CN109962401A - Single longitudinal mode dye laser frequency-sweeping apparatus and control method - Google Patents
Single longitudinal mode dye laser frequency-sweeping apparatus and control method Download PDFInfo
- Publication number
- CN109962401A CN109962401A CN201910222265.9A CN201910222265A CN109962401A CN 109962401 A CN109962401 A CN 109962401A CN 201910222265 A CN201910222265 A CN 201910222265A CN 109962401 A CN109962401 A CN 109962401A
- Authority
- CN
- China
- Prior art keywords
- single longitudinal
- longitudinal mode
- bright fringes
- wavemeter
- dye laser
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 title claims abstract description 18
- 238000010408 sweeping Methods 0.000 title claims abstract description 16
- 230000003071 parasitic effect Effects 0.000 claims abstract description 36
- 239000000919 ceramic Substances 0.000 claims abstract description 35
- 230000000694 effects Effects 0.000 claims abstract description 11
- 238000004891 communication Methods 0.000 claims abstract description 6
- 230000003595 spectral effect Effects 0.000 claims description 8
- 239000013307 optical fiber Substances 0.000 claims description 7
- 238000005070 sampling Methods 0.000 claims description 7
- 230000010355 oscillation Effects 0.000 claims description 5
- 238000005259 measurement Methods 0.000 claims description 4
- 230000007246 mechanism Effects 0.000 claims description 4
- 230000003287 optical effect Effects 0.000 claims description 4
- 239000000284 extract Substances 0.000 claims description 3
- 229910052573 porcelain Inorganic materials 0.000 claims description 2
- 238000012544 monitoring process Methods 0.000 abstract description 5
- 238000006243 chemical reaction Methods 0.000 abstract description 2
- 230000008030 elimination Effects 0.000 abstract 1
- 238000003379 elimination reaction Methods 0.000 abstract 1
- 230000001276 controlling effect Effects 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 238000012545 processing Methods 0.000 description 3
- 230000008901 benefit Effects 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 230000024241 parasitism Effects 0.000 description 2
- 241000931526 Acer campestre Species 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000012850 discrimination method Methods 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/0014—Monitoring arrangements not otherwise provided for
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/10—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
- H01S3/105—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating by controlling the mutual position or the reflecting properties of the reflectors of the cavity, e.g. by controlling the cavity length
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/14—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range characterised by the material used as the active medium
- H01S3/20—Liquids
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Optics & Photonics (AREA)
- Lasers (AREA)
Abstract
The invention discloses a kind of single longitudinal mode dye laser frequency-sweeping apparatus and control methods, the single longitudinal mode dye laser frequency-sweeping apparatus, including single longitudinal mode laser oscillator, Fizeau wavemeter, with the controller of the wavemeter communication connection, the single longitudinal mode laser oscillator includes the rotor plate for being driven opposed bottom rotation, the end mirror being fixed on rotor plate, the piezoelectric ceramics for being fixed on bottom plate and controllably being connect with the controller, the Effect of Back-Cavity Mirror being fixedly connected with the moved end of the piezoelectric ceramics, and grating, the present invention is during length scanning, using the interference fringe of Fizeau wavemeter reaction cavity output laser, the small neighbouring parasitic bright fringes of real-time monitoring, and judge like-control-not gate direction, it is stretched by control piezoelectric ceramics again to carry out the long compensation of chamber, elimination is posted Raw mould.
Description
Technical field
The invention belongs to laser control technique fields, and in particular to a kind of single longitudinal mode dye laser frequency-sweeping apparatus and control
Method.
Background technique
Laser has good monochromaticjty and coherence, therefore is widely used in every field.Single longitudinal mode laser
Line width in fields such as spectrum, light-matter interaction, hyperfine structures usually in 100MHz hereinafter, be used widely.?
In, the output wavelength of laser is needed to be scanned in a wide range, while keeping output without mode hopping.
It in fields such as single-longitudinal-mode fiber laser, solid state lasers, generallys use narrow band filter and is tuned, realize and swash
Optical wavelength close limit tuning operation.Littman type laser adjusts output wavelength by adjusting the angle of hysteroscope and grating, real
Existing length scanning, is applied in the tunable laser such as external cavity semiconductor laser, dye laser.This laser is due to adjusting
There are the limitations of sports apparatus and mechanical structure precision during section, will cause chamber length and lack of proper care with running laser mode, thus
Mode hopping is generated, continuous scanning effect is poor.
Summary of the invention
It is an object of the invention to overcome the deficiencies of the prior art and provide a kind of single longitudinal mode dye laser frequency-sweeping apparatus,
Its with wavelength it is a wide range of, without mode hopping, continuous scanning, the length scanning effect to output light can be improved.
It is an object of the invention to further simultaneously disclose a kind of control method, processing speed is effectively increased.
The present invention is achieved by the following technical solutions:
A kind of single longitudinal mode dye laser frequency-sweeping apparatus, including single longitudinal mode laser oscillator, Fizeau wavemeter are and described
Wavemeter communication connection controller,
The single longitudinal mode laser oscillator includes the rotor plate for being driven opposed bottom rotation, is fixed at rotor plate
On end mirror, the piezoelectric ceramics for being fixed on bottom plate and controllably connecting with the controller makes pottery with the piezoelectricity
The Effect of Back-Cavity Mirror and grating that the moved end of porcelain is fixedly connected, oscillation light is output light in the zero-order diffraction light of grating, described
Fizeau wavemeter is to measure the output light wavelength and form interference fringe.
In the above-mentioned technical solutions, the rotation axis of the rotor plate is located at the reflecting surface of end mirror and the grating face of grating
Extension line focus.
In the above-mentioned technical solutions, the driving mechanism of the rotor plate includes rotating with the controller through end mirror
The driving motor of driver connection, by the sliding block of the described driving motor driving straight reciprocating motion, and with the sliding block
The catch bar being rotatably connected, the catch bar are rotatably connected with the rotor plate.
In the above-mentioned technical solutions, the chamber of the Littman type resonant cavity of the Effect of Back-Cavity Mirror, end mirror and optical grating constitution is long
For 10cm.
In the above-mentioned technical solutions, the Free Spectral Range of the Fizeau wavemeter is not exactly equal to resonator mode
Twice of interval.
In the above-mentioned technical solutions, the mode spacing of the resonant cavity is about 1.5GHz, interferometer used in Fizeau wavemeter
Free Spectral Range is 3.75GHz.
The output light side is provided with sampling optical fiber, and the sampling optical fiber conducts output light to Fizeau wavelength
Meter.
In the above-mentioned technical solutions, the piezoelectric ceramics be ring-shaped piezo ceramic, the ring-shaped piezo ceramic by with
The piezoelectric ceramic actuator driving of the controller communication connection.
In the above-mentioned technical solutions, the rotor plate is set square.
A kind of length scanning control method of the single longitudinal mode dye laser, includes the following steps,
1) end mirror is rotated, carries out length scanning by the step-length of setting,
2) interference fringe of Fizeau wavemeter real-time measurement is read,
3) polynomial curve fitting is carried out to interference fringe,
4) scheduled amplitude threshold is pressed, it is adjacent on the right of it that peak-peak position is searched in interference fringe matched curve
Another peak position is as the two neighboring main bright fringes of the interference fringe；
5) local data's section between adjacent two main bright fringes is extracted；
6) to the fitting of local data segment；
7) parasitic bright fringes is such as not detected in differential host bright fringes, then jumps to (1) and start next step wavelength regulation,
Otherwise it carries out in next step,
8) left side or the right side of main bright fringes are proximate to according to the parasitic bright fringes position to judge resonance cavity mistuning
Direction；
9) the flexible compensation to carry out chamber length that control piezoelectric ceramics is passed through according to imbalance direction；
10) 2) -9 are repeated) step, until parasitic bright fringes is not detected in the 7) step；
11) 1) -10 are repeated) step, until completing length scanning task.
In the above-mentioned technical solutions, the method for local data's section is extracted in the step 5) are as follows: from the peak-peak
Position deviates to the right certain data cell and starts, and is deviated between certain data cell to the left to another described peak position
Data, with ensure extract data segment between two main bright fringes.
The advantages and benefits of the present invention are:
Single longitudinal mode Wavelength scanning method of the invention is to export laser during wavelength regulation according to the laser and exist
The interference fringe formed in Fizeau wavemeter carries out small parasitic bright fringes real-time monitoring, when detecting small parasitic mould,
By controlling the compensation of the flexible carry out chamber length of piezoelectric ceramics, so that parasitic mode is disappeared, avoid the appearance of mode hopping.Realize single longitudinal mode
Laser is a wide range of, wavelength and without mode hopping scans.
Detailed description of the invention
Fig. 1 is single longitudinal mode dye laser length scanning system block diagram.
Fig. 2 is single longitudinal mode dye laser oscillator schematic diagram
Fig. 3 is that single longitudinal mode dye laser length scanning controls software flow pattern
Fig. 4 is single longitudinal mode dye laser interference fringes processing process schematic
Fig. 5 is the dye laser interference fringe schematic diagram with parasitic mode
In figure:
1 single longitudinal mode laser oscillator
2 Fizeau wavemeters
3 end mirror rotating drivers
4 piezoelectric ceramic actuators
5 controllers
6 control softwares
7 sampling optical fiber
8 end mirror rotation of drive rod
9 high-voltage output lines
10,11,12 connection
13 piezoelectric ceramics
14 Effect of Back-Cavity Mirror
15 end mirrors
16 gratings
17 oscillation lights
18 output lights
19 rotation axis
20,21 interference fringe
22,23 main bright fringes
24 neighbouring parasitic bright fringes
Neighbouring parasitic bright fringes after 25 fitting of a polynomials
26 interference fringe matched curves
27, the primary and secondary peak position in 28 interference fringe matched curves
Local data's section between 29 main bright fringes
30, local data's section matched curve between 31 main bright fringes
It for those of ordinary skill in the art, without creative efforts, can be according to above attached
Figure obtains other relevant drawings.
Specific embodiment
In order to enable those skilled in the art to better understand the solution of the present invention, combined with specific embodiments below furtherly
Bright technical solution of the present invention.
Embodiment one
A kind of single longitudinal mode dye laser frequency-sweeping apparatus of the invention, including single longitudinal mode laser oscillator 1, Fizeau wavelength
Meter 2, the controller 5 with the wavemeter communication connection,
The single longitudinal mode laser oscillator includes the rotor plate for being driven opposed bottom rotation, is fixed at rotor plate
On end mirror 15, the piezoelectric ceramics 13 for being fixed on bottom plate and controllably being connect with the controller, with the pressure
The Effect of Back-Cavity Mirror 14 and grating 16 that the moved end of electroceramics is fixedly connected, oscillation light are output light, institute in the zero-order diffraction light of grating
The Fizeau wavemeter stated is to measure the output light wavelength and form interference fringe.Endovenous laser beam low-angle
On glancing incidence to grating, the chromatic dispersion effects of grating, Linewidth are improved, while realizing the output of laser.
Wherein, the controller is the terminal with calculating or logic processing capability, is such as mounted with predetermined software programs
Control computer etc., controller 5 connect by connection 10 with Fizeau wavemeter 2, control software installation in controlling computer,
Software is controlled by sending instruction, reads optical maser wavelength and interference fringe from Fizeau wavemeter；Pass through connection 11 and end face
Mirror rotating driver 3 is connected, and end mirror rotating driver is using conventional sinusoidal regulating mechanism and corresponding servo-system, end face
Mirror rotating driver pushes end mirror to rotate around the axis corresponding angle according to the rotation order that control software is sent, and realizes wavelength
Adjusting；It is connect by connection 12 with piezoelectric ceramic actuator, piezoelectric ceramic actuator 4 is connected to by high-voltage output line 9
Two electrodes of the piezoelectric ceramics 13 in oscillator, control software send voltage output order, piezoelectricity to piezoelectric ceramic actuator
Ceramic driver exports corresponding voltage by order, controls the flexible of piezoelectric ceramics.
Single longitudinal mode Wavelength scanning method of the invention is to export laser during wavelength regulation according to the laser and exist
The interference fringe formed in Fizeau wavemeter carries out small parasitic bright fringes real-time monitoring, when detecting small parasitic mould,
By controlling the compensation of the flexible carry out chamber length of piezoelectric ceramics, so that parasitic mode is disappeared, avoid the appearance of mode hopping.Realize single longitudinal mode
Laser is a wide range of, wavelength and without mode hopping scans.
Specifically, the rotation axis of the rotor plate is located at the reflecting surface of end mirror and the extended line in the grating face of grating is burnt
Point, the driving mechanism of the rotor plate include the driving motor connecting with the controller through end mirror rotating driver,
By the sliding block of the driving motor driving straight reciprocating motion, and the catch bar being rotatably connected with the sliding block, institute
The catch bar stated is rotatably connected with the rotor plate.
Embodiment two
Wherein, Effect of Back-Cavity Mirror 14, end mirror 15, grating 16 constitute Littman type resonant cavity, and chamber length is designed as 10cm, vibrates
Light 17 vibrates in resonant cavity, and zero-order diffraction light of the oscillation light 17 on grating 16 is output light 18, and output light 18 is by part coupling
It closes in sampling optical fiber 7, is transferred to Fizeau wavemeter 2, carry out laser wavelength measurement, and export the interference fringe between bright dark phase
20 or interference fringe 21, as shown in Figure 4 and Figure 5.As shown in figure 5, neighbouring parasitic mode can be generated in resonant cavity when like-control-not gate,
Neighbouring parasitic bright fringes 24 can be generated between main bright fringes 22 and 23 in corresponding interference fringe 21.According to designed 10cm resonance
Chamber is long, and it is about 1.5GHz that resonant cavity, which exports laser mode spacing, therefore the parasitic bright fringes 24 that neighbouring parasitic mode is formed will be close
Main bright fringes 22 or 23.
Effect of Back-Cavity Mirror 14 is fixed on 13 one end of piezoelectric ceramics, and 13 other end of piezoelectric ceramics is fixed on bottom plate, and piezoelectric ceramics drives
The output voltage of dynamic device 4 is connected on the electrode of piezoelectric ceramics by high-voltage output line 9, drives the elongation or contracting of piezoelectric ceramics 13
It is short, it drives end mirror 14 to be moved forward and backward, realizes the long control of chamber.Piezoelectric ceramic actuator uses the driver of market purchasing, such as
Core E00/E01 tomorrow Series Piezoelectric driver.The rotation axis 19 of end mirror 15 is that the reflecting surface of end mirror 15 and grating face extend
The intersection point of line.End mirror rotating driver 3 pushes end mirror 15 to rotate around rotation axis 19 by catch bar 8, by adjusting end face
The adjusting of the angle of mirror and grating realization resonant cavity output wavelength.
Fizeau wavemeter exports laser to single longitudinal mode laser oscillator by sampling optical fiber and measures, and obtains laser wave
It is long, and form the interference fringe of laser.The Fizeau laser wavelength meter is using high-precision, the wavelength of wide Free Spectral Range
Meter, and Free Spectral Range is not twice of exactly equal to resonator mode interval.Therefore the neighbouring parasitic bright fringes of resonant cavity must
So close to the left or right side of main bright fringes, the method in resonance cavity mistuning direction is judged are as follows: according to the neighbouring parasitic bright of resonant cavity
Striped judges resonance cavity mistuning direction close to the left or right side of main bright fringes.The long mistake of chamber is reflected in left or right side
Direction is adjusted, is that chamber length is too short in left side, is then that chamber length is too long on right side.
Such as: the Resonant Intake System of single longitudinal mode laser is 10cm, and the mode spacing of the resonant cavity is about 1.5GHz, be can be used such as Russia
Ross produces the measurement that LM007 wavemeter carries out wavelength and interference fringe, and relative accuracy 10-7, Free Spectral Range are
3.75GHz.Wavemeter acquires the interference fringe between bright dark phase using linear CCD, and is output to computer by USB line, interferes item
Line abscissa is CCD pixel, and ordinate is light signal strength.Fizeau wavemeter output interference fringe main bright fringes spacing be
For wavemeter Free Spectral Range, the interference fringe formed using LM007 wavemeter, the parasitic bright fringes that closes on of resonant cavity is in
Main bright fringes left or right side, at the position of 0.4 times of main bright fringes spacing, as shown in Figure 5.
Embodiment three
The length scanning algorithm flow for controlling software includes rotating end mirror, acquisition interference fringe, polynomial curve fitting,
It determines adjacent main bright fringes position, extracts local data's section between adjacent main bright fringes, local data's section curve matching judges parasitism
Striped judges direction of lacking of proper care, the long compensation of chamber.
When occurring parasitic mode of laser in resonant cavity, it is bright between two main bright fringes of interference fringe to generate a parasitism
Striped.Single longitudinal mode Wavelength scanning method of the present invention is during wavelength regulation according to interference fringe, real-time monitoring small parasitic
Bright fringes, wherein to the discrimination method of parasitic mode are as follows: since the interference fringe of Fizeau wavemeter output is that high contrast is bright dark
Alternate striped generally comprises three or more sharp main bright fringes, and has imbalance, the parasitic bright fringes of generation when resonant cavity is micro-
Relative amplitude very little, while original interference striped curve is due to the presence of noise, is not a smooth curve.In order at this
Small parasitic bright fringes is identified on the relative complex interference fringe curve of sample, the present invention is first to whole interference fringe curve
Fitting of a polynomial is carried out, a smooth matched curve is obtained, two peak positions are searched in this smooth matched curve,
As the rough position of main bright fringes two neighboring in interference fringe, then on former interference fringe curve to extract two neighboring master bright
Interfringe local data's section.This local data section curve is relatively simple basin type curve, is easier to the curve
Carry out accurate fitting of a polynomial, it is ensured that remain with small parasitic bright fringes information.At smooth local fit Curvilinear Search peak
Value is more than the peak value of preset threshold if there is an amplitude, judges the peak value for parasitic bright fringes.The pre-set peak value can adopt
It is set with specific setting value or according to the predetermined ratio of the amplitude of two peak values.
Specifically control method is
(1) end mirror is rotated, the step-length of length scanning is converted to the rotational angle of end mirror 15 by control software 6, concurrently
Order lose one's life to end mirror rotating driver 3, end mirror rotating driver 3 is rotated accordingly by 8 Driving plane mirror 15 of catch bar
Angle, laser output wavelength will change.
(2) interference fringe is acquired, as shown in Figures 4 and 5, the interference fringe 20 that control software 6 is read from Fizeau wavemeter 2
Or 21.
(3) polynomial curve fitting, such as Fig. 4 carry out a polynomial curve fitting to interference fringe 20, obtain interference item
Line matched curve 26.
(4) adjacent two main bright fringes position is determined, by scheduled amplitude threshold, in smooth interference fringe matched curve 26
Upper search peak-peak, another peak value position of the peak-peak position as peak position 27, on the right of peak-peak position
It sets as secondary peak position 28, primary and secondary peak position 27,28 is respectively the rough of the main bright fringes 22 and 23 on interference fringe curve 20
Position.
(5) local data's section between two neighboring main bright fringes, the data segment of extraction are extracted are as follows: in interference fringe 20,
Increasing certain data cell from peak position 27, such as 10 pixels start, reduce certain data cell to secondary peak position 28,
Such as the data segment between 10 pixels, local data's section 29 is obtained.
(6) local data section fitting, due to local data section 29 be the better simply basin type curve of shape, can carry out compared with
Precision curves fitting.Local data's section 29 is subjected to fitting of a polynomial, obtains smooth local fit curve 30.Shown in Fig. 5, office
Portion's data matched curve 31 contains neighbouring parasitic bright fringes 25.
(7) differential host bright fringes, according to scheduled amplitude threshold, the search peak on local fit curve 30 or 31.
Predetermined amplitude threshold value is 5, and parasitic bright fringes 25 is detected on local fit curve 31.
(8) judge imbalance direction, neighbouring parasitic bright fringes 25 is close to the left side of main bright fringes, chamber in local fit curve 31
Length is partially short.
(9) the long compensation of chamber, control software 6 control piezoelectric ceramic actuator 4 and change corresponding output voltage, control piezoelectric ceramics
13 shorten, and carry out the long adjusting of chamber
(10) step (2) to (9) are repeated, until parasitic bright fringes is not detected in step (7).
(11) the length scanning adjusting that step (1) to (10) continue next step is repeated.
The present invention exports the interference fringe of laser using Fizeau wavemeter reaction cavity during length scanning,
The small neighbouring parasitic bright fringes of real-time monitoring, and judge like-control-not gate direction, then stretch to carry out chamber by control piezoelectric ceramics
Parasitic mode is eliminated in long compensation.
The spatially relative terms such as "upper", "lower", "left", "right" have been used in embodiment for ease of explanation, have been used for
Relationship of the elements or features relative to another elements or features shown in explanatory diagram.It should be understood that in addition to figure
Shown in except orientation, spatial terminology is intended to include the different direction of device in use or operation.For example, if in figure
Device be squeezed, the element for being stated as being located at other elements or feature "lower" will be located into other elements or feature "upper".
Therefore, exemplary term "lower" may include both upper and lower orientation.Device, which can be positioned in other ways, (to be rotated by 90 ° or position
In other orientation), it can be interpreted accordingly used herein of the opposite explanation in space.
Moreover, the relational terms of such as " first " and " second " or the like are used merely to one with another with identical
The component of title distinguishes, without necessarily requiring or implying between these components there are any this actual relationship or
Sequentially.
Illustrative description has been done to the present invention above, it should explanation, the case where not departing from core of the invention
Under, any simple deformation, modification or other skilled in the art can not spend the equivalent replacement of creative work equal
Fall into protection scope of the present invention.
Claims (10)
1. a kind of single longitudinal mode dye laser frequency-sweeping apparatus, it is characterised in that: including single longitudinal mode laser oscillator, Fizeau wavelength
Meter, the controller with the wavemeter communication connection,
The single longitudinal mode laser oscillator includes the rotor plate for being driven opposed bottom rotation, is fixed on rotor plate
End mirror, the piezoelectric ceramics for being fixed on bottom plate and controllably being connect with the controller, with the piezoelectric ceramics
The Effect of Back-Cavity Mirror and grating that moved end is fixedly connected, oscillation light are output light, the Fizeau wave in the zero-order diffraction light of grating
Long meter is to measure the output light wavelength and form interference fringe.
2. a kind of single longitudinal mode dye laser frequency-sweeping apparatus according to claim 1, it is characterised in that: the rotor plate
Rotation axis be located at the extension line focus of the reflecting surface of end mirror and the grating face of grating.
3. a kind of single longitudinal mode dye laser frequency-sweeping apparatus according to claim 1, it is characterised in that: the rotor plate
Driving mechanism include the driving motor being connect with the controller through end mirror rotating driver, by the driving motor
Drive the sliding block of straight reciprocating motion, and the catch bar being rotatably connected with the sliding block, the catch bar with it is described
Rotor plate be rotatably connected.
4. a kind of single longitudinal mode dye laser frequency-sweeping apparatus according to claim 1, it is characterised in that: the back cavity
The a length of 10cm of chamber of the Littman type resonant cavity of mirror, end mirror and optical grating constitution.
5. a kind of single longitudinal mode dye laser frequency-sweeping apparatus according to claim 1, it is characterised in that: the Fizeau
The Free Spectral Range of wavemeter is not twice of exactly equal to resonator mode interval.
6. a kind of single longitudinal mode dye laser frequency-sweeping apparatus according to claim 1, it is characterised in that: the mould of the resonant cavity
Between be divided into 1.5GHz, the Free Spectral Range of interferometer used in Fizeau wavemeter is 3.75GHz.
7. a kind of single longitudinal mode dye laser frequency-sweeping apparatus according to claim 1, it is characterised in that: the output light
Side is provided with sampling optical fiber, and the sampling optical fiber conducts output light to Fizeau wavemeter.
8. a kind of single longitudinal mode dye laser frequency-sweeping apparatus according to claim 1, it is characterised in that: the piezoelectricity pottery
Porcelain is ring-shaped piezo ceramic, and the ring-shaped piezo ceramic is driven by the piezoelectric ceramic actuator connecting with the controller communication
It is dynamic.
9. a kind of length scanning control method of such as described in any item single longitudinal mode dye lasers of claim 1-8, feature
It is, includes the following steps,
1) end mirror is rotated, carries out length scanning by the step-length of setting,
2) interference fringe of Fizeau wavemeter real-time measurement is read,
3) polynomial curve fitting is carried out to interference fringe,
4) press scheduled amplitude threshold, searched in interference fringe matched curve peak-peak position and its on the right of it is adjacent another
Peak position is as the two neighboring main bright fringes of the interference fringe；
5) local data's section between adjacent two main bright fringes is extracted；
6) to the fitting of local data segment；
7) parasitic bright fringes is such as not detected in differential host bright fringes, then jumps to (1) and start next step wavelength regulation, otherwise
It carries out in next step,
8) left side or the right side of main bright fringes are proximate to according to the parasitic bright fringes position to judge resonance cavity mistuning direction；
9) the flexible compensation to carry out chamber length that control piezoelectric ceramics is passed through according to imbalance direction；
10) 2) -9 are repeated) step, until parasitic bright fringes is not detected in the 7) step；
11) 1) -10 are repeated) step, until completing length scanning task.
10. length scanning control method as claimed in claim 9, which is characterized in that extract local number in the step 5)
According to the method for section are as follows: since the peak-peak position deviates to the right certain data cell, to another described peak value position
The data deviated between certain data cell to the left are set, to ensure the data segment extracted between two main bright fringes.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910222265.9A CN109962401B (en) | 2019-03-22 | 2019-03-22 | Single longitudinal mode dye laser sweep frequency device and control method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910222265.9A CN109962401B (en) | 2019-03-22 | 2019-03-22 | Single longitudinal mode dye laser sweep frequency device and control method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN109962401A true CN109962401A (en) | 2019-07-02 |
| CN109962401B CN109962401B (en) | 2024-04-19 |
Family
ID=67024675
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201910222265.9A Active CN109962401B (en) | 2019-03-22 | 2019-03-22 | Single longitudinal mode dye laser sweep frequency device and control method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN109962401B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111262124A (en) * | 2020-03-06 | 2020-06-09 | 河北工业大学 | Brillouin laser |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201584644U (en) * | 2009-12-30 | 2010-09-15 | 核工业理化工程研究院华核新技术开发公司 | Novel multi-longitudinal mode dye laser |
| CN103326238A (en) * | 2013-06-14 | 2013-09-25 | 西安交通大学 | Tunable laser automatic mode hopping restraining method |
| CN209881087U (en) * | 2019-03-22 | 2019-12-31 | 核工业理化工程研究院 | Single longitudinal mode dye laser frequency sweep device |
-
2019
- 2019-03-22 CN CN201910222265.9A patent/CN109962401B/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201584644U (en) * | 2009-12-30 | 2010-09-15 | 核工业理化工程研究院华核新技术开发公司 | Novel multi-longitudinal mode dye laser |
| CN103326238A (en) * | 2013-06-14 | 2013-09-25 | 西安交通大学 | Tunable laser automatic mode hopping restraining method |
| CN209881087U (en) * | 2019-03-22 | 2019-12-31 | 核工业理化工程研究院 | Single longitudinal mode dye laser frequency sweep device |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111262124A (en) * | 2020-03-06 | 2020-06-09 | 河北工业大学 | Brillouin laser |
Also Published As
| Publication number | Publication date |
|---|---|
| CN109962401B (en) | 2024-04-19 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN103828146B (en) | Generate that wavelength is continuous and system and method for scanning of defined wavelength versus both time from laser dynamic self-adapting | |
| CN101604818B (en) | Continuous mode-hop-free tunable grating external-cavity diode laser | |
| US20080140325A1 (en) | Light control unit, optical tomographic imaging method and apparatus | |
| JP2007526620A (en) | Wavelength tuning source device and method | |
| US20140307244A1 (en) | Method for adjusting spectrum width of narrow-band laser | |
| EP2132840A2 (en) | Methods, arrangements and apparatus for utlizing a wavelength-swept laser using angular scanning and dispersion procedures | |
| CN105811232B (en) | A kind of adjusting method generating mode excitation optical path for passive optical resonant cavity | |
| US20110211194A1 (en) | Optical spectrum analyzer with continuously rotating tuynable filter | |
| CN109962401A (en) | Single longitudinal mode dye laser frequency-sweeping apparatus and control method | |
| CN111609999A (en) | Beat frequency signal detection device and method for wide wavelength range in laser offset frequency locking | |
| JP5121150B2 (en) | Tunable laser light source | |
| JPH11307879A (en) | Variable wavelength laser | |
| EP0341315A1 (en) | Method of stabilizing laser wavelength and laser device with stabilized wavelength | |
| CN209881087U (en) | Single longitudinal mode dye laser frequency sweep device | |
| CN103326238B (en) | The automatic mode hopping suppressing method of a kind of tunable laser | |
| EP2451033A1 (en) | Continuous mode-hop-free grating-tuned external cavity semiconductor laser | |
| KR100956853B1 (en) | Method and apparatus for fast measurement of 3-dimensional object | |
| EP1202408A1 (en) | Tuning a laser | |
| CN1150666C (en) | Method of evaluating tuneable lasers | |
| JP5223064B2 (en) | Wavelength scanning laser light source | |
| JP2000314661A (en) | Measuring apparatus for wavelength characteristic | |
| JP2005524246A (en) | Tunable laser source with parameter correction | |
| JP6709588B2 (en) | Laser light source device and interferometer | |
| US8953161B2 (en) | Optical spectrum analyzer with continuously rotating tunable filter | |
| KR101794779B1 (en) | Simultaneous distance measuring system of multiple targets using femtosecond laser and spatial coordinate measuring method using the same |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |