CN209803186U - feed circuit structure and test fixture - Google Patents
feed circuit structure and test fixture Download PDFInfo
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- CN209803186U CN209803186U CN201822196281.9U CN201822196281U CN209803186U CN 209803186 U CN209803186 U CN 209803186U CN 201822196281 U CN201822196281 U CN 201822196281U CN 209803186 U CN209803186 U CN 209803186U
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- transmission line
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Abstract
The utility model is suitable for a microwave power device tests the field, provides a feeder circuit structure and test fixture. The circuit structure includes: a feed end, a microwave end and a metal transmission line; the feeding end is connected with an external direct current feeding circuit, and the microwave end is connected with an external test fixture; the feed end and the microwave end are arranged at two ends of the metal transmission line, and the metal transmission line is arc-shaped; wherein the length of the metal transmission line is half the circumference of a circle with the diameter being the distance between the feeding end and the microwave end. The utility model discloses a feed circuit structure and test fixture simple manufacture, the bandwidth is wide, and the commonality is strong, and test frequency range is big, practices thrift cost of manufacture and development cycle.
Description
Technical Field
The utility model belongs to microwave power device tests the field, especially relates to a feed circuit structure and test fixture.
Background
The test fixture is an indispensable key component in a microwave power tube device test system, generally realizes the functions of fixing a tested microwave device, pre-matching, feeding, converting signal coaxial transmission into microstrip transmission and the like, and the accuracy of a test result is directly influenced by the performance of the test fixture. In the actual production process of packaging microwave power devices, the tested products are often of various types, the packaging shell forms and the testing conditions are different, so that the clamp and the power supply circuit are required to have certain universality, otherwise, different clamps and power supply circuits are required to be developed aiming at different products, the product development cycle is influenced, and the serious waste of resources is caused. The design of the feed circuit structure is one of the main factors affecting the frequency universality of the test fixture.
the traditional feed circuit structure has narrow bandwidth, and when packaged microwave power devices with different frequency bands are tested, the feed circuit structure needs to be redesigned according to the test frequency band of the tested microwave device, and then a new test fixture and a new power supply circuit need to be redesigned, so that the product development cycle is influenced, and the serious waste of resources is caused.
SUMMERY OF THE UTILITY MODEL
In view of this, the embodiment of the utility model provides a feed circuit structure and test fixture to it is low to solve feed circuit structure's commonality among the prior art, influences product development cycle, and causes the problem of the serious waste of resource.
The utility model provides a first aspect of the embodiment provides a feed circuit structure, include: a feed end, a microwave end and a metal transmission line;
The feeding end is connected with an external direct current feeding circuit, and the microwave end is connected with an external test fixture;
The feed end and the microwave end are arranged at two ends of the metal transmission line, and the metal transmission line is arc-shaped;
wherein the length of the metal transmission line is half the circumference of a circle with the diameter being the distance between the feeding end and the microwave end.
optionally, the metal transmission line has a cross-sectional area passing through
Obtaining; wherein M is the cross-sectional area of the metal transmission line, N is the maximum current of the tested microwave device, and Q is the maximum bearable current of the metal transmission line in unit area.
Optionally, the metal transmission line is a copper wire.
Optionally, the feeding end is welded to the external dc feeding circuit.
Optionally, the microwave end is welded to a microstrip line of the external test fixture.
Optionally, the first end of the metal transmission line is the feeding end, and the second end of the metal transmission line is the microwave end.
a second aspect of the embodiments of the present invention provides a test fixture, which includes an input end fixture and an output end fixture, and further includes two feed circuit structures, which are connected to the input end fixture and the output end fixture respectively, as provided in the first aspect of the embodiments;
The microwave end of one of the feed circuit structures is connected with the microstrip line of the output end clamp;
And the microwave end of the other feed circuit structure is connected with the microstrip line of the input end clamp.
optionally, the test fixture further includes: at least one DC feed circuit for supplying power to the output clamp and the input clamp;
The direct current feed circuit is connected with the feed end of the feed circuit structure.
Optionally, the test fixture further includes: the two isolation capacitors are respectively arranged on one side of the input end clamp and one side of the output end clamp;
Metal leads are arranged on two sides of each isolation capacitor; the isolation capacitor is connected with the input end clamp or the output end clamp through the metal lead.
Compared with the prior art, the embodiment of the utility model beneficial effect who exists is: the utility model comprises a feed end, a microwave end and a metal transmission line, wherein the feed end is connected with an external direct current feed circuit, the microwave end is connected with an external test fixture, the feed end and the microwave end are arranged at two ends of the metal transmission line, and the metal transmission line is arc-shaped, has simple structure, saves the manufacturing cost and the development period; the length of the metal transmission line is half of the circumference of a circle with the diameter being the distance between the feed end and the microwave end, so that the test fixture is wide in bandwidth, high in universality and large in test frequency range.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for the embodiments or the prior art descriptions will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings without inventive labor.
Fig. 1 is a schematic structural diagram of a feeding circuit structure according to an embodiment of the present invention;
fig. 2 is a schematic structural diagram of a metal transmission line according to an embodiment of the present invention;
fig. 3 is a schematic structural diagram of a test fixture provided by the second embodiment of the present invention.
Detailed Description
In the following description, for purposes of explanation and not limitation, specific details are set forth, such as particular system structures, techniques, etc. in order to provide a thorough understanding of the embodiments of the invention. It will be apparent, however, to one skilled in the art that the present invention may be practiced in other embodiments that depart from these specific details. In other instances, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present invention with unnecessary detail.
In order to explain the technical solution of the present invention, the following description is made by using specific examples.
Example one
Referring to fig. 1 and fig. 2, the present embodiment provides a feeding circuit structure 100, including: a feed terminal 10, a microwave terminal 20 and a metal transmission line 30.
the feed end 10 is connected with an external direct current feed circuit, and the microwave end 20 is connected with an external test fixture CLM; the feeding terminal 10 and the microwave terminal 20 are disposed at two ends of the metal transmission line 30, and the metal transmission line 30 is in a circular arc shape.
Wherein the length of the metal transmission line 30 is half of the circumference of a circle having a diameter equal to the distance between the feeding terminal 10 and the microwave terminal 20. Referring to fig. 2, L is the distance between the feeding end 10 and the microwave end 20, i.e. the diameter of a circle, through which the length D of the metal transmission line 30 can pass
D＝(L*π)/2
I.e. half the circumference of a circle with the diameter being the distance between the feeding end 10 and the microwave end 20.
the metal transmission line 30 is arc-shaped, the length of the metal transmission line is half of the circumference of a circle with the diameter of the distance between the feeding end 10 and the microwave end 20, namely the metal transmission line 30 is equivalent to an inductor, so that a microwave signal of a measured microwave device can be prevented from entering a direct current feed circuit through the metal transmission line 30, and meanwhile, the measured microwave device is ensured to provide a direct current working point for the measured microwave device.
The feed circuit structure comprises a feed end 10, a microwave end 20 and a metal transmission line 30, wherein the feed end 10 is connected with an external direct-current feed circuit, the microwave end 20 is connected with an external test fixture CLM, the feed end 10 and the microwave end 20 are arranged at two ends of the metal transmission line 30, and the metal transmission line 30 is arc-shaped, so that the structure is simple, and the manufacturing cost and the development period are saved; the length of the metal transmission line 30 is half of the circumference of a circle with the diameter being the distance between the feeding end 10 and the microwave end 20, so that the test fixture has wide bandwidth, strong universality and wide test frequency range.
in one embodiment, the cross-sectional area of the metal transmission line 30 may pass
obtaining; wherein, M is the cross-sectional area of the metal transmission line 30, N is the maximum current of the microwave device to be measured, and Q is the maximum bearable current per unit area of the metal transmission line 30. Illustratively, the maximum bearable current per unit area of the metal transmission line 30 is 6A/mm2The maximum current of the tested microwave device is 30A, and the cross section area of the obtained metal transmission line 30 is 5mm2。
optionally, the metal transmission line 30 is a copper wire, which is low in cost, good in electrical conductivity and thermal conductivity, and saves the cost of the feed circuit structure. Illustratively, a first end of the copper wire is connected to the feeding end 10, a second end of the copper wire is connected to the microwave end 20, the copper wire is in a circular arc shape, a length of the copper wire is a half circumference of a circle with a diameter of a distance between the feeding end 10 and the microwave end 20, and a cross-sectional area of the copper wire is defined by
Obtaining; wherein M is the cross-sectional area of the copper wire, N is the maximum current of the microwave device to be tested, and Q is the maximum bearable current of the copper wire in unit area. In this embodiment, the kind of the copper wire is not particularly limited.
It should be understood that the present embodiment does not specifically limit the metal transmission line 30, and the metal transmission line 30 may also be other metal-based wires, such as an aluminum wire.
Optionally, the feeding terminal 10 is welded to an external dc feeding circuit, and the microwave terminal 20 is welded to a microstrip line of an external test fixture CLM. The welded connection mode enables the feed circuit structure to be more firmly connected with the direct current feed circuit and the test fixture, the direct current feed circuit can directly transmit current to the metal transmission line 30 through the welding point, and then the current is transmitted to the test fixture, and a direct current power supply is provided for the microwave device to be tested.
Optionally, the first end of the metal transmission line 30 is a feeding end 10, the second end of the metal transmission line 30 is a microwave end 20, that is, one end of the metal transmission line 30 is directly welded to the dc feed circuit, and the other end is directly welded to the microstrip line of the external test fixture CLM, and the metal transmission line 30 is in the shape of an arc, and the length of the metal transmission line 30 is half of the circumference of a circle with the diameter equal to the distance between the external dc feed circuit and the external test fixture CLM, so that the structure of the feed circuit structure is simplified, the manufacturing cost and the development period are further saved, and the test frequency range is increased.
Illustratively, the metal transmission line 30 is a length of copper wire having a cross-sectional area based on the maximum sustainable current per unit area (A/mm)2) And selecting the maximum current of the tested microwave device, wherein the length of the copper wire is (L x pi)/2, the copper wire is made into a semicircle according to the radius of L/2, and L is the distance between two welding points, namely the distance between the external direct current feed circuit and the external test fixture CLM.
Then welding one end of a first semicircular copper wire on the micro-strip line at the input end of the external test fixture CLM, and welding the other end of the first semicircular copper wire on the input end direct current feed circuit; and welding one end of a second semicircular copper wire on the micro-strip line at the output end of the external test fixture CLM, and welding the other end of the second semicircular copper wire on the output end direct current feed circuit. This copper line is equivalent to an inductance, can prevent that microwave signal from getting into direct current feed circuit through the copper line, guarantees direct current feed circuit simultaneously and provides direct current operating point for the microwave device under test, compares with traditional microstrip line direct feed structure, simple manufacture, and the bandwidth is very wide, and the commonality is strong.
The embodiment mainly comprises a feed end 10, a microwave end 20 and a metal transmission line 30, wherein the feed end 10 is connected with an external direct-current feed circuit, the microwave end 20 is connected with an external test fixture CLM, the feed end 10 and the microwave end 20 are arranged at two ends of the metal transmission line 30, and the metal transmission line 30 is arc-shaped, so that the structure is simple, and the manufacturing cost and the development period are saved; the length of the metal transmission line 30 is half of the circumference of a circle with the diameter being the distance between the feeding end 10 and the microwave end 20, so that the test fixture has wide bandwidth, strong universality and wide test frequency range.
Example two
Referring to fig. 3, the present embodiment provides a test fixture including: including the input terminal clamp 110 and the output terminal clamp 120, and further including any one of the feeding circuit structures 200 as provided in the first embodiment, which are respectively connected to the input terminal clamp 110 and the output terminal clamp 120, also has the beneficial effects of the feeding circuit structure 200 in the first embodiment.
The microwave end of one of the feeding circuit structures 210 is connected to the microstrip line of the output terminal clamp 110, and the microwave end of the other feeding circuit structure 220 is connected to the microstrip line of the input terminal clamp 120.
Optionally, the test fixture further includes: at least one dc feed circuit 300 for supplying power to the output terminal jig 120 and the input terminal jig 110; the dc feeder circuit 300 is connected to the feeding end of the feeder circuit structure 200. Illustratively, the test fixture may include 2 dc feed circuits 300, a first dc feed circuit 310 connected to the input side fixture 110 through the feed circuit structure 210, and a second dc feed circuit 320 connected to the output side fixture 120 through the feed circuit structure 220. The specific structure of the dc power supply circuit 300 is not limited in this embodiment, and may be a dc circuit or a dc power supply, or other dc power supply devices.
Optionally, as shown in fig. 3, the test fixture further includes: two isolation capacitors Cr respectively disposed at one sides of the input terminal clamp 110 and the output terminal clamp 120; metal leads 400 are arranged on two sides of each isolation capacitor Cr; the isolation capacitor Cr is connected to the input terminal jig 110 or the output terminal jig 120 through a metal lead 400.
The above-mentioned embodiments are only used for illustrating the technical solution of the present invention, and not for limiting the same; although the present invention has been described in detail with reference to the foregoing embodiments, it should be understood by those skilled in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; such modifications and substitutions do not substantially depart from the spirit and scope of the embodiments of the present invention, and are intended to be included within the scope of the present invention.
Claims (9)
1. A feed circuit structure, comprising: a feed end, a microwave end and a metal transmission line;
The feeding end is connected with an external direct current feeding circuit, and the microwave end is connected with an external test fixture;
The feed end and the microwave end are arranged at two ends of the metal transmission line, and the metal transmission line is arc-shaped;
Wherein the length of the metal transmission line is half the circumference of a circle with the diameter being the distance between the feeding end and the microwave end.
2. The feed circuit structure of claim 1, wherein the metal transmission line has a cross-sectional area that passes through
Obtaining; wherein M is the cross-sectional area of the metal transmission line, N is the maximum current of the tested microwave device, and Q is the maximum bearable current of the metal transmission line in unit area.
3. The feed circuit structure of claim 1, wherein the metal transmission line is a copper line.
4. The feed circuit structure of claim 1, wherein said feed terminal is soldered to said external dc feed circuit.
5. The feed circuit structure of claim 1, wherein the microwave end is soldered to a microstrip line of the external test fixture.
6. The feed circuit structure of any of claims 1 to 5, wherein the first end of the metal transmission line is the feed end and the second end of the metal transmission line is the microwave end.
7. A test fixture comprising an input fixture and an output fixture, characterized by two feed circuit structures according to any of claims 1 to 6 connected to the input fixture and the output fixture, respectively;
The microwave end of one of the feed circuit structures is connected with the microstrip line of the output end clamp;
And the microwave end of the other feed circuit structure is connected with the microstrip line of the input end clamp.
8. The test fixture of claim 7, further comprising: at least one DC feed circuit for supplying power to the output clamp and the input clamp;
The direct current feed circuit is connected with the feed end of the feed circuit structure.
9. the test fixture of claim 7 or 8, further comprising: the two isolation capacitors are respectively arranged on one side of the input end clamp and one side of the output end clamp;
Metal leads are arranged on two sides of each isolation capacitor; the isolation capacitor is connected with the input end clamp or the output end clamp through the metal lead.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201822196281.9U CN209803186U (en) | 2018-12-26 | 2018-12-26 | feed circuit structure and test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201822196281.9U CN209803186U (en) | 2018-12-26 | 2018-12-26 | feed circuit structure and test fixture |
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| CN209803186U true CN209803186U (en) | 2019-12-17 |
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| CN201822196281.9U Active CN209803186U (en) | 2018-12-26 | 2018-12-26 | feed circuit structure and test fixture |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109596866A (en) * | 2018-12-26 | 2019-04-09 | 中国电子科技集团公司第十三研究所 | Feed circuit structure and test fixture |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109596866A (en) * | 2018-12-26 | 2019-04-09 | 中国电子科技集团公司第十三研究所 | Feed circuit structure and test fixture |
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