CN110133478A - Abnormal detection circuit, method, apparatus and medium - Google Patents

Abnormal detection circuit, method, apparatus and medium Download PDF

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Publication number
CN110133478A
CN110133478A CN201910419862.0A CN201910419862A CN110133478A CN 110133478 A CN110133478 A CN 110133478A CN 201910419862 A CN201910419862 A CN 201910419862A CN 110133478 A CN110133478 A CN 110133478A
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China
Prior art keywords
measured
voltage
circuit
abnormal
key circuit
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CN201910419862.0A
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Chinese (zh)
Inventor
刘航冉
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Shanghai Wingtech Electronic Technology Co Ltd
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Shanghai Wingtech Electronic Technology Co Ltd
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Priority to CN201910419862.0A priority Critical patent/CN110133478A/en
Publication of CN110133478A publication Critical patent/CN110133478A/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2812Checking for open circuits or shorts, e.g. solder bridges; Testing conductivity, resistivity or impedance
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2813Checking the presence, location, orientation or value, e.g. resistance, of components or conductors

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)

Abstract

The embodiment of the invention discloses a kind of abnormal detection circuit, method, apparatus and media, are related to abnormality detection technical field.The abnormal detection circuit includes: at least one circuit under test module and abnormality detection module, wherein, circuit under test module one end connects power supply, other end ground connection, the circuit under test module includes key circuit to be measured, and at least one and the concatenated resistance of key circuit to be measured, the resistance are used to simulate the resistance of the key circuit to be measured over the ground;The abnormality detection module is connect with the circuit under test module, carries out abnormal judgement for detecting the voltage at key circuit both ends to be measured, and according to the voltage of detection.The embodiment of the present invention is detected by voltage of the abnormality detection module in abnormal detection circuit to key circuit both ends to be measured, determine whether key circuit to be measured is abnormal according to voltage, to intercept abnormal key circuit, the yield of output is improved, market repair rate is reduced.

Description

Abnormal detection circuit, method, apparatus and medium
Technical field
The present embodiments relate to abnormality detection technical field more particularly to a kind of abnormal detection circuit, method, apparatus and Medium.
Background technique
FPC (Flexible Printed Circuit flexible electric circuit board, also known as flexible circuit board) be with polyester film or Polyimides is substrate, manufactured and form route by being etched on copper foil a kind of to have height reliability, excellent flexibility Printed circuit.FPC also has many advantages, such as good thermal diffusivity and solderability and is easy to that load, cost is relatively low, soft or hard combination Design also to compensate for flexible parent metal to a certain extent slightly insufficient in element bearing capacity.Therefore, current intelligence is whole End equipment largely carries out human-computer interaction by the way of side switch FPC, when to realize switching on and shutting down, the functions such as adjusting volume.
Under normal circumstances, the resistance value of key based on FPC itself can be considered as zero.But in process of production due to technique Problem can be introduced into impurity or foreign matter etc. into the printed circuit of FPC, " micro-short circuit " occur so as to cause the key inside based on FPC Phenomenon, so that the key based on FPC has certain resistance value.The resistance value will be so that according to ohm law system to based on FPC Key-press status make erroneous judgement, such as the off-state of key is mistaken for closed state;Or the closed state quilt of some key It is mistaken for the closed state of another key.
Summary of the invention
The embodiment of the present invention provides a kind of abnormal detection circuit, method, apparatus and medium, with solve in production process due to The problem of technological problems can be introduced into impurity or foreign matter etc. into the printed circuit of FPC, enter market so as to cause abnormal key.
In a first aspect, the abnormal detection circuit includes: at least the embodiment of the invention provides a kind of abnormal detection circuit One circuit under test module and abnormality detection module, wherein
Circuit under test module one end connects power supply, and other end ground connection, the circuit under test module includes key to be measured Circuit and at least one and the concatenated resistance of key circuit to be measured, the resistance is for simulating the key electricity to be measured The resistance of road over the ground;
The abnormality detection module is connect with the circuit under test module, for detecting the electricity at key circuit both ends to be measured Pressure, and abnormal judgement is carried out according to the voltage of detection.
Second aspect, the embodiment of the invention provides a kind of method for detecting abnormality, are applied to any in the embodiment of the present invention The abnormal detection circuit, which comprises
Obtain the voltage at key circuit both ends to be measured;
According to the voltage at the key circuit both ends to be measured, abnormal judgement is carried out to key circuit to be measured.
The third aspect is configured at any in the embodiment of the present invention the embodiment of the invention provides a kind of abnormal detector The abnormal detection circuit, described device include:
Voltage obtains module, for obtaining the voltage at key circuit both ends to be measured;
Abnormal judgment module carries out key circuit to be measured different for the voltage according to the key circuit both ends to be measured Often judgement.
Fourth aspect, the embodiment of the invention provides a kind of computer readable storage mediums, are stored thereon with computer journey Sequence realizes the method for detecting abnormality as described in any in the embodiment of the present invention when program is executed by processor.
The embodiment of the present invention is pressed according to the voltage value of acquisition to be measured by obtaining the voltage at key circuit both ends to be measured Key circuit carries out abnormal judgement.Because being capable of detecting when the resistance of key circuit to be measured by voltage value.And under normal condition, if Key switch is to press, and the resistance of key circuit to be measured is approximately zero;The resistance of key circuit to be measured if key switch disconnects It is approximate infinitely great.Accordingly, abnormal judgement is carried out to key circuit to be measured according to the resistance of detection.Under abnormal key is intercepted Come, to improve the yield of output, reduces market repair rate.
Detailed description of the invention
In order to illustrate the technical solution of the embodiments of the present invention more clearly, below will be to needed in the embodiment attached Figure is briefly described, it should be understood that the following drawings illustrates only certain embodiments of the present invention, therefore is not construed as pair The restriction of range for those of ordinary skill in the art without creative efforts, can also be according to this A little attached drawings obtain other relevant attached drawings.
Figure 1A is several abnormal schematic diagrames common based on FPC key inside circuit;
Figure 1B is a kind of structural schematic diagram for abnormal detection circuit that the embodiment of the present invention one provides;
Fig. 1 C is a kind of structural schematic diagram for key to be measured that the embodiment of the present invention one provides;
Fig. 1 D is a kind of structure for abnormal detection circuit including 3 circuit under test modules that the embodiment of the present invention one provides Schematic diagram;
Fig. 2 is a kind of flow chart of method for detecting abnormality provided by Embodiment 2 of the present invention;
Fig. 3 is a kind of structural schematic diagram for abnormal detector that the embodiment of the present invention three provides.
Specific embodiment
The embodiment of the present invention is described in further detail with reference to the accompanying drawings and examples.It is understood that this Locate described specific embodiment and is used only for explaining the embodiment of the present invention, rather than limitation of the invention.It further needs exist for Bright, only parts related to embodiments of the present invention are shown for ease of description, in attached drawing rather than entire infrastructure.
Since side switch FPC belongs to one kind of PCB, in process of production since technological problems can introduce impurity or foreign matter etc. extremely In printed wire, occur so as to cause internal circuit abnormal.Referring to Figure 1A, the figure shows normal based on FPC key inside circuit Several exceptions seen: complete open circuit (fine open) 101, dead short (fine short) 102 and route notch (nicks) 103, the black portions in figure are the impurity or foreign matter being introduced into printed wire 104.These exceptions often lead to the electricity of side switch FPC Resistance is abnormal.
Specifically, abnormal for fine short, if short dot caused by impurity or foreign matter is sufficiently small, according to resistance R The more big corresponding resistance value of the smaller resistance of=ρ * L/S, S is also just big, otherwise the more big corresponding resistance value of S is also just small.Wherein R is circuit Resistance, ρ are the resistivity of circuit printing material (such as copper product), and L is the length of circuit, and S is the transversal of short-circuit point circuit Area.
Embodiment one
Figure 1B is a kind of structural schematic diagram for abnormal detection circuit that the embodiment of the present invention one provides.The present embodiment can fit The case where for being carried out abnormality detection to circuit.Typically, the present embodiment is applicable to carry out fine to the key based on FPC The case where abnormality detection of open, fine short and nicks.As shown in Figure 1B, which includes: at least one Circuit under test module 105 and abnormality detection module 106.
Wherein, 105 one end of circuit under test module connects power supply, other end ground connection.
Circuit under test module 105 includes a key circuit 107 to be measured and at least one and key circuit 107 to be measured Concatenated resistance 108, resistance 108 are variable resistance for simulating the resistance of key circuit 107 to be measured over the ground, specific resistance value according to Actual needs is really.
Specifically, key circuit 107 to be measured can be on state or off-state.
To realize the abnormality detection for carrying out on state or off-state to key circuit 107 to be measured, circuit under test module 105 further include key switch 109, and key switch 109 is set in key circuit 107 to be measured, for controlling key circuit to be measured 107 on-off.
The quantity of circuit under test module 105 is determined according to the quantity of key circuit to be measured.Optionally, circuit under test module 105 quantity can be 1,2 or more, and the present embodiment does not limit this.
Specifically, abnormality detection module 106 includes: voltage acquisition unit 110 and abnormal deciding means 111, wherein
Voltage acquisition unit 110 is connect with circuit under test module 105, for acquiring the electricity at 107 both ends of key circuit to be measured Pressure;
Abnormal deciding means 111 is connect with voltage acquisition unit 110, for according to 107 liang of key circuit to be measured of acquisition The voltage at end carries out abnormal judgement.
To realize that voltage acquisition unit 110 includes: operational amplifier 112 and voltage to the amplification of the voltage signal of acquisition Collector 113, wherein
Operational amplifier 112 is connect with circuit under test module 105, for amplifying to the electric signal of acquisition;
Voltage collector 113 is connect with operational amplifier 112, for determining key to be measured according to amplified electric signal The voltage at 107 both ends of circuit.
Optionally, voltage collector 113 can be free voltage sampler.Typically, voltage collector 113 can be ADC (Analog-to-Digital Converter, A/D converter) voltage collecting device.
Abnormal deciding means 111 can be arbitrarily can be based on the device or device that the voltage of acquisition is judged extremely.Tool Body, abnormal deciding means 111 is the terminal with display screen, for showing to judging result, optionally, when acquisition When voltage is belonged in normal voltage range, then the voltage value obtained is green display, and marks " qualification ";When acquisition voltage not When belonging in normal voltage range, then the voltage value obtained is red display, and marks "abnormal".
Exemplary, it is side switch FPC 114 referring to Fig. 1 C key to be measured, wherein side switch FPC 114 is the side based on FPC Key.The key circuit to be measured that side switch FPC 114 includes, respectively booting 115 marketing or promotion circuit 116 of key circuit and volume down Key circuit 117.Side switch FPC 114 further includes the cathode 118 for connecting each key circuit.
Referring to Fig. 1 D, continue using key to be measured as side switch FPC 114, the key circuit to be measured that side switch FPC 114 includes, point It Wei not be switched on for key circuit 119, marketing or promotion circuit 120 and volume down key circuit 121.Abnormal detection circuit include 3 to Slowdown monitoring circuit module, each circuit under test module include that a key circuit to be measured and one simulate key circuit to be measured over the ground Resistance.
With continued reference to Fig. 1 D, the operational amplifier 112 in abnormality detection module adds with booting key circuit 119, volume respectively Key circuit 120 and volume down key circuit 121 connect.ADC voltage collecting device 123 is connected with operational amplifier 112 for detecting Be switched on key circuit 119,121 both ends of marketing or promotion circuit 120 and volume down key circuit voltage.Host computer 124 and ADC voltage is adopted Acquisition means 123 are connected, and for carrying out abnormal judgement according to the voltage of detection, and show judging result.
The embodiment of the present invention is by the abnormality detection module in abnormal detection circuit to the voltage at key circuit both ends to be measured It is detected, is capable of detecting when whether the resistance of key circuit to be measured is abnormal, so that the key of abnormal resistance be intercepted, mentions The high yield of output, reduces market repair rate.
Embodiment two
Fig. 2 is a kind of flow chart of method for detecting abnormality provided by Embodiment 2 of the present invention, and the present embodiment can be adapted for The case where carrying out abnormality detection to circuit, this method can be applied to any abnormality detection electricity in the embodiment of the present invention Road.This method can be executed by a kind of abnormal detector, which can be realized by the mode of software and/or hardware.Ginseng See that Fig. 2, method for detecting abnormality provided in this embodiment include:
Step 201, the voltage for obtaining key circuit both ends to be measured.
Specifically, the voltage for obtaining key circuit both ends to be measured includes: that the key 1) being set in key circuit to be measured is opened When closing conjunction, the voltage at key circuit both ends to be measured;2) it is to be measured to press when the key switch being set in key circuit to be measured disconnects The voltage at key circuit both ends.
Step 202, according to the voltage at key circuit both ends to be measured, abnormal judgement is carried out to key circuit to be measured.
Specifically, the Novel presentation of key circuit to be measured is including:
1) resistance of key circuit to be measured becomes some numerical value from zero;Wherein, key circuit to be measured key circuit to be measured Specific resistance value is related with the intensity of anomaly of key circuit to be measured, and the more big then resistance value of intensity of anomaly is bigger, abnormal journey It is smaller to spend smaller then resistance value, and key circuit resistance to be measured can then be embodied in its both end voltage of acquisition numerically extremely.
2) since resistance occurs in key circuit to be detected, cause key circuit to be measured that can become connecting shape in open-circuit condition State.
Optionally, if the voltage at key circuit both ends to be measured is voltage when key switch disconnects, judge key to be measured The voltage at circuit both ends whether be less than disconnect abnormal voltage threshold value, wherein disconnect abnormal voltage threshold value according to supply voltage and with to The concatenated resistance of key circuit is surveyed to determine;If so, determining that key circuit to be measured is abnormal.
Illustratively, it is assumed that supply voltage 1.8V, key switch disconnect, and qualified key circuit to be detected is to open at this time Line state, so the voltage at qualified key circuit both ends to be measured is equal to supply voltage, i.e. 1.8V;And it is abnormal at this time to be detected Key circuit is on-state, and can have some resistance value, the resistance point of abnormal key circuit to be detected meeting series connection with it Pressure, so the voltage at abnormal key circuit both ends to be detected is less than 1.8V.Assuming that being with the concatenated resistance of key circuit to be measured 8M ohm, rule of thumb optionally, when key switch disconnects, if abnormal key circuit resistance to be detected is greater than 136M Ohm, is not in misjudgment phenomenon at this time, then disconnects abnormal voltage threshold value are as follows: 1.8 × 136/ (136+8)=1.7V work as key When switch disconnects, the voltage at key circuit both ends to be detected is less than 1.7V, it is determined that key circuit to be detected is abnormal.
Optionally, if the voltage at key circuit both ends to be measured is voltage when key switch is closed, judge key to be measured The voltage at circuit both ends whether be greater than closure abnormal voltage threshold value, wherein closure abnormal voltage threshold value according to supply voltage and with to The concatenated resistance of key circuit is surveyed to determine;If so, determining that key circuit to be measured is abnormal.
Illustratively, it is assumed that supply voltage 1.8V, key switch closure, qualified key circuit to be detected is short at this time Line state, so the voltage at qualified key circuit both ends to be measured is equal to 0V;And key circuit to be detected abnormal at this time is to connect Logical state, and some resistance value can be had, the electric resistance partial pressure of abnormal key circuit to be detected meeting series connection with it, so abnormal The voltage at key circuit both ends to be detected is greater than 0V.Assuming that being 8M ohm with the concatenated resistance of key circuit to be measured, rule of thumb It optionally, is at this time not in miss if abnormal key circuit resistance to be detected is less than 470K ohm when key switch is closed Sentence phenomenon, is then closed abnormal voltage threshold value are as follows: 1.8 × 0.47/ (0.47+8)=0.1V, i.e., it is to be checked when key switch is closed The voltage for surveying key circuit both ends is greater than 0.1V, it is determined that key circuit to be detected is abnormal.
By the voltage for obtaining key switch under open and close two states, respectively with closure abnormal voltage threshold value It is compared with abnormal voltage threshold value is disconnected, finally determines whether slowdown monitoring circuit to be checked is abnormal, and the judging result obtained in this way is accurate Rate is higher, avoids abnormal products and enters market.
The present embodiment additionally provides a kind of concrete application scene for realizing method for detecting abnormality, will be integrated with key to be detected The FPC device of circuit is placed on detection fixture, is detected and is equipped with abnormal detection circuit provided by the above embodiment in fixture, and has Have and be equipped with the corresponding button of each key switch with the key switch and the probe that is in contact of cathode on FPC device, detection fixture, Testing staff can realize closure/disconnection of corresponding key switches by control button, operational amplifier, ADC acquisition device and Host computer is connected by the interface on detection fixture with key circuit to be detected.Under the specific environment, through the above steps 201 The abnormal judgement of key circuit to be detected can be realized with above-mentioned steps 202.
The embodiment of the present invention carries out key circuit to be measured different by the voltage according to the key circuit both ends to be measured of acquisition Often judgement is capable of detecting when whether the resistance of key circuit to be measured is abnormal, so that the key of abnormal resistance be intercepted, improves The yield of output, reduces market repair rate.
Embodiment three
Fig. 3 is a kind of structural schematic diagram for abnormal detector that the embodiment of the present invention three provides.The abnormal detector It is configured in abnormal detection circuit, method for detecting abnormality provided by any embodiment of the present invention can be performed, have execution method Corresponding functional module and beneficial effect.As shown in figure 3, the apparatus may include:
Voltage obtains module 31, for obtaining the voltage at key circuit both ends to be measured;
Abnormal judgment module 32 carries out key circuit to be measured abnormal for the voltage according to key circuit both ends to be measured Judgement.
On the basis of the above embodiments, abnormal judgment module 32, is specifically used for:
If the voltage at key circuit both ends to be measured is voltage when key switch disconnects, key circuit both ends to be measured are judged Voltage whether be less than and disconnect abnormal voltage threshold value, wherein disconnect abnormal voltage threshold value according to supply voltage and with key to be measured electricity The concatenated resistance in road determines;
If so, determining that key circuit to be measured is abnormal.
On the basis of the above embodiments, abnormal judgment module 32, is specifically also used to:
If the voltage when voltage at key circuit both ends to be measured is key switch closure, judges key circuit both ends to be measured Voltage whether be greater than closure abnormal voltage threshold value, wherein closure abnormal voltage threshold value according to supply voltage and with key to be measured electricity The concatenated resistance in road determines;
If so, determining that key circuit to be measured is abnormal.
A kind of abnormal detector provided by the embodiment of the present invention, the abnormal detector are configured at abnormal detection circuit In, method for detecting abnormality provided by any embodiment of the present invention can be performed, have the corresponding functional module of execution method and have Beneficial effect.The not technical detail of detailed description in the present embodiment, reference can be made to being examined extremely provided by any embodiment of the present invention Survey method.
Example IV
The embodiment of the present invention four additionally provides a kind of computer readable storage medium, and computer executable instructions are by calculating For executing a kind of method for detecting abnormality when machine processor executes, this method comprises:
Obtain the voltage at key circuit both ends to be measured;
According to the voltage at key circuit both ends to be measured, abnormal judgement is carried out to key circuit to be measured.
Certainly, a kind of storage medium comprising computer executable instructions, computer provided by the embodiment of the present invention The method operation that executable instruction is not limited to the described above, can also be performed a kind of exception provided by any embodiment of the invention Relevant operation in detection method.The computer readable storage medium of the embodiment of the present invention can be calculated using one or more Any combination of the readable medium of machine.Computer-readable medium can be computer-readable signal media or computer-readable deposit Storage media.Computer readable storage medium for example may be-but not limited to-electricity, magnetic, optical, electromagnetic, infrared ray or half System, device or the device of conductor, or any above combination.The more specific example of computer readable storage medium is (non- The list of exhaustion) it include: the electrical connection with one or more conducting wires, portable computer diskette, hard disk, random access memory Device (RAM), read-only memory (ROM), erasable programmable read only memory (EPROM or flash memory), optical fiber, Portable, compact magnetic Disk read-only memory (CD-ROM), light storage device, magnetic memory device or above-mentioned any appropriate combination.In this document In, computer readable storage medium can be any tangible medium for including or store program, which can be commanded execution System, device or device use or in connection.
Computer-readable signal media may include in a base band or as carrier wave a part propagate data-signal, Wherein carry computer-readable program code.The data-signal of this propagation can take various forms, including but unlimited In electromagnetic signal, optical signal or above-mentioned any appropriate combination.Computer-readable signal media can also be that computer can Any computer-readable medium other than storage medium is read, which can send, propagates or transmit and be used for By the use of instruction execution system, device or device or program in connection.
The program code for including on computer-readable medium can transmit with any suitable medium, including --- but it is unlimited In wireless, electric wire, optical cable, RF etc. or above-mentioned any appropriate combination.
The computer for executing operation of the present invention can be write with one or more programming languages or combinations thereof Program code, described program design language include object oriented program language-such as Java, Smalltalk, C++, It further include conventional procedural programming language-such as " C " language or similar programming language.Program code can be with It fully executes, partly execute on the user computer on the user computer, being executed as an independent software package, portion Divide and partially executes or executed on a remote computer or server completely on the remote computer on the user computer.? Be related in the situation of remote computer, remote computer can pass through the network of any kind --- including local area network (LAN) or Wide area network (WAN)-be connected to subscriber computer, or, it may be connected to outer computer (such as mentioned using Internet service It is connected for quotient by internet).
Note that the above is only a better embodiment of the present invention and the applied technical principle.It will be appreciated by those skilled in the art that The invention is not limited to the specific embodiments described herein, be able to carry out for a person skilled in the art it is various it is apparent variation, It readjusts and substitutes without departing from protection scope of the present invention.Therefore, although being carried out by above embodiments to the present invention It is described in further detail, but the present invention is not limited to the above embodiments only, without departing from the inventive concept, also It may include more other equivalent embodiments, and the scope of the invention is determined by the scope of the appended claims.

Claims (11)

1. a kind of abnormal detection circuit, which is characterized in that the abnormal detection circuit include: at least one circuit under test module and Abnormality detection module, wherein
Circuit under test module one end connects power supply, and other end ground connection, the circuit under test module includes key circuit to be measured, And at least one and the concatenated resistance of key circuit to be measured, the resistance are used to simulate the key circuit to be measured over the ground Resistance;
The abnormality detection module is connect with the circuit under test module, for detecting the electricity at the key circuit both ends to be measured Pressure, and abnormal judgement is carried out according to the voltage of detection.
2. abnormal detection circuit according to claim 1, which is characterized in that the circuit under test module further includes that key is opened It closes, the key switch is set in the key circuit to be measured, for controlling the on-off of the key circuit to be measured.
3. abnormal detection circuit according to claim 1, which is characterized in that the abnormality detection module includes: that voltage is adopted Collect unit and abnormal deciding means, wherein
The voltage acquisition unit is connect with the circuit under test module, for acquiring the electricity at the key circuit both ends to be measured Pressure;
The abnormal deciding means is connect with the voltage acquisition unit, for the key circuit two to be measured according to acquisition The voltage at end carries out abnormal judgement.
4. abnormal detection circuit according to claim 3, which is characterized in that the voltage acquisition unit includes: that operation is put Big device and voltage collector, wherein
The operational amplifier is connect with the circuit under test module, for amplifying to the electric signal of acquisition;
The voltage collector is connect with the operational amplifier, for determining key electricity to be measured according to amplified electric signal The voltage at road both ends.
5. a kind of method for detecting abnormality, which is characterized in that the described method includes:
Obtain the voltage at key circuit both ends to be measured;
According to the voltage at the key circuit both ends to be measured, abnormal judgement is carried out to key circuit to be measured.
6. method for detecting abnormality according to claim 5, which is characterized in that described according to the key circuit both ends to be measured Voltage, abnormal judgement is carried out to key circuit to be measured, comprising:
If the voltage at the key circuit both ends to be measured is voltage when key switch disconnects, the key circuit to be measured is judged The voltage at both ends whether be less than disconnect abnormal voltage threshold value, wherein the disconnection abnormal voltage threshold value according to supply voltage and with institute The concatenated resistance of key circuit to be measured is stated to determine;
If so, determining that the key circuit to be measured is abnormal.
7. method for detecting abnormality according to claim 5, which is characterized in that described according to the key circuit both ends to be measured Voltage, abnormal judgement is carried out to key circuit to be measured, comprising:
If the voltage when voltage at the key circuit both ends to be measured is key switch closure, judges the key circuit to be measured The voltage at both ends whether be greater than closure abnormal voltage threshold value, wherein the closure abnormal voltage threshold value according to supply voltage and with institute The concatenated resistance of key circuit to be measured is stated to determine;
If so, determining that the key circuit to be measured is abnormal.
8. a kind of abnormal detector, is configured in abnormal detection circuit, which is characterized in that described device includes:
Voltage obtains module, for obtaining the voltage at key circuit both ends to be measured;
Abnormal judgment module carries out exception to key circuit to be measured and sentences for the voltage according to the key circuit both ends to be measured It is disconnected.
9. abnormal detector according to claim 8, which is characterized in that the exception judgment module is specifically used for:
If the voltage at the key circuit both ends to be measured is voltage when key switch disconnects, the key circuit to be measured is judged The voltage at both ends whether be less than disconnect abnormal voltage threshold value, wherein the disconnection abnormal voltage threshold value according to supply voltage and with institute The concatenated resistance of key circuit to be measured is stated to determine;
If so, determining that the key circuit to be measured is abnormal.
10. device according to claim 8, which is characterized in that the exception judgment module is specifically also used to:
If the voltage when voltage at the key circuit both ends to be measured is key switch closure, judges the key circuit to be measured The voltage at both ends whether be greater than closure abnormal voltage threshold value, wherein the closure abnormal voltage threshold value according to supply voltage and with institute The concatenated resistance of key circuit to be measured is stated to determine;
If so, determining that the key circuit to be measured is abnormal.
11. a kind of computer readable storage medium, is stored thereon with computer program, which is characterized in that the program is by processor The method for detecting abnormality as described in any in claim 5-7 is realized when execution.
CN201910419862.0A 2019-05-20 2019-05-20 Abnormal detection circuit, method, apparatus and medium Pending CN110133478A (en)

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CN110888093A (en) * 2019-11-29 2020-03-17 Tcl移动通信科技(宁波)有限公司 Display screen connection detection method and device, computer readable storage medium and terminal
CN112492303A (en) * 2020-11-27 2021-03-12 深圳创维-Rgb电子有限公司 Key response abnormity repairing method, terminal and storage medium
CN113267119A (en) * 2020-02-17 2021-08-17 法雷奥汽车内部控制(深圳)有限公司 Angle and/or torque sensor system and method applied thereto
CN113376544A (en) * 2020-03-10 2021-09-10 安徽精卓光显技术有限责任公司 Method and device for detecting circuit abnormality in film material, storage medium and terminal
CN115291101A (en) * 2022-10-08 2022-11-04 浙江正泰电器股份有限公司 Abnormality detection method, apparatus, system, and computer-readable storage medium

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Application publication date: 20190816