CN109782087B - Test platform and test method of electronic device - Google Patents
Test platform and test method of electronic device Download PDFInfo
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- CN109782087B CN109782087B CN201811621652.1A CN201811621652A CN109782087B CN 109782087 B CN109782087 B CN 109782087B CN 201811621652 A CN201811621652 A CN 201811621652A CN 109782087 B CN109782087 B CN 109782087B
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Abstract
The application provides a test platform and a test method of an electronic device. The test platform is used for testing specific functions of an electronic device and comprises a workbench, a power supply controller, a first switch, a main board and a second switch, wherein the power supply controller is connected with the workbench, the first switch is electrically connected with the power supply controller to control the power-on state of the power supply controller, the main board is connected with the workbench and is electrically connected with the power supply controller, a wiring terminal is led out from a specific circuit on the main board and is used for being electrically connected with the electronic device, and the second switch is electrically connected with the main board to control the power-on state of the specific circuit. The test platform can effectively protect the tested electronic device.
Description
Technical Field
The present disclosure relates to testing of electronic devices, and particularly to a testing platform and a testing method of an electronic device.
Background
In recent years, the industry of electronic devices has been rapidly growing, and electronic products need to be subjected to quality inspection before being shipped out of a factory to confirm that all functions of the electronic devices can work normally, but a large part of repair products exist in after-sales data, which affects the image of a company in the mind of consumers and increases extra expenses of the company.
Disclosure of Invention
The application provides a test platform for testing specific functions of an electronic device, wherein the test platform comprises: the power supply controller is connected with the workbench, the first switch is electrically connected with the power supply controller to control the power-on state of the power supply controller, the main board is connected with the workbench and electrically connected with the power supply controller, a wiring terminal is led out from a specific circuit on the main board, the wiring terminal is used for being electrically connected with an electronic device, and the second switch is electrically connected with the main board to control the power-on state of the specific circuit.
The application also provides a test method of the electronic device, the test method is based on the test platform to test the electronic device, and the test method comprises the following steps: closing the first switch, and electrifying the main board by the power supply controller; the electronic device is buckled with the wiring terminal; closing the second switch, and conducting the specific circuit, so as to electrify the electronic device; whether the specific function of the electronic device is normal is detected.
In this application, let the mainboard be in the on-state through first switch, treat the voltage stability of mainboard, after surge phenomenon disappears, let specific circuit on the mainboard and electron device electrical property switch on through the second switch to avoid when testing electron device, too big voltage to electron device's damage, first switch and second switch mutually support and make electron device can test under safe voltage all the time. Binding post is external, and the workman has enough big operating space with electron device lock to binding post on to reduced binding post and at the risk that the lock in-process warp, improved binding post's life, secondly, even binding post damages, only need change binding post can, and need not change the mainboard again, improved test platform's maintenance efficiency.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.
FIG. 1 is a schematic structural diagram of an embodiment of a test platform provided herein;
FIG. 2 is a schematic view of the structure of FIG. 1 in the direction II-II;
FIG. 3 is a schematic structural diagram of another embodiment of a test platform provided herein;
FIG. 4 is a schematic structural diagram of another embodiment of a test platform provided herein;
FIG. 5 is a schematic structural diagram of another embodiment of a test platform provided herein;
FIG. 6 is a schematic structural diagram of another embodiment of a test platform provided herein;
fig. 7 is a flowchart illustrating an embodiment of a testing method for an electronic device provided in the present application.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. It is to be understood that the specific embodiments described herein are merely illustrative of the application and are not limiting of the application. It should be further noted that, for the convenience of description, only some of the structures related to the present application are shown in the drawings, not all of the structures. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
The electronic device provided by the embodiment of the application comprises electronic equipment such as a smart phone, a tablet personal computer, intelligent wearable equipment, a digital audio and video player, an electronic reader, a handheld game machine and vehicle-mounted electronic equipment.
The terms "first" and "second" in this application are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In the description of the present application, "plurality" means at least two, e.g., two, three, etc., unless explicitly specifically limited otherwise. All directional indications (such as up, down, left, right, front, and rear … …) in the embodiments of the present application are only used to explain the relative positional relationship between the components, the movement, and the like in a specific posture (as shown in the drawings), and if the specific posture is changed, the directional indication is changed accordingly. Furthermore, the terms "include" and "have," as well as any variations thereof, are intended to cover non-exclusive inclusions. Such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not limited to only those steps or elements but may alternatively include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
Referring to fig. 1, fig. 1 is a schematic structural diagram of an embodiment of a test platform 100 provided in the present application.
The test platform 100 provided by the present application can be used to test various specific functions of the electronic device 200, such as: determine whether the display module of the electronic device 200 is normal, determine whether the fingerprint module of the electronic device 200 is normal, determine whether the camera function of the electronic device 200 is normal, and the like. In the following embodiments, the details of the determination of whether the display and the touch pressure of the display module of the electronic device 200 are normal will be described.
The test platform 100 of the present embodiment includes a worktable 110, a power controller 120, a first switch 130, a main board 140, and a second switch 150.
The power controller 120 is connected to the table 110, the power controller 120 is used to control the overall circuit, and the first switch 130 is electrically connected to the power controller 120 to control the power-on state of the power controller 120. That is, when the first switch 130 is in the closed state, the power controller 120 is in the power-on state; when the first switch 130 is in the off state, the power controller 120 is in the power-off state.
The main board 140 is connected to the working platform 110 and electrically connected to the power controller 120, and a circuit for implementing each specific function of the electronic device 200 is laid on the main board 140. When determining that a specific function of the electronic device 200 needs to be tested, only a specific circuit on the main board 140 needs to be led out of the connection terminal 170, for example, in order to determine whether the display and touch pressure of the display module are normal, the connection terminal 170 only needs to be led out of a circuit on the main board 140 that controls the display module. Of course, a plurality of terminals 170 may be simultaneously led out from each circuit on the motherboard 140 to test each specific function of the electronic device 200.
The connection terminal 170 is used for electrically connecting with the electronic device 200, for example, the connection terminal 170 is a female socket, the electronic device 200 is led out of the male socket, and the male socket is buckled into the female socket, so that the connection terminal 170 is electrically connected with the electronic device 200. The second switch 150 is electrically connected to the main board 140, and specifically, the second switch 150 is electrically connected to a specific circuit on the main board 140 to control the power-on state of the specific circuit.
The specific test method of the test platform 100 of this embodiment is as follows: 1, pressing the first switch 130 to make the first switch 130 in a closed state, and the power controller 120 turning on the main board 140, at this time, the second switch 150 is in an open state; 2 the display module is buckled on the wiring terminal 170; 3, the second switch 150 is closed, and the display module is conducted with a specific circuit on the main board 140, so that the display module is in a power-on state; 4, testing whether the display and the touch pressure of the display module are normal; 5 disconnecting the second switch 150 (to prevent the worker from being injured by electric shock when connecting or disconnecting the electronic device 200 and the connection terminal 170), repeating the steps 2-5, and disconnecting the first switch 130 until all the display modules are tested.
In this embodiment, the first switch 130 enables the motherboard 140 to be in a power-on state, after the voltage of the motherboard 140 is stable and the surge phenomenon disappears, the second switch 150 enables the specific circuit on the motherboard 140 to be electrically connected with the electronic device 200, so as to avoid the damage of the electronic device 200 caused by an excessive voltage when the electronic device 200 is tested, and the first switch 130 and the second switch 150 cooperate with each other to enable the electronic device 200 to be tested under a safe voltage all the time. Binding post 170 is external, and the workman has enough big operating space to buckle electron device 200 to binding post 170 on to reduced binding post 170 and at the risk that the lock in-process warp, improved binding post 170's life, secondly, even binding post 170 damages, only need change binding post 170 can, and need not change mainboard 140 again, improved test platform 100's maintenance efficiency.
Referring to fig. 1 and 2, fig. 2 is a schematic structural diagram in a direction ii-ii of fig. 1 of the present application.
The test platform 100 of the present embodiment includes a worktable 110, a power controller 120, a first switch 130, a main board 140, a second switch 150, and a trigger cover 160.
The power controller 120 is connected to the table 110, the power controller 120 is used to control the overall circuit, and the first switch 130 is electrically connected to the power controller 120 to control the power-on state of the power controller 120. The main board 140 is connected to the working platform 110 and electrically connected to the power controller 120, and a circuit for implementing each specific function of the electronic device 200 is laid on the main board 140. When determining that a specific function of the electronic device 200 needs to be tested, only a specific circuit on the main board 140 needs to be led out of the connection terminal 170. Of course, a plurality of terminals 170 may be simultaneously led out from each circuit on the motherboard 140 to test each specific function of the electronic device 200.
The connection terminal 170 is used for electrically connecting with the electronic device 200, the second switch 150 is electrically connected with the motherboard 140, and the second switch 150 is electrically connected with a specific circuit on the motherboard 140 to control the power-on state of the specific circuit. The trigger cover 160 is hinged to the table 110, and the trigger cover 160 can rotate around the table 110. When the trigger cover plate 160 rotates to the second switch 150, the second switch 150 is pressed by the gravity of the trigger cover plate, so that the second fast switch is in a closed state, and the specific circuit is in a power-on state; the trigger cover 160 rotates in a direction away from the second switch 150 to be separated from the second switch 150, so that the second switch 150 is in an off state. (in the direction of the arrows in fig. 2). The self-gravity of the trigger cover plate 160 is constant, so that the pressing force applied to the second switch 150 is stable; in addition, the hinge position of the trigger cover 160 and the workbench 110 is also fixed, so that the position where the second switch 150 is pressed and held by the touch cover is fixed, and in summary, the stress and the stress point of the second switch 150 are fixed and controllable, and the uncertainty factor of non-manpower is large, so that the service life of the second switch 150 is prolonged. In addition, the risk of electric shock to the worker is reduced without the worker directly touching the second switch 150.
The test platform 100 further includes a support frame 180, and the working platform 110 has an upper surface 112 and a lower surface 114 which are oppositely arranged, and the upper surface 112 is a working surface facing the worker. The bracket 180 is mounted on the upper surface 112, the trigger cover 160 is hinged to the bracket 180, the trigger cover 160 is flat, and the trigger cover 160 presses the second switch 150 when rotated to be flush with the upper surface 112 of the table 110.
The trigger cover 160 includes a first cover portion 161 and a second cover portion 162, and a joint of the first cover portion 161 and the second cover portion 162 is hinged to the bracket 180, wherein the first cover portion 161 is configured to rotate to the second switch 150 to press the second switch 150, and the second cover portion 162 is configured to abut against the workbench 110 when the first cover portion 161 rotates in a direction away from the second switch 150 to prevent the first cover portion 161 from further rotating. The included angle between the first cover plate portion 161 and the workbench 110 can be controlled by controlling the specific length of the second cover plate portion 162, so that the purpose of accurately controlling the specific working space of the testing platform 100 is achieved.
The worktable 110 is provided with a first through hole 116 and a second through hole 118 communicating the upper surface 112 and the lower surface 114, the main board 140 is mounted on the lower surface 114 of the worktable 110, the connection terminal 170 passes through the first through hole 116, and the second switch 150 is mounted in the second through hole 118. At this time, the second switch 150 may be beyond the second through hole 118 to receive the capping of the trigger cap 160.
Referring to fig. 3, fig. 3 is a schematic structural diagram of another embodiment of the test platform 100 provided in the present application.
The test platform 100 of the present embodiment includes a worktable 110, a power controller 120, a first switch 130, a main board 140, a second switch 150, a trigger cover 160, and a bracket 180.
The power controller 120 is connected to the table 110, the power controller 120 is used to control the overall circuit, and the first switch 130 is electrically connected to the power controller 120 to control the power-on state of the power controller 120. The main board 140 is connected to the working platform 110 and electrically connected to the power controller 120, and a circuit for implementing each specific function of the electronic device 200 is laid on the main board 140. When determining that a specific function of the electronic device 200 needs to be tested, only a specific circuit on the main board 140 needs to be led out of the connection terminal 170. Of course, a plurality of terminals 170 may be simultaneously led out from each circuit on the motherboard 140 to test each specific function of the electronic device 200. The connection terminal 170 is used for electrically connecting with the electronic device 200, the second switch 150 is electrically connected with the motherboard 140, and the second switch 150 is electrically connected with a specific circuit on the motherboard 140 to control the power-on state of the specific circuit.
The table 110 has an upper surface 112 and a lower surface 114 disposed opposite to each other, and the upper surface 112 is a working surface facing a worker. The worktable 110 is provided with a first through hole 116 and a second through hole 118 communicating the upper surface 112 and the lower surface 114, the main board 140 is mounted on the lower surface 114 of the worktable 110, the connection terminal 170 passes through the first through hole 116, and the second switch 150 is mounted in the second through hole 118.
The bracket 180 is mounted on the upper surface 112, the trigger cover 160 is hinged to the bracket 180, the trigger cover 160 is provided with an interference portion 163 in a protruding manner, the trigger cover 160 can rotate around the bracket 180, and when the trigger cover 160 rotates to be flush with the upper surface 112 of the working table 110, the interference portion 163 can be inserted into the second through hole 118 along with the rotation of the trigger cover 160 to press the second switch 150, so that the second switch 150 is in a closed state. (in the direction of the arrows in fig. 3).
Referring to fig. 4, fig. 4 is a schematic structural diagram of another embodiment of the test platform 100 provided in the present application.
The test platform 100 of the present embodiment includes a worktable 110, a power controller 120, a first switch 130, a main board 140, a second switch 150, a trigger cover 160, and a bracket 180.
The power controller 120 is connected to the table 110, the power controller 120 is used to control the overall circuit, and the first switch 130 is electrically connected to the power controller 120 to control the power-on state of the power controller 120. The main board 140 is connected to the working platform 110 and electrically connected to the power controller 120, and a circuit for implementing each specific function of the electronic device 200 is laid on the main board 140. When determining that a specific function of the electronic device 200 needs to be tested, only a specific circuit on the main board 140 needs to be led out of the connection terminal 170. Of course, a plurality of terminals 170 may be simultaneously led out from each circuit on the motherboard 140 to test each specific function of the electronic device 200. The connection terminal 170 is used for electrically connecting with the electronic device 200, the second switch 150 is electrically connected with the motherboard 140, and the second switch 150 is electrically connected with a specific circuit on the motherboard 140 to control the power-on state of the specific circuit.
The table 110 has an upper surface 112 and a lower surface 114 disposed opposite to each other, and the upper surface 112 is a working surface facing a worker. The worktable 110 is provided with a first through hole 116 and a second through hole 118 communicating the upper surface 112 and the lower surface 114, the main board 140 is mounted on the lower surface 114 of the worktable 110, the connection terminal 170 passes through the first through hole 116, and the second switch 150 is mounted in the second through hole 118.
The bracket 180 is mounted on the upper surface 112, the trigger cover 160 is hinged to the bracket 180, the trigger cover 160 is provided with an interference portion 163 in a protruding manner, the trigger cover 160 can rotate around the bracket 180, and when the trigger cover 160 rotates to be flush with the upper surface 112 of the working table 110, the interference portion 163 can be inserted into the second through hole 118 along with the rotation of the trigger cover 160 to press the second switch 150, so that the second switch 150 is in a closed state. (in the direction of the arrows in fig. 4).
Specifically, the trigger cover plate 160 has a first surface 164, a second surface 165 and a third surface 166 which are adjacent in sequence, the first surface 164 and the third surface 166 are hinged to the support 180, when the second switch 150 is in a press-fit state, the second surface 165 faces the upper surface 112, the trigger cover plate 160 penetrates through the first surface 164, the second surface 165 and the third surface 166 to be provided with a catching groove 167, and the catching groove 167 is used for providing an avoiding space when the trigger cover plate 160 is caught and rotated.
Referring to fig. 5, fig. 5 is a schematic structural diagram of another embodiment of the test platform 100 provided in the present application.
The test platform 100 of the present embodiment includes a worktable 110, a power controller 120, a first switch 130, a main board 140, a second switch 150, a trigger cover 160, and a bracket 180.
The power controller 120 is connected to the table 110, the power controller 120 is used to control the overall circuit, and the first switch 130 is electrically connected to the power controller 120 to control the power-on state of the power controller 120. The main board 140 is connected to the working platform 110 and electrically connected to the power controller 120, and a circuit for implementing each specific function of the electronic device 200 is laid on the main board 140. When determining that a specific function of the electronic device 200 needs to be tested, only a specific circuit on the main board 140 needs to be led out of the connection terminal 170. Of course, a plurality of terminals 170 may be simultaneously led out from each circuit on the motherboard 140 to test each specific function of the electronic device 200. The connection terminal 170 is used for electrically connecting with the electronic device 200, the second switch 150 is electrically connected with the motherboard 140, and the second switch 150 is electrically connected with a specific circuit on the motherboard 140 to control the power-on state of the specific circuit.
The table 110 has an upper surface 112 and a lower surface 114 disposed opposite to each other, and the upper surface 112 is a working surface facing a worker. The worktable 110 is provided with a first through hole 116 and a second through hole 118 communicating the upper surface 112 and the lower surface 114, the main board 140 is mounted on the lower surface 114 of the worktable 110, the connection terminal 170 passes through the first through hole 116, and the second switch 150 is mounted in the second through hole 118.
The bracket 180 is mounted on the upper surface 112, the trigger cover 160 is hinged to the bracket 180, the trigger cover 160 is provided with an interference portion 163 in a protruding manner, the trigger cover 160 can rotate around the bracket 180, and when the trigger cover 160 rotates to be flush with the upper surface 112 of the working table 110, the interference portion 163 can be inserted into the second through hole 118 along with the rotation of the trigger cover 160 to press the second switch 150, so that the second switch 150 is in a closed state. (in the direction of the arrows in fig. 5).
Specifically, the trigger cover plate 160 has a first surface 164, a second surface 165 and a third surface 166 which are adjacent in sequence, the first surface 164 and the third surface 166 are respectively hinged to the bracket 180, when the second switch 150 is in a press-fit state, the second surface 165 faces the upper surface 112, and a handle 168 is convexly arranged on the first surface 164 and/or the third surface 166, and the handle 168 is used for providing a grabbing position when the trigger cover plate 160 is rotated.
Referring to fig. 6, fig. 6 is a schematic structural diagram of another embodiment of the test platform 100 provided in the present application.
The test platform 100 of the present embodiment includes a worktable 110, a power controller 120, a first switch 130, a main board 140, a second switch 150, a trigger cover 160, a bracket 180, and a buffer 190.
The power controller 120 is connected to the table 110, the power controller 120 is used to control the overall circuit, and the first switch 130 is electrically connected to the power controller 120 to control the power-on state of the power controller 120. The main board 140 is connected to the working platform 110 and electrically connected to the power controller 120, and a circuit for implementing each specific function of the electronic device 200 is laid on the main board 140. When determining that a specific function of the electronic device 200 needs to be tested, only a specific circuit on the main board 140 needs to be led out of the connection terminal 170. Of course, a plurality of terminals 170 may be simultaneously led out from each circuit on the motherboard 140 to test each specific function of the electronic device 200. The connection terminal 170 is used for electrically connecting with the electronic device 200, the second switch 150 is electrically connected with the motherboard 140, and the second switch 150 is electrically connected with a specific circuit on the motherboard 140 to control the power-on state of the specific circuit.
The table 110 has an upper surface 112 and a lower surface 114 disposed opposite to each other, and the upper surface 112 is a working surface facing a worker. The worktable 110 is provided with a first through hole 116 and a second through hole 118 communicating the upper surface 112 and the lower surface 114, the main board 140 is mounted on the lower surface 114 of the worktable 110, the connection terminal 170 passes through the first through hole 116, and the second switch 150 is mounted in the second through hole 118.
The bracket 180 is mounted on the upper surface 112, the trigger cover 160 is hinged to the bracket 180, the trigger cover 160 can rotate around the bracket 180, and when the trigger cover 160 rotates to be flush with the upper surface 112 of the workbench 110, the trigger cover 160 can cover and press the second switch 150 in the second through hole 118, so that the second switch 150 is in a closed state.
The buffer member 190 has a buffering effect, and the buffer member 190 may be silica gel, foam, a spring, or the like. The upper surface 112 of the worktable 110 is provided with an accommodating groove, the buffer 190 is installed in the accommodating groove, and the trigger cover plate 160 is pressed on the buffer 190 when rotating to be flush with the upper surface 112 of the worktable 110, so as to buffer the impact force of the trigger cover plate 160, and the touch cover plate is slowly pressed on the second switch 150.
Specifically, the trigger cover plate 160 has a first surface 164, a second surface 165 and a third surface 166 which are adjacent in sequence, the first surface 164 and the third surface 166 are hinged to the bracket 180, when the second switch 150 is in a press-fit state, the second surface 165 faces the upper surface 112, the second surface 165 is provided with an avoiding groove 169, when the trigger cover plate 160 rotates to be flush with the upper surface 112 of the workbench 110, the buffer 190 is pressed simultaneously, and the buffer 190 is accommodated in the avoiding groove 169. The design of the avoiding groove 169 may allow the size of the buffer 190 to be increased to improve the buffering effect of the buffer 190.
In the embodiments described herein, a particular feature, structure, or characteristic described in connection with the embodiments may be included in at least one embodiment of the application. The appearances of the phrase in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. It is explicitly and implicitly understood by one skilled in the art that the embodiments described herein can be combined with other embodiments.
Referring to fig. 1 and 7, fig. 7 is a flowchart illustrating an embodiment of a testing method for an electronic device 200 according to the present disclosure.
The test method utilizes the test platform of any one of the embodiments to test the specific functions of the electronic device.
M101: the first switch is closed.
When the first switch 130 is pressed to turn on the first switch 130, the power controller 120 turns on the main board 140, and the second switch 150 is turned off. The main board 140 is electrically connected to the power controller 120, and a circuit for implementing each specific function of the electronic device 200 is laid on the main board 140. When determining that a specific function of the electronic device 200 needs to be tested, only a specific circuit on the main board 140 needs to be led out of the connection terminal 170, for example, in order to determine whether the display and touch pressure of the display module are normal, the connection terminal 170 only needs to be led out of a circuit on the main board 140 that controls the display module. Of course, a plurality of terminals 170 may be simultaneously led out from each circuit on the motherboard 140 to test each specific function of the electronic device 200. When the second switch 150 is in the off state, the specific circuit on the main board 140 is in the non-energized state.
M102: the electronic device is buckled with the wiring terminal.
The connection terminal 170 is used for electrically connecting with the electronic device 200, for example, the connection terminal 170 is a female socket, the electronic device 200 is led out of the male socket, and the male socket is buckled into the female socket, so that the connection terminal 170 is electrically connected with the electronic device 200.
M103: the second switch is closed.
The second switch 150 is electrically connected to the main board 140, and specifically, the second switch 150 is electrically connected to a specific circuit on the main board 140 to control the power-on state of the specific circuit. When the second switch 150 is closed, the electronic device 200 is conducted with a specific circuit on the main board 140, so that the electronic device 200 is in a power-on state.
M104: a particular function of the electronic device is detected.
After testing whether the specific functions of the electronic device 200 are normal, the second switch 150 is turned off (to prevent a worker from being injured by electric shock when connecting or disconnecting the electronic device 200 and the connection terminal 170), and the steps M102-M104 are repeated until all the electronic devices 200 are tested, and the first switch 130 is turned off.
The above description is only for the purpose of illustrating embodiments of the present invention and is not intended to limit the scope of the present invention, and all modifications, equivalents, and equivalent structures or equivalent processes that can be used directly or indirectly in other related fields of technology shall be encompassed by the present invention.
Claims (8)
1. A test platform for testing specific functions of an electronic device, the test platform comprising: the power supply controller is connected with the workbench, the first switch is electrically connected with the power supply controller to control the power-on state of the power supply controller, the mainboard is connected with the workbench and is electrically connected with the power supply controller, a wiring terminal is led out from a specific circuit on the mainboard, the wiring terminal is used for being electrically connected with the electronic device, the second switch is electrically connected with the mainboard to control the power-on state of the specific circuit, the trigger cover plate is hinged with the workbench, and the trigger cover plate is used for rotating to the position of the second switch to press the second switch so as to enable the specific circuit to be in the power-on state;
the workbench is provided with an upper surface and a lower surface which are oppositely arranged, the workbench is provided with a second through hole which is communicated with the upper surface and the lower surface, the second switch is arranged in the second through hole, the trigger cover plate is convexly provided with a collision part, and the collision part can be inserted into the second through hole along with the rotation of the trigger cover plate so as to press the second switch.
2. The test platform of claim 1, further comprising a bracket mounted on the upper surface, the trigger cover being hingedly attached to the bracket, the trigger cover pressing the second switch when rotated to be flush with the upper surface of the table.
3. The test platform of claim 2, wherein the trigger cover comprises a first cover portion and a second cover portion, and a joint of the first cover portion and the second cover portion is hinged to the bracket, wherein the first cover portion is configured to rotate to the second switch to press the second switch, and the second cover portion is configured to abut against the workbench when the first cover portion rotates in a direction away from the second switch to prevent further rotation of the first cover portion.
4. The test platform of claim 2, wherein the workbench is provided with a first through hole communicating the upper surface and the lower surface, the main board is mounted on the lower surface of the workbench, and the wiring terminal penetrates out of the first through hole.
5. The test platform of claim 2, wherein the trigger cover has a first surface, a second surface and a third surface adjacent to each other in sequence, the first surface and the third surface are respectively hinged to the bracket, when the second switch is in a press-fit state, the second surface faces the upper surface, the trigger cover has a catching groove penetrating through the first surface, the second surface and the third surface, and the catching groove is used for providing an avoiding space for the trigger cover to rotate when being caught.
6. The test platform of claim 5, wherein the first face and/or the third face is convexly provided with a handle for providing a gripping location when the trigger cover is rotated.
7. The testing platform of claim 2, wherein the top surface of the worktable has a receiving groove, the testing platform further comprises a buffer member installed in the receiving groove, and the trigger cover plate presses the buffer member when rotating to be flush with the top surface of the worktable.
8. A method for testing an electronic device, wherein the method is based on the test platform of any one of claims 1 to 7, and the method comprises:
closing the first switch, and electrifying the mainboard by the power controller;
the electronic device is buckled with the wiring terminal;
rotating the trigger cover plate until the abutting part convexly arranged on the trigger cover plate is inserted into the second through hole on the workbench so as to close the second switch, and conducting the specific circuit, so that the electronic device is electrified;
whether the specific function of the electronic device is normal is detected.
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| CN201811621652.1A CN109782087B (en) | 2018-12-28 | 2018-12-28 | Test platform and test method of electronic device |
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| CN201811621652.1A CN109782087B (en) | 2018-12-28 | 2018-12-28 | Test platform and test method of electronic device |
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| CN109782087B true CN109782087B (en) | 2021-07-27 |
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