CN109521231B - Chip tantalum electrolytic capacitor test fixture - Google Patents
Chip tantalum electrolytic capacitor test fixture Download PDFInfo
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- CN109521231B CN109521231B CN201811376082.4A CN201811376082A CN109521231B CN 109521231 B CN109521231 B CN 109521231B CN 201811376082 A CN201811376082 A CN 201811376082A CN 109521231 B CN109521231 B CN 109521231B
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- 239000003990 capacitor Substances 0.000 title claims abstract description 28
- 229910052715 tantalum Inorganic materials 0.000 title claims abstract description 27
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 title claims abstract description 27
- 238000012360 testing method Methods 0.000 title claims abstract description 23
- 239000000872 buffer Substances 0.000 claims abstract description 32
- 238000009963 fulling Methods 0.000 claims abstract description 24
- 230000006835 compression Effects 0.000 claims abstract description 16
- 238000007906 compression Methods 0.000 claims abstract description 16
- 238000003825 pressing Methods 0.000 claims abstract description 15
- 239000010720 hydraulic oil Substances 0.000 claims abstract description 13
- 238000005096 rolling process Methods 0.000 claims description 26
- 239000012212 insulator Substances 0.000 claims description 14
- 210000002421 cell wall Anatomy 0.000 claims description 7
- 239000011148 porous material Substances 0.000 claims description 2
- 230000003139 buffering effect Effects 0.000 abstract description 9
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 10
- 238000000034 method Methods 0.000 description 6
- 238000005299 abrasion Methods 0.000 description 5
- 229910052742 iron Inorganic materials 0.000 description 5
- 230000009471 action Effects 0.000 description 3
- 230000008859 change Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 238000001125 extrusion Methods 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 238000004891 communication Methods 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 230000004075 alteration Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000004512 die casting Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000002035 prolonged effect Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G9/00—Electrolytic capacitors, rectifiers, detectors, switching devices, light-sensitive or temperature-sensitive devices; Processes of their manufacture
- H01G9/004—Details
- H01G9/04—Electrodes or formation of dielectric layers thereon
- H01G9/042—Electrodes or formation of dielectric layers thereon characterised by the material
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- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
Abstract
The invention relates to the technical field of tantalum electrolytic capacitors, and discloses a chip-type tantalum electrolytic capacitor test fixture which comprises an upper template, a middle template, a lower template, a negative electrode pressing pin, an insulating base, a positive electrode pressing pin, a circuit board, a hydraulic oil cylinder, a pressing pin positioning plate and a positive electrode pressing pin panel, wherein the lower surface of the middle template is provided with a plurality of buffer grooves, the negative electrode pressing pin is in sliding connection with the groove walls of the buffer grooves, the upper end of the negative electrode pressing pin is fixedly connected with a telescopic rod, the upper end of the telescopic rod is fixedly connected with a first piston, the same compression spring is fixedly connected between the first piston and the negative electrode pressing pin, the compression spring is movably sleeved on the rod wall of the telescopic rod, the groove walls of the buffer grooves are symmetrically provided with two sliding grooves. This piece formula tantalum electrolytic capacitor test fixture can carry out multistage buffering to negative pole tucking, avoids the negative pole pressure to cause the damage to the circuit board, the effectual wearing and tearing that have reduced guide pillar and uide bushing, has improved the life of anchor clamps.
Description
Technical Field
The invention relates to the technical field of tantalum electrolytic capacitor production, in particular to a chip-type tantalum electrolytic capacitor test fixture.
Background
The tantalum electrolytic capacitor is developed by the American Belle laboratory, has excellent performance, and is a product which has small volume and can reach larger capacitance in all capacitors. The tantalum electrolytic capacitor is not only widely used in the fields of military communication, aerospace and the like, but also widely used in products such as industrial control, video equipment, communication instruments and the like. The tantalum electrolytic capacitor needs to be tested after production is completed, and the test needs to be positioned by using a clamp.
Through retrieval, chinese patent No. CN202533462U discloses a chip tantalum electrolytic capacitor test fixture, which comprises an upper template, a middle template, and a lower template, a guide pillar, a circuit board, a press pin positioning plate, an anode press pin, a cathode press pin, and a hydraulic cylinder, wherein each corner of the three templates is provided with a guide through hole, the upper end and the lower end of the guide pillar are respectively and fixedly installed in the guide through holes of the upper template and the lower template, the guide through hole of the middle template is movably sleeved at the middle section of the guide pillar, the upper surface of the upper module is provided with the hydraulic cylinder, the piston rod of the hydraulic cylinder penetrates through the upper template and then is connected with the middle template, the front part of the middle template is provided with a row of cathode press pins along the length direction, and the lower end of the cathode press pin. The chip tantalum electrolytic capacitor test fixture in the patent has the following defects: above-mentioned anchor clamps avoid the negative pressure to cause the damage to the circuit board, are equipped with the spring on the negative pressure needle and cushion, nevertheless only cushion through the spring, and the buffering effect is relatively poor, and the guide pillar of above-mentioned anchor clamps and the frequent relative friction of uide bushing lead to guide pillar and guide pin bushing wearing and tearing serious, have reduced the life of anchor clamps.
Disclosure of Invention
Technical problem to be solved
Aiming at the defects of the prior art, the invention provides a chip tantalum electrolytic capacitor test fixture which has the advantages of improving the buffering effect, reducing the abrasion speed of a guide pillar and a guide sleeve and the like, and solves the problems that the negative pressing pin is only buffered by a spring, the buffering effect is poor and the guide pillar and the guide sleeve are seriously abraded in the prior art.
(II) technical scheme
In order to achieve the purposes of improving the buffering effect and reducing the abrasion speed of the guide pillar and the guide sleeve, the invention provides the following technical scheme:
the utility model provides a piece formula tantalum electrolytic capacitor test fixture, includes cope match-plate pattern, well template, lower bolster, negative pole tucking, anodal tucking, circuit board, hydraulic cylinder, tucking locating plate and anodal tucking panel, a plurality of dashpots have been seted up to the lower surface of well template, the cell wall sliding connection of negative pole tucking and dashpot, the upper end fixedly connected with telescopic link of negative pole tucking, the first piston of upper end fixedly connected with of telescopic link, the same compression spring of fixedly connected with between first piston and the negative pole tucking, the pole wall of telescopic link is located to the compression spring movable sleeve, two sliding trays have been seted up to the cell wall symmetry of dashpot, sliding connection has the second piston in the sliding tray, the same buffer spring of fixedly connected with between the tank bottom of second piston and sliding tray, the dashpot intussuseption is filled with hydraulic oil.
Preferably, two through holes are symmetrically formed in the side wall of the upper side of the middle template, a guide sleeve is fixedly sleeved in each through hole, two guide pillars are fixedly connected between the upper template and the lower template, the rod walls of the guide pillars are movably sleeved on the guide sleeves, a fixing block is fixedly connected to the inner wall of each guide sleeve through a fixing device, a ball groove is formed in the side wall, close to one side of each guide pillar, of each fixing block, a ball is rotatably connected in the ball groove, and the ball is in close contact with the rod walls of the guide pillars.
Preferably, the fixing device comprises a sleeve fixedly connected with the inner wall of the guide sleeve, the moving rod is movably sleeved on the inner wall of the sleeve, the same spring is fixedly connected between the moving rod and the inner wall of the guide sleeve, and the spring is located in the sleeve.
Preferably, the groove wall of the buffer groove is symmetrically and fixedly connected with two sliding blocks, and the outer wall of the negative electrode pressing needle is provided with a sliding groove matched with the sliding blocks.
Preferably, the inner wall of the sleeve is symmetrically and fixedly connected with two limiting sliding blocks, and the rod wall of the moving rod is provided with a limiting sliding groove matched with the limiting sliding blocks.
Preferably, the rod wall of the guide post is provided with a rolling groove corresponding to the ball, and the ball is in close contact with the groove bottom of the rolling groove.
Preferably, the diameter of the ball is larger than the groove depth of the ball groove.
Preferably, the mounting groove has been seted up to the upper surface of lower bolster, insulator foot is located the mounting groove, two recesses have been seted up to the upper surface symmetry of lower bolster, the recess is close to the cell wall of insulator foot one side and has been seted up the sliding hole, and sliding connection has the locking lever in the sliding hole, two fixture blocks of the symmetrical fixedly connected with of pore wall of sliding hole, the draw-in groove corresponding with the fixture block has been seted up to the pole wall of locking lever, the locking groove corresponding with the locking lever has been seted up to insulator foot's lateral wall, the same reset spring of fixedly connected with between the cell wall of locking lever and recess, the pole wall fixedly connected with driving lever of.
(III) advantageous effects
Compared with the prior art, the invention provides a chip tantalum electrolytic capacitor test fixture, which has the following beneficial effects:
1. this piece formula tantalum electrolytic capacitor test fixture, well template through setting up, the negative pole tucking, the dashpot, the telescopic link, first piston, compression spring, the sliding tray, second piston and buffer spring, in use, the negative pole tucking makes compression spring warp and cushions, compression spring extrudees first piston, hydraulic oil in the first piston extrusion dashpot cushions, the second piston in the hydraulic oil extrusion sliding tray, make the second piston remove to the tank bottom of sliding tray, second piston extrusion buffer spring, make buffer spring warp and cushion, this device can carry out multistage buffering to the negative pole tucking, avoid the negative pole pressure to cause the damage to the circuit board.
2. This piece formula tantalum electrolytic capacitor test fixture, cope match-plate pattern through setting up, the lower bolster, the uide bushing, the guide pillar, the fixed block, the ball groove, the ball, the sleeve pipe, the carriage release lever, spring and roll groove, in use, under the effect of spring, the carriage release lever removes, the carriage release lever drives the fixed block and removes, the fixed block drives the ball and removes, make the ball and the tank bottom in close contact with in roll groove, when the uide bushing removes, the ball rolls with the tank bottom in roll groove relatively, convert sliding friction into rolling friction, frictional resistance has been reduced, and avoid uide bushing and guide pillar directly to remove, the effectual wearing and tearing that have reduced guide pillar and uide bushing, the life of anchor clamps has been improved.
Drawings
FIG. 1 is a schematic structural diagram of a fixture for testing a chip tantalum electrolytic capacitor according to the present invention;
FIG. 2 is an enlarged view of a portion A of FIG. 1;
FIG. 3 is an enlarged view of a portion B of FIG. 2;
FIG. 4 is an enlarged view of a portion C of FIG. 1;
FIG. 5 is an enlarged view of a portion D of FIG. 4;
fig. 6 is a partial structure enlarged view of a portion E in fig. 1.
In the figure: 1 upper die plate, 2 middle die plate, 3 lower die plate, 4 negative pole tucking, 5 buffer slots, 6 telescopic links, 7 first piston, 8 compression spring, 9 sliding slot, 10 second piston, 11 buffer spring, 12 guide sleeve, 13 guide post, 14 fixed block, 15 ball slot, 16 ball, 17 sleeve, 18 movable rod, 19 spring, 20 rolling slot, 21 insulating base, 22 mounting slot, 23 groove, 24 locking lever, 25 locking slot, 26 reset spring, 27 deflector rod.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to fig. 1-6, a chip-type tantalum electrolytic capacitor test fixture comprises an upper template 1, a middle template 2, a lower template 3, a negative pressure pin 4, a positive pressure pin, a circuit board, a hydraulic cylinder, a pressure pin positioning plate and a positive pressure pin panel, wherein the specific connection relationship of the above structures has been described in detail in a reference document, and will not be described herein any more, the lower surface of the middle template 2 is provided with a plurality of buffer slots 5, the negative pressure pin 4 is slidably connected with the slot walls of the buffer slots 5, the upper end of the negative pressure pin 4 is fixedly connected with a telescopic rod 6, the upper end of the telescopic rod 6 is fixedly connected with a first piston 7, the specific material of the first piston 7 is rubber, the first piston 7 is in close contact with the slot walls of the buffer slots 5, so as to ensure that hydraulic oil will not leak from the connection between the first piston 7 and the buffer slots 5, thereby ensuring the normal use of the device, the same compression spring 8 is fixedly connected between the first piston 7, the compression spring 8 is movably sleeved on the rod wall of the telescopic rod 6, two sliding grooves 9 are symmetrically formed in the groove wall of the buffer groove 5, a second piston 10 is connected in the sliding grooves 9 in a sliding mode, the specific material of the second piston 10 is rubber, the second piston 10 is in close contact with the groove wall of the sliding grooves 9, hydraulic oil is prevented from leaking from the joint of the second piston 10 and the sliding grooves 9, normal use of the device is guaranteed, the same buffer spring 11 is fixedly connected between the second piston 10 and the groove bottom of the sliding grooves 9, the buffer groove 5 is filled with the hydraulic oil, when the device is used, the negative pressure pin 4 enables the compression spring 8 to deform and buffer, the compression spring 8 extrudes the first piston 7, the first piston 7 extrudes the hydraulic oil in the buffer groove 5 for buffering, the hydraulic oil extrudes the second piston 10 in the sliding grooves 9, the second piston 10 moves towards the groove bottom of the sliding grooves 9, the second piston 10 extrudes the buffer spring 11, make buffer spring 11 warp and cushion, this device can carry out multistage buffering to negative pole tucking 4, avoids negative pole tucking 4 to cause the damage to the circuit board.
Two through holes are symmetrically formed in the side wall of the upper side of the middle template 2, a guide sleeve 12 is fixedly sleeved in the through holes, two guide posts 13 are fixedly connected between the upper template 1 and the lower template 3, the guide sleeve 12 is movably sleeved on the rod walls of the guide posts 13, a fixed block 14 is fixedly connected to the inner wall of the guide sleeve 12 through a fixing device, a ball groove 15 is formed in the side wall of the fixed block 14 close to one side of the guide posts 13, balls 16 are rotatably connected in the ball groove 15, the balls 16 are tightly contacted with the rod walls of the guide posts 13, when the die-casting die is used, the movable rod 18 moves under the action of a spring 19, the movable rod 18 drives the fixed block 14 to move, the fixed block 14 drives the balls 16 to move, the balls 16 are enabled to be tightly contacted with the groove bottoms of the rolling grooves 20, when the guide sleeve 12 moves, the balls 16 roll relative to the groove bottoms of the rolling grooves 20, sliding, the abrasion between the guide pillar 13 and the guide sleeve 12 is effectively reduced, and the service life of the clamp is prolonged.
The fixing device comprises a sleeve 17 fixedly connected with the inner wall of the guide sleeve 12, a moving rod 18 is movably sleeved on the inner wall of the sleeve 17, a same spring 19 is fixedly connected between the moving rod 18 and the inner wall of the guide sleeve 12, the spring 19 is positioned in the sleeve 17, the spring can extrude the moving rod 18 under the action of the spring 19, the moving rod 18 can move towards the direction of the guide column 13, the moving rod 18 drives the fixed block 14 to move towards the direction of the guide column 13, the fixed block 14 drives the balls 16 to move towards the direction of the rolling groove 20, the balls 16 can be in close contact with the groove bottom of the rolling groove 20, therefore, the balls 16 can roll relative to the rolling groove 20, sliding friction is converted into rolling friction, the rolling friction is relative to the sliding friction, the friction coefficient is small, and abrasion can be effectively.
Two sliders of cell wall symmetry fixedly connected with of dashpot 5, the outer wall of negative pole tucking iron 4 set up with slider assorted spout, mutually support through slider and spout, carry out spacing fixed to negative pole tucking iron 4, prevent that negative pole tucking iron 4 from breaking away from dashpot 5, and can prevent that negative pole tucking iron 4 from rotating, have guaranteed negative pole tucking iron 4's normal use.
Two limit slide blocks of sleeve 17's inner wall symmetry fixedly connected with, the pole wall of carriage release lever 18 set up with limit slide block assorted spacing spout, mutually support through limit slide block and spacing spout, carry on spacingly to carriage release lever 18, prevent that carriage release lever 18 from breaking away from sleeve 17, avoid fixed block 14 and uide bushing 12 to break away from, improved the steadiness of device.
The rolling groove 20 corresponding with the ball is seted up to the pole wall of guide pillar 13, and the tank bottom in close contact with in ball 16 and rolling groove 20, and rolling groove 20 can carry out effectual spacing to ball 16, prevents that ball 16 from breaking away from ball groove 15, and mutually supports through ball 16 and rolling groove 20, converts sliding friction into rolling friction, and rolling friction is for sliding friction, and coefficient of friction is less, can effectual reduction wearing and tearing.
The diameter of the ball 16 is larger than the depth of the ball groove 15, so that the ball 16 can be exposed outside the ball groove 15, and the ball 16 can be ensured to be in contact with the groove bottom of the rolling groove 20, so that the ball 16 can roll relative to the groove bottom of the rolling groove 20, sliding friction is converted into rolling friction, and the rolling friction is smaller than the sliding friction, so that the abrasion can be effectively reduced.
The upper surface of the lower template 3 is provided with a mounting groove 22, the insulating base 21 is positioned in the mounting groove 22, the upper surface of the lower template 3 is symmetrically provided with two grooves 23, the groove wall of the groove 23 close to one side of the insulating base 21 is provided with a sliding hole, the sliding hole is connected with a locking rod 24 in a sliding manner, the hole wall of the sliding hole is symmetrically and fixedly connected with two clamping blocks, the rod wall of the locking rod 24 is provided with clamping grooves corresponding to the clamping blocks, the locking rod 24 is limited by the mutual matching of the clamping blocks and the clamping grooves, the locking rod 24 is prevented from inclining when moving, the locking rod 24 is convenient to align with the locking groove 25, the side wall of the insulating base 21 is provided with a locking groove 25 corresponding to the locking rod 24, the same reset spring 26 is fixedly connected between the locking rod 24 and the groove wall of the groove 23, the rod wall of the locking rod 24 is fixedly connected, remove locking lever 24 to insulator foot 21's restriction, extract mounting groove 22 with insulator foot 21, be convenient for change insulator foot 21, after the change is accomplished, insert insulator foot 21 into mounting groove 22, pulling driving lever 27, make locking lever 24 aim at locking groove 25, loosen driving lever 27, under reset spring 26's effect, locking lever 24 inserts locking groove 25, locking lever 24 fixes insulator foot 21, accomplish insulator foot 21's dismantlement and installation, can be quick simple change insulator foot, the dismouting efficiency is improved, staff's intensity of labour has been reduced.
In conclusion, when the chip tantalum electrolytic capacitor test fixture is used, the negative pressing pin 4 deforms and buffers the compression spring 8, the compression spring 8 presses the first piston 7, the first piston 7 presses the hydraulic oil in the buffer groove 5 for buffering, the hydraulic oil presses the second piston 10 in the sliding groove 9, the second piston 10 moves towards the bottom of the sliding groove 9, the second piston 10 presses the buffer spring 11, and the buffer spring 11 deforms and buffers the hydraulic oil, the device can buffer the negative pressing pin 4 in multiple stages, damage to a circuit board caused by the negative pressing pin 4 is avoided, when the fixture is used, under the action of the spring 19, the moving rod 18 moves, the moving rod 18 drives the fixed block 14 to move, the fixed block 14 drives the balls 16 to move, the balls 16 are in close contact with the bottom of the rolling groove 20, when the guide sleeve 12 moves, the balls 16 roll relative to the bottom of the rolling groove 20, convert sliding friction into rolling friction, reduced frictional resistance, and avoid uide bushing 12 and guide pillar 13 directly to remove, the effectual wearing and tearing that reduce guide pillar 13 and uide bushing 12 have improved the life of anchor clamps.
It is to be noted that the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.
Claims (7)
1. The utility model provides a piece formula tantalum electrolytic capacitor test fixture, includes cope match-plate pattern (1), well template (2), lower bolster (3), negative pole tucking (4), insulator foot (21), anodal tucking, circuit board, hydraulic cylinder, tucking locating plate and anodal tucking panel, its characterized in that: the lower surface of the middle template (2) is provided with a plurality of buffer grooves (5), the negative pressing needle (4) is in sliding connection with the groove walls of the buffer grooves (5), the upper end of the negative pressing needle (4) is fixedly connected with a telescopic rod (6), the upper end of the telescopic rod (6) is fixedly connected with a first piston (7), a same compression spring (8) is fixedly connected between the first piston (7) and the negative pressing needle (4), the compression spring (8) is movably sleeved on the rod wall of the telescopic rod (6), the groove walls of the buffer grooves (5) are symmetrically provided with two sliding grooves (9), the sliding grooves (9) are internally connected with a second piston (10) in a sliding manner, a same buffer spring (11) is fixedly connected between the second piston (10) and the groove bottoms of the sliding grooves (9), and the buffer grooves (5) are filled with hydraulic oil;
two through holes are symmetrically formed in the side wall of the upper side of the middle template (2), a guide sleeve (12) is sleeved in the through holes in a fixed mode, two guide pillars (13) are fixedly connected between the upper template (1) and the lower template (3), the rod wall of each guide pillar (13) is movably sleeved with the guide sleeve (12), a fixed block (14) is fixedly connected to the inner wall of each guide sleeve (12) through a fixing device, a ball groove (15) is formed in the side wall, close to one side of each guide pillar (13), of each fixed block (14), balls (16) are connected to the ball grooves (15) in a rotating mode, and the balls (16) are in close contact with the rod wall of each guide pillar (13).
2. The fixture for testing chip tantalum electrolytic capacitor according to claim 1, wherein: the fixing device comprises a sleeve (17) fixedly connected with the inner wall of the guide sleeve (12), a moving rod (18) is movably sleeved on the inner wall of the sleeve (17), a same spring (19) is fixedly connected between the moving rod (18) and the inner wall of the guide sleeve (12), and the spring (19) is located in the sleeve (17).
3. The fixture for testing chip tantalum electrolytic capacitor according to claim 1, wherein: the wall symmetry fixedly connected with two sliders of dashpot (5), the spout with slider assorted is seted up to the outer wall of negative pole tucking (4).
4. The fixture for testing chip tantalum electrolytic capacitor according to claim 2, wherein: the inner wall of the sleeve (17) is symmetrically and fixedly connected with two limiting sliding blocks, and the rod wall of the moving rod (18) is provided with a limiting sliding groove matched with the limiting sliding blocks.
5. The fixture for testing chip tantalum electrolytic capacitor according to claim 1, wherein: the rod wall of the guide post (13) is provided with a rolling groove (20) corresponding to the ball, and the ball (16) is tightly contacted with the bottom of the rolling groove (20).
6. The fixture for testing chip tantalum electrolytic capacitor according to claim 1, wherein: the diameter of the ball (16) is larger than the groove depth of the ball groove (15).
7. The fixture for testing chip tantalum electrolytic capacitor according to claim 1, wherein: mounting groove (22) have been seted up to the upper surface of lower bolster (3), insulator foot (21) are located mounting groove (22), two recess (23) have been seted up to the upper surface symmetry of lower bolster (3), the cell wall that recess (23) are close to insulator foot (21) one side has seted up the sliding hole, and sliding connection has locking lever (24) in the sliding hole, two fixture blocks of pore wall symmetry fixedly connected with of sliding hole, the draw-in groove corresponding with the fixture block has been seted up to the pole wall of locking lever (24), the corresponding locking groove (25) with locking lever (24) have been seted up to the lateral wall of insulator foot (21), the same reset spring (26) of fixedly connected with between the cell wall of locking lever (24) and recess (23), the pole wall fixedly connected with driving lever (27) of locking lever (24).
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811376082.4A CN109521231B (en) | 2018-11-19 | 2018-11-19 | Chip tantalum electrolytic capacitor test fixture |
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| CN201811376082.4A CN109521231B (en) | 2018-11-19 | 2018-11-19 | Chip tantalum electrolytic capacitor test fixture |
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| CN109521231A CN109521231A (en) | 2019-03-26 |
| CN109521231B true CN109521231B (en) | 2021-07-16 |
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