CN104777237A - Test block assembly for electric contact ultrasonic inspection of low-voltage apparatuses - Google Patents
Test block assembly for electric contact ultrasonic inspection of low-voltage apparatuses Download PDFInfo
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- CN104777237A CN104777237A CN201510170184.0A CN201510170184A CN104777237A CN 104777237 A CN104777237 A CN 104777237A CN 201510170184 A CN201510170184 A CN 201510170184A CN 104777237 A CN104777237 A CN 104777237A
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Abstract
The invention discloses a test block assembly for electric contact ultrasonic inspection of low-voltage apparatuses. The test block assembly comprises a plate base body, and test blocks which are assembled on the plate base body in an inlaid mode, wherein the test blocks respectively refer to a slit type test block, a thickness resolution test block, an inclined surface type test block and an arc surface type test block; a counter bore array is arranged on the plate base body; and four groups of test blocks are inlaid on the plate base body by virtue of the counter bores of the counter bore array. The test block assembly disclosed by the invention can be matched with an ultrasonic scanning technology, and the acoustic resolution and thickness resolution of different thicknesses, different depths and different widths can be calibrated by virtue of an ultrasonic probe; and moreover, the one-site common function requirements are met, the specified test blocks in multiple standards are replaced, and the working efficiency is improved.
Description
Technical field
The invention belongs to UT (Ultrasonic Testing) equipment technology field, more particularly, relate to a kind of low-voltage electrical apparatus electric contact UT (Ultrasonic Testing) test block assembly.
Background technology
Ultrasound examination is one of lossless detection method be most widely used at present.Indispensable element when standard testing block is Ultrasonic NDT, it is mainly used in probe, the performance test of detector, the adjustment of sensitivity, and the work of the aspect such as the adjustment of measurement range.In real work, need to adopt different UT (Ultrasonic Testing) standards because job specification is different and sample work piece is different.At present, in Ultrasonic Nondestructive field, the kind of test block is single compared with multi-usage, and country variant has the standard of country variant, when therefore staff carries out ultrasound examination, need multiple standard testing block co-operation just can complete Testing index, simultaneously, to the ultrasound examination of Low Voltage Electrical Apparatus, existing standard testing block does not take into full account the surface configuration of workpiece for measurement, and testing standard is also imperfect.
Summary of the invention
For above-mentioned defect of the prior art, the object of the invention is to design a kind of low-voltage electrical apparatus electric contact UT (Ultrasonic Testing) test block assembly, multiple Special test block can be replaced, can all kinds of indexs of quick and precisely detection probe, take into full account the surface configuration of electrical contact in electrical contact field simultaneously, meet multiple need of work.
For achieving the above object, the technical solution used in the present invention is:
The invention provides a kind of low-voltage electrical apparatus electric contact UT (Ultrasonic Testing) test block assembly, comprise a board substrate and the inserted four groups of test blocks be assembled on described board substrate, four groups of test blocks are respectively slit-type test block, thickness resolution test block, plagiohedral test block and cabochon test block; Wherein: described board substrate is provided with counterbore array; Four groups of test blocks are embedded on described board substrate by the counterbore of described counterbore array.
Preferably, described slit-type test block is embedded in the two row counterbores above of the counterbore array on described board substrate, described thickness resolution test block is embedded in the left side two row counterbore of four lines below the counterbore array on described board substrate, below the counterbore array that described plagiohedral test block and cabochon test block are embedded in described board substrate respectively the right three of four lines arrange in a wherein row counterbore in.
Preferably, described board substrate is rectangular parallelepiped thin plate, and the thickness of described board substrate is 40 ~ 50mm.
Preferably, described counterbore array, is provided with multiple cylinder counterbore or multiple square or rectangular parallelepiped counterbore.
Preferably, described slit-type test block has ten groups, and wherein five groups are laterally embedded in the counterbore of counterbore array of described board substrate, and other five groups are longitudinally embedded in the counterbore of described board substrate; The stainless-steel sheet pasted is embedded in first group of counterbore of described board substrate; Often the test block of slit-type described in group forms with an identical gap bonding by the stainless-steel sheet of polylith consistency of thickness; Between each group the thickness of the stainless-steel sheet of described slit-type test block and gap different.
Preferably, described thickness resolution test block has eight groups, and described in eight groups, the thickness of thickness resolution test block is different, and thickness is arranged as 0.5mm, 1.0mm, 1.5mm, 2.0mm, 2.5mm, 3.0mm, 3.5mm, 4.0mm; Correspondingly, the countersunk head degree of depth of eight counterbores that described counterbore array is arranged is respectively 0.5mm, 1.0mm, 1.5mm, 2.0mm, 2.5mm, 3.0mm, 3.5mm, 4.0mm, is mounted to respectively in counterbore corresponding to described counterbore array by thickness resolution test block described in eight groups.
Preferably, described plagiohedral test block is two groups of thickness blocks; Correspond, two corresponding with it counterbores are provided with in counterbore array on described board substrate, the height of described counterbore has certain altitude difference, and the line making two counterbores in height surperficial and horizontal direction are respectively, and (two pitch angle are acute angle at a pitch angle, as 5 ° and 10 ° can be respectively), namely make described plagiohedral test block after being embedded in the described counterbore on described board substrate in a pitch angle.More preferably, in described plagiohedral test block, the thickness of thickness block is 2mm.
Preferably, described cabochon test block is two groups of surperficial detection blocks for arc surface; Described cabochon test block is embedded in the counterbore that described board substrate is arranged.More preferably, the arc radius detecting the arc surface of block described in two groups is respectively 15mm and 25mm, and this detection block thickness is 5mm.
The processing technology that the technical solution used in the present invention relates to is simple.
Owing to have employed technique scheme, the invention has the beneficial effects as follows:
UT (Ultrasonic Testing) test block assembly of the present invention, ultrasound scanning can be coordinated, complete ultrasonic probe to the acoustics resolving power of situation, the demarcation of thickness resolving power such as different-thickness, different depth, different in width, and propose testing standard for cambered surface common in test piece and inclined-plane situation.Meanwhile, the present invention is simple, comprehensively, can meet on-the-spot common function needs, the test block specified in alternative multiple standards, increases work efficiency, and has highly application value.
Accompanying drawing explanation
Fig. 1 is the board substrate structural representation of one embodiment of the invention;
In figure: 6 is the setting area of slit-type test block on board substrate, 7 is the setting area of thickness resolution test block on board substrate, and 8 is the setting area of board substrate ramp type test block, and 9 is the setting area of cabochon test block on board substrate;
Fig. 2, Fig. 3 are respectively main pseudosection and the vertical view of the slit-type test block of one embodiment of the invention,
In figure: 10 is slit-type test block, 11 is the board substrate of slit-type test block;
Fig. 4 is the main pseudosection of the thickness resolution test block of one embodiment of the invention;
In figure: 12 is thickness resolution test block, 13 is the board substrate of thickness resolution test block;
Fig. 5 is the main pseudosection of the plagiohedral test block of one embodiment of the invention;
In figure: 14 is plagiohedral test block, 15 is the board substrate of plagiohedral test block;
Fig. 6 is the main pseudosection of the cabochon test block of one embodiment of the invention,
In figure: 16 is cabochon test block, 17 is the board substrate of cabochon test block.
Embodiment
Elaborate to embodiments of the invention below, following examples give detailed embodiment and concrete operating process, but protection scope of the present invention is not limited to following embodiment.
As shown in figures 1 to 6, the embodiment schematic diagram of low-voltage electrical apparatus electric contact UT (Ultrasonic Testing) test block assembly of the present invention, described test block assembly comprises four groups of test blocks, and four groups of test blocks are inserted to be assembled on one piece of board substrate; Four groups of test blocks are respectively slit-type test block (as shown in Figure 2), thickness resolution test block (as shown in Figure 4), plagiohedral test block (as shown in Figure 5) and cabochon test block (as shown in Figure 6); Described board substrate is provided with counterbore array; Four groups of test blocks are embedded on described board substrate by the counterbore of described counterbore array.
As an optimal way, described board substrate is square thin plate, and thickness is 40 ~ 50mm, thin plate has the hole of multiple certain size, and the counterbore of described counterbore array is squared counter bore or cylindrical bore, and the present embodiment counterbore is set to 25, is arranged as 5 row 5 and arranges.Certainly, in other embodiments, the counterbore number of counterbore array also can be other numbers, and this does not affect the essence that the present invention realizes.
As shown in Figure 1 as an optimal way, described slit-type test block has 10 groups, and wherein horizontal type slit test block has 5 groups, perpendicular type slit test block has 5 groups, and described slit-type test block is embedded in the setting area 6 of slit-type test block on board substrate; Described thickness resolution test block has 8 groups, is embedded in the setting area 7 of thickness resolution test block on board substrate; Described plagiohedral test block has 2 groups, described cabochon test block has 2 groups, is embedded in the setting area 9 of cabochon test block on the setting area 8 of board substrate ramp type test block and board substrate respectively.
As shown in Figure 2,3, as an optimal way, described slit-type test block 10, be formed with a certain size gap bonding by the certain thickness stainless-steel sheet of polylith, in each group, height of steel plate is consistent, and between steel plate with steel plate, adhesion gap is consistent.Often between group, the steel plate thickness of test block is different with steel plate gap.There is 0.1mm in steel plate thickness and gap respectively, 0.13mm, 0.15mm, 0.18mm, 0.2mm, and each two covers, have ten groups.Often organizing slit-type test block 10 has five block plate bondings to form.And in slit-type test block 10 described in ten groups, wherein a set of five groups is laterally be embedded in the counterbore of board substrate 11 of slit-type test block, and a set of five groups is longitudinally be embedded in the counterbore of board substrate 11 of slit-type test block in addition.The slit-type test block 10 pasted is embedded in by above-mentioned direction in the first kind counterbore 6 of the board substrate 11 of slit-type test block.
As shown in Figure 4, as an optimal way, described thickness resolution test block 12 has eight groups, and eight groups of thickness are different, and thickness is arranged as 0.5mm, 1.0mm, 1.5mm, 2.0mm, 2.5mm, 3.0mm, 3.5mm, 4.0mm.Correspondingly, the countersunk head degree of depth of eight counterbores of the board substrate 13 of thickness resolution test block is respectively 0.5mm, 1.0mm, 1.5mm, 2.0mm, 2.5mm, 3.0mm, eight groups of thickness resolution test blocks 12 are embedded in eight counterbores of the correspondence of the board substrate 13 of thickness resolution test block by 3.5mm, 4.0mm respectively.
As shown in Figure 5, as an optimal way, the thickness block of described plagiohedral test block 14 to be two groups of thickness be 2mm; Correspond, two counterbores are provided with in the board substrate 15 of plagiohedral test block, especially, the height of counterbore is arranged to have certain difference in height, and the line making two counterbores in height surperficial and horizontal direction are the pitch angle of 5 ° and 10 ° respectively, be the pitch angle of 5 ° and 10 ° after namely making two counterbores of plagiohedral test block 14 on the board substrate 15 being embedded in plagiohedral test block.
As shown in Figure 6, as an optimal way, described cabochon test block 16 is two groups of surfaces for arc surface and arc radius are respectively the detection block of 15mm and 25mm, cabochon test block 16 thickness is 5mm, in the counterbore that the board substrate 17 cabochon test block 16 being embedded in cabochon test block is arranged.
Before starting ultrasound examination, need acoustics, thickness, the inclined-plane cambered surface resolution to detector probe, detection perform carries out test calibration, to ensure the stability of system.
Slit-type test block mainly coordinates ultrasonic probe and ultrasonic technique, completes the test of the acoustic capability to ultrasonic probe, mainly sees that probe can distinguish the slit width that how little great slit width is in other words.
Thickness type test block mainly coordinates ultrasonic probe and ultrasonic technique, completes the test of the thickness penetration capacity to ultrasonic probe, mainly sees that probe can penetrate how thick step.
Inclined-plane cabochon test block mainly coordinates ultrasonic probe and ultrasonic technique, completes the test of the inclined-plane cambered surface detectability to ultrasonic probe, mainly sees that probe differentiates the angle capability of inclined-plane and arc surface.
The present invention can coordinate ultrasound scanning, complete ultrasonic probe to the acoustics resolving power of situation of different-thickness, different depth, different in width etc., the demarcation of thickness resolving power, and propose testing standard for cambered surface common in test piece and inclined-plane situation.Meanwhile, the present invention is simple, comprehensively, can meet on-the-spot common function needs, the test block specified in alternative multiple standards, increases work efficiency, and has highly application value.
Although content of the present invention has done detailed introduction by above preferred embodiment, will be appreciated that above-mentioned description should not be considered to limitation of the present invention.After those skilled in the art have read foregoing, for multiple amendment of the present invention and substitute will be all apparent.Therefore, protection scope of the present invention should be limited to the appended claims.
Claims (10)
1. a low-voltage electrical apparatus electric contact UT (Ultrasonic Testing) test block assembly, it is characterized in that, comprise a board substrate and the inserted four groups of test blocks be assembled on described board substrate, four groups of test blocks are respectively slit-type test block, thickness resolution test block, plagiohedral test block and cabochon test block; Wherein: described board substrate is provided with counterbore array; Four groups of test blocks are embedded on described board substrate by the counterbore of described counterbore array.
2. a kind of low-voltage electrical apparatus electric contact UT (Ultrasonic Testing) test block assembly according to claim 1, it is characterized in that, described slit-type test block is embedded in the two row counterbores above of the counterbore array on described board substrate, described thickness resolution test block is embedded in the left side two row counterbore of four lines below the counterbore array on described board substrate, below the counterbore array that described plagiohedral test block and cabochon test block are embedded in described board substrate respectively the right three of four lines arrange in a wherein row counterbore in.
3. a kind of low-voltage electrical apparatus electric contact UT (Ultrasonic Testing) test block assembly according to claim 1, is characterized in that, described counterbore array, is provided with multiple cylinder counterbore or multiple square or rectangular parallelepiped counterbore.
4. a kind of low-voltage electrical apparatus electric contact UT (Ultrasonic Testing) test block assembly according to claim 1, it is characterized in that, described slit-type test block has ten groups, wherein five groups are laterally embedded in the counterbore of counterbore array of described board substrate, and other five groups are longitudinally embedded in the counterbore of described counterbore array; The stainless-steel sheet pasted is embedded in first group of counterbore of described board substrate; Often the test block of slit-type described in group forms with an identical gap bonding by the stainless-steel sheet of polylith consistency of thickness; Between each group the thickness of the stainless-steel sheet of described slit-type test block and gap different.
5. a kind of low-voltage electrical apparatus electric contact UT (Ultrasonic Testing) test block assembly according to claim 1, it is characterized in that, described thickness resolution test block has eight groups, described in eight groups, the thickness of thickness resolution test block is different, and thickness is arranged as 0.5mm, 1.0mm, 1.5mm, 2.0mm, 2.5mm, 3.0mm, 3.5mm, 4.0mm; Correspondingly, the countersunk head degree of depth of eight counterbores that described counterbore array is arranged is respectively 0.5mm, 1.0mm, 1.5mm, 2.0mm, 2.5mm, 3.0mm, 3.5mm, 4.0mm, is mounted to respectively in counterbore corresponding to described counterbore array by thickness resolution test block described in eight groups.
6. a kind of low-voltage electrical apparatus electric contact UT (Ultrasonic Testing) test block assembly according to any one of claim 1-5, it is characterized in that, described plagiohedral test block is two groups of thickness blocks; Correspond, be provided with two corresponding with it counterbores in the counterbore array on described board substrate, the height of described counterbore has certain altitude difference, and the line making two counterbores in height surperficial and horizontal direction are respectively in a pitch angle.
7. a kind of low-voltage electrical apparatus electric contact UT (Ultrasonic Testing) test block assembly according to claim 6, it is characterized in that, described pitch angle is acute angle.
8. a kind of low-voltage electrical apparatus electric contact UT (Ultrasonic Testing) test block assembly according to claim 6, it is characterized in that, in described plagiohedral test block, the thickness of thickness block is 2mm.
9. a kind of low-voltage electrical apparatus electric contact UT (Ultrasonic Testing) test block assembly according to any one of claim 1-5, is characterized in that, described cabochon test block is two groups of surperficial detection blocks for arc surface; Described cabochon test block is embedded in the counterbore that described board substrate is arranged.
10. a kind of low-voltage electrical apparatus electric contact UT (Ultrasonic Testing) test block assembly according to claim 9, it is characterized in that, the arc radius detecting the arc surface of block described in two groups is respectively 15mm and 25mm, and this detection block thickness is 5mm.
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| CN201510170184.0A CN104777237B (en) | 2015-04-10 | 2015-04-10 | Low-voltage electrical apparatus electric contact ultrasonic examination test block assembly |
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| CN201510170184.0A CN104777237B (en) | 2015-04-10 | 2015-04-10 | Low-voltage electrical apparatus electric contact ultrasonic examination test block assembly |
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| CN104777237B CN104777237B (en) | 2017-12-26 |
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| WO2019024466A1 (en) * | 2017-08-02 | 2019-02-07 | 梁晓东 | Three-in-one delayed test strip pipeline complete machine |
| CN109459502A (en) * | 2018-12-03 | 2019-03-12 | 森松（江苏）重工有限公司 | A kind of support frame for holding multiple pieces TOFD reference block |
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| CN109459502A (en) * | 2018-12-03 | 2019-03-12 | 森松（江苏）重工有限公司 | A kind of support frame for holding multiple pieces TOFD reference block |
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