CN110060980A - 硬屏蔽上的硅涂层 - Google Patents
硬屏蔽上的硅涂层 Download PDFInfo
- Publication number
- CN110060980A CN110060980A CN201910108416.8A CN201910108416A CN110060980A CN 110060980 A CN110060980 A CN 110060980A CN 201910108416 A CN201910108416 A CN 201910108416A CN 110060980 A CN110060980 A CN 110060980A
- Authority
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- China
- Prior art keywords
- thickness
- silicon layer
- layer
- hard shielding
- shielding material
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
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- 229910052710 silicon Inorganic materials 0.000 title claims abstract description 55
- 239000010703 silicon Substances 0.000 title claims abstract description 55
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 title claims abstract description 54
- 238000000576 coating method Methods 0.000 title abstract description 15
- 239000011248 coating agent Substances 0.000 title description 14
- 239000000463 material Substances 0.000 claims abstract description 45
- 239000004411 aluminium Substances 0.000 claims abstract description 26
- 229910052782 aluminium Inorganic materials 0.000 claims abstract description 26
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims abstract description 26
- 239000010949 copper Substances 0.000 claims abstract description 21
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims abstract description 20
- 229910052802 copper Inorganic materials 0.000 claims abstract description 20
- 229910052751 metal Inorganic materials 0.000 claims description 8
- 239000002184 metal Substances 0.000 claims description 8
- 229910000831 Steel Inorganic materials 0.000 claims description 4
- 239000010959 steel Substances 0.000 claims description 4
- 230000000737 periodic effect Effects 0.000 claims description 2
- 238000000034 method Methods 0.000 abstract description 42
- 238000004519 manufacturing process Methods 0.000 abstract description 7
- 239000007921 spray Substances 0.000 description 27
- 230000008569 process Effects 0.000 description 13
- 238000004544 sputter deposition Methods 0.000 description 11
- 230000007547 defect Effects 0.000 description 9
- 239000007789 gas Substances 0.000 description 9
- 238000010891 electric arc Methods 0.000 description 7
- 238000001704 evaporation Methods 0.000 description 5
- 238000005507 spraying Methods 0.000 description 5
- 239000007858 starting material Substances 0.000 description 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 3
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 3
- 239000010935 stainless steel Substances 0.000 description 3
- 229910001220 stainless steel Inorganic materials 0.000 description 3
- 239000000758 substrate Substances 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 2
- 229910052796 boron Inorganic materials 0.000 description 2
- 239000011575 calcium Substances 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 239000011651 chromium Substances 0.000 description 2
- 239000000428 dust Substances 0.000 description 2
- 239000001257 hydrogen Substances 0.000 description 2
- 229910052739 hydrogen Inorganic materials 0.000 description 2
- 229910052738 indium Inorganic materials 0.000 description 2
- 229910000765 intermetallic Inorganic materials 0.000 description 2
- 239000011777 magnesium Substances 0.000 description 2
- 239000011572 manganese Substances 0.000 description 2
- 230000007246 mechanism Effects 0.000 description 2
- 229910001092 metal group alloy Inorganic materials 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 239000010955 niobium Substances 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- 239000010948 rhodium Substances 0.000 description 2
- 238000004062 sedimentation Methods 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 239000010936 titanium Substances 0.000 description 2
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 2
- 229910052721 tungsten Inorganic materials 0.000 description 2
- 239000010937 tungsten Substances 0.000 description 2
- OYPRJOBELJOOCE-UHFFFAOYSA-N Calcium Chemical compound [Ca] OYPRJOBELJOOCE-UHFFFAOYSA-N 0.000 description 1
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 229910052684 Cerium Inorganic materials 0.000 description 1
- VEXZGXHMUGYJMC-UHFFFAOYSA-M Chloride anion Chemical compound [Cl-] VEXZGXHMUGYJMC-UHFFFAOYSA-M 0.000 description 1
- ZAMOUSCENKQFHK-UHFFFAOYSA-N Chlorine atom Chemical compound [Cl] ZAMOUSCENKQFHK-UHFFFAOYSA-N 0.000 description 1
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 1
- 229910052692 Dysprosium Inorganic materials 0.000 description 1
- 229910052691 Erbium Inorganic materials 0.000 description 1
- 229910052693 Europium Inorganic materials 0.000 description 1
- KRHYYFGTRYWZRS-UHFFFAOYSA-M Fluoride anion Chemical compound [F-] KRHYYFGTRYWZRS-UHFFFAOYSA-M 0.000 description 1
- PXGOKWXKJXAPGV-UHFFFAOYSA-N Fluorine Chemical compound FF PXGOKWXKJXAPGV-UHFFFAOYSA-N 0.000 description 1
- 229910052688 Gadolinium Inorganic materials 0.000 description 1
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 1
- 229910052689 Holmium Inorganic materials 0.000 description 1
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 1
- 229910052765 Lutetium Inorganic materials 0.000 description 1
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 description 1
- PWHULOQIROXLJO-UHFFFAOYSA-N Manganese Chemical compound [Mn] PWHULOQIROXLJO-UHFFFAOYSA-N 0.000 description 1
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- 229910052779 Neodymium Inorganic materials 0.000 description 1
- 229910052777 Praseodymium Inorganic materials 0.000 description 1
- 229910052773 Promethium Inorganic materials 0.000 description 1
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical compound [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 description 1
- 229910052772 Samarium Inorganic materials 0.000 description 1
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 description 1
- UCKMPCXJQFINFW-UHFFFAOYSA-N Sulphide Chemical compound [S-2] UCKMPCXJQFINFW-UHFFFAOYSA-N 0.000 description 1
- 239000005864 Sulphur Substances 0.000 description 1
- 229910052771 Terbium Inorganic materials 0.000 description 1
- 229910052775 Thulium Inorganic materials 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 229910052769 Ytterbium Inorganic materials 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 229910052787 antimony Inorganic materials 0.000 description 1
- WATWJIUSRGPENY-UHFFFAOYSA-N antimony atom Chemical compound [Sb] WATWJIUSRGPENY-UHFFFAOYSA-N 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 229910052788 barium Inorganic materials 0.000 description 1
- DSAJWYNOEDNPEQ-UHFFFAOYSA-N barium atom Chemical compound [Ba] DSAJWYNOEDNPEQ-UHFFFAOYSA-N 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 229910052790 beryllium Inorganic materials 0.000 description 1
- ATBAMAFKBVZNFJ-UHFFFAOYSA-N beryllium atom Chemical compound [Be] ATBAMAFKBVZNFJ-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 229910052797 bismuth Inorganic materials 0.000 description 1
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 description 1
- 229910052793 cadmium Inorganic materials 0.000 description 1
- BDOSMKKIYDKNTQ-UHFFFAOYSA-N cadmium atom Chemical compound [Cd] BDOSMKKIYDKNTQ-UHFFFAOYSA-N 0.000 description 1
- 229910052791 calcium Inorganic materials 0.000 description 1
- -1 carbide Chemical class 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- GWXLDORMOJMVQZ-UHFFFAOYSA-N cerium Chemical compound [Ce] GWXLDORMOJMVQZ-UHFFFAOYSA-N 0.000 description 1
- 239000000460 chlorine Substances 0.000 description 1
- 229910052801 chlorine Inorganic materials 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 229910017052 cobalt Inorganic materials 0.000 description 1
- 239000010941 cobalt Substances 0.000 description 1
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- KBQHZAAAGSGFKK-UHFFFAOYSA-N dysprosium atom Chemical compound [Dy] KBQHZAAAGSGFKK-UHFFFAOYSA-N 0.000 description 1
- UYAHIZSMUZPPFV-UHFFFAOYSA-N erbium Chemical compound [Er] UYAHIZSMUZPPFV-UHFFFAOYSA-N 0.000 description 1
- OGPBJKLSAFTDLK-UHFFFAOYSA-N europium atom Chemical compound [Eu] OGPBJKLSAFTDLK-UHFFFAOYSA-N 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 239000011737 fluorine Substances 0.000 description 1
- 229910052731 fluorine Inorganic materials 0.000 description 1
- UIWYJDYFSGRHKR-UHFFFAOYSA-N gadolinium atom Chemical compound [Gd] UIWYJDYFSGRHKR-UHFFFAOYSA-N 0.000 description 1
- 229910052733 gallium Inorganic materials 0.000 description 1
- 229910052732 germanium Inorganic materials 0.000 description 1
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 1
- 229910052735 hafnium Inorganic materials 0.000 description 1
- VBJZVLUMGGDVMO-UHFFFAOYSA-N hafnium atom Chemical compound [Hf] VBJZVLUMGGDVMO-UHFFFAOYSA-N 0.000 description 1
- 239000001307 helium Substances 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
- KJZYNXUDTRRSPN-UHFFFAOYSA-N holmium atom Chemical compound [Ho] KJZYNXUDTRRSPN-UHFFFAOYSA-N 0.000 description 1
- 150000002431 hydrogen Chemical class 0.000 description 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 229920000554 ionomer Polymers 0.000 description 1
- 229910052741 iridium Inorganic materials 0.000 description 1
- GKOZUEZYRPOHIO-UHFFFAOYSA-N iridium atom Chemical compound [Ir] GKOZUEZYRPOHIO-UHFFFAOYSA-N 0.000 description 1
- 229910052747 lanthanoid Inorganic materials 0.000 description 1
- 150000002602 lanthanoids Chemical class 0.000 description 1
- 229910052746 lanthanum Inorganic materials 0.000 description 1
- FZLIPJUXYLNCLC-UHFFFAOYSA-N lanthanum atom Chemical compound [La] FZLIPJUXYLNCLC-UHFFFAOYSA-N 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- OHSVLFRHMCKCQY-UHFFFAOYSA-N lutetium atom Chemical compound [Lu] OHSVLFRHMCKCQY-UHFFFAOYSA-N 0.000 description 1
- 229910052749 magnesium Inorganic materials 0.000 description 1
- 229910052748 manganese Inorganic materials 0.000 description 1
- 239000000155 melt Substances 0.000 description 1
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 1
- 229910052753 mercury Inorganic materials 0.000 description 1
- 229910052987 metal hydride Inorganic materials 0.000 description 1
- 150000004681 metal hydrides Chemical class 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- QEFYFXOXNSNQGX-UHFFFAOYSA-N neodymium atom Chemical compound [Nd] QEFYFXOXNSNQGX-UHFFFAOYSA-N 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 229910052758 niobium Inorganic materials 0.000 description 1
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 description 1
- 150000004767 nitrides Chemical class 0.000 description 1
- 210000000056 organ Anatomy 0.000 description 1
- 229910052762 osmium Inorganic materials 0.000 description 1
- SYQBFIAQOQZEGI-UHFFFAOYSA-N osmium atom Chemical compound [Os] SYQBFIAQOQZEGI-UHFFFAOYSA-N 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 150000002927 oxygen compounds Chemical class 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- PUDIUYLPXJFUGB-UHFFFAOYSA-N praseodymium atom Chemical compound [Pr] PUDIUYLPXJFUGB-UHFFFAOYSA-N 0.000 description 1
- VQMWBBYLQSCNPO-UHFFFAOYSA-N promethium atom Chemical compound [Pm] VQMWBBYLQSCNPO-UHFFFAOYSA-N 0.000 description 1
- 229910052705 radium Inorganic materials 0.000 description 1
- HCWPIIXVSYCSAN-UHFFFAOYSA-N radium atom Chemical compound [Ra] HCWPIIXVSYCSAN-UHFFFAOYSA-N 0.000 description 1
- 229910052702 rhenium Inorganic materials 0.000 description 1
- WUAPFZMCVAUBPE-UHFFFAOYSA-N rhenium atom Chemical compound [Re] WUAPFZMCVAUBPE-UHFFFAOYSA-N 0.000 description 1
- 229910052703 rhodium Inorganic materials 0.000 description 1
- MHOVAHRLVXNVSD-UHFFFAOYSA-N rhodium atom Chemical compound [Rh] MHOVAHRLVXNVSD-UHFFFAOYSA-N 0.000 description 1
- 229910052707 ruthenium Inorganic materials 0.000 description 1
- KZUNJOHGWZRPMI-UHFFFAOYSA-N samarium atom Chemical compound [Sm] KZUNJOHGWZRPMI-UHFFFAOYSA-N 0.000 description 1
- 229910052706 scandium Inorganic materials 0.000 description 1
- SIXSYDAISGFNSX-UHFFFAOYSA-N scandium atom Chemical compound [Sc] SIXSYDAISGFNSX-UHFFFAOYSA-N 0.000 description 1
- VSZWPYCFIRKVQL-UHFFFAOYSA-N selanylidenegallium;selenium Chemical compound [Se].[Se]=[Ga].[Se]=[Ga] VSZWPYCFIRKVQL-UHFFFAOYSA-N 0.000 description 1
- 150000003376 silicon Chemical class 0.000 description 1
- 238000010025 steaming Methods 0.000 description 1
- 229910052712 strontium Inorganic materials 0.000 description 1
- CIOAGBVUUVVLOB-UHFFFAOYSA-N strontium atom Chemical compound [Sr] CIOAGBVUUVVLOB-UHFFFAOYSA-N 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
- 229910052713 technetium Inorganic materials 0.000 description 1
- GKLVYJBZJHMRIY-UHFFFAOYSA-N technetium atom Chemical compound [Tc] GKLVYJBZJHMRIY-UHFFFAOYSA-N 0.000 description 1
- JBQYATWDVHIOAR-UHFFFAOYSA-N tellanylidenegermanium Chemical compound [Te]=[Ge] JBQYATWDVHIOAR-UHFFFAOYSA-N 0.000 description 1
- GZCRRIHWUXGPOV-UHFFFAOYSA-N terbium atom Chemical compound [Tb] GZCRRIHWUXGPOV-UHFFFAOYSA-N 0.000 description 1
- 229910052716 thallium Inorganic materials 0.000 description 1
- BKVIYDNLLOSFOA-UHFFFAOYSA-N thallium Chemical compound [Tl] BKVIYDNLLOSFOA-UHFFFAOYSA-N 0.000 description 1
- FRNOGLGSGLTDKL-UHFFFAOYSA-N thulium atom Chemical compound [Tm] FRNOGLGSGLTDKL-UHFFFAOYSA-N 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- 229910052723 transition metal Inorganic materials 0.000 description 1
- 150000003624 transition metals Chemical class 0.000 description 1
- LEONUFNNVUYDNQ-UHFFFAOYSA-N vanadium atom Chemical compound [V] LEONUFNNVUYDNQ-UHFFFAOYSA-N 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
- NAWDYIZEMPQZHO-UHFFFAOYSA-N ytterbium Chemical compound [Yb] NAWDYIZEMPQZHO-UHFFFAOYSA-N 0.000 description 1
- 229910052727 yttrium Inorganic materials 0.000 description 1
- VWQVUPCCIRVNHF-UHFFFAOYSA-N yttrium atom Chemical compound [Y] VWQVUPCCIRVNHF-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C28/00—Coating for obtaining at least two superposed coatings either by methods not provided for in a single one of groups C23C2/00 - C23C26/00 or by combinations of methods provided for in subclasses C23C and C25C or C25D
- C23C28/30—Coatings combining at least one metallic layer and at least one inorganic non-metallic layer
- C23C28/34—Coatings combining at least one metallic layer and at least one inorganic non-metallic layer including at least one inorganic non-metallic material layer, e.g. metal carbide, nitride, boride, silicide layer and their mixtures, enamels, phosphates and sulphates
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C4/00—Coating by spraying the coating material in the molten state, e.g. by flame, plasma or electric discharge
- C23C4/04—Coating by spraying the coating material in the molten state, e.g. by flame, plasma or electric discharge characterised by the coating material
- C23C4/06—Metallic material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/552—Protection against radiation, e.g. light or electromagnetic waves
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B15/00—Layered products comprising a layer of metal
- B32B15/01—Layered products comprising a layer of metal all layers being exclusively metallic
- B32B15/012—Layered products comprising a layer of metal all layers being exclusively metallic one layer being formed of an iron alloy or steel, another layer being formed of aluminium or an aluminium alloy
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B15/00—Layered products comprising a layer of metal
- B32B15/01—Layered products comprising a layer of metal all layers being exclusively metallic
- B32B15/013—Layered products comprising a layer of metal all layers being exclusively metallic one layer being formed of an iron alloy or steel, another layer being formed of a metal other than iron or aluminium
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B15/00—Layered products comprising a layer of metal
- B32B15/01—Layered products comprising a layer of metal all layers being exclusively metallic
- B32B15/013—Layered products comprising a layer of metal all layers being exclusively metallic one layer being formed of an iron alloy or steel, another layer being formed of a metal other than iron or aluminium
- B32B15/015—Layered products comprising a layer of metal all layers being exclusively metallic one layer being formed of an iron alloy or steel, another layer being formed of a metal other than iron or aluminium the said other metal being copper or nickel or an alloy thereof
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B15/00—Layered products comprising a layer of metal
- B32B15/04—Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B15/00—Layered products comprising a layer of metal
- B32B15/04—Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material
- B32B15/043—Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material of metal
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B15/00—Layered products comprising a layer of metal
- B32B15/18—Layered products comprising a layer of metal comprising iron or steel
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B15/00—Layered products comprising a layer of metal
- B32B15/20—Layered products comprising a layer of metal comprising aluminium or copper
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- C—CHEMISTRY; METALLURGY
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- C—CHEMISTRY; METALLURGY
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- C—CHEMISTRY; METALLURGY
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- C—CHEMISTRY; METALLURGY
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- C—CHEMISTRY; METALLURGY
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- C—CHEMISTRY; METALLURGY
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- C—CHEMISTRY; METALLURGY
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- C—CHEMISTRY; METALLURGY
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- C—CHEMISTRY; METALLURGY
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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Abstract
本申请涉及硬屏蔽上的硅涂层。公开了一种器件,所述器件包括硬屏蔽材料;包括铝或铜的层;和具有第一厚度的硅层。所述器件还可以包括具有第二厚度的硅层。还公开了制造所述器件的方法。
Description
发明领域
本公开内容总体上涉及一种器件,所述器件包括硬屏蔽材料;包括铝或铜的层;和具有第一厚度的硅层。所述器件还可以包括具有第二厚度的硅层。还公开了制造所述器件的方法。所述器件可以包括较少的缺陷并且可以具有增加的耐久性。
发明背景
过量的涂层材料可以附着至溅射涂覆室的壁。溅射室的壁上的涂层可以破裂、脱落,并且可以产生灰尘。溅射涂覆室的每个使用周期都增加了可以在被沉积在涂覆室中的涂层中看到的缺陷的数量和类型。增加的缺陷的数量导致降低的收率,这导致通过涂覆室的较低产量,这导致较低的容量。
发明概述
在一个方面中,公开了一种器件,所述器件包括硬屏蔽材料;包括铝或铜的层;和硅层。
在另一个方面中,公开了一种制造器件的方法,该方法包括提供硬屏蔽材料;使用双丝电弧喷涂工艺(twin wire arc spray process)在硬屏蔽材料的顶部上施加一层;以及使用等离子体喷涂工艺在使用双丝电弧喷涂工艺施加的层的顶部上施加具有第一厚度的硅层。
各个实施方案的另外的特征和优点将部分地在以下的描述中阐述,并且部分地从描述中将是明显的或者可以通过实践各个实施方案而得知。各个实施方案的目的和其他优点将通过在本文的描述中特别指出的要素和组合来实现和获得。
附图简述
从详细描述和附图中可以更全面地理解在其若干方面和实施方案中的本公开内容,其中:
图1是根据本发明的方面的器件的横截面;
图2A和图2B是根据本发明的方面的器件的图像;
图3A和图3B是根据本发明的方面的器件的图像;和
图4A和图4B是根据本发明的方面的器件的图像;
在整个本说明书和附图中,相同的附图标记表示相同的要素。
发明详述
应理解,前述的一般性描述和下面的详细描述两者仅是示例性的和解释性的,并且意图提供对本教导的各种实施方案的解释。每个图中所示的层/部件可以关于特定的图被描述,但是应当理解,特定层/部件的描述将适用于其他图中的等效层/部件。
在其广泛和变化的实施方案中,本文公开了器件10,所述器件10包括硬屏蔽材料20;包括铝或铜的层30;和具有第一厚度的硅层40。如图1所示,该器件可以包括硬屏蔽材料20;包括铝或铜的层30;具有第一厚度的硅层40;和具有第二厚度的硅层50。图2A-图4B是如图1所示的器件的图像。
硬屏蔽材料202可以是任何合适的基底材料。在一个方面中,硬屏蔽材料20可以是金属。如本文所使用的,术语“金属”指的是周期表的第2至13族(包括第2族和第13族)的元素,加上第14族和第15族中的选定元素。因此,术语“金属”广义地指的是以下元素:
第2或IIA族:铍(Be)、镁(Mg)、钙(Ca)、锶(Sr)、钡(Ba)和镭(Ra)。
第3-12族:过渡金属(第IIIB族、第IVB族、第VB族、第VIB族、第VIIB族、第VIII族、第IB族和第IIB族),包括钪(Sc)、钇(Y)、钛(Ti)、锆(Zr)、铪(Hf)、钒(V)、铌(Nb)、钽(Ta)、铬(Cr)、钼(Mo)、钨(W)、锰(Mn)、锝(Tc)、铼(Re)、铁(Fe)、钌(Ru)、锇(Os)、钴(Co)、铑(Rh)、铱(Ir)、镍(Ni)、钯(Pd)、铂(Pt)、铜(Cu)、银(Ag)、金(Au)、锌(Zn)、镉(Cd)和汞(Hg)。
第13或IIIA族:硼(B)、铝(Al)、镓(Ga)、铟(In)和铊(Tl)。
镧系元素:镧(La)、铈(Ce)、镨(Pr)、钕(Nd)、钷(Pm)、钐(Sm)、铕(Eu)、钆(Gd)、铽(Tb)、镝(Dy)、钬(Ho)、铒(Er)、铥(Tm)、镱(Yb)和镥(Lu)。
第14或IVA族:锗(Ge)、锡(Sn)和铅(Pb)。
第15或VA族:锑(Sn)和铋(Bi)。
在一个方面中,硬屏蔽材料20可以是钢例如不锈钢或铝。硬屏蔽材料20可以具有在从约1mm至约5mm的范围内的厚度,例如从约2mm至约4mm的范围内的厚度,并且作为另外的例子,约3mm厚。预期也可以使用在所公开的范围内的任何厚度。
在所公开的器件10中,包括铝或铜的层30可以施加在硬屏蔽材料20的顶部上。层30可以是粗糙的金属,例如粗糙的铝层或粗糙的铜层。在一个方面中,此层30可以使用双丝电弧喷涂工艺施加。双丝电弧喷涂工艺可以包括各种步骤,例如:(A)向反应室提供至少一种选自由金属、金属合金、金属化合物和陶瓷组成的组的起始材料;(B)操作包括两根丝线和被可控地供给到腔室中的工作气体的双丝电弧喷嘴,以在两根丝线的两个会聚的前端(leading tip)之间形成电弧,以在前端加热并熔化起始材料,用于提供沿预定的方向行进的液滴流;以及(C)操作高能量源,用于在电弧附近和在腔室内部产生蒸发区,其中液滴被蒸发以形成蒸汽物质。两根丝线可以被连续地供给到腔室中,其中丝线的前端以高供给速率连续地熔化(并且部分地蒸发),用于在不间断的情况下并且以高的生产率连续地产生蒸汽材料。蒸汽材料可以撞击并沉积到硬屏蔽材料例如基底上,以形成薄膜或涂层。可以调节基底表面附近的温度,使得蒸汽材料冷凝并形成涂层,例如铝或铜的涂层。
工作气体可以选自例如氢、氧、碳、氮、氯、氟、硼和硫,以分别形成金属氢化物、氧化物、碳化物、氮化物、氯化物、氟化物、硼化物和硫化物及其组合。
起始材料可以包括呈丝线的两种不同材料。两种不同的材料可以以这样的方式构成两根丝线,该方式使得两根丝线具有不同的材料组成。
两根金属丝线可以由动力辊驱动,以与两个相应的导电套(conductive jacket)物理接触,所述导电套通过导电块被供应有“+”和“-”电压或脉冲功率。电压极性可以颠倒;即,“-”和“+”代替“+”和“-”。电压可以来自DC或脉冲电源。两根丝线的下端可以以约30°-60°的角度彼此接近。可以使两端彼此接触持续短的时间段。由于高电流密度,这样的“短路”接触可以产生超高温度,导致电离电弧的形成。稳定的电弧可以被维持,条件是电流被持续地供应,维持一定水平的气体压力,并且丝线以恒定或脉动速度供给。通过气体通道从气体源(例如压缩空气瓶)引入的压缩空气流也可以用于将液体流向下带入到蒸发区中。
包括铝或铜的层30可以以约0.001mm至约5mm的厚度,例如从约0.05mm至约4mm的厚度,并且作为另外的实例从约0.1mm至约3mm的厚度,施加在硬屏蔽材料20的顶部上。在一个方面中,层20可以使用双丝电弧喷涂工艺施加以实现约0.1mm的厚度。
在所公开的器件10中,具有第一厚度的硅层40可以施加到包括铝或铜的层30上。硅层40可以使用等离子体喷涂工艺来施加。等离子体喷涂工艺可以使用DC电弧以产生高温(1500℃)电离等离子体气体流。材料例如硅可以在惰性气体流中被携带到等离子体射流中,在等离子体射流中,材料被加热并被推向基底,例如施加在硬屏蔽材料的顶部上的铝或铜的暴露层。等离子体喷枪可以包括铜阳极和钨阴极,两者都可以是水冷的。等离子体气体,例如氩气、氮气、氢气和氦气,可以围绕阴极流动并穿过阳极,所述阳极可以被成形为收缩喷嘴。
具有第一厚度的硅层40可以以约0.05mm至约2mm,例如从约0.08mm至约1.5mm,并且作为另外的实例从约0.1mm至约1mm的第一厚度存在。
由于存在相对于彼此不同的材料,可能会发生应力和由此产生的缺陷。例如,包括铝或铜的层30可以在相邻的硅层40中产生应力和缺陷,该硅层40具有通过等离子体喷涂工艺施加的第一厚度。然而,由于硅层40的第一厚度,这些缺陷可以被减少或最小化。例如,缺陷可能仅存在于从包括铝或铜的层进入硅层40的20nm内。因此,缺陷不会一直延伸穿过硅层40。
另外,具有第一厚度的硅层40可以具有与硅层50相似的性质,所述硅层50具有第二厚度并且经由溅射沉积工艺施加。
器件10还可以包括具有第二厚度的硅层50,所述硅层50已经通过溅射沉积工艺被施加到具有第一厚度的硅层40上,该硅层40通过等离子体喷涂工艺施加。硅层50可以以从约10nm至约100nm,例如从约30nm至约80nm,并且作为另外的实例从约45nm至约60nm的第二厚度存在。
制造器件10的方法可以包括提供硬屏蔽材料20;使用双丝电弧喷涂工艺在硬屏蔽材料20的顶部上施加层30;以及使用等离子体喷涂工艺在使用双丝电弧喷涂工艺施加的层30的顶部上施加具有第一厚度的硅层40。
如上所讨论的,硬屏蔽材料20可以是任何基底材料。在一个方面中,硬屏蔽材料20是钢或铝。硬屏蔽材料20的厚度可以是约3mm。
在一个方面中,使用双丝电弧喷涂工艺施加的层30是铝层。在另一个方面中,使用双丝电弧喷涂工艺施加的层30是铜层。使用双丝电弧喷涂施加的层30可以具有约1mm的厚度。
使用等离子体喷涂工艺施加的具有第一厚度的硅层40可以使得能够沉积较厚的硅层。此硅层40可以以足够厚的层施加,以避免和/或最小化由于不同材料的存在而发生的缺陷的风险。此外,因为此较厚的硅层40在不同的工艺步骤中施加,所以使得能够溅射沉积具有第二厚度的硅层50以使用较少的材料,即,它是较薄的层。较少材料的使用将降低硅出现在溅射涂覆室壁上、从壁上脱落以及在器件10上产生灰尘的可能性。
制造器件10的方法还包括,在使用等离子体喷涂工艺施加具有第一厚度的硅层40之后,在溅射工艺中施加具有第二厚度的硅层50。在溅射工艺中施加的硅层50可以以约50nm的厚度存在。
使用两个单独的工艺来施加不同厚度的硅层40、硅层50可以减少所得的器件10中的缺陷,增加收率,增加产量,并且增加容量。此外,所施加的硅层可以改变器件的应力概况。此外,所施加的硅层可以增加器件的耐久性。
实施例
实施例1-器件10如下制造:使用具有3mm的厚度的不锈钢的硬屏蔽材料20作为基底。使用双丝电弧喷涂工艺将铝层30施加到不锈钢板20上。铝层30的厚度为0.1mm。使用等离子体喷涂工艺将具有第一厚度的硅层40施加到铝层30上。硅层40的厚度为0.1mm。将具有第二厚度的硅层50溅射沉积到具有第一厚度的等离子体喷涂的硅层40上。溅射沉积的硅层50的厚度为50nm。图2A-图4B是根据该方法制造的器件的图像。
一种制造器件的方法,包括:提供硬屏蔽材料;使用双丝电弧喷涂工艺在硬屏蔽材料的顶部上施加一层;以及使用等离子体喷涂工艺在使用双丝电弧喷涂工艺施加的层的顶部上施加具有第一厚度的硅层。在一些实施方案中,其中所述硬屏蔽材料是钢或铝。在一些实施方案中,其中使用双丝电弧喷涂工艺施加的层是铝层。在一些实施方案中,其中使用双丝电弧喷涂工艺施加的层是铜层。在一些实施方案中,还包括在使用等离子体喷涂工艺施加硅层之后,在溅射工艺中施加具有第二厚度的硅层。在一些实施方案中,其中所施加的具有第一厚度的硅层改变所述器件的应力概况。在一些实施方案中,其中所施加的具有第一厚度的硅层增加所述器件的耐久性。在一些实施方案中,其中所述双丝电弧喷涂工艺包括向反应室提供至少一种选自由金属、金属合金、金属化合物和陶瓷组成的组的起始材料。在前述实施方案中,其中所述双丝电弧喷涂工艺还包括操作双丝电弧喷嘴,所述双丝电弧喷嘴包括两根丝线和被可控地供给到所述反应室中的工作气体,以在两根丝线的两个会聚的前端之间形成电弧,以在所述前端加热并熔化至少一种起始材料,用于提供沿预定的方向行进的液滴流。在前述实施方案中,其中所述双电弧喷涂工艺还包括操作高能量源,用于在所述电弧附近和在所述反应室内部产生蒸发区,其中所述液滴被蒸发以形成蒸汽物质。
从前面的描述中,本领域技术人员可以理解,本教导可以以多种形式实现。因此,虽然已经结合其特定的实施方案和实施例描述了这些教导,但是本教导的真实范围不应该被如此限制。可以做出各种变化和修改,而不脱离本文教导的范围。
本范围公开内容将被广泛地解释。意图本公开内容公开实现本文公开的器件、活动和机械动作的等效物、设备(means)、系统和方法。对于所公开的每个器件、物品、方法、设备、机械元件或机构,意图本公开内容也涵盖在其公开内容中,并且教导了用于实践本文公开的许多方面、机构和器件的等效物、设备、系统和方法。此外,本公开内容涉及涂层及其许多方面、特征和要素。这样的器件在其使用和操作中可以是动态的,本公开内容意图涵盖使用该器件和/或制造物品的等效物、设备、系统和方法,及其与本文公开的操作和功能的描述和精神一致的许多方面。本申请的权利要求同样被广泛地解释。
本文中在其许多实施方案中对本发明的描述在本质上仅仅是示例性的,并且因此不偏离本发明的主旨的变型意图在本发明的范围内。这样的变型不应被视为背离本发明的精神和范围。
Claims (10)
1.一种器件,包括:
硬屏蔽材料;
包括铝或铜的层;和
具有第一厚度的硅层。
2.如权利要求1所述的器件,还包括具有第二厚度的硅层。
3.如权利要求1所述的器件,其中所述硬屏蔽材料是金属。
4.如权利要求1所述的器件,其中所述硬屏蔽材料是周期表的第1族至第13族的元素。
5.如权利要求1所述的器件,其中所述硬屏蔽材料是钢或铝。
6.如权利要求1所述的器件,其中所述硬屏蔽材料具有在从约1mm至约5mm的范围内的厚度。
7.如权利要求1所述的器件,其中包括铝或铜的所述层是粗糙的。
8.如权利要求1所述的器件,其中包括铝或铜的所述层能够具有约0.001mm至约5mm的厚度。
9.如权利要求1所述的器件,其中所述硅层以约0.05mm至约2mm的第一厚度存在。
10.如权利要求2所述的器件,其中所述硅层以约10nm至约100nm的第二厚度存在。
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