CN109596866A - Feed circuit structure and test fixture - Google Patents
Feed circuit structure and test fixture Download PDFInfo
- Publication number
- CN109596866A CN109596866A CN201811598410.5A CN201811598410A CN109596866A CN 109596866 A CN109596866 A CN 109596866A CN 201811598410 A CN201811598410 A CN 201811598410A CN 109596866 A CN109596866 A CN 109596866A
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- CN
- China
- Prior art keywords
- fixture
- feed
- transmission line
- microwave
- circuit structure
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 55
- 229910052751 metal Inorganic materials 0.000 claims abstract description 64
- 239000002184 metal Substances 0.000 claims abstract description 64
- 230000005540 biological transmission Effects 0.000 claims abstract description 60
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical group [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 21
- 238000002955 isolation Methods 0.000 claims description 9
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 claims description 5
- 230000005611 electricity Effects 0.000 claims description 4
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 3
- 239000010931 gold Substances 0.000 claims description 3
- 229910052737 gold Inorganic materials 0.000 claims description 3
- 238000003466 welding Methods 0.000 claims 1
- 238000004519 manufacturing process Methods 0.000 abstract description 9
- 238000011161 development Methods 0.000 abstract description 4
- 238000012356 Product development Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000005538 encapsulation Methods 0.000 description 3
- 239000002699 waste material Substances 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 229910000831 Steel Inorganic materials 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 239000004744 fabric Substances 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
- 238000005493 welding type Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0425—Test clips, e.g. for IC's
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The present invention is suitable for microwave power device testing field, provides a kind of feed circuit structure and test fixture.The circuit structure includes: feed end, microwave end and metal transmission line；Feed end is connect with external dc feed circuit, and microwave end is connect with external testing fixture；The both ends of the metal transmission line are arranged in the feed end and the microwave end, and the metal transmission line is arc-shaped；Wherein, it is half of perimeter of the circle of diameter that the length of the metal transmission line, which is with the distance between the feed end and the microwave end,.Feed circuit structure of the invention and test fixture production are simple, and with wide, versatile, test frequency range is big, saves cost of manufacture and development cycle.
Description
Technical field
The invention belongs to microwave power device testing field more particularly to a kind of feed circuit structure and test fixtures.
Background technique
Test fixture is indispensable critical component in Microwave Power Tubes device test system, generally to realize fixed quilt
Micrometer wave device, pre-matching, feed and signal coaxial transmission turn functions, the performance quality such as micro-strip transmission and directly influence survey
The accuracy of test result.In the actual production process of encapsulation microwave power device, often there are many type for the product of test, encapsulation
Housing form, test condition are had nothing in common with each other, and this requires fixtures and power supply circuit certain versatility, otherwise for different
Product needs to develop different fixture and power supply circuit, influences product development cycle, causes the serious waste of resource.Wherein, it presents
The design of electric circuit structure is to influence general one of the principal element of test fixture frequency.
Traditional feed circuit fabric bandwidths are relatively narrow, when the encapsulation microwave power device of test different frequency range, need basis
The test frequency range of tested microwave device redesigns feed circuit structure, and then needs to redesign new test fixture and power supply
Circuit influences product development cycle, causes the serious waste of resource.
Summary of the invention
In view of this, the embodiment of the invention provides a kind of feed circuit structure and test fixtures, to solve the prior art
The problem of versatility of middle feed circuit structure is low, influences product development cycle, and causes the serious waste of resource.
The first aspect of the embodiment of the present invention provides a kind of feed circuit structure, comprising: feed end, microwave end and metal
Transmission line；
The feed end is connect with external dc feed circuit, and the microwave end is connect with external testing fixture；
The both ends of the metal transmission line are arranged in the feed end and the microwave end, and the metal transmission line is in circular arc
Shape；
Wherein, the length of the metal transmission line is with the distance between the feed end and the microwave end for diameter
Half round of perimeter.
Optionally, the cross-sectional area of the metal transmission line passes through
It obtains；Wherein, M is the cross-sectional area of the metal transmission line, and N is the maximum current of tested microwave device, and Q is institute
The unit area maximum for stating metal transmission line can bear electric current.
Optionally, the metal transmission line is copper wire.
Optionally, the feed end and the external dc feed circuit weld.
Optionally, the micro-strip wire bonding at the microwave end and the external testing fixture.
Optionally, the first end of the metal transmission line is the feed end, and the second end of the metal transmission line is institute
State microwave end.
The second aspect of the embodiment of the present invention provides a kind of test fixture, including input terminal fixture and output end fixture,
Further include two connect respectively with the input terminal fixture and the output end fixture as the first aspect of above-described embodiment mentions
The feed circuit structure supplied；
The microwave end of one of them feed circuit structure is connect with the microstrip line of the output end fixture；
The microwave end of another feed circuit structure is connect with the microstrip line of the input terminal fixture.
Optionally, the test fixture further include: at least one is supplied for the output end fixture and the input terminal fixture
The direct current tie line of electricity；
The direct current tie line is connect with the feed end of the feed circuit structure.
Optionally, the test fixture further include: two are separately positioned on the input terminal fixture and output end folder
Has the isolation capacitance of side；
The two sides of each isolation capacitance are respectively provided with metal lead wire；The isolation capacitance passes through the metal lead wire and institute
State input terminal fixture or output end fixture connection.
Existing beneficial effect is the embodiment of the present invention compared with prior art: the present invention include feed end, microwave end and
Metal transmission line, feed end are connect with external dc feed circuit, and microwave end is connect with external testing fixture, feed end and microwave
The both ends of metal transmission line are arranged in end, and metal transmission line is arc-shaped, and structure is simple, save cost of manufacture and exploitation week
Phase；Wherein, it is half of perimeter of the circle of diameter that the length of metal transmission line, which is with the distance between feed end and microwave end, so that
Test fixture band is wide, versatile, and test frequency range is big.
Detailed description of the invention
It to describe the technical solutions in the embodiments of the present invention more clearly, below will be to embodiment or description of the prior art
Needed in attached drawing be briefly described, it should be apparent that, the accompanying drawings in the following description is only of the invention some
Embodiment for those of ordinary skill in the art without any creative labor, can also be according to these
Attached drawing obtains other attached drawings.
Fig. 1 is the structural schematic diagram for the feed circuit structure that the embodiment of the present invention one provides；
Fig. 2 is the structural schematic diagram for the metal transmission line that the embodiment of the present invention one provides；
Fig. 3 is the structural schematic diagram of test fixture provided by Embodiment 2 of the present invention.
Specific embodiment
In being described below, for illustration and not for limitation, the tool of such as particular system structure, technology etc is proposed
Body details, to understand thoroughly the embodiment of the present invention.However, it will be clear to one skilled in the art that there is no these specific
The present invention also may be implemented in the other embodiments of details.In other situations, it omits to well-known system, device, electricity
The detailed description of road and method, in case unnecessary details interferes description of the invention.
In order to illustrate technical solutions according to the invention, the following is a description of specific embodiments.
Embodiment one
Fig. 1 and Fig. 2 are please referred to, a kind of feed circuit structure 100 is present embodiments provided, comprising: feed end 10, microwave end
20 and metal transmission line 30.
Feed end 10 is connect with external dc feed circuit, and microwave end 20 is connect with external testing fixture CLM；Feed end 10
The both ends of metal transmission line 30 are set with microwave end 20, and metal transmission line 30 is arc-shaped.
Wherein, the length of metal transmission line 30 be with the distance between feed end 10 and microwave end 20 for diameter circle partly
A perimeter.It is the distance between feed end 10 and microwave end 20, as diameter of a circle, metal transmission line 30 referring specifically to Fig. 2, L
Length D can pass through
D=(L* π)/2
It obtains, is as half of perimeter of the circle of diameter with the distance between feed end 10 and microwave end 20.
Metal transmission line 30 is arc-shaped, and it is the circle of diameter that length, which is with the distance between feed end 10 and microwave end 20,
Half of perimeter, i.e. metal transmission line 30 is equivalent to an inductance, can prevent the microwave signal of tested microwave device from passing through gold
Belong to transmission line 30 and enter direct current tie line, while guaranteeing that tested microwave device provides dc point to tested microwave device,
Compared with traditional feed structure, production is simple, versatile, and with wide, test frequency range can achieve 0.8G-12G, phase
170% can achieve to bandwidth.
Above-mentioned feed circuit structure, includes feed end 10, microwave end 20 and metal transmission line 30, feed end 10 and external
Direct current tie line connection, microwave end 20 are connect with external testing fixture CLM, and feed end 10 and the setting of microwave end 20 are passed in metal
Defeated 30 both ends of line, and metal transmission line 30 is arc-shaped, structure is simple, saves cost of manufacture and development cycle；Wherein, metal passes
It is half of perimeter of the circle of diameter that the length of defeated line 30, which is with the distance between feed end 10 and microwave end 20, so that test fixture
With wide, versatile, test frequency range is big.
In one embodiment, the cross-sectional area of metal transmission line 30 can pass through
It obtains；Wherein, M is the cross-sectional area of metal transmission line 30, and N is the maximum current of tested microwave device, and Q is metal
The unit area maximum of transmission line 30 can bear electric current.Illustratively, the unit area maximum of metal transmission line 30 can bear electricity
Stream is 6A/mm2, the maximum current for being tested microwave device is 30A, and the cross-sectional area that can obtain metal transmission line 30 is 5mm2。
Optionally, metal transmission line 30 is copper wire, and at low cost, electric conductivity and thermal conductivity are good, saves feed circuit structure
Cost etc..Illustratively, the first end of copper wire is connect with feed end 10, and the second end of copper wire is connect with microwave end 20, and copper wire is in
It is arc-shaped, the length of copper wire be take the distance between feed end 10 and microwave end 20 as half of perimeter of the circle of diameter, and copper wire
Cross-sectional area by
It obtains；Wherein, M is the cross-sectional area of copper wire, and N is the maximum current of tested microwave device, and Q is the unit plane of copper wire
Product maximum can bear electric current.The present embodiment is not specifically limited the type of copper wire.
It should be understood that the present embodiment to metal transmission line 30 without specifically limiting, metal transmission line 30 can also be it
His metal class conducting wire, such as aluminum steel.
Optionally, feed end 10 and external dc feed circuit weld, the micro-strip at microwave end 20 and external testing fixture CLM
Wire bonding.It is stronger that the connection type of welding connect feed circuit structure with direct current tie line and test fixture, directly
Electric current directly can be transferred to metal transmission line 30 by pad by current feed circuit, be then transmitted further to test fixture, be
Tested microwave device provides DC power supply.
Optionally, the first end of metal transmission line 30 is feed end 10, and the second end of metal transmission line 30 is microwave end 20,
I.e. one end of metal transmission line 30 is directly welded with direct current tie line, micro-strip of the other end directly with external testing fixture CLM
Wire bonding, and metal transmission line 30 is arc-shaped, the length of metal transmission line 30 is with external direct current tie line and external survey
The distance between fixture CLM is tried as half of perimeter of the circle of diameter, more simplifies the structure of feed circuit structure in this way, further
Cost of manufacture and development cycle are saved, test frequency range is increased.
Illustratively, metal transmission line 30 uses one section of copper wire, and the cross-sectional area of copper wire can according to the maximum of unit area
Bear electric current (A/mm2) and the maximum current of tested microwave device selected, the length of copper wire is (L* π)/2, and by copper
Line is that L/2 is fabricated to semicircle according to radius, and L is the distance of two solder joints, i.e. external dc feed circuit and external testing presss from both sides
Has the distance between CLM.
Then on the microstrip line for the input terminal for first semicircular copper wire one end being welded on external testing fixture CLM,
First semicircular copper wire other end is welded on input terminal direct current tie line；Again by second semicircular copper wire one end
It is welded on the microstrip line of the output end of external testing fixture CLM, second semicircular copper wire other end is welded on output end
On direct current tie line.The copper wire is equivalent to an inductance, can prevent microwave signal from entering direct current tie line by copper wire,
Guarantee that direct current tie line provides dc point to tested microwave device simultaneously, with traditional microstrip line direct feed structure phase
Than production is simple, and bandwidth is especially wide, versatile.
Above-described embodiment mainly includes feed end 10, microwave end 20 and metal transmission line 30, feed end 10 and external dc
Feed circuit connection, microwave end 20 are connect with external testing fixture CLM, and feed end 10 and microwave end 20 are arranged in metal transmission line
30 both ends, and metal transmission line 30 is arc-shaped, structure is simple, saves cost of manufacture and development cycle；Wherein, metal transmission line
It is half of perimeter of the circle of diameter that 30 length, which is with the distance between feed end 10 and microwave end 20, so that test fixture bandwidth
Width, versatile, test frequency range is big.
Embodiment two
Referring to Fig. 3, a kind of test fixture is present embodiments provided, comprising: including input terminal fixture 110 and output end fixture
120, it further include two timess provided such as above-described embodiment one being connect respectively with input terminal fixture 110 and output end fixture 120
A kind of feed circuit structure 200, it may have beneficial effect possessed by feed circuit structure 200 in above-described embodiment one.
The microwave end of one of feed circuit structure 210 is connect with the microstrip line of output end fixture 110, another feed
The microwave end of circuit structure 220 is connect with the microstrip line of input terminal fixture 120.
Optionally, the test fixture further include: at least one powers for output end fixture 120 and input terminal fixture 110
Direct current tie line 300；Direct current tie line 300 is connect with the feed end of feed circuit structure 200.Illustratively, it tests
Fixture may include 2 direct current tie lines 300, and the first direct current tie line 310 passes through feed circuit structure 210 and input terminal
Fixture 110 connects, and the second direct current tie line 320 is connect by feed circuit structure 220 with output end fixture 120.This implementation
Example can be DC circuit or DC power supply without limitation to the specific structure of direct current tie line 300, can also be with other direct currents
Power supply unit.
Optionally, such as Fig. 3, the test fixture further include: two are separately positioned on input terminal fixture 110 and output end folder
Has the isolation capacitance Cr of 120 sides；The two sides of each isolation capacitance Cr are respectively provided with metal lead wire 400；Isolation capacitance Cr passes through gold
Belong to lead 400 to connect with input terminal fixture 110 or output end fixture 120.
Embodiment described above is merely illustrative of the technical solution of the present invention, rather than its limitations；Although referring to aforementioned reality
Applying example, invention is explained in detail, those skilled in the art should understand that: it still can be to aforementioned each
Technical solution documented by embodiment is modified or equivalent replacement of some of the technical features；And these are modified
Or replacement, the spirit and scope for technical solution of various embodiments of the present invention that it does not separate the essence of the corresponding technical solution should all
It is included within protection scope of the present invention.
Claims (9)
1. a kind of feed circuit structure characterized by comprising feed end, microwave end and metal transmission line；
The feed end is connect with external dc feed circuit, and the microwave end is connect with external testing fixture；
The both ends of the metal transmission line are arranged in the feed end and the microwave end, and the metal transmission line is arc-shaped；
Wherein, the length of the metal transmission line is the circle with the distance between the feed end and the microwave end for diameter
Half of perimeter.
2. feed circuit structure as described in claim 1, which is characterized in that the cross-sectional area of the metal transmission line passes through
It obtains；Wherein, M is the cross-sectional area of the metal transmission line, and N is the maximum current of tested microwave device, and Q is the gold
The unit area maximum for belonging to transmission line can bear electric current.
3. feed circuit structure as described in claim 1, which is characterized in that the metal transmission line is copper wire.
4. feed circuit structure as described in claim 1, which is characterized in that the feed end and external dc feed electricity
Road welding.
5. feed circuit structure as described in claim 1, which is characterized in that the microwave end and the external testing fixture
Micro-strip wire bonding.
6. feed circuit structure as claimed in claim 1 to 5, which is characterized in that the first end of the metal transmission line
For the feed end, the second end of the metal transmission line is the microwave end.
7. a kind of test fixture, including input terminal fixture and output end fixture, which is characterized in that further include two respectively with it is described
Input terminal fixture connected with the output end fixture such as feed circuit structure as claimed in any one of claims 1 to 6；
The microwave end of one of them feed circuit structure is connect with the microstrip line of the output end fixture；
The microwave end of another feed circuit structure is connect with the microstrip line of the input terminal fixture.
8. test fixture as claimed in claim 7, which is characterized in that the test fixture further include: at least one is described
The direct current tie line of output end fixture and input terminal fixture power supply；
The direct current tie line is connect with the feed end of the feed circuit structure.
9. test fixture as claimed in claim 7 or 8, which is characterized in that the test fixture further include: two are respectively set
In the isolation capacitance of the input terminal fixture and output end fixture side；
The two sides of each isolation capacitance are respectively provided with metal lead wire；The isolation capacitance by the metal lead wire with it is described defeated
Enter to hold fixture or output end fixture connection.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811598410.5A CN109596866A (en) | 2018-12-26 | 2018-12-26 | Feed circuit structure and test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811598410.5A CN109596866A (en) | 2018-12-26 | 2018-12-26 | Feed circuit structure and test fixture |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN109596866A true CN109596866A (en) | 2019-04-09 |
Family
ID=65962801
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201811598410.5A Pending CN109596866A (en) | 2018-12-26 | 2018-12-26 | Feed circuit structure and test fixture |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN109596866A (en) |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102222135A (en) * | 2011-05-23 | 2011-10-19 | 清华大学 | Equivalent circuit model for current reflux path in single-ended inductor and modeling method thereof |
| CN102621470A (en) * | 2012-03-31 | 2012-08-01 | 中国电子科技集团公司第十三研究所 | Method for testing performance of semiconductor microwave power chip packaging shell |
| CN103296669A (en) * | 2013-06-28 | 2013-09-11 | 株洲普天中普防雷科技有限公司 | Lightning protection device and circuit arrangement mode of circuit board of quarter wavelength lightning protection device |
| WO2016041486A1 (en) * | 2014-09-16 | 2016-03-24 | 李文洁 | Slot antenna using resonant feed structure |
| CN105510648A (en) * | 2016-01-14 | 2016-04-20 | 中国电子科技集团公司第十三研究所 | High-isolation microwave test fixture for ultrahigh-power GaN microwave devices |
| CN106788274A (en) * | 2017-01-18 | 2017-05-31 | 广东宽普科技股份有限公司 | A kind of road complex RF microwave power amplifier of broadband three |
| CN206961987U (en) * | 2017-06-16 | 2018-02-02 | 南京信息工程大学 | A kind of new micro-strip restructural multi-mode filter |
| CN209803186U (en) * | 2018-12-26 | 2019-12-17 | 中国电子科技集团公司第十三研究所 | feed circuit structure and test fixture |
-
2018
- 2018-12-26 CN CN201811598410.5A patent/CN109596866A/en active Pending
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102222135A (en) * | 2011-05-23 | 2011-10-19 | 清华大学 | Equivalent circuit model for current reflux path in single-ended inductor and modeling method thereof |
| CN102621470A (en) * | 2012-03-31 | 2012-08-01 | 中国电子科技集团公司第十三研究所 | Method for testing performance of semiconductor microwave power chip packaging shell |
| CN103296669A (en) * | 2013-06-28 | 2013-09-11 | 株洲普天中普防雷科技有限公司 | Lightning protection device and circuit arrangement mode of circuit board of quarter wavelength lightning protection device |
| WO2016041486A1 (en) * | 2014-09-16 | 2016-03-24 | 李文洁 | Slot antenna using resonant feed structure |
| CN105510648A (en) * | 2016-01-14 | 2016-04-20 | 中国电子科技集团公司第十三研究所 | High-isolation microwave test fixture for ultrahigh-power GaN microwave devices |
| CN106788274A (en) * | 2017-01-18 | 2017-05-31 | 广东宽普科技股份有限公司 | A kind of road complex RF microwave power amplifier of broadband three |
| CN206961987U (en) * | 2017-06-16 | 2018-02-02 | 南京信息工程大学 | A kind of new micro-strip restructural multi-mode filter |
| CN209803186U (en) * | 2018-12-26 | 2019-12-17 | 中国电子科技集团公司第十三研究所 | feed circuit structure and test fixture |
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