CN109632092A - A kind of luminance test system and method based on spatial light field - Google Patents
A kind of luminance test system and method based on spatial light field Download PDFInfo
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Abstract
The invention discloses a kind of luminance test system and method based on spatial light field, CCD is demarcated in advance using the scaling method of traditional luminance meter, using this calculated relationship as the corresponding relationship of image grayscale and brightness, and then the image on required focal plane is obtained by light field refocusing algorithm, the Luminance Distribution in respective planes is converted thereof into again, by adjusting the image and its Luminance Distribution of the available different focal planes of relevant parameter of refocusing, it does not need to focus when measuring brightness, it operates very easy, and it can be quick, real-time capture spatial brightness information, match different measurement demands.
Description
Technical Field
The invention relates to a brightness test system and method based on a space light field, and belongs to the field of display device measurement.
Background
With the rapid development of technologies such as display and lighting, the composition of the light environment is more and more diversified, and the accurate measurement and evaluation of the light environment are more and more important. The evaluation of the luminous environment relates to various indexes, such as brightness, illumination, spectrum, stroboscopic and the like, wherein the brightness is an important index of the evaluation of the luminous environment, and has been widely concerned for a long time, and how to conveniently and accurately measure the brightness is a very critical problem.
There have been many efforts to measure brightness for a long time, and various brightness meters are available on the market. The common brightness meter comprises a shading tube brightness meter, an aiming point brightness meter, a CCD imaging brightness meter and the like, wherein the shading tube brightness meter has the characteristics of simple manufacture and convenient use, has the defects of low measurement accuracy and small receiving surface of a detector, and can ensure certain accuracy only when the radius of a small hole of a cylinder is less than one tenth of the length of the cylinder; the aiming point type luminance meter is provided with an ocular aiming system, a view field solid angle is changeable and can be focused, the measurement accuracy is higher, but the measurement range is very small, only the luminance at the aiming point can be measured, and the operation is more complicated; the CCD imaging brightness meter allows brightness measurement of multiple points related to the space at the same time, adopts a three-color filter matched with CIE to measure brightness and chromaticity, can display CIE color coordinates and color temperature of each pixel in an image, and takes millions of brightness data information within a few seconds. Currently, there is no corresponding solution for measuring the full spatial luminance distribution data, and the research is very little and lacks systematicness.
Disclosure of Invention
The purpose of the invention is as follows: the invention provides a brightness test system and method based on a space light field, which are used for measuring full-space brightness distribution data.
The technical scheme is as follows: the technical scheme adopted by the invention is that the brightness test system based on the space light field comprises an imaging module and a host, wherein the imaging module comprises a main lens and a micro lens array, optical axes of the main lens and the micro lens array are parallel, a photoelectric coupler is arranged on the other side of the micro lens array, and the host calculates the brightness of the space light field according to signal data obtained by the photoelectric coupler.
The micro lens array is located at the focal plane of the main lens, and the photoelectric coupler is located at the focal plane of the micro lens array.
A space light field brightness test method based on a time domain transformation method comprises a main lens and a micro lens array with optical axes parallel, wherein a CCD is arranged on the other side of the micro lens array, and the method comprises the following steps:
1) calibrating the gray value and the brightness value of the image of the CCD by using a lighting meter;
2) determining the distance relationship between a refocusing plane and the micro-lens array, and parameterizing a light field coordinate biplane;
3) establishing a two-dimensional geometrical relationship among a main lens plane, a CCD plane and a refocusing plane;
4) expanding the two-dimensional geometrical relationship to a four-dimensional light field;
5) integrating the four-dimensional light field on the main lens plane to obtain an image of a refocusing focal plane;
6) and reprocessing the obtained refocused image according to the preset calibrated corresponding relation between the image gray scale and the brightness, and converting the refocused image into a brightness distribution map on the required focal plane.
In the step 2), the main lens plane is regarded as a u-v plane, the CCD plane is regarded as an x-y plane, the distance F between the two planes is the focal length of the main lens, L represents the intensity of incident light, and the incident light is marked as L (u, v, x, y).
In the step 3), the light ray passes through the main lens plane position (u, v), then reaches the CCD plane position (x, y), and finally reaches the refocus plane, and under the two-dimensional condition, the geometrical relationship is as follows:
in the above formula LF(x, u) denotes a plenoptic function, which refers specifically to a certain ray. L isαFRepresenting the intersection point of the same ray on the refocusing plane,f' is the distance from the main lens to the refocusing plane.
In the step 4), the conversion relationship under the two-dimensional condition is expanded to a four-dimensional light field:
where F' is the distance from the main lens plane to the refocusing plane.
Integrating the four-dimensional light field pair (u, v) in the step 5) to obtain an image E of a refocusing planeαF(x,y):
A space light field brightness test method based on a Fourier slice algorithm comprises a main lens and a micro lens array with optical axes parallel, wherein a CCD is arranged on the other side of the micro lens array, and the method comprises the following steps:
1) calibrating the gray value and the brightness value of the image of the CCD by using a lighting meter;
2) parameterizing a light field coordinate biplane;
3) extracting a proper two-dimensional slice in a frequency domain;
4) performing two-dimensional Fourier inverse transformation to obtain an image on a refocusing plane;
5) and finally, after a refocusing image is obtained, reprocessing the obtained refocusing image according to the preset calibrated corresponding relation between the image gray scale and the brightness, and converting the image into a brightness distribution map on a corresponding focal plane.
And in the step 2), the main lens plane is regarded as a u-v plane, the refocusing focal plane is regarded as an x-y plane, the distance F between the main lens plane and the CCD plane is the focal length of the main lens, and the incident light ray is recorded as L (u, v, x, y).
The distance between the refocusing plane and the main lens plane in the steps 3) and 4) is F', namely α F, and the intersection point of the light ray and the refocusing plane is (x, y) and is marked as LαFThe coordinates of the intersection point of the light ray and the CCD plane are (u + (x-u)/α, v + (y-v)/α);
definition PαFor a conversion factor of the light field from CCD depth F to α F, then Pα[LF]Represents PαActing on the light field LFProjected from space to a two-dimensional plane:
according to the fourier slice theorem, the above equation can be defined as:
wherein,integrating the last two dimensions of the four-dimensional function as an integration factor, BαIs a four-dimensional base transformation:
defining slicing factorsAnd FnFor N-dimensional Fourier transform, F-nFor N-dimensional inverse Fourier transform, the method comprisesIs replaced byThe following can be obtained:
order toThe following can be obtained:
β thereinαThe calculation method comprises the following steps:
from EF=Pα[LF]A refocused image is obtained.
Has the advantages that: the invention combines the light field measurement principle and the measurement principle of the traditional luminance meter, obtains the spatial light field distribution information in real time through the imaging module, and the acquired data is more complete. The CCD is calibrated in advance by utilizing a calibration method of a traditional luminance meter, the calculation relation is taken as the corresponding relation between the image gray scale and the brightness, an image on a required focal plane is obtained through an optical field refocusing algorithm and then is converted into the brightness distribution on the corresponding plane, the images of different focal planes and the brightness distribution thereof can be obtained by adjusting relevant parameters of refocusing, focusing is not needed when the brightness is measured, the operation is very simple and convenient, and the space brightness information can be captured quickly and in real time to match different measurement requirements.
Drawings
FIG. 1 is a schematic diagram of a test system according to the present invention;
FIG. 2 is a schematic structural view of an imaging module;
FIG. 3 is a schematic diagram of a light field coordinate biplane parameterization;
FIG. 4 is a diagram showing the relationship between the refocusing plane and the microlens array.
Detailed Description
The present invention is further illustrated by the following figures and specific examples, which are to be understood as illustrative only and not as limiting the scope of the invention, which is to be given the full breadth of the appended claims and any and all equivalent modifications thereof which may occur to those skilled in the art upon reading the present specification.
Example 1
The light field is a concept used to describe the radiation transmission characteristics of light in three-dimensional space, and generally, a sampling point of the light field, i.e. a ray, is represented by the coordinates of the intersection point of the ray and two planes and the intensity of the ray.
As shown in fig. 1, the spatial light field-based luminance testing system of the present embodiment includes a host 2 and an imaging module 1. The imaging module 1 further includes a main lens 3 and a micro lens array 4 with optical axes coincident with each other, and a photocoupler 5, i.e., a CCD, perpendicular to the optical axes is further provided on the other side of the micro lens array 4, as shown in fig. 2. The resolution of the microlens array 4 is 434 × 625, the pitch of the adjacent microlenses is 14um, and the resolution of the photocoupler 5 is 7000 × 5000 or more. The microlens array 4 is located on the focal plane of the main lens 3, and the photocoupler 5 is located on the focal plane of the microlens array 4.
Before use, the photoelectric coupler 5 calibrates the gray value and the brightness value of the image by using a lighting luminance meter in advance, wherein the gray value range is 0-255, and the brightness value range is 0-1000 cd/m2。
Imaging module 1 shoots the scene that awaits measuring, and inside the light of equidirectional not got into the camera through main lens 3, assembled on the different microlens of microlens array 4, diverged into a plurality of light respectively and reachd optoelectronic coupler 5 again behind the microlens, received by optoelectronic coupler 5 and convert the signal of telecommunication into, and this signal of telecommunication sends to host computer 2 and handles.
The host machine 2 processes the received signals according to the light field refocusing principle, if the requirement on precision is high and the requirement on running time is relatively low, the host machine 2 refocuses the original light field by adopting a time domain transformation method, performs coordinate transformation by utilizing a light ray tracing principle, and performs integration on a new image surface to obtain an image on a corresponding focal plane. The distance relationship of the refocusing plane to the microlens array 4 is first determined.
As shown in fig. 3, the light field coordinates are then parameterized biplanar, the main lens plane is regarded as u-v plane, the CCD plane is regarded as x-y plane, the distance F between the two planes is the focal length of the main lens, the incident light ray passes through the biplane and intersects at the point (u, v, x, y), L represents the intensity of the light ray, and then the light ray is denoted as L (u, v, x, y), where (x, y) represents the coordinates of the intersection of the light ray and the CCD plane and the position of each microlens (because the focal length of the microlens is small, the microlens array 4 is close to the photocoupler 6 to a negligible distance); (u, v) are coordinates of the intersection of the ray with the principal lens plane.
Further, according to the geometrical relationship of the main lens plane, the CCD plane and the refocusing plane, the light passes through the main lens plane position (u, v), then reaches the CCD plane position (x, y), and finally reaches the refocusing plane, in the two-dimensional case, the geometrical relationship is:
in the above formula LF(x, u) denotes a plenoptic function, which refers specifically to a certain ray. L isαFRepresenting the intersection of the same ray in the refocus plane.
Further, the conversion relationship in the two-dimensional case is expanded to a four-dimensional light field:
whereinF' is the distance from the main lens plane to the refocusing plane.
And finally, integrating the four-dimensional light field pair (u, v) to obtain an image E of a refocusing planeαF(x,y):
Obtaining a refocused image EαFAfter (x, y), the host 2 reprocesses the obtained refocusing image according to the pre-calibrated corresponding relationship between the image gray scale and the brightness, converts the image into a brightness distribution diagram on the required focal plane, and records the brightness distribution diagramAnd recording related brightness data, and exporting the data according to the requirements of users.
Example 2
If the operation speed is required to be fast and the requirement on the precision is relatively low, the host 2 performs refocusing on the original light field by adopting a frequency domain Fourier slice algorithm.
As shown in fig. 4, in this embodiment, the main lens plane is regarded as a u-v plane, the refocusing plane is regarded as an x-y plane, the distance F between the main lens plane and the CCD plane is the focal length of the main lens, and the light ray passing through the main lens plane and the refocusing plane intersects with the four-dimensional space at the point (u, v, x, y), and is denoted as L (u, v, x, y).
Let the refocusing plane be at a distance F' from the main lens plane, α F, and the intersection of the ray with the refocusing plane be (x, y), denoted LαFAccording to the triangle similarity theorem, the coordinates of the intersection point of the ray and the CCD plane are (u + (x-u)/α, v + (y-v)/α).
Further, define PαFor a conversion factor of the light field from CCD depth F to α F, then Pα[LF]Represents PαActing on the light field LFThe aim is to compute the picture of the light field camera focused at the corresponding depth, i.e. projected from space to a two-dimensional plane:
according to the fourier slice theorem, the above equation can be defined as:
wherein,integrating the last two dimensions of the four-dimensional function as an integration factor, BαIs a four-dimensional base transformation:
further defining slicing factorsAnd FnFor N-dimensional Fourier transform, F-nFor N-dimensional inverse Fourier transform, the method comprisesIs replaced byThe following can be obtained:
order toThe following can be obtained:
β thereinαThe calculation method comprises the following steps:
from EF=Pα[LF]A refocused image is obtained.
And finally, after a refocusing image is obtained, the host 2 reprocesses the obtained refocusing image according to the corresponding relation between the image gray scale and the brightness calibrated in advance, converts the refocusing image into a brightness distribution map on a corresponding focal plane, records related brightness data, and conducts data export according to the requirements of users.
Claims (10)
1. The brightness test system based on the space light field is characterized by comprising an imaging module (1) and a host (2), wherein the imaging module (1) comprises a main lens (3) and a micro lens array (4) with parallel optical axes, a photoelectric coupler (5) is arranged on the other side of the micro lens array (4), and the brightness of the space light field is calculated by the host (2) according to signal data obtained by the photoelectric coupler (5).
2. The system for testing the brightness based on the spatial light field according to claim 1, wherein the micro lens array (4) is located at the focal plane of the main lens (3), and the photo coupler (5) is located at the focal plane of the micro lens array (4).
3. A space light field brightness test method based on a time domain transformation method comprises a main lens and a micro lens array with optical axes parallel, and a CCD is arranged on the other side of the micro lens array, and is characterized by comprising the following steps:
1) calibrating the gray value and the brightness value of the image of the CCD by using a lighting meter;
2) determining the distance relationship between a refocusing plane and the micro-lens array, and parameterizing a light field coordinate biplane;
3) establishing a two-dimensional geometrical relationship among a main lens plane, a CCD plane and a refocusing plane;
4) expanding the two-dimensional geometrical relationship to a four-dimensional light field;
5) integrating the four-dimensional light field on the main lens plane to obtain an image of a refocusing focal plane;
6) and reprocessing the obtained refocused image according to the preset calibrated corresponding relation between the image gray scale and the brightness, and converting the refocused image into a brightness distribution map on the required focal plane.
4. The spatial light field brightness test method based on the time domain transformation method as claimed in claim 3, wherein in step 2), the main lens plane is regarded as a u-v plane, the CCD plane is regarded as an x-y plane, the distance F between the two planes is the focal length of the main lens, L represents the intensity of the incident light, and the incident light is denoted as L (u, v, x, y).
5. The spatial light field brightness test method based on the time domain transformation method according to claim 4, wherein in the step 3), the light passes through the main lens plane position (u, v), then reaches the CCD plane position (x, y), and finally reaches the refocusing focal plane, and in the two-dimensional case, the geometrical relationship is as follows:
in the above formula LF(x, u) denotes a plenoptic function, which refers specifically to a certain ray. L isαFRepresenting the intersection point of the same ray on the refocusing plane,f' is the distance from the main lens to the refocusing plane.
6. The spatial light field luminance testing method based on the time domain transformation method as claimed in claim 5, wherein the transformation relationship in the two-dimensional case is expanded to a four-dimensional light field in the step 4):
where F' is the distance from the main lens plane to the refocusing plane.
7. The spatial light field brightness test method based on time domain transformation method as claimed in claim 6, wherein in the step 5), the four-dimensional light field pair (u, v) is integrated to obtain the image E of the refocusing planeαF(x,y):
8. A space light field brightness test method based on a Fourier slice algorithm comprises a main lens and a micro lens array with optical axes parallel, wherein a CCD is arranged on the other side of the micro lens array, and the method is characterized by comprising the following steps:
1) calibrating the gray value and the brightness value of the image of the CCD by using a lighting meter;
2) parameterizing a light field coordinate biplane;
3) extracting a proper two-dimensional slice in a frequency domain;
4) performing two-dimensional Fourier inverse transformation to obtain an image on a refocusing plane;
5) and finally, after a refocusing image is obtained, reprocessing the obtained refocusing image according to the preset calibrated corresponding relation between the image gray scale and the brightness, and converting the image into a brightness distribution map on a corresponding focal plane.
9. The fourier-slicing-algorithm-based spatial light field brightness test method according to claim 8, wherein in step 2), the main lens plane is regarded as a u-v plane, the refocusing focal plane is regarded as an x-y plane, a distance F between the main lens plane and the CCD plane is a focal length of the main lens, and incident light rays are denoted as L (u, v, x, y).
10. The fourier-slicing-algorithm-based spatial light-field luminance testing method as claimed in claim 9, wherein the distance from the refocusing plane to the main lens plane in steps 3) and 4) is F', that is, α F, and the intersection point of the light ray and the refocusing plane is (x, y), which is denoted as LαFThe coordinates of the intersection point of the light ray and the CCD plane are (u + (x-u)/α, v + (y-v)/α);
definition PαFor a conversion factor of the light field from CCD depth F to α F, then Pα[LF]Represents PαActing on the light field LFProjected from space to a two-dimensional plane:
according to the fourier slice theorem, the above equation can be defined as:
wherein,integrating the last two dimensions of the four-dimensional function as an integration factor, BαIs a four-dimensional base transformation:
defining slicing factorsAnd FnFor N-dimensional Fourier transform, F-nFor N-dimensional inverse Fourier transform, the method comprisesIs replaced byThe following can be obtained:
order toThe following can be obtained:
β thereinαThe calculation method comprises the following steps:
from EF=Pα[LF]A refocused image is obtained.
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Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111486950A (en) * | 2020-04-20 | 2020-08-04 | Oppo广东移动通信有限公司 | Ambient light detection method, ambient light detection device, electronic apparatus, and storage medium |
CN111638042A (en) * | 2020-05-29 | 2020-09-08 | 深圳飞嵌科技有限公司 | DLP optical characteristic test analysis method |
CN111664938A (en) * | 2020-06-11 | 2020-09-15 | 江南大学 | Method and device for measuring high-intensity monochromatic light irradiation |
CN113724179A (en) * | 2020-05-15 | 2021-11-30 | 天津大学 | Method and device for calculating space brightness evaluation index |
CN113870773A (en) * | 2021-10-29 | 2021-12-31 | 卡莱特云科技股份有限公司 | Brightness compensation method, brightness compensation device and brightness compensation system of LED display screen |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104463949A (en) * | 2014-10-24 | 2015-03-25 | 郑州大学 | Rapid three-dimensional reconstruction method and system based on light field digit refocusing |
CN105807550A (en) * | 2016-03-02 | 2016-07-27 | 深圳大学 | Inversion type super-speed image forming method |
-
2018
- 2018-12-29 CN CN201811632061.4A patent/CN109632092A/en active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104463949A (en) * | 2014-10-24 | 2015-03-25 | 郑州大学 | Rapid three-dimensional reconstruction method and system based on light field digit refocusing |
CN105807550A (en) * | 2016-03-02 | 2016-07-27 | 深圳大学 | Inversion type super-speed image forming method |
Non-Patent Citations (1)
Title |
---|
张文豪: "基于频率域的光场重对焦算法研究", 《中国优秀硕士学位论文数据库》 * |
Cited By (9)
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CN111486950A (en) * | 2020-04-20 | 2020-08-04 | Oppo广东移动通信有限公司 | Ambient light detection method, ambient light detection device, electronic apparatus, and storage medium |
CN111486950B (en) * | 2020-04-20 | 2022-04-19 | Oppo广东移动通信有限公司 | Ambient light detection method, ambient light detection device, electronic apparatus, and storage medium |
CN113724179A (en) * | 2020-05-15 | 2021-11-30 | 天津大学 | Method and device for calculating space brightness evaluation index |
CN113724179B (en) * | 2020-05-15 | 2023-09-15 | 天津大学 | Calculation method and device for space brightness evaluation index |
CN111638042A (en) * | 2020-05-29 | 2020-09-08 | 深圳飞嵌科技有限公司 | DLP optical characteristic test analysis method |
CN111638042B (en) * | 2020-05-29 | 2022-04-01 | 深圳飞嵌科技有限公司 | DLP optical characteristic test analysis method |
CN111664938A (en) * | 2020-06-11 | 2020-09-15 | 江南大学 | Method and device for measuring high-intensity monochromatic light irradiation |
CN113870773A (en) * | 2021-10-29 | 2021-12-31 | 卡莱特云科技股份有限公司 | Brightness compensation method, brightness compensation device and brightness compensation system of LED display screen |
CN113870773B (en) * | 2021-10-29 | 2022-11-25 | 卡莱特云科技股份有限公司 | Brightness compensation method, brightness compensation device and brightness compensation system of LED display screen |
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