CN109738468B - A Universal Probe Holder for Sample Positioning in Neutron Diffraction Measurements - Google Patents
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Abstract
Description
技术领域technical field
本发明涉及中子衍射残余应力检测技术领域,具体涉及一种探针夹持装置,该探针夹持装置应用于利用中子衍射对材料及构件残余应力进行测量时的样品定位,且适用于对一定范围内任意直径探针的夹持固定。The invention relates to the technical field of neutron diffraction residual stress detection, in particular to a probe clamping device, which is applied to sample positioning when using neutron diffraction to measure the residual stress of materials and components, and is suitable for Clamping and fixing of probes of any diameter within a certain range.
背景技术Background technique
残余应力是影响材料和构建疲劳强度、结构刚度、抵抗应力腐蚀等性能的重要因素,因此研究复杂应用环境下的工程部件材料的工作状态和使用寿命,定量测量残余应力的数值分布具有重要的现实意义和重大的应用价值。Residual stress is an important factor affecting the properties of materials and structures such as fatigue strength, structural stiffness, stress corrosion resistance, etc. Therefore, it is important to study the working state and service life of engineering component materials in complex application environments and quantitatively measure the numerical distribution of residual stress. Significance and significant application value.
目前,能检测构件内部残余应力大小的方法主要分为有损测试法和无损测试法,其中,中子衍射法是无损测试法中的代表方法,也是迄今为止关于残余应力检测的最为有效的无损检测方法。中子衍射谱仪是应用中子衍射原理进行残余应力测量的装置,目前国际上使用的定位方法大多采用中子束扫边定位法:对于外形轮廓尺寸已知的规则被测样品,中子束扫边定位法首先将样品准确安装在样品台上并进行初始位置的标定,测量时再调整样品至合适的角度及位置,控制样品的移动,使样品从表面边界轮廓开始测量,得到衍射中子束强度,逐步平移使取样体积进入样品内部,记录每次中子束衍射出射强度,直至采样体积从外边界逐步移去,从样品厚度的两个边界间的“移入-退出”测量过程中会产生一个中子束峰强分布谱,称为“进入曲线”。该曲线两边的跳变位置间隔即为样品厚度,曲线高度的一半所对应的位置为样品边界移动到衍射点的位置。再根据事先已知的样品的轮廓几何信息和安装位置计算确定样品几何中心在测量空间的位置和姿态。At present, the methods that can detect the internal residual stress of components are mainly divided into nondestructive testing methods and nondestructive testing methods. Among them, neutron diffraction method is the representative method in nondestructive testing methods, and it is also the most effective nondestructive testing method for residual stress detection so far. Detection method. The neutron diffraction spectrometer is a device that uses the principle of neutron diffraction to measure the residual stress. At present, most of the positioning methods used in the world use the neutron beam scanning edge positioning method: for the regular measured sample with known outline and size, the neutron beam The scanning edge positioning method firstly installs the sample on the sample stage and calibrates the initial position. During measurement, adjust the sample to an appropriate angle and position, control the movement of the sample, and start the measurement from the surface boundary contour to obtain diffracted neutrons. Beam intensity, gradually translate the sampling volume into the interior of the sample, record the outgoing intensity of each neutron beam diffraction, until the sampling volume is gradually removed from the outer boundary, from the "in-exit" measurement process between the two boundaries of the sample thickness. A neutron beam peak intensity profile is produced, called the "entry curve". The jump position interval on both sides of the curve is the sample thickness, and the position corresponding to half of the curve height is the position where the sample boundary moves to the diffraction point. Then, the position and posture of the geometric center of the sample in the measurement space are determined according to the profile geometric information of the sample and the installation position known in advance.
这种扫边定位方法要求被测样品具有规则且已知的轮廓外形或具有特定的表面形状,同时要多次扫描表面才能得到正确的“进入曲线”,需要的定位时间比较长、精度低。然而在实际测量过程中,样品的形状是不定且变化多样的,而且当扫描的表面有织构、大晶粒或高吸收材料的情况时,入射曲线还会发生变形,不能够实现精确的定位。This edge-sweeping positioning method requires the sample to be tested to have a regular and known contour or a specific surface shape, and to scan the surface multiple times to obtain the correct "entry curve", which requires long positioning time and low accuracy. However, in the actual measurement process, the shape of the sample is indeterminate and varied, and when the scanned surface has texture, large grains or high absorption materials, the incident curve will be deformed, which cannot achieve accurate positioning. .
为了克服上述缺点,特提出了基于标准探针的样品定位方法,其核心就是要通过细长的探针确定取样体积的中心位姿,然后以此为基础进行测量标定,并通过确定各坐标系的相对位置关系实现对样品中测量点的定位,最后完成样品中残余应力的测量。In order to overcome the above shortcomings, a sample positioning method based on a standard probe is proposed. The relative positional relationship of the sample realizes the positioning of the measurement point in the sample, and finally completes the measurement of the residual stress in the sample.
由于在不同的实验环境下需要用到不同直径和材质的探针,因此探针的更换较为频繁。目前采用的探针夹持装置普遍为一体式装夹且夹持部件的孔径大小不可调整,在有限的操作空间内,不仅探针更换较为麻烦,而且由于探针自身具有很大的长径并采用一端固定而另一端悬空的设置方式,极易发生变形和折断现象。上述情况将严重影响实验进度,浪费宝贵的中子束时间,长此以往将造成巨大的经济损失。同时,在基于探针的样品定位方法中,还必须时刻保证探针的安装精度和垂直度,这就对探针夹持装置的结构设计提出了更高要求。Because probes of different diameters and materials are required in different experimental environments, probes are frequently replaced. The current probe clamping device is generally one-piece clamping, and the aperture size of the clamping part cannot be adjusted. In the limited operating space, not only is the probe replacement more troublesome, but also because the probe itself has a large length and diameter and is not adjustable. One end is fixed and the other end is suspended, which is prone to deformation and breakage. The above situation will seriously affect the progress of the experiment, waste precious neutron beam time, and cause huge economic losses in the long run. At the same time, in the probe-based sample positioning method, the installation accuracy and verticality of the probe must be guaranteed at all times, which puts forward higher requirements on the structural design of the probe clamping device.
发明内容SUMMARY OF THE INVENTION
本发明的目的在于提供一种装夹方便、安装精度高且适用于任意直径探针的探针夹持装置,以解决背景技术中提出的问题。The purpose of the present invention is to provide a probe clamping device with convenient clamping, high installation accuracy and suitable for probes of any diameter, so as to solve the problems raised in the background art.
为实现上述目的,本发明提供了一种用于中子衍射测量中样品定位的通用型探针夹持装置,包括用于固定探针的夹持机构以及用于实现所述探针绷紧拉直的升降机构;In order to achieve the above object, the present invention provides a universal probe clamping device for sample positioning in neutron diffraction measurement, including a clamping mechanism for fixing the probe and a tensioning mechanism for realizing the probe. straight lift mechanism;
所述夹持机构包括两个上下相对的夹持组件,通过所述升降机构实现两个夹持组件在竖直方向上的距离可调,所述夹持组件包括紧固件和导套,两个紧固件的相对端设置成锥形结构且内部中空用于插入探针的端头部分,所述紧固件的相对端沿周向分为多个形状、大小相等的扇形压片,所述导套套设在紧固件的相对端上且所述导套的内部腔体设置成与紧固件匹配的锥形结构,通过导套对紧固件的压片产生径向挤压,迫使所有压片同时向中间靠拢,从而实现对中间插入探针的夹紧固定。The clamping mechanism includes two upper and lower opposite clamping assemblies, the distance between the two clamping assemblies in the vertical direction can be adjusted through the lifting mechanism, and the clamping assembly includes a fastener and a guide sleeve. The opposite ends of the fasteners are arranged in a tapered structure and are hollow inside for inserting the end portion of the probe. The opposite ends of the fasteners are circumferentially divided into a plurality of fan-shaped pressing pieces of equal shape and size, so The guide sleeve is sleeved on the opposite end of the fastener, and the inner cavity of the guide sleeve is set to a conical structure matching the fastener, and the guide sleeve produces radial extrusion on the pressing piece of the fastener, forcing the All the pressing pieces move toward the middle at the same time, so as to realize the clamping and fixing of the inserted probe in the middle.
优选地,所述升降机构包括从上至下依次设置的顶板、升降台和底座以及竖直设置在所述底座上的支撑导轨和升降杆,所述支撑连导轨的下端与所述底座固连而上端穿过所述升降台并与所述顶板固连,所述升降杆的下端与所述底座之间为可转动连接或间隙配合而上端穿过所述升降台和顶板,且所述升降杆和升降台通过螺纹配合联动设置,通过旋转升降杆使力沿螺纹传递给升降台从而带动所述升降台沿支撑导轨上下运动;两个夹持组件分别设置在所述升降台和底座上。Preferably, the lifting mechanism includes a top plate, a lifting platform and a base arranged in sequence from top to bottom, and a support rail and a lifting rod vertically arranged on the base, and the lower end of the support connecting rail is fixedly connected to the base The upper end passes through the lifting platform and is fixedly connected with the top plate, the lower end of the lifting rod and the base are rotatably connected or clearance fit, and the upper end passes through the lifting platform and the top plate, and the lifting rod is rotatably connected with the base. The rod and the lifting platform are arranged in a threaded linkage, and the force is transmitted to the lifting platform along the thread by rotating the lifting rod to drive the lifting platform to move up and down along the support guide rail; two clamping assemblies are respectively arranged on the lifting platform and the base.
优选地,为了保证所述升降台可在任意高度均具有良好的限位能力和定位精度,所述升降杆与升降台间的传动部分选用螺纹升角小于螺旋副当量摩擦角的螺纹配合,使二者间具备良好的自锁效果。Preferably, in order to ensure that the lifting platform can have good position-limiting ability and positioning accuracy at any height, the transmission part between the lifting rod and the lifting platform selects the thread with the thread lift angle smaller than the equivalent friction angle of the screw pair, so that the The two have a good self-locking effect.
优选地,还包括备用通孔,所述备用通孔对称设置在所述升降台和底座上且用于实现对探针两端的长久夹持定位。Preferably, a spare through hole is also included, and the spare through hole is symmetrically arranged on the lifting platform and the base and is used for long-term clamping and positioning of both ends of the probe.
优选地,所述备用通孔的数量为多组且具有不同直径,各组备用通孔的中轴线与所述紧固件的中轴线位于同一竖直面上。Preferably, there are multiple sets of spare through holes with different diameters, and the central axis of each set of spare through holes and the central axis of the fastener are located on the same vertical plane.
优选地,还包括一组用于实现任意直径探针的夹持定位的V型槽,所述V型槽对称设置在所述升降台和底座上,且所述V型槽的中轴线与备用通孔的中轴线、紧固件的中轴线位于同一竖直面上。Preferably, it also includes a set of V-shaped grooves for clamping and positioning probes of any diameter, the V-shaped grooves are symmetrically arranged on the lifting platform and the base, and the central axis of the V-shaped grooves is the same as the spare The central axis of the through hole and the central axis of the fastener are located on the same vertical plane.
对于利用备用通孔或V型槽进行夹持的探针,可采用将探针的两端缠绕在固定螺栓上并由固定螺栓旋转压紧的方式固定,或采用在备用通孔或V型槽中插入螺栓进行卡固的方式固定,从而实现对探针的位置固定和拉紧绷直。For the probe clamped by the spare through hole or V-groove, the two ends of the probe can be wrapped around the fixing bolt and fixed by the fixing bolt, or the spare through-hole or V-groove can be used to fix the probe. It is fixed by inserting bolts in the middle to fix the position of the probe and tighten it.
优选地,所述夹持组件还包括基座,所述基座通过固定螺栓固定设置在所述升降台和底座上,在所述基座上设有用于所述紧固件插入固定的卡槽,所述紧固件与该卡槽之间为间隙配合。Preferably, the clamping assembly further includes a base, the base is fixed on the lifting platform and the base by fixing bolts, and a slot for the fastener to be inserted and fixed is provided on the base. , there is clearance fit between the fastener and the card slot.
优选地,所述夹持组件还包括用于防止所述基座发生周向旋转的紧定螺栓,所述紧定螺栓水平设置在所述升降台和底座上且从侧面对基座进行紧压固定。Preferably, the clamping assembly further comprises a set bolt for preventing the circumferential rotation of the base, the set bolt is horizontally arranged on the lifting platform and the base and presses the base from the side fixed.
优选地,两个紧定螺栓位于所述基座的同一侧。Preferably, the two set bolts are located on the same side of the base.
优选地,在所述升降杆的上端设有便于施力的把手。Preferably, the upper end of the lift rod is provided with a handle which is convenient for applying force.
优选地,在所述导套的内侧壁以及所述紧固件或基座的外侧壁上设有匹配的螺纹,通过旋转导套使其向紧固件靠近或远离从而实现对压片的放松和压迫。Preferably, matching threads are provided on the inner side wall of the guide sleeve and the outer side wall of the fastener or the base, and the pressing sheet can be loosened by rotating the guide sleeve to make it approach or move away from the fastener. and oppression.
为了保证装置本身的可靠性、耐磨性、抗弯曲能力及防腐蚀性,本发明各部件的材料选用不锈钢或在强度、耐磨性、抗氧化性和抗腐蚀性方面具有良好表现的高性能铝合金。In order to ensure the reliability, wear resistance, bending resistance and corrosion resistance of the device itself, the material of each component of the present invention is selected from stainless steel or high performance with good performance in strength, wear resistance, oxidation resistance and corrosion resistance. Aluminum alloy.
发明提供的技术方案至少具有如下有益效果:The technical solution provided by the invention has at least the following beneficial effects:
1、本发明具有良好的实用性,通过设置可自由移动的升降台实现对探针的绷紧拉直,且被夹持探针的长度可根据实际情况灵活调整,通过设置带有扇形压片的紧固件以及利用螺纹旋进的导套实现对探针的快速更换,不仅操作灵活,而且利用扇形压片的对中夹紧可确保被夹持探针的中心轴和夹持组件的中心轴完全重合,避免出现探针偏心现象,进而确保探针的安装精度。1. The present invention has good practicability. By setting a freely movable lifting platform, the probe can be tightened and straightened, and the length of the clamped probe can be flexibly adjusted according to the actual situation. The fasteners and the threaded guide sleeve can be used to quickly replace the probe, which is not only flexible in operation, but also can ensure the center axis of the clamped probe and the center of the clamping assembly. The shafts are completely coincident to avoid the eccentricity of the probe, thereby ensuring the installation accuracy of the probe.
2、本发明通过设置多组备用通孔实现对长时间无需更换的探针的夹持固定,简化了实验流程且定位精确,还可根据实际需要具体设计备用通孔的组数以及各组备用通孔的直径,适用性好。2. The present invention realizes the clamping and fixing of probes that do not need to be replaced for a long time by setting multiple groups of spare through holes, which simplifies the experimental process and enables accurate positioning. The number of spare through holes and the spare groups of each group can also be specifically designed according to actual needs. The diameter of the through hole has good applicability.
3、本发明通过设置V型槽进一步扩展了探针夹持装置的应用范围,不仅完全摆脱了装置对于探针直径的使用限制,而且提供了足够大的操作空间确保更换探针时动作的快速灵活,避免发生磕碰而导致探针损坏;由于V型槽对具有圆柱外形的探针具备良好的限位和对中能力,能够确保探针的安装精度。3. The present invention further expands the application range of the probe holding device by setting the V-shaped groove, which not only completely gets rid of the device’s use restriction on the probe diameter, but also provides a large enough operating space to ensure the quick action when replacing the probe. It is flexible and avoids damage to the probe caused by bumping; because the V-shaped groove has good positioning and centering ability for the probe with a cylindrical shape, it can ensure the installation accuracy of the probe.
4、本发明在确保探针的安装精度的同时缩短了实验周期,大幅度减少了样品定位实验方案所耗费的时间,有利于被测样品的精确定位并节省宝贵的中子束时间,提高定位测量的效率并节约成本损耗。4. The present invention shortens the experimental period while ensuring the installation accuracy of the probe, greatly reduces the time consumed by the sample positioning experimental scheme, is beneficial to the precise positioning of the sample to be tested, saves precious neutron beam time, and improves positioning. Measure the efficiency and save cost loss.
5、发明通过将上下两个紧定螺栓设置在基座的同一侧,使得探针的上下两端同时受到来自同一方向的作用力,确保探针始终保持相对于底座的垂直度,提高样品的定位精度。5. The invention arranges the upper and lower fixing bolts on the same side of the base, so that the upper and lower ends of the probe receive the force from the same direction at the same time, so as to ensure that the probe always maintains the verticality relative to the base and improve the sample's stability. positioning accuracy.
附图说明Description of drawings
为了更清楚地说明本发明技术方案,下面将对本发明实施例描述中所需使用到的附图作简单地介绍,显而易见地,下列附图仅仅用于帮助理解本发明中的部分实施例而非技术方案的全部,其中:In order to illustrate the technical solutions of the present invention more clearly, the following will briefly introduce the drawings used in the description of the embodiments of the present invention. Obviously, the following drawings are only used to help understand some embodiments of the present invention, rather than All of the technical solutions, including:
图1是本发明实施例1的立体示意图;1 is a schematic perspective view of Embodiment 1 of the present invention;
图2是图1正面视角的结构示意图;Fig. 2 is the structural representation of the front view of Fig. 1;
图3是图1左侧视角的结构示意图;Fig. 3 is the structural representation of the left side view of Fig. 1;
图4是图3中圈出部分的放大示意图;Fig. 4 is the enlarged schematic diagram of the part circled in Fig. 3;
图5是实施例1中探针夹持装置用于样品定位实验时的工作示意图;5 is a working schematic diagram of the probe clamping device in Example 1 when it is used in a sample positioning experiment;
其中:01探针,02样品台,03入射狭缝,04中子探测器,05入射中子束,06衍射中子束,021负载托板,022X轴驱动伺服电机,023Y轴驱动伺服电机,024Z轴第一级升降缸,025Z轴第二级升降缸,026Z轴旋转机构;1顶板,2升降台,3底座,31螺栓连接孔,4支撑导轨,5升降杆,6把手,7夹持组件,71基座,72紧固件,73导套,74紧定螺栓,75固定螺栓,8备用通孔,9V型槽。Among them: 01 probe, 02 sample stage, 03 incident slit, 04 neutron detector, 05 incident neutron beam, 06 diffracted neutron beam, 021 load pallet, 022X axis drive servo motor, 023Y axis drive servo motor, 024Z-axis first-stage lifting cylinder, 025Z-axis second-stage lifting cylinder, 026Z-axis rotating mechanism; 1 top plate, 2 lifting table, 3 base, 31 bolt connection holes, 4 supporting rails, 5 lifting rods, 6 handles, 7 clamping Assembly, 71 Base, 72 Fasteners, 73 Guide Bushes, 74 Set Bolts, 75 Set Bolts, 8 Spare Through Holes, 9 V-Slots.
具体实施方式Detailed ways
下面将结合本发明实施例中的附图,对本发明的技术方案进行清楚、完整地描述,显然,所描述的实施例仅是本发明的部分实施例,而不是全部的实施例。基于本发明中的实施例,本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其它实施例,都属于本发明保护的范围。The technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some of the embodiments of the present invention, but not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.
实施例1Example 1
参见图1~图4,一种用于中子衍射测量中样品定位的通用型探针夹持装置,包括用于固定探针01的夹持机构以及用于实现所述探针01绷紧拉直的升降机构。Referring to FIGS. 1 to 4 , a universal probe clamping device for sample positioning in neutron diffraction measurement, including a clamping mechanism for fixing the
所述升降机构包括顶板1、升降台2、底座3、支撑导轨4、升降杆5和把手6。所述顶板1、升降台2和底座3从上至下依次设置,在所述底座3上设有用于实现其与样品台固连的螺栓连接孔31,所述支撑导轨4竖直穿过升降台2且上下两端分别与所述顶板1和底座3固连,所述升降杆5同样竖直设置且位于两个支撑导轨4之间,在所述底座3上设有用于容置升降杆5下端端部的凹槽,所述升降杆5的上部穿过升降台2和顶板1且在升降杆5的上端设置把手6。The lifting mechanism includes a top plate 1 , a
其中,所述支撑导轨4和升降台2之间、所述升降杆5和底座3凹槽之间、所述升降杆5和顶板1之间均为间隙配合,所述升降杆5和升降台2之间则通过螺纹配合实现联动设置;通过旋转升降杆使力沿螺纹传递给升降台从而带动所述升降台沿支撑导轨上下运动。Wherein, between the support rail 4 and the
在本实施例中,所述升降杆5与升降台2间的传动部分选用螺纹升角小于螺旋副当量摩擦角的螺纹配合,使二者间具备良好的自锁效果,确保所述升降台2的定位精度。In the present embodiment, the transmission part between the
所述夹持机构包括两个上下同轴相对且分别设置在所述升降台2和底座3上的夹持组件7,所述夹持组件7包括基座71、紧固件72和导套73,所述基座71通过竖直设置的固定螺栓75与升降台2和底座3固连,在所述基座71上设有用于实现紧固件72插入固定的卡槽,所述紧固件72与该卡槽之间为间隙配合,两个紧固件72的相对端设置成圆锥形结构且内部中空用于插入探针01的端头部分,所述紧固件72的相对端沿周向均分为多个相等的扇形压片,所述导套73套设在紧固件72的相对端上且所述导套73的内部设置成与紧固件72外形匹配的圆锥形腔体,在所述导套73的内侧壁和基座71的外侧壁上设有匹配的螺纹;通过旋转导套使其向紧固件靠近或远离,进而实现对压片的放松和压迫,通过径向挤压压片并迫使其向中间靠拢,实现对中间插入探针的夹紧固定。The clamping mechanism includes two upper and lower coaxially opposite clamping assemblies 7 respectively disposed on the
由于所述紧固件72与基座71间采用了极易拆装的连接方式,在实际使用过程中,可根据所用探针的直径更换具有不同开口直径范围的紧固件。Since the fastener 72 and the base 71 are connected in an extremely easy-to-remove manner, in actual use, fasteners with different opening diameter ranges can be replaced according to the diameter of the probe used.
所述夹持组件7还包括紧定螺栓74,所述紧定螺栓74水平插入升降台2和底座3中并从侧面对71基座进行紧压固定,从而防止基座发生周向旋转。The clamping assembly 7 further includes a fixing
在本实施例中,两个紧定螺栓74位于基座71的同一侧以确保探针的垂直度。In this embodiment, two set
本装置还包括两组不同直径的备用通孔8和一组V型槽9。每组备用通孔均对称设置在升降台2和底座3上并用于实现对探针两端的长久夹持定位,所述V型槽9对称设置在升降台2和底座3上并用于实现对任意直径探针的夹持定位,所述V型槽9的中轴线与各组备用通孔8的中轴线、紧固件72的中轴线位于同一竖直面上。在对探针两端进行固定时,可根据探针的直径和材质选择合适的固定方式。The device also includes two sets of spare through
结合图5,中子衍射测量的实验条件包括中子衍射谱仪的样品台02、入射狭缝03、中子探测器04、中子束挡板、屏蔽大鼓和全站仪测量系统(图中未全部示出)。测量方法为基于探针的样品定位方法。With reference to Fig. 5, the experimental conditions for neutron diffraction measurement include the
中子衍射测量的过程如下:The process of neutron diffraction measurement is as follows:
1、组装好探针夹持装置并将探针中点设为标记点,通过内六角螺栓和螺栓连接孔31的配合将整个探针夹持装置固定在样品台02的负载托板021上,同时将待进行残余应力测量的样品也固定在负载托板021上,此时样品上任一点与标记点的相对位置为固定值;1. Assemble the probe clamping device and set the midpoint of the probe as the mark point, and fix the entire probe clamping device on the
2、通过入射狭缝03发出入射中子束05,通过中子探测器04接收衍射中子束06;2. The
3、通过X轴驱动伺服电机022、Y轴驱动伺服电机023、两个Z轴升降缸以及Z轴旋转机构26驱动负载托板021在X轴、Y轴、Z轴方向移动或绕Z轴旋转,以标记点为衍射测量参考点,用中子束扫边法确定取样体积中心位姿,使探针上的标记点移动到由入射中子束05和衍射中子束06的交会点位置,即衍射点;3. Drive the
4、利用全站仪测量系统对样品台等进行坐标系标定,计算出样品上将要进行残余应力测量的点(即待测量点)与探针中点(即标记点)在样品台坐标系中的相对位姿;4. Use the total station measurement system to calibrate the coordinate system of the sample stage, etc., and calculate that the point on the sample to be measured for residual stress (ie the point to be measured) and the midpoint of the probe (ie the marker point) are in the sample stage coordinate system relative pose;
5、驱动样品台02运动且运动量为计算出的相对位姿大小,将样品上待测量点移动到衍射点进行残余应力测量;5. Drive the
6、由中子探测器04对衍射中子束06的波长变化进行分析,通过布拉格原理计算得出样品上待测量点的残余应力。6. The wavelength change of the diffracted
以上所述仅为本发明的优选实施例,并非因此限制本发明的专利保护范围,对于本领域的技术人员来说,本发明可以有各种更改和变化。在本发明的精神和原则之内,凡是利用本发明说明书及附图内容所作的任何改进或等同替换,直接或间接运用在其它相关的技术领域,均应包括在本发明的专利保护范围内。The above descriptions are only preferred embodiments of the present invention, and are not intended to limit the scope of patent protection of the present invention. For those skilled in the art, the present invention may have various modifications and changes. Within the spirit and principle of the present invention, any improvement or equivalent replacement made by using the contents of the description and drawings of the present invention, directly or indirectly applied in other related technical fields, shall be included in the scope of patent protection of the present invention.
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Inventor after: Li Qunming Inventor after: Zhong Jue Inventor after: Deng Hua Inventor after: Han Zhiqiang Inventor before: Li Qunming Inventor before: Deng Hua Inventor before: Han Zhiqiang |