CN109962401B - Single longitudinal mode dye laser sweep frequency device and control method - Google Patents
Single longitudinal mode dye laser sweep frequency device and control method Download PDFInfo
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/10—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
- H01S3/105—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating by controlling the mutual position or the reflecting properties of the reflectors of the cavity, e.g. by controlling the cavity length
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- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
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Abstract
The invention discloses a single longitudinal mode dye laser sweep device and a control method, wherein the single longitudinal mode dye laser sweep device comprises a single longitudinal mode laser oscillator, a Fizeau wavemeter, a controller in communication connection with the wavemeter, the single longitudinal mode laser oscillator comprises a rotating plate driven to rotate relative to a bottom plate, an end mirror fixedly arranged on the rotating plate, piezoelectric ceramics fixedly arranged on the bottom plate and controllably connected with the controller, a rear cavity mirror fixedly connected with the movable end of the piezoelectric ceramics, and a grating.
Description
Technical Field
The invention belongs to the technical field of laser control, and particularly relates to a single longitudinal mode dye laser sweep device and a control method.
Background
Lasers have good monochromaticity and coherence and are therefore widely used in various fields. The line width of the single longitudinal mode laser is generally below 100MHz, and the single longitudinal mode laser is widely applied in the fields of spectrum, interaction of light and substances, ultra-fine structure and the like. In applications, it is desirable that the output wavelength of the laser be scanned over a wide range while maintaining output free of mode hops.
In the fields of single longitudinal mode fiber lasers, solid lasers and the like, a narrow-band filter is generally adopted for tuning, so that the tuning output of laser wavelength in a narrow range is realized. The Littman laser adjusts the output wavelength by adjusting the angle between the cavity mirror and the grating, realizes wavelength scanning, and is applied to tunable lasers such as external cavity semiconductor lasers, dye lasers and the like. The laser has the advantages that due to the fact that a moving device exists in the adjusting process and the limitation of mechanical structure precision, the cavity length and the oscillation laser mode are offset, so that mode jump is generated, and the continuous scanning effect is poor.
Disclosure of Invention
The invention aims to overcome the defects of the prior art and provide a single longitudinal mode dye laser sweep device which has the advantages of wide wavelength range, no mode jump and continuous scanning and can improve the wavelength scanning effect on output light.
The invention aims to simultaneously disclose a control method, which effectively improves the processing speed.
The invention is realized by the following technical scheme:
a sweep device of single longitudinal mode dye laser comprises a single longitudinal mode laser oscillator, a Fizeau wavemeter, a controller in communication connection with the wavemeter,
The single longitudinal mode laser oscillator comprises a rotating plate driven to rotate relative to a bottom plate, an end mirror fixedly arranged on the rotating plate, piezoelectric ceramics fixedly arranged on the bottom plate and controllably connected with the controller, a rear cavity mirror fixedly connected with the movable end of the piezoelectric ceramics, and a grating, wherein zero-order diffracted light of the oscillating light at the grating is output light, and the Fizeau wavemeter is used for measuring the wavelength of the output light and forming interference fringes.
In the above technical scheme, the rotation axis of the rotation plate is located at the focal point of the extension line of the reflection surface of the end mirror and the grating surface of the grating.
In the above technical scheme, the driving mechanism of the rotating plate comprises a driving motor connected with the controller through the end mirror rotary driver, a slide block driven by the driving motor to reciprocate linearly, and a pushing rod rotatably connected with the slide block, wherein the pushing rod is rotatably connected with the rotating plate.
In the technical scheme, the Littman resonant cavity formed by the rear cavity mirror, the end surface mirror and the grating has a cavity length of 10cm.
In the above solution, the free spectral range of the Fizeau wavemeter is not exactly equal to twice the cavity mode spacing.
In the above technical solution, the mode spacing of the resonant cavity is about 1.5GHz, and the free spectral range of the interferometer used in fizeau wavemeter is 3.75GHz.
The output light side is provided with a sampling optical fiber, and the sampling optical fiber conducts the output light to the Fizeau wavemeter.
In the above technical scheme, the piezoelectric ceramic is annular piezoelectric ceramic, and the annular piezoelectric ceramic is driven by a piezoelectric ceramic driver in communication connection with the controller.
In the above technical scheme, the rotating plate is a triangle.
The wavelength scanning control method of the single longitudinal mode dye laser comprises the following steps,
1) The end mirror is rotated to scan the wavelength according to the set step length,
2) The interference fringes measured in real time by the Fizeau wavemeter are read,
3) A polynomial curve fitting is performed on the interference fringes,
4) Searching the maximum peak position and the other peak position adjacent to the right of the maximum peak position on the interference fringe fitting curve as two main bright fringes adjacent to the interference fringe according to a preset amplitude threshold;
5) Extracting a local data segment between two adjacent main bright stripes;
6) Fitting the local data segment;
7) Identifying the parasitic bright stripes, if the parasitic bright stripes are not detected, jumping to (1) starting the next wavelength adjustment, otherwise, carrying out the next step,
8) Judging the detuning direction of the resonant cavity according to whether the parasitic bright stripe is close to the left side or the right side of the main bright stripe;
9) Compensating the cavity length by controlling the extension and contraction of the piezoelectric ceramics according to the detuning direction;
10 Repeating steps 2) -9) until no parasitic bright streaks are detected in step 7);
11 Repeating steps 1) -10) until the wavelength scanning task is completed.
In the above technical solution, the method for extracting the local data segment in the step 5) includes: starting from the maximum peak position shifted to the right by a certain data unit and shifting the data between certain data units to the left by the other peak position to ensure that the extracted data segment is between the two main bright stripes.
The invention has the advantages and beneficial effects that:
The single longitudinal mode wavelength scanning method of the invention is that in the wavelength adjusting process, according to the interference fringes formed by the laser output laser in the Fizeau wavemeter, the real-time monitoring of the tiny parasitic bright fringes is carried out, when the tiny parasitic mode is detected, the compensation of the cavity length is carried out by controlling the extension and contraction of the piezoelectric ceramic, so that the parasitic mode disappears, and the occurrence of mode jump is avoided. The scanning of the single longitudinal mode laser with a large range and no mode jump wavelength is realized.
Drawings
FIG. 1 is a block diagram of a single longitudinal mode dye laser wavelength scanning system.
FIG. 2 is a schematic diagram of a single longitudinal mode dye laser oscillator
FIG. 3 is a flow chart of software for controlling the laser wavelength scanning of single longitudinal mode dye
FIG. 4 is a schematic diagram showing the process of single longitudinal mode dye laser interference fringe treatment
FIG. 5 is a schematic diagram of dye laser interference fringes with parasitic modes
In the figure:
1. Single longitudinal mode laser oscillator
2 Fizeau wavelength meter
3. End mirror rotary driver
4. Piezoelectric ceramic actuator
5. Controller for controlling a power supply
6. Control software
7. Sampling optical fiber
8. End mirror rotation driving rod
9. High voltage output line
10. 11, 12 Communication line
13. Piezoelectric ceramics
14. Rear cavity mirror
15. End mirror
16. Grating
17. Oscillating light
18. Output light
19. Rotating shaft
20. 21 Interference fringes
22. 23 Main bright stripes
24. Adjacent parasitic bright stripes
25. Adjacent parasitic bright stripes after polynomial fitting
26. Fitting curve of interference fringes
27. 28 Primary and secondary peak positions on the interference fringe fitting curve
29. Local data segment between main bright stripes
30. 31 Local data segment fitting curve between main bright stripes
Other relevant drawings may be made by those of ordinary skill in the art from the above figures without undue burden.
Detailed Description
In order to make the person skilled in the art better understand the solution of the present invention, the following describes the solution of the present invention with reference to specific embodiments.
Example 1
The invention relates to a single longitudinal mode dye laser sweep device, which comprises a single longitudinal mode laser oscillator 1, a Fizeau wavemeter 2, a controller 5 in communication connection with the wavemeter,
The single longitudinal mode laser oscillator comprises a rotating plate driven to rotate relative to a bottom plate, an end mirror 15 fixedly arranged on the rotating plate, piezoelectric ceramics 13 fixedly arranged on the bottom plate and controllably connected with the controller, a rear cavity mirror 14 fixedly connected with the movable end of the piezoelectric ceramics, and a grating 16, wherein zero-order diffracted light of oscillating light at the grating is output light, and the Fizeau wavemeter is used for measuring the wavelength of the output light and forming interference fringes. The laser beam in the cavity is grazing incidence on the grating at a small angle, the dispersion effect of the grating is improved, the line width is compressed, and the output of the laser is realized.
The controller is a terminal with calculation or logic processing capability, such as a control computer loaded with a preset software program, and the controller 5 is connected with the Fizeau wavemeter 2 through a communication line 10, the control software is installed in the control computer, and the control software reads laser wavelength and interference fringes from the Fizeau wavemeter by sending instructions; the end mirror rotary driver is connected with the end mirror rotary driver 3 through a communication line 11, and the end mirror rotary driver adopts a conventional sine adjusting mechanism and a corresponding servo system, and the end mirror rotary driver pushes the end mirror to rotate by a corresponding angle around a rotating shaft according to a rotation command sent by control software, so that the wavelength is adjusted; the piezoelectric ceramic driver 4 is connected to two electrodes of the piezoelectric ceramic 13 in the oscillator through a high-voltage output line 9 by a communication line 12, and the control software sends a voltage output command to the piezoelectric ceramic driver, and the piezoelectric ceramic driver outputs corresponding voltage according to the command to control the expansion and contraction of the piezoelectric ceramic.
The single longitudinal mode wavelength scanning method of the invention is that in the wavelength adjusting process, according to the interference fringes formed by the laser output laser in the Fizeau wavemeter, the real-time monitoring of the tiny parasitic bright fringes is carried out, when the tiny parasitic mode is detected, the compensation of the cavity length is carried out by controlling the extension and contraction of the piezoelectric ceramic, so that the parasitic mode disappears, and the occurrence of mode jump is avoided. The scanning of the single longitudinal mode laser with a large range and no mode jump wavelength is realized.
Specifically, the rotation shaft of the rotation plate is positioned at the focus of an extension line of the reflection surface of the end mirror and the grating surface of the grating, the driving mechanism of the rotation plate comprises a driving motor connected with the controller through a rotation driver of the end mirror, a slide block driven by the driving motor to reciprocate linearly, and a push rod rotatably connected with the slide block, and the push rod is rotatably connected with the rotation plate.
Example two
The rear cavity mirror 14, the end mirror 15 and the grating 16 form a Littman resonant cavity, the cavity length is designed to be 10cm, the oscillating light 17 oscillates in the resonant cavity, zero-order diffracted light of the oscillating light 17 on the grating 16 is output light 18, the output light 18 is partially coupled into the sampling optical fiber 7, transmitted to the Fizeau wavemeter 2 for laser wavelength measurement, and interference fringes 20 or interference fringes 21 with light and dark phases are output, as shown in fig. 4 and 5. As shown in fig. 5, adjacent parasitic modes are generated in the resonant cavity when the cavity length is misaligned, and adjacent parasitic bright stripes 24 are generated between the main bright stripes 22 and 23 on the corresponding interference stripe 21. Depending on the designed 10cm cavity length, the cavity output lasing mode spacing is about 1.5GHz, so that parasitic bright stripes 24 formed adjacent to the parasitic mode will be close to either main bright stripe 22 or 23.
The rear cavity mirror 14 is fixed at one end of the piezoelectric ceramic 13, the other end of the piezoelectric ceramic 13 is fixed on the bottom plate, the output voltage of the piezoelectric ceramic driver 4 is connected to the electrode of the piezoelectric ceramic through the high-voltage output line 9, the extension or shortening of the piezoelectric ceramic 13 is driven, the end mirror 14 is driven to move forwards and backwards, and the control of the cavity length is realized. Piezoelectric ceramic actuators are commercially available, such as the Mingmian E00/E01 series piezoelectric actuators. The rotation axis 19 of the end mirror 15 is the intersection point of the reflection surface of the end mirror 15 and the extension line of the grating surface. The end mirror rotary driver 3 pushes the end mirror 15 to rotate around the rotation shaft 19 through the push rod 8, and the output wavelength of the resonant cavity is adjusted by adjusting the angle between the end mirror and the grating.
The Fizeau wavemeter measures laser output by the single longitudinal mode laser oscillator through the sampling optical fiber to obtain laser wavelength and form interference fringes of the laser. The Fizeau laser wavemeter employs a high precision, wide free spectral range wavemeter, and the free spectral range is not exactly equal to twice the cavity mode spacing. Therefore, adjacent parasitic bright stripes of the resonant cavity are necessarily close to the left side or the right side of the main bright stripes, and the method for judging the detuning direction of the resonant cavity comprises the following steps: and judging the detuning direction of the resonant cavity according to the fact that the adjacent parasitic bright stripes of the resonant cavity are close to the left side or the right side of the main bright stripes. The left side or the right side reflects the detuning direction of the cavity length, the left side is too short and the right side is too long.
Such as: the resonant cavity of the single longitudinal mode laser is 10cm in length, the mode interval of the resonant cavity is about 1.5GHz, the wavelength and interference fringes can be measured by using an LM007 wavelength meter produced by Russian, the relative precision is 10-7, and the free spectral range is 3.75GHz. The wavemeter adopts a linear CCD to collect interference fringes between light and dark, and outputs the interference fringes to a computer through a USB line, wherein the abscissa of the interference fringes is CCD pixels, and the ordinate is the optical signal intensity. The main bright stripe interval of the interference fringes output by the Fizeau wavemeter is the free spectrum range of the wavemeter, the interference fringes formed by the LM007 wavemeter are utilized, and the adjacent parasitic bright stripes of the resonant cavity are positioned at the left side or the right side of the main bright stripes and at the position of 0.4 times of the main bright stripe interval, as shown in fig. 5.
Example III
The wavelength scanning algorithm flow of the control software comprises the steps of rotating an end mirror, collecting interference fringes, performing polynomial curve fitting, determining the positions of adjacent main bright fringes, extracting local data segments between the adjacent main bright fringes, performing curve fitting on the local data segments, judging parasitic fringes, judging the offset direction and compensating the cavity length.
When a parasitic lasing mode occurs in the cavity, a parasitic bright stripe is created between the two main bright stripes of the interference fringes. The single longitudinal mode wavelength scanning method of the invention monitors tiny parasitic bright stripes in real time according to interference stripes in the wavelength adjusting process, wherein the method for identifying the parasitic modes comprises the following steps: because the interference fringes output by the Fizeau wavemeter are high-contrast bright-dark alternate fringes, the interference fringes generally comprise more than three sharp main bright fringes, when the resonant cavity is slightly detuned, the relative amplitude of the generated parasitic bright fringes is small, and meanwhile, the original interference fringe curve is not a smooth curve due to the existence of noise. In order to identify tiny parasitic bright fringes on the relatively complex interference fringe curve, the invention firstly carries out polynomial fitting on the whole interference fringe curve to obtain a smooth fitting curve, searches two peak positions on the smooth fitting curve to serve as rough positions of two adjacent main bright fringes on the interference fringe, and then extracts local data segments between the two adjacent main bright fringes on the original interference fringe curve. The local data segment curve is a relatively simple basin-type curve, and accurate polynomial fitting is relatively easy to carry out on the curve, so that the information of tiny parasitic bright stripes is ensured to be reserved. Searching peak values in the smooth local fitting curve, and judging the peak values as parasitic bright stripes if a peak value with the amplitude exceeding a preset threshold value exists. The preset peak value can be set by adopting a specific set value or according to a preset proportion of the amplitude values of the two peak values.
The specific control method comprises the following steps of
(1) The end mirror is rotated, the control software 6 converts the step length of wavelength scanning into the rotation angle of the end mirror 15, and sends a command to the end mirror rotation driver 3, and the end mirror rotation driver 3 drives the end mirror 15 to rotate by a corresponding angle through the push rod 8, so that the output wavelength of the laser is changed.
(2) The interference fringes are collected as shown in fig. 4 and 5, and the control software 6 reads the interference fringes 20 or 21 from the Fizeau wavemeter 2.
(3) Polynomial curve fitting as in fig. 4, the interference fringe 20 is subjected to a first order polynomial curve fitting to obtain an interference fringe fitting curve 26.
(4) The positions of two adjacent main bright fringes are determined, and a maximum peak value is searched on a smooth interference fringe fitting curve 26 according to a preset amplitude threshold value, wherein the maximum peak value position is taken as a main peak position 27, the other peak value position right of the maximum peak value position is taken as a secondary peak position 28, and the main peak position 27 and the secondary peak position 28 are rough positions of the main bright fringes 22 and 23 on the interference fringe curve 20 respectively.
(5) Extracting a local data segment between two adjacent main bright stripes, wherein the extracted data segment is as follows: on the interference fringe 20, a certain data unit is added from the main peak position 27, for example, 10 pixels, and the data unit is reduced from the sub-peak position 28, for example, a data segment between 10 pixels, to obtain a local data segment 29.
(6) Fitting of the local data segments, because the local data segments 29 are basin-type curves of simpler shape, a more accurate curve fit can be performed. The local data segment 29 is polynomial fitted to produce a smooth local fit curve 30. As shown in fig. 5, the local data fitting curve 31 includes adjacent parasitic bright stripes 25.
(7) Parasitic bright stripes are identified and peaks are searched on the locally fitted curve 30 or 31 according to a predetermined amplitude threshold. The predetermined amplitude threshold is 5 and parasitic bright stripes 25 are detected on the locally fitted curve 31.
(8) And judging the detuning direction, wherein the adjacent parasitic bright stripes 25 in the local fitting curve 31 are close to the left side of the main bright stripes, and the cavity length is short.
(9) Cavity length compensation, control software 6 controls piezoelectric ceramic driver 4 to change corresponding output voltage, controls piezoelectric ceramic 13 to shorten, and adjusts cavity length
(10) Repeating the steps (2) to (9) until no parasitic bright stripes are detected in the step (7).
(11) Repeating the steps (1) to (10) to continue the next wavelength scanning adjustment.
In the wavelength scanning process, a Fizeau wavemeter is adopted to feed back interference fringes of laser output by a resonant cavity, tiny adjacent parasitic bright fringes are monitored in real time, the cavity length imbalance direction is judged, and then the cavity length compensation is carried out by controlling the extension and retraction of piezoelectric ceramics, so that parasitic modes are eliminated.
Spatially relative terms, such as "upper," "lower," "left," "right," and the like, may be used in the embodiments for ease of description to describe one element or feature's relationship to another element or feature's illustrated in the figures. It will be understood that the spatial terms are intended to encompass different orientations of the device in use or operation in addition to the orientation depicted in the figures. For example, if the device in the figures is turned over, elements described as "under" other elements or features would then be oriented "over" the other elements or features. Thus, the exemplary term "lower" may encompass both an upper and lower orientation. The device may be otherwise positioned (rotated 90 degrees or at other orientations) and the spatially relative descriptors used herein interpreted accordingly.
Moreover, relational terms such as "first" and "second", and the like, may be used solely to distinguish one element from another element having the same name, without necessarily requiring or implying any actual such relationship or order between such elements.
The foregoing has described exemplary embodiments of the invention, it being understood that any simple variations, modifications, or other equivalent arrangements which would not unduly obscure the invention may be made by those skilled in the art without departing from the spirit of the invention.
Claims (8)
1. A wavelength scanning control method of a single longitudinal mode dye laser is characterized in that the single longitudinal mode dye laser sweep device comprises a single longitudinal mode laser oscillator, a Fizeau wavemeter, a controller in communication connection with the wavemeter,
The single longitudinal mode laser oscillator comprises a rotating plate driven to rotate relative to a bottom plate, an end mirror fixedly arranged on the rotating plate, piezoelectric ceramics fixedly arranged on the bottom plate and controllably connected with the controller, a rear cavity mirror fixedly connected with the movable end of the piezoelectric ceramics, and a grating, wherein zero-order diffracted light of the oscillating light in the grating is output light, and the Fizeau wavemeter is used for measuring the wavelength of the output light and forming interference fringes;
the rotating shaft of the rotating plate is positioned at the focus of an extension line of the reflecting surface of the end mirror and the grating surface of the grating;
the wavelength scanning control method comprises the following steps,
1) The end mirror is rotated to scan the wavelength according to the set step length,
2) The interference fringes measured in real time by the Fizeau wavemeter are read,
3) A polynomial curve fitting is performed on the interference fringes,
4) Searching the maximum peak position and the other peak position adjacent to the right of the maximum peak position on the interference fringe fitting curve as two main bright fringes adjacent to the interference fringe according to a preset amplitude threshold;
5) Extracting a local data segment between two adjacent main bright stripes;
6) Fitting the local data segment;
7) Identifying the parasitic bright stripes, if the parasitic bright stripes are not detected, jumping to (1) starting the next wavelength adjustment, otherwise, carrying out the next step,
8) Judging the detuning direction of the resonant cavity according to whether the parasitic bright stripe is close to the left side or the right side of the main bright stripe;
9) The compensation of the cavity length is carried out by controlling the extension and contraction of the piezoelectric ceramic according to the detuning direction, wherein the left side is too short and the right side is too long;
10 Repeating steps 2) -9) until no parasitic bright streaks are detected in step 7);
11 Repeating steps 1) -10) until the wavelength scanning task is completed.
2. The method for controlling wavelength scanning of a single longitudinal mode dye laser sweep apparatus according to claim 1, wherein: the driving mechanism of the rotating plate comprises a driving motor connected with the controller through an end mirror rotary driver, a sliding block driven by the driving motor to linearly reciprocate, and a pushing rod rotatably connected with the sliding block, wherein the pushing rod is rotatably connected with the rotating plate.
3. The method for controlling wavelength scanning of a single longitudinal mode dye laser sweep apparatus according to claim 1, wherein: the Littman resonant cavity formed by the rear cavity mirror, the end surface mirror and the grating has a cavity length of 10cm.
4. The method for controlling wavelength scanning of a single longitudinal mode dye laser sweep apparatus according to claim 1, wherein: the free spectral range of the Fizeau wavemeter is not exactly equal to twice the cavity mode spacing.
5. The method for controlling wavelength scanning of a single longitudinal mode dye laser sweep apparatus according to claim 1, wherein: the mode spacing of the cavity was 1.5GHz and the free spectral range of the interferometer used in the Fizeau wavemeter was 3.75GHz.
6. The method for controlling wavelength scanning of a single longitudinal mode dye laser sweep apparatus according to claim 1, wherein: the output light side is provided with a sampling optical fiber, and the sampling optical fiber conducts the output light to the Fizeau wavemeter.
7. The method for controlling wavelength scanning of a single longitudinal mode dye laser sweep apparatus according to claim 1, wherein: the piezoelectric ceramic is annular piezoelectric ceramic, and the annular piezoelectric ceramic is driven by a piezoelectric ceramic driver in communication connection with the controller.
8. The method for controlling the wavelength sweep of a single longitudinal mode dye laser sweep apparatus according to claim 1, wherein the method for extracting the local data segment in step 5) comprises the steps of: starting from the maximum peak position shifted to the right by a certain data unit and shifting the data between certain data units to the left by the other peak position to ensure that the extracted data segment is between the two main bright stripes.
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Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201584644U (en) * | 2009-12-30 | 2010-09-15 | 核工业理化工程研究院华核新技术开发公司 | Novel multi-longitudinal mode dye laser |
| CN103326238A (en) * | 2013-06-14 | 2013-09-25 | 西安交通大学 | Tunable laser automatic mode hopping restraining method |
| CN209881087U (en) * | 2019-03-22 | 2019-12-31 | 核工业理化工程研究院 | Single longitudinal mode dye laser frequency sweep device |
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- 2019-03-22 CN CN201910222265.9A patent/CN109962401B/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201584644U (en) * | 2009-12-30 | 2010-09-15 | 核工业理化工程研究院华核新技术开发公司 | Novel multi-longitudinal mode dye laser |
| CN103326238A (en) * | 2013-06-14 | 2013-09-25 | 西安交通大学 | Tunable laser automatic mode hopping restraining method |
| CN209881087U (en) * | 2019-03-22 | 2019-12-31 | 核工业理化工程研究院 | Single longitudinal mode dye laser frequency sweep device |
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