CN109724901B - Micron particle optical detection device - Google Patents
Micron particle optical detection device Download PDFInfo
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- CN109724901B CN109724901B CN201811633456.6A CN201811633456A CN109724901B CN 109724901 B CN109724901 B CN 109724901B CN 201811633456 A CN201811633456 A CN 201811633456A CN 109724901 B CN109724901 B CN 109724901B
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Abstract
The invention provides a micron particle detection device, which detects the particle size based on the Mie scattering theory and reflects a main laser beam out of a diffusion light beam propagation optical path through a reflection component arranged on a main line optical path of a laser, so that only Mie scattering light exists in an optical signal collected in a final optical receiver. The device can reduce noise and improve the signal to noise ratio in the particle detection process by reducing the interference of the main laser to the detection signal, records and identifies the characteristics of the scattering pattern of the obtained Mie scattering light, marks the particles and improves the particle detection accuracy. The particle detection device can enable researchers to detect particles quickly and accurately.
Description
Technical Field
The invention relates to the technical field of laser, in particular to a micron particle optical detection device.
Background
Particle detection technology is becoming more and more widely used in all aspects of life, from the measurement of chemicals to the detection of water parasites. At present, the detection technology aiming at the parasites in water mainly adopts reagents for detection, the detection speed is slow, the particle detection under a common microscope is generally considered to be carried out for discrimination, and meanwhile, the detection field of view is small. The existing particle detection device can measure particle size, complex refractive index and concentration parameters of particles by using a light scattering method, and determines the particles through physical and chemical parameters of the particles, but the existing device has the problems that main laser is also doped in obtained scattered light, so that the accuracy of the obtained particle information is influenced, and the particle size of the final particles is seriously deviated. In order to reduce noise and improve signal-to-noise ratio, which enables researchers to quickly detect particles, a microparticle optical detection device is required.
Disclosure of Invention
The invention aims to provide a micron particle optical detection device aiming at overcoming the defects in the prior art, and aims to solve the problem that the particle size is inaccurate due to the fact that the finally collected optical signal is inaccurate because the main laser is doped in the existing device for detecting micron particles based on the Mie scattering theory.
The object of the invention can be achieved by the following technical measures:
the present invention provides a microparticle optical detection device, comprising:
a laser for emitting a laser beam propagating in a first direction to irradiate detected particles;
the light diffusion component is arranged at the exit of the laser and used for placing the detected particles, and the laser beam irradiates the detected particles and generates Mie scattering to form a diffused light beam;
an optical shaping component for shaping the diffused light beam;
an optical receiver for receiving the shaped diffused beam; and
and the reflecting component is arranged in the diffused light beam propagation optical path and used for reflecting the light beam propagating along the first direction in the diffused light beam so as to guide the light beam out of the diffused light beam propagation optical path.
Further, the light diffusion component is a particle channel.
Further, the optical shaping assembly includes:
and the collecting mirror is arranged between the particle channel and the reflecting component and is used for collecting the diffused light beams.
Further, the optical shaping assembly further comprises:
and the view field adjusting lens is arranged between the reflecting component and the light receiver and is used for adjusting the emergent light angle of the diffused light beam.
Further, the reflection component comprises a reflection absorption point and a flat glass, the reflection absorption point is installed on the flat glass, and the surface of the reflection absorption point is a reflection surface.
Further, the surface of the reflection and absorption point is a 45-degree slope.
Further, the focal point of the laser beam is located on the surface of the reflection absorption point.
Further, the optical receiver is a camera for acquiring a scattering diagram of the shaped diffused light beam.
Furthermore, the device also comprises an analysis module which is used for judging the type of the detected particles according to the scattering diagram.
The invention has the advantages that the micron particle detection device is used for detecting the particle size based on the Mie scattering theory, and the main laser beam is reflected out of the diffusion light beam propagation optical path through the reflection component arranged on the main laser line optical path of the laser, so that only Mie scattered light exists in the optical signal collected in the final optical receiver. The device can reduce noise and improve the signal to noise ratio in the particle detection process by reducing the interference of the main laser to the detection signal, records and identifies the characteristics of the scattering pattern of the obtained Mie scattering light, marks the particles and improves the particle detection accuracy. The particle detection device can enable researchers to detect particles quickly and accurately.
Drawings
FIG. 1 is a structural diagram of a microparticle detection apparatus according to an embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention will be described in further detail with reference to the accompanying drawings and specific embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
In order to make the description of the present disclosure more complete and complete, the following description is given for illustrative purposes with respect to the embodiments and examples of the present invention; it is not intended to be the only form in which the embodiments of the invention may be practiced or utilized. The embodiments are intended to cover the features of the various embodiments as well as the method steps and sequences for constructing and operating the embodiments. However, other embodiments may be utilized to achieve the same or equivalent functions and step sequences.
The present invention provides a microparticle optical detection device, comprising:
a laser for emitting a laser beam propagating in a first direction to irradiate detected particles;
the light diffusion component is arranged at the exit of the laser and used for placing the detected particles, and the laser beam irradiates the detected particles and generates Mie scattering to form a diffused light beam;
an optical shaping component for shaping the diffused light beam;
an optical receiver for receiving the shaped diffused beam; and
and the reflecting component is arranged in the diffused light beam propagation optical path and used for reflecting the light beam propagating along the first direction in the diffused light beam so as to guide the light beam out of the diffused light beam propagation optical path.
The micron particle detection device of the invention detects the particle size based on the Mie scattering theory, and reflects the main laser beam out of the diffusion light beam propagation optical path through the reflection component arranged on the main line optical path of the laser, so that only Mie scattered light exists in the optical signal collected in the final optical receiver. The device can reduce noise and improve the signal to noise ratio in the particle detection process by reducing the interference of the main laser to the detection signal, records and identifies the characteristics of the scattering pattern of the obtained Mie scattering light, marks the particles and improves the particle detection accuracy. The particle detection device can enable researchers to detect particles quickly and accurately.
Fig. 1 shows a structural diagram of a microparticle detection apparatus according to an embodiment of the present invention, referring to fig. 1, FIG. 1 includes a laser 1, the laser 1 can emit a laser beam 7, a particle channel 2, a light diffusion component for placing detected particles, the laser beam 7 irradiates the detected particles to generate Mie scattering to form a diffused light beam 8, a focusing mirror 3 and a view field adjusting lens 6 are both optical shaping components, the focusing mirror 3 is used for converging the Mie scattering light beam, the view field adjusting lens 6 is used for adjusting the emergent light angle of the diffused light beam, a reflection component 4 includes a reflection absorption point 41 and a flat glass 42, the reflection absorption point 41 is installed on the flat glass, the surface of the reflection absorption point 41 is a reflection surface with a 45-degree inclined surface, a camera 5 is an optical receiver, for obtaining a scatter pattern of the shaped diffused beam, the scatter pattern of the camera 5 may be analyzed by a data analysis module 9.
According to the micrometer particle detection device shown in fig. 1, when a laser beam 7 emitted by a laser beam 1 irradiates particles placed in a particle channel 2, the particles in the particle channel are subjected to mie scattering, a formed mie scattering light beam 8 and the laser beam 7 are converged after passing through a focusing mirror 3, and pass through a reflecting part 4 in a converging way, meanwhile, the mie laser beam 7 passes through a reflection absorption point 41 of the reflecting part 4, and is reflected out of a propagation light path by a reflection surface of a 45-degree inclined plane of the reflection absorption point 41, and the mie scattering light is converged continuously, and is adjusted to enter a camera 5 through a market adjusting lens 6, an analysis module 9 can be connected behind the camera 5, and the analysis module 9 can mark the particles according to the record and the characteristic identification of a scattering pattern obtained by the camera 5, so as to judge the type of the detected particles.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents and improvements made within the spirit and principle of the present invention are intended to be included within the scope of the present invention.
Claims (8)
1. A microparticle-optical inspection apparatus, comprising:
a laser for emitting a laser beam propagating in a first direction to irradiate detected particles;
the light diffusion component is arranged at the exit of the laser and used for placing the detected particles, and the laser beam irradiates the detected particles and generates Mie scattering to form a diffused light beam;
an optical shaping component for shaping the diffused light beam;
an optical receiver for receiving the shaped diffused beam; and
a reflecting member provided in the diffused-beam propagation optical path for reflecting a light beam propagating in a first direction among the diffused light beams to guide the light beam out of the diffused-beam propagation optical path; the reflecting component comprises a reflection absorption point and a flat glass, the reflection absorption point is installed on the flat glass, and the surface of the reflection absorption point is a reflecting surface.
2. The microparticle optical inspection device as claimed in claim 1, wherein said light diffusing component is a particle channel.
3. The microparticle optical inspection device as claimed in claim 2, wherein said optical shaping assembly comprises:
and the collecting mirror is arranged between the particle channel and the reflecting component and is used for collecting the diffused light beams.
4. The microparticle optical inspection device as defined in claim 3, wherein said optical shaping assembly further comprises:
and the view field adjusting lens is arranged between the reflecting component and the light receiver and is used for adjusting the emergent light angle of the diffused light beam.
5. The optical detection device for microparticles as claimed in claim 1, wherein the surface of the reflection absorption point is a 45 degree slope.
6. The optical detection device for microparticles as claimed in claim 1 wherein the focal point of the laser beam is located on the surface of the reflective absorption point.
7. The microparticle optical inspection device as claimed in claim 3, wherein said optical receiver is a camera for obtaining a scatter plot of the shaped diffused beam.
8. The optical detection apparatus for micron particles as described in claim 7 further comprising an analysis module for determining the type of said detected particles based on said scatter plot.
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