CN110082671A - Analog detection method, system, device, hub and storage medium - Google Patents
Analog detection method, system, device, hub and storage medium Download PDFInfo
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- CN110082671A CN110082671A CN201910237498.6A CN201910237498A CN110082671A CN 110082671 A CN110082671 A CN 110082671A CN 201910237498 A CN201910237498 A CN 201910237498A CN 110082671 A CN110082671 A CN 110082671A
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- 238000001514 detection method Methods 0.000 title claims abstract description 25
- 238000012360 testing method Methods 0.000 claims abstract description 358
- 238000004088 simulation Methods 0.000 claims abstract description 158
- 230000003993 interaction Effects 0.000 claims abstract description 31
- 238000000034 method Methods 0.000 claims abstract description 26
- 230000015654 memory Effects 0.000 claims description 21
- 238000005538 encapsulation Methods 0.000 claims description 18
- 238000004891 communication Methods 0.000 claims description 16
- 238000004590 computer program Methods 0.000 claims description 15
- 230000000903 blocking effect Effects 0.000 claims description 4
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/303—Contactless testing of integrated circuits
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K7/00—Methods or arrangements for sensing record carriers, e.g. for reading patterns
- G06K7/0095—Testing the sensing arrangement, e.g. testing if a magnetic card reader, bar code reader, RFID interrogator or smart card reader functions properly
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- G—PHYSICS
- G07—CHECKING-DEVICES
- G07G—REGISTERING THE RECEIPT OF CASH, VALUABLES, OR TOKENS
- G07G1/00—Cash registers
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Abstract
This application involves the field of test technology, a kind of analog detection method, system, device, hub and storage medium are provided.Method includes: to automatically switch target card reader by receiving switching command according to switching command and automatically switch target simulation head, to switch smart card and Devices to test to be measured；The test request sent by receiving Devices to test by target simulation hair, the first data in smart card to be measured are read by target card reader according to test request, then the first data are forwarded to Devices to test by target simulation head, the data interaction between Devices to test and smart card to be measured is realized, to complete current test assignment；Due to that can realize the automatic switchover of smart card without moving card when switching smart card, the time of smart card switching is saved；When switching Devices to test, the automatic switchover of Devices to test can be realized without mobile Devices to test, the time for saving Devices to test switching effectively increases testing efficiency to substantially reduce the testing time.
Description
Technical field
This application involves the field of test technology, more particularly to a kind of analog detection method, system, device, hub and
Storage medium.
Background technique
With the development of computer technology, more and more businessmans complete delivery operation to smart card using POS terminal.Its
In, POS terminal (Point of Sale) is a kind of multi-functional terminal end also known as point-of-sale terminal, has and supports consumption, pre-authorization, remaining
Functions are inquired and transferred accounts etc. to volume.Smart card (Smart Card), also known as IC (Integrated Circuit, integrated circuit) card,
It is that microelectronic chip is embedded in card obtained in card base.Under the premise of POS terminal supports smart card, user is by smart card
When being put in the induction zone of POS terminal, POS terminal can be handled data in smart card, complete the data interaction in smart card,
To complete the operation such as to consume, inquire, transfer accounts.
Therefore, it in POS terminal R&D process, needs to test POS terminal using multiple smart cards, with test
Whether POS terminal supports these smart cards.In existing testing scheme, by manually mode or by mechanical arm
The mobile replacement smart card of mode, so that POS terminal is written and read processing to different intelligent card；Or pass through manually, by machinery
The mobile replacement POS terminal of the mode of arm, so that different POS terminals are written and read processing to identical smart card.However, passing through machine
Tool arm mobile handoff smart card or POS terminal, are influenced by mechanical flexibility ratio, are not only easy crawl failure, but also need to expend
Plenty of time causes testing efficiency lower.
Summary of the invention
Based on this, it is necessary to the technical issues of for the testing efficiency for how improving Devices to test, provide a kind of simulation and survey
Method for testing, system, device, hub and storage medium.
A kind of analog detection method, which comprises
Switching command is received, target card reader and target simulation head are determined according to switching command；
Receive the test request that Devices to test is sent by the target simulation hair；
The first data in smart card to be measured are read by the target card reader according to the test request；
First data are forwarded to the Devices to test by the target simulation head, realize Devices to test with it is to be measured
Data interaction between smart card, to complete when time test.
In one embodiment, described the step of target card reader and target simulation head are determined according to switching command, comprising:
To be switched interface identifier is obtained according to the switching command；
Judge the interface type of the to be switched interface identifier；
When the corresponding interface type of the to be switched interface identifier is card reader interface, card reader interface will be had connected and cut
Shift to the corresponding target card reader interface of the to be switched interface identifier；
When the corresponding interface type of the to be switched interface identifier is dummy head interface, dummy head interface will be had connected and cut
Shift to the corresponding target simulation head interface of the to be switched interface identifier.
In one embodiment, after described the step of determining target card reader and target simulation head according to switching command,
Further include:
Starting has connected the corresponding target card reader of card reader interface；
Card seeking instruction is sent to the target card reader after starting, so that target card reader detection is in card reading region
It is no to have smart card to be measured；
When the target card reader successfully is detected smart card to be measured, it is corresponding described that starting has connected dummy head interface
Target simulation head executes the step of receiving the test request that the Devices to test is sent by target simulation hair.
In one embodiment, described to be read in smart card to be measured according to the test request by the target card reader
The first data, comprising:
When receiving the test request, the test request is packaged according to reader device agreement；
Test request after encapsulation is sent to the target card reader by having connected card reader interface, the test is asked
It asks and is used to indicate the target card reader and reads the first data in smart card to be measured for the test request.
In one embodiment, described that first data are forwarded to described to be measured set by the target simulation head
It is standby, comprising:
First data are packaged according to dummy head device protocol, by the first data after encapsulation by having connected
Dummy head interface is sent to the target simulation head；
So that the Devices to test obtains first data by the target simulation head.
A kind of simulated testing system, the system comprises: first terminal, hub, Devices to test；Hub includes master
Plate, multiple candidate card reader, multiple candidate dummy heads, serial ports pinboard, the mainboard connect the serial ports pinboard, the string
Mouth pinboard connects the candidate card reader, the candidate dummy head by interface, in which:
The first terminal, for sending switching command to the mainboard；
The mainboard determines mesh from the candidate card reader according to the switching command after receiving switching command
Card reader is marked, determines target simulation head from the candidate dummy head；
The serial ports pinboard establishes target reading for connecting the target card reader by having connected card reader interface
Communication between card device and mainboard；It is also used to connect the target simulation head by having connected dummy head interface, establishes target mould
Communication between quasi- head and mainboard；
The target simulation head, for by being modeled to smart card to be measured, to connect card reading region built-in non-with Devices to test
Vertical connection；
The Devices to test, for sending test request to the mainboard by the target simulation head；
The mainboard, after receiving the test request, by the test request according to the reading of the target card reader
After card device device protocol is packaged, it is forwarded to the target card reader；
The target card reader reads smart card to be measured according to the test request after receiving the test request
The first data, first data are sent to the mainboard；
The mainboard, after receiving first data, by first data according to the mould of the target simulation head
After quasi- head apparatus agreement is packaged, it is transmitted to the target simulation head；
The Devices to test, for obtaining first data by the target simulation head, realize Devices to test and to
The data interaction between smart card is surveyed, is completed when time test.
A kind of simulating test device, described device include:
Switching module determines target card reader and target simulation head according to switching command for receiving switching command；
Test request receiving module, the test request sent for receiving Devices to test by the target simulation hair；
First data acquisition module, for reading smart card to be measured by the target card reader according to the test request
In the first data；
First data forwarding module, for first data to be forwarded to described to be measured set by the target simulation head
It is standby, so that the Devices to test handles first data, to complete the current test to the Devices to test.
In one embodiment, the switching module includes:
Type judging unit judges the changing-over to be cut for obtaining to be switched interface identifier according to the switching command
The interface type of mouth mark；
Card reader switch unit, for when the corresponding interface type of the to be switched interface identifier is card reader interface,
Card reader interface will be had connected and switch to the corresponding target card reader interface of the to be switched interface identifier；
Dummy head switch unit, for when the corresponding interface type of the to be switched interface identifier is dummy head interface,
Dummy head interface will be had connected and switch to the corresponding target simulation head interface of the to be switched interface identifier.
A kind of hub, including memory and processor, the memory are stored with the calculating that can be run on a processor
Machine program, the processor realize the step in above-mentioned each embodiment of the method when executing the computer program.
A kind of computer readable storage medium, is stored thereon with computer program, and the computer program is held by processor
The step in above-mentioned each embodiment of the method is realized when row.
Above-mentioned analog detection method, system, device, hub and storage medium, by receiving switching command, according to switching
Instruction automatically switches target card reader from multiple candidate card reader and automatically switches target simulation from multiple candidate simulation heads
Head；Switching command is corresponding in each test determines a target card reader and the corresponding sheet smart card of each target card reader,
Switching command is corresponding in each test determines a target simulation head and the corresponding Devices to test of each target simulation head；?
The automatic switchover of smart card can be realized without moving card when switching smart card, save the time of smart card switching；It is to be measured switching
When equipment, the automatic switchover of Devices to test can be realized without mobile Devices to test, saves the time of Devices to test switching；Pass through
The test request that Devices to test is sent by target simulation hair is received, intelligence to be measured is read by target card reader according to test request
Can the first data in card, the first data are then forwarded to Devices to test by target simulation head, realize Devices to test and to
The data interaction between smart card is surveyed, to complete current test assignment.The analog detection method of this case is due in test process
Without carrying out the operation of plug-in card, Devices to test is replaced without mobile in test process, to substantially reduce test
Time effectively increases testing efficiency.
Detailed description of the invention
Fig. 1 is the application scenario diagram of one embodiment analog detection method；
Fig. 2 is the structural schematic diagram of hub in one embodiment；
Fig. 3 is the flow diagram of one embodiment analog detection method；
Fig. 4 is flow diagram the step of determining target simulation head and target card reader in one embodiment；
Fig. 5 is flow diagram the step of detecting smart card in one embodiment；
Fig. 6 is the flow diagram of analog detection method in another embodiment；
Fig. 7 is the flow diagram of analog detection method in further embodiment；
Fig. 8 is the structural block diagram of simulated testing system in one embodiment；
Fig. 9 is the structural block diagram of simulating test device in one embodiment；
Figure 10 is the internal structure chart of hub in one embodiment.
Specific embodiment
It is with reference to the accompanying drawings and embodiments, right in order to which the objects, technical solutions and advantages of the application are more clearly understood
The application is further elaborated.It should be appreciated that specific embodiment described herein is only used to explain the application, not
For limiting the application.
Analog detection method provided by the present application can be applied in application environment as shown in Figure 1.Fig. 1 is a reality
Apply the applied environment figure that analog detection method is run in example.As shown in Figure 1, the application environment includes first terminal 110, hub
120 and Devices to test 130, as shown in Fig. 2, hub 120 includes mainboard, serial ports pinboard, multiple candidate card reader, Duo Gehou
Select dummy head.Each candidate corresponding sheet smart card of card reader, each candidate corresponding Devices to test of dummy head.First
Terminal 110 is host computer, is connect by network implementations with the mainboard in hub 120；Devices to test 130 can pass through NFC
(near field communication, near-field communication) is interacted with the target simulation head in hub.120 quilt of hub
The dynamic test instruction for receiving switching command and Devices to test 130 from first terminal 110.
Wherein, hub as shown in Figure 2, mainboard is connect with serial ports pinboard in a hub, and mainboard is for receiving
After the switching command of first terminal 110, instruction serial ports pinboard will have connected card reader interface, and to switch to switching command corresponding
Card reader interface will have connected dummy head interface and switch to the corresponding dummy head interface of switching command.Thus from candidate equipment
The corresponding candidate card reader of middle determining switching command is target card reader, corresponding candidate dummy head is target simulation head, mainboard
Between target card reader by serial ports pinboard have connected card reader interface communicated, mainboard and target simulation head it
Between communicated by the dummy head interface that has connected in serial ports pinboard.
Wherein, first terminal 110 can be, but not limited to be various personal computers, laptop, smart phone, plate
Computer and portable wearable device.Hub 120 (HUB) is the transponder of a multiterminal interface, for realizing intelligence to be measured
Data interaction between card and Devices to test.Devices to test can be POS (Point of Sale, point-of-sale terminal) machine.
In one embodiment, as shown in figure 3, providing a kind of analog detection method, it is applied to collect in Fig. 1 in this way
It is illustrated for line device 120, comprising the following steps:
Step 210, switching command is received, target card reader and target simulation head are determined according to switching command.
Wherein, switching command refers to that being used to indicate hub switches candidate card reader to be launched, switches time to be launched
Select the instruction of dummy head.Target card reader refers to the unique candidate card reader in each test for starting, target simulation head
Refer to the unique candidate dummy head in each test for starting.Multiple candidate card reader and candidate simulation are equipped in hub
Head, each corresponding sheet smart card of candidate's card reader, each corresponding Devices to test of candidate's dummy head.Candidate card reader
(Card Reader, card-reading apparatus) is after actuation for reading the data in smart card.Candidate dummy head is used for mould after actuation
Intend into smart card.
Wherein, smart card (Smart card) is also known as IC (Integrated Circuit, integrated circuit) card, is by micro- electricity
Card obtained in sub- chip insertion card base.Smart card includes contact intelligent card and contact type intelligent card.Smart card can be with
It is bank card, bank card can be EMV (EuropayMasterCardVisa) card for meeting EMV standard；EMV standard is by state
Border three biggest banks card tissue Europay (Continental Europe card), MasterCard (Master Card) and Visa (Visa) initiate to formulate jointly
Technical standard from magnetic stripe card to smart card that shifted from of bank card.
Specifically, first terminal in simulated testing system generates switching command, by network or serial ports by switching command
The hub being sent in simulated testing system.Hub receives the switching command that first terminal is sent, and according to switching command
From unique target card reader determining in candidate card reader and unique target simulation head from candidate dummy head.
In one embodiment, first terminal can be various personal computers, laptop, smart phone, plate
Computer and portable wearable device, first terminal can be POS machine, and POS machine can be traditional POS machine, can also be intelligence
POS machine；POS machine can support contact intelligent card, can also support contact type intelligent card.
In one embodiment, hub receives switching command from host computer.Host computer is used to generate switching command and will
Switching command is sent to hub.Host computer can be Devices to test, can be POS machine, can also be third party's computer.
In one embodiment, candidate card reader is equipped with card slot or non-contact card reading region, and non-contact card reading region is used
It is interacted in contact type intelligent card, card slot is for being inserted into contact intelligent card and interacting with contact intelligent card.
Step 220, the test request that Devices to test is sent by target simulation hair is received.
Wherein, test request includes that Devices to test and smart card to be measured is requested to carry out the APDU order of data interaction.Target
Dummy head refers to the element that data interaction is carried out with Devices to test.
Wherein, APDU (ApplicationProtocolDataUnit, using interaction data unit) refers to that peer layer takes second place
Between the data unit transmitted, APDU order is the application data format that interacts according to Devices to test with smart card to be measured to intelligence to be measured
The operational order sent can be blocked, operational order includes card reading instruction, writes at least one of card instruction, select file instruction.To
Measurement equipment can be traditional POS machine, be also possible to intelligent POS machine, can also be other for carrying out data friendship with smart card
Mutual equipment.
Specifically, the hub in simulated testing system receives Devices to test and is asked by the test that target simulation hair is sent
It asks.In one embodiment, in each test, hub starts target simulation head after determining target simulation head, after starting
Target simulation connector analog is at smart card to be measured.Target simulation head after Devices to test and starting establishes connection, and to target simulation
Hair send test request.
Step 230, the first data in smart card to be measured are read by target card reader according to test request.
Wherein, the first data refer to the response data for test request.Target card reader is set in hub, and target is read
Card device refers to the element that data interaction is carried out with smart card to be measured.
Specifically, after the hub in simulated testing system receives test request, intelligence to be measured is read by target card reader
The first data in capable of blocking.In one embodiment, starting target is read after hub receives test request by target simulation head
Card device, the target card reader after starting read in smart card to be measured and are directed to corresponding first data of test request.
Specifically, there is multiple candidate card reader, and one Zhang Zhineng of each candidate corresponding placement of card reader in a hub
Card, hub start target card reader after determining target card reader in multiple candidate card reader.Target card reader after starting
The first data in corresponding smart card to be measured are read according to test request.
Step 240, the first data are forwarded to Devices to test by target simulation head, realize Devices to test and intelligence to be measured
Data interaction between card, to complete when time test.
Wherein, after the hub in simulated testing system obtains the first data of smart card to be measured by target card reader,
First data are forwarded to Devices to test by target simulation head, after Devices to test receives the first data, realize to be measured set
The standby data interaction with smart card to be measured is completed when time test.
In one embodiment, when the first data are forwarded to Devices to test by target simulation head by hub, complete to
Measurement equipment after time test, first terminal generates switching command again and is sent to hub, and hub receives switching command, root
Target card reader or/and target simulation head are redefined according to switching command, so that it is determined that the intelligence to be measured of data interaction next time
Card and Devices to test, to carry out next round simulation test.
In one embodiment, hub carries out data interaction to a smart card to be measured for multiple and different Devices to test
Test, i.e., multiple corresponding target card reader of candidate dummy head.In each test, target card reader is constant, target card reading
The corresponding smart card to be measured of device is constant；Automatically switch different candidate dummy heads by switching command when test every time, again really
Fixed new target simulation head is used to complete the simulation test of the corresponding Devices to test of target simulation head.Pass through the " more of Devices to test
To one " simulation test, after having executed the test of a Devices to test every time, automatically switches candidate dummy head, continue to execute
The test of next Devices to test realizes multiple Devices to test to test same sheet smart card, to realize that card is shared, saves
Card resource, and by realizing automation switching Devices to test, it is a large amount of to save the testing time, effectively improve equipment test effect
Rate.
In one embodiment, hub is directed to the same Devices to test to multiple smart cards to be measured to progress data interaction
Test.That is a target simulation head corresponds to multiple candidate card reader, and in each test, target simulation head is constant, target simulation head
Corresponding Devices to test is constant, automatically switches different candidate card reader according to switching command to determine target card reader, thus
Automatically switch the smart card to be measured tested.By the simulation test of Devices to test " one-to-many ", a Zhang Zhi has been executed every time
After the test that can block, then handoff candidate card reader, continues to execute the test of next sheet smart card, realizes a Devices to test to survey
Multiple smart cards are tried, to improve the suitability of Devices to test, smart card to be measured are switched by automation, when a large amount of savings are tested
Between, effectively improve equipment testing efficiency.
In one embodiment, hub carries out data interaction survey to multiple Devices to test for multiple smart cards to be measured
Examination.After having executed test program every time, candidate's card reader and candidate dummy head can be switched, redefine new target simulation head
With target card reader, to redefine Devices to test and smart card to be measured is tested next time.Pass through the mould of " multi-to-multi "
Quasi- test after having executed test every time, switches Devices to test and smart card to be measured continues to execute next test, can save a large amount of
Testing time realizes automatic test, effectively improves equipment testing efficiency.
In the present embodiment, by receiving switching command, automatically switched from multiple candidate card reader according to switching command
Target card reader and the automatic switchover target simulation head from multiple candidate dummy heads；Switching command is corresponding in each test determines
One target card reader and the corresponding sheet smart card of each target card reader, switching command is corresponding in each test determines one
Target simulation head and the corresponding Devices to test of each target simulation head；Intelligence can be realized without moving card when switching smart card
The time of smart card switching is saved in the automatic switchover of card；When switching Devices to test, without mobile Devices to test can realize to
The time of smart card switching is saved in the automatic switchover of measurement equipment；The survey sent by receiving Devices to test by target simulation hair
Examination request, reads the first data in smart card to be measured by target card reader according to test request, then leads to the first data
Cross target dummy head and be forwarded to Devices to test so that Devices to test handles the first data, realize Devices to test with it is to be measured
Data interaction between smart card, to complete when time test assignment.Due to being not necessarily to carry out the operation of plug-in card in test process,
Devices to test is replaced without mobile in test process, to effectively reduce the testing time, test process is simply quick, real
Existing automatic test, substantially increases testing efficiency.
As shown in figure 4, in one embodiment, step 210 includes:
Step 212, to be switched interface identifier is obtained according to switching command.
Specifically, hub parses switching command, analytically after switching command in obtain to be switched interface
Interface identifier.Interface identifier refer to the serial ports pinboard in hub for connecting candidate dummy head, candidate card reader connects
The mark of mouth.Interface is set on serial ports pinboard, is corresponded with each candidate dummy head and each candidate card reader.Interface mark
Know the number that can be interface, the number of interface can be the character string of the combinations such as letter, number, additional character.Pass through interface
Mark can distinguish the distinct device of corresponding device type and identical device type.For example, interface identifier D1, D2, D3,
M1, M2, M3, wherein D and M characterizes the corresponding card reader interface of candidate card reader respectively, the corresponding dummy head of candidate dummy head connects
Mouthful；D1, D2, D3 characterize the different corresponding card reader interfaces of candidate card reader respectively, and M1, M2, M3 respectively represent different times
Select the corresponding dummy head interface of dummy head.
Step 214, judge the corresponding interface type of to be switched interface identifier.
Wherein, hub judges that the corresponding interface type of to be switched interface identifier is card reader interface type or dummy head
Device type.Judge specifically, judging that interface type can be identified by self defined interface.
In one embodiment, self defined interface mark can pass through corresponding dummy head device protocol format and card reader
Device protocol format is defined, and the interface identifier after definition is for distinguishing dummy head and card reader.
In one embodiment, self defined interface mark can be according to dummy head candidate in hub, the position of candidate card reader
Setting sequence, successively sequence is numbered.
Step 216A will have connected card reader when the corresponding interface type of to be switched interface identifier is card reader interface
Interface switches to the corresponding target card reader interface of to be switched interface identifier.
Wherein, card reader interface is in serial ports pinboard for connecting the interface of candidate this device type of card reader.?
Connection card reader interface is the interface for uniquely establishing connection in multiple card reader interfaces with corresponding candidate card reader, has connected card reading
Device interface has uniqueness in each test.
Specifically, the hub in simulated testing system by serial ports pinboard will have connected card reader interface switch to
After switching interface identifies corresponding target card reader interface, mainboard can be logical by serial ports pinboard and target card reader in hub
Letter.
In one embodiment, hub receives the switching command that first terminal is sent, and the mainboard in hub is to switching
Instruction parsed after obtain it is to be switched be identified as D3, can determine whether that corresponding interface type is card reader interface according to D, then will
It has connected card reader interface and switches to the corresponding card reader interface of number 3.According to switching command, automatically switch in hub internal
Card reader interface is had connected, the data interaction between mainboard and different candidate card reader is realized, to guarantee hub and different intelligence
Data interaction between capable of blocking.
Step 216B will have connected dummy head when the corresponding interface type of to be switched interface identifier is dummy head interface
Interface switches to the corresponding target simulation head interface of to be switched interface identifier.
Wherein, dummy head interface is in serial ports pinboard for connecting the interface of candidate this device type of dummy head.?
Connection dummy head interface is the interface for uniquely establishing connection in multiple dummy head interfaces with corresponding candidate dummy head, has connected mould
Quasi- head interface has uniqueness in each test；
Specifically, the hub in simulated testing system by serial ports pinboard will have connected dummy head interface switch to
After switching interface identifies corresponding target simulation head interface, mainboard can be logical by serial ports pinboard and target simulation head in hub
Letter.
In one embodiment, hub receives the switching command that first terminal is sent, and the mainboard in hub is to switching
Instruction parsed after obtain it is to be switched be identified as M2, can determine whether that corresponding interface type is dummy head interface according to M, then will
It has connected dummy head interface and switches to the corresponding dummy head interface of number 2.According to switching command, automatically switch in hub internal
Have connected dummy head interface, realize the data interaction between mainboard and different candidate's dummy heads, with guarantee hub from it is different to
Data interaction between measurement equipment.
In the present embodiment, after hub receives switching command, switching command is parsed, is obtained after parsing to be switched
Interface identifier；Hub first determines that need to switch is candidate card reader or candidate dummy head according to be switched interface identifier,
Having connected card reader interface and having connected dummy head interface in serial ports pinboard is switched to further according to be switched interface identifier
The corresponding interface of to be switched interface identifier, determines unique target card reader and target simulation head in each test process with this；
Since target card reader corresponds to smart card to be measured, target simulation head corresponds to Devices to test, by realizing hub internal mainboard, mesh
After marking the data interaction between card reader and target simulation head, the data interaction between Devices to test and smart card to be measured is realized,
Complete testing when secondary for device under test；In test next time, unique target card reader is redefined according to switching command
With target simulation head, completion is tested next time.In the present embodiment by having connected card reader according to switching command automatic switchover
Interface and the mode for having connected dummy head interface automatically switch to target card reader and target simulation head, complete automatic test,
The testing time is substantially reduced, realizes that smart card is shared, improve Devices to test is suitability, to effectively improve test effect
Rate.
As shown in figure 5, further including the step for detecting smart card before step 220 after step 210 in one embodiment
Suddenly, the step specifically includes the following steps:
Step 310, starting has connected the corresponding target card reader of card reader interface.
Wherein, the hub in simulated testing system, after reception switching command determines target card reader and target simulation head,
Hub starts the target card reader in hub.Target card reader is in power-down state when not working.
Specifically, in hub internal, the completion of serial ports pinboard has connected card reader interface and has connected dummy head interface
Switching after, powered on to the corresponding target card reader of card reader interface is had connected；Mainboard obtains the reader device agreement of storage,
And reader device agreement is sent to target card reader by serial ports pinboard, to start target card reader.Wherein, card reader
The agreement used when device protocol carries out data transmission for card reader.
Step 320, card seeking instruction is sent to the target card reader after starting, so that the detection of target card reader is in card reading region
Inside whether there is smart card to be measured.
Wherein, card seeking instruction is used to indicate whether the detection of target card reader has smart card to be measured in its card reading region
Instruction.
Specifically, after the starting of target card reader, mainboard is generated to be instructed according to the card seeking that reader device agreement is packaged,
Card seeking instruction is sent to corresponding target card reader by serial ports pinboard by mainboard.Target card reader receives card seeking instruction
Afterwards, target card reader detects in its card reading region whether have smart card to be measured.
In one embodiment, after target card reader receives card seeking instruction, emit radiofrequency signal to surrounding.Believe in radio frequency
Number signal cover in there are smart card to be measured and when smart card to be measured is contact type intelligent card, smart card to be measured according to
Radiofrequency signal returns to smartcard identification to target card reader, i.e. target card reader detects smart card to be measured in card reading region.
In one embodiment, after target card reader receives card seeking instruction, target card reader generates radiofrequency signal, when depositing
When smart card to be measured and target reader surface are physically contacted, smart card to be measured is according to radiofrequency signal to target card reader
Smartcard identification is returned to, i.e. target card reader detects smart card to be measured in card reading region.
Step 330, when target card reader successfully is detected smart card to be measured, it is corresponding that starting has connected dummy head interface
Target simulation head executes the step of receiving the test request that Devices to test is sent by target simulation hair.
Wherein, the hub in simulated testing system receives switching command and determines target card reader and target simulation head, when
When target card reader in hub successfully is detected smart card to be measured, hub starting has connected the corresponding mesh of dummy head interface
Dummy head is marked, target simulation head is in power-down state when not working.
Specifically, in hub internal, the completion of serial ports pinboard has connected dummy head interface and has connected dummy head interface
Switching after, powered on to target simulation head；Mainboard obtains the dummy head device protocol of storage, and dummy head device protocol is passed through
Serial ports pinboard is sent to target simulation head, to start target simulation head.After target simulation head is activated, it is modeled to intelligence to be measured
Block and smart card to be measured is contact type intelligent card, establishes connection with Devices to test.Devices to test is established after connection to target mould
Quasi- hair send test request, that is, executes the step that hub receives the test request that Devices to test is sent by target simulation hair
Suddenly.Wherein, the agreement used when dummy head device protocol carries out data transmission for dummy head.
In the present embodiment, the target card reader first started in hub is able to the simulation test of Devices to test normally
It carries out, then sends card seeking instruction to the target card reader after starting, detect whether there are smart card to be measured, to establish hub
With the communication between smart card to be measured, restart the target simulation head in hub, the target simulation head after starting is set with to be measured
It is standby to establish connection, to establish the communication between hub and Devices to test.When hub and smart card to be measured, Devices to test are established
Communication and then reception test request, ensure that the normal operation of simulation test.
As shown in fig. 6, in one embodiment, step 230, reading intelligence to be measured by target card reader according to test request
The first data in capable of blocking, comprising:
Step 232, when receiving test request, test request is packaged according to reader device agreement.
Specifically, the hub in simulated testing system receives Devices to test and is asked by the test that target simulation hair is sent
It asks.In hub internal, target simulation head receives the test request that Devices to test is sent, and target simulation head is according to simulation head apparatus
Test request by encapsulation by encapsulating, is sent to mainboard by serial ports pinboard, mainboard first will by test request by agreement
The test request received is decapsulated, and is encapsulated again according to reader device agreement to test request after decapsulation.
In one embodiment, when the target card reader of hub internal and target simulation head are communicated, using difference
Device protocol, target card reader use reader device agreement, target simulation head use dummy head device protocol.
Step 234, the test request after encapsulation is sent to target card reader by having connected card reader interface, test is asked
It asks and is used to indicate target card reader and reads the first data in smart card to be measured for test request.
Wherein, the inside of the hub in simulated testing system, mainboard turn the test request after encapsulation by serial ports
The card reader interface that has connected in fishplate bar is sent to target card reader, target card reader receive after test request to it is corresponding to
It surveys smart card to be read, reads out the first data for test request.
In one embodiment, target card reader carries out different readings to smart card to be measured for different test requests
Operation, test request include but is not limited to consumption, pre-authorization, inquiry into balance and at least one of transfer accounts.
In the present embodiment, mainboard carries out decapsulation to test request according to reader device agreement and encapsulates again, energy
It is enough to improve the data transmission efficiency between target card reader, to improve data transmission efficiency between hub internal element.
As shown in fig. 7, in one embodiment, step 240, the first data are forwarded to be measured set by target simulation head
It is standby to include:
Step 242, the first data are packaged according to dummy head device protocol.
Wherein, the inside of the hub in simulated testing system, target card reader are read out after the first data according to reading
Card device device protocol is packaged, and the first data after encapsulation are connect by the card reader that has connected in serial ports pinboard
Mouth is sent to mainboard；Mainboard is decapsulated encapsulates the first data according to dummy head device protocol again.
Step 244, the first data after encapsulation are sent to target simulation head by having connected dummy head interface, so as to
Measurement equipment obtains the first data by target simulation head.
Wherein, the inside of the hub in simulated testing system, the first number passes through serial ports pinboard after mainboard will encapsulate
In the dummy head interface that has connected be sent to target simulation head, Devices to test obtains the first data by target simulation head
In one embodiment, Devices to test can be POS machine, and POS machine send radiofrequency signal, target to target simulation hair
After dummy head receives radiofrequency signal, the first data are sent to POS machine, Devices to test receives the first data.
In one embodiment, Devices to test and target simulation head establish physical connection, and target simulation head receives first
When data, by the first data forwarding to Devices to test, Devices to test receives the first data.
In the present embodiment, mainboard carries out decapsulation to the first data according to dummy head device protocol and encapsulates again, energy
It is enough to improve the data transmission efficiency between target simulation head, to improve data transmission efficiency between hub internal element, energy
The data transmission efficiency between smart card and Devices to test to be measured is enough effectively improved, so that the simulation for effectively improving Devices to test is surveyed
Try efficiency.
It should be understood that although each step in the flow chart of Fig. 3-7 is successively shown according to the instruction of arrow,
These steps are not that the inevitable sequence according to arrow instruction successively executes.Unless expressly stating otherwise herein, these steps
Execution there is no stringent sequences to limit, these steps can execute in other order.Moreover, at least one in Fig. 3-7
Part steps may include that perhaps these sub-steps of multiple stages or stage are not necessarily in synchronization to multiple sub-steps
Completion is executed, but can be executed at different times, the execution sequence in these sub-steps or stage is also not necessarily successively
It carries out, but can be at least part of the sub-step or stage of other steps or other steps in turn or alternately
It executes.
In one embodiment, as shown in figure 8, providing a kind of simulated testing system, system includes: first terminal, collection
Line device, Devices to test；Hub includes mainboard, multiple candidate card reader, multiple candidate dummy heads, serial ports pinboard, and mainboard connects
Serial ports pinboard is connect, serial ports pinboard connects the candidate card reader, the serial ports pinboard by interface and connected by switching
Connect the dummy head interface connection candidate dummy head, in which:
First terminal, for sending switching command to mainboard；Mainboard, after receiving switching command, according to switching command
Target card reader is determined from candidate card reader, and target simulation head is determined from candidate dummy head；Serial ports pinboard, for passing through
Card reader interface linking objective card reader is had connected, the communication between target card reader and mainboard is established；It is also used to by having connected
Dummy head interface linking objective dummy head is connect, the communication between target simulation head and mainboard is established；Target simulation head, for passing through
It is modeled to smart card to be measured, connects the built-in vertical connection in card reading region non-with Devices to test；Devices to test, for passing through target simulation
Head sends test request to mainboard；Mainboard, after receiving test request, by test request according to the card reader of target card reader
After device protocol is packaged, it is forwarded to target card reader；Target card reader, for receiving test request, according to test request
First data are sent to mainboard by the first data for reading smart card to be measured；Mainboard, after receiving the first data, by first
After data are packaged according to the dummy head device protocol of target simulation head, it is transmitted to target simulation head；Devices to test, for leading to
It crosses target dummy head and obtains the first data, realize the data interaction between Devices to test and smart card to be measured, complete when time test.
In the present embodiment, switching command is sent to hub by first terminal, hub is automatic according to switching command
Switch and determine target simulation head and target card reader, to automatically switch Devices to test and smart card to be measured, realizes to be measured set
The data interaction of smart card standby and to be measured, completes the test of device under test.Due to being not necessarily to carry out plug-in card in test process
It operates, effectively increases survey to substantially reduce the testing time without mobile replacement Devices to test in test process
Try efficiency.
Specific about simulated testing system limits the restriction that may refer to above for analog detection method, herein not
It repeats again.
In one embodiment, as shown in figure 9, providing a kind of simulating test device, comprising: switching module 10, test
Request receiving module 20, the first data acquisition module 30, the first data forwarding module 40, in which:
Switching module determines target card reader and target simulation head according to switching command for receiving switching command.
Test request receiving module, the test request sent for receiving Devices to test by target simulation hair.
First data acquisition module, for reading first in smart card to be measured by target card reader according to test request
Data.
First data forwarding module, for the first data to be forwarded to Devices to test by target simulation head, so as to be measured
Equipment handles the first data, to complete the current test of device under test.
In the present embodiment, by receive switching command, is automatically switched according to switching command and determine target simulation head with
Target card reader, to automatically switch Devices to test and smart card to be measured, after receiving test request, realize Devices to test and
The test of device under test is completed in the data interaction of smart card to be measured.Due to being not necessarily to carry out the operation of plug-in card in test process,
Devices to test is replaced without mobile in test process, to substantially reduce the testing time, realizes that smart card is shared, mentions
High Devices to test is suitability, effectively increases testing efficiency.
In one embodiment, switching module 10 includes type judging unit, card reader switch unit, dummy head switching list
Member, in which:
Type judging unit judges to be switched interface identifier for obtaining to be switched interface identifier according to switching command
Interface type.
Card reader switch unit will for when the corresponding interface type of to be switched interface identifier is card reader interface
Connection card reader interface switches to the corresponding target card reader interface of to be switched interface identifier.
Dummy head switch unit will for when the corresponding interface type of to be switched interface identifier is dummy head interface
Connection dummy head interface switches to the corresponding target simulation head interface of to be switched interface identifier.
In the present embodiment, to be switched interface identifier is obtained according to switching command by type judging unit, judged to be cut
Then the interface type of alias mark has connected card reader interface or/and dummy head by the automatic switchover of card reader switch unit
Switch unit switching has connected dummy head interface, automatically switches to target card reader and target simulation head, completes automatic test,
The testing time is substantially reduced, to effectively improve testing efficiency.
In one embodiment, device further includes test preliminary examination module, comprising:
Start unit has connected the corresponding target card reader of card reader interface for starting；
Detection unit, for sending card seeking instruction to the target card reader after starting, so that the detection of target card reader is being read
Whether to be measured smart card is had in card region；
The start unit is also used to when target card reader successfully is detected smart card to be measured, and starting has connected simulation
The corresponding target simulation head of head interface, executes the step for receiving the test request that Devices to test is sent by target simulation hair
Suddenly.
In the present embodiment, first starting target card reader by test preliminary examination module obtains the simulation test of Devices to test
To be normally carried out, card seeking instruction then is sent to the target card reader after starting, is detected whether there are smart card to be measured, to establish
Target simulation head is restarted in communication between hub and smart card to be measured, and the target simulation head after starting is built with Devices to test
Vertical connection, to establish the communication between hub and Devices to test.When hub is communicated with smart card to be measured, Devices to test foundation
And then test request is received, it ensure that the normal operation of simulation test.By before receiving test request, to whether there is
Smart card to be measured carries out pre-detection, can guarantee the effective of simulation test and be normally carried out, and realizes Devices to test and intelligence to be measured
Data interaction between card guarantees the validity of test.
In one embodiment, the first data acquisition module includes:
First encapsulation unit when for receiving test request, seals test request according to reader device agreement
Dress；
First transmission unit is also used to the test request after encapsulation being sent to target reading by having connected card reader interface
Card device, the test request are used to indicate target card reader and read the first data in smart card to be measured for test request.
In the present embodiment, test request is packaged according to reader device agreement by the first encapsulation unit, is sealed
Test request can be used in the data transmission of target card reader after dress, be led to the test request after encapsulation by the first transmission unit
It crosses and has connected card reader interface and be sent to target card reader, instruction target card reader is read in smart card to be measured for test request
The first data.In the present embodiment, test request is sent afterwards by first encapsulating, effectively improve and carry out data with target card reader
Efficiency of transmission when transmission.
In one embodiment, the first data forwarding module includes:
Second encapsulation unit, for being packaged according to dummy head device protocol to the first data；
Second transmission unit is sent to target simulation by having connected dummy head interface for the first data after encapsulating
Head；So that Devices to test is by obtaining the first data in target simulation head.
In the present embodiment, the data by the second encapsulation unit according to dummy head device protocol encapsulation of data, after encapsulation
The data transmission that can be used in target simulation head, is connect the data after encapsulation by having connected dummy head by the second transmission unit
Mouth is sent to target simulation head, so that Devices to test is by obtaining the first data in target simulation head.In the present embodiment, pass through
It first encapsulates and sends data afterwards, effectively improve efficiency of transmission when carrying out data transmission with target simulation head.
Specific about simulating test device limits the restriction that may refer to above for analog detection method, herein not
It repeats again.Modules in above-mentioned simulating test device can be realized fully or partially through software, hardware and combinations thereof.On
Stating each module can be embedded in the form of hardware or independently of in the processor in hub, can also be stored in collection in a software form
In memory in line device, the corresponding operation of the above modules is executed in order to which processor calls.
In one embodiment, a kind of hub is provided, internal structure chart can be as shown in Figure 10.The hub packet
Include processor, memory, network interface, database, serial ports pinboard, card reader and the dummy head connected by system bus.
Wherein, the processor of the hub is for providing calculating and control ability.The memory of the hub includes non-volatile memories
Medium, built-in storage.The non-volatile memory medium is stored with operating system, computer program and database.The built-in storage
Operation for operating system and computer program in non-volatile memory medium provides environment.The database of the hub is used for
Store related data when simulation test.The network interface of the hub is used for logical by network connection with external first terminal
Letter.Serial ports pinboard includes card reader interface and dummy head interface, by having connected card reader interface and card reader connection communication,
By having connected dummy head interface and dummy head connection communication.Card reader is used to read the number in external smart card after actuation
According to dummy head for being modeled to smart card after actuation, with external Devices to test connection communication.The computer program is processed
To realize a kind of analog detection method when device executes.
It will be understood by those skilled in the art that structure shown in Figure 10, only part relevant to application scheme
The block diagram of structure, does not constitute the restriction for the hub being applied thereon to application scheme, and specific hub can wrap
It includes than more or fewer components as shown in the figure, perhaps combines certain components or with different component layouts.
In one embodiment, a kind of hub, including memory and processor are provided, which is stored with calculating
Machine program, the processor perform the steps of reception switching command when executing computer program, determine target according to switching command
Card reader and target simulation head；Receive the test request that Devices to test is sent by target simulation hair；Passed through according to test request
Target card reader reads the first data in smart card to be measured and first data is forwarded to Devices to test by target simulation head, real
Data interaction between existing Devices to test and smart card to be measured, to complete when time test.
In one embodiment, a kind of computer readable storage medium is provided, computer program is stored thereon with, is calculated
Machine program performs the steps of reception switching command when being executed by processor, determine target card reader and mesh according to switching command
Mark dummy head；Receive the test request that Devices to test is sent by target simulation hair；Pass through target card reader according to test request
First data are forwarded to Devices to test by target simulation head by the first data read in smart card to be measured, realize Devices to test
With the data interaction between smart card to be measured, thus complete when time test.
Those of ordinary skill in the art will appreciate that realizing all or part of the process in above-described embodiment method, being can be with
Relevant hardware is instructed to complete by computer program, the computer program can be stored in a non-volatile computer
In read/write memory medium, the computer program is when being executed, it may include such as the process of the embodiment of above-mentioned each method.Wherein,
To any reference of memory, storage, database or other media used in each embodiment provided herein,
Including non-volatile and/or volatile memory.Nonvolatile memory may include read-only memory (ROM), programming ROM
(PROM), electrically programmable ROM (EPROM), electrically erasable ROM (EEPROM) or flash memory.Volatile memory may include
Random access memory (RAM) or external cache.By way of illustration and not limitation, RAM is available in many forms,
Such as static state RAM (SRAM), dynamic ram (DRAM), synchronous dram (SDRAM), double data rate sdram (DDRSDRAM), enhancing
Type SDRAM (ESDRAM), synchronization link (Synchlink), DRAM (SLDRAM), memory bus (Rambus) direct RAM
(RDRAM), direct memory bus dynamic ram (DRDRAM) and memory bus dynamic ram (RDRAM) etc..
Each technical characteristic of above embodiments can be combined arbitrarily, for simplicity of description, not to above-described embodiment
In each technical characteristic it is all possible combination be all described, as long as however, the combination of these technical characteristics be not present lance
Shield all should be considered as described in this specification.
The several embodiments of the application above described embodiment only expresses, the description thereof is more specific and detailed, but simultaneously
It cannot therefore be construed as limiting the scope of the patent.It should be pointed out that coming for those of ordinary skill in the art
It says, without departing from the concept of this application, various modifications and improvements can be made, these belong to the protection of the application
Range.Therefore, the scope of protection shall be subject to the appended claims for the application patent.
Claims (10)
1. a kind of analog detection method, which comprises
Switching command is received, target card reader and target simulation head are determined according to switching command；
Receive the test request that Devices to test is sent by the target simulation hair；
The first data in smart card to be measured are read by the target card reader according to the test request；
First data are forwarded to the Devices to test by the target simulation head, realize Devices to test and intelligence to be measured
Data interaction between card, to complete when time test.
2. the method according to claim 1, wherein described determine target card reader and target according to switching command
The step of dummy head, comprising:
To be switched interface identifier is obtained according to the switching command；
Judge the interface type of the to be switched interface identifier；
When the corresponding interface type of the to be switched interface identifier is card reader interface, card reader interface will be had connected and switched to
The corresponding target card reader interface of the to be switched interface identifier；
When the corresponding interface type of the to be switched interface identifier is dummy head interface, dummy head interface will be had connected and switched to
The corresponding target simulation head interface of the to be switched interface identifier.
3. the method according to claim 1, wherein described determine target card reader and target according to switching command
After the step of dummy head, further includes:
Starting has connected the corresponding target card reader of card reader interface；
Card seeking instruction is sent to the target card reader after starting, so that whether target card reader detection has in card reading region
Smart card to be measured；
When the target card reader successfully is detected smart card to be measured, starting has connected the corresponding target of dummy head interface
Dummy head executes the step of receiving the test request that the Devices to test is sent by target simulation hair.
4. the method according to claim 1, wherein described pass through the target card reading according to the test request
Device reads the first data in smart card to be measured, comprising:
When receiving the test request, the test request is packaged according to reader device agreement；
Test request after encapsulation is sent to the target card reader by having connected card reader interface, the test request is used
The first data in smart card to be measured are read for the test request in the instruction target card reader.
5. the method according to claim 1, wherein described pass through the target simulation head for first data
It is forwarded to the Devices to test, comprising:
First data are packaged according to dummy head device protocol；By the first data after encapsulation by having connected simulation
Head interface is sent to the target simulation head, so that the Devices to test obtains first number by the target simulation head
According to.
6. a kind of simulated testing system, the system comprises: first terminal, hub, Devices to test；Hub include mainboard,
Multiple candidate's card reader, multiple candidate dummy heads, serial ports pinboard, the mainboard connect the serial ports pinboard, the serial ports
The interface of pinboard is for connecting the candidate card reader and the candidate dummy head, in which:
The first terminal, for sending switching command to the mainboard；
The mainboard determines that target is read from the candidate card reader according to the switching command after receiving switching command
Card device determines target simulation head from the candidate dummy head；
The serial ports pinboard establishes target card reader for connecting the target card reader by having connected card reader interface
Communication between mainboard；It is also used to connect the target simulation head by having connected dummy head interface, establishes target simulation head
Communication between mainboard；
The target simulation head, for meeting the built-in vertical company in card reading region non-with Devices to test by being modeled to smart card to be measured
It connects；
The Devices to test, for sending test request to the mainboard by the target simulation head；
The mainboard, after receiving the test request, by the test request according to the card reader of the target card reader
After device protocol is packaged, it is forwarded to the target card reader；
The target card reader reads the of smart card to be measured according to the test request after receiving the test request
First data are sent to the mainboard by one data；
The mainboard, after receiving first data, by first data according to the dummy head of the target simulation head
After device protocol is packaged, it is transmitted to the target simulation head；
The Devices to test realizes Devices to test and intelligence to be measured for obtaining first data by the target simulation head
Data interaction between capable of blocking is completed when time test.
7. a kind of simulating test device, which is characterized in that described device includes:
Switching module determines target card reader and target simulation head according to switching command for receiving switching command；
Test request receiving module, the test request sent for receiving Devices to test by the target simulation hair；
First data acquisition module, for being read in smart card to be measured according to the test request by the target card reader
First data；
First data forwarding module, for first data to be forwarded to the Devices to test by the target simulation head,
So that the Devices to test handles first data, to complete the current test to the Devices to test.
8. device according to claim 7, which is characterized in that the switching module includes:
Type judging unit judges the alias mark to be cut for obtaining to be switched interface identifier according to the switching command
The interface type of knowledge；
Card reader switch unit will for when the corresponding interface type of the to be switched interface identifier is card reader interface
Connection card reader interface switches to the corresponding target card reader interface of the to be switched interface identifier；
Dummy head switch unit will for when the corresponding interface type of the to be switched interface identifier is dummy head interface
Connection dummy head interface switches to the corresponding target simulation head interface of the to be switched interface identifier.
9. a kind of hub, including memory and processor, the memory are stored with computer program, which is characterized in that institute
State the step of realizing any one of claims 1 to 5 the method when processor executes the computer program.
10. a kind of computer readable storage medium, is stored thereon with computer program, which is characterized in that the computer program
The step of any one of claims 1 to 5 the method is realized when being executed by processor.
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