CN109670255A - A kind of exemplary simulation condition recommended method of time sequence parameter cluster - Google Patents

A kind of exemplary simulation condition recommended method of time sequence parameter cluster Download PDF

Info

Publication number
CN109670255A
CN109670255A CN201811601063.7A CN201811601063A CN109670255A CN 109670255 A CN109670255 A CN 109670255A CN 201811601063 A CN201811601063 A CN 201811601063A CN 109670255 A CN109670255 A CN 109670255A
Authority
CN
China
Prior art keywords
collection
parameter
time sequence
path
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201811601063.7A
Other languages
Chinese (zh)
Other versions
CN109670255B (en
Inventor
江荣贵
郭超
石华俊
陈彬
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Beijing Empyrean Technology Co Ltd
Original Assignee
Beijing CEC Huada Electronic Design Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Beijing CEC Huada Electronic Design Co Ltd filed Critical Beijing CEC Huada Electronic Design Co Ltd
Priority to CN201811601063.7A priority Critical patent/CN109670255B/en
Publication of CN109670255A publication Critical patent/CN109670255A/en
Application granted granted Critical
Publication of CN109670255B publication Critical patent/CN109670255B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00Computer-aided design [CAD]
    • G06F30/20Design optimisation, verification or simulation
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00Computer-aided design [CAD]
    • G06F30/30Circuit design
    • G06F30/39Circuit design at the physical level
    • G06F30/398Design verification or optimisation, e.g. using design rule check [DRC], layout versus schematics [LVS] or finite element methods [FEM]

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Evolutionary Computation (AREA)
  • Geometry (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Management, Administration, Business Operations System, And Electronic Commerce (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)

Abstract

A kind of exemplary simulation condition recommended method of time sequence parameter cluster, comprising the following steps: building service condition collection, path parameter collection and cell parameters collection;The path parameter collection and the cell parameters collection are subjected to Z-score normalization, and extraction typical statistic parameter for statistical analysis;It carries out ISODATA clustering and obtains the path parameter collection and the corresponding cluster classification of the cell parameters collection;Supervised classification model is established, determines simulated conditions boundary corresponding to the different operating mode of circuit.The present invention obtains circuit critical path and the relevant time sequence parameter building sample data set of internal element under more simulated conditions, the classification and screening of time sequence parameter are completed by ISODATA clustering algorithm, and it navigates to typical simulation run condition and recommends user, accelerate circuit sequence verifying and analytic process, and then shortens the chip design cycle.

Description

A kind of exemplary simulation condition recommended method of time sequence parameter cluster
Technical field
The present invention relates to EDA design field, in particular to a kind of exemplary simulation condition recommended method of time sequence parameter cluster.
Background technique
Eda tool completes the physical Design of chip by calling standard cell lib (Standard Cell Library), when Sequence library (Timing Library) is then at static timing analysis (Static Timing Analysis, STA) with bivariate table Form recording unit library in cell delay information.Timing verification and analytic process of the eda tool when chip makes physical is implemented In, circuit basic unit delay parameter is to be directly acquired by the library or interpolation calculation obtains.Meanwhile circuit interconnection line RC joins It is several that the influence of the timing of entire circuit also can not be ignored.With the continuous improvement of technological level and design requirement, multiterminal angle-is introduced Multi-mode (Multi-Corner Multi-mode, MCMM) technology is carried out for the different working environment of chip and operating mode Combination is as SPICE emulation (i.e. Simulation program with integrated circuit emphasis, emulation Circuit simulator is most common circuit-level simulation program, and it is big that each software vendor provides VSPICE, HSPICE and PSPICE etc. With the SPICE software version of small difference, be all made of the spice simulation algorithm of Berkeley university exploitation) model parameter, with reality Circuit sequence analysis and inspection under existing many condition operating condition.During synchronous circuit timing Design, temporal constraint (Timing Constraints) plays directive function to the physical Design and timing Design of chip, is that checking chip timing is No convergent benchmark.The timing results obtained by STA can in standard cell lib specific PVT (Process, Voltage and Temperature) under SPICE emulation timing results complete calibration.It is old that circuit is introduced under the conditions of typical PVT Change time (Aging Time) and is used as SPICE circuit simulation model parameter, it can be more truly in solving circuit critical path The time sequence parameter of portion's each unit efficiently solves limitation of STA during chip designs.But SPICE circuit simulation one As take a long time, and each time the time sequence parameter of simulation and calculation can not reactionary slogan, anti-communist poster to circuit each unit, for subsequent STA circuit analysis It is recycled, which increases the period of chip design.Meanwhile under a large amount of simulated conditions SPICE emulation when Its information redundance of order parameter is larger, lacks typicalness, to hinder subsequent conditioning circuit timing verification and analytic process.
Circuit sequence analysis mainly by be calculated on two levels of circuit critical path and inside unit when Order parameter completes correlation analysis, and it may also include phase without same path that wherein single-pathway, which may include multiple and different units, Same unit.Either which level, the time sequence parameter obtained under more simulated conditions can construct effective sample data set, And the classification and screening of emulation time sequence parameter data set are completed by classical machine learning algorithm (such as classify, cluster), and fixed User is recommended to typical simulation run condition in position, accelerates circuit sequence verifying and analytic process.
Summary of the invention
In order to solve the shortcomings of the prior art, the purpose of the present invention is to provide a kind of typical cases of time sequence parameter cluster Simulated conditions recommended method, obtains circuit critical path under more simulated conditions and the relevant time sequence parameter of internal element constructs sample Notebook data collection, the classification and screening of time sequence parameter are completed by ISODATA clustering algorithm, and navigate to typical simulation run item Part recommends user, accelerates circuit sequence verifying and analytic process, and then shorten the chip design cycle.
To achieve the above object, the exemplary simulation condition recommended method of time sequence parameter cluster provided by the invention, including with Lower step:
1) service condition collection, path parameter collection and cell parameters collection are constructed;
2) the path parameter collection and the cell parameters collection are subjected to Z-score normalization, and for statistical analysis mentioned Take typical statistic parameter;
3) it carries out ISODATA clustering and obtains the path parameter collection and the corresponding cluster class of the cell parameters collection Not;
4) supervised classification model is established, determines simulated conditions boundary corresponding to the different operating mode of circuit.
Further, in the step 1), according to artificial circuit topological structure and artificial tasks hierarchical structure, selection is imitative True task proper subclass and emulation time sequence parameter proper subclass construct service condition collection and path parameter collection or cell parameters collection respectively;
The building of path parameter collection or cell parameters collection is fit to same artificial tasks hierarchical structure, wherein preceding 3 layers of correspondence In mulitpath and multiple units, latter 2 layers then correspond to a paths or a unit, specific steps are as follows:
Service condition collection is constructed with the actual SPICE simulation run condition of circuit;
The SPICE emulation that circuit is completed for all SPICE simulated conditions vector resolves the circuit critical path and interior The time sequence parameter of portion's unit;
Using critical path or essential elements as research object, its time sequence parameter under the conditions of all simulation runs is integrated Construct set of data samples;The set of data samples, including path parameter collection and cell parameters collection construct a R respectively4And R3's European sample space, path parameter collection vector sum cell parameters collection vector are respectively the feature vector in the sample space.
Further, the service condition collection, including, Process, Voltage, Temperature and Aging Time.
Further, the path parameter collection, including, launch clock path delay, data path delay, Capture clock path delay and path slack;The cell parameters collection, including, increment delay, Transition time and arrival time.
Further, in the step 2), path parameter collection and cell parameters collection are subjected to Z-score normalization, system Typical statistic parameter is extracted in meter analysis;With reference to timing sequence library and temporal constraint, the primary condition of ISODATA Clustering Model is determined, The typical statistic parameter includes sum, maximum value, minimum value, mean value, minimal characteristic distance, maximum characteristic distance.
Further, the step 3) further comprises selecting in each classification according to minimal distance principle apart from classification The nearest time sequence parameter sample in center is represented as such time sequence parameter, and corresponding simulated conditions are as circuit exemplary operation Service condition under mode.
Further, the step 4) further comprises, using cluster result label as the sample of corresponding service condition collection This label establishes supervised classification model, for predicting its corresponding circuits time sequence status for new simulated conditions, while determining circuit Simulated conditions boundary corresponding to different operating modes, for time sequence status prediction and exception of the circuit under new simulated conditions Situation detection.
It further, can be by new simulated conditions and emulation time sequence parameter difference after completing SPICE emulation to new samples It is included in service condition collection and path parameter collection, cell parameters collection, updates optimization Clustering Model and disaggregated model, is further obtained more Has exemplary simulation service condition subset.
To achieve the above object, the present invention also provides a kind of computer readable storage mediums, are stored thereon with computer and refer to The step of order, the computer instruction executes the exemplary simulation condition recommended method of above-mentioned time sequence parameter cluster when running.
Technical solution of the present invention has the advantages that
1) OCS, PPS and CPS are constructed respectively using the parameter of emulation front and back, and using Z-Score rule to PPS and CPS carries out standardization processing, balances the influence of each time sequence parameter.And typical operation item is reverse-located by analysis PPS and CPS Part subsetAndThen will represent a kind of typical circuit operating pattern;
2) realize that the timing redundancy of SPICE emulation time sequence parameter collection PPS and CPS is solidifying using ISODATA clustering algorithm It is poly-.Temporal constraint rule can be incorporated after clustering and quickly navigates to the exception class of timing violation, and then accelerates timing verification And analytic process, effectively shorten the chip design cycle;
3) class label that PPS and CPS cluster generates is used for the supervised classification of OCS, quickly distinguishes and predicts to reach Circuit operating pattern under subsequent simulation service condition.Newly-increased simulated conditions are used to simultaneously to cluster the update with disaggregated model The precision of Clustering Model and disaggregated model is continuously improved in optimization process.
4) after increasing artificial tasks newly, its simulation run condition and emulation time sequence parameter are used for Clustering Model and disaggregated model Update optimization finally stablized and accurate exemplary simulation condition recommendation results until model is restrained.
Other features and advantages of the present invention will be illustrated in the following description, also, partly becomes from specification It obtains it is clear that understand through the implementation of the invention.
Detailed description of the invention
Attached drawing is used to provide further understanding of the present invention, and constitutes part of specification, and with it is of the invention Embodiment together, is used to explain the present invention, and is not construed as limiting the invention.In the accompanying drawings:
Fig. 1 is the flow chart of the exemplary simulation condition recommended method of time sequence parameter according to the present invention cluster;
Fig. 2 is the schematic diagram according to the artificial tasks hierarchical structure of embodiments of the present invention;
Fig. 3 is the emulation time sequence parameter clustering block diagram according to embodiments of the present invention;
Fig. 4 is the signal updated according to the emulation time sequence status prediction of embodiments of the present invention and machine learning model Figure.
Specific embodiment
Hereinafter, preferred embodiments of the present invention will be described with reference to the accompanying drawings, it should be understood that preferred reality described herein Apply example only for the purpose of illustrating and explaining the present invention and is not intended to limit the present invention.
Fig. 1 is the flow chart of the exemplary simulation condition recommended method of time sequence parameter according to the present invention cluster, below will ginseng Fig. 1 is examined, the exemplary simulation condition recommended method of time sequence parameter cluster of the invention is described in detail.
Firstly, constructing service condition collection (Operating Conditions Set, OCS), path parameter in step 101 Collect (Path Parameter Set, PPS) and cell parameters collection (Cell Parameter Set, CPS).
Fig. 2 is the schematic diagram according to the artificial tasks hierarchical structure of embodiments of the present invention.As shown in Fig. 2, illustrating The hierarchical structure explosion views of artificial tasks (Simulation Task) under normal circumstances, forCorresponding to one Specific artificial tasks.According to the development of MCMM technology, each artificial tasks may include multiple scenes (Scenarios). Meanwhile each scene, by constituting comprising one or more group of paths (Path Groups), each group of paths includes one or more Paths (Paths, data path or clock path), and each path can all pass through one or more units (Cells).It presses For the hierarchical structure, it can be separately included according to Simulation Task, Scenarios and Path Groups three first layers Paths and the emulation time sequence parameter of Cells construct PPS and CPS, then by the way that ISODATA clustering circuit is whole or electricity The time sequence status in road region;And be directed to Paths and Cells level, then when selecting the emulation of same Path or the same Cell Order parameter constructs PPS and CPS, and passes through the time sequence status of ISODATA clustering circuit part.Pass through building and emulation PPS corresponding to task hierarchical structure and CPS is, it can be achieved that the timing verification of circuit different levels structure is analyzed.It is each simultaneously There is the primary and secondary dependence for clearly " including and constituting " between level, it, can be successively secondary in conjunction with existing temporal constraint principle Apparent more fully analysis, which is controlled, to be realized to the time sequence status of circuit.
In this step, according to artificial circuit topological structure and artificial tasks hierarchical structure, reasonable artificial tasks are selected Proper subclass and emulation time sequence parameter proper subclass construct OCS and PPS, CPS (wherein PPS and CPS at least constructs one) respectively, to grind Study carefully the time sequence status feature that circuit is whole or part is under each operating mode.Specific steps are as follows:
1) service condition collection (Operating Conditions is constructed with the actual SPICE simulation run condition of circuit Set, OCS), OCS includes: process (Process), voltage (Voltage), temperature (Temperature) and ageing time Multiple parameters such as (Aging Time).
2) SPICE for completing circuit to all SPICE simulated conditions vectors in 1) is emulated, and resolves the circuit critical path And the time sequence parameter of internal element;
3) using critical path or essential elements as research object, its comprehensive timing under the conditions of all simulation runs is joined Number building set of data samples, wherein path parameter collection (Path Parameter Set, PPS) includes that the path launch clock prolongs (launch clock path delay), data path delay (data path delay), capture clock path delay late (capture clock path delay) and timing path relaxation (timing path slack);The cell parameters collection, packet Include delta delay (incremental delay), transit time (transition time) and arrival time (arrival Time), a R is constructed respectively4And R3European sample space, PPS vector sum CPS vector is respectively in the sample space Feature vector.
It may be noted that the time sequence parameter collection of building includes circuit hierarchical information.The building of PPS and CPS needs to be fit to same Artificial tasks hierarchical structure, wherein first 3 layers likely correspond to mulitpath and multiple units, latter 2 layers then correspond to a paths An or unit (single-pathway may also include multiple units).
In step 102, PPS and CPS is subjected to Z-score normalization, statistical analysis extracts typical statistic parameter.
In this step, PPS and CPS are subjected to Z-score normalization, need for different path or cell respectively into Row statistical analysis extracts typical statistic parameter, such as sum, maximum value, minimum value, mean value, minimal characteristic distance, maximum feature away from From determining the primary condition of ISODATA Clustering Model with reference to timing sequence library and temporal constraint.
In this step, in order to balance the contribution of each temporal aspect parameter, using Z-score feature normalization rule pair Each parameter is standardized, so that the temporal aspect parameter of all path or cell obeys standardized normal distribution N (0,1).
In step 103, ISODATA clustering obtains the corresponding cluster classification of PPS and CPS.
ISODATA is introduced first, ISODATA, i.e. Iterative Self-organizing Data Analysis Techniques Algorithm, iteration self-organizing data analysis algorithm are the bases in K-means clustering algorithm On plinth, increase to cluster result " merging " and " division " two operations, and a kind of cluster of set algorithm operational parameter control is calculated Method.Wherein, the selection of iterative parameter and the number of iterations all has an impact to cluster result.
By the redundancy of a large amount of emulation time sequence parameters of ISODATA cluster removal, so that the stronger timing ginseng of similitude Number merger is same class, establishes screening rule and is recommended using navigating to suitable time sequence parameter and service condition as Typical Representative User is used for timing verification and abnormality detection.Specifically, in this step, ISODATA clustering obtains time sequence parameter collection The corresponding cluster classification of PPS and CPS selects timing nearest apart from class center in each classification to join according to minimal distance principle Numerical example is represented as such time sequence parameter, and corresponding simulated conditions are as the operation item under circuit typical mode of operation Part.That is, using simulation run conditional parameter corresponding to the temporal aspect vector nearest apart from each cluster centre as this Service condition of the circuit under a certain typical mode of operation represents, i.e., all kinds of included artificial circuit timing shapes in cluster result State belongs to the circuit typical mode of operation under typical service condition.
Fig. 3 is the emulation time sequence parameter clustering block diagram according to embodiments of the present invention.As shown in figure 3, giving SPICE emulates the process of time sequence parameter collection PPS and CPS clustering, and introducing temporal constraint facilitates ISODATA Clustering Model Rationally initialization, and cluster result is explained to analyze the typical circuit operating mode of each classification.According to minimum range Principle pulls out the emulation time sequence parameter nearest apart from such center as representing from each cluster classification, carries out timing and tests Card and analysis;The representation parameter maps corresponding simulated conditions and constitutes typical service condition subsetPass through To time sequence parameter collection PPS and CPS using Z-score normalize and ISODATA clustering, it is intended to by with similar characteristic when Order parameter is integrated into same category, removes bulk redundancy information, screens typical time sequence parameter and represents as timing verification and analysis, To shorten the chip design cycle.
In this step, cluster is completed to all feature samples using ISODATA clustering algorithm, primary condition can root It is constrained according to timing sequence library and correlation timing, the statistical result of joint PPS or CPS codetermines.
In step 104, supervised classification model is established, determines simulated conditions side corresponding to the different operating mode of circuit Boundary.
In this step, it using cluster result label as the sample label of corresponding OCS, establishes pre- for new simulated conditions The supervised classification model of its corresponding circuits time sequence status is surveyed, while determining simulated conditions corresponding to the different operating mode of circuit Boundary is conducive to time sequence status prediction and abnormal conditions detection of the circuit under new simulated conditions.
Fig. 4 is the signal updated according to the emulation time sequence status prediction of embodiments of the present invention and machine learning model Figure.As shown in figure 4, can also establish supervised classification model to subsequent simulation by the ISODATA cluster labels of emulation time sequence parameter Circuit timing parameters state corresponding to condition is predicted and is distinguished.Existing simulated conditions collection OCS joint cluster labels are built Vertical supervised learning model, to prejudge to the SPICE emulation time sequence status of circuit under new simulated conditions, verification process can It is completed by SPICE emulation and temporal constraint.Since the machine learning models such as cluster, classify are larger to the dependence of sample, Its precision and the independence of sample, typicalness and separability are closely related, therefore after new samples complete SPICE emulation, it can will be new Simulated conditions and emulation time sequence parameter be included in OCS and PPS, CPS respectively, and then realize the update of Clustering Model and disaggregated model Optimization further obtains and has more exemplary simulation service condition subset Ω '.
It, can be by the supervised classification model of foundation to the corresponding circuit of the simulated conditions when there is new artificial tasks creation Time sequence status is prejudged, and is verified by SPICE emulation;If duplicate simulated conditions can be built by data with existing The mode of vertical look-up table is directly searched to circuit sequence state corresponding to the condition, without carrying out SPICE emulation again.Meanwhile New simulation run condition and emulation time sequence parameter can be used for updating OCS and PPS, CPS, and repeat 102-104 pairs of step ISODATA Clustering Model and supervised classification model realization update optimization, obtain more typical simulation run condition subset and more quasi- True simulated conditions distinguish boundary.That is, the operating mode in order to quickly distinguish and predict the circuit under subsequent simulation service condition, Can exercise supervision to the simulation run conditional parameter collection constructed in step 101 time sequence parameter cluster result corresponding with its taxology It practises, while newly-increased simulated conditions can also be used in the update optimization of Clustering Model and disaggregated model, further obtain more typical Simulation run condition recommends user.
Secondary use ISODATA cluster analysis result establishes classical supervised classification model to simulation run conditional parameter collection OCS is distinguished, and determines the simulated conditions boundary under different circuit operating patterns, and the timing for accelerating circuit subsequent simulation task is tested Card and analysis.
The present invention also provides a kind of computer readable storage mediums, are stored thereon with computer instruction, the computer The step of exemplary simulation condition recommended method of above-mentioned time sequence parameter cluster is executed when instruction operation, the time sequence parameter cluster Exemplary simulation condition recommended method referring to the introduction of preceding sections, repeat no more.
Those of ordinary skill in the art will appreciate that: the foregoing is only a preferred embodiment of the present invention, and does not have to In the limitation present invention, although the present invention is described in detail referring to the foregoing embodiments, for those skilled in the art For, still can to foregoing embodiments record technical solution modify, or to part of technical characteristic into Row equivalent replacement.All within the spirits and principles of the present invention, any modification, equivalent replacement, improvement and so on should all include Within protection scope of the present invention.

Claims (9)

1. a kind of exemplary simulation condition recommended method of time sequence parameter cluster, which comprises the following steps:
1) service condition collection, path parameter collection and cell parameters collection are constructed;
2) the path parameter collection and the cell parameters collection are subjected to Z-score normalization, and extraction allusion quotation for statistical analysis Type statistical parameter;
3) it carries out ISODATA clustering and obtains the path parameter collection and the corresponding cluster classification of the cell parameters collection;
4) supervised classification model is established, determines simulated conditions boundary corresponding to the different operating mode of circuit.
2. the exemplary simulation condition recommended method of time sequence parameter cluster according to claim 1, which is characterized in that described In step 1), according to artificial circuit topological structure and artificial tasks hierarchical structure, artificial tasks proper subclass and emulation timing are selected Parameter proper subclass constructs service condition collection and path parameter collection or cell parameters collection respectively;
The building of path parameter collection or cell parameters collection is fit to same artificial tasks hierarchical structure, wherein first 3 layers correspond to it is more Paths and multiple units, latter 2 layers then correspond to a paths or a unit, specific steps are as follows:
Service condition collection is constructed with the actual SPICE simulation run condition of circuit;
The SPICE emulation that circuit is completed for all SPICE simulated conditions vectors resolves the circuit critical path and internal list The time sequence parameter of member;
Using critical path or essential elements as research object, its comprehensive time sequence parameter under the conditions of all simulation runs is constructed Set of data samples;The set of data samples, including path parameter collection and cell parameters collection construct a R respectively4And R3It is European Sample space, path parameter collection vector sum cell parameters collection vector are respectively the feature vector in the sample space.
3. the exemplary simulation condition recommended method of time sequence parameter cluster according to claim 1, which is characterized in that the fortune Row condition set, including, process, voltage, temperature and ageing time.
4. the exemplary simulation condition recommended method of time sequence parameter cluster according to claim 1, which is characterized in that the road Diameter parameter set, including, the path launch clock delay, data path delay, capture clock path delay and timing path pine It relaxes;The cell parameters collection, including, delta delay, transit time and arrival time.
5. the exemplary simulation condition recommended method of time sequence parameter cluster according to claim 1, which is characterized in that described In step 2, path parameter collection and cell parameters collection are subjected to Z-score normalization, statistical analysis extracts typical statistic parameter; With reference to timing sequence library and temporal constraint, the primary condition of ISODATA Clustering Model is determined, the typical statistic parameter includes total Number, maximum value, minimum value, mean value, minimal characteristic distance, maximum characteristic distance.
6. the exemplary simulation condition recommended method of time sequence parameter cluster according to claim 1, which is characterized in that the step It is rapid 3), further comprise that time sequence parameter sample nearest apart from class center in each classification is selected according to minimal distance principle Time sequence parameter as such represents, and corresponding simulated conditions are as the service condition under circuit typical mode of operation.
7. the exemplary simulation condition recommended method of time sequence parameter cluster according to claim 1, which is characterized in that the step It is rapid 4), further comprise, using cluster result label as the sample label of corresponding service condition collection, establishing supervised classification mould Type for predicting its corresponding circuits time sequence status for new simulated conditions, while determining corresponding to the different operating mode of circuit Simulated conditions boundary, for circuit under new simulated conditions time sequence status prediction and abnormal conditions detection.
8. the exemplary simulation condition recommended method of time sequence parameter cluster according to claim 1, which is characterized in that new sample After this completion SPICE emulation, new simulated conditions and emulation time sequence parameter can be included in service condition collection and path parameter respectively Collection, cell parameters collection update optimization Clustering Model and disaggregated model, further obtain and have more exemplary simulation service condition subset.
9. a kind of computer readable storage medium, is stored thereon with computer instruction, which is characterized in that the computer instruction fortune Perform claim requires the step of exemplary simulation condition recommended method of 1 to 8 described in any item time sequence parameter clusters when row.
CN201811601063.7A 2018-12-26 2018-12-26 Typical simulation condition recommendation method for time sequence parameter clustering Active CN109670255B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201811601063.7A CN109670255B (en) 2018-12-26 2018-12-26 Typical simulation condition recommendation method for time sequence parameter clustering

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201811601063.7A CN109670255B (en) 2018-12-26 2018-12-26 Typical simulation condition recommendation method for time sequence parameter clustering

Publications (2)

Publication Number Publication Date
CN109670255A true CN109670255A (en) 2019-04-23
CN109670255B CN109670255B (en) 2020-04-07

Family

ID=66146235

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201811601063.7A Active CN109670255B (en) 2018-12-26 2018-12-26 Typical simulation condition recommendation method for time sequence parameter clustering

Country Status (1)

Country Link
CN (1) CN109670255B (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111898335A (en) * 2020-06-23 2020-11-06 北京大学 Circuit reliability analysis method
CN112100158A (en) * 2020-09-21 2020-12-18 海光信息技术有限公司 Standard cell library establishing method and device, electronic equipment and storage medium
CN113806151A (en) * 2021-09-07 2021-12-17 深圳宝新创科技股份有限公司 Time sequence parameter determination method, device, electronic equipment and system
CN114626324A (en) * 2022-02-24 2022-06-14 深圳市紫光同创电子有限公司 Post-simulation verification method and device for FPGA circuit, electronic equipment and storage medium
CN116796209A (en) * 2023-08-24 2023-09-22 北京安图生物工程有限公司 Data processing method for monitoring storage environment temperature of detection kit

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08137974A (en) * 1994-11-15 1996-05-31 Toshiba Corp Fund operation supporting device for automatic transaction device
CN107238817A (en) * 2017-07-04 2017-10-10 中国人民解放军海军航空工程学院 A kind of parameter adaptive setting and the radar emitter signal method for separating of adjust automatically
CN107895222A (en) * 2017-10-26 2018-04-10 华北电力大学 The bad Leakage Reactance discrimination method of transformer based on DBSCAN algorithms
CN108446412A (en) * 2017-02-16 2018-08-24 龙芯中科技术有限公司 Memory Compilation Method, device and the memory of generation

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08137974A (en) * 1994-11-15 1996-05-31 Toshiba Corp Fund operation supporting device for automatic transaction device
CN108446412A (en) * 2017-02-16 2018-08-24 龙芯中科技术有限公司 Memory Compilation Method, device and the memory of generation
CN107238817A (en) * 2017-07-04 2017-10-10 中国人民解放军海军航空工程学院 A kind of parameter adaptive setting and the radar emitter signal method for separating of adjust automatically
CN107895222A (en) * 2017-10-26 2018-04-10 华北电力大学 The bad Leakage Reactance discrimination method of transformer based on DBSCAN algorithms

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
李志博: "射频电路多参数健康评估技术研究", 《中国优秀硕士学位论文全文数据库 信息科技辑》 *
梁涛: "模拟集成电路性能参数建模及其参数成品率估计算法的研究", 《中国博士学位论文全文数据库 信息科技辑》 *

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111898335A (en) * 2020-06-23 2020-11-06 北京大学 Circuit reliability analysis method
CN112100158A (en) * 2020-09-21 2020-12-18 海光信息技术有限公司 Standard cell library establishing method and device, electronic equipment and storage medium
CN112100158B (en) * 2020-09-21 2022-11-22 海光信息技术股份有限公司 Standard cell library establishing method and device, electronic equipment and storage medium
CN113806151A (en) * 2021-09-07 2021-12-17 深圳宝新创科技股份有限公司 Time sequence parameter determination method, device, electronic equipment and system
CN113806151B (en) * 2021-09-07 2024-01-02 深圳宝新创信息技术有限公司 Time sequence parameter determining method, device, electronic equipment and system
CN114626324A (en) * 2022-02-24 2022-06-14 深圳市紫光同创电子有限公司 Post-simulation verification method and device for FPGA circuit, electronic equipment and storage medium
CN114626324B (en) * 2022-02-24 2023-12-12 深圳市紫光同创电子有限公司 FPGA circuit post-simulation verification method and device, electronic equipment and storage medium
CN116796209A (en) * 2023-08-24 2023-09-22 北京安图生物工程有限公司 Data processing method for monitoring storage environment temperature of detection kit
CN116796209B (en) * 2023-08-24 2023-10-20 北京安图生物工程有限公司 Data processing method for monitoring storage environment temperature of detection kit

Also Published As

Publication number Publication date
CN109670255B (en) 2020-04-07

Similar Documents

Publication Publication Date Title
CN109670255A (en) A kind of exemplary simulation condition recommended method of time sequence parameter cluster
CN112100952B (en) Post-simulation method and device for integrated circuit, electronic equipment and storage medium
US7092845B2 (en) Computational design methods
US11836641B2 (en) Machine learning-based prediction of metrics at early-stage circuit design
CN111274134A (en) Vulnerability identification and prediction method and system based on graph neural network, computer equipment and storage medium
CN109657805A (en) Hyper parameter determines method, apparatus, electronic equipment and computer-readable medium
US11726899B2 (en) Waveform based reconstruction for emulation
US7249331B2 (en) Architectural level throughput based power modeling methodology and apparatus for pervasively clock-gated processor cores
US20110035203A1 (en) system level power evaluation method
US10699046B2 (en) System and method for achieving functional coverage closure for electronic system verification
CN114730352A (en) Method and apparatus for machine learning based delay calculation and verification of integrated circuit design
CN107909141A (en) A kind of data analysing method and device based on grey wolf optimization algorithm
KR101966558B1 (en) System and method for visualizing equipment inventory status and repair parts procurement request
CN115165332A (en) Integrated design method and system for built-in test and comprehensive test of equipment
US6847927B2 (en) Efficient array tracing in a logic simulator machine
CN117435505B (en) Visual generation method of performance test script
US11227090B2 (en) System and method for achieving functional coverage closure for electronic system verification
CN112783513A (en) Code risk checking method, device and equipment
CN117272896A (en) Machine learning techniques for circuit design verification
Bounceur et al. A classification approach for an accurate analog/RF BIST evaluation based on the process parameters
CN115184055A (en) Method and system for determining test set with optimized hierarchical testability
US20220390999A1 (en) System and method for predicting power usage of network components
US20220164511A1 (en) Method and apparatus for power measurement in electronic circuit design and analysis
US6829572B2 (en) Method and system for efficiently overriding array net values in a logic simulator machine
US11842130B1 (en) Model-based simulation result predictor for circuit design

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant
CP01 Change in the name or title of a patent holder

Address after: 100102 Beijing city two Chaoyang District Lize Road No. 2 A block 2 layer

Patentee after: Beijing Huada Jiutian Technology Co.,Ltd.

Address before: 100102 Beijing city two Chaoyang District Lize Road No. 2 A block 2 layer

Patentee before: HUADA EMPYREAN SOFTWARE Co.,Ltd.

CP01 Change in the name or title of a patent holder