CN109811403A - A kind of crystal pulling system and crystal pulling method - Google Patents

A kind of crystal pulling system and crystal pulling method Download PDF

Info

Publication number
CN109811403A
CN109811403A CN201711176669.6A CN201711176669A CN109811403A CN 109811403 A CN109811403 A CN 109811403A CN 201711176669 A CN201711176669 A CN 201711176669A CN 109811403 A CN109811403 A CN 109811403A
Authority
CN
China
Prior art keywords
magnetic field
horizontal magnetic
crystal pulling
silicon melt
bringing device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201711176669.6A
Other languages
Chinese (zh)
Inventor
三重野文健
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Zing Semiconductor Corp
Original Assignee
Zing Semiconductor Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Zing Semiconductor Corp filed Critical Zing Semiconductor Corp
Priority to CN201711176669.6A priority Critical patent/CN109811403A/en
Publication of CN109811403A publication Critical patent/CN109811403A/en
Pending legal-status Critical Current

Links

Abstract

The present invention provides a kind of crystal pulling system and crystal pulling methods.The system comprises: crystal pulling chamber, the crystal pulling chamber include the crucible for storing silicon melt;With horizontal magnetic field bringing device, the horizontal magnetic field bringing device includes the multiple loop coils being arranged on the outside of the crystal pulling chamber, the power of the multiple loop coil independently controls, so as to be applied to the distribution of horizontal magnetic intensity in vertical direction on the silicon melt adjustable for the horizontal magnetic field bringing device.Crystal pulling system and crystal pulling method according to the present invention, the distribution of the horizontal magnetic intensity being applied in crucible on silicon melt in vertical direction is adjusted during crystal pulling, rather than bushing position is adjusted, the horizontal magnetic intensity of silicon melt level remains constant in crucible during realization crystal pulling, it avoids and crucible is driven upside down, so as to avoid the crucible drive system when carrying out the crystal pulling of large scale crystal column using larger volume or power.

Description

A kind of crystal pulling system and crystal pulling method
Technical field
The present invention relates to technical field of semiconductors, in particular to a kind of crystal pulling system and crystal pulling method.
Background technique
Czochralski method (hereinafter referred to as " CZ method ") is method for preparing single crystal most widely used in the manufacture of Silicon Wafer. CZ method is to make the method for crystal growth while lifting in the molten silicon that crystal seed is impregnated in silica crucible.Pass through CZ method The crystal column of formation, further progress cut to form Silicon Wafer.
In order to improve semiconductor devices yield and reduce IC chip manufacturing cost, silicon single crystal wafer it is straight Diameter was originally bigger, this makes occur more and more problems during monocrystalline silicon growing, as monocrystalline oxygen concentration increase, crystal at The problems such as long stability is low and low yield.A kind of solution is using the CZ method for applying horizontal magnetic field, specifically, using containing There is the horizontal magnetic field for applying some strength outside the crucible of melting monocrystalline silicon body, while crucible rotate and in crystal growth It is moved up and down on direction, carries out crystal pulling to guarantee silicon melt level in crucible to be maintained under constant magnetic field strength.However, compared with In large-sized crystal growing process, as 450mm monocrystalline silicon growth course in need bigger crucible drive unit with movement Crucible is difficult to overcome this disadvantage in the prior art.
Therefore, it is necessary to be improved to current crystal pulling system and crystal pulling method, so as to eliminate presently, there are the problem of.
Summary of the invention
A series of concept of reduced forms is introduced in Summary, this will in the detailed description section into One step is described in detail.Summary of the invention is not meant to attempt to limit technical solution claimed Key feature and essential features do not mean that the protection scope for attempting to determine technical solution claimed more.
In view of the deficiencies of the prior art, the present invention provides a kind of crystal pulling system, the system comprises:
Crystal pulling chamber, the crystal pulling chamber include the crucible for storing silicon melt;With
Horizontal magnetic field bringing device, the horizontal magnetic field bringing device include the more of the setting on the outside of the crystal pulling chamber The power of a loop coil, the multiple loop coil independently controls, so that the horizontal magnetic field bringing device is applied to The distribution of horizontal magnetic intensity in vertical direction on the silicon melt is adjustable.
Illustratively, the horizontal magnetic field bringing device includes top field coil, middle part field coil and bottom magnetic field Coil;Wherein,
The top field coil includes the institute that the horizontal magnetic field applied is distributed in the region of the silicon melt level or more State loop coil;
The middle part field coil includes that the horizontal magnetic field applied is distributed in the silicon melt level to the crucible bottom Region the loop coil;
The bottom field coil includes that the horizontal magnetic field applied is distributed in the described of crucible bottom region below Loop coil.
Illustratively, the horizontal magnetic field bringing device includes at least 10 loop coils.
Illustratively, the middle part field coil includes loop coil described at least six.
Illustratively, the system also includes the silicon melt level monitoring systems that the crystal pulling chamber roof is arranged in.
Illustratively, the silicon melt level monitoring system includes optical sensor.
Illustratively, the system also includes horizontal magnetic field automatic control systems, fill to apply to the horizontal magnetic field It sets and carries out automatically controlling.
Illustratively, the horizontal magnetic field automatic control system includes:
Data acquisition module, to obtain the process data in crystal pulling technique, the process data includes device parameter number According to, properties of product data corresponding with each device parameter data;
Data conversion module, the process data is converted into computable standardized data;
Machine learning control module obtains the control of horizontal magnetic field bringing device calculate according to the process data Prediction result, and the horizontal magnetic field bringing device is carried out automatically according to the horizontal magnetic field bringing device control forecasting result Control.
Illustratively, the horizontal magnetic field automatic control system control the loop coil load power size and/ Or sequence.
The present invention also provides a kind of crystal pulling methods, which is characterized in that adjusts and is applied on silicon melt during crystal pulling Horizontal magnetic intensity distribution in vertical direction, to maintain the horizontal magnetic intensity of the silicon melt level constant.
Illustratively, keep the horizontal position for storing the crucible of the silicon melt constant during crystal pulling.
Illustratively, the method for adjusting the distribution of the horizontal magnetic intensity being applied on silicon melt in vertical direction Implemented by the horizontal magnetic field bringing device that the control of machine learning Controlling model applies the horizontal magnetic field.
Illustratively, the process of the machine learning Controlling model implementation includes:
The process data in crystal pulling technique is obtained, the process data includes device parameter data and each device parameter number According to corresponding properties of product data;
The process data is converted into computable standardized data;
Horizontal magnetic field bringing device control forecasting is calculated according to the standardized data using neural network prediction model As a result;
The horizontal magnetic field bringing device is controlled according to the horizontal magnetic field bringing device control forecasting result.
Crystal pulling system and crystal pulling method according to the present invention can be adjusted during crystal pulling and be applied in crucible on silicon melt Horizontal magnetic intensity distribution in vertical direction, rather than bushing position is adjusted, is realized during crystal pulling in crucible The horizontal magnetic intensity of silicon melt level remains constant, avoids and drives upside down to crucible, so as to avoid carrying out greatly Using the crucible drive system of larger volume or power when size crystal column crystal pulling, to reduce crystal pulling system bulk.
Detailed description of the invention
Following drawings of the invention is incorporated herein as part of the present invention for the purpose of understanding the present invention.Shown in the drawings of this hair Bright embodiment and its description, principle used to explain the present invention.
In attached drawing:
Fig. 1 shows a kind of structural schematic diagram of crystal pulling system;
The structural schematic diagram for the crystal pulling system implemented Fig. 2 shows one according to the present invention.
Specific embodiment
In the following description, a large amount of concrete details are given so as to provide a more thorough understanding of the present invention.So And it is obvious to the skilled person that the present invention may not need one or more of these details and be able to Implement.In other examples, in order to avoid confusion with the present invention, for some technical characteristics well known in the art not into Row description.
It should be understood that the present invention can be implemented in different forms, and should not be construed as being limited to propose here Embodiment.On the contrary, provide these embodiments will make it is open thoroughly and completely, and will fully convey the scope of the invention to Those skilled in the art.In the accompanying drawings, for clarity, the size and relative size in the area Ceng He may be exaggerated.From beginning to end Same reference numerals indicate identical element.
It should be understood that when element or layer be referred to " ... on ", " with ... it is adjacent ", " being connected to " or " being coupled to " it is other When element or layer, can directly on other elements or layer, it is adjacent thereto, be connected or coupled to other elements or layer, or There may be elements or layer between two parties by person.On the contrary, when element is referred to as " on directly existing ... ", " with ... direct neighbor ", " directly It is connected to " or " being directly coupled to " other elements or when layer, then there is no elements or layer between two parties.It should be understood that although can make Various component, assembly units, area, floor and/or part are described with term first, second, third, etc., these component, assembly units, area, floor and/ Or part should not be limited by these terms.These terms be used merely to distinguish a component, assembly unit, area, floor or part with it is another One component, assembly unit, area, floor or part.Therefore, do not depart from present invention teach that under, first element discussed below, portion Part, area, floor or part are represented by second element, component, area, floor or part.
Spatial relation term for example " ... under ", " ... below ", " below ", " ... under ", " ... it On ", " above " etc., herein can for convenience description and being used describe an elements or features shown in figure with The relationship of other elements or features.It should be understood that spatial relation term intention further includes making other than orientation shown in figure With the different orientation with the device in operation.For example, then, being described as " under other elements if the device in attached drawing is overturn Face " or " under it " or " under it " elements or features will be oriented in other elements or features "upper".Therefore, exemplary art Language " ... below " and " ... under " it may include upper and lower two orientations.Device can additionally be orientated (be rotated by 90 ° or its It is orientated) and spatial description language as used herein correspondingly explained.
The purpose of term as used herein is only that description specific embodiment and not as limitation of the invention.Make herein Used time, " one " of singular, "one" and " described/should " be also intended to include plural form, unless the context clearly indicates separately Outer mode.It is also to be understood that term " composition " and/or " comprising ", when being used in this specification, determines the feature, whole The presence of number, step, operations, elements, and/or components, but be not excluded for one or more other features, integer, step, operation, The presence or addition of component, assembly unit and/or group.Herein in use, term "and/or" includes any of related listed item and institute There is combination.
In order to thoroughly understand the present invention, detailed step will be proposed in following description, to illustrate proposition of the present invention Technical solution.Presently preferred embodiments of the present invention is described in detail as follows, however other than these detailed descriptions, the present invention can be with With other embodiments.
In order to improve semiconductor devices yield and reduce IC chip manufacturing cost, silicon single crystal wafer it is straight Diameter was originally bigger, this makes occur more and more problems during monocrystalline silicon growing, as monocrystalline silicon oxygen concentration increases, crystal Grow up the problems such as stability is low and low yield.A kind of solution be using the CZ method for applying horizontal magnetic field, specifically, using The horizontal magnetic field for applying some strength outside the crucible of melting monocrystalline silicon body is filled, while crucible rotate and in crystal growth Direction on move up and down, to guarantee in crucible that silicon melt level keeps scheduled magnetic field strength.A kind of crystal pulling as shown in figure 1 The structural schematic diagram of system, wherein crystal pulling system includes crystal pulling chamber 1, be provided in crystal pulling chamber 1 crucible 2 and to crucible 2 into The heater 3 of row heating, be provided with below crucible 2 crucible drive unit 4 to drive the rotation of crucible 2 and in vertical direction on Lower movement, wherein crystal pulling system further includes the horizontal magnetic field bringing device 5 being arranged on the outside of crystal pulling chamber, to positioned at earthenware The silicon melt of crucible 2 applies horizontal magnetic field.However, in vertical direction strong of existing magnetic field applicator during crystal pulling Degree distribution remains unchanged, such as gradually increases or reduce from silicon melt level to bottom in vertical direction but in same level Intensity in height remains unchanged, and at the same time, controls the rotation of crucible 2 by crucible drive unit 4 and moves up and down, to protect The position of the liquid level of card silicon melt in vertical direction is constant, so that the position at silicon melt level has constant default magnetic Field intensity.In the crystal growing process of larger size, as 450mm monocrystalline silicon growth course in need larger size or function The problems such as crucible drive unit of rate brings the size of crystal pulling apparatus to increase thus to drive crucible to move up and down, and load increases.
In order to solve the problems in the prior art, the present invention provides a kind of crystal pulling system, the system comprises:
Crystal pulling chamber, the crystal pulling chamber include the crucible for storing silicon melt;With
The horizontal magnetic field bringing device includes the multiple loop coils being arranged on the outside of the crystal pulling chamber, described more The power of a loop coil independently controls, so that the horizontal magnetic field bringing device is applied to the level on the silicon melt The distribution of magnetic field strength in vertical direction is adjustable.
Crystal pulling system and crystal pulling method according to the present invention, adjust during crystal pulling and are applied in crucible on silicon melt The distribution of horizontal magnetic intensity in vertical direction, rather than bushing position is adjusted, silicon in crucible during realization crystal pulling The horizontal magnetic intensity of melt liquid level remains constant, avoids and drives upside down to crucible, so as to avoid big ruler is being carried out Using the crucible drive system of larger volume or power when very little crystal column crystal pulling, to reduce crystal pulling system bulk.
Embodiment one
In order to solve the problems in the prior art, a kind of crystal pulling system is present embodiments provided, it is suitable for larger diameters Silicon Wafer crystal pulling technique is particularly suitable for 450mm diameter Silicon Wafer crystal pulling technique.As shown in Fig. 2, showing according to the present invention A kind of structural schematic diagram of the crystal pulling system of one embodiment.The crystal pulling system includes crystal pulling chamber 21, is set in crystal pulling chamber The heater 23 for being equipped with the crucible 22 of storage silicon melt and crucible 22 being heated, the horizontal magnetic in 21 outside of crystal pulling chamber Field bringing device 25 is stored with silicon melt 26 in crucible 22 to apply horizontal magnetic field to the silicon melt for being located at crucible 22.It is described Horizontal magnetic field bringing device includes the multiple loop coils being arranged on the outside of the crystal pulling chamber, the multiple loop coil Power independently controls, so that the horizontal magnetic field bringing device is applied to the horizontal magnetic intensity on the silicon melt and is hanging down The upward distribution of histogram is adjustable.By the way that multiple loop coils are arranged, wherein each loop coil is controlled by independent current source generates water Flat magnetic field, so that it is adjustable in vertical direction to be applied to the magnetic field strength of horizontal magnetic field on silicon melt during crystal pulling, Maintain to realize in crucible in the case that silicon melt level is constant not needing to be adjusted bushing position during crystal pulling The magnetic field strength of silicon melt level is kept constant, and is driven upside down so as to avoid to crucible, and the drawing of large scale crystal column is being carried out When brilliant, reduce the crucible drive system using larger volume or power, to reduce crystal pulling system bulk.
With continued reference to Fig. 2, crucible drive unit 24 is provided with below crucible 22 to drive crucible 22 to rotate.In crystal pulling Keeping crucible rotation in the process is the hot asymmetry in order to reduce silicon melt, makes silicon crystal column isodiametric growth.The crystal pulling system System also packet seed crystal, bracing wire, bracing wire motor 28, argon gas plate and the insulation material layer that is arranged on the outside of heater etc. is in the prior art Configuration, do not shown all in Fig. 2, those skilled in the art, which can according to need, to be selected, and details are not described herein.
Illustratively, the horizontal magnetic field bringing device includes top field coil, middle part field coil and bottom magnetic field Coil;Wherein, the top field coil includes the region that the horizontal magnetic field applied is distributed in the silicon melt level or more The loop coil;The middle part field coil includes that the horizontal magnetic field applied is distributed in the silicon melt level to the crucible The loop coil in the region of bottom;The bottom field coil includes that the horizontal magnetic field applied is distributed in the crucible bottom The loop coil in region below.It, can be with shape during crystal pulling to form the horizontal magnetic field for including entire silicon melt At wide in range magnetic field adjustable extent, the magnetic field center adjustable area of formation is located at silicon melt level between crucible bottom.Such as Fig. 2 Shown, horizontal magnetic field bringing device 25 includes top field coil 251, middle part field coil 252 and bottom field coil 253, Wherein, the magnetic field that top field coil 251 applies is located at the region of 26 liquid level 26a of silicon melt or more, and middle part field coil 252 is applied The liquid level 26a or less that the magnetic field added is located at silicon melt 26 arrives the region of the bottom 22b or more of crucible 22, bottom field coil 253 The magnetic field of application is located at the region below bottom 22b of crucible 22.
Illustratively, the horizontal magnetic field bringing device includes at least 10 loop coils.Wherein, illustratively, The middle part field coil includes at least 6 loop coils, and setting includes at least 6 magnetic field loop coils, during crystal pulling, With the progress of crystal pulling process, in the case where crucible keeps that position is constant in vertical direction, in crucible the liquid level of silicon melt by Gradually decline, setting at least six magnetic field loop coil can be in the magnetic field that vertical direction is distributed from silicon melt level to crucible bottom Intensity controlled by least six magnetic field loop coil, further the magnetic field of silicon melt level is strong during accurate control crystal pulling Degree.As shown in Fig. 2, top field coil 251 includes 2 loop coils, middle part field coil 252 includes 6 loop coils, bottom Portion's field coil 253 includes 2 loop coils.
Illustratively, the top field coil include at least 2 loop coils, i.e., by least two loop coil into One step accurately controls the distribution of the horizontal magnetic intensity of silicon melt level or more in vertical direction.Illustratively, the bottom Field coil includes at least 2 loop coils, i.e., by least two loop coil, further accurately control crucible bottom is below The distribution of horizontal magnetic intensity in vertical direction.
It is to be appreciated that the setting of the top field coil, middle part field coil and bottom field coil is only Illustratively, any number of loop coil may be implemented to be applied to the magnetic field strength of the horizontal magnetic field on silicon melt in vertical direction Being distributed adjustable embodiment may be applicable to the present invention.It is also to be appreciated that multiple loop coils can have it is identical The coil parameters such as loop density, diameter, can also have a different coil parameters, those skilled in the art can according to need into Row setting.
Illustratively, the system also includes the silicon melt surface monitoring devices for being located at the crystal pulling chamber roof.It is described Monitoring device is to monitor silicon melt level state.Illustratively, the monitoring device is set as optical sensor, to monitor Liquid level position of silicon melt is adjusted magnetic field applicator according to the liquid level position of silicon melt.As shown in Fig. 2, in crystal pulling chamber Optical sensor 27 is arranged in the top of room 21.
Illustratively, the system also includes horizontal magnetic field automatic control systems, fill to apply to the horizontal magnetic field It sets and carries out automatically controlling.The horizontal magnetic field automatic control system includes: data acquisition module, to obtain work in crystal pulling technique Skill data, the process data include device parameter data, properties of product data corresponding with each device parameter data;Data turn Block is changed the mold, the process data is converted into computable standardized data;Machine learning control module, to according to institute It states process data and calculate acquisition horizontal magnetic field bringing device control forecasting as a result, and according to the horizontal magnetic field bringing device Control forecasting result carries out automatically controlling the horizontal magnetic field bringing device.The horizontal magnetic field automatic control system uses The process data obtained during crystal pulling technique generates prediction data by machine learning Controlling model, passes through prediction data control The coil load quantity of the horizontal magnetic field bringing device is made, load power etc. is controlled.
Show that routinely the process controlled by learning control model horizontal magnetic field bringing device includes: to obtain Process data in crystal pulling technique is taken, the process data includes device parameter data, product corresponding with each device parameter data Performance data;The process data is converted into computable standardized data;Using neural network prediction model according to Standardized data calculates horizontal magnetic field bringing device control forecasting result;According to horizontal magnetic field bringing device control forecasting result Controlled level magnetic field applicator.
Illustratively, the device parameter data include the absolute coil during crystal pulling in horizontal magnetic field bringing device Power data and time data and crystal pulling time control data etc. in several, each absolute coil.Illustratively, the product Can data include silicon Silicon Wafer size, oxygen concentration distribution is (dense including oxygen in vertical direction in silicon crystal column and radially in wafer Degree distribution), grown-in defects distribution, resistivity distribution etc..The process data obtained is subjected to data conversion, obtains to count After the standardized data of calculation, the control of horizontal magnetic field bringing device is calculated according to standardized data using neural network prediction model Prediction result.The data conversion and can be with using the method for neural computing horizontal magnetic field bringing device control forecasting result Using the method that those skilled in the art are general, details are not described herein.Finally, according to calculated horizontal magnetic field bringing device Control forecasting result carries out automatically controlling horizontal magnetic field bringing device.Illustratively, horizontal magnetic field bringing device control forecasting As a result the prediction result of the device parameter including horizontal magnetic field bringing device.Pass through horizontal magnetic field bringing device control forecasting result Controlled level magnetic field applicator includes the size and/or sequence for controlling the load power of loop coil.
It is to be appreciated that the example in the present embodiment in the method for neural network as machine learning model is to horizontal magnetic The control mode of field automatic control system, which is illustrated, to be only exemplary, and the model of other machines study is such as based on vector Statistical learning, deep learning of machine etc. are suitable for the present invention.
Embodiment two
Crystal pulling method is carried out using crystal pulling system described in embodiment one the present invention also provides a kind of, wherein in crystal pulling The distribution of the horizontal magnetic intensity being applied on silicon melt in vertical direction is adjusted in journey.It adjusts and is applied to during crystal pulling The distribution of horizontal magnetic intensity in vertical direction in crucible on silicon melt, rather than bushing position is adjusted, it realizes and draws The horizontal magnetic intensity of silicon melt level remains constant in crucible during crystalline substance, drives upside down so as to avoid to crucible, When carrying out the crystal pulling of large scale crystal column, reduce the crucible drive system using larger volume or power, to reduce crystal pulling system System volume.
Illustratively, the process of the crystal pulling includes: that polycrystalline silicon raw material doping and melting process, horizontal magnetic field loaded Journey;Silicon melt heating and stabilization process;Seed crystal and melt contacts process;Room, lifting, equal diameter control and epilog, institute The process of stating can be process identical with crystal pulling process in the prior art or similar deformation, and details are not described herein.Below only Only lifting process is illustratively described.
Illustratively, it keeps the horizontal position of the crucible of storage silicon melt constant during crystal pulling, crystal pulling can be kept The stability of silicon melt in the process.Referring to Fig. 2, in crystal pulling chamber 21, crucible 22 will be placed in by the polysilicon block as raw material It is interior, crucible is heated with scheduled temperature setting heater 23, so that polysilicon block melts to form silicon as shown in Figure 2 Melt 26.Driving crystal seed is immersed in silicon melt 26, and bracing wire motor 28 is driven to lift crystal seed with certain speed, and crystal seed is in bracing wire Lifting under lift out monocrystalline column 20 upwards, in the process, the liquid level of silicon melt 26 is with the carry out liquid level during lifting Height declines, while adjusting horizontal magnetic field bringing device 25, so that in the magnetic field strength of liquid level position during liquid level declines It keeps constant, and in the process, keep bushing position constant.Single crystal silicon ingot is formed by this step lifting process.
Illustratively, during crystal pulling to the horizontal magnetic intensity being applied on the silicon melt in vertical direction Distribution carries out automatically controlling.Illustratively, by machine learning Controlling model to the horizontal magnetic field being applied on the silicon melt The distribution of intensity in vertical direction carries out automatically controlling.Show routinely, it is described that horizontal magnetic field is applied by learning control model The process that feeder apparatus is controlled include: obtain crystal pulling technique in process data, the process data include device parameter data, Properties of product data corresponding with each device parameter data;The process data is converted into computable standardized data;It adopts Horizontal magnetic field bringing device control forecasting result is calculated according to the standardized data with neural network prediction model;According to water Flat magnetic field applicator control forecasting result controlled level magnetic field applicator.
Illustratively, the device parameter data include the absolute coil during crystal pulling in horizontal magnetic field bringing device Power data and time data and crystal pulling time control data etc. in several, each absolute coil.Illustratively, the product Can data include silicon Silicon Wafer size, oxygen concentration distribution is (dense including oxygen in vertical direction in silicon crystal column and radially in wafer Degree distribution), grown-in defects distribution, resistivity distribution etc..The process data obtained is subjected to data conversion, obtains to count After the standardized data of calculation, the control of horizontal magnetic field bringing device is calculated according to standardized data using neural network prediction model Prediction result.The data conversion and can be with using the method for neural computing horizontal magnetic field bringing device control forecasting result Using the method that those skilled in the art are general, details are not described herein.Finally, according to calculated horizontal magnetic field bringing device Control forecasting result carries out automatically controlling horizontal magnetic field bringing device.Illustratively, horizontal magnetic field bringing device control forecasting As a result the prediction result of the device parameter including horizontal magnetic field bringing device.Pass through horizontal magnetic field bringing device control forecasting result Controlled level magnetic field applicator includes the size and/or sequence for controlling the load power of loop coil.The horizontal magnetic field is certainly Autocontrol system uses the process data obtained during crystal pulling technique, generates prediction data by learning control model, leads to The coil load quantity that prediction data controls the horizontal magnetic field bringing device is crossed, loading current etc. is controlled.
Illustratively, the device parameter data include the absolute coil during crystal pulling in horizontal magnetic field bringing device Power data and time data and crystal pulling time control data etc. in several, each absolute coil.Illustratively, the product Can data include silicon Silicon Wafer size, oxygen concentration distribution is (dense including oxygen in vertical direction in silicon crystal column and radially in wafer Degree distribution), grown-in defects distribution, resistivity distribution etc..The process data obtained is subjected to data conversion, obtains to count After the standardized data of calculation, the control of horizontal magnetic field bringing device is calculated according to standardized data using neural network prediction model Prediction result.The data conversion and the method for utilizing neural computing horizontal magnetic field bringing device control forecasting result are this Method known to the technical staff of field, details are not described herein.
In conclusion crystal pulling system according to the present invention and crystal pulling method, adjust during crystal pulling and are applied in crucible The distribution of horizontal magnetic intensity in vertical direction on silicon melt, rather than bushing position is adjusted, realize crystal pulling process The horizontal magnetic intensity of silicon melt level maintains constant in middle crucible, avoids and drives upside down to crucible, so as to avoid When carrying out the crystal pulling of large scale crystal column using the crucible drive system of larger volume or power, to reduce crystal pulling system bulk.
The present invention has been explained by the above embodiments, but it is to be understood that, above-described embodiment is only intended to The purpose of citing and explanation, is not intended to limit the invention to the scope of the described embodiments.Furthermore those skilled in the art It is understood that the present invention is not limited to the above embodiments, introduction according to the present invention can also be made more kinds of member Variants and modifications, all fall within the scope of the claimed invention for these variants and modifications.Protection scope of the present invention by The appended claims and its equivalent scope are defined.

Claims (13)

1. a kind of crystal pulling system, which is characterized in that the system comprises:
Crystal pulling chamber, the crystal pulling chamber include the crucible for storing silicon melt;With
Horizontal magnetic field bringing device, the horizontal magnetic field bringing device include the multiple rings being arranged on the outside of the crystal pulling chamber The power of shape coil, the multiple loop coil independently controls so that the horizontal magnetic field bringing device be applied to it is described The distribution of horizontal magnetic intensity in vertical direction on silicon melt is adjustable.
2. system according to claim 1, which is characterized in that the horizontal magnetic field bringing device includes top magnetic field line Circle, middle part field coil and bottom field coil;Wherein,
The top field coil includes the ring that the horizontal magnetic field applied is distributed in the region of the silicon melt level or more Shape coil;
The middle part field coil includes that the horizontal magnetic field applied is distributed in the silicon melt level to the area of the crucible bottom The loop coil in domain;
The bottom field coil includes the annular that the horizontal magnetic field applied is distributed in crucible bottom region below Coil.
3. system according to claim 2, which is characterized in that the horizontal magnetic field bringing device includes at least described in 10 Loop coil.
4. system according to claim 2, which is characterized in that the middle part field coil includes annular described at least six Coil.
5. system according to claim 1, which is characterized in that the system also includes be arranged in the crystal pulling chamber roof Silicon melt level monitoring system.
6. system according to claim 5, which is characterized in that the silicon melt level monitoring system includes optical sensing Device.
7. system according to claim 1, which is characterized in that the system also includes horizontal magnetic field automatic control system, To be carried out automatically controlling to the horizontal magnetic field bringing device.
8. system according to claim 7, which is characterized in that the horizontal magnetic field automatic control system includes:
Data acquisition module, to obtain the process data in crystal pulling technique, the process data include device parameter data, with The corresponding properties of product data of each device parameter data;
Data conversion module, the process data is converted into computable standardized data;
Machine learning control module obtains horizontal magnetic field bringing device control forecasting calculate according to the process data As a result, and being controlled automatically according to the horizontal magnetic field bringing device control forecasting result to the horizontal magnetic field bringing device System.
9. system according to claim 8, which is characterized in that the horizontal magnetic field automatic control system controls the annular The size and/or sequence of the load power of coil.
10. a kind of crystal pulling method, which is characterized in that adjust the horizontal magnetic intensity being applied on silicon melt during crystal pulling and exist Distribution in vertical direction, to maintain the horizontal magnetic intensity of the silicon melt level constant.
11. according to the method described in claim 10, it is characterized in that, keeping storing the earthenware of the silicon melt during crystal pulling The horizontal position of crucible is constant.
12. according to the method described in claim 10, it is characterized in that, described to adjust the horizontal magnetic field that is applied on silicon melt strong The method of the distribution of degree in vertical direction applies the horizontal magnetic field of the horizontal magnetic field by the control of machine learning Controlling model Bringing device is implemented.
13. according to the method for claim 12, which is characterized in that the process packet that the machine learning Controlling model is implemented It includes:
Obtain crystal pulling technique in process data, the process data include device parameter data, with each device parameter data phase Corresponding properties of product data;
The process data is converted into computable standardized data;
Horizontal magnetic field bringing device control forecasting result is calculated according to the standardized data using neural network prediction model;
The horizontal magnetic field bringing device is controlled according to the horizontal magnetic field bringing device control forecasting result.
CN201711176669.6A 2017-11-22 2017-11-22 A kind of crystal pulling system and crystal pulling method Pending CN109811403A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201711176669.6A CN109811403A (en) 2017-11-22 2017-11-22 A kind of crystal pulling system and crystal pulling method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201711176669.6A CN109811403A (en) 2017-11-22 2017-11-22 A kind of crystal pulling system and crystal pulling method

Publications (1)

Publication Number Publication Date
CN109811403A true CN109811403A (en) 2019-05-28

Family

ID=66599909

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201711176669.6A Pending CN109811403A (en) 2017-11-22 2017-11-22 A kind of crystal pulling system and crystal pulling method

Country Status (1)

Country Link
CN (1) CN109811403A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114411256A (en) * 2021-12-31 2022-04-29 南京晶升装备股份有限公司 Heating device for silicon carbide crystal growth
CN114855284A (en) * 2022-04-06 2022-08-05 上海新昇半导体科技有限公司 Method for growing monocrystalline silicon
CN115542865A (en) * 2022-11-24 2022-12-30 杭州慧翔电液技术开发有限公司 Superconducting magnet automatic lifting field system and parameter control method
TWI812402B (en) * 2021-11-25 2023-08-11 大陸商西安奕斯偉材料科技股份有限公司 A kind of drawing method of single crystal silicon rod and single crystal silicon rod

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN85100591A (en) * 1985-04-01 1986-07-02 哈尔滨工业大学 Pulling single crystal silicon method and device thereof in the non-linear magnetic field
CN85106561A (en) * 1984-08-10 1987-03-25 株式会社东芝 Single-crystal growing apparatus
JPS6433093A (en) * 1987-07-28 1989-02-02 Toshiba Ceramics Co Device for pulling up single crystal
JP2001328895A (en) * 2000-05-18 2001-11-27 Sumitomo Electric Ind Ltd Method for producing single crystal and its producing device
CN1908249A (en) * 2005-07-27 2007-02-07 希特隆股份有限公司 A silicon single crystal ingot and wafer, growing apparatus and method thereof
CN1958875A (en) * 2006-09-28 2007-05-09 浙江理工大学 Equipment and method for drawing single article of semiconductor
CN101498032A (en) * 2008-01-21 2009-08-05 韩国矽得荣株式会社 Apparatus for manufacturing semiconductor single crystal ingot and method using the same
CN102076890A (en) * 2008-06-30 2011-05-25 Memc电子材料有限公司 Controlling a melt-solid interface shape of a growing silicon crystal using an unbalanced magnetic field and iso-rotation

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN85106561A (en) * 1984-08-10 1987-03-25 株式会社东芝 Single-crystal growing apparatus
CN85100591A (en) * 1985-04-01 1986-07-02 哈尔滨工业大学 Pulling single crystal silicon method and device thereof in the non-linear magnetic field
JPS6433093A (en) * 1987-07-28 1989-02-02 Toshiba Ceramics Co Device for pulling up single crystal
JP2001328895A (en) * 2000-05-18 2001-11-27 Sumitomo Electric Ind Ltd Method for producing single crystal and its producing device
CN1908249A (en) * 2005-07-27 2007-02-07 希特隆股份有限公司 A silicon single crystal ingot and wafer, growing apparatus and method thereof
CN1958875A (en) * 2006-09-28 2007-05-09 浙江理工大学 Equipment and method for drawing single article of semiconductor
CN101498032A (en) * 2008-01-21 2009-08-05 韩国矽得荣株式会社 Apparatus for manufacturing semiconductor single crystal ingot and method using the same
CN102076890A (en) * 2008-06-30 2011-05-25 Memc电子材料有限公司 Controlling a melt-solid interface shape of a growing silicon crystal using an unbalanced magnetic field and iso-rotation

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
夏国辉主编: "《新编电工手册》", 31 August 2001, 延边人民出版社 *

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI812402B (en) * 2021-11-25 2023-08-11 大陸商西安奕斯偉材料科技股份有限公司 A kind of drawing method of single crystal silicon rod and single crystal silicon rod
CN114411256A (en) * 2021-12-31 2022-04-29 南京晶升装备股份有限公司 Heating device for silicon carbide crystal growth
CN114411256B (en) * 2021-12-31 2023-11-10 南京晶升装备股份有限公司 Heating device for silicon carbide crystal growth
CN114855284A (en) * 2022-04-06 2022-08-05 上海新昇半导体科技有限公司 Method for growing monocrystalline silicon
CN115542865A (en) * 2022-11-24 2022-12-30 杭州慧翔电液技术开发有限公司 Superconducting magnet automatic lifting field system and parameter control method

Similar Documents

Publication Publication Date Title
CN101133193B (en) Controlling melt-solid interface shape of a growing silicon crystal using a variable magnetic field
CN109811403A (en) A kind of crystal pulling system and crystal pulling method
KR100848435B1 (en) Method and apparatus for growing silicon crystal by controlling melt-solid interface shape as a function of axial length
JP2008531444A (en) A system for continuous growth in single crystal silicon.
CN104583467A (en) Silicon single crystal growing device and method of growing same
JP5789676B2 (en) Resistance heating sapphire single crystal ingot growth apparatus and method of manufacturing resistance heating sapphire single crystal ingot
KR20120070080A (en) Single crystal growth device
JP5731349B2 (en) A system for continuous growth in single crystal silicon.
TW200305664A (en) Method for producing silicon single crystal and, silicon single crystal and silicon wafer
CN110629283A (en) Silicon single crystal growth method
CN109811402A (en) A kind of crystal pulling system and crystal pulling method
CN109963967A (en) The manufacturing method of compound semiconductor and compound semiconductor single crystal
CN111101195A (en) Crystal growth method of monocrystalline silicon crystal bar
CN103774210A (en) Equipment and method for producing crystal by vertical boat method
KR101271649B1 (en) Manufacturing method of high quality multicrystalline silicon ingot using monocrystalline silicon seed
KR101675903B1 (en) Apparatus and method for manufacturing semiconductor single crystal
Bliss et al. MLEK crystal growth of (100) indium phosphide
KR100991088B1 (en) Apparatus and Method for manufacturing semiconductor single crystal ingot using CUSP magnetic field
KR101292703B1 (en) Apparatus for single crystal growth
CN114855284A (en) Method for growing monocrystalline silicon
TWI310058B (en)
JP4899608B2 (en) Semiconductor single crystal manufacturing apparatus and manufacturing method
CN108796603B (en) Process method for Czochralski single crystal complementary doping alloy
JP2009292702A (en) Method for growing silicon single crystal
KR100869940B1 (en) Method of manufacturing silicon single crystal ingot

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
RJ01 Rejection of invention patent application after publication
RJ01 Rejection of invention patent application after publication

Application publication date: 20190528