CN107423185A - A kind of method of testing and device of disk array and compatible mainframe adaptation - Google Patents
A kind of method of testing and device of disk array and compatible mainframe adaptation Download PDFInfo
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- CN107423185A CN107423185A CN201710660541.0A CN201710660541A CN107423185A CN 107423185 A CN107423185 A CN 107423185A CN 201710660541 A CN201710660541 A CN 201710660541A CN 107423185 A CN107423185 A CN 107423185A
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/263—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers
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Abstract
The invention discloses the method for testing that a kind of disk array and compatible mainframe are adapted to, by multipath by the LUN mapping that equipment under test divides to host side, main frame is added to the LUN of equipment under test, after identification operation, the establishment file system on LUN, and basic readwrite tests is carried out to file system, after a series of basic test has been carried out to equipment under test, persistently read and write further through to equipment under test, and reach the purpose to main frame stability test, the present invention passes through a series of test comprehensively, it ensure that main frame and corresponding disk array can have better compatible adaptation, and the method for testing of the present invention can be used the disk array of various models, with versatility, invention additionally discloses the test device that a kind of disk array and compatible mainframe are adapted to, with above-mentioned beneficial effect.
Description
Technical field
The present invention relates to host device field, the method for testing being adapted to more particularly to a kind of disk array and compatible mainframe
And device.
Background technology
Langchao Tiansuo's K1 systems are China's 863 Program key special subjects " high-end fault-tolerant computer development and application " projects
Achievement.China's First key applied host machine, Langchao Tiansuo's K1 system signs, which China, turns into the 3rd, the whole world after America and Japan
The country of host technology of new generation is grasped, and is expected to change China and is relied on for a long time in the core realm such as finance, telecommunications mainframe
The difficult situation of import with.
Completing various functions due to main frame needs to be combined with disk array as storage device, and main frame and different brands
And the quality of the compatible mating situation between the disk array of model is different, therefore before main frame use, typically
The disk array that different brand and signal can be directed to carries out the test of some aspects, to determine between main frame and storage device
Whether compatibility adaptation is good.
But subject matter existing for the disk array of various models is different, is surveyed just for the problem of being primarily present
Examination, can not eliminate possibility existing for other problemses, so this test does not have comprehensive and versatility, cause test
As a result it is inaccurate, during later stage use, produce much problems caused by poor compatibility.
The content of the invention
It is an object of the invention to provide the method for testing that a kind of disk array and compatible mainframe are adapted to, solve for brand
It is not comprehensive with the disk array test of model, and do not have the problem of versatility, it is that the bottom that main frame and disk array form is hard
Part system carry out one it is comprehensive assess, ensure that the later stage reaches the standard grade the stability and performance of application, present invention also offers a kind of magnetic
The test device of disk array and compatible mainframe adaptation.
In order to solve the above technical problems, the present invention provides a kind of method of testing of disk array and compatible mainframe adaptation, bag
Include：
By the HBA multiple LUN of card port scanning recognition, wherein, the LUN is the memory space created in equipment under test,
The equipment under test maps LUN to host side by multipath, and the equipment under test is disk array；
File system mounted catalogue is arrived to the LUN establishment files system, and by described；
Test is written and read to the catalogue of carry, checks operating system daily record and storage daily record；
Judge that the operating system daily record and the storage daily record report an error with the presence or absence of abnormal, if it is not, then using
Iozone instruments carry out continuing read-write operation to mount directory, reach the first preset time until the read-write operation duration；
Check that the operating system daily record and iozone daily records report an error with the presence or absence of abnormal, obtain test result.
Wherein, described to check operating system daily record and iozone daily records with the presence or absence of exception, obtaining test result includes：
If the operating system daily record and the iozone daily records are not present exception and reported an error, created to the LUN
LVM equipment；
If creating the LVM equipment success, operation is written and read to the LVM equipment using Fio instruments, wherein,
The Fio instruments are IO pressure test instruments；
A link in multilink between the host side and the equipment under test is chosen, is in the link
Chain state, and fall chain state described in holding in the second preset time；
Pass through the time of the IO that iostat is checked between the host side and equipment under test flows to recovering from interrupting
Whether more than the first default recovery time, if it is not, then fall chain state verification by, and by it is described fall chain state described in
Link-recovery connects；
Whether the i/o traffic for the link for judging to recover connection within the second default recovery time recovers normal, if
It is that the then link-recovery test passes through.
Wherein, also include after in link-recovery test：
A link in multilink between the selection host side and the equipment under test is repeated, makes the chain
Road is in the operation of chain state, falls chain until each of the links between the host side and the equipment under test is carried out completion
State verification and link-recovery test.
Wherein, each of the links between the host side and the equipment under test is carried out completion and falls chain state verification and chain
Test is recovered on road to be included：
If every link falls chain state verification and link-recovery test all by using the Fio instruments pair
LVM equipment is written and read operation；
Control a controller in two controllers in the equipment under test to be in failure state, judge the main frame
Whether times of the IO from interrupting recovery between end and the equipment under test is more than the 3rd preset time, if not, recovering to control
Device processed is in normal condition；
Control another controller in two controllers in the equipment under test to be in failure state, judge the master
Times of the IO from interrupting recovery between generator terminal and the equipment under test whether more than the 3rd preset time, obtains disabling controller
Imitate test result.
Wherein, also include after by the multiple LUN of HBA card port scanning recognitions：
The LUN is created into raw device, operation is written and read to the raw device using the Fio instruments；
Readwrite bandwidth is recorded, judges whether the readwrite bandwidth reaches pre-set bandwidths, if it is, performing to the LUN
The establishment of file system is carried out, and by the file system mounted operation to catalogue.
Present invention also offers the test device that a kind of disk array and compatible mainframe are adapted to, including：
Scan module, for by the HBA multiple LUN of card port scanning recognition, wherein, the LUN is to be created in equipment under test
The memory space built, the equipment under test map LUN to host side by multipath, and the equipment under test is disk array；
Creation module, file system mounted catalogue is arrived for the LUN establishment files system, and by described；
Test module, test is written and read to the catalogue of carry, checks operating system daily record and storage daily record；Judge
The operating system daily record and the storage daily record report an error with the presence or absence of abnormal, if it is not, then using iozone instruments to carry
Catalogue carries out continuing read-write operation, reaches the first preset time until the read-write operation duration；Check the operating system day
Will and iozone daily records report an error with the presence or absence of abnormal, obtain test result.
Wherein, the test module includes：
First test cell, reported an error if exception is not present for the operating system daily record and the iozone daily records,
LVM equipment then is being created to the LUN；If creating the LVM equipment success, the LVM equipment is entered using Fio instruments
Row read-write operation, wherein, the Fio instruments are IO pressure test instruments；
Second test cell, for choosing a chain between the host side and the equipment under test in multilink
Road, the link is in chain state, and fall chain state described in holding in the second preset time；Institute is checked by iostat
Whether the time for stating IO flows from interrupting to recovering between host side and the equipment under test presets recovery time more than first,
If it is not, then fall chain state verification by, and by it is described fall chain state the link-recovery connect；Judge pre- second
If whether the i/o traffic for recovering the link of connection in recovery time recovers normal, if it is, the link-recovery is tested
Pass through.
Wherein, second test cell is additionally operable to：
After link-recovery test passes through, repeat more between the selection host side and the equipment under test
A link in bar link, and disconnecting link makes the link be in the operation of chain state, until the host side and institute
State each of the links between equipment under test be carried out completion fall chain state verification and link-recovery test.
Wherein, the test module includes：
3rd test cell, if for link every described fall chain state verification and link-recovery test all by,
Operation is written and read to LVM equipment using the Fio instruments；One in two controllers in the equipment under test is controlled to control
Device processed is in failure state, judges whether times of the IO from interrupting recovery between the host side and the equipment under test surpasses
The 3rd preset time is crossed, if not, recovery controller is in normal condition；Control in two controllers in the equipment under test
Another controller be in failure state, judge IO between the host side and the equipment under test from interrupting recovery
Time whether more than the 3rd preset time, obtains controller failure test result.
Wherein, the test module also includes：
4th test cell, for after by the multiple LUN of HBA card port scanning recognitions, the LUN to be created into naked
Equipment, operation is written and read to the raw device using the Fio instruments；Readwrite bandwidth is recorded, judges that the readwrite bandwidth is
It is no to reach pre-set bandwidths, if it is, the establishment that file system is carried out to the LUN is performed, and will be described file system mounted
To the operation of catalogue.
A kind of method of testing of disk array and compatible mainframe adaptation provided by the present invention, is scanned by HBA card ports
The LUN of equipment under test division is identified, if identified successfully, illustrates that the equipment under test can be added into host side and be known
Not, the establishment file system then on the LUN recognized, and the test of operation is written and read to this document system, if do not occurred
Exception reports an error, then illustrates that the function of reading and writing substantially can be completed between equipment under test and main frame, meets basic compatible adaptation
Performance, then LUN is carried out to continue readwrite tests for a long time, this is the test to the stability of host side, if test result
It is without exception, then illustrate that whole equipment under test and the system of host side cooperation can keep more stable in long-time read-write operation
Performance, it is provided by the invention so as to judge the equipment under test and host side has the performance of relatively good compatible adaptation
Method of testing, added carrying out basic multipath to host side, after identification test, carried out host side again to equipment under test
The test of basic read-write capability, on the basis of the function of being determined to complete to read and write substantially, host side has been carried out again and has been set to tested
For long lasting for read-write, because for host side, the most important performance of compatible adaptation is exactly between disk array
Well stable read-write capability, if test can be by, illustrate the compatible Adapter Property between host side and equipment under test,
It disclosure satisfy that read-write needs.
Test in a certain respect is considered relative to model of the prior art just for disk array, such as is only taken into account pair
The addition and identification of disk array, it is believed that can identify i.e. read-write etc., this test is inaccurate, of the invention test
Method is not limited the brand and model of disk array, can be applied to any disk array being connected with host side, tool
There is versatility, the assessment on a comprehensive basis has been carried out to the bottom hardware system of bosom friend and disk array composition, ensure that should
There is preferable stability and performance with system.
Preferably, the present invention also it is emergent to the link between main frame and disk array fall chain state surveyed
Examination, is further ensured during read-write, a certain bar link down, other links can timely recover the energy of read-write capability
Power, it ensure that the bottom hardware environment of application system operation to the adaptibility to response of mutation environment, further increases the complete of test
The availability of face property and equipment.
Present invention also offers the test device that a kind of disk array and compatible mainframe are adapted to, there is above-mentioned beneficial effect.
Brief description of the drawings
, below will be to embodiment or existing for the clearer explanation embodiment of the present invention or the technical scheme of prior art
The required accompanying drawing used is briefly described in technology description, it should be apparent that, drawings in the following description are only this hair
Some bright embodiments, for those of ordinary skill in the art, on the premise of not paying creative work, can be with root
Other accompanying drawings are obtained according to these accompanying drawings.
Fig. 1 is a kind of flow of the embodiment for the test that disk array provided by the invention and compatible mainframe are adapted to
Figure；
Fig. 2 is a kind of embodiment flow of link test provided by the invention；
Fig. 3 is a kind of flow chart of embodiment of controller failure testing provided by the invention；
Fig. 4 is a kind of flow chart of embodiment of bandwidth test provided by the invention；
Fig. 5 is the flow for another embodiment of test that disk array provided by the invention and compatible mainframe are adapted to
Figure；
Fig. 6 is the structured flowchart for the test device that disk array provided in an embodiment of the present invention and compatible mainframe are adapted to.
Embodiment
In order that those skilled in the art more fully understand the present invention program, with reference to the accompanying drawings and detailed description
The present invention is described in further detail.Obviously, described embodiment is only part of the embodiment of the present invention, rather than
Whole embodiments.Based on the embodiment in the present invention, those of ordinary skill in the art are not making creative work premise
Lower obtained every other embodiment, belongs to the scope of protection of the invention.
A kind of flow chart of embodiment of the test of disk array and compatible mainframe adaptation provided by the invention, such as
Shown in Fig. 1, this method can include：
Step S101：Pass through the multiple LUN of HBA card port scanning recognitions.
Specifically, the LUN is the memory space created in equipment under test, the equipment under test is mapped by multipath
For LUN to host side, the equipment under test is disk array.
It should be noted that only one can be mapped or by multiple LUN to host side by a paths, to then
It is no to map LUN for multipath, the operation of subsequent step is had no effect on, but use multipath to map multiple LUN, and to equipment
One of multipath function test, if the mapping of certain paths is unsuccessful, illustrate to test not by without subsequently being surveyed
Examination.Certainly, this is not essential features of the invention, because in subsequent step, it is also desirable to pass through multi-path transmission number
According to, if multipath function has problem, can similarly be tested, but by mapping LUN test multipath functions, energy
Enough performances for determining multipath function faster, improve testing efficiency, so this is a kind of relatively preferred embodiment.
Step S102：File system mounted catalogue is arrived to the LUN establishment files system, and by described.
Specifically, file system can be the file system of EXT3, EXT4 and other forms.
Step S103：Test is written and read to the catalogue of carry, checks operating system daily record and storage daily record.
To LUN create it is file system mounted under catalogue, catalogue is written and read namely to carry in catalogue hereafter
Part system is written and read, that is, the LUN of main frame is mapped to disk array and is written and read.
Step S104：Judge that the operating system daily record and the storage daily record report an error with the presence or absence of abnormal, if it is,
Test is by the way that test terminates, if not, into step S105.
Broken down if existed during read-write, it is related to that can be found in storage daily record in operating system daily record
Exception report an error, so as to obtain test result.
Step S105：Mount directory is carried out using iozone instruments to continue read-write operation, when read-write operation continues
Between reach the first preset time.
Specifically, the first preset time is usually set to random time between 3 days or so or 2 to 4 days, mainly
It is the test in order to be read and write for a long time to equipment under test, if test is surveyed by read-write of the explanation in long-time high intensity
Under examination, main frame and equipment under test can keep relatively good stability.
It should be noted that step S103 is the test of a basic read-write capability, and step S105 be then long lasting for
Readwrite tests, if without step S103, directly test, which carries out step S105, can also realize technical scheme, but
That the step S105 testing times are longer, and if step S103 test not by, then need not carry out step S105 test, and
The step S103 test consuming time can be ignored relative to step S105, so first carrying out step S103 test, be
A kind of relatively preferred embodiment of the present invention, testing efficiency can be improved, but this is not that the necessary technology of the present invention is special
Sign.
Step S106：Check that the operating system daily record and iozone daily records report an error with the presence or absence of abnormal, obtain test knot
Fruit.
The present invention first carries out LUN addition, identification and the test of multipath function to host side and equipment under test, can be with
Determine normally connect between host side and equipment under test, test is written and read further through the catalogue to carry, can be right
Basic read-write capability between host side and equipment under test is tested, further continuation read-write capability is tested from
And determine the stability of equipment.By the test to host side and equipment under test various aspects, complete comprehensive to equipment
Detection, and whole test process is not limited the model of disk array, so, method of testing of the invention has versatility,
It ensure that in the main frame and disk array application that test passes through that there is higher stability.
In addition, present invention is mainly applied to the survey of day shuttle K1 main frames and the compatible adaptation of the disk array of various different models
Examination, follow-up other embodiment are also mainly used in identical application scenarios.
Based on above-described embodiment, it is contemplated that there is multipath between host side and equipment under test, can be with during read-write
A few link transmission datas, or all link simultaneous transmission data are selected, when the link for wherein transmitting data is unexpected
During disconnection, important performance that the needs of the conversion of data transmission state and the compatible adaptation of host side and disk array consider it
One.In the above-described embodiments, when the operating system daily record and the iozone daily records are in the presence of abnormal report an error, it is believed that test
Not by being reported an error if there is no abnormal, the present invention can be improved further.
Therefore, in a kind of specific embodiment of the invention, do not deposited in the operating system daily record and the iozone daily records
On the basis of reporting an error extremely, as shown in Fig. 2 Fig. 2 is a kind of embodiment flow of link test provided by the invention
Figure, this method can include：
Step S201：LVM equipment is created to the LUN.
Step S202：If creating the LVM equipment success, behaviour is written and read to the LVM equipment using Fio instruments
Make.
Set it should be noted that being written and read test to disk array using Fio instruments and it is not absolutely required to establishment LVM
Standby, can LVM equipment is created in the present invention be successfully tested to create LVM to equipment under test, if host side and magnetic
The performance of the compatible adaptation of disk array is bad, when creating LVM, is then likely to occur the situation of disk array explosion, therefore, creates LVM
A test of the equipment also for the performance to equipment under test.In addition, the equipment created is also not necessarily LVM equipment, may be used also
To be the similar devices such as PV, VG.
Step S203：A link in multilink between the host side and the equipment under test is chosen, is made described
Link is in chain state, and falls chain state described in holding in the second preset time.
It should be noted that when normally performing read-write operation between host side and disk array, main frame can be set
Hold between disk array certain one or more or all link simultaneous transmission data, but once during read-write just
Disconnected suddenly in a certain bar link of transmission data and be in chain state, system can be automatically by the link by disconnecting suddenly originally
The data of transmission are converted to link that other do not disconnect to transmit, and the speed of this transfer process, and main frame and disk battle array
One of important performance for compatible adaptation between row.
Specifically, it is to be defaulted as between host side and disk array each of the links all in common transport number in step S203
During according to, link test, choose a wherein link and tested, certainly this be not the present invention unique scheme, may be used also
To be to set a certain bar or multilink transmission read-write data, as long as what is wherein disconnected in test is to transmit read-write data
Link.
In addition, it is manually to pull out link certain link is in the relatively simple embodiment of chain state, still
Using other modes link can also be made to be in chain state, it is numerous to list herein.
Step S204：Flowed by the IO that iostat is checked between the host side and the equipment under test from interrupting to recovering
Whether the time of amount is more than the first default recovery time, if it is, falling chain state verification not by the way that test stops, if not, falling
Chain state verification is by into step S205.
It should be noted that when carrying out the test of chain state, the foundation for judging test is exactly main frame and disk array
Between the more long compatible adaptation of then explanation of time spent by IO flows total from interrupting to recovering performance it is poorer, conversely, when expending
Between it is shorter, illustrate that performance is better.
Step S205：By in it is described fall chain state the link-recovery connect.
Step S206：Whether the i/o traffic for the link for judging to recover connection within the second default recovery time is recovered just
Often.
Need what is illustrated, link is from falling chain state to link-recovery state, originally between host side and disk array
Data transfer can be automatically converted to the link transmission data set originally, and recover after disconnecting the i/o traffic of the link of connection from
One of the flow value for recovering original is interrupted, and judge the performance standard of compatible adaptation.
In order to further determine that whether the performance of the compatible adaptation of host side and equipment under test end is good, it is necessary to every chain
Road all enters line link and falls chain test and link-recovery test, so in above-described embodiment, if link-recovery test not by,
Test stops, if link-recovery test passes through, may further include：
Step S207：Judge whether each of the links is carried out completion and falls chain state verification and link-recovery test, if it is,
Into step S208, if it is not, then into step 204.
Step S208：Link test between host side and equipment under test end passes through.
It should be noted that for link test, it is not absolutely required to all turn off each of the links, recover test,
Can also be the test that a link for selecting host side and equipment under test end respectively to select turned off, recovered link respectively, such as
Fruit test is but more comprehensively preferred all by it is also assumed that multilink function is good between host side and equipment under test
Method of testing be all to be tested each of the links, so this is only the chain at test main frame end and equipment under test end of the present invention
A kind of embodiment of line state, it is not unique embodiment of the present invention.
Based on above-described embodiment, it is contemplated that the disk array as equipment under test is dual controller equipment, if wherein certain
One controller catastrophic failure, it is necessary to which another controller performs related operation, and rapid translating controller performs correlation
Operation, and one of important performance for compatible adaptation between host side and disk array.Therefore, in chain drive test in the present invention
On the basis of pinging, the test that the controller of disk array fails can also be included.
The flow chart of a kind of embodiment of controller failure testing provided by the invention, as shown in figure 3, can wrap
Include：
Step S301：Operation is written and read to LVM equipment using the Fio instruments；
Specifically, can not be Fio instruments to the readwrite tests of LVM equipment, can also be dd instruments or other can be with
The equipment of test is written and read to equipment under test.
Step S302：A controller in two controllers in the equipment under test is controlled to be in failure state；
Step S303：Judge whether times of the IO from interrupting recovery between the host side and the equipment under test surpasses
The 3rd preset time is crossed, if it is, test is by the way that test terminates, if not, into step S304；
Specific 3rd preset time is typically at 15 minutes or so, it is of course also possible to be other time spans, Ke Yigen
Set according to needs of the equipment in concrete application scene.
Step S304：Recovery controller is in normal condition；
Step S305：Another controller in two controllers in the equipment under test is controlled to be in failure state；
Step S306：Judge whether times of the IO from interrupting recovery between the host side and the equipment under test surpasses
The 3rd preset time is crossed, if it is, test is by the way that test terminates, if it is not, then test passes through, test terminates.
Based on above-described embodiment, in order to ensure the read-write capability between host side and equipment under test end, detected in host side
To after the LUN of equipment under test mapping, before LVM equipment is created to LUN, bandwidth test first can be carried out to equipment under test.
The flow chart of a kind of embodiment of bandwidth test provided by the invention, as shown in figure 4, can include：
Step S401：The LUN is created into raw device.
Step S402：Operation is written and read to the raw device using the Fio instruments.
Specifically, it can also be tested using other Reading and writing instruments, in addition, raw device refers to create other equipment
LUN.
Step S403：Record readwrite bandwidth.
Step S404：Judge whether the readwrite bandwidth reaches pre-set bandwidths, if it is, test is not by test knot
Beam, if it is not, then bandwidth test passes through.
It should be noted that bandwidth test is a survey to reading and writing the speed of data between host side and equipment under test
Examination, if set without above-mentioned survey, in other readwrite tests also can embody read-write data speed performance, but
Ensure to be tested in the state of read or write speed is good, it is possible to increase the percent of pass of follow-up test, improve testing efficiency.
Based on above-described embodiment, it can be selected according to the practical application of host side and the disk array of adaptation in the present invention
In certain it is several tested, but be to be carried out various tests one time than more preferably scheme, if the whole energy of all tests
Enough pass through, can more judge that compatible adaptation has good performance, this hair between host side and equipment under test comprehensively and accurately
The flow chart of another embodiment of test of disk array and the compatible mainframe adaptation of bright offer is as shown in figure 5, this method
Including：
Step S501：Pass through the multiple LUN of HBA card port scanning recognitions.
Step S502：The LUN is created into raw device, behaviour is written and read to the raw device using the Fio instruments
Make.
Step S503：Readwrite bandwidth is recorded, judges whether the readwrite bandwidth reaches pre-set bandwidths, if it is, test
Not by the way that test terminates, if not, into step S504.
Step S504：File system mounted survey is written and read to the LUN establishment files system, and to described to catalogue
Examination.
Step S505：Judge that operating system daily record and storage daily record report an error with the presence or absence of abnormal, if it is, test is obstructed
Cross, test terminates, if it is not, then into step S506.
Step S506：Catalogue is carried out using iozone instruments to continue read-write operation, reached until the read-write operation duration
To the first preset time.
Step S507：Judge that operating system daily record and iozone daily records report an error with the presence or absence of abnormal, if it is, test is not
By the way that test terminates, if not, into step S508.
Step S508：The LVM equipment is created, link test is carried out to the link between host side and equipment under test end,
Judgement is tested whether by if it is not, then test terminates, if it is, into step S509.
Step S509：Device failure is controlled to the dual controller of equipment under test；
Step S510：Judgement is tested whether by the way that if it is, test passes through, test terminates if it is not, then test is obstructed
Cross, test terminates.
It should be noted that for lasting readwrite tests, link test and control between main equipment and disk array
The testing sequence of device failure testing does not have inevitable sequencing.
The test device being adapted to below to disk array provided in an embodiment of the present invention and compatible mainframe is introduced, hereafter
The survey that the test device of disk array and the compatible mainframe adaptation of description is adapted to above-described disk array and compatible mainframe
Method for testing can be mutually to should refer to.
Fig. 6 is the structured flowchart for the test device that disk array provided in an embodiment of the present invention and compatible mainframe are adapted to, and is joined
The test device being adapted to according to Fig. 6 disk arrays and compatible mainframe can include：
Scan module 100, for by the HBA multiple LUN of card port scanning recognition, wherein, the LUN is in equipment under test
The memory space of establishment, the equipment under test map LUN to host side by multipath, and the equipment under test is disk array；
Creation module 200, file system mounted catalogue is arrived for the LUN establishment files system, and by described；
Test module 300, test is written and read to the catalogue of carry, checks operating system daily record and storage daily record；
Judge that the operating system daily record and the storage daily record report an error with the presence or absence of abnormal, if it is not, then using iozone instruments pair
Mount directory carries out continuing read-write operation, reaches the first preset time until the read-write operation duration；Check the operation system
System daily record and iozone daily records report an error with the presence or absence of abnormal, obtain test result.
Preferably, the test module 300 includes：
First test cell, reported an error if exception is not present for the operating system daily record and the iozone daily records,
LVM equipment then is being created to the LUN；If creating the LVM equipment success, the LVM equipment is entered using Fio instruments
Row read-write operation, wherein, the Fio instruments are IO pressure test instruments；
Second test cell, for choosing a chain between the host side and the equipment under test in multilink
Road, the link is in chain state, and fall chain state described in holding in the second preset time；Institute is checked by iostat
Whether the time for stating IO flows from interrupting to recovering between host side and the equipment under test presets recovery time more than first,
If it is not, then fall chain state verification by, and by it is described fall chain state the link-recovery connect；Judge pre- second
If whether the i/o traffic for recovering the link of connection in recovery time recovers normal, if it is, the link-recovery is tested
Pass through.
Preferably, second test cell is additionally operable to：
After link-recovery test passes through, repeat more between the selection host side and the equipment under test
A link in bar link, and disconnecting link makes the link be in the operation of chain state, until the host side and institute
State each of the links between equipment under test be carried out completion fall chain state verification and link-recovery test.
The test module 300 includes：
3rd test cell, if for link every described fall chain state verification and link-recovery test all by,
Operation is written and read to LVM equipment using the Fio instruments；One in two controllers in the equipment under test is controlled to control
Device processed is in failure state, judges whether times of the IO from interrupting recovery between the host side and the equipment under test surpasses
The 3rd preset time is crossed, if not, recovery controller is in normal condition；Control in two controllers in the equipment under test
Another controller be in failure state, judge IO between the host side and the equipment under test from interrupting recovery
Time whether more than the 3rd preset time, obtains controller failure test result.
As a kind of embodiment, the test device of disk array and compatible mainframe adaptation provided by the present invention is also
It may further include：
The test module 300 also includes：
4th test cell, for after by the multiple LUN of HBA card port scanning recognitions, the LUN to be created into naked
Equipment, operation is written and read to the raw device using the Fio instruments；Readwrite bandwidth is recorded, judges that the readwrite bandwidth is
It is no to reach pre-set bandwidths, if it is, the establishment that file system is carried out to the LUN is performed, and will be described file system mounted
To the operation of catalogue.
The test device of disk array and the compatible mainframe adaptation of the present embodiment is used to realize foregoing disk array and master
The method of testing of the compatible adaptation of machine, therefore the embodiment in the test device of disk array and compatible mainframe adaptation is visible
Disk array hereinbefore and the embodiment part of the method for testing of compatible mainframe adaptation, for example, scan module 100, for reality
Step S101 in the method for testing of existing above-mentioned disk array and compatible mainframe adaptation, creation module 200, for realizing method of testing
Middle step S102, test module 300, it is respectively used to realize step in the method for testing of above-mentioned disk array and compatible mainframe adaptation
S103, S104, S105 and S106, so, its embodiment is referred to the description of corresponding various pieces embodiment,
This is repeated no more.
Each embodiment is described by the way of progressive in this specification, what each embodiment stressed be with it is other
The difference of embodiment, between each embodiment same or similar part mutually referring to.For dress disclosed in embodiment
For putting, because it is corresponded to the method disclosed in Example, so description is fairly simple, related part is referring to method part
Explanation.
Professional further appreciates that, with reference to the unit of each example of the embodiments described herein description
And algorithm steps, can be realized with electronic hardware, computer software or the combination of the two, in order to clearly demonstrate hardware and
The interchangeability of software, the composition and step of each example are generally described according to function in the above description.These
Function is performed with hardware or software mode actually, application-specific and design constraint depending on technical scheme.Specialty
Technical staff can realize described function using distinct methods to each specific application, but this realization should not
Think beyond the scope of this invention.
Directly it can be held with reference to the step of method or algorithm that the embodiments described herein describes with hardware, processor
Capable software module, or the two combination are implemented.Software module can be placed in random access memory (RAM), internal memory, read-only deposit
Reservoir (ROM), electrically programmable ROM, electrically erasable ROM, register, hard disk, moveable magnetic disc, CD-ROM or technology
In any other form of storage medium well known in field.
The method of testing and device being adapted to above to disk array provided by the present invention and compatible mainframe have been carried out in detail
It is thin to introduce.Specific case used herein is set forth to the principle and embodiment of the present invention, and above example is said
It is bright to be only intended to help the method and its core concept for understanding the present invention.It should be pointed out that the ordinary skill for the art
For personnel, under the premise without departing from the principles of the invention, some improvement and modification, these improvement can also be carried out to the present invention
Also fallen into modification in the protection domain of the claims in the present invention.
Claims (10)
- A kind of 1. method of testing of disk array and compatible mainframe adaptation, it is characterised in that including：By the HBA multiple LUN of card port scanning recognition, wherein, the LUN is the memory space created in equipment under test, described Equipment under test maps LUN to host side by multipath, and the equipment under test is disk array；File system mounted catalogue is arrived to the LUN establishment files system, and by described；Test is written and read to the catalogue of carry, checks operating system daily record and storage daily record；Judge that the operating system daily record and the storage daily record report an error with the presence or absence of abnormal, if it is not, then using iozone works Tool carries out continuing read-write operation to mount directory, reaches the first preset time until the read-write operation duration；Check that the operating system daily record and iozone daily records report an error with the presence or absence of abnormal, obtain test result.
- 2. method of testing according to claim 1, it is characterised in that described to check operating system daily record and iozone daily records With the presence or absence of exception, obtaining test result includes：If the operating system daily record and the iozone daily records are not present exception and reported an error, LVM is created to the LUN and set It is standby；If creating the LVM equipment success, operation is written and read to the LVM equipment using Fio instruments, wherein, it is described Fio instruments are IO pressure test instruments；A link in multilink between the host side and the equipment under test is chosen, the link is in chain State, and fall chain state described in holding in the second preset time；By time of the IO that iostat is checked between the host side and equipment under test flows to recovering from interrupting whether More than the first default recovery time, if it is not, then fall chain state verification by, and by it is described fall chain state the link Recover connection；Whether the i/o traffic for the link for judging to recover connection within the second default recovery time recovers normal, if it is, The link-recovery test passes through.
- 3. method of testing according to claim 2, it is characterised in that also wrapped after in link-recovery test Include：A link in multilink between the selection host side and the equipment under test is repeated, is made at the link In the operation for falling chain state, fall chain state until each of the links between the host side and the equipment under test is carried out completion Test and link-recovery test.
- 4. method of testing according to claim 3, it is characterised in that every between the host side and the equipment under test Bar link be carried out completion fall chain state verification and link-recovery test include：If every link falls chain state verification and link-recovery test all by being set using the Fio instruments to LVM It is standby to be written and read operation；Control a controller in two controllers in the equipment under test to be in failure state, judge the host side and The time of IO between the equipment under test from interrupting recovery whether more than the 3rd preset time, if not, recovery controller In normal condition；Control another controller in two controllers in the equipment under test to be in failure state, judge the host side Whether times of the IO from interrupting recovery between the equipment under test more than the 3rd preset time, obtains controller failure and surveys Test result.
- 5. method of testing according to claim 4, it is characterised in that by the multiple LUN of HBA card port scanning recognitions it Also include afterwards：The LUN is created into raw device, operation is written and read to the raw device using the Fio instruments；Readwrite bandwidth is recorded, judges whether the readwrite bandwidth reaches pre-set bandwidths, the LUN is carried out if it is, performing The establishment of file system, and by the file system mounted operation to catalogue.
- A kind of 6. test device of disk array and compatible mainframe adaptation, it is characterised in that including：Scan module, for by the HBA multiple LUN of card port scanning recognition, wherein, the LUN is to be created in equipment under test Memory space, the equipment under test map LUN to host side by multipath, and the equipment under test is disk array；Creation module, file system mounted catalogue is arrived for the LUN establishment files system, and by described；Test module, test is written and read to the catalogue of carry, checks operating system daily record and storage daily record；Described in judgement Operating system daily record and the storage daily record report an error with the presence or absence of abnormal, if it is not, then using iozone instruments to mount directory Carry out continuing read-write operation, reach the first preset time until the read-write operation duration；Check the operating system daily record and Iozone daily records report an error with the presence or absence of abnormal, obtain test result.
- 7. test device according to claim 6, it is characterised in that the test module includes：First test cell, reported an error if exception is not present for the operating system daily record and the iozone daily records, it is right The LUN creates LVM equipment；If creating the LVM equipment success, the LVM equipment is written and read using Fio instruments Operation, wherein, the Fio instruments are IO pressure test instruments；Second test cell, for choosing a link between the host side and the equipment under test in multilink, make The link is in chain state, and falls chain state described in holding in the second preset time；The master is checked by iostat Whether the time of IO flows from interrupting to recovering between generator terminal and the equipment under test presets recovery time more than first, if It is no, then fall chain state verification by, and by it is described fall chain state the link-recovery connect；Judge default extensive second Whether the i/o traffic for the link for recovering connection in the multiple time recovers normal, if it is, link-recovery test passes through.
- 8. test device according to claim 7, it is characterised in that second test cell is additionally operable to：After link-recovery test passes through, repeat and choose a plurality of chain between the host side and the equipment under test A link in road, and disconnecting link makes the link be in the operation of chain state, until the host side and the quilt Each of the links between measurement equipment is carried out completion and falls chain state verification and link-recovery test.
- 9. test device according to claim 8, it is characterised in that the test module also includes：3rd test cell, if falling chain state verification and link-recovery test all by using for link every described The Fio instruments are written and read operation to LVM equipment；Control a controller in two controllers in the equipment under test In failure state, judge times of the IO from interrupting recovery between the host side and the equipment under test whether more than the Three preset times, if not, recovery controller is in normal condition；Control another in two controllers in the equipment under test One controller is in failure state, judges times of the IO between the host side and the equipment under test from interruption to recovery Whether more than the 3rd preset time, controller failure test result is obtained.
- 10. test device according to claim 9, it is characterised in that the test module also includes：4th test cell, for after by the multiple LUN of HBA card port scanning recognitions, the LUN being created into naked and set It is standby, operation is written and read to the raw device using the Fio instruments；Readwrite bandwidth is recorded, whether judges the readwrite bandwidth Reach pre-set bandwidths, if it is, performing the establishment that file system is carried out to the LUN, and file system mounted arrived described The operation of catalogue.
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| CN107423185B (en) | 2021-07-16 |
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