CN109541773A - Adjust the grating line method parallel with linear light source - Google Patents
Adjust the grating line method parallel with linear light source Download PDFInfo
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- CN109541773A CN109541773A CN201811612921.8A CN201811612921A CN109541773A CN 109541773 A CN109541773 A CN 109541773A CN 201811612921 A CN201811612921 A CN 201811612921A CN 109541773 A CN109541773 A CN 109541773A
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- grating
- light source
- linear light
- parallel
- adjustment
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/62—Optical apparatus specially adapted for adjusting optical elements during the assembly of optical systems
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- Optics & Photonics (AREA)
- Spectrometry And Color Measurement (AREA)
Abstract
The present invention provides a kind of methods that adjustment grating line is parallel with linear light source, are related to field of spectral analysis technology, comprising: the monochromatic source of emergent light angle can be adjusted and be fixed on platform by being equipped with one；It is equipped with a master grating being adhesively fixed in grating frame and is placed on platform, the groove of master grating is parallel with the linear light source that monochromatic source issues；The surface for adjusting monochromatic source irradiation master grating, throws into diffraction pattern on receiving screen；The angle of fixed monochromatic source, makes marks at least two diffraction patterns of diffraction pattern；Tested grating is put into the grating frame not being bonded and replaces master grating；Tested grating is rotated until the diffraction pattern of tested grating diffration hot spot and master grating is on the same line.This method does not need not needing to operate in darker environment by optical detection device, has the characteristics that easy to operate, quick, accuracy is high.
Description
Technical field
The present invention relates to field of spectral analysis technology, parallel with linear light source in particular to a kind of adjustment grating line
Method.
Background technique
The tradition adjustment grating line device parallel with linear light source is that the illumination being emitted by slit is mapped on grating, then
It is weaker to be diffracted on optical detector the light that (device complexity is not easy to operate) being adjusted is emitted due to slit, is visually difficult clear
The striped for seeing the diffraction from grating clearly, needs by optical detection device, and needs external environment light intensity weaker, adjustment
(test) process is easy by external environmental interference.
Summary of the invention
The present invention is directed at least solve one of above-mentioned technical problems existing in the prior art or related technologies, one is disclosed
The kind adjustment grating line method parallel with linear light source, does not need complicated device, operating process, can not by external environmental interference
It is parallel with linear light source quickly to adjust grating line.
The present invention is to be achieved by the following technical programs:
A method of adjustment grating line is parallel with linear light source, comprising: emergent light angle can be adjusted by being equipped with one
Monochromatic source is simultaneously fixed on platform；It is equipped with a master grating being adhesively fixed in grating frame and is placed on platform, mark
The groove of quasi-optical grid is parallel with the linear light source that monochromatic source issues；The surface for adjusting monochromatic source irradiation master grating, makes diffraction
Pattern is thrown on receiving screen；The angle of fixed monochromatic source, makes marks at least two diffraction patterns of diffraction pattern；It will be by
Grating is surveyed to be put into the grating frame not being bonded and replace master grating；Tested grating is rotated until tested grating diffration hot spot
Line is parallel with the line of label.
The adjustment grating line method parallel with linear light source provided according to the present invention, it is preferable that diffraction pattern extremely
The step of making marks on few two diffraction patterns, specifically includes: on 0 grade ,+1 grade and -1 grade of diffraction pattern of facula position
It makes marks.
In the technical scheme, step 1: it is equipped with a monochromatic source, can freely adjust its emergent light angle.Step 2:
It is equipped with a platform, a grating frame.Monochromatic source is fixed on platform.Step 3: it is equipped with bonding standard
Grating, it is known that the master grating groove is parallel with linear light source.Step 4: opening monochromatic source, master grating be put on platform,
Monochromatic source angle is adjusted, light is irradiated into master grating surface, is diffracted on receiving screen.The angle of monochromatic source is fixed, point
It is not marked 0 grade ,+1 grade and -1 grade of diffraction pattern position.Step 5: tested grating is put into the grating for needing to be bonded
In frame, master grating is replaced, if the groove and linear light source out of plumb of tested grating, are tested the company of optical grating diffraction hot spot at this time
The line of line and the hot spot of master grating institute diffraction is not parallel.Step 6: it is tested grating in rotating grating frame, makes its diffraction pattern
It is on the same line with standard hot spot, tested grating is Nian Jie with grating frame.Adjustment is completed.
The adjustment grating line provided according to the present invention the method parallel with linear light source, it is preferable that monochromatic source is laser
Device.
The adjustment grating line provided according to the present invention the method parallel with linear light source, it is preferable that monochromatic source is feux rouges
Light source.
The adjustment grating line method parallel with linear light source provided according to the present invention, it is preferable that receiving screen for wall or
Person's naked eyes are able to observe that the screen of hot spot.
The adjustment grating line provided according to the present invention the method parallel with linear light source, it is preferable that receiving screen is laser spy
Device is surveyed, reception and analysis optical signal is used for.
The adjustment grating line provided according to the present invention the method parallel with linear light source, it is preferable that master grating is concave surface
Grating.
The beneficial effect that the present invention obtains includes:
The present invention is made caused by diffraction spectral line caused by tested grating and master grating by rotating tested grating
Diffraction spectral line is overlapped, parallel with linear light source to achieve the purpose that correct grating line, does not need not needing by optical detection device
It is operated in darker environment, has the characteristics that easy to operate, quick, accuracy is high.
Detailed description of the invention
Fig. 1 is the schematic diagram that hot spot is distributed on receiving screen.
Fig. 2 is light path schematic diagram.
Fig. 3 is the groove schematic diagram parallel with linear light source.
Fig. 4 is groove and the not parallel schematic diagram of linear light source.
Specific embodiment
To better understand the objects, features and advantages of the present invention, with reference to the accompanying drawing and specific real
Applying mode, the present invention is further described in detail.
In the case where incident light impinges perpendicularly on grating surface, when grating line and linear light source are not parallel, 0 grade of diffraction
The position of spectral line is constant, and respectively upward, lower direction offset not contour phenomenon occurs, and light for+1 grade and -1 grade of diffraction pattern
Micro- draws close to central zero order diffraction hot spot, when the angle that grating line and linear light source are staggered increases ,+1 grade and -1 grade of diffraction
On hot spot, the offset distance in lower direction is significantly increased.General spectra collection analyzes optical signal with line array CCD, line array CCD be by
Multiple pixels rearrange, and as shown in dash area in Fig. 3, each pixel will receive each wave band by optical grating diffraction
Light, when grating line is parallel with linear light source, the light distribution of each wave band is as shown in Figure 3, and shaded area is pixel institute in figure
Received light area, when grating line is not parallel with linear light source, the light of each wave band is distributed as shown in Figure 4 in line array CCD,
One pixel will receive the optical signal of two and more than two wave bands, received smooth surface in the received light area ratio Fig. 1 of Fig. 4 simultaneously
Product is reduced, and is caused to receive luminous intensity reduction, is also led to resolution ratio reduction.
Therefore, the present invention is directed to using more succinct, fast and accurately method is parallel with linear light source to adjust grating line,
One embodiment of the present of invention discloses following method of adjustment:
What is adjusted in the present embodiment is concave grating, uses red-light source, as shown in Fig. 2, red laser is opened,
First standard concave grating is placed on platform, adjusts the angle of red laser and the position of concave grating, so that light source is just
It is radiated at the center of concave grating well.And makes the diffraction pattern on receiving screen minimum, mark facula position.As shown in Figure 1
AOB, 0 grade of center diffraction pattern is O point, and ± 1 grade of diffraction pattern is respectively B point and A point.Then it is viscous tested grating to be put into needs
It in the grating frame connect, is placed on platform, replaces master grating, adjust the relative distance of grating frame and laser, so that by
The central bright fringe of far field of survey grating institute diffraction is overlapped with the central bright fringe of far field of master grating institute diffraction, and the diffraction light on receiving screen
Spot is minimum.Adjustment, which finishes, fixes grating frame position, then rotates tested grating, makes the line and master grating of its diffraction pattern
The line of diffraction pattern is parallel.Then tested grating is Nian Jie with grating frame.Grating adjustment is completed,
Red-light source is selected in embodiment, other monochromatic sources also can be selected.
Concave grating is adjusted in embodiment, can also be used to adjustment plane grating.
Reception device is wall in embodiment, or any screen that can visually see hot spot, or
With laser detector come reception and analysis optical signal.
The disclosed adjustment grating line method parallel with linear light source according to the present invention rotates tested grating and makes tested light
Diffraction spectral line caused by grid is overlapped with diffraction spectral line caused by master grating, flat to reach correction grating line and linear light source
Capable purpose does not need not needing to operate in darker environment by optical detection device, and it is easy to operate, quick, accurate to have
Spend the features such as high.
The foregoing is only a preferred embodiment of the present invention, is not intended to restrict the invention, for the skill of this field
For art personnel, the invention may be variously modified and varied.All within the spirits and principles of the present invention, made any to repair
Change, equivalent replacement, improvement etc., should all be included in the protection scope of the present invention.
Claims (7)
1. a kind of method that adjustment grating line is parallel with linear light source characterized by comprising
The monochromatic source of emergent light angle can be adjusted and be fixed on platform by being equipped with one；
It is equipped with a master grating being adhesively fixed in grating frame and places on the platform, the groove of the master grating
It is parallel with the linear light source that the monochromatic source issues；
The surface that the monochromatic source irradiates the master grating is adjusted, throws into diffraction pattern on receiving screen；
The angle of the fixed monochromatic source, makes marks at least two diffraction patterns of the diffraction pattern；
Tested grating is put into the grating frame not being bonded and replaces the master grating；
The tested grating is rotated until tested grating diffration hot spot line is parallel with the line of the label.
2. the adjustment grating line according to claim 1 method parallel with linear light source, which is characterized in that described described
The step of making marks at least two diffraction patterns of diffraction pattern, specifically includes:
It makes marks on 0 grade ,+1 grade and -1 grade of the diffraction pattern of facula position.
3. the adjustment grating line according to claim 1 method parallel with linear light source, which is characterized in that the monochromatic light
Source is laser.
4. the adjustment grating line according to claim 1 method parallel with linear light source, which is characterized in that the monochromatic light
Source is red-light source.
5. the adjustment grating line according to claim 1 method parallel with linear light source, which is characterized in that the receiving screen
The screen of hot spot is able to observe that for wall or naked eyes.
6. the adjustment grating line according to claim 1 method parallel with linear light source, which is characterized in that the receiving screen
For laser detector, it to be used for reception and analysis optical signal.
7. the adjustment grating line according to claim 1 method parallel with linear light source, which is characterized in that the standard light
Grid are concave grating.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811612921.8A CN109541773A (en) | 2018-12-27 | 2018-12-27 | Adjust the grating line method parallel with linear light source |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811612921.8A CN109541773A (en) | 2018-12-27 | 2018-12-27 | Adjust the grating line method parallel with linear light source |
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| CN109541773A true CN109541773A (en) | 2019-03-29 |
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Citations (6)
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|---|---|---|---|---|
| CN102645167A (en) * | 2012-05-04 | 2012-08-22 | 中国科学院长春光学精密机械与物理研究所 | Absolute displacement measuring device |
| CN204514326U (en) * | 2015-04-14 | 2015-07-29 | 嘉兴普朗克光电科技有限公司 | A kind of multiple spot line laser module and apply its Laser Dotted Line Appearance |
| CN105043540A (en) * | 2015-07-05 | 2015-11-11 | 钢研纳克检测技术有限公司 | Raster fixing structure with three-dimensional attitude adjusting function |
| CN107101723A (en) * | 2017-06-13 | 2017-08-29 | 钢研纳克检测技术有限公司 | High-resolution echelle spectrometer two dimension deviation spectrum analysis and bearing calibration |
| CN107132634A (en) * | 2017-06-28 | 2017-09-05 | 中国工程物理研究院激光聚变研究中心 | The reloading method of grating in a kind of large-scale ultra-short pulse laser compressor reducer |
| CN108181238A (en) * | 2018-02-06 | 2018-06-19 | 钢研纳克检测技术有限公司 | The echelle grating attitude adjusting method and calibrating installation of a kind of spectrometer |
-
2018
- 2018-12-27 CN CN201811612921.8A patent/CN109541773A/en active Pending
Patent Citations (6)
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|---|---|---|---|---|
| CN102645167A (en) * | 2012-05-04 | 2012-08-22 | 中国科学院长春光学精密机械与物理研究所 | Absolute displacement measuring device |
| CN204514326U (en) * | 2015-04-14 | 2015-07-29 | 嘉兴普朗克光电科技有限公司 | A kind of multiple spot line laser module and apply its Laser Dotted Line Appearance |
| CN105043540A (en) * | 2015-07-05 | 2015-11-11 | 钢研纳克检测技术有限公司 | Raster fixing structure with three-dimensional attitude adjusting function |
| CN107101723A (en) * | 2017-06-13 | 2017-08-29 | 钢研纳克检测技术有限公司 | High-resolution echelle spectrometer two dimension deviation spectrum analysis and bearing calibration |
| CN107132634A (en) * | 2017-06-28 | 2017-09-05 | 中国工程物理研究院激光聚变研究中心 | The reloading method of grating in a kind of large-scale ultra-short pulse laser compressor reducer |
| CN108181238A (en) * | 2018-02-06 | 2018-06-19 | 钢研纳克检测技术有限公司 | The echelle grating attitude adjusting method and calibrating installation of a kind of spectrometer |
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| 黄文超等: "光栅光谱有光问题研究", 《物理通报》 * |
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