CN1101014C - 近红外分析仪的温度控制 - Google Patents
近红外分析仪的温度控制 Download PDFInfo
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- CN1101014C CN1101014C CN95194590A CN95194590A CN1101014C CN 1101014 C CN1101014 C CN 1101014C CN 95194590 A CN95194590 A CN 95194590A CN 95194590 A CN95194590 A CN 95194590A CN 1101014 C CN1101014 C CN 1101014C
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
- G05D23/00—Control of temperature
- G05D23/19—Control of temperature characterised by the use of electric means
- G05D23/20—Control of temperature characterised by the use of electric means with sensing elements having variation of electric or magnetic properties with change of temperature
- G05D23/24—Control of temperature characterised by the use of electric means with sensing elements having variation of electric or magnetic properties with change of temperature the sensing element having a resistance varying with temperature, e.g. a thermistor
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
- G05D23/00—Control of temperature
- G05D23/19—Control of temperature characterised by the use of electric means
- G05D23/1902—Control of temperature characterised by the use of electric means characterised by the use of a variable reference value
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Abstract
一种连续控制光具座的温度的方法。一种箔式RTD温度探测器固定在光具座上,其在PID控制方法中用作测量输入装置。在该控制方法中使用热交换管技术将热量从分析仪壳体中排出。PID温度控制器通过控制热交换风扇的速度而达到所要求的温度设定点。在实践中,两个热交换风扇能一起控制,然而,为实现最佳的内部温度均匀性,内腔热交换风扇维持全速,而控制外腔风扇以调节热量排出速度。光具座的温度变化控制在±0.1℃,而一般的温度变化控制范围为±2℃。
Description
发明背景
本发明涉及仪器的温度控制,更具体地讲,本发明涉及近红外分析仪的温度控制。
仪器包装的温度控制经常是一个很重要的设计因素。近红外(NIR)分析仪的内部温度控制对测量准确性所必需的。更确切地说,只要有2-4℃的温度变化就会影响近红外分光光度计,这种温度变化会引起最佳波长的变动,并产生测量误差。
一般的分光光度计使用开关型控制方法把温度变化控制在一定的范围内。在“开”状态下,启动冷凝器或其它装置,以将分光光度计的外壳内积聚的热量排出,如美国专利No.4328,676中所描述的那样。所述冷凝器或其它装置保持在“开”状态直至温度到达温度下限,然后关闭冷凝器。电子元件和/或外部环境产生的热量会引起分光光度计外壳内温度上升,直至温度到达第二温度限,从而使所述冷凝器或其它装置再次处于“开”状态。这种开/关温度控制方式使内部温度在2-4℃的变化范围内波动。
发明概述
一种优选的温度控制方案在于将热量从分析仪中排出并对光具座温度实现连续控制。将温度传感器固定在分析仪的光具座上,该温度传感器用作控制方案中的测量输入装置,该方案确实能达到所追求的目的。在该控制方案中使用一热导管式热交换器将热量从分析仪壳体中排出。热导管使用一种液体(例如酒精)通过该液体在内空气循环热交换器上挥发,然后在外空气循环热交换器上重新冷凝而将热量排出。热导管使壳体内空气,而不是外部空气通过精密光学元件循环方面特别有用,这样就无须对冷却空气进行额外的过滤。
一种PID温度控制器通过控制热交换器的风扇速度来达到所要求的温度设定点。除热速度能很准确地加以控制。在实践中,两个热交换器风扇能同时被控制;然而,为取得最佳的内部温度均匀性,内部热交换风扇保持全速旋转,而仅仅对外交换风扇加以控制,以调节除热速度。光具座的温度控制维持在±0.1℃的偏差范围,而一般的温度控制范围是±2℃。
更具体地讲,本发明包括控制分析仪壳体温度的装置和方法,其中,热量是在分析仪壳体内产生的。该装置包括具有内外腔的热交换器,内外腔围绕连接到分析仪壳体上的热交换盘管。内侧腔通过一入口和一出口与壳体相通,设在入口内的连续运行的恒速风扇使空气经过盘管并通过壳体循环。外腔与新鲜的外部空气相通,并且一可变速风扇使外部新鲜空气循环并通过外腔。温度传感器位于壳体内并相应于传感器位置处的温度产生信号。可变速风扇响应传感器所产生的信号。
本发明的另一个实施例,是控制近红外分析仪的壳体内部温度,并进而控制分析仪的准确性的改进方法。其改进之处包括对壳体内的精密光学元件的温度进行连续测量,并相应地使这些光学元件周围的温度受控的空气循环,以将元件维持在一相对恒定的温度。使用这种方法可使对温度敏感的精密光学元件的温度变化维持在±0.1℃。
附图简介
附图对分析仪及相关的内、外热交换器作出了示意性说明。
优选实施例的详述
参照附图,分析仪壳体10包括精密光学系统12,以及电子元件(未示出)。“精密光学系统”或“精密光学元件”包括光探测器、光栅,光栅座等,这些“精密光学系统”或“精密光学元件”对温度敏感并装在分析器壳体内侧,在所谓的“光具座”上。温度传感器14与所述精密光学系统相连,并输出一个温度信号给温度控制器15。与分析仪壳体10相连的还有一个热交换管式热交换器16,其具有内腔16a,外腔16b和热交换盘管18。该热交换盘管从内腔向外腔延伸,这样,热量就可以从内腔向外腔转移。此外,内腔有一个将空气从分析仪壳体内排出的内入口20和将温度受控的空气送至精密光学系统的内出口22。一连续运行的内风扇24安装上述内出口22处,使空气通过上述热交换管式热交换器的内腔。所述热交换管式热交换器外腔16b有一使外部新鲜空气进入热交换管式热交换器的外入口28,以及将空气从外腔排出的外出口30。一速度受控的风扇32安装在外出口30内,使空气通过热交换管式热交换器16的外腔。速度受控的风扇32与温度控制仪15电连接,该风扇的速度随温度传感器14的输出信号增加或减小,从而对热交换器16的热交换盘管18提供较多或较少的冷却量。
在优选结构的一个实施例中,一个包括内风扇和外风扇的Noren型CC600F热交换管式热交换器(由Noren Products,Inc.,Menlo Park,CA提供)与一台Guided Wave 300P近红外分析仪(由UOP Guided Wave,E1Dorado Hills,CA提供)的外壳相连。一个MINCO箔式100欧姆电阻温度探测仪或RTD与上述分析仪的精密光学元件相连,并且输入信号给ECS型6415PID温度控制仪。该温度控制仪具有10倍放大的控制输出。这种输出又与热交换管式热交换器的外风扇相连,以控制外风扇的速度。
Claims (6)
1.一种控制分析仪壳体(10)温度的装置,其中,热量是由所述壳体(10)内的精密光学系统(12)产生,所述装置包括:
一个具有热交换盘管(18)、内腔(16a)和外腔(16b)的热交换器(16),所述腔(16a,16b)围绕上述热交换盘管(18),
所述热交换器(16)以这样一种方式与壳体(10)相连,使内腔(16a)通过壳体(10)上的内出口(20)和内入口(22)与上述壳体(10)相通,
一个连续运行的恒速风扇(24)位于所述内入口(22)内,使空气通过所述壳体(10)并经过热交换盘管(18)循环,
所述外腔(16b)与新鲜的外部空气相通,
一个可变速风扇(32)使外部新鲜空气通过外腔(16b)循环,以冷却交换盘管(18),
一个温度传感器(14)位于上述壳体内,相应于传感器位置处的温度产生信号,
上述可变速风扇(32)响应上述信号。
2.如权利要求1所述的装置,其特征在于所述温度传感器位于分析仪壳体内的精密光学元件上。
3.如权利要求2所述的装置,其特征在于所述精密光学元件是由光探测器,光栅和光栅座组成的组件。
4.一种控制近红外分析仪温度的改进方法,其中精密光学元件装在壳体(10)内,具有热交换盘管(18)、内腔(16a)和外腔(16b)的热交换器(16)与壳体(10)相连,上述腔(16a,16b)包围热交换盘管(18),其中,所述内腔(16a)通过一通向壳体(10)的内入口(22)和壳体(10)的内出口(20)与壳体(10)相通,外腔(16b)通过一外入口(30)和有变速风扇(32)的外出口(28)与外部新鲜空气相通,其特征在于所述精密光学元件的温度变化被控制在±0.1℃的预定目标内,这是通过以下步骤实现的:
a)通过固定在精密元件上的温度传感器(14)连续测量壳体(10)内的精密光学元件的温度;
b)通过恒速风扇(24)使空气连续经过精密光学元件循环,以将元件的温度保持在一相对恒定值;
c)由温度传感器(14)产生的信号控制外部变速风扇(32)的速度。
5.如权利要求4所述的方法,其特征在于所述精密光学元件是由光探测器,光栅和光栅座组成的组件。
6.如权利要求4所述的方法,其特征在于所述精密光学元件的温度变化维持在±0.1℃。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/289,554 US5523563A (en) | 1994-08-12 | 1994-08-12 | Apparatus for controlling the temperature of a near-infrared analyzer |
US08/289,554 | 1994-08-12 |
Publications (2)
Publication Number | Publication Date |
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CN1155338A CN1155338A (zh) | 1997-07-23 |
CN1101014C true CN1101014C (zh) | 2003-02-05 |
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Application Number | Title | Priority Date | Filing Date |
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CN95194590A Expired - Fee Related CN1101014C (zh) | 1994-08-12 | 1995-07-21 | 近红外分析仪的温度控制 |
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Country | Link |
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US (1) | US5523563A (zh) |
EP (1) | EP0775340B1 (zh) |
JP (1) | JPH10504410A (zh) |
KR (1) | KR100294305B1 (zh) |
CN (1) | CN1101014C (zh) |
BR (1) | BR9508797A (zh) |
DE (1) | DE69510062T2 (zh) |
TW (1) | TW316288B (zh) |
WO (1) | WO1996005545A1 (zh) |
Families Citing this family (19)
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US5894987A (en) * | 1996-08-26 | 1999-04-20 | The United States Of America As Represented By The Secretary Of The Air Force | Variable area inlet for vehicle thermal control |
US6144031A (en) * | 1997-04-21 | 2000-11-07 | Inframetrics Inc. | Infrared video camera system with uncooled focal plane array and radiation shield |
US6205796B1 (en) | 1999-03-29 | 2001-03-27 | International Business Machines Corporation | Sub-dew point cooling of electronic systems |
EP1182453B1 (en) * | 2000-06-27 | 2007-08-15 | Agilent Technologies, Inc. | Method of reducing the effects of varying environmental conditions in a measuring instrument and measuring instrument using the method |
KR100369811B1 (ko) * | 2001-01-30 | 2003-01-29 | 삼성전자 주식회사 | 상변화를 이용한 열 전달 매체를 구비한 광소자 모듈 |
KR100387035B1 (ko) * | 2001-01-30 | 2003-06-12 | 삼성전자주식회사 | 일체형 열전달모듈을 이용한 광소자 모듈 |
US6498681B2 (en) * | 2001-05-03 | 2002-12-24 | Lucent Technologies Inc. | Apparatus and method for temperature-compensating diffraction-based optical devices |
JP2003283175A (ja) * | 2002-03-22 | 2003-10-03 | Shindengen Electric Mfg Co Ltd | 電子装置用簡易型恒温装置及びその制御方法 |
KR101060357B1 (ko) * | 2004-04-19 | 2011-08-29 | 엘지전자 주식회사 | 전자제품의 열원냉각장치 |
WO2006002522A1 (en) * | 2004-06-30 | 2006-01-12 | Trojan Technologies Inc. | Radiation sensor device and fluid treatment system containing same |
US20070201734A1 (en) * | 2006-02-24 | 2007-08-30 | The University Of Chicago | Automated multicolor fluorescent microscope with scanning and thermostatic ability |
US20080266549A1 (en) * | 2007-04-26 | 2008-10-30 | Ese Inc. | Chemical Constituent Analyzer |
WO2010050864A1 (en) * | 2008-11-03 | 2010-05-06 | Telefonaktiebolaget L M Ericsson (Publ) | Climate control in a radio network node |
GB2475306A (en) * | 2009-11-16 | 2011-05-18 | Groveley Detection Ltd | Temperature control apparatus including heat pipe for a gas or other detector that extends its operating range to extreme temperatures |
US8763409B2 (en) * | 2011-07-07 | 2014-07-01 | Linde Aktiengesellschaft | LNG (liquefied natural gas) and LIN (liquid nitrogen) in transit refrigeration heat exchange system |
US9612194B2 (en) | 2011-07-07 | 2017-04-04 | Cidra Corporate Services Inc. | Spectroscopic analysis of oil sands ore face for real time ore blend management |
CN103234908B (zh) * | 2013-04-26 | 2015-01-07 | 青岛科技大学 | 温控气体红外分析通用型联接装置 |
DE102015104843A1 (de) * | 2015-03-30 | 2016-10-06 | Rittal Gmbh & Co. Kg | Regelungsverfahren für ein Schaltschrankkühlgerät |
CN106092896A (zh) * | 2016-08-25 | 2016-11-09 | 北京万联达信科仪器有限公司 | 一种用于icp光谱仪的恒温控制装置 |
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US4328676A (en) * | 1981-03-25 | 1982-05-11 | Koolatron Industries, Ltd. | Thermoelectric environmental chamber |
US4659934A (en) * | 1983-08-31 | 1987-04-21 | Isco, Inc. | Method and apparatus for reducing Schlieren noise in a liquid chromatograph |
DE3707320A1 (de) * | 1987-03-07 | 1988-09-15 | Messerschmitt Boelkow Blohm | Einrichtung zur kuehlung eines sensors |
JPH0619327B2 (ja) * | 1988-03-10 | 1994-03-16 | 三洋電機株式会社 | 赤外線ガス濃度計 |
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JPH0650889A (ja) * | 1992-07-31 | 1994-02-25 | Shimadzu Corp | 近赤外分析装置 |
-
1994
- 1994-08-12 US US08/289,554 patent/US5523563A/en not_active Expired - Lifetime
-
1995
- 1995-07-21 EP EP95926720A patent/EP0775340B1/en not_active Expired - Lifetime
- 1995-07-21 BR BR9508797A patent/BR9508797A/pt not_active IP Right Cessation
- 1995-07-21 KR KR1019970700898A patent/KR100294305B1/ko not_active IP Right Cessation
- 1995-07-21 DE DE69510062T patent/DE69510062T2/de not_active Expired - Fee Related
- 1995-07-21 JP JP8507326A patent/JPH10504410A/ja active Pending
- 1995-07-21 WO PCT/US1995/008968 patent/WO1996005545A1/en active IP Right Grant
- 1995-07-21 CN CN95194590A patent/CN1101014C/zh not_active Expired - Fee Related
- 1995-08-26 TW TW084108893A patent/TW316288B/zh active
Also Published As
Publication number | Publication date |
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US5523563A (en) | 1996-06-04 |
WO1996005545A1 (en) | 1996-02-22 |
DE69510062T2 (de) | 1999-12-30 |
DE69510062D1 (de) | 1999-07-08 |
BR9508797A (pt) | 1997-12-23 |
JPH10504410A (ja) | 1998-04-28 |
TW316288B (zh) | 1997-09-21 |
CN1155338A (zh) | 1997-07-23 |
EP0775340A1 (en) | 1997-05-28 |
KR100294305B1 (ko) | 2001-09-17 |
EP0775340B1 (en) | 1999-06-02 |
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