CN109752452B - Probe stepping device for eddy current detection of fine cracks - Google Patents
Probe stepping device for eddy current detection of fine cracks Download PDFInfo
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- CN109752452B CN109752452B CN201910154506.0A CN201910154506A CN109752452B CN 109752452 B CN109752452 B CN 109752452B CN 201910154506 A CN201910154506 A CN 201910154506A CN 109752452 B CN109752452 B CN 109752452B
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Abstract
A probe stepping device for detecting micro cracks by vortex is characterized in that a base plate is arranged on the surface of a detected area of an airplane, gaskets with the same thickness are arranged between two limiting blocks and a positioning plate, the rear end face of the positioning plate is contacted with the positioning block through the gaskets, and the vortex probe is used for conducting high-frequency vortex inspection along the front end face and the rear end face of the positioning plate. And then a gasket is added between the limiting block and the positioning plate, so that the positioning plate performs incremental displacement to the outside, the positioning plate is parallel to the moving surface after moving, the eddy current probe is used for high-frequency eddy current inspection along the front end surface and the rear end surface of the positioning plate as guiding, and the positioning plate is continuously moved in an incremental manner through continuously adding the gasket, so that the eddy current probe continuously scans along the straight lines parallel to each other. The marker pen is not required to be used for drawing lines, so that stable scanning guidance is provided for the eddy current probe, and the inspection efficiency and the reliability of detecting fine cracks are greatly improved. Meanwhile, the paint surface is not polluted.
Description
Technical Field
The invention relates to the technical field of aircraft maintenance tools, in particular to a probe stepping device for detecting microcracks by vortex.
Background
For nondestructive detection of damage to an aircraft metal structure, the eddy current detection method is the most widely applied method, and the size of a crack required to be detected is fine, for example, a boeing company is required to detect whether a crack exists on a back beam chord of a horizontal stabilizer, and the crack with the length of not less than 0.100 inch is required to be detected, and the parallel scanning interval is 0.050 inch at maximum. Because of the limitation of the marking tool, such as the large diameter of the nib of the marker, the spacing between two adjacent marking lines 11 may be greater than the length of the crack 12 after the marking, thereby failing to mark a scanning spacing of 0.050 inches, as shown in fig. 3. Meanwhile, the paint layer cannot be removed due to the penetration of the marker pen oil into the paint layer, so that paint surface pollution is caused. The marking pen is used for drawing lines in a long time, and the method for marking the grid lines in the detected area is only suitable for the conditions of small area, no paint layer coverage, easy cleaning and large detected crack size, and has more limiting factors. Therefore, if the method of marking the grid lines is used for large-area detection of the microcracks, the working efficiency is low, pollution is caused to the paint layer, the cleanliness requirement is high, and more importantly, the reliability of the detection of the microcracks is difficult to ensure. The probe stepper is used to ensure that the scan pitch per probe movement can be maintained at a pitch increment of 0.050 inches to complete all inspection of the inspected area.
Disclosure of Invention
In order to overcome the defects of the technology, the invention provides the probe stepping device for detecting the microcracks by the eddy current, which is used for improving the reliability of detecting the microcracks and avoiding the occurrence of the condition of missed detection.
The technical scheme adopted for overcoming the technical problems is as follows:
a probe stepper for eddy current inspection of microcracks, comprising:
the base plate is horizontally arranged on the surface of the detected area of the airplane;
the two limiting blocks are in an L-shaped structure, are respectively fixed on the left side and the right side of the base plate through screws, the front end faces of the two limiting blocks are perpendicular to the base plate, and the front end faces of the two limiting blocks are located on the same plane;
the positioning plate is of a strip-shaped structure and is arranged above the base plate;
a plurality of groups of gaskets are arranged between the rear end of the positioning plate and each limiting block, the rear end face of the positioning plate is contacted with the front end face of the limiting block, the front end face and the rear end face of the positioning plate are perpendicular to the base plate, and the front end face and the rear end face of the positioning plate are parallel to the front end faces of the two limiting blocks.
Further, the base plate is of a U-shaped structure, a sliding groove is formed in the base plate, a track matched with the sliding groove is arranged at the lower end of the positioning plate, and the positioning plate is slidably mounted in the sliding groove through the track.
The beneficial effects of the invention are as follows: when the device is used, the base plate is placed on the surface of a detected area of an airplane, gaskets with the same thickness are placed between the two limiting blocks and the positioning plate, the rear end face of the positioning plate is contacted with the limiting blocks through the gaskets, and the eddy current probe is used for conducting high-frequency eddy current inspection along the front end face and the rear end face of the positioning plate. And then a gasket is added between the limiting block and the positioning plate, so that the positioning plate performs incremental displacement to the outside, the positioning plate is parallel to the moving surface after moving, the eddy current probe is used for high-frequency eddy current inspection along the front end surface and the rear end surface of the positioning plate as guiding, and the positioning plate is continuously moved in an incremental manner through continuously adding the gasket, so that the eddy current probe continuously scans along the straight lines parallel to each other. The marker pen is not required to be used for drawing lines, so that stable scanning guidance is provided for the eddy current probe, and the inspection efficiency and the reliability of detecting fine cracks are greatly improved. Meanwhile, the paint surface is not polluted.
Drawings
FIG. 1 is an exploded view of a three-dimensional structure of the present invention;
FIG. 2 is a schematic perspective view of the present invention;
FIG. 3 is a schematic view of the marker after drawing a line;
in the figure, 1, a base plate 2, a sliding groove 3, a screw 4, a limiting block 5, a gasket 6, a positioning plate 7 and a track.
Detailed Description
The invention will be further described with reference to fig. 1, 2 and 3.
A probe stepper for eddy current inspection of microcracks, comprising: a base plate 1 which is horizontally placed on the surface of a detected area of the airplane; the two limiting blocks 4 are in an L-shaped structure, the two limiting blocks 4 are respectively fixed on the left side and the right side of the base plate 1 through screws 3, the front end faces of the two limiting blocks 4 are perpendicular to the base plate 1, and the front end faces of the two limiting blocks 4 are located on the same plane; a positioning plate 6 having a strip-like structure and disposed above the base plate 1; a plurality of groups of gaskets 5 are arranged between the rear end of the positioning plate 6 and each limiting block 4, the rear end face of the positioning plate 6 is contacted with the foremost gasket, the rearmost gasket is contacted with the front end face of the limiting block 4, the front end face and the rear end face of the positioning plate 6 are perpendicular to the base plate 1, and the front end face and the rear end face of the positioning plate 6 are parallel to the front end faces of the two limiting blocks 4. When the device is used, the base plate 1 is placed on the surface of a detected area of an airplane, the gasket 5 with the same thickness is placed between the two limiting blocks 4 and the locating plate 6, the rear end face of the locating plate 6 is contacted with the limiting blocks 4 through the gasket 5, and the eddy current probe is used for conducting high-frequency eddy current inspection along the front end face and the rear end face of the locating plate 6. Then, a gasket 5 is added between the limiting block 4 and the positioning plate 6, so that the positioning plate 6 performs incremental displacement to the outside, meanwhile, the positioning plate 6 is parallel to the front surface before moving after moving, the eddy current probe is used for conducting high-frequency eddy current inspection along the front end surface and the rear end surface of the positioning plate 6 as guiding, and the gasket 5 is continuously added, so that the positioning plate 6 is continuously moved in an incremental mode, and the eddy current probe is continuously scanned along the straight lines parallel to each other. The marker pen is not required to be used for drawing lines, so that stable scanning guidance is provided for the eddy current probe, and the inspection efficiency and the reliability of detecting fine cracks are greatly improved. Meanwhile, the paint surface is not polluted.
The shims 5 may take three sizes, 0.050 inch, 0.250 inch, and 0.500 inch, respectively, each time with 0.050 inch as a scanning increment, when the thickness of the stack of shims 5 exceeds 1 inch, then scanning along the front face of locating plate 6 is not required, as the area of trailing edge inspection can cover the leading edge area.
Further, the base plate 1 is of a U-shaped structure, a sliding groove 2 is formed in the base plate, a track 7 matched with the sliding groove 2 is arranged at the lower end of the positioning plate 6, and the positioning plate 6 is slidably mounted in the sliding groove 2 through the track 7. The chute 2 can play a guiding role, so that the positioning plate 6 can slide along the guiding of the chute 2 through the track 7, and the front end face of the positioning plate is always parallel to the front end faces of the two limiting blocks 4.
Claims (2)
1. A probe stepping apparatus for eddy current inspection of microcracks, comprising:
a base plate (1) which is horizontally arranged on the surface of a detected area of the airplane;
the two limiting blocks (4) are of an L-shaped structure, the two limiting blocks (4) are respectively fixed on the left side and the right side of the base plate (1) through screws (3), the front end faces of the two limiting blocks (4) are perpendicular to the base plate (1), and the front end faces of the two limiting blocks (4) are located on the same plane;
a positioning plate (6) which is a strip-shaped structure and is arranged above the base plate (1);
a plurality of groups of gaskets (5) are arranged between the rear end of the positioning plate (6) and each limiting block (4), the rear end face of the positioning plate (6) is in contact with the front end face of the limiting block (4), the front end face and the rear end face of the positioning plate (6) are perpendicular to the base plate (1), and the front end face and the rear end face of the positioning plate (6) are parallel to the front end faces of the two limiting blocks (4).
2. The probe stepper for eddy current inspection of microcracks of claim 1 wherein: the base plate (1) is of a U-shaped structure, a sliding groove (2) is formed in the base plate, a track (7) matched with the sliding groove (2) is formed in the lower end of the positioning plate (6), and the positioning plate (6) is slidably mounted in the sliding groove (2) through the track (7).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910154506.0A CN109752452B (en) | 2019-03-01 | 2019-03-01 | Probe stepping device for eddy current detection of fine cracks |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910154506.0A CN109752452B (en) | 2019-03-01 | 2019-03-01 | Probe stepping device for eddy current detection of fine cracks |
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| CN109752452A CN109752452A (en) | 2019-05-14 |
| CN109752452B true CN109752452B (en) | 2023-09-29 |
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| CN201910154506.0A Active CN109752452B (en) | 2019-03-01 | 2019-03-01 | Probe stepping device for eddy current detection of fine cracks |
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| CN109752452A (en) | 2019-05-14 |
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