) * | 2019-02-21 | 2019-06-21 | 广州技象科技有限公司 | A kind of smart lock production test method |
| CN110308385A (en) * | 2019-07-19 | 2019-10-08 | 惠尔丰(中国)信息系统有限公司 | A kind of PCBA Online Transaction Processing and method |
| CN110456259A (en) * | 2019-08-19 | 2019-11-15 | 深圳坚朗海贝斯智能科技有限公司 | PCBA single-board testing method and test macro |
| CN111343559A (en) * | 2020-03-10 | 2020-06-26 | 深圳市众智高新电子科技有限公司 | Automatic testing system and method for Bluetooth audio product |
| CN111751143A (en) * | 2020-07-17 | 2020-10-09 | 苏州琨山智能科技有限公司 | Intelligent lock testing system, method, device and storage medium |
-
2020
- 2020-12-02 CN CN202011399593.5A patent/CN112595956A/en active Pending
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105182371A (en) * | 2015-10-08 | 2015-12-23 | 上海华测导航技术股份有限公司 | GNSS product automatic test method based on function test |
| CN105374202A (en) * | 2015-12-14 | 2016-03-02 | 四川长虹电子部品有限公司 | Radio frequency remote controller automatic test system |
| US20180003764A1 (en) * | 2016-07-01 | 2018-01-04 | Intel Corporation | Systems and methods for wireless device testing |
| CN108037444A (en) * | 2017-12-29 | 2018-05-15 | 广州市中海达测绘仪器有限公司 | GNSS PCBA automatization test systems and its application process |
| CN108184243A (en) * | 2018-01-08 | 2018-06-19 | 东莞市慧眼数字技术有限公司 | Signal tester and signal test system based on NB-IOT networks |
| CN109918241A (en) * | 2019-02-21 | 2019-06-21 | 广州技象科技有限公司 | A kind of smart lock production test method |
| CN110308385A (en) * | 2019-07-19 | 2019-10-08 | 惠尔丰(中国)信息系统有限公司 | A kind of PCBA Online Transaction Processing and method |
| CN110456259A (en) * | 2019-08-19 | 2019-11-15 | 深圳坚朗海贝斯智能科技有限公司 | PCBA single-board testing method and test macro |
| CN111343559A (en) * | 2020-03-10 | 2020-06-26 | 深圳市众智高新电子科技有限公司 | Automatic testing system and method for Bluetooth audio product |
| CN111751143A (en) * | 2020-07-17 | 2020-10-09 | 苏州琨山智能科技有限公司 | Intelligent lock testing system, method, device and storage medium |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113721089A (en) * | 2021-08-04 | 2021-11-30 | 广州安凯微电子股份有限公司 | Automatic testing arrangement of intelligence lock and system |
| CN114088991A (en) * | 2021-11-08 | 2022-02-25 | 广东乐心医疗电子股份有限公司 | Circuit board testing method, device and system |
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