CN109738468A - A kind of universal probe clamping device for Sample location in neutron diffraction measurement - Google Patents
A kind of universal probe clamping device for Sample location in neutron diffraction measurement Download PDFInfo
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- CN109738468A CN109738468A CN201910007775.4A CN201910007775A CN109738468A CN 109738468 A CN109738468 A CN 109738468A CN 201910007775 A CN201910007775 A CN 201910007775A CN 109738468 A CN109738468 A CN 109738468A
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Abstract
The present invention provides a kind of universal probe clamping device for Sample location in neutron diffraction measurement, including clamping device and elevating mechanism, elevating mechanism includes the top plate set gradually from top to bottom, lifting platform and pedestal and connects the supporting guide of top plate and pedestal and by being threadedly engaged the elevating lever with lifting platform linkage, lifting platform can be driven to move up and down along supporting guide by rotation and lifting bar；Clamping device includes two clamp assemblies on pedestal and lifting platform, clamp assemblies include fastener and guide sleeve, the opposite end of two fasteners is arranged to hollow pyramidal structure and is circumferentially divided into multiple fan-shaped tablettings, and guide sleeve is set on fastener and fixes probe by forcing tabletting to come closer；It further include spare through-hole and the V-groove being symmetricly set on lifting platform and pedestal, central axes and fastener central axes are located on same vertical plane.The highly precision clamp of arbitrary diameter probe in a certain range can be achieved in the present invention, easy to use and extend application range.
Description
Technical field
The present invention relates to neutron diffraction residual stress detection technique fields, and in particular to a kind of probe clamping device, the spy
Needle clamping device is applied to Sample location when measuring using neutron diffraction to material and component residual stress, and is suitable for
Arbitrary diameter probe in a certain range is gripped.
Background technique
Residual stress be influence material and construct fatigue strength, the rigidity of structure, resist the performances such as stress corrosion it is important because
Element, therefore study the working condition and service life of the engineering part material under complicated applications environment, quantitative measurment residual stress
Numeric distribution have important practical significance and great application value.
Currently, the method for energy detection means internal residual stress size is broadly divided into and damages method of testing and non-destructive testing method,
Wherein, neutron diffraction method is the representative method in non-destructive testing method, and having the most about residual stress detection so far
The lossless detection method of effect.Neutron diffractometer is the device that residual stress measurement is carried out using neutron diffraction principle, at present state
The localization method used on border mostly uses greatly neutron beam to sweep side positioning mode: for rule detected sample known to appearance profile size
Product, neutron beam sweep the calibration that sample is accurately mounted on line home position of going forward side by side on sample stage by side positioning mode first, when measurement again
Sample is adjusted to suitable angle and position, the movement of sample is controlled, measures sample since surface-boundary profile, spread out
Beamlet intensity is hit, move step by step makes sample volume enter sample interior, each neutron beam diffraction outgoing intensity is recorded, until adopting
Sample volume is gradually removed from outer boundary, can generate one from " move into-exit " measurement process between two boundaries of thickness of sample
A neutron beam peak intensity distribution profile, referred to as " arrival curve ".The jump position interval on the curve both sides is thickness of sample, and curve is high
Position corresponding to the half of degree is the position that sample boundaries are moved to point diffraction.It is several further according to the profile of previously known sample
What information and installation site calculate the position and posture for determining sample geometric center in measurement space.
It is this to sweep side localization method requirement sample with rule and known contours profiles or there is specific surface
Shape, while wanting Multiple-Scan surface just and can obtain correct " arrival curve ", the positioning time needed is long, precision is low.
However during actual measurement, the shape of sample is indefinite and changes multiplicity, and when there are texture, big crystalline substance in the surface of scanning
When the case where grain or high-selenium corn material, incidence curves also occur that deformation, can not realize accurate positioning.
To overcome the above disadvantages, special to propose the sample positioning method based on standard probe, core seeks to pass through
Elongated probe determines the center pose of sample volume, then measures calibration based on this, and by determining each coordinate
The relative positional relationship of system realizes the positioning to measurement point in sample, finally completes the measurement of residual stress in sample.
Due to needing to use the probe of different-diameter and material under different experimental situations, the replacement of probe is more
Frequently.Currently used probe clamping device is commonly integral type clamping and the pore size of hold assembly cannot be adjusted, and is having
In the operating space of limit, not only probe replacement is more troublesome, but also since probe itself has very big major diameter and uses one end
Fixed and set-up mode that the other end is hanging, easily deforms and breakage phenomenon.Above situation will seriously affect experiment progress,
The valuable neutron beam time is wasted, huge economic loss will be if things go on like this caused.Meanwhile in the Sample location side based on probe
In method, it is necessary to which the moment guarantees the installation accuracy and verticality of probe, this just proposes the structure design of probe clamping device
Requirements at the higher level.
Summary of the invention
The purpose of the present invention is to provide it is a kind of it is convenient for mounting and clamping, installation accuracy is high and is suitable for the probe of arbitrary diameter probe
Clamping device, to solve the problems, such as to propose in background technique.
To achieve the above object, the present invention provides a kind of universal probes for Sample location in neutron diffraction measurement
Clamping device tightens the elevating mechanism being straightened including the clamping device for fixing probe and for realizing the probe；
The clamping device includes two clamp assemblies opposing upper and lower, realizes two clamping groups by the elevating mechanism
The distance of part in the vertical direction is adjustable, and the clamp assemblies include fastener and guide sleeve, the opposite end setting of two fasteners
Tapered structure and inner hollow are used to be inserted into the end portion of probe, and the opposite end of the fastener is circumferentially divided into multiple shapes
Shape, equal-sized fan-shaped tabletting, the guide sleeve is set on the opposite end of fastener and the internal cavity of the guide sleeve is arranged
All tablettings are forced simultaneously by guide sleeve to the tabletting generation radial compression of fastener at the matched pyramidal structure of fastener
It draws close to centre, is fixedly clamped to realize to centre insertion probe.
Preferably, the elevating mechanism includes the top plate set gradually from top to bottom, lifting platform and pedestal and sets vertically
Supporting guide and elevating lever on the base is set, the lower end of the company's of support guide rail and the pedestal are connected and upper end passes through
The lifting platform is simultaneously connected with the top plate, is rotatably connected between the lower end of the elevating lever and the pedestal or gap is matched
It closes and upper end passes through the lifting platform and top plate, and the elevating lever and lifting platform pass through rotation by being threadedly engaged linkage setting
Turning elevating lever makes power threadingly pass to lifting platform to drive the lifting platform to move up and down along supporting guide；Two clamping groups
Part is separately positioned on the lifting platform and pedestal.
Preferably, in order to guarantee that the lifting platform can all have good restraining ability and positioning accuracy in arbitrary height,
Running part between the elevating lever and lifting platform selects lead angle to be less than being threadedly engaged for screw pair equivalent friction angle, makes two
Has good self-locking effect between person.
It preferably, further include spare through-hole, the spare through-hole is symmetricly set on the lifting platform and pedestal and is used for
Realize the permanent clamping position to probe both ends.
Preferably, the quantity of the spare through-hole be multiple groups and have different-diameter, the central axes of the spare through-hole of each group with
The central axes of the fastener are located on same vertical plane.
It preferably, further include the V-groove of one group of clamping position for realizing arbitrary diameter probe, the V-groove is symmetrical
It is arranged on the lifting platform and pedestal, and the central axes of the central axes of the V-groove and the central axes of spare through-hole, fastener
On same vertical plane.
For the probe clamped using spare through-hole or V-groove, it can be used and the both ends of probe are wrapped in fixed spiral shell
It fixes on bolt and by the mode that fixing bolt rotatably compresses, or is fixed using bolt is inserted into spare through-hole or V-groove
Mode fix, thus realize the position of probe is fixed and is tensed it is exceptionally straight.
Preferably, the clamp assemblies further include pedestal, and the pedestal is fixed at the lifting by fixing bolt
On platform and pedestal, be equipped with the card slot fixed for fastener insertion on the pedestal, the fastener and the card slot it
Between be clearance fit.
Preferably, the clamp assemblies further include the tight fixed bolt for preventing the pedestal from rotating in a circumferential direction, described
Tight fixed bolt is horizontally set on the lifting platform and pedestal and carries out pressing fixation to pedestal from side.
Preferably, two tight fixed bolts are located at the same side of the pedestal.
Preferably, it is equipped in the upper end of the elevating lever convenient for the handle of force.
Preferably, matched spiral shell is equipped on the lateral wall of the inner sidewall of the guide sleeve and the fastener or pedestal
Line makes it to fastener close to or far to realize loosening and oppress to tabletting by rotary guide sleeve.
In order to guarantee the reliability, wearability, bending resistance and anticorrosive property of device itself, the material of each component of the present invention
Material selects stainless steel or in terms of intensity, wearability, inoxidizability and corrosion resistance with the high-performance aluminium alloy of good behaviour.
The technical solution that invention provides at least has the following beneficial effects:
1, the present invention has good practicability, tightens drawing to probe by the way that the lifting platform that can move freely realization is arranged
Directly, and the length of clamped probe can be adjusted flexibly according to the actual situation, by be provided with fan-shaped tabletting fastener and
The quick-replaceable to probe is realized using the guide sleeve being threaded into, not only flexible operation, but also pressed from both sides using the centering of fan-shaped tabletting
The central axis of the central axis and clamp assemblies that tightly can ensure that clamped probe is completely coincident, and avoids the occurrence of probe eccentric phenomena, into
And ensure the installation accuracy of probe.
2, the present invention realizes gripping to the probe that no replacement is required for a long time by the spare through-hole of setting multiple groups, simplifies
Experiment flow and registration can also specifically design the group number and the spare through-hole of each group of spare through-hole according to actual needs
Diameter, applicability are good.
3, the present invention has further expanded the application range of probe clamping device by the way that V-groove is arranged, and is not only completely free of
Device limits the use of probe diameter, and provide sufficiently large operating space ensure to act when replacing probe it is fast
It is fast flexible, it avoids colliding with and leading to tissue damage；Since V-groove has good limit to the probe with cylindrical shape
With centering ability, it can be ensured that the installation accuracy of probe.
4, the present invention shortens experimental period while the installation accuracy for ensuring probe, drastically reduces Sample location
Time spent by experimental program is conducive to the accurate positioning of sample and saves the valuable neutron beam time, improves positioning
Efficiency and the save the cost loss of measurement.
5, upper and lower two tight fixed bolts by being arranged in the same side of pedestal by invention, so that the upper and lower ends of probe are simultaneously
By from unidirectional active force, it is ensured that probe remains the verticality relative to pedestal, improves the positioning accurate of sample
Degree.
Detailed description of the invention
In order to illustrate more clearly of technical solution of the present invention, below the embodiment of the present invention will be described in required use
Attached drawing is briefly described, it should be apparent that, following drawings be used only for helping understanding section Example in the present invention rather than
The whole of technical solution, in which:
Fig. 1 is the stereoscopic schematic diagram of the embodiment of the present invention 1；
Fig. 2 is the structural schematic diagram at the front Fig. 1 visual angle；
Fig. 3 is the structural schematic diagram of Fig. 1 left side perspective；
Fig. 4 is the enlarged diagram that part is irised out in Fig. 3；
Fig. 5 is operation schematic diagram when 1 middle probe clamping device of embodiment is tested for Sample location；
Wherein: 01 probe, 02 sample stage, 03 entrance slit, 04 neutron detector, 05 incident neutron beam, 06 diffracted neutrons
Beam, 021 load supporting plate, 022X axis drive servo motor, and 023Y axis drives servo motor, 024Z axis first order lift cylinders, 025Z
Axis second level lift cylinders, 026Z axis rotating mechanism；1 top plate, 2 lifting platforms, 3 pedestals, 31 bolt connecting holes, 4 supporting guides, 5 liters
Drop bar, 6 handles, 7 clamp assemblies, 71 pedestals, 72 fasteners, 73 guide sleeves, 74 tight fixed bolts, 75 fixing bolts, 8 spare through-holes,
9V type groove.
Specific embodiment
Following will be combined with the drawings in the embodiments of the present invention, and technical solution of the present invention is clearly and completely described,
Obviously, described embodiment is only section Example of the invention, instead of all the embodiments.Based on the reality in the present invention
Example is applied, all other embodiment obtained by those of ordinary skill in the art without making creative efforts all belongs to
In the scope of protection of the invention.
Embodiment 1
Referring to figs. 1 to 4, a kind of universal probe clamping device for Sample location in neutron diffraction measurement, including
For fixing the clamping device of probe 01 and tightening the elevating mechanism being straightened for realizing the probe 01.
The elevating mechanism includes top plate 1, lifting platform 2, pedestal 3, supporting guide 4, elevating lever 5 and handle 6.The top plate
1, lifting platform 2 and pedestal 3 are set gradually from top to bottom, and the spiral shell being connected for realizing it with sample stage is equipped on the pedestal 3
Bolt connecting hole 31, the supporting guide 4 passes vertically through lifting platform 2 and upper and lower ends are connected with the top plate 1 and pedestal 3 respectively,
The elevating lever 5 is equally vertically arranged and is located between two supporting guides 4, is equipped on the pedestal 3 for accommodating lifting
The groove of 5 lower end of bar, the top of the elevating lever 5 pass through lifting platform 2 and top plate 1 and handle are arranged in the upper end of elevating lever 5
Hand 6.
Wherein, between the supporting guide 4 and lifting platform 2, between 3 groove of the elevating lever 5 and pedestal, the elevating lever
It is clearance fit between 5 and top plate 1, then by being threadedly engaged realization linkage setting between the elevating lever 5 and lifting platform 2；
Power is set threadingly to pass to lifting platform to drive the lifting platform to move up and down along supporting guide by rotation and lifting bar.
In the present embodiment, the running part between the elevating lever 5 and lifting platform 2 selects lead angle to work as less than screw pair
Being threadedly engaged for amount angle of friction, makes have good self-locking effect between the two, it is ensured that the positioning accuracy of the lifting platform 2.
The clamping device includes about two folders that are coaxial opposite and being separately positioned on the lifting platform 2 and pedestal 3
Component 7 is held, the clamp assemblies 7 include pedestal 71, fastener 72 and guide sleeve 73, and the pedestal 71 passes through the fixation being vertically arranged
Bolt 75 and lifting platform 2 and pedestal 3 are connected, and are equipped on the pedestal 71 and are inserted into fixed card slot for realizing fastener 72,
It is clearance fit between the fastener 72 and the card slot, the opposite end of two fasteners 72 is arranged to conical structure and inside
The hollow end portion for being used to be inserted into probe 01, the opposite end of the fastener 72 are circumferentially divided into multiple equal fan-shaped pressures
Piece, the guide sleeve 73 is set on the opposite end of fastener 72 and the inside of the guide sleeve 73 is arranged to and 72 shape of fastener
The conical bores matched are equipped with matched screw thread on the inner sidewall of the guide sleeve 73 and the lateral wall of pedestal 71；Pass through rotation
Guide sleeve makes it to fastener close to or far from and then realizing loosening and oppress to tabletting, by radial compression tabletting and force
It draws close to centre, realizes and is fixedly clamped to centre insertion probe.
Due to using extremely easy-to-dismount connection type between the fastener 72 and pedestal 71, in actual use,
The fastener with different openings diameter range can be replaced according to the diameter of probe used.
The clamp assemblies 7 further include tight fixed bolt 74, and the tight fixed bolt 74 is horizontally inserted into lifting platform 2 and pedestal 3
And 71 pedestals are carried out from side to press fixation, to prevent pedestal from rotating in a circumferential direction.
In the present embodiment, two tight fixed bolts 74 are located at the same side of pedestal 71 to ensure the verticality of probe.
The present apparatus further includes the spare through-hole 8 and one group of V-groove 9 of two groups of different-diameters.Every group of spare through-hole is symmetrically set
It sets on lifting platform 2 and pedestal 3 and for realizing the permanent clamping position to probe both ends, the V-groove 9 is symmetricly set on liter
It drops on platform 2 and pedestal 3 and for realizing the clamping position to arbitrary diameter probe, the central axes of the V-groove 9 and each group are spare
The central axes of through-hole 8, the central axes of fastener 72 are located on same vertical plane.It, can basis when probe both ends are fixed
The diameter and material of probe select suitable fixed form.
In conjunction with Fig. 5, the experiment condition of neutron diffraction measurement include the sample stage 02 of Neutron diffractometer, entrance slit 03,
Neutron detector 04, neutron beam baffle, shielding big drum and total station measuring system (being not entirely shown in figure).Measurement method is base
In the sample positioning method of probe.
The process of neutron diffraction measurement is as follows:
1, it assembles probe clamping device and probe midpoint is set as mark point, pass through hexagon socket head cap screw and bolt connecting hole
Entire probe clamping device is fixed on the load supporting plate 021 of sample stage 02 by 31 cooperation, while by pending residual stress
The sample of measurement is also secured on load supporting plate 021, and the relative position of any point and mark point is fixed value on sample at this time；
2, incident neutron beam 05 is issued by entrance slit 03, diffracted neutrons beam 06 is received by neutron detector 04；
3, drive servo motor 022, Y-axis that 023, two Z axis lift cylinders of servo motor and Z axis is driven to rotate by X-axis
The driving load supporting plate 021 of mechanism 26 is in X-axis, Y-axis, Z-direction are mobile or rotates about the z axis, is diffractometry reference using mark point
Point sweeps side method with neutron beam and determines sample volume center pose, is moved to the mark point on probe by 05 He of incident neutron beam
The plotted point position of diffracted neutrons beam 06, i.e. point diffraction；
4, coordinate system calibration is carried out to sample stage etc. using total station measuring system, remnants will be carried out by calculating on sample
The point (point i.e. to be measured) and the relative pose of probe midpoint (i.e. mark point) in sample stage coordinate system of stress measurement；
5, the movement of driving sample stage 02 and amount of exercise are calculated relative pose size, and point to be measured on sample is moved
Residual stress measurement is carried out to point diffraction；
6, it is analyzed by wavelength change of the neutron detector 04 to diffracted neutrons beam 06, is calculated by Prague principle
Out on sample point to be measured residual stress.
The above description is only a preferred embodiment of the present invention, is not intended to limit scope of patent protection of the invention, for
For those skilled in the art, the invention may be variously modified and varied.Within the spirit and principles in the present invention, all
Using any improvement or equivalent replacement made by description of the invention and accompanying drawing content, directly or indirectly it is used in other relevant
Technical field should all be included within the scope of the present invention.
Claims (10)
1. a kind of universal probe clamping device for Sample location in neutron diffraction measurement, which is characterized in that including being used for
It fixes the clamping device of probe (01) and tightens the elevating mechanism being straightened for realizing the probe (01)；
The clamping device includes two clamp assemblies (7) opposing upper and lower, realizes two clamping groups by the elevating mechanism
The distance of part in the vertical direction is adjustable, and the clamp assemblies (7) include fastener (72) and guide sleeve (73), two fasteners
(72) opposite end is arranged to pyramidal structure and inner hollow is used to be inserted into the end portion of probe (01), the fastener (72)
Opposite end be circumferentially divided into multiple shapes, equal-sized fan-shaped tabletting, the guide sleeve (73) is set in fastener (72)
On opposite end and the internal cavity of the guide sleeve (73) is arranged to and fastener (72) matched pyramidal structure, by guide sleeve to tight
The tabletting of firmware generates radial compression, and all tablettings is forced to be drawn close simultaneously to centre, to realize the folder to intermediate insertion probe
It fastens.
2. the universal probe clamping device for Sample location in neutron diffraction measurement according to claim 1, feature
It is, the elevating mechanism includes the top plate (1) set gradually from top to bottom, lifting platform (2) and pedestal (3) and is vertically arranged
Supporting guide (4) and elevating lever (5) on the pedestal (3), the support connect the lower end and the pedestal (3) of guide rail (4)
It is connected and upper end passes through the lifting platform (2) and is connected with the top plate (1), the lower end of the elevating lever (5) and the pedestal
(3) to be rotatably connected or clearance fit and upper end pass through the lifting platform (2) and top plate (1), and the elevating lever (5) between
With lifting platform (2) by being threadedly engaged linkage setting, power is set to pass to lifting platform threadingly to drive by rotation and lifting bar
The lifting platform moves up and down along supporting guide；Two clamp assemblies are separately positioned on the lifting platform (2) and pedestal (3).
3. the universal probe clamping device for Sample location in neutron diffraction measurement according to claim 2, feature
It is, further includes spare through-hole (8), the spare through-hole is symmetricly set on the lifting platform (2) and pedestal (3) and for real
Now to the permanent clamping position at probe (01) both ends.
4. the universal probe clamping device for Sample location in neutron diffraction measurement according to claim 3, feature
It is, the quantity of the spare through-hole (8) is multiple groups and has different-diameter, the central axes of the spare through-hole of each group and the fastening
The central axes of part (72) are located on same vertical plane.
5. the universal probe clamping device for Sample location in neutron diffraction measurement according to claim 3, feature
It is, further includes the V-groove (9) of one group of (01) clamping position for realizing arbitrary diameter probe, the V-groove (9) is symmetrical
It is arranged on the lifting platform (2) and pedestal (3), and central axes of the central axes of the V-groove (9) and spare through-hole (8), tightly
The central axes of firmware (72) are located on same vertical plane.
6. the universal probe clamping device for Sample location in neutron diffraction measurement according to claim 5, feature
It is, the clamp assemblies (7) further include pedestal (71), and the pedestal (71) is fixed at described by fixing bolt (75)
On lifting platform (2) and pedestal (3), the card fixed for realizing the fastener (72) insertion is equipped on the pedestal (71)
Slot is clearance fit between the fastener (72) and the card slot.
7. the universal probe clamping device for Sample location in neutron diffraction measurement according to claim 6, feature
It is, the clamp assemblies (7) further include the tight fixed bolt (74) for preventing the pedestal (71) from rotating in a circumferential direction, described
Tight fixed bolt (74) is horizontally set on the lifting platform (2) and pedestal (3) and carries out pressing fixation to pedestal from side.
8. the universal probe clamping device for Sample location in neutron diffraction measurement according to claim 7, feature
It is, two tight fixed bolts (74) are located at the same side of the pedestal (71).
9. the universal Probe clip according to any one of claim 2~8 for Sample location in neutron diffraction measurement
Hold device, which is characterized in that be equipped with convenient for the handle (6) of force in the upper end of the elevating lever (5).
10. the universal probe clamping device for Sample location in neutron diffraction measurement according to claim 9, feature
It is, matched spiral shell is equipped on the inner sidewall and the fastener (72) of the guide sleeve (73) or the lateral wall of pedestal (71)
Line makes it to fastener close to or far to realize loosening and oppress to tabletting by rotary guide sleeve.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201910007775.4A CN109738468B (en) | 2019-01-04 | 2019-01-04 | Universal probe clamping device for positioning sample in neutron diffraction measurement |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910007775.4A CN109738468B (en) | 2019-01-04 | 2019-01-04 | Universal probe clamping device for positioning sample in neutron diffraction measurement |
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| CN109738468B CN109738468B (en) | 2020-07-10 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN112858735A (en) * | 2021-01-14 | 2021-05-28 | 强一半导体（苏州）有限公司 | Probe loading object stage for measuring key size of multi-section MEMS probe |
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| US20070084053A1 (en) * | 2005-10-17 | 2007-04-19 | Pratt & Whitney Canada Corp. | Blade tip grinding tooling |
| CN202350724U (en) * | 2011-10-26 | 2012-07-25 | 东莞市欣绿医疗科技有限公司 | Measuring device for deformation of micro-pressure spring leaf |
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| CN109738468B (en) | 2020-07-10 |
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Inventor after: Li Qunming Inventor after: Zhong Jue Inventor after: Deng Hua Inventor after: Han Zhiqiang Inventor before: Li Qunming Inventor before: Deng Hua Inventor before: Han Zhiqiang |