CN109990908A - Infrared focal plane device blind pixel detection method - Google Patents
Infrared focal plane device blind pixel detection method Download PDFInfo
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- CN109990908A CN109990908A CN201811351297.0A CN201811351297A CN109990908A CN 109990908 A CN109990908 A CN 109990908A CN 201811351297 A CN201811351297 A CN 201811351297A CN 109990908 A CN109990908 A CN 109990908A
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- 238000001514 detection method Methods 0.000 title claims abstract description 23
- 230000004044 response Effects 0.000 claims abstract description 47
- 230000005457 Black-body radiation Effects 0.000 claims abstract description 32
- 239000011159 matrix material Substances 0.000 claims description 6
- 230000009286 beneficial effect Effects 0.000 abstract description 2
- 238000000034 method Methods 0.000 description 22
- 239000000523 sample Substances 0.000 description 4
- 238000003491 array Methods 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 238000011897 real-time detection Methods 0.000 description 2
- 238000012935 Averaging Methods 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 239000000571 coke Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000013213 extrapolation Methods 0.000 description 1
- 238000003331 infrared imaging Methods 0.000 description 1
- 230000004043 responsiveness Effects 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
- G01J2005/106—Arrays
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Abstract
The invention discloses infrared focal plane device blind pixel detection methods, it the following steps are included: (1), respectively with height two temperature uniform black body radiation infrared detector, and the response of each pixel of detector is recorded respectively, the response that high temperature blackbody radiates is denoted as, the response of low temperature black body radiation is denoted as；(2), the difference of all pixel high temperature blackbodies Yu low temperature black body radiation response is calculated；(3), the mean value of all effective pixel high temperature blackbodies and low temperature black body radiation response difference except blind element is calculated；(4), threshold value is setWith
Description
Technical field
The present invention relates to a kind of blind pixel detection method more particularly to infrared focal plane device blind pixel detection methods.
Background technique
Blind element is also referred to as invalid pixel, the definition for invalid pixel, mainly from device itself to black matrix spoke in national standard
For the responsiveness penetrated as quantizating index, invalid pixel (Non-effective pixel) includes dead pixel and hot pixel excessively;
Dead pixel (Dead pixel): pixel response rate is less than 1/10 pixel of average response rate;Cross hot pixel (Overhot
Pixel): pixel noise voltage is greater than 10 times of pixel of average noise voltage.Currently, being proposed both at home and abroad to the detection of blind element
A variety of algorithms, including method is defined, the response differential technique of double reference sources,Method, pre-determined threshold method etc..Definition method is according to state
Family's standard, using the 1/10 of the average response rate of all pixels of frame image and 10 times of average noise voltage as threshold value, by picture
First response rate is less than the pixel of the average noise voltage of 1/10 or noise voltage greater than 10 times of average response rate as pixel.Work
In journey practice, it usually is used as threshold value by 1/10 and 10 times of the average gray value of full frame image, pixel gray value is lower than 1/10
Or blind element is labeled as higher than the pixel of 10 times of average gray values.The response differential technique of double reference sources is using detector to height two
The uniform black matrix of a different temperatures is detected, and obtains asking its difference (high after detector responds high/low temperature two uniform black matrixes
Warm response subtracts low temperature response) and difference average value.It, will be poor using 1/10 and 10 times of the difference average value as threshold value
It is worth the pixel less than 1/10 or greater than 10 times of difference average value and is labeled as blind element；Method is utilized under uniform black body radiation,
The response of infrared focal plane array and the theoretical model of noise Normal Distribution:Its
In, x is under the conditions of the uniform black matrix of fixed temperature, and the gray value that detector responds, μ is entire focal plane arrays (FPA) gray value
Mean value,For the mean square deviation of the average noise voltage of the focal plane arrays (FPA).WithAs threshold value, gray value is existedExcept pixel be labeled as blind element.Black body radiation region is divided into two parts up and down, pre-determined threshold by pre-determined threshold method
Value, the pixel in top half is then traversed, the gray value of each pixel and 5 pixels behind and below it is done respectively
Difference, if difference is greater than threshold value, then marking the pixel is blind element.Similarly, similar place is carried out to the pixel of lower half portion
Reason.Definition method needs to calculate average pixel response rate and average noise voltage.
Chinese invention patent publication number CN102214354A discloses a kind of invalid pixel real-time detection side of infrared image
Method is utilized first in system boot scene and is based onBad first detection method, detect dead pixel and cross hot pixel and portion
Divide the pixel of flashing, generates initial invalid pixel table, and in subsequent target following and discovery procedure, it is outer with two dimension is based on
The method pushed away constantly detects invalid pixel and updates invalid pixel table, achievees the purpose that invalid pixel detection in real time.Method needs
The mean square deviation of image averaging noise voltage is calculated, then realizes that blind element detects by way of iteration, it is inconvenient, and calculate
Amount is big, and the performance of pre-determined threshold method is related with preset threshold value, and threshold value be easy to cause greatly very much and fails to judge, and threshold value is too small,
It then be easy to cause and sentenced, to be unfavorable for the detection of blind element, wherein being to be based on to crossing hot pixel and the judgement of pixel being subcooled
Method, the initial first frame image of system is carried out based on regional area firstInvalid pixel detection, then with based on two dimension
The blind pixel detection method of extrapolation is measured in real time processing to infrared image, and by processing result real-time update blind element table, the party
Although method can distinguish the dead pixel in blind element and cross hot pixel, inconvenient, computationally intensive, real-time detection is to be based onWhat the result of invalid pixel detection carried out, therefore haveThe disadvantages mentioned above of method.
The response differential technique of double reference sources needs predetermined threshold value, ifThen recognize more than or equal to threshold value
It is normal pixel for the pixel, such as (photonics journal, in May, 2004, the 5th phase of volume 33) discloses an entitled " infrared coke
The detection of planar device blind element and backoff algorithm " article, refer to the blind element of two o'clock reference source a kind of in text and detect automatically
Technology, principle are the black-body reference uniform irradiation IRFPA using two with different temperatures, obtain two groups of different responses
Data calculate according to this two groups of data and judge the blind element position in IRFPA.Specific operation process is as follows: with a low temperature
Homogeneous radiation sourceEach probe unit of IRFPA is irradiated, the response of each probe unit is recorded,, and store；
2) again with the homogeneous radiation source of a high temperatureEach probe unit of IRFPA is irradiated, the response of each probe unit is recorded, and store；3) by the difference of this two groups of dataCompared with preset
Threshold valueIt makes comparisons, if, then it is assumed that the picture (i, j) member is normal pixel；If, then should
It is blind element that (i, j) pixel is somebody's turn to do in judgement.It is selected very crucial to the detection of entire blind element, it is general using warp in practical applications
Test value setting.And the dead pixel in blind element cannot be distinguished in this method and crosses hot pixel.
Summary of the invention
The technical problem to be solved by the present invention is to existing blind pixel detection method, there are many defects, and blind element cannot be distinguished
In dead pixel and cross hot pixel, a kind of infrared focal plane device blind pixel detection method is provided thus.
The technical scheme is that infrared focal plane device blind pixel detection method, it is the following steps are included: (1), difference
With height two temperature uniform black body radiation infrared detector, and respectively record each pixel of detector response, will be high
The response of warm black body radiation is denoted as, the response of low temperature black body radiation is denoted as, wherein i=1-M, j=
The line number and columns of 1-N, M and N and respectively infrared focal plane array;
(2), the difference of all pixel high temperature blackbodies Yu low temperature black body radiation response is calculated
；
(3), the mean value of all effective pixel high temperature blackbodies and low temperature black body radiation response difference except blind element is calculated, wherein d and h is respectively dead pixel and hot pixel number excessively；
(4), threshold value is setWith, wherein the value of α is 0.2-0.9, and the value of β is 1-2, by the height of each pixel
Warm black matrix is compared with the difference of low temperature black body radiation response and the threshold value of setting, if, then
It is determined as dead pixel, if, then it was determined as hot pixel, in being then determined as normal picture between the two
Member, judgement while, count the number of blind element；
(5), repeat the above steps (3), (4), until the adjacent blind element number detected twice is equal.
The improvement of above scheme is the step (1)WithMultiframe black body radiation is acquired to ring
It answers, averages, the black body radiation response of single is replaced with mean value.
The beneficial effects of the invention are as follows easy to operate, and calculation amount is small, has used finer criterion that can distinguish extremely
Pixel and excessively hot pixel；The response of multiframe black body radiation is acquired, is averaged, the black body radiation response of single is replaced with mean value.
Specific embodiment
Below with reference to embodiment, technical scheme in the embodiment of the invention is clearly and completely described.Obviously, institute
The embodiment of description is only a part of the embodiment of the present invention, instead of all the embodiments.Based on the embodiments of the present invention,
Those of ordinary skill in the art's every other embodiment without making creative work, belongs to protection of the invention
Range.
Embodiment 1: infrared focal plane device blind pixel detection method, it is characterized in that it the following steps are included: (1), use respectively
The just uniform black body radiation infrared detector of two temperature, and the response of each pixel of detector is recorded respectively, by high temperature
The response of black body radiation is denoted as, the response of low temperature black body radiation is denoted as, wherein i=1-M, j=
The line number and columns of 1-N, M and N and respectively infrared focal plane array;
(2), the difference of all pixel high temperature blackbodies Yu low temperature black body radiation response is calculated
；
(3), the mean value of all effective pixel high temperature blackbodies and low temperature black body radiation response difference except blind element is calculated, wherein d and h is respectively dead pixel and hot pixel number excessively；
(4), threshold value is setWith, the value that wherein value of α is 0.4, β is 1.4, and the high temperature of each pixel is black
Body is compared with the difference of low temperature black body radiation response and the threshold value of setting, if, then determine
For dead pixel, if, then it was determined as hot pixel, in normal pixel is then determined as between the two, sentenced
The number of blind element is counted while determining；
(5), repeat the above steps (3), (4), until the adjacent blind element number detected twice is equal.
Embodiment 2: the difference from embodiment 1 is that the value that the value of α is 0.2, β in step (4) is 1.
Embodiment 3: the difference from embodiment 1 is that the value that the value of α is 0.6, β in step (4) is 1.5.
Embodiment 4: the difference from embodiment 1 is that the value that the value of α is 0.9, β in step (4) is 2.
Embodiment 5: the difference from embodiment 1 is that step (1)WithAcquire multiframe
Black body radiation response, averages, and the black body radiation response of single is replaced with mean value.
The value of α and β in above-described embodiment obtain based on experience value, particular by the orthogonal of alpha-beta
What table was tested.Step (5) algorithmic statement when the adjacent blind element number detected twice is equal.
Novelty of the invention proposes a kind of infrared imaging blind element compensation method based on median filter theory, avoids
Conventional method needs to calculate average pixel response rate and averagely noise voltage etc. is inconvenient and computationally intensive, be easy to cause
The disadvantages of failing to judge finer can distinguish dead pixel and cross hot pixel, Detection accuracy and detection effect generally can be improved
Rate.
Claims (2)
1. infrared focal plane device blind pixel detection method, it is characterized in that it the following steps are included: (1), respectively with two temperature of height
The uniform black body radiation infrared detector of degree, and the response of each pixel of detector is recorded respectively, by high temperature blackbody radiation
Response is denoted as, the response of low temperature black body radiation is denoted as, wherein i=1-M, j=1-N, M and N and point
Not Wei infrared focal plane array line number and columns;
(2), the difference of all pixel high temperature blackbodies Yu low temperature black body radiation response is calculated
；
(3), the mean value of all effective pixel high temperature blackbodies and low temperature black body radiation response difference except blind element is calculated, wherein d and h is respectively dead pixel and hot pixel number excessively；
(4), threshold value is setWith, wherein the value of α is 0.2-0.9, and the value of β is 1-2, by the height of each pixel
Warm black matrix is compared with the difference of low temperature black body radiation response and the threshold value of setting, if, then sentence
It is set to dead pixel, if, then it was determined as hot pixel, in being then determined as normal pixel between the two,
The number of blind element is counted while judgement；
(5), repeat the above steps (3), (4), until the adjacent blind element number detected twice is equal.
2. infrared focal plane device blind pixel detection method as described in claim 1, it is characterized in that the step (1)WithThe response of multiframe black body radiation is acquired, is averaged, the black matrix spoke of single is replaced with mean value
Penetrate response.
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110686783A (en) * | 2019-09-12 | 2020-01-14 | 山东大学 | Blind pixel detection method and image processing method for InGaAs short-wave infrared imager |
| CN111579081A (en) * | 2020-04-30 | 2020-08-25 | 烟台艾睿光电科技有限公司 | Infrared temperature measurement method, device and equipment |
| CN111986171A (en) * | 2020-08-14 | 2020-11-24 | 西安应用光学研究所 | Abnormal element detection method for infrared linear array detector |
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| CN102214354A (en) * | 2011-04-29 | 2011-10-12 | 中国航空工业集团公司洛阳电光设备研究所 | Method for detecting invalid pixels of infrared image in real time |
| CN104330164A (en) * | 2014-08-05 | 2015-02-04 | 凯迈（洛阳）测控有限公司 | Infrared focal plane array blind pixel detection method and device |
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110686783A (en) * | 2019-09-12 | 2020-01-14 | 山东大学 | Blind pixel detection method and image processing method for InGaAs short-wave infrared imager |
| CN110686783B (en) * | 2019-09-12 | 2020-11-20 | 山东大学 | Blind pixel detection method and image processing method for InGaAs short-wave infrared imager |
| CN111579081A (en) * | 2020-04-30 | 2020-08-25 | 烟台艾睿光电科技有限公司 | Infrared temperature measurement method, device and equipment |
| CN111579081B (en) * | 2020-04-30 | 2021-12-21 | 烟台艾睿光电科技有限公司 | Infrared temperature measurement method, device and equipment |
| CN111986171A (en) * | 2020-08-14 | 2020-11-24 | 西安应用光学研究所 | Abnormal element detection method for infrared linear array detector |
| CN111986171B (en) * | 2020-08-14 | 2024-02-27 | 西安应用光学研究所 | Abnormal element detection method for infrared array detector |
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