CN109974601B - 印制板层间介质厚度检测结构及其检测方法 - Google Patents
印制板层间介质厚度检测结构及其检测方法 Download PDFInfo
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- CN109974601B CN109974601B CN201910257941.6A CN201910257941A CN109974601B CN 109974601 B CN109974601 B CN 109974601B CN 201910257941 A CN201910257941 A CN 201910257941A CN 109974601 B CN109974601 B CN 109974601B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
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- Investigating Or Analysing Materials By Optical Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
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CN109974601B true CN109974601B (zh) | 2020-11-27 |
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Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002005631A (ja) * | 2000-06-16 | 2002-01-09 | Sumitomo Metal Ind Ltd | 板体特性測定方法、及び板体特性測定装置 |
CN102998285A (zh) * | 2012-12-17 | 2013-03-27 | 吉林大学 | 折射率测量装置及其使用方法 |
CN202956093U (zh) * | 2012-11-22 | 2013-05-29 | 上海嘉视光学科技有限公司 | 一种简易的镜片厚度光学检测装置 |
CN104048612A (zh) * | 2014-06-24 | 2014-09-17 | 江苏大学 | 一种用于同时多点镜片镀膜厚度检测的方法和装置 |
US8902436B1 (en) * | 2011-06-27 | 2014-12-02 | The United States Of America As Represented By The Secretary Of The Navy | Chiral slab thickness measurement using weak value amplification |
CN105181646A (zh) * | 2015-05-13 | 2015-12-23 | 武汉理工大学 | 基于计算机视觉的透明介质折射率测量方法 |
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- 2019-04-01 CN CN201910257941.6A patent/CN109974601B/zh active Active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002005631A (ja) * | 2000-06-16 | 2002-01-09 | Sumitomo Metal Ind Ltd | 板体特性測定方法、及び板体特性測定装置 |
US8902436B1 (en) * | 2011-06-27 | 2014-12-02 | The United States Of America As Represented By The Secretary Of The Navy | Chiral slab thickness measurement using weak value amplification |
CN202956093U (zh) * | 2012-11-22 | 2013-05-29 | 上海嘉视光学科技有限公司 | 一种简易的镜片厚度光学检测装置 |
CN102998285A (zh) * | 2012-12-17 | 2013-03-27 | 吉林大学 | 折射率测量装置及其使用方法 |
CN104048612A (zh) * | 2014-06-24 | 2014-09-17 | 江苏大学 | 一种用于同时多点镜片镀膜厚度检测的方法和装置 |
CN105181646A (zh) * | 2015-05-13 | 2015-12-23 | 武汉理工大学 | 基于计算机视觉的透明介质折射率测量方法 |
Non-Patent Citations (1)
Title |
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平面界面折射成像位置的研究;郎军等;《物理教师》;20170228;全文 * |
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Address after: Beidou Industrial Park, Jinfeng Industrial Zone, Zhangzhou City, Fujian Province, China Patentee after: ZHANGZHOU KEHUA TECHNOLOGY LIMITED BY SHARE Ltd. Patentee after: Kehua Data Co.,Ltd. Address before: Beidou Industrial Park, Jinfeng Industrial Zone, Zhangzhou City, Fujian Province, China Patentee before: ZHANGZHOU KEHUA TECHNOLOGY LIMITED BY SHARE Ltd. Patentee before: XIAMEN KEHUAHENGSHENG LIMITED BY SHARE Ltd. |
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Effective date of registration: 20210816 Address after: 363000 No. 11, Jinxing Road, Xiangcheng District, Zhangzhou City, Fujian Province Patentee after: Zhangzhou Kehua Electric Technology Co.,Ltd. Patentee after: Kehua Data Co.,Ltd. Address before: Beidou Industrial Park, Jinfeng Industrial Zone, Zhangzhou City, Fujian Province, China Patentee before: ZHANGZHOU KEHUA TECHNOLOGY LIMITED BY SHARE Ltd. Patentee before: Kehua Data Co.,Ltd. |
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Effective date of registration: 20220413 Address after: 363000 No. 11, Jinxing Road, Xiangcheng District, Zhangzhou City, Fujian Province Patentee after: Zhangzhou Kehua Electric Technology Co.,Ltd. Address before: 363000 No. 11, Jinxing Road, Xiangcheng District, Zhangzhou City, Fujian Province Patentee before: Zhangzhou Kehua Electric Technology Co.,Ltd. Patentee before: Kehua Data Co., Ltd |