CN109799680A - Chemical amplification positive photosensitive resin composition and its application - Google Patents
Chemical amplification positive photosensitive resin composition and its application Download PDFInfo
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- CN109799680A CN109799680A CN201811343915.7A CN201811343915A CN109799680A CN 109799680 A CN109799680 A CN 109799680A CN 201811343915 A CN201811343915 A CN 201811343915A CN 109799680 A CN109799680 A CN 109799680A
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- acid
- resin composition
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- 239000000126 substance Substances 0.000 title claims abstract description 63
- 230000003321 amplification Effects 0.000 title claims abstract description 60
- 238000003199 nucleic acid amplification method Methods 0.000 title claims abstract description 60
- 239000011342 resin composition Substances 0.000 title claims abstract description 59
- -1 polyoxy Polymers 0.000 claims abstract description 244
- 125000000217 alkyl group Chemical group 0.000 claims abstract description 78
- 229920005989 resin Polymers 0.000 claims abstract description 78
- 239000011347 resin Substances 0.000 claims abstract description 78
- 239000000178 monomer Substances 0.000 claims abstract description 53
- 239000000203 mixture Substances 0.000 claims abstract description 44
- 230000015572 biosynthetic process Effects 0.000 claims abstract description 34
- 239000000758 substrate Substances 0.000 claims abstract description 30
- 238000004519 manufacturing process Methods 0.000 claims abstract description 18
- 239000002904 solvent Substances 0.000 claims abstract description 16
- 238000009713 electroplating Methods 0.000 claims abstract description 14
- 229920003986 novolac Polymers 0.000 claims abstract description 13
- 150000004292 cyclic ethers Chemical group 0.000 claims abstract description 6
- 229910052799 carbon Inorganic materials 0.000 claims description 85
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 80
- 239000002253 acid Substances 0.000 claims description 37
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 claims description 33
- MWPLVEDNUUSJAV-UHFFFAOYSA-N anthracene Natural products C1=CC=CC2=CC3=CC=CC=C3C=C21 MWPLVEDNUUSJAV-UHFFFAOYSA-N 0.000 claims description 32
- 125000004435 hydrogen atom Chemical group [H]* 0.000 claims description 27
- 229910052751 metal Inorganic materials 0.000 claims description 19
- 239000002184 metal Substances 0.000 claims description 19
- 125000003118 aryl group Chemical group 0.000 claims description 15
- 239000003795 chemical substances by application Substances 0.000 claims description 13
- 150000002430 hydrocarbons Chemical group 0.000 claims description 12
- 230000002285 radioactive effect Effects 0.000 claims description 8
- 238000007747 plating Methods 0.000 claims description 7
- 238000002156 mixing Methods 0.000 claims description 6
- 150000001721 carbon Chemical group 0.000 claims description 5
- 125000000962 organic group Chemical group 0.000 claims description 5
- 238000011161 development Methods 0.000 claims description 3
- JEIPFZHSYJVQDO-UHFFFAOYSA-N iron(III) oxide Inorganic materials O=[Fe]O[Fe]=O JEIPFZHSYJVQDO-UHFFFAOYSA-N 0.000 claims description 3
- 238000003475 lamination Methods 0.000 claims description 3
- 229920002120 photoresistant polymer Polymers 0.000 abstract description 43
- 230000035945 sensitivity Effects 0.000 abstract description 14
- CERQOIWHTDAKMF-UHFFFAOYSA-N alpha-methacrylic acid Natural products CC(=C)C(O)=O CERQOIWHTDAKMF-UHFFFAOYSA-N 0.000 description 39
- UHOVQNZJYSORNB-UHFFFAOYSA-N monobenzene Natural products C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 description 35
- 150000001875 compounds Chemical class 0.000 description 31
- 238000000034 method Methods 0.000 description 30
- 150000002148 esters Chemical class 0.000 description 29
- ISWSIDIOOBJBQZ-UHFFFAOYSA-N Phenol Chemical compound OC1=CC=CC=C1 ISWSIDIOOBJBQZ-UHFFFAOYSA-N 0.000 description 22
- LYCAIKOWRPUZTN-UHFFFAOYSA-N Ethylene glycol Chemical compound OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 20
- 229910052731 fluorine Inorganic materials 0.000 description 20
- NIXOWILDQLNWCW-UHFFFAOYSA-N 2-Propenoic acid Natural products OC(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 18
- NIXOWILDQLNWCW-UHFFFAOYSA-M Acrylate Chemical compound [O-]C(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-M 0.000 description 18
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 18
- 238000003786 synthesis reaction Methods 0.000 description 18
- MTHSVFCYNBDYFN-UHFFFAOYSA-N diethylene glycol Substances OCCOCCO MTHSVFCYNBDYFN-UHFFFAOYSA-N 0.000 description 16
- 229920002554 vinyl polymer Polymers 0.000 description 16
- 125000000484 butyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 15
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 15
- JYEUMXHLPRZUAT-UHFFFAOYSA-N 1,2,3-triazine Chemical compound C1=CN=NN=C1 JYEUMXHLPRZUAT-UHFFFAOYSA-N 0.000 description 14
- 239000004593 Epoxy Substances 0.000 description 14
- 125000001153 fluoro group Chemical group F* 0.000 description 14
- 125000003866 trichloromethyl group Chemical group ClC(Cl)(Cl)* 0.000 description 14
- SMZOUWXMTYCWNB-UHFFFAOYSA-N 2-(2-methoxy-5-methylphenyl)ethanamine Chemical compound COC1=CC=C(C)C=C1CCN SMZOUWXMTYCWNB-UHFFFAOYSA-N 0.000 description 13
- DNIAPMSPPWPWGF-UHFFFAOYSA-N Propylene glycol Chemical compound CC(O)CO DNIAPMSPPWPWGF-UHFFFAOYSA-N 0.000 description 13
- IAYPIBMASNFSPL-UHFFFAOYSA-N Ethylene oxide Chemical compound C1CO1 IAYPIBMASNFSPL-UHFFFAOYSA-N 0.000 description 12
- UFWIBTONFRDIAS-UHFFFAOYSA-N Naphthalene Chemical compound C1=CC=CC2=CC=CC=C21 UFWIBTONFRDIAS-UHFFFAOYSA-N 0.000 description 12
- FKRCODPIKNYEAC-UHFFFAOYSA-N ethyl propionate Chemical compound CCOC(=O)CC FKRCODPIKNYEAC-UHFFFAOYSA-N 0.000 description 12
- 150000001450 anions Chemical class 0.000 description 11
- 229960003742 phenol Drugs 0.000 description 11
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 10
- MUBZPKHOEPUJKR-UHFFFAOYSA-N Oxalic acid Chemical compound OC(=O)C(O)=O MUBZPKHOEPUJKR-UHFFFAOYSA-N 0.000 description 10
- 239000000654 additive Substances 0.000 description 10
- 150000001335 aliphatic alkanes Chemical group 0.000 description 10
- RTZKZFJDLAIYFH-UHFFFAOYSA-N ether Substances CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 10
- BDAGIHXWWSANSR-UHFFFAOYSA-N methanoic acid Natural products OC=O BDAGIHXWWSANSR-UHFFFAOYSA-N 0.000 description 10
- DCKVNWZUADLDEH-UHFFFAOYSA-N sec-butyl acetate Chemical compound CCC(C)OC(C)=O DCKVNWZUADLDEH-UHFFFAOYSA-N 0.000 description 10
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 description 9
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 9
- 230000000996 additive effect Effects 0.000 description 9
- 125000003545 alkoxy group Chemical group 0.000 description 9
- 230000008859 change Effects 0.000 description 9
- GOOHAUXETOMSMM-UHFFFAOYSA-N Propylene oxide Chemical compound CC1CO1 GOOHAUXETOMSMM-UHFFFAOYSA-N 0.000 description 8
- 238000006243 chemical reaction Methods 0.000 description 8
- 239000007788 liquid Substances 0.000 description 8
- 150000002790 naphthalenes Chemical class 0.000 description 8
- WQGWDDDVZFFDIG-UHFFFAOYSA-N pyrogallol Chemical compound OC1=CC=CC(O)=C1O WQGWDDDVZFFDIG-UHFFFAOYSA-N 0.000 description 8
- 125000002023 trifluoromethyl group Chemical group FC(F)(F)* 0.000 description 8
- 150000001336 alkenes Chemical class 0.000 description 7
- 125000002091 cationic group Chemical group 0.000 description 7
- 230000000052 comparative effect Effects 0.000 description 7
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 7
- 150000002825 nitriles Chemical group 0.000 description 7
- 125000000538 pentafluorophenyl group Chemical group FC1=C(F)C(F)=C(*)C(F)=C1F 0.000 description 7
- 238000006116 polymerization reaction Methods 0.000 description 7
- 125000001424 substituent group Chemical group 0.000 description 7
- RWSOTUBLDIXVET-UHFFFAOYSA-O sulfonium group Chemical group [SH3+] RWSOTUBLDIXVET-UHFFFAOYSA-O 0.000 description 7
- ZWEHNKRNPOVVGH-UHFFFAOYSA-N 2-Butanone Chemical compound CCC(C)=O ZWEHNKRNPOVVGH-UHFFFAOYSA-N 0.000 description 6
- XEKOWRVHYACXOJ-UHFFFAOYSA-N Ethyl acetate Chemical compound CCOC(C)=O XEKOWRVHYACXOJ-UHFFFAOYSA-N 0.000 description 6
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 description 6
- WSFSSNUMVMOOMR-UHFFFAOYSA-N Formaldehyde Chemical compound O=C WSFSSNUMVMOOMR-UHFFFAOYSA-N 0.000 description 6
- 229910052801 chlorine Inorganic materials 0.000 description 6
- 125000000113 cyclohexyl group Chemical group [H]C1([H])C([H])([H])C([H])([H])C([H])(*)C([H])([H])C1([H])[H] 0.000 description 6
- 235000019441 ethanol Nutrition 0.000 description 6
- LZCLXQDLBQLTDK-UHFFFAOYSA-N ethyl 2-hydroxypropanoate Chemical compound CCOC(=O)C(C)O LZCLXQDLBQLTDK-UHFFFAOYSA-N 0.000 description 6
- 239000011737 fluorine Substances 0.000 description 6
- 125000004356 hydroxy functional group Chemical group O* 0.000 description 6
- 238000003384 imaging method Methods 0.000 description 6
- MGFYSGNNHQQTJW-UHFFFAOYSA-N iodonium Chemical compound [IH2+] MGFYSGNNHQQTJW-UHFFFAOYSA-N 0.000 description 6
- 150000002500 ions Chemical class 0.000 description 6
- 125000001449 isopropyl group Chemical group [H]C([H])([H])C([H])(*)C([H])([H])[H] 0.000 description 6
- RLSSMJSEOOYNOY-UHFFFAOYSA-N m-cresol Chemical compound CC1=CC=CC(O)=C1 RLSSMJSEOOYNOY-UHFFFAOYSA-N 0.000 description 6
- IWDCLRJOBJJRNH-UHFFFAOYSA-N p-cresol Chemical compound CC1=CC=C(O)C=C1 IWDCLRJOBJJRNH-UHFFFAOYSA-N 0.000 description 6
- XNGIFLGASWRNHJ-UHFFFAOYSA-N phthalic acid Chemical compound OC(=O)C1=CC=CC=C1C(O)=O XNGIFLGASWRNHJ-UHFFFAOYSA-N 0.000 description 6
- 150000003839 salts Chemical class 0.000 description 6
- FKTXDTWDCPTPHK-UHFFFAOYSA-N 1,1,1,2,3,3,3-heptafluoropropane Chemical compound FC(F)(F)[C](F)C(F)(F)F FKTXDTWDCPTPHK-UHFFFAOYSA-N 0.000 description 5
- OSWFIVFLDKOXQC-UHFFFAOYSA-N 4-(3-methoxyphenyl)aniline Chemical compound COC1=CC=CC(C=2C=CC(N)=CC=2)=C1 OSWFIVFLDKOXQC-UHFFFAOYSA-N 0.000 description 5
- 125000004172 4-methoxyphenyl group Chemical group [H]C1=C([H])C(OC([H])([H])[H])=C([H])C([H])=C1* 0.000 description 5
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 5
- 150000008065 acid anhydrides Chemical class 0.000 description 5
- ORILYTVJVMAKLC-UHFFFAOYSA-N adamantane Chemical compound C1C(C2)CC3CC1CC2C3 ORILYTVJVMAKLC-UHFFFAOYSA-N 0.000 description 5
- 239000007864 aqueous solution Substances 0.000 description 5
- 239000000460 chlorine Substances 0.000 description 5
- 229910052802 copper Inorganic materials 0.000 description 5
- 239000010949 copper Substances 0.000 description 5
- SBZXBUIDTXKZTM-UHFFFAOYSA-N diglyme Chemical compound COCCOCCOC SBZXBUIDTXKZTM-UHFFFAOYSA-N 0.000 description 5
- 238000011156 evaluation Methods 0.000 description 5
- 235000019253 formic acid Nutrition 0.000 description 5
- FUZZWVXGSFPDMH-UHFFFAOYSA-N hexanoic acid Chemical compound CCCCCC(O)=O FUZZWVXGSFPDMH-UHFFFAOYSA-N 0.000 description 5
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 5
- 229940017219 methyl propionate Drugs 0.000 description 5
- 229910052757 nitrogen Inorganic materials 0.000 description 5
- JRZJOMJEPLMPRA-UHFFFAOYSA-N olefin Natural products CCCCCCCC=C JRZJOMJEPLMPRA-UHFFFAOYSA-N 0.000 description 5
- 125000001820 oxy group Chemical group [*:1]O[*:2] 0.000 description 5
- 125000001436 propyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])[H] 0.000 description 5
- 229960004063 propylene glycol Drugs 0.000 description 5
- 235000013772 propylene glycol Nutrition 0.000 description 5
- WBYWAXJHAXSJNI-VOTSOKGWSA-M .beta-Phenylacrylic acid Natural products [O-]C(=O)\C=C\C1=CC=CC=C1 WBYWAXJHAXSJNI-VOTSOKGWSA-M 0.000 description 4
- GJYCVCVHRSWLNY-UHFFFAOYSA-N 2-butylphenol Chemical compound CCCCC1=CC=CC=C1O GJYCVCVHRSWLNY-UHFFFAOYSA-N 0.000 description 4
- YCOXTKKNXUZSKD-UHFFFAOYSA-N 3,4-xylenol Chemical compound CC1=CC=C(O)C=C1C YCOXTKKNXUZSKD-UHFFFAOYSA-N 0.000 description 4
- NPDACUSDTOMAMK-UHFFFAOYSA-N 4-Chlorotoluene Chemical compound CC1=CC=C(Cl)C=C1 NPDACUSDTOMAMK-UHFFFAOYSA-N 0.000 description 4
- KAKZBPTYRLMSJV-UHFFFAOYSA-N Butadiene Chemical compound C=CC=C KAKZBPTYRLMSJV-UHFFFAOYSA-N 0.000 description 4
- ZAMOUSCENKQFHK-UHFFFAOYSA-N Chlorine atom Chemical compound [Cl] ZAMOUSCENKQFHK-UHFFFAOYSA-N 0.000 description 4
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Natural products CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 4
- VZCYOOQTPOCHFL-OWOJBTEDSA-N Fumaric acid Chemical compound OC(=O)\C=C\C(O)=O VZCYOOQTPOCHFL-OWOJBTEDSA-N 0.000 description 4
- RRHGJUQNOFWUDK-UHFFFAOYSA-N Isoprene Chemical compound CC(=C)C=C RRHGJUQNOFWUDK-UHFFFAOYSA-N 0.000 description 4
- BAPJBEWLBFYGME-UHFFFAOYSA-N Methyl acrylate Chemical compound COC(=O)C=C BAPJBEWLBFYGME-UHFFFAOYSA-N 0.000 description 4
- CTQNGGLPUBDAKN-UHFFFAOYSA-N O-Xylene Chemical compound CC1=CC=CC=C1C CTQNGGLPUBDAKN-UHFFFAOYSA-N 0.000 description 4
- 239000002202 Polyethylene glycol Substances 0.000 description 4
- KDYFGRWQOYBRFD-UHFFFAOYSA-N Succinic acid Natural products OC(=O)CCC(O)=O KDYFGRWQOYBRFD-UHFFFAOYSA-N 0.000 description 4
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- 125000003670 adamantan-2-yl group Chemical group [H]C1([H])C(C2([H])[H])([H])C([H])([H])C3([H])C([*])([H])C1([H])C([H])([H])C2([H])C3([H])[H] 0.000 description 4
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- NEHMKBQYUWJMIP-UHFFFAOYSA-N chloromethane Chemical class ClC NEHMKBQYUWJMIP-UHFFFAOYSA-N 0.000 description 4
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- 229930016911 cinnamic acid Natural products 0.000 description 4
- 238000000576 coating method Methods 0.000 description 4
- 239000000470 constituent Substances 0.000 description 4
- QSAWQNUELGIYBC-UHFFFAOYSA-N cyclohexane-1,2-dicarboxylic acid Chemical compound OC(=O)C1CCCCC1C(O)=O QSAWQNUELGIYBC-UHFFFAOYSA-N 0.000 description 4
- JHIVVAPYMSGYDF-UHFFFAOYSA-N cyclohexanone Chemical compound O=C1CCCCC1 JHIVVAPYMSGYDF-UHFFFAOYSA-N 0.000 description 4
- 238000009792 diffusion process Methods 0.000 description 4
- 238000005516 engineering process Methods 0.000 description 4
- XYIBRDXRRQCHLP-UHFFFAOYSA-N ethyl acetoacetate Chemical compound CCOC(=O)CC(C)=O XYIBRDXRRQCHLP-UHFFFAOYSA-N 0.000 description 4
- 229910052736 halogen Inorganic materials 0.000 description 4
- 150000002367 halogens Chemical class 0.000 description 4
- 238000010438 heat treatment Methods 0.000 description 4
- WBYWAXJHAXSJNI-UHFFFAOYSA-N methyl p-hydroxycinnamate Natural products OC(=O)C=CC1=CC=CC=C1 WBYWAXJHAXSJNI-UHFFFAOYSA-N 0.000 description 4
- 238000004806 packaging method and process Methods 0.000 description 4
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- 238000002360 preparation method Methods 0.000 description 4
- 238000012545 processing Methods 0.000 description 4
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- 241000894007 species Species 0.000 description 4
- 238000006467 substitution reaction Methods 0.000 description 4
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- 238000010792 warming Methods 0.000 description 4
- RMSGQZDGSZOJMU-UHFFFAOYSA-N 1-butyl-2-phenylbenzene Chemical group CCCCC1=CC=CC=C1C1=CC=CC=C1 RMSGQZDGSZOJMU-UHFFFAOYSA-N 0.000 description 3
- UHOPWFKONJYLCF-UHFFFAOYSA-N 2-(2-sulfanylethyl)isoindole-1,3-dione Chemical compound C1=CC=C2C(=O)N(CCS)C(=O)C2=C1 UHOPWFKONJYLCF-UHFFFAOYSA-N 0.000 description 3
- JAHNSTQSQJOJLO-UHFFFAOYSA-N 2-(3-fluorophenyl)-1h-imidazole Chemical compound FC1=CC=CC(C=2NC=CN=2)=C1 JAHNSTQSQJOJLO-UHFFFAOYSA-N 0.000 description 3
- ZCYVEMRRCGMTRW-UHFFFAOYSA-N 7553-56-2 Chemical group [I] ZCYVEMRRCGMTRW-UHFFFAOYSA-N 0.000 description 3
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- 150000001491 aromatic compounds Chemical class 0.000 description 3
- JXLHNMVSKXFWAO-UHFFFAOYSA-N azane;7-fluoro-2,1,3-benzoxadiazole-4-sulfonic acid Chemical compound N.OS(=O)(=O)C1=CC=C(F)C2=NON=C12 JXLHNMVSKXFWAO-UHFFFAOYSA-N 0.000 description 3
- KDYFGRWQOYBRFD-NUQCWPJISA-N butanedioic acid Chemical compound O[14C](=O)CC[14C](O)=O KDYFGRWQOYBRFD-NUQCWPJISA-N 0.000 description 3
- 239000011248 coating agent Substances 0.000 description 3
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- 125000000118 dimethyl group Chemical group [H]C([H])([H])* 0.000 description 3
- LTYMSROWYAPPGB-UHFFFAOYSA-O diphenylsulfanium Chemical compound C=1C=CC=CC=1[SH+]C1=CC=CC=C1 LTYMSROWYAPPGB-UHFFFAOYSA-O 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 235000008434 ginseng Nutrition 0.000 description 3
- WGCNASOHLSPBMP-UHFFFAOYSA-N hydroxyacetaldehyde Natural products OCC=O WGCNASOHLSPBMP-UHFFFAOYSA-N 0.000 description 3
- 239000004615 ingredient Substances 0.000 description 3
- 229910052740 iodine Inorganic materials 0.000 description 3
- 150000002576 ketones Chemical class 0.000 description 3
- 125000005647 linker group Chemical group 0.000 description 3
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 3
- LVHBHZANLOWSRM-UHFFFAOYSA-N methylenebutanedioic acid Natural products OC(=O)CC(=C)C(O)=O LVHBHZANLOWSRM-UHFFFAOYSA-N 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
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- YKYONYBAUNKHLG-UHFFFAOYSA-N n-Propyl acetate Natural products CCCOC(C)=O YKYONYBAUNKHLG-UHFFFAOYSA-N 0.000 description 3
- 125000000449 nitro group Chemical group [O-][N+](*)=O 0.000 description 3
- LQNUZADURLCDLV-UHFFFAOYSA-N nitrobenzene Substances [O-][N+](=O)C1=CC=CC=C1 LQNUZADURLCDLV-UHFFFAOYSA-N 0.000 description 3
- 239000003960 organic solvent Substances 0.000 description 3
- 235000006408 oxalic acid Nutrition 0.000 description 3
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- 125000005395 methacrylic acid group Chemical class 0.000 description 1
- DKJCSMHIPYRALV-UHFFFAOYSA-N methoxymethyl propanoate Chemical compound CCC(=O)OCOC DKJCSMHIPYRALV-UHFFFAOYSA-N 0.000 description 1
- BKFQHFFZHGUTEZ-UHFFFAOYSA-N methyl 2-butoxyacetate Chemical class CCCCOCC(=O)OC BKFQHFFZHGUTEZ-UHFFFAOYSA-N 0.000 description 1
- PPFNAOBWGRMDLL-UHFFFAOYSA-N methyl 2-ethoxyacetate Chemical class CCOCC(=O)OC PPFNAOBWGRMDLL-UHFFFAOYSA-N 0.000 description 1
- GSJFXBNYJCXDGI-UHFFFAOYSA-N methyl 2-hydroxyacetate Chemical class COC(=O)CO GSJFXBNYJCXDGI-UHFFFAOYSA-N 0.000 description 1
- 229940057867 methyl lactate Drugs 0.000 description 1
- XTBFPVLHGVYOQH-UHFFFAOYSA-N methyl phenyl carbonate Chemical compound COC(=O)OC1=CC=CC=C1 XTBFPVLHGVYOQH-UHFFFAOYSA-N 0.000 description 1
- CWKLZLBVOJRSOM-UHFFFAOYSA-N methyl pyruvate Chemical compound COC(=O)C(C)=O CWKLZLBVOJRSOM-UHFFFAOYSA-N 0.000 description 1
- PQIOSYKVBBWRRI-UHFFFAOYSA-N methylphosphonyl difluoride Chemical group CP(F)(F)=O PQIOSYKVBBWRRI-UHFFFAOYSA-N 0.000 description 1
- 150000002763 monocarboxylic acids Chemical class 0.000 description 1
- ZWRUINPWMLAQRD-UHFFFAOYSA-N n-Nonyl alcohol Natural products CCCCCCCCCO ZWRUINPWMLAQRD-UHFFFAOYSA-N 0.000 description 1
- QYZFTMMPKCOTAN-UHFFFAOYSA-N n-[2-(2-hydroxyethylamino)ethyl]-2-[[1-[2-(2-hydroxyethylamino)ethylamino]-2-methyl-1-oxopropan-2-yl]diazenyl]-2-methylpropanamide Chemical compound OCCNCCNC(=O)C(C)(C)N=NC(C)(C)C(=O)NCCNCCO QYZFTMMPKCOTAN-UHFFFAOYSA-N 0.000 description 1
- GNVRJGIVDSQCOP-UHFFFAOYSA-N n-ethyl-n-methylethanamine Chemical compound CCN(C)CC GNVRJGIVDSQCOP-UHFFFAOYSA-N 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 125000004433 nitrogen atom Chemical group N* 0.000 description 1
- QJGQUHMNIGDVPM-UHFFFAOYSA-N nitrogen group Chemical group [N] QJGQUHMNIGDVPM-UHFFFAOYSA-N 0.000 description 1
- 125000001400 nonyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- BKIMMITUMNQMOS-UHFFFAOYSA-N normal nonane Natural products CCCCCCCCC BKIMMITUMNQMOS-UHFFFAOYSA-N 0.000 description 1
- QWVGKYWNOKOFNN-UHFFFAOYSA-N o-cresol Chemical class CC1=CC=CC=C1O QWVGKYWNOKOFNN-UHFFFAOYSA-N 0.000 description 1
- SUSQOBVLVYHIEX-UHFFFAOYSA-N o-phenylene-diaceto-nitrile Natural products N#CCC1=CC=CC=C1 SUSQOBVLVYHIEX-UHFFFAOYSA-N 0.000 description 1
- AHHWIHXENZJRFG-UHFFFAOYSA-N oxetane Chemical compound C1COC1 AHHWIHXENZJRFG-UHFFFAOYSA-N 0.000 description 1
- JCGNDDUYTRNOFT-UHFFFAOYSA-N oxolane-2,4-dione Chemical compound O=C1COC(=O)C1 JCGNDDUYTRNOFT-UHFFFAOYSA-N 0.000 description 1
- NWVVVBRKAWDGAB-UHFFFAOYSA-N p-methoxyphenol Chemical compound COC1=CC=C(O)C=C1 NWVVVBRKAWDGAB-UHFFFAOYSA-N 0.000 description 1
- FXLOVSHXALFLKQ-UHFFFAOYSA-N p-tolualdehyde Chemical compound CC1=CC=C(C=O)C=C1 FXLOVSHXALFLKQ-UHFFFAOYSA-N 0.000 description 1
- 238000012856 packing Methods 0.000 description 1
- FJKROLUGYXJWQN-UHFFFAOYSA-N papa-hydroxy-benzoic acid Natural products OC(=O)C1=CC=C(O)C=C1 FJKROLUGYXJWQN-UHFFFAOYSA-N 0.000 description 1
- QNGNSVIICDLXHT-UHFFFAOYSA-N para-ethylbenzaldehyde Natural products CCC1=CC=C(C=O)C=C1 QNGNSVIICDLXHT-UHFFFAOYSA-N 0.000 description 1
- 125000005010 perfluoroalkyl group Chemical group 0.000 description 1
- GQDSSPVCELQEFY-UHFFFAOYSA-N phenol;1,4-xylene Chemical compound OC1=CC=CC=C1.CC1=CC=C(C)C=C1 GQDSSPVCELQEFY-UHFFFAOYSA-N 0.000 description 1
- QIWKUEJZZCOPFV-UHFFFAOYSA-N phenyl 2-methylprop-2-enoate Chemical class CC(=C)C(=O)OC1=CC=CC=C1 QIWKUEJZZCOPFV-UHFFFAOYSA-N 0.000 description 1
- WVDDGKGOMKODPV-ZQBYOMGUSA-N phenyl(114C)methanol Chemical compound O[14CH2]C1=CC=CC=C1 WVDDGKGOMKODPV-ZQBYOMGUSA-N 0.000 description 1
- 229940100595 phenylacetaldehyde Drugs 0.000 description 1
- RMVRSNDYEFQCLF-UHFFFAOYSA-O phenylsulfanium Chemical compound [SH2+]C1=CC=CC=C1 RMVRSNDYEFQCLF-UHFFFAOYSA-O 0.000 description 1
- 150000003053 piperidines Chemical class 0.000 description 1
- 229960005235 piperonyl butoxide Drugs 0.000 description 1
- 229920001515 polyalkylene glycol Polymers 0.000 description 1
- 238000006068 polycondensation reaction Methods 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 229920000573 polyethylene Polymers 0.000 description 1
- 239000003505 polymerization initiator Substances 0.000 description 1
- 150000008442 polyphenolic compounds Polymers 0.000 description 1
- 229920001296 polysiloxane Polymers 0.000 description 1
- 229920002689 polyvinyl acetate Polymers 0.000 description 1
- 239000011118 polyvinyl acetate Substances 0.000 description 1
- 229920002451 polyvinyl alcohol Polymers 0.000 description 1
- 239000004800 polyvinyl chloride Substances 0.000 description 1
- 229920000036 polyvinylpyrrolidone Polymers 0.000 description 1
- 239000001267 polyvinylpyrrolidone Substances 0.000 description 1
- 235000013855 polyvinylpyrrolidone Nutrition 0.000 description 1
- KCXFHTAICRTXLI-UHFFFAOYSA-N propane-1-sulfonic acid Chemical compound CCCS(O)(=O)=O KCXFHTAICRTXLI-UHFFFAOYSA-N 0.000 description 1
- CIBMHJPPKCXONB-UHFFFAOYSA-N propane-2,2-diol Chemical compound CC(C)(O)O CIBMHJPPKCXONB-UHFFFAOYSA-N 0.000 description 1
- 235000019260 propionic acid Nutrition 0.000 description 1
- ADOFEJQZDCWAIL-UHFFFAOYSA-N propyl 2-ethoxyacetate Chemical compound CCCOC(=O)COCC ADOFEJQZDCWAIL-UHFFFAOYSA-N 0.000 description 1
- ILVGAIQLOCKNQA-UHFFFAOYSA-N propyl 2-hydroxypropanoate Chemical compound CCCOC(=O)C(C)O ILVGAIQLOCKNQA-UHFFFAOYSA-N 0.000 description 1
- 125000001725 pyrenyl group Chemical group 0.000 description 1
- 150000003233 pyrroles Chemical class 0.000 description 1
- IUVKMZGDUIUOCP-BTNSXGMBSA-N quinbolone Chemical compound O([C@H]1CC[C@H]2[C@H]3[C@@H]([C@]4(C=CC(=O)C=C4CC3)C)CC[C@@]21C)C1=CCCC1 IUVKMZGDUIUOCP-BTNSXGMBSA-N 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 150000003254 radicals Chemical class 0.000 description 1
- 230000003252 repetitive effect Effects 0.000 description 1
- 125000006413 ring segment Chemical group 0.000 description 1
- 229960004889 salicylic acid Drugs 0.000 description 1
- 229930195734 saturated hydrocarbon Natural products 0.000 description 1
- 238000000790 scattering method Methods 0.000 description 1
- 238000007650 screen-printing Methods 0.000 description 1
- 229910000029 sodium carbonate Inorganic materials 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 238000004528 spin coating Methods 0.000 description 1
- 239000001384 succinic acid Substances 0.000 description 1
- 229940014800 succinic anhydride Drugs 0.000 description 1
- 150000005846 sugar alcohols Polymers 0.000 description 1
- VACCAVUAMIDAGB-UHFFFAOYSA-N sulfamethizole Chemical compound S1C(C)=NN=C1NS(=O)(=O)C1=CC=C(N)C=C1 VACCAVUAMIDAGB-UHFFFAOYSA-N 0.000 description 1
- 125000000475 sulfinyl group Chemical group [*:2]S([*:1])=O 0.000 description 1
- 125000000020 sulfo group Chemical group O=S(=O)([*])O[H] 0.000 description 1
- BDHFUVZGWQCTTF-UHFFFAOYSA-N sulfonic acid Chemical compound OS(=O)=O BDHFUVZGWQCTTF-UHFFFAOYSA-N 0.000 description 1
- 150000003459 sulfonic acid esters Chemical class 0.000 description 1
- 229910052717 sulfur Inorganic materials 0.000 description 1
- 125000004434 sulfur atom Chemical group 0.000 description 1
- 229920003002 synthetic resin Polymers 0.000 description 1
- 239000000057 synthetic resin Substances 0.000 description 1
- JMSVCTWVEWCHDZ-UHFFFAOYSA-N syringic acid Chemical class COC1=CC(C(O)=O)=CC(OC)=C1O JMSVCTWVEWCHDZ-UHFFFAOYSA-N 0.000 description 1
- 125000006158 tetracarboxylic acid group Chemical group 0.000 description 1
- 229940073455 tetraethylammonium hydroxide Drugs 0.000 description 1
- LRGJRHZIDJQFCL-UHFFFAOYSA-M tetraethylazanium;hydroxide Chemical compound [OH-].CC[N+](CC)(CC)CC LRGJRHZIDJQFCL-UHFFFAOYSA-M 0.000 description 1
- 125000002813 thiocarbonyl group Chemical group *C(*)=S 0.000 description 1
- 125000003396 thiol group Chemical class [H]S* 0.000 description 1
- 229930192474 thiophene Natural products 0.000 description 1
- YRHRIQCWCFGUEQ-UHFFFAOYSA-N thioxanthen-9-one Chemical compound C1=CC=C2C(=O)C3=CC=CC=C3SC2=C1 YRHRIQCWCFGUEQ-UHFFFAOYSA-N 0.000 description 1
- 125000002088 tosyl group Chemical group [H]C1=C([H])C(=C([H])C([H])=C1C([H])([H])[H])S(*)(=O)=O 0.000 description 1
- JLGLQAWTXXGVEM-UHFFFAOYSA-N triethylene glycol monomethyl ether Chemical compound COCCOCCOCCO JLGLQAWTXXGVEM-UHFFFAOYSA-N 0.000 description 1
- XPDWGBQVDMORPB-UHFFFAOYSA-N trifluoromethane acid Natural products FC(F)F XPDWGBQVDMORPB-UHFFFAOYSA-N 0.000 description 1
- 239000012953 triphenylsulfonium Substances 0.000 description 1
- 125000004417 unsaturated alkyl group Chemical group 0.000 description 1
- 229940005605 valeric acid Drugs 0.000 description 1
- HGBOYTHUEUWSSQ-UHFFFAOYSA-N valeric aldehyde Natural products CCCCC=O HGBOYTHUEUWSSQ-UHFFFAOYSA-N 0.000 description 1
- 238000007794 visualization technique Methods 0.000 description 1
Landscapes
- Materials For Photolithography (AREA)
- Addition Polymer Or Copolymer, Post-Treatments, Or Chemical Modifications (AREA)
Abstract
The present invention provides the manufacturing method of a kind of chemical amplification positive photosensitive resin composition, the manufacturing method of substrate with mold and electroplating formation body.Chemical amplification positive photosensitive resin composition includes resin (A), novolac resin (B), photoacid generator (C) and solvent (D), wherein resin (A) includes resin (A-1) and resin (A-2), resin (A-1) is to be reacted by the first mixture and obtained, first mixture includes monomer (a-1-1) and monomer (a-1-2), and monomer (a-1-1) contains the structure such as formula (a-1-1a): monomer (a-1-2) contains cyclic ether group.Resin (A-2) is to be reacted by the second mixture and obtained, and the second mixture includes monomer (a-2-1), and monomer (a-2-1) stretches alkyl chain containing polyoxy.Chemical amplification positive photosensitive resin composition has good sensitivity, and it is formed by photoresist pattern with good rectangularity.
Description
Technical field
A kind of manufacture of substrate the invention relates to chemical amplification positive photosensitive resin composition, with mold
The manufacturing method of method and electroplating formation body, and in particular to a kind of photoresist pattern that can be used to form good rectangularity
The good chemical amplification positive photosensitive resin composition of sensitivity, by above-mentioned chemical amplification positive photosensitive resin composition
The manufacturing method of substrate obtained with mold, and the manufacture of the electroplating formation body as made from the above-mentioned substrate with mold
Method.
Background technique
Now, photoelectricity processing has become the mainstream of precise fine processing technology.Alleged " photoelectricity processing ", refers to and forms photoresist
Object is coated on machined object surface and forms photoresist layer, is patterned photoresist layer using photolithographic techniques, then with patterned
Photoresist layer (photoresist pattern) be that mask carries out chemical etching, electrolytic etching or electrical forming etc. based on being electroplated, to manufacture
The general name of the technology of the various precision components such as semiconductor package body.
Also, in recent years, with the miniaturization of electronic equipment, the high density packaging technique progress of semiconductor package body is quick,
And seek the spininess foot film assemblingization of packaging body, package body sizes miniaturization, adopt rewinding method two-dimentional package technique, three
Tie up the promotion of the packing density of package technique.In such high density packaging technique, such as: it will be for connecting towards prominent on packaging body
The projected electrode (assembling terminal) of convex block etc., the wiring again and assembling terminal that extend from the surrounding terminals on wafer metal column
Deng being configured to high precision on substrate, using as connection terminal.
If above-mentioned photoelectricity processing is using light resistance composition, as such light resistance composition, both having known has comprising acid generation
The chemical amplification type light resistance composition of agent (referring now to patent document 1,2 etc.).Chemical amplification type light resistance composition is by radiation
Line irradiates (exposure) and generates acid by acid producing agent, promotes the diffusion of acid by heat treatment, with the matrix resin in constituent
Etc. causing sour catalyst to react, and change its alkali-solubility person.
Such chemical amplification positive light resistance composition is to be used in the electricity such as the convex block or metal column of adopting coating step
Plate the formation etc. of formed body.Specifically, being formed on the supports such as metal substrate using chemical amplification type light resistance composition
The photoresist layer of desired film thickness is exposed across set mask pattern, images, and forms the photoresist figure used as template
Case, wherein being optionally removed (removing) predetermined part that form convex block or metal column.Thereafter, by plating in the removal
Partially in (non-photoresist portion) after the conductor of embedment copper etc., then surrounding photoresist pattern is removed, convex block or metal column can be formed.
However, amplification positive photosensitive resin composition documented by above-mentioned, sensitivity and it is formed by photoresist pattern
Rectangularity can not be received by dealer.Therefore, it is good and the good photoresist pattern of rectangularity can be formed how to provide a kind of sensitivity
Chemical amplification positive light resistance composition, actually current those skilled in the art want to solve the problems, such as.
Summary of the invention
Therefore, an aspect of the invention provides a kind of chemical amplification positive photosensitive resin composition, improves sense
Spend and be formed by the rectangularity of photoresist pattern.
Another aspect of the invention provides a kind of manufacturing method of substrate with mold, is increased using chemistry above-mentioned
Width type positive-type photosensitive resin composition, is made the mold to form electroplating formation body.
Another aspect of the invention provides a kind of manufacturing method of electroplating formation body, to the substrate for having aforementioned mold
It is electroplated, to form electroplating formation body in mold.
Above-mentioned aspect according to the present invention provides a kind of chemical amplification positive photosensitive resin composition first, until
Less include resin (A), novolac resin (B), photoacid generator (C) and solvent (D), following division it.
Resin (A)
Resin (A) of the invention includes resin (A-1) and resin (A-2).
Resin (A-1)
Resin (A-1) of the invention is to be reacted by one first mixture and obtained, which includes monomer (a-1-1)
And monomer (a-1-2).In one embodiment, monomer (a-1-1) includes the construction such as following formula (a-1-1a):
In formula (a-1-1a), R1aFor hydrogen atom or methyl, R2aFor low alkyl group and X3aWith the carbon atom being bonded
The hydrocarbon ring of carbon number 5 to 20 is collectively formed.
In above formula (a-1-1a), R2aThe low alkyl group of expression is straight-chain or branched, R2aFor example, methyl, ethyl,
The group of n- propyl, isopropyl, n- butyl, isobutyl group, the second butyl, third butyl, various amyls etc..If reaching high comparison
The advantage of degree, high-res, the depth of focus etc., and be preferable with the low alkyl group that carbon number is 2 to 4.
Furthermore X3aThe hydrocarbon ring of mononuclear type or polycyclic type that carbon number is 5 to 20 is formed with the carbon atom being bonded.Mononuclear type hydrocarbon
Ring may be, for example, pentamethylene, hexamethylene, cycloheptane, cyclooctane etc..Polycyclic type hydrocarbon ring may be, for example, two ring-like hydrocarbon rings, tricyclic hydrocarbon
Ring, four ring-like hydrocarbon rings etc..Specifically, polycyclic type hydrocarbon ring may be, for example, adamantane, norbornane, isoborneol alkane, tristane,
Tetracyclododecane etc..In above-mentioned X3aIt is formed in the example for the hydrocarbon ring that carbon number is 5 to 20 with the carbon atom being bonded, and with hexamethylene
Alkane ring and adamantane ring are preferable.
The specific example of monomer (a-1-1) can be such as following formula (a-1-1b) to formula (a-1-1g) compound represented.
Monomer (a-1-1) can single use or mixing two kinds it is used above.
Total usage amount based on the first mixture is 100 parts by weight, and the content of monomer (a-1-1) is 10 parts by weight to 50 weights
Part is measured, preferably 10 parts by weight to 45 parts by weight, more preferably 10 parts by weight to 40 parts by weight are more preferably.
As unused monomer (a-1-1), the sensitivity of chemical amplification positive photosensitive resin composition is bad and institute's shape
At photoresist pattern rectangularity it is poor.
Monomer (a-1-2) of the invention contains cyclic ether group, can enumerate (methyl) Glycidyl Acrylate, (methyl) third
Olefin(e) acid -2- methyl polyglycidyl, (methyl) acrylic acid -3,4- epoxy butyl ester, (methyl) acrylic acid -6,7- epoxy heptyl ester, (first
Base) acrylic acid -3,4- epoxy cyclohexyl or (methyl) acrylic acid -3,4- epoxycyclohexanecarboxylate etc. three-membered ring's class;3- (first
Base) acryloyloxymethyl propylene oxide (3- [(meth) acryloyloxymethyl] oxetane), 3- (methyl) acryloyl-oxy
Methyl -3- ethyl propylene oxide, 3- (methyl) acryloyloxymethyl -2- methyloxetane, 3- (methyl) acryloyloxymethyl -
2- trifluoromethyl propylene oxide, 3- (methyl) acryloyloxymethyl -2- pentafluoroethyl group propylene oxide, 3- (methyl) acryloyl-oxy first
Base -2- phenyl propylene oxide, 3- (methyl) acryloyloxymethyl -2,2- difluoro propylene oxide, 3- (methyl) acryloyloxymethyl -
2,2,4- trifluoro-epoxy propanes, 3- (methyl) acryloyloxymethyl -2,2,4,4- tetrafluoro propylene oxide, 3- (methyl) acryloyl-oxy
Ethyl propylene oxide, 3- (methyl) acrylyl oxy-ethyl -3- ethyl propylene oxide, 2- ethyl -3- (methyl) acrylyl oxy-ethyl
Propylene oxide, 3- (methyl) acrylyl oxy-ethyl -2- trifluoromethyl propylene oxide, five fluorine of 3- (methyl) acrylyl oxy-ethyl -2-
Ethyl propylene oxide, 3- (methyl) acrylyl oxy-ethyl -2- phenyl propylene oxide, 2,2- bis- fluoro- 3- (methyl) acryloyl-oxy second
Basic ring Ethylene Oxide, 3- (methyl) acrylyl oxy-ethyl -2,2,4- trifluoro-epoxy propane, 3- (methyl) acrylyl oxy-ethyl -2,2,
4,4- tetrafluoro propylene oxide, 2- (methyl) acryloyloxymethyl propylene oxide, 2- methyl -2- (methyl) acryloyloxymethyl epoxy
Propane, 3- methyl -2- (methyl) acryloyloxymethyl propylene oxide, 4- methyl -2- (methyl) acryloyloxymethyl propylene oxide,
2- (methyl) acryloyloxymethyl -2- trifluoromethyl propylene oxide, 2- (methyl) acryloyloxymethyl -3- trifluoromethyl epoxy third
Alkane, 2- (methyl) acryloyloxymethyl -4- trifluoromethyl propylene oxide, 2- (methyl) acryloyloxymethyl -2- pentafluoroethyl group ring
Ethylene Oxide, 2- (methyl) acryloyloxymethyl -3- pentafluoroethyl group propylene oxide, five fluorine second of 2- (methyl) acryloyloxymethyl -4-
Basic ring Ethylene Oxide, 2- (methyl) acryloyloxymethyl -2- phenyl propylene oxide, 2- (methyl) acryloyloxymethyl -3- benzyl ring
Ethylene Oxide, 2- (methyl) acryloyloxymethyl -4- phenyl propylene oxide, 2,3- bis- fluoro- 2- (methyl) acryloyloxymethyl epoxy
Propane, 2,4-, bis- fluoro- 2- (methyl) acryloyloxymethyl propylene oxide, 3,3- bis- fluoro- 2- (methyl) acryloyloxymethyl epoxy
Propane, 2,4-, bis- fluoro- 2- (methyl) acryloyloxymethyl propylene oxide, 3,4- bis- fluoro- 2- (methyl) acryloyloxymethyl epoxy
Propane, 4,4-, bis- fluoro- 2- (methyl) acryloyloxymethyl propylene oxide, 2- (methyl) acryloyloxymethyl -3,3,4- trifluoro ring
Ethylene Oxide, 2- (methyl) acryloyloxymethyl -3,4,4- trifluoro-epoxy propane, 2- (methyl) acryloyloxymethyl -3,3,4,4-
Tetrafluoro propylene oxide, 2- (methyl) acrylyl oxy-ethyl propylene oxide, 2- (methyl) acrylyl oxy-ethyl -2- methyl epoxy third
Alkane, 2- (methyl) acrylyl oxy-ethyl -4- methyloxetane, 2- (methyl) acrylyl oxy-ethyl -2- trifluoromethyl epoxy third
Alkane, 2- (methyl) acrylyl oxy-ethyl -3- trifluoromethyl propylene oxide, 2- (methyl) acrylyl oxy-ethyl -4- fluoroform basic ring
Ethylene Oxide, 2- (methyl) acrylyl oxy-ethyl -2- pentafluoroethyl group propylene oxide, five fluorine second of 2- (methyl) acrylyl oxy-ethyl -3-
Basic ring Ethylene Oxide, 2- (methyl) acrylyl oxy-ethyl -4- pentafluoroethyl group propylene oxide, 2- (methyl) acrylyl oxy-ethyl -2- benzene
Basic ring Ethylene Oxide, 2- (methyl) acrylyl oxy-ethyl -3- phenyl propylene oxide, 2- (methyl) acrylyl oxy-ethyl -4- benzyl ring
Ethylene Oxide, 2,3-, bis- fluoro- 2- (methyl) acrylyl oxy-ethyl propylene oxide, 2,4- bis- fluoro- 2- (methyl) acrylyl oxy-ethyl ring
Ethylene Oxide, 3,3-, bis- fluoro- 2- (methyl) acrylyl oxy-ethyl propylene oxide, 3,4- bis- fluoro- 2- (methyl) acrylyl oxy-ethyl ring
Ethylene Oxide, 4,4-, bis- fluoro- 2- (methyl) acrylyl oxy-ethyl propylene oxide, 2- (methyl) acrylyl oxy-ethyl -3,3,4- trifluoro
Propylene oxide, 2- (methyl) acrylyl oxy-ethyl -3,4,4- trifluoro-epoxy propane, 2- (methyl) acrylyl oxy-ethyl -3,3,4,
Four membered ring's class of 4- tetrafluoro propylene oxide etc.;(methyl) acrylic acid tetrahydrofuran ester, (methyl) acrylic acid modified through caprolactone
Tetrahydrofuran ester, (the amyl- 4- yl of 2- methyl -2- isobutyl group -1,3- dioxy ring) methyl (methyl) acrylate ((2-methyl-2-
Isobutyl-1,3-dioxolan-4-yl) methyl (meth) acrylate), (2- methyl -2- ethyl -1,3- dioxy ring is amyl-
4- yl) methyl (methyl) acrylate ((2-methyl-2-ethyl-1,3-dioxolan-4-yl) methyl (meth)
Acrylate), (Isosorbide-5-Nitrae-dioxy loop coil [4,5] decyl- 2- yl) methyl (methyl) acrylate ((Isosorbide-5-Nitrae-dioxaspiro [4,5]
Dec-2-yl) methyl (meth) acrylate), (2, the 2- amyl- 4- yl of dimethyl -1,3- dioxy ring) methyl (methyl) acrylic acid
The five-membered ring class of ester ((2,2-dimethyl-1,3-dioxolan-4-yl) methyl (meth) acrylate) etc.;(methyl) third
Dimethomorph ((meth) acryloyl morpholine), (methyl) acrylic acid tetrahydropyrans ester, (methyl) acrylic acid -2- first
The six membered ring class of base tetrahydropyrans ester etc..Wherein, cyclic ether group acrylate more than four membered ring or four membered ring of preferably having is
Monomer, the cyclic ether group acrylate more preferably having more than five-membered ring or five-membered ring is monomer.
Monomer (a-1-2) individually a kind of can use or mix a variety of uses.
Total amount based on monomer mixture is 100 parts by weight, and the usage amount of monomer (a-1-2) is 3 parts by weight to 20 weight
Part, preferably 5 parts by weight to 20 parts by weight, more preferably 5 parts by weight to 15 parts by weight.
As unused monomer (a-1-2), the sensitivity of chemical amplification positive photosensitive resin composition is bad and institute's shape
At photoresist pattern rectangularity it is poor.
In the first mixture of the invention, as long as not influencing effect of the invention, other monomers (a- can further include
1-3).Other monomers (a-1-3) are, for example, known free-radical polymerised compound or anionic polymerisation compound.
As such polymerizable compound, the monocarboxylic acid class such as acrylic acid, methacrylic acid, crotonic acid can be enumerated;Horse
Carry out the omega-dicarboxylic acids such as sour, fumaric acid, itaconic acid;2- methylacryoyloxyethyl succinic acid, 2- methylacryoyloxyethyl Malaysia
Acid, 2- methylacryoyloxyethyl phthalic acid, 2- methylacryoyloxyethyl hexahydrophthalic acid etc. have carboxyl and ester
The methacrylic acid derivative class of key;(methyl) methyl acrylate, (methyl) ethyl acrylate, (methyl) butyl acrylate, (first
Base) (methyl) alkyl-acrylates such as cyclohexyl acrylate, (methyl) acrylic acid third butyl ester;1- ethyoxyl (methyl) propylene
(methyl) alkoxyalkyl acrylates such as acetoacetic ester, 1- methoxyl group (methyl) propyl acrylate;2- adamantyl (methyl) third
Olefin(e) acid ester (2-adamantyl (meth) acrylate), 2- methyl -2- adamantyl (methyl) acrylate (2-methyl-2-
Adamantyl (meth) acrylate), 2- ethyl -2- adamantyl (methyl) acrylate (2-ethyl-2-adamantyl
(meth) acrylate), 2- butyl -2- adamantyl (methyl) acrylate (2-butyl-2-adamantyl (meth)
Acrylate), 2- acrylic acid-2- methyl-1-methyl-1-tricyclic [3,3,1,13.7] decyl- 2- base ethyl ester (2-propenoic
Acid, 2-methyl-, l-methyl-1-tricyclo [3.3.1.13 ' 7] dec-2-ylethyl ester) etc. contain adamantane
(methyl) acrylate of base;(methyl) third such as (methyl) 2-Hydroxy ethyl acrylate, (methyl) 2-hydroxypropyl acrylate
Olefin(e) acid hydroxy alkyl esters;(methyl) Glycidyl Acrylate, (methyl) acrylic acid -2- methyl polyglycidyl, (methyl) propylene
Acid -3,4- epoxy butyl ester, (methyl) acrylic acid -6,7- epoxy heptyl ester, (methyl) acrylic acid -3,4- epoxy cyclohexyl or (methyl)
Acrylic acid -3,4- epoxycyclohexanecarboxylate etc. (methyl) acrylic acid epoxy base ester class;(methyl) phenyl acrylate, (methyl) propylene
Sour benzene methyl etc. (methyl) benzyl acrylate class;The dicarboxylic diesters class such as diethyl maleate, dibutyl fumarate;Benzene second
Alkene, α-methylstyrene, chlorostyrene, 1-chloro-4-methyl-benzene, vinyltoluene, hydroxy styrenes, Alpha-Methyl hydroxy styrenes,
The aromatic compound species containing vinyl such as α-ethyl hydroxy styrene;The aliphatic compound containing vinyl such as vinyl acetate
Class;Butadiene, isoprene equiconjugate alkadiene;The polymerizable compound class of the nitrile group-containings such as acrylonitrile, methacrylonitrile;Chlorine
The polymerizable compounds containing chlorine such as ethylene, vinylidene chloride;The polymerism chemical combination of the amide bonds such as acrylamide, Methacrylamide
Species etc..
Total usage amount based on the first mixture is 100 parts by weight, the contents of other monomers (a-1-3) be 30 parts by weight extremely
To 85 parts by weight, more preferably 45 parts by weight to 85 parts by weight are more preferably for 87 parts by weight, preferably 35 parts by weight.
The weight average molecular weight of resin (A-1) is 5,000 to 30,000;Preferably 6,000 to 25,000;More preferably 7,
000 to 20,000.
Resin (A-2)
Resin (A-2) of the invention is to be reacted by the second mixture and obtained, which includes monomer (a-2-1),
Or it can further include monomer (a-2-2).
Monomer (a-2-1) of the invention stretches alkyl chain containing polyoxy, can enumerate following concrete examples, but be not restricted to this
A little concrete examples: acrylic acid phenyl methylcarbamate ester (trade name: ARONIX TO-901), the E0 of ethylene oxide (hereinafter referred to as EO) modification change
The acrylic acid tridecane ester (trade name: ARONIX that lauryl ester (trade name: ARONIX T0-950), the E0 of matter are modified
TO-951), acrylic acid (2- ethylhexyl-polyethylene glycol) ester (trade name: ARONIX TO-946~TO-949), the above are east
Manufactured by the synthesis limited liability company of Asia;Acrylic acid (ethyl-diethylene glycol) ester (trade name: Light Acrylate EC-A),
Acrylic acid (methoxy-triethylene glycol) ester (trade name: Light Acrylate MTG-A), acrylic acid (the poly- second two of methoxyl group-
Alcohol) ester (trade name: Light Acrylate 130A), acrylic acid (phenoxy group-polyethylene glycol) ester (trade name: Light
Acrylate P-200A), acrylic acid (nonyl phenyl-polyoxyethanyl chain additives) ester (trade name: Light Acrylate
NP-4EA, NP-8EA), the above are manufactured by chemistry limited liability company, common prosperity society;Polyalkylene glycol acrylate ester (trade name:
BLEMMER AE-350), methacrylic acid macrogol ester (trade name: BLEMMER PE-90, PE-200, PE-350), propylene
Sour (methoxypolyethylene glycol) ester (trade name: BLEMMER AME-400), methacrylic acid (methoxypolyethylene glycol) ester
(trade name: BLEMMER PME-100, PME-200, PME-400), methacrylic acid polypropylene glycol ester (trade name: BLEMMER
PP-500, PP-800), methacrylic acid (polyethylene glycol propylene glycol) ester (trade name: BLEMMER 70PEP-370B), first
(octyloxy-is poly- for base acrylic acid (polyethylene glycol butanediol) ester (trade name: BLEMMER 50PET-800), methacrylic acid
Ethylene glycol-polypropylene glycol) ester (trade name: BLEMMER 50POEP-800B, 50AOEP-800B), the above are Japanese grease shares
Manufactured by Co., Ltd;Methacrylic acid (methoxyl group-diethylene glycol) ester (trade name: NK Ester M-20G, M-40G, M-
90G) and acrylic acid (phenoxy group-diethylene glycol) ester (trade name: NK Ester AMP-20G), the above are the village Xin Zhong chemistry
Manufactured by Industries, Inc.
Total amount based on the second mixture is 100 parts by weight, and the usage amount of monomer (a-2-1) is 5 parts by weight to 50 weight
Part, preferably 5 parts by weight to 40 parts by weight, more preferably 10 parts by weight to 40 parts by weight.
As unused monomer (a-2-1), the sensitivity of chemical amplification positive photosensitive resin composition is bad and institute's shape
At photoresist pattern rectangularity it is poor.
Monomer (a-2-2) of the invention contains the structure such as formula (a-2-2a):
In formula (a-2-2a), R1bIt is respectively independent to indicate hydrogen atom ,-CH3、-CF3Or-CH20H。R2bIndicate alkyl (carbon number
It is preferable for 1 to 8 person), naphthenic base (carbon number is that 3 to 8 persons are preferable) or aryl (carbon number is that 6 to 20 persons are preferable).R3bTo R12bRespectively solely
The vertical alkyl (carbon number is that 1 to 15 person is preferable) or R for indicating hydrogen atom or containing or do not contain heteroatomic 1 valence3bTo R12bIn
The two more than form ring mutually.When forming ring mutually, R3bTo R12bExpression contains or does not contain heteroatomic divalent alkyl (carbon
Number is that 1 to 15 person is preferable).R3bTo R12bExpression is bonded to adjacent carbon person can not be bonded each other between any object, can also be formed
Double bond.T indicates the linker of singly-bound or divalent.The divalent linker of T is to stretch alkyl (carbon number is that 1 to 10 person is preferably more preferably carbon
Number be 1 to 5) ,-COO-RtBase, -0-RtBase, and RtFor stretch alkyl (carbon number be 1 to 10 person be preferably, more preferably carbon number be 1 to
5) or ring stretches alkyl (carbon number is that 3 to 10 persons are preferable).
R2bIndicate alkyl, naphthenic base or aryl.R2bAlkyl and naphthenic base may be, for example, methyl, ethyl, propyl, isopropyl
Base, n- butyl, the second butyl, third butyl, third amyl, n- amyl, n- hexyl, cyclopenta, cyclohexyl, cyclopentyl-methyl,
Cyclopentyl ethyl, cyclohexyl methyl, cyclohexyl-ethyl etc..The aryl may be, for example, phenyl, aminomethyl phenyl, naphthalene, anthryl, phenanthrene
Base, pyrenyl etc..
R3bTo R12bRespectively it is independent indicate hydrogen atom or contain or not the alkyl containing heteroatomic 1 valence (carbon number be 1 to
15 is preferable) when, it may be, for example, methyl, ethyl, propyl, isopropyl, n- butyl, the second butyl, third butyl, the three penta
Base, n- amyl, n- hexyl, n- octyl, n- nonyl, n- decyl, cyclopenta, cyclohexyl, cyclopentyl-methyl, cyclopentyl ethyl, ring
The alkyl and naphthenic base of amyl butyl, cyclohexyl methyl, cyclohexyl-ethyl, cyclohexylbutyl etc., and a part of above-mentioned group
Hydrogen atom can be by hydroxyl, alkoxy, carboxylic acid group, alkoxy carbonyl group, side oxygen (oxo) base, amido, alkylamino radical, itrile group, mercapto, alkane
The groups such as sulfenyl, sulfo group replace.
R3bTo R12bCan also be formed mutually ring (such as: R3bAnd R4b、R5bAnd R7b、R5bAnd R8b、R6bAnd R8b、R6bAnd R12b、R7b
And R11b、R9bAnd R10b、R10bAnd R11bDeng), at this point, R3bTo R12bExpression contains or containing heteroatomic divalent alkyl, (carbon number is not
1 to 15 person is preferable), it may be, for example, 1 hydrogen atoms of removal from the example of the alkyl of above-mentioned 1 valence.Furthermore R3bTo R12bTable
Show that being bonded to adjacent carbon person can not be bonded each other between any object, double bond (such as R can also be formed3bAnd R12b、R9bAnd R12b、
R5bAnd R7bDeng).
The specific example such as following formula (a-2-2-1) of monomer (a-2-2) is to shown in formula (a-2-2-26).It illustrates,
Known method that can be for example contained using Japanese publication number 2000-336121 a case, synthesis following formula (a-2-2-1) to formula (a-2-
Compound 2-26).
In the concrete example of above formula (a-2-2a), and by R5bAnd R7bBond and formed with following formula (a-2-2b)
The norbornane ring of structure is preferable.
In formula (a-2-2b), R1bIt is respectively independent to indicate hydrogen atom ,-CH3、-CF3Or-CH2OH。R2bIndicate alkyl (carbon number
It is preferable for 1 to 8 person), naphthenic base (carbon number is that 3 to 8 persons are preferable) or aryl (carbon number is that 6 to 20 persons are preferable).R3b、R4b、R6b、R8b
To R18bThe respectively independent alkyl (carbon number is that 1 to 15 person is preferable) for indicating hydrogen atom or containing or do not contain heteroatomic 1 valence,
Or R3b、R4b、R6b、R8bTo R18bBoth of above form ring mutually.When forming ring mutually, R3b、R4b、R6b、R8bTo R18bTable
Show containing or do not contain heteroatomic divalent alkyl (carbon number is that 1 to 15 person is preferable).R3b、R4b、R6b、R8bTo R18bExpression is bonded to
Adjacent carbon person can not be bonded each other between any object, can also form double bond.T indicates the linker of singly-bound or divalent.The divalent of T
Linker is to stretch alkyl (carbon number is that 1 to 10 person is that preferably, more preferably carbon number is 1 to 5) ,-COO-RtBase, -0-RtBase, and Rt
For stretch alkyl (carbon number is that 1 to 10 person is preferably, and more preferably carbon number be 1 to 5) or ring stretch alkyl (carbon number be 3 to 10 persons for compared with
It is good).
Total amount based on the second mixture is 100 parts by weight, and the usage amount of monomer (a-2-2) is 3 parts by weight to 20 weight
Part, preferably 3 parts by weight to 15 parts by weight, more preferably 5 parts by weight to 15 parts by weight.
When the second mixture contains monomer (a-2-2), formed by chemical amplification positive photosensitive resin composition
Photoresist pattern rectangularity it is preferable.
In the second mixture of the invention, as long as not influencing effect of the invention, other monomers (a- can further include
2-3).Other monomers (a-2-3) are, for example, known free-radical polymerised compound or anionic polymerisation compound.
As such polymerizable compound, the monocarboxylic acid class such as acrylic acid, methacrylic acid, crotonic acid can be enumerated;Horse
Carry out the omega-dicarboxylic acids such as sour, fumaric acid, itaconic acid;2- methylacryoyloxyethyl succinic acid, 2- methylacryoyloxyethyl Malaysia
Acid, 2- methylacryoyloxyethyl phthalic acid, 2- methylacryoyloxyethyl hexahydrophthalic acid etc. have carboxyl and ester
The methacrylic acid derivative class of key;(methyl) methyl acrylate, (methyl) ethyl acrylate, (methyl) butyl acrylate, (first
Base) (methyl) alkyl-acrylates such as cyclohexyl acrylate, (methyl) acrylic acid third butyl ester;1- ethyoxyl (methyl) propylene
(methyl) alkoxyalkyl acrylates such as acetoacetic ester, 1- methoxyl group (methyl) propyl acrylate;2- adamantyl (methyl) third
Olefin(e) acid ester (2-adamantyl (meth) acrylate), 2- methyl -2- adamantyl (methyl) acrylate (2-methyl-2-
Adamantyl (meth) acrylate), 2- ethyl -2- adamantyl (methyl) acrylate (2-ethyl-2-adamantyl
(meth) acrylate), 2- butyl -2- adamantyl (methyl) acrylate (2-butyl-2-adamantyl (meth)
Acrylate), 2- acrylic acid-2- methyl-1-methyl-1-tricyclic [3,3,1,13.7] decyl- 2- base ethyl ester (2-propenoic
Acid, 2-methyl-, 1-methyl-1-tricyclo [3.3.1.13,7] dec-2-ylethyl ester) etc. contain adamantane
(methyl) esters of acrylic acid of base;(methyl) such as (methyl) 2-Hydroxy ethyl acrylate, (methyl) 2-hydroxypropyl acrylates
Hydroxyalkyl acrylates class;(methyl) Glycidyl Acrylate, (methyl) acrylic acid -2- methyl polyglycidyl, (methyl) third
Olefin(e) acid -3,4- epoxy butyl ester, (methyl) acrylic acid -6,7- epoxy heptyl ester, (methyl) acrylic acid -3,4- epoxy cyclohexyl or (first
Base) the acrylic acid epoxies base ester class such as acrylic acid -3,4- epoxycyclohexanecarboxylate;(methyl) phenyl acrylate, (methyl) acrylic acid
Benzene methyl etc. (methyl) benzyl acrylate class;The dicarboxylic diesters class such as diethyl maleate, dibutyl fumarate;Styrene,
α-methylstyrene, chlorostyrene, 1-chloro-4-methyl-benzene, vinyltoluene, hydroxy styrenes, Alpha-Methyl hydroxy styrenes, α-
The aromatic compound species containing vinyl such as ethyl hydroxy styrene;The aliphatic compound containing vinyl such as vinyl acetate
Class;Butadiene, isoprene equiconjugate alkadiene;The polymerizable compound class of the nitrile group-containings such as acrylonitrile, methacrylonitrile;Chlorine
The polymerizable compounds containing chlorine such as ethylene, vinylidene chloride;The polymerism chemical combination of the amide bonds such as acrylamide, Methacrylamide
Species etc..
Total usage amount based on the second mixture is 100 parts by weight, the contents of other monomers (a-2-3) be 30 parts by weight extremely
To 92 parts by weight, more preferably 45 parts by weight to 85 parts by weight are more preferably for 92 parts by weight, preferably 45 parts by weight.
The weight average molecular weight of resin (A-2) is 5,000 to 30,000;Preferably 6,000 to 25,000;More preferably 7,
000 to 20,000.
Total usage amount based on resin (A) is 100 parts by weight, and the content of resin (A-1) is 60 parts by weight to 90 parts by weight,
Preferably 60 parts by weight are to 85 parts by weight, more preferably 60 parts by weight to 80 parts by weight;The content of resin (A-2) be 10 parts by weight extremely
40 parts by weight, preferably 15 parts by weight are to 40 parts by weight, more preferably 20 parts by weight to 40 parts by weight.
When resin (A-1) and resin (A-2) content within the above range, by chemical amplification positive photoresist group
The rectangularity for being formed by photoresist pattern at object is preferable.
The solvent for preparing resin (A-1) and/or resin (A-2) Shi Suoyong includes but is not limited to (1) alcohol compound: first
Alcohol, ethyl alcohol, benzyl alcohol, 2 phenylethyl alcohol or 3- phenyl-1-propanol etc.;(2) ether compound: tetrahydrofuran etc.;(3) glycol ethers
Class compound: ethylene glycol ether, glycol monoethyl ether, ethylene glycol monoethyl ether etc.;(4) ethylene glycol alkyl ether acetate: second two
Alcohol monobutyl ether acetate, ethylene glycol ether acetate, glycol methyl ether acetate etc.;(5) diethylene glycol class compound: diethylene glycol
Monomethyl ether, diethylene glycol monoethyl ether, diethylene glycol monobutyl ether, diethylene glycol dimethyl ether (diethylene glycol
Dimethyl ether), diethylene glycol diethyl ether, diethylene glycol ethylmethyl ether etc.;(6) dipropylene glycol class compound: dipropylene glycol
Monomethyl ether, dipropylene glycol monoethyl ether, dimethyl ether, dipropylene glycol diethyl ether, dipropylene glycol ethyl methyl ether etc.;(7) the third two
Alcohol monoalkyl ether compound: propylene glycol monomethyl ether, dihydroxypropane single-ether, propylene glycol monopropyl ether, propylene glycol monobutyl ether etc.;(8)
Propylene glycol alkyl ether acetate class compound: propylene glycol methyl ether acetate (propylene glycol monomethyl ether
Acetate), propylene-glycol ethyl ether acetate, propylene glycol propyl ether acetate, propylene glycol butyl ether acetate etc.;(9) propylene glycol alkyl ether
Propionic acid ester compound: propylene glycol monomethyl ether acetate, propylene-glycol ethyl ether propionic ester, propylene glycol propyl ether propionic ester, propandiol butyl ether
Propionic ester etc.;(10) compound fragrant hydrocarbon: toluene, dimethylbenzene etc.;(11) ketone compounds: methyl ethyl ketone, cyclohexanone, diacetone
Alcohol etc.;(12) ester type compound: methyl acetate, ethyl acetate, propyl acetate, butyl acetate, 2 hydroxy propanoic acid ethyl ester, 2- hydroxyl
Base -2 Methylpropionic acid methyl esters, 2- hydroxy-2-methyl ethyl propionate, glycolic acid methyl esters, ethyl glycolate, butyl glycolate, lactic acid
Methyl esters, propyl lactate, butyl lactate, 3- hydroxy methyl propionate, 3- hydroxypropionate, 3- hydracrylic acid propyl ester, 3- hydroxyl third
Acid butyl ester, 2- hydroxy-3-methyl methyl butyrate, methoxy menthyl acetate, ethyl methoxyacetate, methoxyacetic acid butyl ester, second
Ethoxyacetic acid methyl esters, ethoxy ethyl acetate, ethoxyacetic acid propyl ester, ethoxyacetic acid butyl ester, propoxyl group methyl acetate, the third oxygen
Ethyl, propoxyl group propyl acetate, propoxyl group butyl acetate, butoxy acetic acid methyl esters, butoxy acetic acid ethyl ester, butoxy
Propyl acetate, butoxy acetic acid butyl ester, 3- methoxybutyl acetic acid esters, 2- methoxy methyl propionate, 2- methoxypropionate,
2- methoxy propyl propyl propionate, 2- methoxy propyl acid butyl ester, 2- ethoxypropanoate, 2- ethoxyl ethyl propionate, 2- ethyoxyl
Propyl propionate, 2- ethoxy-c acid butyl ester, 2- butoxy methyl propionate, 2- butoxy ethyl propionate, 2- butoxy propyl propionate,
2- butoxy butyl propionate, 3- methoxy methyl propionate, 3- methoxypropionate, 3- methoxy propyl propyl propionate, 3- methoxyl group
Butyl propionate, 3- ethoxypropanoate, 3- ethoxyl ethyl propionate, 3- ethoxy-c propyl propionate, 3- ethoxy-c acid butyl ester,
3- propoxyl group methyl propionate, 3- propoxyl group ethyl propionate, 3- propoxyl group propyl propionate, 3- propoxyl group butyl propionate, 3- butoxy
Methyl propionate, 3- butoxy ethyl propionate, 3- butoxy propyl propionate, 3- butoxy butyl propionate etc., this solvent can individually or
It is used in mixed way.
Used polymerization initiators are prepared when resin (A-1) and/or resin (A-2) including but not limited to azo-compound
Or peroxide, it can be used alone or as a mixture.
Azo-compound is such as, but not limited to: 2,2 '-azobis isobutyronitriles, 2,2 '-azos are bis- (2,4- methyl pentane nitrile)
[2,2 '-azobis (2,4-dimethylvaleronitrile)], bis- (4- methoxyl group -2, the 4- dimethyl-pentens of 2,2 '-azos
Nitrile), 2,2 '-azos double -2- methylbutyronitriles [2,2 '-azobis-2-methyl butyronitrile], 4, the 4 '-bis- (4- of azo
Cyanopentanoic acid), 2,2 '-azo of dimethyl bis- (2 Methylpropionic acid esters), bis- (4- methoxyl group -2, the 4- dimethyl-pentens of 2,2 '-azos
Nitrile) etc..
Peroxide is such as, but not limited to: dibenzoyl peroxide, dilauroyl peroxide, third butyl peroxy the three penta
Acid esters, 1,1- bis- (third butyl peroxy) hexamethylene, hydrogen peroxide etc..
Reaction temperature when preparing resin (A-1) and/or resin (A-2) is 40~120 degree, and polymerization time is 3~12 small
When.
Novolac resin (B)
Novolac resin (B) is passed through in the presence of acidic catalyst by aldehyde compound and aromatic hydroxy compound
Polycondensation reaction and obtain.
The concrete example of aforementioned aldehyde compound, such as: formaldehyde, paraformaldehyde (paraformaldehyde), metaformaldehyde
(trioxane), acetaldehyde, propionic aldehyde, butyraldehyde, trimethyl-acetaldehyde, methacrylaldehyde (acrolein), crotonaldehyde (crotonaldehyde),
Hexamethylene aldehyde (cyclo hexanealdehyde), furtural (furfural), furylacrolein (furylacrolein),
Benzaldehyde, terephthalaldehyde (terephthal aldehyde), phenylacetaldehyde, α-hydrocinnamicaldehyde, beta-phenyl propionic aldehyde, ortho-methyl benzene
Formaldehyde, m- tolyl aldehyde, p-tolualdehyde, o- chlorobenzaldehyde, m- chlorobenzaldehyde, p- chlorobenzaldehyde, cinnamic acid
Deng.Aforementioned aldehyde compound individually a kind of can use or mix a variety of uses.Preferably, aldehyde compound can be formaldehyde or benzene first
Aldehyde.
The concrete example of aforementioned fragrance race hydroxy compounds, such as: phenol (phenol);M-cresol (m-cresol), p- first
Phenol (p-cresol), o-cresol (o-cresol) etc. cresols (cresol) class compound;2,3- dimethlbenzenes, 2,5- dimethylbenzene
Phenol, 3,5- dimethlbenzene, 3,4- table cresols etc. xylenols (xylenol) class compound;M- ethyl -phenol, p- ethylo benzene
Phenol, o- ethyl -phenol, 2,3,5-TEP, 2,3,5- triethyl group phenol, 4- third butylphenol, 3- third butyl benzene
Phenol, 2- third butylphenol, 2- third butyl -4- methylphenol, 2- third butyl -5- methylphenol, 6- third butyl -3- first
The alkylphenols such as base phenol (alkyl phenol) class compound;P-methoxyphenol, m- metoxyphenol, p- ethyoxyl
Phenol, m- thanatol, to propoxyl group phenol, m- propoxyl group phenol etc. alkoxy phenols (alkoxy phenol) class
Close object;O- isopropenyl phenol, p- isopropenyl phenol, 2- methyl -4- isopropenyl phenol, 2- ethyl -4- isopropenyl
The isopropenyl phenols such as phenol (isopropenyl phenol) class compound;The aryl of phenylphenol (phenyl phenol)
Phenol (aryl phenol) class compound;4,4 '-dihydroxybiphenyls, bisphenol-A, m- benzenediol (resorcinol), p- benzene two
Phenol (hydroquinone), Pyrogallol acid (pyrogallol) etc. polyhydroxy benzenes (polyhydroxyphenol) class chemical combination
Object.Aromatic hydroxy compound individually a kind of can use or mix a variety of uses.
Preferably, aromatic hydroxy compound can be 3,5- dimethlbenzene, 3,4-Xylenol, 2,5- dimethlbenzene, o-
Cresols, m-cresol or p-Cresol.
The concrete example of aforementioned acid catalyst, such as: hydrochloric acid, sulfuric acid, formic acid, acetic acid, oxalic acid or p-methyl benzenesulfonic acid.
Novolac resin (B) individually a kind of can use or mix a variety of uses.Total usage amount based on resin (A) is
100 parts by weight, the content of novolac resin (B) are 20 parts by weight to 180 parts by weight, preferably 25 parts by weight to 160 weight
Part, more preferably 30 parts by weight to 140 parts by weight.
The weight average molecular weight of novolac resin (B) is 5,000 to 50,000;Preferably 6,000 to 45,000;More
Good is 7,000 to 40,000.
Photoacid generator (C)
Photoacid generator (C) is the irradiation by actinic ray or radioactive ray and generates the compound of acid, as long as that can borrow
The compound that acid is directly or indirectly generated by light, is not particularly limited.As photoacid generator (C), preferably following institute
First illustrated~the 5th form acid producing agent.Hereinafter, to the photoacid generator used is suitble in photosensitive resin composition
(C) preferably in is illustrated in the form of first to the 5th.
As the first form of photoacid generator (C), following formula (C-1) compound represented can be enumerated:
In formula (C-1), X1Indicate that the sulphur atom or iodine atom of g valence, g are 1 or 2.H indicates the repetition list of the structure in parantheses
First number.W1For with X1The organic group of bond, indicate carbon number be 6 to 30 aryl, carbon number be 4 to 30 heterocycle, carbon number be 1 to
The alkynyl that the alkenyl or carbon number that 30 alkyl, carbon number are 2 to 30 are 2 to 30, W1It can be via alkyl, hydroxyl, alkoxy, alkane carbonyl
Base, aromatic carbonyl, alkoxy carbonyl group, aryloxy carbonyl, fragrant thiocarbonyl group, acyloxy, arylthio, alkylthio group, aryl, heterocycle, aryloxy group, alkane
Sulfinyl, alkane sulfonyl, arylsulfonyl, stretches alkoxy, amido, cyano, group formed by nitro and halogen at fragrant sulfinyl
In at least one kind of substitution for selecting.W1Number be g+h (g-1)+1, W1It can distinguish mutually the same or different.Also, 2 or more W1
It can be bonded directly with one another or via-O- ,-S- ,-SO- ,-S02-、-NH-、-NW2,-CO- ,-COO- ,-CONH-, carbon number be 1 to
3 stretch alkyl or stretch phenyl bond and formed includes X1Ring structure.W2For carbon number be 1 to 5 alkyl or carbon number be 6 to 10
Aryl.
X2For structure shown in following formula (C-1a):
In formula (C-la), X4Indicate carbon number be 1 to 8 stretch alkyl, carbon number be 6 to 20 stretch aryl or carbon number is 8 to 20
The miscellaneous base of divalent, X4Aryl that alkoxy that the alkyl that can be 1 to 8 via carbon number, carbon number are 1 to 8, carbon number are 6 to 10, hydroxyl,
At least one kind of substitution selected in group formed by cyano, nitro and halogen.X5Expression-O- ,-S- ,-SO- ,-SO2-、-NH-、-
NW2,-CO- ,-COO- ,-CONH-, carbon number be 1 to 3 to stretch alkyl or stretch phenyl.H indicates the repetitive unit of the structure in parantheses
Number.H+1 X4And h X5It can distinguish identical or different.W2It is identical as aforementioned definitions.
(X3)-be to ion (counter ion), can enumerate fluoroalkyl fluorophosphoric acid shown in following formula (C-1b) yin
The anion of borate anion, the anion of following formula (C-1d) or following formula (C-1e) shown in ion, following formula (C-1c):
[(W3)jPF6-j]-Formula (C-1b)
In formula (C-1b), W3The alkyl that the hydrogen atom of 80% or more expression replaces through fluorine atom.J indicates its number, be 1 to
5 integer.J W3It can distinguish identical or different.
In formula (C-1c), W4~W7Independently indicate fluorine atom or phenyl, a part of the hydrogen atom in the phenyl or complete
It portion can be via at least one kind of substitution selected in group formed by fluorine atom and trifluoromethyl.
R1dS03 -Formula (C-1d)
Anion representated by formula (C-1d) may be, for example, trifluoromethanesulfonic acid anion, five fluorine ethanesulfonic acid anion, seven fluorine
Propane sulfonic acid anion, nine fluorine fourth sulfonic acid anions, phenyl-pentafluoride sulfonic acid anion, p- toluenesulfonate anion, benzene sulfonic acid yin from
Son, naphthalene sulfonic acids anion, rylnthracene sulfonin anion, camphorsulfonic acid anion, methylsulphur acid anion, ethanesulfonic acid anion, propane sulfonic acid
Anion and fourth sulfonic acid anion.Wherein, preferably trifluoromethanesulfonic acid anion, nine fluorine fourth sulfonic acid anions, benzene sulfonic acid yin from
Sub or p- toluenesulfonate anion.
(R2bS02)3C-Formula (C-le)
Anion shown in formula (C-1e) may be, for example, (CF3S02)3C-、(C2F5S02)3C-、(C3F7SO2)3C-Or
(C4F9S02)3C-。
As the ion in formula (C-1) compound represented, triphenylsulfonium, three-p-methylphenyl sulfoniums, 4- (benzene can be enumerated
Sulfenyl) phenyl diphenyl sulfonium, bis- [4- (diphenyl sulfonium base) phenyl] thioethers, bis- [4- { bis- [4- (2- hydroxy ethoxy) phenyl] sulfoniums
Base } phenyl] thioether, bis- { 4- [bis- (4- fluorophenyl) sulfonium bases] phenyl } thioethers, 4- (4- benzoyl -2- chlorophenylsulfanyl) phenyl pair
(4- fluorophenyl) sulfonium, 7- isopropyl -9- Oxy-1 0- thia -9,10- dihydroanthracene -2- two-p-methylphenyl of base sulfonium, 7- isopropyl -
9- Oxy-1 0- thia -9,10- dihydroanthracene -2- base diphenyl sulfonium, 2- [(diphenyl) sulfonium base] thioxanthone, 4- [4- (4- third
Butylbenzoyl) thiophenyl] two-p-methylphenyl of phenyl sulfonium, 4- (4- benzoylphenylsulfanyl) phenyl diphenyl sulfonium, diphenyl
Phenylacetyl group sulfonium, 4- hydroxyphenylmethyl benzyl sulfonium, 2- naphthyl methyl (1- carbethoxyl group) ethyl sulfonium, 4- hydroxyphenylmethyl benzene second
Acyl group sulfonium, phenyl [4- (4- biphenyl sulfenyl) phenyl] 4- biphenyl sulfonium, phenyl [4- (4- biphenyl sulfenyl) phenyl] 3- biphenyl sulfonium, [4-
(4- acetyl thiophenyl) phenyl] diphenyl sulfonium, octadecyl methyl phenylacetyl group sulfonium, two benzene base Iodonium, two-to first benzene base Iodonium, bis- (4-
Dodecyl phenyl) Iodonium, bis- (4- methoxyphenyls) lock, (4- octyloxyphenyl) benzene base Iodonium, bis- (12 oxygroup of 4-) benzene base Iodonium, 4-
(14 oxygroup of 2- hydroxyl) phenyl Ben Ji Iodonium, 4- cumenyl (p-methylphenyl) Iodonium, 4- isobutylphenyl (p-methylphenyl) Iodonium or double
(4- third butyl phenyl) iodine etc..
In ion in above-mentioned formula (C-1) compound represented, following formula (C- can be enumerated as preferable ion
Sulfonium cation shown in 1f):
In formula (C-1f), W8It independently indicates by hydrogen atom, alkyl, hydroxyl, alkoxy, alkyl carbonyl, alkane carbonyloxy group, alkane
Oxygen carbonyl, halogen atom, the aryl that can have substituent group, the base selected in group formed by aromatic carbonyl.X2It indicates and above-mentioned formula (C-1)
In X2Identical meaning.
As the specific example of sulfonium cation shown in above-mentioned formula (C-1f), can enumerate 4- (thiophenyl) phenyl diphenyl sulfonium,
Bis- (4- fluorophenyl) sulfoniums of 4- (4- benzoyl -2- chlorophenylsulfanyl) phenyl, 4- (4- benzoylphenylsulfanyl) phenyl diphenyl sulfonium,
Phenyl [4- (4- biphenyl sulfenyl) phenyl] 4- biphenyl sulfonium, phenyl [4- (4- biphenyl sulfenyl) phenyl] 3- biphenyl sulfonium, [4- (4- acetyl
Thiophenyl) phenyl] diphenyl sulfonium, diphenyl [4- (to three thiophenyls) phenyl] diphenyl sulfonium.
In fluoroalkyl fluorophosphoric acid anion shown in above-mentioned formula (C-1b), W3Indicate the alkyl replaced through fluorine atom, preferably
Carbon number be 1~8, more preferably carbon number be 1~4.As the specific example of alkyl, methyl, ethyl, propyl, butyl, penta can be enumerated
The straight chained alkyls such as base, octyl;The branched alkyl groups such as isopropyl, isobutyl group, the second butyl, third butyl;Even cyclopropyl, ring fourth
Naphthenic base such as base, cyclopenta, cyclohexyl etc., it is usually 80% or more that the hydrogen atom of alkyl, which is substituted as the ratio of fluorine atom, compared with
Good is 90% or more, more preferably 100%.If the Replacement rate of fluorine atom is not up to 80%, fluoroalkyl shown in above-mentioned formula (C-1)
The acid strength of fluorophosphate can reduce.
Particularly good W3It is 1~4 for carbon number, and the Replacement rate of fluorine atom is 100% straight-chain or the perfluor alkane of branch-like
Base can enumerate CF as specific example3、CF3CF2、(CF3)2CF、CF3CF2CF2、CF3CF2CF2CF2、(CF3)2CFCF2、CF3CF2
(CF3)CF、(CF3)3C。W3Number j be 1~5 integer, preferably 2~4, particularly good is 2 or 3.
As the specific example of preferable fluoroalkyl fluorophosphoric acid anion, [(CF can be enumerated3CF2)2PF4]-、[(CF3CF2)3PF3]-、[((CF3)2CF)2PF4]-、[((CF3)2CF)3PF3]-、[(CF3CF2CF2)2PF4]-、[(CF3CF2CF2)3PF3]-、
[((CF3)2CFCF2)2PF4]-、[((CF3)2CFCF2)3PF3]-、[(CF3CF2CF2CF2)2PF4]-or [(CF3CF2CF2)3PF3]-,
In these, particularly good is [(CF3CF2)3PF3]-、[(CF3CF2CF2)3PF3]-、[((CF3)2CF)3PF3]-、[((CF3)2CF)2PF4]-、[((CF3)2CFCF2)3PF3]-Or [((CF3)2CFCF2)2PF4]-。
As the preferred embodiments of borate anion shown in above-mentioned formula (C-1c), wantonly (pentafluorophenyl group) boron can be enumerated
Acid group ([B (C6F5)4]-), wantonly [(trifluoromethyl) phenyl] borate ([B (C6H4CF3)4]-), bis- (pentafluorophenyl group) boric acid of difluoro
Root ([(C6F5)2BF2]-), trifluoro (pentafluorophenyl group) borate ([(C6F5)BF3]-), wantonly (difluorophenyl) borate ([B
(C6H3F2)4]-) etc..It is particularly good for wantonly (pentafluorophenyl group) borate ([B (C in these6F5)4]-)。
As the second form of acid producing agent (A), can enumerate bis- (the trichloromethyl) -6- piperonyl -1,3,5-triazines of 2,4-,
2,4- bis- (trichloromethyl) -6- [2- (2- furyl) vinyl] symmetrical triazine, bis- (trichloromethyl) -6- [2- (the 5- first of 2,4-
Base -2- furyl) vinyl] symmetrically triazine, bis- (the trichloromethyl) -6- of 2,4- [2- (5- ethyl -2- furyl) vinyl] are right
Claim triazine, bis- (the trichloromethyl) -6- of 2,4- [2- (5- propyl -2- furyl) vinyl] symmetrical triazine, bis- (three chloromethanes of 2,4-
Base) -6- [2- (3,5- Dimethoxyphenyl) vinyl] symmetrical triazine, bis- (trichloromethyl) -6- [2- (3, the 5- diethoxies of 2,4-
Base phenyl) vinyl] symmetrical triazine, bis- (the trichloromethyl) -6- of 2,4- [2- (3,5- dipropoxy phenyl) vinyl] symmetrical three
Bis- (the trichloromethyl) -6- of piperazine, 2,4- [2- (3- methoxyl group -5- ethoxyl phenenyl) vinyl] symmetrical triazine, bis- (three chloromethanes of 2,4-
Base) the symmetrical triazine of -6- [2- (3- methoxyl group -5- propoxyphenyl) vinyl], [(3, the 4- Asias 2- bis- (the trichloromethyl) -6- of 2,4-
Methylenedioxy group phenyl) vinyl] symmetrical triazine, bis- (the trichloromethyl) -6- (3,4- methylenedioxyphenyl) of 2,4- symmetrically triazine,
2,4- bis--trichloromethyl -6- (the bromo- 4- methoxyl group of 3-) symmetrical triazine of phenyl, 2,4- be bis--trichloromethyl -6- (the bromo- 4- methoxy of 2-
Base) the symmetrical triazine of phenyl, 2,4- be bis--and trichloromethyl -6- (the bromo- 4- methoxyl group of 2-) symmetrical triazine of styryl phenyl, 2,4- be bis- -
Trichloromethyl -6- (the bromo- 4- methoxyl group of 3-) symmetrical triazine of styryl phenyl, bis- (three chloromethanes of 2- (4- methoxyphenyl) -4,6-
Base) -1,3,5-triazines, bis- (the trichloromethyl) -1,3,5-triazines of 2- (4- methoxyl group naphthalene) -4,6-, 2- [2- (2- furyl) second
Alkenyl] bis- (the trichloromethyl) -1,3,5-triazines of -4,6-, 2- [2- (5- methyl -2- furyl) vinyl] bis- (three chloromethanes of -4,6-
Base) -1,3,5-triazines, 2- [2- (3,5- Dimethoxyphenyl) vinyl] bis- (trichloromethyl) -1,3,5-triazines of -4,6-, 2-
[2- (3,4- Dimethoxyphenyl) vinyl] bis- (trichloromethyl) -1,3,5-triazines of -4,6-, 2- (3,4- methylenedioxybenzenes
Base) bis- (the trichloromethyl) -1,3,5-triazines of -4,6-, ginseng (1,3- dibromopropyl) -1,3,5-triazines, ginseng (2,3- dibromopropyl) -
The following formula (C-2) such as the halogen-containing triaizine compounds such as 1,3,5-triazines and ginseng (2,3- dibromopropyl) isocyanuric acid ester
Shown in halogen-containing triaizine compounds.
In formula (C-2), W9~W11Independently it is expressed as alkylhalide group.
Also, the third form as photoacid generator (C), can enumerate α-(tolysulfonyl oxygroup imido grpup)-phenyl second
Nitrile, α-(phenylsulfonyloxy imido grpup) -2,4- dichlorophenyl acetonitrile, α-(phenylsulfonyloxy imido grpup) -2,6- dichlorophenyl second
Nitrile, α-(2- chloro benzenesulfonyloxy imido grpup) -4- methoxyphenylacetonitrile, α-(ethylsulfonyloxy imido grpup) -1- chlorine amylene
Base acetonitrile and following formula (C-3) compound represented containing sulfonic acid oximido.
In formula (C-3), W12Indicate 1 valence, divalent or trivalent organic group, W13Expression is substituted or unsubstituted saturated hydrocarbons
Base, unsaturated alkyl or aromatic series compound base, n indicate the number of repeat unit of the structure in parantheses.
In above-mentioned formula (C-3), aromatic series compound basis representation makes aromatic compound show distinctive physics, chemically
The base of the compound of matter can enumerate the heteroaryls such as the aryl such as phenyl, naphthalene or furyl, thienyl.These also can be in ring
Above with 1 or more substituent group appropriate, such as halogen atom, alkyl, alkoxy, nitro etc..Also, W13It is particularly good to be for carbon number
1 to 6 alkyl can enumerate methyl, ethyl, propyl, butyl.Especially with W12For aromatic series compound base, W13It is 1 to 4 for carbon number
The compound of alkyl be preferable.
As acid producing agent shown in above-mentioned formula (C-3), as n=1, W can be enumerated12For phenyl, aminomethyl phenyl, methoxyl group
Phenyl is any, W13For the compound of methyl, α-(mesyloxy imido grpup) -1- phenylacetonitrile, α-can be specifically enumerated
(mesyloxy imido grpup) -1- (p-methylphenyl) acetonitrile, α-(mesyloxy imido grpup) -1- (p- methoxyphenyl) second
Nitrile, [2- (the third sulfonyloxy imido grpup) -2,3- dihydroxy thiophene -3- subunit] (o-tolyl) acetonitrile etc..As n=2, as
Acid producing agent shown in above-mentioned formula (C-3) can specifically enumerate the generation of acid shown in following formula (C-3-1)~formula (C-3-8)
Agent:
In addition, the 4th form as photoacid generator (C), can enumerate the salt that cationic portion has naphthalene nucleus.It should " tool
Have naphthalene nucleus " refer to structure derived from naphthalene, it is intended that the structure of at least two ring, and the meaning of the armaticity of they can be maintained.It should
Naphthalene nucleus can also have the straight-chain or branch that alkyl, hydroxy, the carbon number of the straight-chain or branch-like that carbon number is 1 to 6 are 1 to 6
The substituent group of the alkoxy of shape etc..Structure derived from naphthalene nucleus can be 1 valence base (free valence is 1), also can be (the trip of divalent base
From valence be 2) more than, it is more satisfactory be 1 valence base (only, at this point, be deduct with above-mentioned substituent group bond close part come calculate trip
From valence).Naphthalene nucleus number is preferably 1~3.
There is the cationic portion of the salt of naphthalene nucleus as such cationic portion, preferably shown in following formula (C-4)
Structure:
In formula (C-4), W14~W16In at least 1 indicate following formula (C-4a) shown in base, remaining indicate carbon number be 1 to 6
Straight-chain or the alkyl of branch-like, the phenyl that can have substituent group, hydroxy or carbon number be 1 to 6 straight-chain or branch
The alkoxy of shape.Alternatively, W14~W16One of for base shown in following formula (C-4a), both remaining is each independently carbon number 1
Straight-chain or branch-like to 6 stretch alkyl, these end can be bonded and annular in shape.
In formula (C-4a), W17、W18Independently indicate the alkane of hydroxy, the straight-chain that carbon number is 1 to 6 or branch-like
The alkyl of straight-chain or branch-like that oxygroup or carbon number are 1 to 6, W18It indicates singly-bound or can have the carbon number of substituent group to be 1 to 6
Straight-chain or branch-like stretch alkyl.1 and m independently indicates that 0~2 integer, l+m are 3 or less.Work as W17There are multiple
When, they can be mutually the same or different.Work as W18There are it is multiple when, they can be mutually the same or different.
Above-mentioned W14~W16The number of base shown in above-mentioned formula (C-4a), the stability viewpoint based on compound are preferable in the middle
It is 1, remaining is that the straight-chain that carbon number is 1 to 6 or branch-like stretch alkyl, these end can be bonded and annular in shape.At this point,
Stretching alkyl for above-mentioned 2 may include sulphur atom and constitutes 3 to 9 Yuans rings.Constitute ring atom (sulfur atom-containing) number be preferably 5 to
6。
Also, oxygen atom can be enumerated (at this point, with the carbon original for stretching alkyl is constituted as the above-mentioned substituent group stretching alkyl and can having
Carbonyl is collectively formed in son), hydroxy etc..
Also, hydroxy can be enumerated as the substituent group that phenyl can have, the alkane of the straight-chain that carbon number is 1 to 6 or branch-like
Oxygroup, the straight-chain that carbon number is 1 to 6 or alkyl of branch-like etc..
Category is suitable as these cationic portions person, following formula (C-4b), (C-4c) those shown can be enumerated, especially with following formula
(C-4c) structure shown in is preferred.
As such cationic portion, Ke Wei Iodonium salt or sulfonium salt;More satisfactory based on viewpoints such as sour generation efficiencies is sulfonium salt.
To more satisfactory for can shape for being suitable as the anion part person of salt of the cationic portion with naphthalene nucleus
At the anion of sulfonium salt.
It is part or all of perfluorinated fluoroalkyl sulfonic acids of hydrogen atom as the anion part of such acid producing agent
Ion or aryl sulfonic acid ion.
Alkyl in fluoroalkyl sulfonic acids ion can be straight-chain, branch-like or the ring-type that carbon number is 1 to 20, based on generation
The volume size and its diffusion length of acid, preferably carbon number are 1 to 10.Especially in branch-like or ring-type person due to diffusion length is short
Preferably.Also, methyl, ethyl, propyl, butyl, octyl etc. can be enumerated as preferably for by can inexpensively synthesize.
Aryl in aryl sulfonic acid ion is the aryl that carbon number is 6 to 20, and can enumerate can replace through alkyl, halogen atom
Phenyl, naphthalene.In particular, for by can inexpensively synthesize, preferably carbon number be 6 to 10 aryl.As the specific of preferably
Example can enumerate phenyl, tosyl, ethylphenyl, naphthalene, methyl naphthalene etc..
Fluorination in above-mentioned fluoroalkyl sulfonic acids ion or aryl sulfonic acid ion, when part or all of hydrogen atom is perfluorinated
Rate is preferably 10~100%, more preferably 50~100%, especially the winner with fluorine atom substitution whole hydrogen atoms, because of the intensity of acid
Enhancing and it is preferable.Belong to such person, can specifically enumerate triflate, perfluor butanesulfonate, perfluorooctane sulfonate ester, perfluor
Benzene sulfonate etc..
In these, as preferable anion part, following formula (C-4d) those shown can be enumerated:
W20S03 -Formula (C-4d)
In formula (C-4d), W20For base shown in following formula (C-4e), (C-4f) and (C-4g).
-CxF2x+1Formula (C-4e)
In formula (C-4e), x indicates 1 to 4 integer.In formula (C-4f), W21Indicate hydrogen atom, hydroxy, carbon atom be 1 to
The alkoxy of straight-chain or branch-like that 6 straight-chain or the alkyl of branch-like or carbon number are 1 to 6, y indicate 1 to 3
Integer.In these, triflate, perfluor butanesulfonate are preferably based on safety point.
Also, nitrogenous person shown in following formula (C-4h), formula (C-4i) also can be used as anion part.
In formula (C-4h), formula (C-4i), XaIndicate the straight-chain that replaces through fluorine atom of at least one hydrogen atom or branch-like
Alkyl is stretched, which is 2 to 6, preferably 3 to 5, more preferably 3.Also, Ya、ZaIndependently indicate that at least one hydrogen is former
The alkyl of straight-chain or branch-like that son replaces through fluorine atom, the carbon number of the alkyl be 1 to 10, preferably 1 to 7, more preferably 1 to
3。
XaThe carbon number or Y for stretching alkyla、ZaAlkyl carbon number it is smaller then better to the dissolubility of organic solvent, because
This is preferably.
Also, XaStretch alkyl or Ya、ZaAlkyl in, through fluorine atom replace hydrogen atom number the more, sour intensity is cured
By force, therefore preferably.This stretches the ratio of the fluorine atom in alkyl or alkyl, that is, fluorination rate is preferably 70~100%, more preferably 90
~100%, the perfluor that most preferably all hydrogen atoms replace through fluorine atom stretches alkyl or perfluoroalkyl.
Belong to and be suitable as the salt person that such cationic portion has naphthalene nucleus, following formula (C-4j), formula (C-4k) can be enumerated
Compound represented.
Furthermore as the 5th form of photoacid generator (C), can enumerate bis- (p-toluenesulfonyl) diazomethanes, it is bis- (1,
1- dimethylethylsulfonyl) diazomethane, bis- (cyclohexylsulfonyl) diazomethanes, bis- (2,4- 3,5-dimethylphenyl sulfonyls)
Double sulfonyidiazomethanes classes such as diazomethane;P-methyl benzenesulfonic acid 2- nitrobenzene methyl esters, p-methyl benzenesulfonic acid 2,6- dinitrobenzene first
Ester, toluenesulfonic acid nitrobenzene methyl esters, toluenesulfonic acid dinitrobenzene methyl esters, sulfonic acid nitrobenzene methyl esters, nitrophenylcarbonates methyl esters, carbonic acid
The nitrobenzoyls radical derivative such as dinitrobenzene methyl esters;Pyrogallol triflate, pyrogallol front three benzene sulfonate, toluene
Sulfonic acid benzene methyl, sulfonic acid benzene methyl, N- mesyloxy succinimide, N- trichloromethyl sulfonyloxy succinimide, N-
The sulfonic acid esters such as phenylsulfonyloxy group maleimide, N- mesyloxy phthalimide;N- hydroxyl phthalyl
The trifluoromethanesulfonic acids esters such as imines, N- hydroxynaphthylimide;Er Ben Ji Iodonium hexafluorophosphate, (4- methoxyphenyl) Ben Ji Iodonium tri-
It is fluorine mesylate, bis- (to third butyl phenyl) Iodonium fluoroform sulphonate, triphenylsulfonium hexafluorophosphate, (4- methoxyphenyl)
The salts such as diphenyl sulfonium fluoroform sulphonate, (to third butyl phenyl) diphenyl sulfonium fluoroform sulphonate;Styrax toluene
The styraxes toluenesulfonic acid esters such as sulphonic acid ester, Alpha-Methyl styrax tosylate;Other Er Ben Ji Iodonium salt, triphenylsulfonium
Salt, Arenediazonium salts, methyl phenyl carbonate etc..
Photoacid generator (C) can be used alone, and can also combine two or more use.Also, being based on total usage amount of resin (A)
For 100 parts by weight, the content of photoacid generator (C) is 0.5 parts by weight to 4.5 parts by weight, preferably 0.6 parts by weight to 4 weight
Part, more preferably 0.7 parts by weight to 3.5 parts by weight.
Solvent (D)
The type of solvent (D), is not particularly limited in the range of not interfering the object of the invention, can be by being used in eurymeric in the past
It is suitable for selecting and using in the organic solvent of photosensitive resin composition.
As the specific example of solvent (D), acetone, methyl ethyl ketone, cyclohexanone, methyl isoamyl ketone, 2- heptan can be enumerated
The ketones such as ketone;Ethylene glycol, ethylene glycol acetate, diethylene glycol, diethylene glycol monoacetate, propylene glycol, propylene glycol list acetic acid
The polyalcohols such as ester, dipropylene glycol, the monomethyl ether of dipropylene glycol monoacetate, single ether, single propyl ether, monobutyl ether, monophenyl ether and
Its derivative;Two ethers such as glycol dimethyl ether, diethylene glycol dimethyl ether, diethylene glycol diethyl ether;The cyclic ethers class such as dioxanes;First
Acetoacetic ester, methyl lactate, ethyl lactate, methyl acetate, ethyl acetate, butyl acetate, methyl pyruvate, methyl acetoacetate,
Ethyl acetoacetate, ethyl pyruvate, ethoxy ethyl acetate, methoxy methyl propionate, 3- ethoxyl ethyl propionate, 2- hydroxyl
Methyl propionate, 2 hydroxy propanoic acid ethyl ester, 2- hydroxy-2-methyl ethyl propionate, 2- hydroxy-3-methyl methyl butyrate, 3- methoxyl group
The esters such as butylacetic acid ester, 3- methyl -3- methoxybutyl acetic acid esters, propylene glycol methyl ether acetate;The fragrance such as toluene, dimethylbenzene
Race's hydro carbons;Deng.These can be used alone, and can also mix two or more use.
Total usage amount based on resin (A) is 100 parts by weight, and the content of solvent (D) is 60 parts by weight to 800 parts by weight,
Preferably 70 parts by weight are to 500 parts by weight, more preferably 80 parts by weight to 400 parts by weight.
Mercaptan compound (E)
Mercaptan compound (E) has structure shown in following formula (E-1):
In formula (E-1), R1c、R2cThe respectively independent alkyl for indicating that hydrogen atom or carbon number are 1 to 4, R3cIndicate singly-bound or carbon number
For 1 to 10 alkyl of stretching, R4cIndicate u valence organic group;U indicates 2 to 6 integer.
Work as R1c、R2cWhen for alkyl, which can be straight-chain or branch's chain state, preferably straight-chain.Work as R1c、R2cFor alkane
When base, as the carbon number of the alkyl, preferably 1 to 4, particularly good is 1 or 2, more preferably 1.As R1c、R2cCombination, preferably one
Person is hydrogen atom, another one is alkyl, it is particularly good be one be hydrogen atom, another one is methyl.
Work as R3cWhen to stretch alkyl, it can be straight-chain or branch's chain state, preferably straight-chain that this, which stretches alkyl,.Work as R3cTo stretch alkane
When base, the carbon number of alkyl, preferably 1 to 10, more preferably 1 to 5 are stretched as this, particularly good is 1 or 2, most preferably 1.
R4cDefined u valence organic group, specifically 2 to 6 valence fatty groups to may include atom other than carbon.Make
For R4cAtom other than the carbon that may include can enumerate nitrogen-atoms, oxygen atom, sulphur atom, fluorine atom, chlorine atom, bromine atom and iodine
Atom etc..R4cThe structure of affiliated fatty group can be straight-chain, branch's chain state or ring-type, can also be composed for these structures
Structure.
In the mercaptan compound (E) as shown in formula (E-1), more preferably by following formula (E-2) compound represented:
In formula (E-2), R4c, the definition of u it is identical as formula (E-1), R5cThe alkyl for being 1 to 4 for hydrogen atom or carbon number.
The concrete example of mercaptan compound (E) can enumerate following formula (E-3)~formula (E-16) concrete example, but be not limited to this
A little concrete examples:
Total usage amount based on resin (A) is 100 parts by weight, and the content of mercaptan compound (E) is 0.3 parts by weight to 3 weights
Measure part, preferably 0.4 parts by weight to 2.8 parts by weight, more preferably 0.5 parts by weight to 2.5 parts by weight.
When chemical amplification positive photosensitive resin composition includes mercaptan compound (E), chemical amplification positive sense
The sensitivity of photosensitiveness resin combination is preferable.
Anthracene compound (F)
Anthracene compound (F) can enumerate following concrete example, but be not restricted to these concrete examples: anthracene (anthracene),
9,10- dibutoxy anthracenes, 9,10- dimethoxy anthracene, 2-ethyl-9,10-dimethoxypyrene, 2- third butyl -9,10- dimethoxy
Base anthracene, 2,3- dimethyl -9,10- dimethoxy anthracene, 9- methoxyl group -10- methyl anthracene, 9,10- diethoxy anthracene, ethyl -9 2-,
10- diethoxy anthracene, 2- third butyl -9,10- diethoxy anthracene, 2,3- dimethyl -9,10- diethoxy anthracene, 9- ethyoxyl -
10- methyl anthracene, 9,10- dipropoxy anthracene, 9,10- diisopropoxy anthracene, 2- ethyl -9,10- dipropoxy anthracene, 2- third fourth
Base -9,10- dipropoxy anthracene, 2,3- dimethyl -9,10- dipropoxy anthracene, 9- isopropoxy -10- methyl anthracene, 9,10- diformazan
Phenoxy group anthracene, 2- ethyl -9,10- xylyloxy anthracene, 2- third butyl -9,10- xylyloxy anthracene, dimethyl -9 2,3-,
10- xylyloxy anthracene, 9- toloxyl -10- methyl anthracene, 9,10-, bis--Alpha-Methyl toloxyl anthracene, 2- ethyl -9,10- bis- -
Alpha-Methyl toloxyl anthracene, 2- third butyl -9,10- bis--Alpha-Methyl toloxyl anthracene, 2,3- dimethyl -9,10-, bis--α-first
Base toloxyl anthracene, 9- (Alpha-Methyl toloxyl) -10- methyl anthracene, 9,10- diphenylanthrancene, 9- methoxyl group anthracene, 9- ethyoxyl
The compounds such as anthracene, 9- methyl anthracene, 9- bromine anthracene, 9- methyl mercapto anthracene, 9- ethylmercapto group anthracene.
Total usage amount based on resin (A) is 100 parts by weight, and the content of anthracene compound (F) is 0.2 parts by weight to 1.5
Parts by weight, preferably 0.25 parts by weight are to 1.3 parts by weight, more preferably 0.3 parts by weight to 1.1 parts by weight.
When in chemical amplification positive photosensitive resin composition including anthracene compound (F), chemical amplification positive
The sensitivity of photosensitive resin composition is preferable.
Additive (G)
In chemical amplification positive photosensitive resin composition, as long as not influencing effect of the invention, more can further it wrap
Containing additive (G), additive (G) can be used alone one kind or use with it is a variety of, end see depending on actual needs.Illustrate additive below
(G) particular content.
In chemical amplification positive photosensitive resin composition, to promote plasticity, it also can further contain polyethylene tree
Rouge is as additive (G).As the specific example of polyvinyl resin, polyvinyl chloride, polystyrene, poly- hydroxy benzenes second can be enumerated
Alkene, polystyrene formic acid, polyvinyl methyl ether, polyvinyl ethyl ether, polyvinyl alcohol, polyvinyl pyrrolidone, gathers polyvinyl acetate
Vinylphenol and these copolymer etc..Polyvinyl resin, based on glass transition temperature it is lower for, preferably polyvinyl methyl ether.
Also, being formed to be promoted using photosensitive resin composition in chemical amplification positive photosensitive resin composition
Template and metal substrate followability, also can further contain then auxiliary agent as additive (G).
Furthermore in chemical amplification positive photosensitive resin composition, to promote coating, defoaming, equal levelling etc., also
Interfacial agent can further be contained as additive (G).As the specific example of interfacial agent, can enumerate BM-1000,
BM-1100 (being BM Chmie corporation), MEGAFACEF142D, MEGAFACE F172, MEGAFACE F173,
MEGAFACE F183 (being DIC corporation), FLUORAD FC-135, FLUORAD FC-170C, FLUORAD FC-430,
FLUORAD FC-431 (being Sumitomo 3M corporation), SURFLON S-112, SURFLON S-113, SURFLONS-131,
SURFLONS-141, SURFLON S-145 (being Asahi Glass corporation), SH-28PA, SH-190, SH-193, SZ-6032,
The commercially available fluorine such as SF-8428 (being Toray Silicone corporation) are interfacial agents, only non-limiting in these.
In addition, in chemical amplification positive photosensitive resin composition, to carry out the deliquescent fine tuning to imaging liquid, also
Acid, acid anhydrides or higher boiling solvent can further be contained as additive (G).
As acid and the specific example of acid anhydrides, acetic acid, propionic acid, n-butyric acie, isobutyric acid, positive valeric acid, isovaleric acid, benzene can be enumerated
The monocarboxylic acids class such as formic acid, cinnamic acid;Lactic acid, 2- hydroxybutyric acid, 3-hydroxybutyrate, salicylic acid, m-hydroxybenzoic acid, para hydroxybenzene
The hydroxyls list carboxylics such as formic acid, 2- hydroxyl cinnamic acid, 3- hydroxyl cinnamic acid, 4-Hydroxycinnamic Acid, 5- Hydroxy M Phthalic Acid, syringic acid
Acids;Oxalic acid, succinic acid, glutaric acid, adipic acid, maleic acid, itaconic acid, hexahydrophthalic acid, phthalic acid, isophthalic two
Formic acid, terephthalic acid (TPA), 1,2- cyclohexane dicarboxylic acid, 1,2,4- cyclohexanetricarboxylic acids, butane tetracarboxylic acid, trimellitic acid, benzene
Equal tetracid, pentamethylene tetrabasic carboxylic acid, butane tetracarboxylic acid, 1, the polybasic carboxylic acids class such as 2,5,8- naphthalene tetracarboxylic acids;Itaconic anhydride, succinic acid
Acid anhydride, citraconic anhydride, laurylene succinic anhydride, tricarballylic acid's acid anhydride, maleic anhydride, hexahydrophthalic anhydride, methyl tetrahydro are adjacent
Phthalate anhydride, humic acid acid anhydride, 1,2,3,4- butane tetracarboxylic acid anhydrides, pentamethylene tetracarboxylic dianhydride, phthalic anhydride, benzene equal four
The double trimellitic anhydrides of acid anhydrides, trimellitic anhydride, benzophenone tetracarboxylic anhydride, ethylene glycol, glycerine join trimellitic anhydride
Equal acid anhydrides.
Also, the specific example as higher boiling solvent, can enumerate N-METHYLFORMAMIDE, n,N-Dimethylformamide, N- first
Yl carboxylic acid anilides, N- methylacetamide, n,N-dimethylacetamide, N- methylpyrrole pyridine ketone, dimethyl sulfoxide, benzyl second
Ether, two hexyl ethers, pentanedione, different Buddhist ketone, caproic acid, octanoic acid, 1- octanol, 1 nonyl alcohol, benzyl alcohol, phenylmethyl acetate, benzoic acid
Ethyl ester, diethy-aceto oxalate, diethyl maleate, gamma-butyrolacton, ethylene carbonate, propene carbonate, phenyl Sai Lusu acetic acid esters
Deng.
Also, to promote sensitivity, also can further make containing sensitizer in chemical amplification positive photosensitive resin composition
For additive (G).
The manufacturing method of chemical amplification positive photosensitive resin composition
There is no particular restriction for the manufacturing method of chemical amplification positive photosensitive resin composition, can by it is above-mentioned it is each at
Divide and is made with common method mixing, stirring.As device workable when mixing, stirring by above-mentioned each ingredient, can enumerate
Dissolving machine, homogenizer, three-roll mill etc..After evenly mixing by above-mentioned each ingredient, also gained mixture can further be utilized
Sieve, molecular filter etc. are filtered.
The manufacturing method of substrate with mold
Using above-mentioned chemical amplification positive photosensitive resin composition, in the metal watch of the substrate with metal surface
It is formed on face and is not particularly limited as the method for the photoresist pattern of the mold to form electroplating formation body.
As preferable method, it can enumerate and include: layering steps, on the metal surface of the substrate with metal surface,
The photo-sensitive resin that lamination is made of above-mentioned chemical amplification positive photosensitive resin composition;Step of exposure, to sense
Photosensitive resin layer irradiates actinic ray or radioactive ray;And development step, the photo-sensitive resin after exposure is imaged, and make
At the manufacturing method of the substrate with mold of the mold to form electroplating formation body.
It as the substrate for lamination photo-sensitive resin, is not particularly limited, always known person can be used, can illustrate for example electric
The substrate of sub- part has been formed on set Wiring pattern person.It is using with metal surface for the substrate
Person;As the metal species for constituting metal surface, preferably copper, gold, aluminium, more preferably copper.
Photo-sensitive resin be with such as following manner on substrate.Also that is, by the chemical amplification positive of liquid
Photosensitive resin composition is coated on substrate, then the photoresist of desired film thickness is formed by heating removal solvent
Layer.The thickness of photo-sensitive resin, as long as can using desired film thickness formed as template photoresist pattern as long as be not particularly limited.Sense
The film thickness of photosensitive resin layer is not particularly limited, preferably 10 μm or more, more preferably 1 to 150 μm, and particularly good is 20 to 120 μm, most preferably
It is 20 to 100 μm.
As coating method of the photosensitive resin composition on substrate, method of spin coating, slot coated method, roller can be used
The methods of rubbing method, screen printing, scattering method.Prebake conditions preferably are carried out to photo-sensitive resin.Prebake conditions are because of sense
Type, mix proportions, coating film thickness of each ingredient in photosensitiveness resin combination etc. and it is different, only usually at 70 to 150 DEG C, preferably
It is 80 to 140 DEG C and 2 to 60 minutes or so.
To the photo-sensitive resin of such as above-mentioned formation, across the mask of predetermined pattern, it is photochemical selectively to irradiate (exposure)
Ray or radioactive ray, such as ultraviolet light or luminous ray that wavelength is 300 to 500nm.
As the line source of radioactive ray, Cooper-Hewitt lamp, high-pressure mercury-vapor lamp, extra-high-pressure mercury vapour lamp, metal halide can be used
Lamp, argon laser etc..Also, radioactive ray include microwave, infrared ray, luminous ray, ultraviolet light, X-ray, gamma-rays, electron beam, matter
Beamlet, neutron beam, ion beam etc..Radioactive ray exposure is the film of the composition or photo-sensitive resin because of photosensitive resin composition
Thickness is equal and different, such as is 100 to 10000mJ/cm when using extra-high-pressure mercury vapour lamp2.Also, radioactive ray include to make photoacid generator
(C) light activated is to generate acid.
After exposure, promote photo-sensitive resin heating the diffusion of acid by using known method, in photonasty tree
Exposed part in adipose membrane, makes the alkali-solubility of photo-sensitive resin change.
Secondly, follow existing prior art method to be imaged by the photo-sensitive resin after exposing, and by soluble portion
Divide dissolution, removal, and forms set photoresist pattern.At this point, being using alkaline aqueous solution as imaging liquid.
As imaging liquid, such as sodium hydroxide, potassium hydroxide, sodium carbonate, sodium metasilicate, sodium metasilicate, ammonium hydroxide, second can be used
Amine, n-propylamine, diethylamine, di-n-propylamine, triethylamine, methyl-diethyl-amine, dimethylethanolamine, triethanolamine, tetramethylphosphonihydroxide hydroxide
Ammonium, tetraethylammonium hydroxide, pyrroles, piperidines, 1,8- diazabicyclo [5,4,0] -7- hendecene, 1,5- diazabicyclo [4,3,
0] aqueous solution of the bases such as -5- nonane.Also, also the aqueous solution to above-mentioned bases can be added the water solubilitys such as methanol, ethyl alcohol in right amount
Aqueous solution made of organic solvent or interfacial agent is used as imaging liquid.
Time of developing be it is different because of the composition of photosensitive resin composition or the film thickness of photo-sensitive resin etc., usually 1
To 30 minutes.Developing method can be any for covering liquid method, infusion process, paddle method, injection visualization method etc..
After imaging, flowing water cleaning in 30 to 90 seconds is carried out, and is subject to drying using air gun or baking oven etc..In this way, i.e.
The substrate with mold for having the photoresist pattern as mold on the metal surface of the substrate with metal surface can be manufactured.
The manufacturing method of electroplating formation body
To (the portion removed with imaging liquid, non-photoresist portion being formed by according to the above method in the mold of the substrate with mold
Point), by conductors such as plating embedment metals, the electroplating formation body of the class of the connection terminal such as convex block or metal column can be formed.
In addition, plating process is not particularly limited, always known various methods can be used.As electroplate liquid, it is especially suitable for using
Plate solder, copper plating, gold plating, nickel plating solution.Remaining mold, finally follows common method to be gone using stripper etc.
It removes.
According to the above method, that is, being formed can inhibit undercutting, while the photoresist pattern as mold.By using being so made
The substrate for having the mold that can inhibit undercutting, the electroplating formation body excellent with the adhesion of substrate can be manufactured.
Embodiment will be enumerated below, and the present invention will be described in detail, but the invention is not limited in disclosed by these embodiments
Hold.
Detailed description of the invention
For above and other purpose, feature, advantage and embodiment of the invention can be clearer and more comprehensible, institute's accompanying drawings it is detailed
Carefully it is described as follows:
[Fig. 1] is the schematic diagram for measuring the rectangularity of photoresist pattern.
[symbol description]
100: substrate
120: photoresist pattern
122: photoresist portion
124: non-photoresist portion
Lb: bottom width
Lt: top width
Specific embodiment
The preparation of resin (A-1)
Synthesis example A-1-1
Nitrogen inlet, blender, heater, condenser pipe and temperature are set on 1000 milliliters of a volume of four cervical vertebra bottles
Meter.Then, the diethylene glycol dimethyl ether of 50 parts by weight is added, and oil bath temperature is warming up to 70 DEG C.Then, by 10 parts by weight
By the 3- methacryloxymethyl propylene oxide of formula (a-1-1c) compound represented (referred to as (a1-1-1)), 3 parts by weight
The methacrylic acid benzene of the methacrylic acids (referred to as (a1-3-1)) of (referred to as (a1-2-1)), 15 parts by weight, 60 parts by weight
Ester (referred to as (a1-3-3)), the methacrylic acid third butyl ester (referred to as (a1-3-6)) of 12 parts by weight and 3.5 parts by weight
Double -2- the methylbutyronitriles (referred to as AMBN) of 2,2 '-azos be added in four cervical vertebra bottles, and be slowly stirred above-mentioned mixed solution.It is whole
The reaction temperature of a polymerization process maintains 70 DEG C, and polymerization time continues 6 hours, after the completion of polymerization, by polymerizate from four necks
It is taken out in conical flask, and solvent is sloughed, resin (A-1-1) can be obtained.
Synthesis example A-1-2 to synthesis example A-1-11
Synthesis example A-1-2 to A-1-11 is to prepare resin (A-1-2) to (A- with the step identical as synthesis example A-1-1
1-11), different places is: change reaction temperature, the reaction time, composition type and usage amount, and state in detail in table 1.
The preparation of resin (A-2)
Synthesis example A-2-1
Nitrogen inlet, blender, heater, condenser pipe and temperature are set on 1000 milliliters of a volume of four cervical vertebra bottles
Meter.Then, the diethylene glycol dimethyl ether of 50 parts by weight is added, and oil bath temperature is warming up to 70 DEG C.Then, by 5 parts by weight
Acrylic acid (ethyl-diethylene glycol) ester (referred to as (a2-1-1)), 15 parts by weight methacrylic acid (referred to as (a2-3-1)),
2- methyl -2- Adamantylmethyl the propylene of the phenyl methacrylates (referred to as (a2-3-3)) of 60 parts by weight, 20 parts by weight
Four necks are added in acid esters (referred to as (a2-3-5)) and the double -2- methylbutyronitriles (referred to as AMBN) of 2,2 '-azos of 3.5 parts by weight
In conical flask, and it is slowly stirred above-mentioned mixed solution.The reaction temperature of entire polymerization process maintains 70 DEG C, and polymerization time continues 6
Hour, after the completion of polymerization, polymerizate is taken out, and solvent is sloughed from four cervical vertebra bottles, resin (A-2-1) can be obtained.
Synthesis example A-2-2 to A-2-15
Synthesis example A-2-2 to A-2-15 is to prepare resin (A-2-2) to (A- with the step identical as synthesis example A-2-1
2-15), different places is: change reaction temperature, the reaction time, composition type and usage amount, and state in detail in table 2.
The preparation of novolac resin (B)
Synthesis example B-1
Nitrogen inlet, blender, heater, condenser pipe and temperature are set on 1000 milliliters of a volume of four cervical vertebra bottles
Meter, import nitrogen after add 0.40 mole of m-cresol, 0.50 mole of p-Cresol, 0.10 mole of 3,4-Xylenol,
0.65 mole of formaldehyde and 0.2 mole of oxalic acid.Being slowly stirred makes reaction solution be warming up to 100 DEG C, and gathers at this temperature
Condensation 6 hours.Then, reaction solution is warming up to 180 DEG C, and is dried under reduced pressure with the pressure of 10mmHg, by solvent devolatilization
After can obtain novolac resin (B-1).
Synthesis example B-2 to synthesis example B-6
Synthesis example B-2 to synthesis example B-6 is to prepare novolac resin (B-2) with the step identical as synthesis example B-1
To (B-6), different places is: change reaction temperature, the reaction time, composition type and usage amount, and state in detail in table 3.
The preparation of chemical amplification positive photosensitive resin composition
Embodiment 1
By the resin (A-1-1) of resulting 50 parts by weight of aforementioned synthesis example, the resin (A-2-1) of 50 parts by weight, 20 weight
The third of 60 parts by weight is added in the novolac resin (B-1) and 0.5 parts by weight photoacid generator C-1 (hereinafter referred to as C-1) of part
After glycol methyl ether acetate (hereinafter referred to as D-1), with swing-out stirrer, dissolved mixing, i.e., it is modulated and chemical increasing
Width type positive-type photosensitive resin composition, the chemical amplification positive photosensitive resin composition is with following each evaluation of measuring
Mode is evaluated, and acquired results are as shown in table 4.
Embodiment 2 is to embodiment 25
Embodiment 2 to embodiment 25 is made using with the chemical amplification positive photosensitive resin composition of embodiment 1
The identical operating method of method, the difference is that embodiment 2 to embodiment 25 is to change chemical amplification positive photonasty tree
The type and usage amount of raw material in fat composition, formula and following evaluation result are as shown in table 4.
Comparative example 1 is to comparative example 9
Comparative example 1 to comparative example 9 is using the chemical amplification positive photosensitive resin composition production side with embodiment 1
The identical operating method of method, the difference is that comparative example 1 to comparative example 9 is to change chemical amplification positive photoresist group
At the type and usage amount of raw material in object, formula and following evaluation result are as shown in table 5.
Evaluation method
1. sensitivity:
By the chemical amplification positive photosensitive resin composition of Examples and Comparative Examples, it is coated on using spin coater
On copper base when 6,50 μm of film thickness of photo-sensitive resin is formed.Thereafter, the photo-sensitive resin is carried out at 110 DEG C
6 minutes prebake conditions.Mask and (the Ultratech company of exposure device Titan 2 after prebake conditions, using the sectional hole patterns of 60 μm of diameters
System), pattern exposure is carried out with g line, h line and i line and periodically changes light exposure.Then, by substrate-placing in heating plate
On, (PEB) is heated after exposure in 3 minutes is carried out at 100 DEG C.Thereafter, it drips 2.38% hydroxide four to photo-sensitive resin
First ammonium (TMAH) aqueous solution is placed 60 seconds at 23 DEG C, is repeated 4 times and is imaged.Thereafter, flowing water cleaning is carried out, then is blown
It spills nitrogen and obtains the thick film photoresist pattern of the contact hole pattern with 50 μm of diameters.
◎: light exposure < 100mJ/cm2
Zero: 100mJ/cm2≤ light exposure < 150mJ/cm2
Δ: 150mJ/cm2≤ light exposure < 200mJ/cm2
×: light exposure >=200mJ/cm2。
2. rectangularity:
Fig. 1 is please referred to, Fig. 1 is the schematic diagram for measuring the rectangularity of photoresist pattern.It is coated on the photoresist of substrate 100
Layer forms the photoresist pattern 120 with photoresist portion 122 and non-photoresist portion 124 after above-mentioned exposure, development step.For upper
The section configuration for stating the photoresist pattern of optimum exposure is observed, and bottom width Lb and the top in non-photoresist portion 124 are measured
The value of width Lt, and calculate index of the Lt/Lb value as rectangularity.Evaluation criterion is as follows:
◎: 0.9 < Lt/Lb< 1.1
Zero: 0.85 < Lt/Lb≤ 0.9 or 1.1≤Lt/Lb< 1.15
Δ: 0.75 < Lt/Lb≤ 0.85 or 1.15≤Lt/Lb< 1.25
×: Lt/Lb< 0.75 or Lt/Lb> 1.25.
As shown in table 4, when the resin (A-1) and resin for being used to synthesize chemical amplification positive photosensitive resin composition
(A-2) when mixture contains specific monomer (a-1-1), monomer (a-1-2) and monomer (a-2-1) respectively, chemical amplification type is just
The sensitivity of type photosensitive resin composition is good, and is formed by photoresist pattern also and has good rectangularity.Furthermore, when
The mixture of synthetic resin (A-2), which contains monomer (a-2-2) and/or resin (A-1) and resin (A-2), has specific amount ranges
When, it can more improve the rectangularity that chemical amplification positive photosensitive resin composition is formed by photoresist pattern.And in constituent
Anthracene compound (F) is used using in mercaptan compound (E) and/or constituent, can further improve the sensitivity of constituent.
On the other hand, as shown in table 5, if being used to synthesize the resin of chemical amplification positive photosensitive resin composition
(A-1) and the mixture of resin (A-2) does not contain specific monomer (a-1-1), monomer (a-1-2) and monomer (a-2-1), then chemical
The sensitivity of amplification positive photosensitive resin composition is bad and to be formed by the rectangularity of photoresist pattern poor.
The above described is only a preferred embodiment of the present invention, limitation in any form not is done to the present invention, though
So the present invention has been disclosed as a preferred embodiment, and however, it is not intended to limit the invention, any technology people for being familiar with this profession
Member, without departing from the scope of the present invention, when the technology contents using the disclosure above are modified or are modified
For the equivalent embodiment of equivalent variations, but anything that does not depart from the technical scheme of the invention content, according to the technical essence of the invention
Any simple modification, equivalent change and modification made to the above embodiment, all of which are still within the scope of the technical scheme of the invention.
Table 4
Table 5
Claims (13)
1. a kind of chemical amplification positive photosensitive resin composition characterized by comprising
Resin (A) includes resin (A-1) and resin (A-2);
Novolac resin (B);
Photoacid generator (C);And
Solvent (D),
Wherein the resin (A-1) is to be reacted by one first mixture and obtained, which includes monomer (a-1-1) and monomer
(a-1-2),
The monomer (a-1-1) contains the structure such as formula (a-1-1a):
In formula (a-1-1a), R1aFor hydrogen atom or methyl, R2aFor low alkyl group and X3aIt is common with the carbon atom that is bonded
Form the hydrocarbon ring of carbon number 5 to 20;And
The monomer (a-1-2) contains cyclic ether group, and
Wherein, which is to be reacted by one second mixture and obtained, which includes monomer (a-2-1), and should
Monomer (a-2-1) stretches alkyl chain containing polyoxy.
2. chemical amplification positive photosensitive resin composition according to claim 1, which is characterized in that second mixing
Object includes monomer (a-2-2), which contains the structural formula such as formula (a-2-2a):
In the formula (a-2-2a), R1bIt is respectively independent to indicate hydrogen atom ,-CH3、-CF3Or-CH2OH;R2bIndicate alkyl, naphthenic base
Or aryl;R3bTo R12bThe respectively independent alkyl for indicating hydrogen atom or contain or do not contain heteroatomic 1 valence, or formed mutually
Ring, wherein when forming ring mutually, R3bTo R12bExpression contains or does not contain heteroatomic divalent alkyl;R3bTo R12bIndicate bond
It can not be bonded each other between any object in adjacent carbon person, can also form double bond;T indicates the linker of singly-bound or divalent;The T
The divalent linker be stretch alkyl ,-COO-RtBase ,-O-RtBase, and RtAlkyl is stretched to stretch alkyl or ring.
3. chemical amplification positive photosensitive resin composition according to claim 1, which is characterized in that further include mercaptan
Compound (E), the mercaptan compound (E) have structure shown in following formula (E-1):
In the formula (E-1), R1c、R2cThe respectively independent alkyl for indicating that hydrogen atom or carbon number are 1 to 4, R3cIndicate singly-bound or carbon number
For 1 to 10 alkyl of stretching, R4cIndicate u valence organic group;U indicates 2 to 6 integer.
4. chemical amplification positive photosensitive resin composition according to claim 1, which is characterized in that further include anthracene class
Compound (F).
5. chemical amplification positive photosensitive resin composition according to claim 1, which is characterized in that be based on the resin
(A) total usage amount is 100 parts by weight, and the content of the novolac resin (B) is 20 parts by weight to 180 parts by weight, light acid
The content of producing agent (C) is 0.5 parts by weight to 4.5 parts by weight, and the content of the solvent (D) is 60 parts by weight to 800 parts by weight.
6. chemical amplification positive photosensitive resin composition according to claim 1, which is characterized in that be based on the resin
(A) total usage amount is 100 parts by weight, and the content of the resin (A-1) is 60 parts by weight to 90 parts by weight, and the resin (A-2)
Content be 10 parts by weight to 40 parts by weight.
7. chemical amplification positive photosensitive resin composition according to claim 1, which is characterized in that based on this first
Total usage amount of mixture is 100 parts by weight, and the content of the monomer (a-1-1) is 10 parts by weight to 50 parts by weight, the monomer (a-
Content 1-2) is 3 parts by weight to 20 parts by weight.
8. chemical amplification positive photosensitive resin composition according to claim 1, which is characterized in that based on this second
Total usage amount of mixture is 100 parts by weight, and the content of the monomer (a-2-1) is 5 parts by weight to 50 parts by weight.
9. chemical amplification positive photosensitive resin composition according to claim 2, which is characterized in that based on this second
Total usage amount of mixture is 100 parts by weight, and the content of the monomer (a-2-2) is 3 parts by weight to 20 parts by weight.
10. chemical amplification positive photosensitive resin composition according to claim 3, which is characterized in that be based on the tree
Total usage amount of rouge (A) is 100 parts by weight, and the content of the mercaptan compound (E) is 0.3 parts by weight to 3 parts by weight.
11. chemical amplification positive photosensitive resin composition according to claim 4, which is characterized in that be based on the tree
Total usage amount of rouge (A) is 100 parts by weight, and the content of the anthracene compound (F) is 0.2 parts by weight to 1.5 parts by weight.
12. a kind of manufacturing method of the substrate with mold characterized by comprising
Layering steps, on the metal surface of the substrate with metal surface, lamination is by such as claim 1 to claim 11
Any one of described in the photo-sensitive resin that is constituted of chemical amplification positive photosensitive resin composition;
Step of exposure irradiates active ray or radioactive ray to the photo-sensitive resin;And
Development step develops to the photo-sensitive resin after exposure, and is made the mold to form electroplating formation body.
13. a kind of manufacturing method of electroplating formation body characterized by comprising
It is real to the substrate manufactured by the manufacturing method by the substrate as claimed in claim 12 with mold with mold
Plating is applied, and the step of electroplating formation body is formed in the mold.
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TWI483075B (en) * | 2013-08-08 | 2015-05-01 | Chi Mei Corp | Negative photosensitive resin composition and application thereof |
TWI506372B (en) * | 2013-12-05 | 2015-11-01 | Chi Mei Corp | Positive-type photosensitive resin composition, pattern forming method, thin film transistor array substrate and liquid crystal display device |
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TW200641535A (en) * | 2005-02-03 | 2006-12-01 | Mitsubishi Gas Chemical Co | Compound for resist and radiation-sensitive composition |
JP2008287284A (en) * | 2008-07-31 | 2008-11-27 | Fujifilm Corp | Positive photosensitive composition |
CN103149795A (en) * | 2011-12-06 | 2013-06-12 | 富士胶片株式会社 | Manufacture methods of resin pattern, pattern substrate, thin film transistor substrate, layer insulation film and display device |
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TW201602720A (en) * | 2014-03-20 | 2016-01-16 | Tokyo Ohka Kogyo Co Ltd | Chemically amplified positive-type photosensitive resin composition for thick-film application |
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