CN109508268A - Function test method is quickly wiped in a kind of ISE hard disk test device and the hard disk sector ISE - Google Patents
Function test method is quickly wiped in a kind of ISE hard disk test device and the hard disk sector ISE Download PDFInfo
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- CN109508268A CN109508268A CN201811346832.3A CN201811346832A CN109508268A CN 109508268 A CN109508268 A CN 109508268A CN 201811346832 A CN201811346832 A CN 201811346832A CN 109508268 A CN109508268 A CN 109508268A
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
- G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
- G06F11/1048—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices using arrangements adapted for a specific error detection or correction feature
- G06F11/106—Correcting systematically all correctable errors, i.e. scrubbing
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
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- Signal Processing For Digital Recording And Reproducing (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
Abstract
The present invention discloses a kind of ISE hard disk test device and function test method is quickly wiped in the hard disk sector ISE, and hard disk information enquiry module is for inquiring hard disk information；Hard disk supports functional inquiry module to support function for inquiring hard disk；Hard disk scan module is for scanning hard disk；Bad block is searched and repair module is for searching hard disk bad block and repairing to bad block；Functional test module is quickly wiped for carrying out quickly erasing functional test to sector in sector.The present invention can inquire hard disk essential information and support function, scan full hard disk can also be carried out to hard disk, it finds out bad block and is automatically repaired, designated sector can also be tested, the quick erasing function of sector can especially be tested, can automatic operating, it is simple to operate, test efficiently, is easy to apply and promote.
Description
Technical field
The present invention relates to hard disk test fields, and in particular to a kind of ISE hard disk test device and the hard disk sector ISE are quickly wiped
Except function test method.
Background technique
ISE hard disk is a kind of encryption disc, can fast and safely be wiped data in magnetic disk.Currently, ISE hard disk is at home
Using still not universal, there are no the testing tools and test method that are directed to ISE hard disk, whether normal can not verify its function.
Summary of the invention
To solve the above problems, the present invention provides a kind of ISE hard disk test device and function is quickly wiped in the hard disk sector ISE
Test method.
The technical scheme is that a kind of ISE hard disk test device, comprising:
Hard disk information enquiry module: for inquiring hard disk information；
Hard disk supports functional inquiry module: supporting function for inquiring hard disk；
Hard disk scan module: for scanning hard disk；
Bad block is searched and repair module: for searching hard disk bad block and repairing to bad block；
Quickly wipe functional test module in sector: for carrying out quickly erasing functional test to sector.
Further, the sector quickly wipes functional test module and includes:
Sector selects submodule: for selecting test sector；
Sevtor address acquisition submodule: for obtaining the address of test sector；
Submodule is written in data: for data to be written in the sector according to acquired test sevtor address；
Reading data saves submodule: for the data in read test sector and preservation；
Submodule is arranged in password: for password to be arranged to test sector；
Code data eliminates submodule: for wiping test sector password and deleting test sector data；
Reading data submodule: it is used for after test sector code data is eliminated, read test sector data；
Data comparison submodule: it is read for correlation data and saves submodule and the read data of data reading submodule；
Test result output sub-module: for being outputed test result according to the comparing result of data comparison submodule, if by contrast,
Test sector data has been deleted, then illustrating to test sector, quickly to wipe function normal, otherwise illustrates that testing sector quickly wipes
Dysfunction.
Further, outputing test result for the test result output sub-module is exported and is saved in the form of log.
Further, the device follow SCSI ATA agreement.
Further, which runs on linux system.
Invention additionally discloses a kind of hard disk sectors ISE quickly to wipe function test method, comprising:
S1: installation linux system；
S2: above-mentioned test device is installed；
S3: running above-mentioned test device, carries out hard disk sector and quickly wipes functional test.
Further, the above-mentioned test device of the operation carries out hard disk sector and quickly wipes functional test, comprising:
S3-1: selection test sector；
S3-2: the address of test sector is obtained；
S3-3: data are written in the sector according to acquired test sevtor address；
S3-4: data and preservation in read test sector；
S3-5: password is arranged to test sector；
S3-6: erasing test sector password and deletion test sector data；
S3-7: after test sector code data is eliminated, read test sector data；
S3-8: comparison step S3-4 and the read data of step S3-7；
S3-9: outputing test result according to the comparing result of step S3-8, if by contrast, test sector data has been deleted, then
Illustrating to test sector, quickly to wipe function normal, otherwise illustrates that testing sector quickly wipes dysfunction.
Further, the test result of step S3-9 output is exported and is saved in the form of log.
Function test method is quickly wiped in ISE hard disk test device provided by the invention and the hard disk sector ISE, can inquire
Hard disk essential information and support function can also carry out scan full hard disk to hard disk, find out bad block and be automatically repaired, moreover it is possible to specified
Sector is tested, and can especially be tested the quick erasing function of sector, can automatic operating, it is simple to operate, survey
Examination efficiently, is easy to apply and promote.
Detailed description of the invention
Fig. 1 is one structural schematic diagram of the specific embodiment of the invention.
Fig. 2 is that the specific embodiment of the invention two carries out quickly erasing function test method process signal to the hard disk sector ISE
Figure.
Specific embodiment
The present invention will be described in detail with reference to the accompanying drawing and by specific embodiment, and following embodiment is to the present invention
Explanation, and the invention is not limited to following implementation.
Embodiment one
The present embodiment is directed to the blank testing of current ISE hard disk, provides a kind of ISE hard disk test device, can inquire hard disk base
This information and support function, can also to hard disk carry out scan full hard disk, find out bad block and be automatically repaired, moreover it is possible to designated sector into
Row functional test.
As shown in Figure 1, the device specifically includes following functions module:
Hard disk information enquiry module: for inquiring hard disk information；
Hard disk supports functional inquiry module: supporting function for inquiring hard disk；
Hard disk scan module: for scanning hard disk；
Bad block is searched and repair module: for searching hard disk bad block and repairing to bad block；
Quickly wipe functional test module in sector: for carrying out quickly erasing functional test to sector.
Wherein, sector quickly wipes functional test module and completes the survey for quickly wiping sector function by following submodule
Examination.
Sector selects submodule: for selecting test sector；
Sevtor address acquisition submodule: for obtaining the address of test sector；
Submodule is written in data: for data to be written in the sector according to acquired test sevtor address；
Reading data saves submodule: for the data in read test sector and preservation；
Submodule is arranged in password: for password to be arranged to test sector；
Code data eliminates submodule: for wiping test sector password and deleting test sector data；
Reading data submodule: it is used for after test sector code data is eliminated, read test sector data；
Data comparison submodule: it is read for correlation data and saves submodule and the read data of data reading submodule；
Test result output sub-module: for being outputed test result according to the comparing result of data comparison submodule, if by contrast,
Test sector data has been deleted, then illustrating to test sector, quickly to wipe function normal, otherwise illustrates that testing sector quickly wipes
Dysfunction.
Wherein, outputing test result for test result output sub-module is exported and is saved in the form of log, so as to the people that works
Member checks.
It should be noted that the test device follow SCSI ATA agreement, and can run on linux system.
Embodiment two
The present embodiment provides a kind of hard disk sectors ISE based on one test device of embodiment quickly to wipe function test method, benefit
The hard disk sector ISE is carried out with above-mentioned test device quickly to wipe functional test.
As shown in Fig. 2, method includes the following steps:
S1: installation linux system；
S2: test device described in installation embodiment one；
S3: test device described in operation embodiment one carries out hard disk sector and quickly wipes functional test.
Wherein, step S3 carries out hard disk sector and quickly wipes functional test, specifically includes the following steps:
S3-1: selection test sector；
S3-2: the address of test sector is obtained；
S3-3: data are written in the sector according to acquired test sevtor address；
S3-4: data and preservation in read test sector；
S3-5: password is arranged to test sector；
S3-6: erasing test sector password and deletion test sector data；
S3-7: after test sector code data is eliminated, read test sector data；
S3-8: comparison step S3-4 and the read data of step S3-7；
S3-9: outputing test result according to the comparing result of step S3-8, if by contrast, test sector data has been deleted, then
Illustrating to test sector, quickly to wipe function normal, otherwise illustrates that testing sector quickly wipes dysfunction.
It should be noted that the test result of step S3-9 output is exported and saved in the form of log, checked convenient for subsequent.
The test method of test device and embodiment two that embodiment one provides, the linux that can be arbitrarily built in server
It is used under environment, easy to operate, high degree of automation, practicability is stronger, can save a large amount of human costs, enriches product and matches
It sets, improves product competitiveness.
Disclosed above is only the preferred embodiment of the present invention, but the present invention is not limited to this, any this field
What technical staff can think does not have creative variation, and without departing from the principles of the present invention made by several improvement and
Retouching, should all be within the scope of the present invention.
Claims (8)
1. a kind of ISE hard disk test device characterized by comprising
Hard disk information enquiry module: for inquiring hard disk information；
Hard disk supports functional inquiry module: supporting function for inquiring hard disk；
Hard disk scan module: for scanning hard disk；
Bad block is searched and repair module: for searching hard disk bad block and repairing to bad block；
Quickly wipe functional test module in sector: for carrying out quickly erasing functional test to sector.
2. ISE hard disk test device according to claim 1, which is characterized in that quickly wipe functional test in the sector
Module includes:
Sector selects submodule: for selecting test sector；
Sevtor address acquisition submodule: for obtaining the address of test sector；
Submodule is written in data: for data to be written in the sector according to acquired test sevtor address；
Reading data saves submodule: for the data in read test sector and preservation；
Submodule is arranged in password: for password to be arranged to test sector；
Code data eliminates submodule: for wiping test sector password and deleting test sector data；
Reading data submodule: it is used for after test sector code data is eliminated, read test sector data；
Data comparison submodule: it is read for correlation data and saves submodule and the read data of data reading submodule；
Test result output sub-module: for being outputed test result according to the comparing result of data comparison submodule, if by contrast,
Test sector data has been deleted, then illustrating to test sector, quickly to wipe function normal, otherwise illustrates that testing sector quickly wipes
Dysfunction.
3. ISE hard disk test device according to claim 2, which is characterized in that the test result output sub-module
Output test result and is exported and saved in the form of log.
4. ISE hard disk test device according to claim 1, which is characterized in that the device follow SCSI ATA agreement.
5. ISE hard disk test device according to claim 1, which is characterized in that the device runs on linux system.
6. function test method is quickly wiped in a kind of hard disk sector ISE characterized by comprising
S1: installation linux system；
S2: the installation described in any item test devices of claim 1-5；
S3: the operation described in any item test devices of claim 1-5 carry out hard disk sector and quickly wipe functional test.
7. function test method is quickly wiped in the hard disk sector ISE according to claim 6, which is characterized in that the operation
The described in any item test devices of claim 1-5 carry out hard disk sector and quickly wipe functional test, comprising:
S3-1: selection test sector；
S3-2: the address of test sector is obtained；
S3-3: data are written in the sector according to acquired test sevtor address；
S3-4: data and preservation in read test sector；
S3-5: password is arranged to test sector；
S3-6: erasing test sector password and deletion test sector data；
S3-7: after test sector code data is eliminated, read test sector data；
S3-8: comparison step S3-4 and the read data of step S3-7；
S3-9: outputing test result according to the comparing result of step S3-8, if by contrast, test sector data has been deleted, then
Illustrating to test sector, quickly to wipe function normal, otherwise illustrates that testing sector quickly wipes dysfunction.
8. function test method is quickly wiped in the hard disk sector ISE according to claim 7, which is characterized in that step S3-9
The test result of output is exported and is saved in the form of log.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811346832.3A CN109508268B (en) | 2018-11-13 | 2018-11-13 | ISE hard disk testing device and ISE hard disk sector quick erasing function testing method |
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| CN201811346832.3A CN109508268B (en) | 2018-11-13 | 2018-11-13 | ISE hard disk testing device and ISE hard disk sector quick erasing function testing method |
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| CN109508268B CN109508268B (en) | 2022-02-18 |
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Cited By (2)
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