CN110108235A - 多目测量装置和多目测量方法 - Google Patents
多目测量装置和多目测量方法 Download PDFInfo
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- CN110108235A CN110108235A CN201910530359.2A CN201910530359A CN110108235A CN 110108235 A CN110108235 A CN 110108235A CN 201910530359 A CN201910530359 A CN 201910530359A CN 110108235 A CN110108235 A CN 110108235A
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- 238000000691 measurement method Methods 0.000 title claims description 27
- 230000003287 optical effect Effects 0.000 claims abstract description 134
- 238000001228 spectrum Methods 0.000 claims abstract description 102
- 238000003384 imaging method Methods 0.000 claims description 20
- 238000002310 reflectometry Methods 0.000 claims description 19
- 238000005259 measurement Methods 0.000 abstract description 49
- 238000000034 method Methods 0.000 description 10
- 238000010586 diagram Methods 0.000 description 8
- 238000009434 installation Methods 0.000 description 6
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- PCTMTFRHKVHKIS-BMFZQQSSSA-N (1s,3r,4e,6e,8e,10e,12e,14e,16e,18s,19r,20r,21s,25r,27r,30r,31r,33s,35r,37s,38r)-3-[(2r,3s,4s,5s,6r)-4-amino-3,5-dihydroxy-6-methyloxan-2-yl]oxy-19,25,27,30,31,33,35,37-octahydroxy-18,20,21-trimethyl-23-oxo-22,39-dioxabicyclo[33.3.1]nonatriaconta-4,6,8,10 Chemical compound C1C=C2C[C@@H](OS(O)(=O)=O)CC[C@]2(C)[C@@H]2[C@@H]1[C@@H]1CC[C@H]([C@H](C)CCCC(C)C)[C@@]1(C)CC2.O[C@H]1[C@@H](N)[C@H](O)[C@@H](C)O[C@H]1O[C@H]1/C=C/C=C/C=C/C=C/C=C/C=C/C=C/[C@H](C)[C@@H](O)[C@@H](C)[C@H](C)OC(=O)C[C@H](O)C[C@H](O)CC[C@@H](O)[C@H](O)C[C@H](O)C[C@](O)(C[C@H](O)[C@H]2C(O)=O)O[C@H]2C1 PCTMTFRHKVHKIS-BMFZQQSSSA-N 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
- G01B11/27—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes
Abstract
Description
Claims (10)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN201910530359.2A CN110108235B (zh) | 2019-06-19 | 多目测量装置和多目测量方法 |
Applications Claiming Priority (1)
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CN201910530359.2A CN110108235B (zh) | 2019-06-19 | 多目测量装置和多目测量方法 |
Publications (2)
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CN110108235A true CN110108235A (zh) | 2019-08-09 |
CN110108235B CN110108235B (zh) | 2024-05-10 |
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Citations (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005189785A (ja) * | 2003-12-24 | 2005-07-14 | Tatsushi Nishioka | 双眼観察装置 |
KR100612933B1 (ko) * | 2005-12-14 | 2006-08-14 | 주식회사 고영테크놀러지 | 3차원 형상 측정장치 및 방법 |
JP2008039750A (ja) * | 2006-08-03 | 2008-02-21 | Kaneyuki Kubodera | 高さ測定装置 |
CN101865654A (zh) * | 2010-05-21 | 2010-10-20 | 沈阳工业大学 | 一种三维场中空间位置分光测量方法及装置 |
US20100265490A1 (en) * | 2009-04-16 | 2010-10-21 | Kamakura Koki Co., Ltd | Range binoculars |
CN103292710A (zh) * | 2013-05-27 | 2013-09-11 | 华南理工大学 | 一种应用双目视觉视差测距原理的距离测量方法 |
CN104359461A (zh) * | 2014-11-06 | 2015-02-18 | 中国人民解放军装备学院 | 一种可变结构的双目视觉测量系统及参数确定方法 |
KR20150049855A (ko) * | 2013-10-31 | 2015-05-08 | 주식회사 휴비츠 | 양안용 시각 모의 실험 장치 |
KR101712004B1 (ko) * | 2015-12-24 | 2017-03-03 | 한국과학기술연구원 | 양안 초점 조절반응 측정장치 |
CN106713897A (zh) * | 2017-02-27 | 2017-05-24 | 驭势科技(北京)有限公司 | 双目相机以及用于双目相机的自校准方法 |
WO2017143696A1 (zh) * | 2016-02-23 | 2017-08-31 | 京东方科技集团股份有限公司 | 测距模组、三维扫描系统以及测距方法 |
EP3388780A1 (de) * | 2017-04-13 | 2018-10-17 | Carl Zeiss Vision International GmbH | Verfahren und vorrichtung für das referenzieren der lage wenigstens eines punkts auf oder in einem transparenten gegenstand |
JP2019075385A (ja) * | 2019-01-25 | 2019-05-16 | オムロン株式会社 | 光源装置およびこれを備えた測距センサ |
CN209894134U (zh) * | 2019-06-19 | 2020-01-03 | 二八六视觉科技(佛山)有限责任公司 | 多目测量装置 |
Patent Citations (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005189785A (ja) * | 2003-12-24 | 2005-07-14 | Tatsushi Nishioka | 双眼観察装置 |
KR100612933B1 (ko) * | 2005-12-14 | 2006-08-14 | 주식회사 고영테크놀러지 | 3차원 형상 측정장치 및 방법 |
JP2008039750A (ja) * | 2006-08-03 | 2008-02-21 | Kaneyuki Kubodera | 高さ測定装置 |
US20100265490A1 (en) * | 2009-04-16 | 2010-10-21 | Kamakura Koki Co., Ltd | Range binoculars |
CN101865654A (zh) * | 2010-05-21 | 2010-10-20 | 沈阳工业大学 | 一种三维场中空间位置分光测量方法及装置 |
CN103292710A (zh) * | 2013-05-27 | 2013-09-11 | 华南理工大学 | 一种应用双目视觉视差测距原理的距离测量方法 |
KR20150049855A (ko) * | 2013-10-31 | 2015-05-08 | 주식회사 휴비츠 | 양안용 시각 모의 실험 장치 |
CN104359461A (zh) * | 2014-11-06 | 2015-02-18 | 中国人民解放军装备学院 | 一种可变结构的双目视觉测量系统及参数确定方法 |
KR101712004B1 (ko) * | 2015-12-24 | 2017-03-03 | 한국과학기술연구원 | 양안 초점 조절반응 측정장치 |
WO2017143696A1 (zh) * | 2016-02-23 | 2017-08-31 | 京东方科技集团股份有限公司 | 测距模组、三维扫描系统以及测距方法 |
CN106713897A (zh) * | 2017-02-27 | 2017-05-24 | 驭势科技(北京)有限公司 | 双目相机以及用于双目相机的自校准方法 |
EP3388780A1 (de) * | 2017-04-13 | 2018-10-17 | Carl Zeiss Vision International GmbH | Verfahren und vorrichtung für das referenzieren der lage wenigstens eines punkts auf oder in einem transparenten gegenstand |
JP2019075385A (ja) * | 2019-01-25 | 2019-05-16 | オムロン株式会社 | 光源装置およびこれを備えた測距センサ |
CN209894134U (zh) * | 2019-06-19 | 2020-01-03 | 二八六视觉科技(佛山)有限责任公司 | 多目测量装置 |
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