CN109949725A - A kind of AOI system image grayscale standardized method and system - Google Patents

A kind of AOI system image grayscale standardized method and system Download PDF

Info

Publication number
CN109949725A
CN109949725A CN201910169382.3A CN201910169382A CN109949725A CN 109949725 A CN109949725 A CN 109949725A CN 201910169382 A CN201910169382 A CN 201910169382A CN 109949725 A CN109949725 A CN 109949725A
Authority
CN
China
Prior art keywords
picture
checked
image
defect
grayscale
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201910169382.3A
Other languages
Chinese (zh)
Other versions
CN109949725B (en
Inventor
罗巍巍
马新伍
张胜森
郑增强
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Wuhan Jingce Electronic Group Co Ltd
Wuhan Jingli Electronic Technology Co Ltd
Original Assignee
Wuhan Jingce Electronic Group Co Ltd
Wuhan Jingli Electronic Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Wuhan Jingce Electronic Group Co Ltd, Wuhan Jingli Electronic Technology Co Ltd filed Critical Wuhan Jingce Electronic Group Co Ltd
Priority to CN201910169382.3A priority Critical patent/CN109949725B/en
Publication of CN109949725A publication Critical patent/CN109949725A/en
Application granted granted Critical
Publication of CN109949725B publication Critical patent/CN109949725B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Landscapes

  • Image Processing (AREA)

Abstract

The invention discloses a kind of AOI system image grayscale standardized method and systems, specific steps are as follows: establish simulated defect sample image for picture to be checked, it counts and compares the detection of defect sample in picture to be detected under different images grayscale as a result, determining the optimal gray value I of picture to be detected according to detection resultr;The compensating parameter of picture to be checked is calculated using the overall intensity mean value of picture to be checked, optimal sum of the grayscale values pre-set image grey level compensation formula, the gray value of each pixel of picture to be checked is compensated using the compensating parameter of calculating, to realize the grey scale of picture to be checked.

Description

A kind of AOI system image grayscale standardized method and system
Technical field
The invention belongs to field of image detection, and in particular to a kind of AOI system image grayscale standardized method and system.
Background technique
AOI (Automatic Optic Inspection, automatic optics inspection technology) is widely used in display screen defect In detection.In the AOI testing process of display screen, display screen successively shows that picture to be detected, visual sensor sync pulse jamming wait for The picture of detection enters defects detection process after the completion of capture.The consistency of picture quality is automatic optics inspection defect detection The basis of rate.
However, the consistency of image grayscale is primarily present following two aspects: the one of image grayscale to detection influence factor The assessment of cause property and the target gray value of picture to be detected.Due to display defect characteristic morphology multiplicity, the wave above and below image grayscale When dynamic, the contrast and defect area of defect can be affected therewith, directly affect assessment of the system to display screen defect rank; Simultaneously as display defect characteristic morphology multiplicity, the feature of different gray value of images, defect performance can change.Such as it is faint Shinny defect can be fainter in high gray image, and faint obfuscation defect is difficult to differentiate in the image of low ash rank.
In display screen automatic production line, display screen gamma curve is the main reason for image gray-scale level fluctuates.Display screen Gamma value indicate the relationship between display grayscale value and display brightness.Since the gamma curve of different display screens exists Difference, by taking L48 picture as an example, brightness when showing same grey menu L48 between different liquid crystal modules is inconsistent.Without Gamma After the liquid crystal module of correction enters automatic optics inspection station, when visual sensor time for exposure and backlight illumination remain unchanged, The overall intensity unusual fluctuations of image to be checked, assessment of the Interference Detection system to defect rank.Camera automatic exposure can be used, The hardware adjustments mode such as adaptive backlight makes picture entirety gray value standard to be checked, however this method will increase system time-consuming And hardware cost is high, while mainly according to scene, debugging provides empirical value repeatedly for the assessment of picture grey values to be checked, thus lack The appraisal procedure of standard.
Summary of the invention
Aiming at the above defects or improvement requirements of the prior art, the present invention provides a kind of AOI system image grayscale standards Change method and system, for picture to be checked establish simulated defect sample image so that it is determined that picture to be detected optimal gray value, And then calculate compensating parameter and the gray value of each pixel of picture to be checked is compensated, to realize picture to be checked Grey scale.
To achieve the above object, according to one aspect of the present invention, a kind of AOI system image grayscale standardization side is provided Method, specific steps are as follows:
S1. simulated defect sample image is established for picture to be checked, counts and compares picture to be detected under different images grayscale The detection of middle defect sample is as a result, determine the optimal gray value Ir of picture to be detected according to detection result;
S2. using the overall intensity mean value of picture to be checked, optimal sum of the grayscale values pre-set image grey level compensation formula calculate to The compensating parameter for examining picture, compensates the gray value of each pixel of picture to be checked using the compensating parameter of calculating, from And realize the grey scale of picture to be checked.
As a further improvement of the present invention, step S1 specifically:
S1.1 picture image to be checked specifies the point defect sample of each grayscale of regional simulation, to generate simulation point defect sample This;
S1.2 acquires the simulation point defect sample image under each picture centre gray average;
S1.3 detects the simulation point defect sample image under each picture centre gray average, counts each picture centre ash Spend the defective data of mean value Imitating point defect sample image.
As a further improvement of the present invention, step S1.3 specifically: utilize point defect detection method and identical detection The defect of simulation point defect sample image under the gray average of parameter extraction different images center counts different images center gray scale Middle detection defect number, defect contrast and the defect area of simulation point defect sample image under mean value;According to defective data Determine the optimal gray value I of picture to be checkedr
As a further improvement of the present invention, the overall intensity mean value computation formula of picture to be checked is
In formula, R is picture area to be checked, and the gray value of pixel (x, y) is f (x, y) in R, and A is the face of picture to be checked Product.
As a further improvement of the present invention, step S2 calculates the compensating parameter of picture to be checked using iterative algorithm, specifically Are as follows:
Preset initial gray value IsWith the number of iterations N, initial penalty coefficient γ is calculated0=sqrt (Is/Ic);
Since n=0, γ is enabledn+1n+ 1, by γnSubstitute into pre-set image grey level compensation formula In(x, y)=aγn*[f (x,y)]γn, obtaining picture image coordinate to be checked is the compensated gray value I of (x, y) pixeln(x, y) further calculates to obtain The overall intensity mean value of the corresponding image of nth iteration, i.e.,
Stopping criterion for iteration is | In-Ir| it is less than preset threshold, γ when iteration endsnAs required gray value penalty coefficient γ;
Wherein, γnGray value penalty coefficient when for nth iteration, a are the coefficient of pre-set image grey level compensation formula.
To achieve the above object, other side according to the invention provides a kind of AOI system image grayscale standardization System, the system include simulated defect processing module and grey level compensation processing module,
Simulated defect processing module is used to establish simulated defect sample image for picture to be checked, counts and compares different images Under grayscale in picture to be detected the detection of defect sample as a result, determining the optimal gray value of picture to be detected according to detection result Ir;
Grey level compensation processing module is used for overall intensity mean value, optimal gray value Ir and pre-set image using picture to be checked Grey level compensation formula calculates the compensating parameter of picture to be checked, using the compensating parameter of calculating to each pixel of picture to be checked Gray value compensates, to realize the grey scale of picture to be checked.
As a further improvement of the present invention, simulated defect processing module includes that sequentially connected simulation point defect generates mould Block, image capture module and defective data processing module, wherein
Point defect generation module is simulated to be used to specify the point defect sample of each grayscale of regional simulation in picture image to be checked, To generate simulation point defect sample;
Image capture module is used to acquire the simulation point defect sample image under each picture centre gray average;
Defective data processing module is used to detect the simulation point defect sample image under each picture centre gray average, system Count the defective data of each picture centre gray average Imitating point defect sample image.
As a further improvement of the present invention, simulated defect processing module utilizes point defect detection method and identical detection The defect of simulation point defect sample image under the gray average of parameter extraction different images center counts different images center gray scale Middle detection defect number, defect contrast and the defect area of simulation point defect sample image under mean value;According to defective data Determine the optimal gray value I of picture to be checkedr
As a further improvement of the present invention, the overall intensity mean value computation formula of picture to be checked is
In formula, R is picture area to be checked, and the gray value of pixel (x, y) is f (x, y) in R, and A is the face of picture to be checked Product.
As a further improvement of the present invention, grey level compensation processing module calculates the compensation of picture to be checked using iterative algorithm Parameter, specifically:
Preset initial gray value IsWith the number of iterations N, initial penalty coefficient γ is calculated0=sqrt (Is/Ic);
Since n=0, γ is enabledn+1n+ 1, by γnSubstitute into pre-set image grey level compensation formula In(x, y)=aγn*[f (x,y)]γn, obtaining picture image coordinate to be checked is the compensated gray value I of (x, y) pixeln(x, y) further calculates to obtain The overall intensity mean value of the corresponding image of nth iteration, i.e.,
Stopping criterion for iteration is | In-Ir| it is less than preset threshold, γ when iteration endsnAs required gray value penalty coefficient γ;
Wherein, γnGray value penalty coefficient when for nth iteration, a are the coefficient of pre-set image grey level compensation formula.
In general, through the invention it is contemplated above technical scheme is compared with the prior art, have below beneficial to effect Fruit:
A kind of AOI system image grayscale standardized method of the invention and system, it is poor for gamma curve between liquid crystal display panel The skimble-scamble problem of testing image caused by different establishes simulated defect sample image so that it is determined that picture to be detected for picture to be checked The optimal gray value in face, so calculate compensating parameter and the gray value of each pixel of picture to be checked is compensated, from And realize the grey scale of picture to be checked, equivalent is in adjusting visual sensor exposure, standardized images overall intensity Later, liquid crystal module defect is expressed more authentic and valid in the picture, easily facilitates the just assessment display screen of AOI detection system Defect rank.
A kind of AOI system image grayscale standardized method of the invention and system, utilize point defect detection method and phase Same detection parameters extract the defect of the simulation point defect sample image under the gray average of different images center, are conducive to accurately mention The information of defect is taken, to further increase the accuracy of the optimal gray value of picture to be checked.
A kind of AOI system image grayscale standardized method of the invention and system calculate picture to be checked using iterative algorithm The compensating parameter in face compensates the gray value of each pixel of picture to be checked, lacks to be more advantageous to and extract liquid crystal module Sunken real information, to further increase the assessment defect rank of AOI image detecting system.
Detailed description of the invention
Fig. 1 is a kind of schematic diagram of AOI system image grayscale standardized method of the embodiment of the present invention.
Specific embodiment
In order to make the objectives, technical solutions, and advantages of the present invention clearer, with reference to the accompanying drawings and embodiments, right The present invention is further elaborated.It should be appreciated that the specific embodiments described herein are merely illustrative of the present invention, and It is not used in the restriction present invention.
In addition, as long as technical characteristic involved in the various embodiments of the present invention described below is each other not Constituting conflict can be combined with each other.The present invention is described in more detail With reference to embodiment.
Fig. 1 is a kind of schematic diagram of AOI system image grayscale standardized method of the embodiment of the present invention.As shown in Figure 1, tool Body step are as follows:
S1. simulated defect sample image is established for picture to be checked, counts and compares picture to be detected under different images grayscale The detection of middle defect sample is as a result, determine the optimal gray value Ir of picture to be detected according to detection result;
Specifically:
S1.1 picture image to be checked specifies the point defect sample of each grayscale of regional simulation, to generate simulation point defect sample This;
Specifically: in all picture central areas to be detected, simulation point defect is generated, includes 256 sub-pixels in region Point defect (display screen minimum unit defect), 256 defect grayscale are 0-255;
S1.2 acquires the simulation point defect sample image under each picture centre gray average;
S1.3 detects the simulation point defect sample image under each picture centre gray average, counts each picture centre ash Spend the defective data of mean value Imitating point defect sample image.
Specifically: it is extracted under the gray average of different images center using point defect detection method and identical detection parameters The defect of point defect sample image is simulated, the middle inspection of the simulation point defect sample image under the gray average of different images center is counted Defect number, defect contrast and defect area out;The optimal gray value of picture to be checked is determined according to defective data.
Wherein, it can be lacked by counting design simulation in the simulation point defect sample image under each picture centre gray average It falls into the defect sum detected at region and obtains detection defect number;It can be by counting the simulation under each picture centre gray average The corresponding contrast mean value of defect is detected at design simulation defect area in point defect sample image and variance obtains Defect Comparison Degree;It can be by being examined at design simulation defect area in the simulation point defect sample image under statistics different images center gray average The corresponding defect area mean value of defect and variance obtain defect area out;
It include defect number, defect contrast and defect area, preferably each picture centre gray average in defective data Under the corresponding picture centre gray average of simulation point defect sample image detection the largest number of images of defect be optimal gray scale It is worth, the simulation point defect sample image detection defect contrast mean value under less preferred each picture centre gray average is highest The corresponding picture centre gray average of image is optimal gray value, the simulation point under last preferably each picture centre gray average It is optimal gray value that defect sample image, which detects the corresponding picture centre gray average of the maximum image of defect area mean value,.
S2. using the overall intensity mean value of picture to be checked, optimal sum of the grayscale values pre-set image grey level compensation formula calculate to The compensating parameter for examining picture, compensates the gray value of each pixel of picture to be checked using the compensating parameter of calculating, from And realize the grey scale of picture to be checked.
The overall intensity mean value of picture to be checked is calculated specifically, acquiring picture to be checked, i.e. measured panel enters detection microscope carrier And picture to be checked is shown one by one, visual sensor shoots the picture to be checked of Display panel;Picture to be checked is calculated after acquiring picture to be checked The overall intensity mean value I in facec, note R be picture area to be checked, then in R pixel (x, y) gray value be f (x, y), A be to The area of picture is examined, the overall intensity mean value computation formula of picture to be checked is
Joined using the compensation that optimal sum of the grayscale values pre-set image grey level compensation formula calculates each sub-pixel point of picture to be checked Number specifically: pre-set image grey level compensation formula is I (x, y)~aγ*[f(x,y)]γ, in formula, I (x, y) is for image coordinate The compensated gray value of (x, y) pixel, f (x, y) are the actual grey value that image coordinate is (x, y) pixel, and γ is gray scale It is worth penalty coefficient, a is the coefficient of pre-set image grey level compensation formula.
The overall gray value standardization of picture to be checked refers to the equal primary system of overall intensity of the same picture to be checked between each panel One is the optimal gray value I of picture to be checkedr.Using L48 picture image to be checked as example, the L48 picture to be checked of each display screen to be checked Image has the optimal gray value I of unified picture to be checked after the pre-treatmentr
For reach unified gray average it needs to be determined that picture to be checked grey level compensation coefficient gamma, calculated using iterative algorithm true Detailed process is as follows for the grey level compensation coefficient gamma of fixed picture to be checked:
Preset initial gray value IsWith the number of iterations N, initial penalty coefficient γ is calculated0=sqrt (Is/Ic);From n= 0 starts, and enables γn+1n+ 1, by γnSubstitute into pre-set image grey level compensation formula In(x, y)=aγn*[f(x,y)]γn, obtain to Inspection picture image coordinate is the compensated gray value I of (x, y) pixeln(x, y) further calculates to obtain nth iteration correspondence Image overall intensity mean value, i.e.,
Stopping criterion for iteration is | In-Ir| it is less than preset threshold, γ when iteration endsnAs required gray value penalty coefficient γ。
After gray value of image standardization to be checked, into defects detection process.
A kind of AOI system image grayscale standardized system, the system include at simulated defect processing module and grey level compensation Manage module, wherein
Simulated defect processing module is used to establish simulated defect sample image for picture to be checked, counts and compares different images Under grayscale in picture to be detected the detection of defect sample as a result, determining the optimal gray value of picture to be detected according to detection result Ir;
Simulated defect processing module includes sequentially connected simulation point defect generation module, image capture module and defect number According to processing module, wherein
Point defect generation module is simulated to be used to specify the point defect sample of each grayscale of regional simulation in picture image to be checked, To generate simulation point defect sample image.In all picture central areas to be detected, simulation point defect is generated, includes in region 256 sub- pixel point defects (display screen minimum unit defect), 256 defect grayscale are 0-255.
Image capture module is used to acquire the simulation point defect sample image under each picture centre gray average;
Defective data processing module is used to detect the simulation point defect sample image under each picture centre gray average, system The defective data of each picture centre gray average Imitating point defect sample image is counted, determines picture to be checked according to defective data Optimal gray value Ir
Specifically: it is extracted under the gray average of different images center using point defect detection method and identical detection parameters The defect of point defect sample image is simulated, the middle inspection of the simulation point defect sample image under the gray average of different images center is counted Defect number, defect contrast and defect area out;
Wherein, it can be lacked by counting design simulation in the simulation point defect sample image under each picture centre gray average It falls into the defect sum detected at region and obtains detection defect number;It can be by counting the simulation under each picture centre gray average The corresponding contrast mean value of defect is detected at design simulation defect area in point defect sample image and variance obtains Defect Comparison Degree;It can be by being examined at design simulation defect area in the simulation point defect sample image under statistics different images center gray average The corresponding defect area mean value of defect and variance obtain defect area out;
It include defect number, defect contrast and defect area, preferably each picture centre gray average in defective data Under the corresponding picture centre gray average of simulation point defect sample image detection the largest number of images of defect be optimal gray scale It is worth, the simulation point defect sample image detection defect contrast mean value under less preferred each picture centre gray average is highest The corresponding picture centre gray average of image is optimal gray value, the simulation point under last preferably each picture centre gray average It is optimal gray value that defect sample image, which detects the corresponding picture centre gray average of the maximum image of defect area mean value,.
Grey level compensation processing module is used for the overall intensity mean value using picture to be checked, optimal sum of the grayscale values pre-set image ash Degree compensation formula calculates the compensating parameter of picture to be checked, using the compensating parameter of calculating to the ash of each pixel of picture to be checked Angle value compensates, to realize the grey scale of picture to be checked.
Grey level compensation processing module calculates the grey level compensation coefficient gamma for determining picture to be checked using iterative algorithm specifically:
Preset initial gray value IsWith the number of iterations N, initial penalty coefficient γ is calculated0=sqrt (Is/Ic);From n= 0 starts, and enables γn+1n+ 1, by γnSubstitute into pre-set image grey level compensation formula In(x, y)=aγn*[f(x,y)]γn, obtain to Inspection picture image coordinate is the compensated gray value of (x, y) pixel, further calculates to obtain the corresponding image of nth iteration Overall intensity mean value, i.e.,
Stopping criterion for iteration is | In-Ir| it is less than preset threshold, γ when iteration endsnAs required gray value penalty coefficient γ。
After gray value of image standardization to be checked, into defects detection process.
As it will be easily appreciated by one skilled in the art that the foregoing is merely illustrative of the preferred embodiments of the present invention, not to The limitation present invention, any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should all include Within protection scope of the present invention.

Claims (10)

1. a kind of AOI system image grayscale standardized method, which is characterized in that specific steps are as follows:
S1. simulated defect sample image is established for picture to be checked, count and compare and lack in picture to be detected under different images grayscale The detection of sample is fallen into as a result, determining the optimal gray value I of picture to be detected according to detection resultr
S2. picture to be checked is calculated using the overall intensity mean value of picture to be checked, optimal sum of the grayscale values pre-set image grey level compensation formula The compensating parameter in face compensates the gray value of each pixel of picture to be checked using the compensating parameter of calculating, thus real The grey scale of existing picture to be checked.
2. a kind of AOI system image grayscale standardized method according to claim 1, which is characterized in that step S1 is specific Are as follows:
S1.1 picture image to be checked specifies the point defect sample of each grayscale of regional simulation, to generate simulation point defect sample;
S1.2 acquires the simulation point defect sample image under each picture centre gray average;
S1.3 detects the simulation point defect sample image under each picture centre gray average, counts each picture centre gray scale The defective data of mean value Imitating point defect sample image.
3. a kind of AOI system image grayscale standardized method according to claim 2, which is characterized in that step S1.3 tool Body are as follows: the simulation point defect under the gray average of different images center is extracted using point defect detection method and identical detection parameters The defect of sample image counts the middle detection defect of the simulation point defect sample image under the gray average of different images center Number, defect contrast and defect area;The optimal gray value I of picture to be checked is determined according to defective datar
4. a kind of AOI system image grayscale standardized method according to any one of claim 1-3, which is characterized in that The overall intensity mean value computation formula of picture to be checked is
In formula, R is picture area to be checked, and the gray value of pixel (x, y) is f (x, y) in R, and A is the area of picture to be checked.
5. a kind of AOI system image grayscale standardized method according to claim 4, which is characterized in that step S2 is utilized Iterative algorithm calculates the compensating parameter of picture to be checked, specifically:
Preset initial gray value IsWith the number of iterations N, initial penalty coefficient γ is calculated0=sqrt (Is/Ic);
Since n=0, γ is enabledn+1n+ 1, by γnSubstitute into pre-set image grey level compensation formula Obtaining picture image coordinate to be checked is the compensated gray value I of (x, y) pixeln(x, y) is further calculated To the overall intensity mean value of the corresponding image of nth iteration, i.e.,
Stopping criterion for iteration is | In-Ir| it is less than preset threshold, γ when iteration endsnAs required gray value penalty coefficient γ;
Wherein, γnGray value penalty coefficient when for nth iteration, a are the coefficient of pre-set image grey level compensation formula.
6. a kind of AOI system image grayscale standardized system, which includes simulated defect processing module and grey level compensation processing Module, which is characterized in that
The simulated defect processing module is used to establish simulated defect sample image for picture to be checked, counts and compares different images Under grayscale in picture to be detected the detection of defect sample as a result, determining the optimal gray value of picture to be detected according to detection result Ir
The grey level compensation processing module is used for the overall intensity mean value using picture to be checked, optimal gray value IrAnd pre-set image Grey level compensation formula calculates the compensating parameter of picture to be checked, using the compensating parameter of calculating to each pixel of picture to be checked Gray value compensates, to realize the grey scale of picture to be checked.
7. a kind of AOI system image grayscale standardized system according to claim 6, which is characterized in that the simulation lacks Sunken processing module includes sequentially connected simulation point defect generation module, image capture module and defective data processing module, In,
The simulation point defect generation module is used to specify the point defect sample of each grayscale of regional simulation in picture image to be checked, To generate simulation point defect sample;
Described image acquisition module is used to acquire the simulation point defect sample image under each picture centre gray average;
The defective data processing module is used to detect the simulation point defect sample image under each picture centre gray average, system Count the defective data of each picture centre gray average Imitating point defect sample image.
8. a kind of AOI system image grayscale standardized system according to claim 6 or 7, which is characterized in that the simulation Defect processing module extracts the mould under the gray average of different images center using point defect detection method and identical detection parameters The defect of quasi- point defect sample image, counts the middle detection of the simulation point defect sample image under the gray average of different images center Defect number, defect contrast and defect area;The optimal gray value I of picture to be checked is determined according to defective datar
9. a kind of AOI system image grayscale standardized system a method according to any one of claims 6-8, which is characterized in that The overall intensity mean value computation formula of picture to be checked is
In formula, R is picture area to be checked, and the gray value of pixel (x, y) is f (x, y) in R, and A is the area of picture to be checked.
10. a kind of AOI system image grayscale standardized system according to claim 9, which is characterized in that the gray scale is mended The compensating parameter that processing module calculates picture to be checked using iterative algorithm is repaid, specifically:
Preset initial gray value IsWith the number of iterations N, initial penalty coefficient γ is calculated0=sqrt (Is/Ic);
Since n=0, γ is enabledn+1n+ 1, by γnSubstitute into pre-set image grey level compensation formula Obtaining picture image coordinate to be checked is the compensated gray value I of (x, y) pixeln(x, y) is further calculated To the overall intensity mean value of the corresponding image of nth iteration, i.e.,
Stopping criterion for iteration is | In-Ir| it is less than preset threshold, γ when iteration endsnAs required gray value penalty coefficient γ;
Wherein, γnGray value penalty coefficient when for nth iteration, a are the coefficient of pre-set image grey level compensation formula.
CN201910169382.3A 2019-03-06 2019-03-06 Image gray level standardization method and system for AOI system Active CN109949725B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201910169382.3A CN109949725B (en) 2019-03-06 2019-03-06 Image gray level standardization method and system for AOI system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201910169382.3A CN109949725B (en) 2019-03-06 2019-03-06 Image gray level standardization method and system for AOI system

Publications (2)

Publication Number Publication Date
CN109949725A true CN109949725A (en) 2019-06-28
CN109949725B CN109949725B (en) 2022-09-20

Family

ID=67009226

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201910169382.3A Active CN109949725B (en) 2019-03-06 2019-03-06 Image gray level standardization method and system for AOI system

Country Status (1)

Country Link
CN (1) CN109949725B (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111798420A (en) * 2020-06-28 2020-10-20 苏州精濑光电有限公司 Point screen position positioning method, device, equipment and storage medium
CN112130355A (en) * 2020-09-21 2020-12-25 深圳同兴达科技股份有限公司 Method for efficiently acquiring defective liquid crystal display module
CN114519714A (en) * 2022-04-20 2022-05-20 中导光电设备股份有限公司 Method and system for judging smudgy defect of display screen
CN116718353A (en) * 2023-06-01 2023-09-08 信利光电股份有限公司 Automatic optical detection method and device for display module

Citations (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5517234A (en) * 1993-10-26 1996-05-14 Gerber Systems Corporation Automatic optical inspection system having a weighted transition database
JP2004239733A (en) * 2003-02-05 2004-08-26 Seiko Epson Corp Defect detection method and apparatus of screen
JP2007047122A (en) * 2005-08-12 2007-02-22 Tokyo Seimitsu Co Ltd Image defect inspection device, defect classification device, and image defect inspection method
US20070106416A1 (en) * 2006-06-05 2007-05-10 Griffiths Joseph J Method and system for adaptively controlling a laser-based material processing process and method and system for qualifying same
CN101667406A (en) * 2009-08-14 2010-03-10 西安龙腾微电子科技发展有限公司 Backlight dynamical adjusting method of TFT-LCD
CN102509300A (en) * 2011-11-18 2012-06-20 深圳市宝捷信科技有限公司 Defect detection method and system
WO2014140522A2 (en) * 2013-03-14 2014-09-18 The University Court Of The University Of Edinburgh A method of generating predetermined luminance levels across an electronic visual display
CN104217684A (en) * 2014-09-11 2014-12-17 西安诺瓦电子科技有限公司 LED (light emitting diode) defective point processing method and detection method and LED display control method
CN104332421A (en) * 2014-09-01 2015-02-04 上海华力微电子有限公司 Performance detection method of scanning machine
CN104424904A (en) * 2013-09-11 2015-03-18 三星显示有限公司 Method of driving a display panel,display apparatus performing the same, method of determining a correction value applied to the same, and method of correcting grayscale data
US20150187289A1 (en) * 2013-12-30 2015-07-02 Samsung Display Co., Ltd. Method of compensating mura of display apparatus and vision inspection apparatus performing the method
CN105911724A (en) * 2016-05-23 2016-08-31 京东方科技集团股份有限公司 Method and device for determining illumination intensity for detection and optical detection method and device
CN106127779A (en) * 2016-06-29 2016-11-16 上海晨兴希姆通电子科技有限公司 The defect inspection method of view-based access control model identification and system
CN106444105A (en) * 2016-10-18 2017-02-22 凌云光技术集团有限责任公司 Method, device and system for detecting defects of liquid crystal screen
CN107025891A (en) * 2017-03-23 2017-08-08 武汉精测电子技术股份有限公司 A kind of display module defect fast repairing method and system
KR20170106527A (en) * 2016-03-10 2017-09-21 삼성디스플레이 주식회사 Inspection apparatus of inspecting mura defects, method of driving the inspection apparatus and display apparatus having correction value of mura defects
CN206740664U (en) * 2017-03-03 2017-12-12 重庆恒讯联盛实业有限公司 A kind of AOI detecting and controlling systems of pcb board
CN108596226A (en) * 2018-04-12 2018-09-28 武汉精测电子集团股份有限公司 A kind of defects of display panel training method and system based on deep learning
CN108646445A (en) * 2018-05-03 2018-10-12 武汉精测电子集团股份有限公司 A kind of defect detecting device of adaptive backlight
US20180301071A1 (en) * 2017-04-18 2018-10-18 Samsung Display Co., Ltd. System and method for white spot mura detection
CN109167928A (en) * 2018-09-06 2019-01-08 武汉精测电子集团股份有限公司 Fast automatic exposure method and system based on defects of display panel detection
CN109406529A (en) * 2018-09-28 2019-03-01 武汉精立电子技术有限公司 A kind of property regulation method of AOI defect detecting system

Patent Citations (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5517234A (en) * 1993-10-26 1996-05-14 Gerber Systems Corporation Automatic optical inspection system having a weighted transition database
JP2004239733A (en) * 2003-02-05 2004-08-26 Seiko Epson Corp Defect detection method and apparatus of screen
JP2007047122A (en) * 2005-08-12 2007-02-22 Tokyo Seimitsu Co Ltd Image defect inspection device, defect classification device, and image defect inspection method
US20070106416A1 (en) * 2006-06-05 2007-05-10 Griffiths Joseph J Method and system for adaptively controlling a laser-based material processing process and method and system for qualifying same
CN101667406A (en) * 2009-08-14 2010-03-10 西安龙腾微电子科技发展有限公司 Backlight dynamical adjusting method of TFT-LCD
CN102509300A (en) * 2011-11-18 2012-06-20 深圳市宝捷信科技有限公司 Defect detection method and system
WO2014140522A2 (en) * 2013-03-14 2014-09-18 The University Court Of The University Of Edinburgh A method of generating predetermined luminance levels across an electronic visual display
CN104424904A (en) * 2013-09-11 2015-03-18 三星显示有限公司 Method of driving a display panel,display apparatus performing the same, method of determining a correction value applied to the same, and method of correcting grayscale data
US20150187289A1 (en) * 2013-12-30 2015-07-02 Samsung Display Co., Ltd. Method of compensating mura of display apparatus and vision inspection apparatus performing the method
CN104332421A (en) * 2014-09-01 2015-02-04 上海华力微电子有限公司 Performance detection method of scanning machine
CN104217684A (en) * 2014-09-11 2014-12-17 西安诺瓦电子科技有限公司 LED (light emitting diode) defective point processing method and detection method and LED display control method
KR20170106527A (en) * 2016-03-10 2017-09-21 삼성디스플레이 주식회사 Inspection apparatus of inspecting mura defects, method of driving the inspection apparatus and display apparatus having correction value of mura defects
CN105911724A (en) * 2016-05-23 2016-08-31 京东方科技集团股份有限公司 Method and device for determining illumination intensity for detection and optical detection method and device
CN106127779A (en) * 2016-06-29 2016-11-16 上海晨兴希姆通电子科技有限公司 The defect inspection method of view-based access control model identification and system
CN106444105A (en) * 2016-10-18 2017-02-22 凌云光技术集团有限责任公司 Method, device and system for detecting defects of liquid crystal screen
CN206740664U (en) * 2017-03-03 2017-12-12 重庆恒讯联盛实业有限公司 A kind of AOI detecting and controlling systems of pcb board
CN107025891A (en) * 2017-03-23 2017-08-08 武汉精测电子技术股份有限公司 A kind of display module defect fast repairing method and system
US20180301071A1 (en) * 2017-04-18 2018-10-18 Samsung Display Co., Ltd. System and method for white spot mura detection
CN108596226A (en) * 2018-04-12 2018-09-28 武汉精测电子集团股份有限公司 A kind of defects of display panel training method and system based on deep learning
CN108646445A (en) * 2018-05-03 2018-10-12 武汉精测电子集团股份有限公司 A kind of defect detecting device of adaptive backlight
CN109167928A (en) * 2018-09-06 2019-01-08 武汉精测电子集团股份有限公司 Fast automatic exposure method and system based on defects of display panel detection
CN109406529A (en) * 2018-09-28 2019-03-01 武汉精立电子技术有限公司 A kind of property regulation method of AOI defect detecting system

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
TIBOR TAKACS: "Novel Outlier Filtering Method for AOI Image Databases", 《IEEE TRANSACTIONS ON COMPONENTS, PACKAGING AND MANUFACTURING TECHNOLOGY》 *
肖磊等: "TFT-LCD面板光学检测自动对焦系统设计", 《红外与激光工程》 *

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111798420A (en) * 2020-06-28 2020-10-20 苏州精濑光电有限公司 Point screen position positioning method, device, equipment and storage medium
CN112130355A (en) * 2020-09-21 2020-12-25 深圳同兴达科技股份有限公司 Method for efficiently acquiring defective liquid crystal display module
CN112130355B (en) * 2020-09-21 2023-03-24 深圳同兴达科技股份有限公司 Method for acquiring defective liquid crystal display module
CN114519714A (en) * 2022-04-20 2022-05-20 中导光电设备股份有限公司 Method and system for judging smudgy defect of display screen
CN114519714B (en) * 2022-04-20 2022-07-26 中导光电设备股份有限公司 Method and system for judging smudgy defect of display screen
CN116718353A (en) * 2023-06-01 2023-09-08 信利光电股份有限公司 Automatic optical detection method and device for display module
CN116718353B (en) * 2023-06-01 2024-05-28 信利光电股份有限公司 Automatic optical detection method and device for display module

Also Published As

Publication number Publication date
CN109949725B (en) 2022-09-20

Similar Documents

Publication Publication Date Title
CN109949725A (en) A kind of AOI system image grayscale standardized method and system
CN101655614B (en) Method and device for detecting cloud pattern defects of liquid crystal display panel
CN113570605B (en) Defect detection method and system based on liquid crystal display panel
CN103558229B (en) A kind of MURA vision automatic testing method of TFT-LCD processing procedure and device
CN110473165A (en) A kind of welding quality of circuit board detection method and device
CN109167928A (en) Fast automatic exposure method and system based on defects of display panel detection
CN110261069B (en) Detection method for optical lens
CN110211523B (en) A kind of method, apparatus and system of telemeasurement Flicker value of liquid crystal module
CN108520514A (en) Printed circuit board electronics member device consistency detecting method based on computer vision
CN101651845B (en) Method for testing definition of moving images of display devices
CN110310596B (en) GAMMA (GAMMA-GAMMA) adjustment initial value prediction method and system of OLED module
CN109615612A (en) A kind of defect inspection method of solar panel
CN109859155A (en) Image distortion detection method and system
US20170048518A1 (en) Method and apparatus for adjusting installation flatness of lens in real time
CN106226033A (en) The method and device of detection transparent substrates transmitance
CN108986721A (en) A kind of test pattern generation method for display panel detection
CN107025891A (en) A kind of display module defect fast repairing method and system
CN109712115A (en) A kind of pcb board automatic testing method and system
CN110579184A (en) Product appearance online detection device and use method thereof
CN116067671B (en) Method, system and medium for testing vehicle paint quality
KR20150125155A (en) Apparatus and method for brightness uniformity inspecting of display panel
CN115546140A (en) Display panel detection method and system and electronic device
CN109448012A (en) A kind of method for detecting image edge and device
CN115546716A (en) Binocular vision-based method for positioning fire source around power transmission line
CN210773933U (en) Product appearance on-line measuring device

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant