CN109458899B - Method for rapidly judging marking line width - Google Patents
Method for rapidly judging marking line width Download PDFInfo
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- CN109458899B CN109458899B CN201811200135.7A CN201811200135A CN109458899B CN 109458899 B CN109458899 B CN 109458899B CN 201811200135 A CN201811200135 A CN 201811200135A CN 109458899 B CN109458899 B CN 109458899B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
- G01B5/02—Measuring arrangements characterised by the use of mechanical techniques for measuring length, width or thickness
Abstract
The invention relates to the field of laser marking, in particular to a method for rapidly judging marking line width. After the laser marking machine marks the mark, the interval in the middle of two parallel lines on the test paper just is by the pair of group of cutting off, forms the sharp of a twice width, and is more directly perceived than traditional measuring method, and misoperation still less. By observing the line groups in each measuring module on the test paper, the line width value can be directly read, and the method is very efficient and accurate. Even if the laser power and the marking speed are different, the pair of line groups with the middle intervals cut through can be found in the standard measurement pattern, and the compatibility is high. And the test paper needed by the test is cheap and common, thereby greatly reducing the cost of measurement hardware.
Description
Technical Field
The invention relates to the field of laser marking, in particular to a method for rapidly judging marking line width.
Background
In the field of CO2 laser marking, the focused laser has the thinnest beam diameter (with the largest energy density) at the focus, and generally needs to be cut or marked at the focus, which is effectively expressed as the marking line width of the machine. The method is an important parameter for measuring the performance quality and the process debugging level of a laser marking machine. The factors capable of influencing the marking line width mainly have two aspects, one is the actual design assembly level of equipment, and the other is user's technology debugging ability, and these two factors are all very big to the marking line width influence.
The traditional measurement marking line width is generally tested by means such as a microscope and a quadratic element, the line width boundary of laser marking is not clear, the boundary is not necessarily a regular straight line, and in addition, the line width difference marked by different powers or the same power and different speeds is also large, so that the traditional test standard is difficult to unify, and the test efficiency is low.
Disclosure of Invention
The invention aims to solve the technical problem of providing a method for intuitively and efficiently and quickly judging the width of a marking line aiming at the defects in the prior art.
The technical scheme adopted by the invention for solving the technical problems is as follows: the method for rapidly judging the width of the marking line comprises the following steps:
s1: calibrating the error of the laser marking machine in the range of A x B;
s2: horizontally placing the test paper in the middle of the marking range, and opening vacuum to suck the test paper flat;
s3: leading the standard measurement graph into marking software and centering; the standard measurement pattern comprises at least one measurement module; the measuring module comprises N lines and Q lines; each line group comprises two parallel lines which are mutually spaced;
s4: adjusting parameters of the laser marking machine until the test paper is just punched;
s5: marking the standard measurement graph by using a laser marking machine; when the laser marks along the two parallel lines, the two marking tracks just cut through the test paper between the two parallel lines, and the marked line width value is the distance value between the two parallel lines.
Further preferred embodiments of the present invention are: the linewidth value is H (q.n), H (q.n) ═ a + (q-1) × 0.1+ (n-1) × 0.02; wherein a is a spacing value between two parallel lines of the line group of the first row and the first column; when the two marking tracks just cut through the test paper between the two parallel lines, the line groups where the two parallel lines are located are the nth row and the Q column in the measuring module, wherein N is more than 0 and less than or equal to N, and Q is more than 0 and less than or equal to Q.
Further preferred embodiments of the present invention are: a is 0.1; the number of rows N is 5; column number Q is 7.
Further preferred embodiments of the present invention are: the standard measurement graph is provided with four groups of measurement modules; the four groups of measuring modules are respectively distributed in the directions of 0 degree, 45 degrees, 90 degrees and 135 degrees.
Further preferred embodiments of the present invention are: the standard measurement pattern further comprises an outer frame for size calibration; the area of the outer frame is S, S is C and D, C is less than or equal to A, and D is less than or equal to B; the measuring module is positioned in the outer frame; after marking a standard measurement graph, checking whether the size of the outer frame is matched with the design size, and if so, reading the line width value H (q.n) of the pair of line groups of which the interval between the two parallel lines on the test paper is just cut off; if not, the process returns to step S1 to debug the device again.
Further preferred embodiments of the present invention are: the A is 100; b is 100; c is 100; d-70.
Further preferred embodiments of the present invention are: the standard measurement graph further comprises a label for displaying the number of columns; the labels are arranged in the outer frame and are positioned below the corresponding line groups in the first row.
Further preferred embodiments of the present invention are: the test paper is office copy paper.
The invention has the advantages that after the marking of the laser marking machine, the pair of line groups with the interval between the two parallel lines just cut off on the test paper form a straight line with the width twice, and compared with the traditional measuring mode, the invention is more visual and has less misoperation. By observing the line groups in each measuring module on the test paper, the line width value can be directly read, and the method is very efficient and accurate. Even if the laser power and the marking speed are different, the pair of line groups with the middle intervals cut through can be found in the standard measurement pattern, and the compatibility is high. And the test paper needed by the test is cheap and common, thereby greatly reducing the cost of measurement hardware.
Drawings
The invention will be further described with reference to the accompanying drawings and examples, in which:
FIG. 1 is a schematic illustration of a standard measurement profile of an embodiment of the present invention.
Detailed Description
The preferred embodiments of the present invention will now be described in detail with reference to the accompanying drawings.
In order to solve the above defects, the present invention provides a method for rapidly determining a marking line width, comprising the following steps:
s1: calibrating the laser marking machine at A × B (mm)2) An error within a range;
s2: placing a test paper (not shown) flat in the middle of the marking range, and opening a vacuum to suck the test paper flat;
s3: leading the standard measurement graph into marking software and centering; the standard measurement pattern comprises at least one measurement module; the measuring module comprises N lines and Q lines; each line group comprises two parallel lines which are mutually spaced;
s4: adjusting the parameters of the laser marking machine (not shown) until the test paper is just punched;
s5: marking the standard measurement graph by using a laser marking machine; when the laser marks along the two parallel lines, the two marking tracks just cut through the test paper between the two parallel lines, and the marked line width value is the distance value between the two parallel lines.
As shown in figure 1, laser marking has the linewidth on test paper, can see two lines behind the two parallel lines of mark, but if the actual distance of two lines just equals when marking the linewidth, then only can see a 2 times wide straight line on test paper, it is more directly perceived relatively traditional measuring mode to the measuring is surveyed the marking line that awaits measuring and has become thick, and the error that causes during the measurement has also been still less. In this embodiment, the laser marking machine used is a CO2 laser marking machine, the relevant parameters of which are adjustable, and the marking positioning accuracy is higher than 0.02 mm. The used test paper is common office copy paper, is very cheap and common, and greatly reduces the measurement cost. The technological parameters of the laser marking machine are adjusted, the power is based on the standard of just punching office copy paper, and the judging method of just punching is to observe whether a place which is not cut through exists on the marking line.
The test range is designed according to actual needs, and the measurement range of the embodiment is 0.10-0.78 mm. The measurement module is designed as 7 columns, 5 rows.
Specifically, the line width value is H (q.n), H (q.n) ═ a + (q-1) × 0.1+ (n-1) × 0.02. Where a is the spacing value between two parallel lines of the line group in the first row and the first column and is a fixed value, in this example, a is 0.10. 0.1 in the formula represents the difference of the spacing between two adjacent horizontal line groups, so the spacing between two parallel lines in each line group in the first row is as follows from left to right: 0.10mm, 0.20mm, 0.30mm, 0.40mm, 0.50mm, 0.60mm, 0.70 mm; 0.02 in the formula represents the difference between the pitches of two longitudinally adjacent line groups, so that in the line groups in the same column, relative to the first line group, the other line groups are respectively increased by 0.02mm, 0.04mm, 0.06mm and 0.08mm from bottom to top, and therefore, the pitches between two parallel lines in each line group in the first column are sequentially from bottom to top: 0.10mm, 0.12mm, 0.14mm, 0.16mm, 0.18 mm. In practical application, the difference between the distances between two adjacent line groups in the transverse direction and the longitudinal direction can be changed to be larger or smaller according to the measurement range and the precision requirement. When the two marking tracks just cut through the test paper between the two parallel lines, the line groups where the two parallel lines are located are the nth row and the q column in the measuring module, n and q are integers, n is more than 0 and less than or equal to 5, and q is more than 0 and less than or equal to 7. For example, the line width value H (4.2) of the line group located at row 2, column 4 is 0.10+ (4-1) × 0.1+ (2-1) × 0.02 is 0.42mm, the line width value H (7.3) of the line group located at column 3, column 7 is 0.10+ (7-1) × 0.1+ (3-1) × 0.02 is 0.74mm, and so on, which are not listed here. The coordinate position of the line group which is just cut through at the interval between the two parallel lines in the measuring module is found out, so that the marking line width value can be directly calculated and read, and the method is very efficient and accurate. Even if the laser power and the marking speed are different, the marking line width value can be calculated as long as the marking line width value is within the measuring range of the standard measuring graph, and the compatibility is very high.
Since the line widths of the laser marks may not be consistent in different directions, in order to reduce errors, the standard measurement pattern in this embodiment is provided with four sets of measurement modules respectively distributed in directions of 0 °, 45 °, 90 °, and 135 °, and each measurement module includes 5 rows and 7 columns of line groups. As a matter of course, in practical application, each measuring module can be rotated by any angle to perform marking measurement.
Taking the line width measured by a certain CO2 laser marking machine at the center of the 450mm focal length range as an example, after the same marking machine marks the standard measurement pattern, the measurement results of the four groups of measurement modules are as follows:
h (3.3) ═ 0.34mm of 0-degree line width; h (3.2) ═ 0.32mm in line width at 45 ℃;
h (3.2) ═ 0.32mm in the line width of 90 degrees; h (3.3) ═ 0.34mm in line width at 135 degrees;
thus, the line width values measured at this parameter are between 0.32mm and 0.34 mm. Particularly, when the focus needs to be accurately found, the method can also provide an accurate debugging reference for debugging personnel.
The result of actually measuring the marking line width for different equipment for multiple times is between 0.30mm and 0.36mm, and the result belongs to the normal range. If the distance is larger than 0.36mm, the effect of the equipment is poor, the equipment can be judged to be unqualified, and whether the equipment is debugged or not is checked, even the equipment fails. The method establishes one measurement standard, and greatly facilitates the comparison test of the performance difference between different devices.
Further, the standard measurement pattern further comprises an outer frame for size calibration; the outer frame is positioned in the A and B calibration range, the area of the outer frame is S, S and C are equal to or less than D, C is equal to or less than A, and D is equal to or less than B; the measuring modules are all positioned in the outer frame. After the standard measurement graph is led in and the parameters of the marking machine are adjusted, a ruler can be used for checking whether the size of the outer frame is matched with the design size after the standard measurement graph is marked. Because the sizes of the outer frames printed by each marking device are slightly different, the sizes need to be corrected in advance, and the actual values of the distances between the parallel lines of each line group in the marking device are ensured to be consistent with the design. If the two parallel lines are matched, reading the line width value H (q.n) of the pair of line groups with the interval between the two parallel lines just cut off on the test paper; if not, the process returns to step S1 to debug the device again. In this embodiment, the value of A, B, C, D is not fixed and may be changed according to the size of the design drawing, similarly, a is 100mm, B is 100mm, C is 100mm, and D is 70 mm.
Preferably, in order to facilitate reading the coordinate position of the line group, the standard measurement graph is further provided with a label; the labels are arranged in the outer frame and are positioned below the corresponding line groups in the first row. In order to facilitate recording and sorting, marking time is further arranged at the upper right corner in the outer frame, and the marking time can be automatically changed and marked on the test paper according to actual time.
When designing a standard measurement pattern, the marking sequence is required to be based on the minimum influence on the deformation of paper, and typical applications include marking each line group first, then marking a mark and an outer frame. When the parameters of the laser marking machine are debugged, the Q frequency of laser emergent light is large enough to be matched with the marking speed, the marking is required to be continuous lines instead of dotted lines consisting of points, and the on-off delay of the laser is also required to be set, so that no key points exist between the starting pen and the last pen of the marking of each line, namely, the interval breakpoints cannot be positioned at two ends every time. When marking each line group, the laser is required to just punch through the test paper, and the energy is required to be as small as possible and the test paper can not be cut through when marking the label and the outer frame.
It should be understood that the above embodiments are only used for illustrating the technical solutions of the present invention, and not for limiting the same, and those skilled in the art can modify the technical solutions described in the above embodiments, or make equivalent substitutions for some technical features; and all such modifications and alterations are intended to fall within the scope of the appended claims.
Claims (8)
1. A method for rapidly judging the width of a marking line comprises the following steps:
s1: calibrating the laser marking machine at A Bmm2An error within a range;
s2: horizontally placing the test paper in the middle of the marking range, and opening vacuum to suck the test paper flat;
s3: leading the standard measurement graph into marking software and centering; the standard measurement pattern comprises at least one measurement module; the measuring module comprises N lines and Q lines; each line group comprises two parallel lines which are mutually spaced;
s4: adjusting parameters of the laser marking machine until the test paper is just punched;
s5: marking the standard measurement graph by using a laser marking machine; when the laser marks along the two parallel lines, the two marking tracks just cut through the test paper between the two parallel lines, and the marked line width value is the distance value between the two parallel lines.
2. The method of rapidly determining a marking line width as claimed in claim 1, wherein: the linewidth value is H (q.n), H (q.n) ═ a + (q-1) × 0.1+ (n-1) × 0.02; wherein a is a spacing value between two parallel lines of the line group of the first row and the first column; when the two marking tracks just cut through the test paper between the two parallel lines, the line groups where the two parallel lines are located are the nth row and the Q column in the measuring module, wherein N is more than 0 and less than or equal to N, and Q is more than 0 and less than or equal to Q.
3. The method of rapidly determining a marking line width as claimed in claim 2, wherein: the a is 0.1 mm; the number of rows N is 5; column number Q is 7.
4. The method of rapidly determining a marking line width as claimed in claim 1, wherein: the standard measurement graph is provided with four groups of measurement modules; the four groups of measuring modules are respectively distributed in the directions of 0 degree, 45 degrees, 90 degrees and 135 degrees.
5. The method of rapidly determining a marking line width as claimed in claim 1, wherein: the standard measurement pattern further comprises an outer frame for size calibration; the area of the outer frame is S, S is C and D, C is less than or equal to A, and D is less than or equal to B; the measuring module is positioned in the outer frame; after marking a standard measurement graph, checking whether the size of the outer frame is matched with the design size, and if so, reading the line width value H (q.n) of the pair of line groups of which the interval between the two parallel lines on the test paper is just cut off; if not, the process returns to step S1 to debug the device again.
6. The method of rapidly determining a marking line width as claimed in claim 5, wherein: the A is 100 mm; b is 100 mm; c is 100 mm; d is 70 mm.
7. The method of rapidly determining a marking line width as claimed in claim 5, wherein: the standard measurement graph further comprises a label for displaying the number of columns; the labels are arranged in the outer frame and are positioned below the corresponding line groups in the first row.
8. The method of rapidly determining a marking line width as claimed in claim 1, wherein: the test paper is office copy paper.
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| Application Number | Priority Date | Filing Date | Title |
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| CN2018215527957 | 2018-09-21 | ||
| CN201821552795 | 2018-09-21 |
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| CN109458899A CN109458899A (en) | 2019-03-12 |
| CN109458899B true CN109458899B (en) | 2020-12-18 |
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Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6342407A (en) * | 1986-08-07 | 1988-02-23 | Matsushita Electric Ind Co Ltd | Measuring method for pattern line width |
| CN1541846A (en) * | 2003-04-28 | 2004-11-03 | ��ʿ��Ƭ��ʽ���� | Device and method for laser marking |
| JP2004333355A (en) * | 2003-05-09 | 2004-11-25 | Sumitomo Chem Co Ltd | Line width measuring method |
| CN1844846A (en) * | 2005-04-08 | 2006-10-11 | 株式会社日立国际电气 | Wire width measuring device |
| CN102628736A (en) * | 2012-04-20 | 2012-08-08 | 核工业理化工程研究院 | Laser linewidth measuring device |
| CN103389041A (en) * | 2013-07-30 | 2013-11-13 | 中节能太阳能科技（镇江）有限公司 | Method for measuring width of grating line |
| CN107883866A (en) * | 2016-09-30 | 2018-04-06 | 上海微电子装备（集团）股份有限公司 | A kind of optical measuring device and method |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9686428B2 (en) * | 2015-02-26 | 2017-06-20 | Konica Minolta, Inc. | Equipment to determine line width of check image and image-forming apparatus using the same |
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2018
- 2018-10-16 CN CN201811200135.7A patent/CN109458899B/en active Active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6342407A (en) * | 1986-08-07 | 1988-02-23 | Matsushita Electric Ind Co Ltd | Measuring method for pattern line width |
| CN1541846A (en) * | 2003-04-28 | 2004-11-03 | ��ʿ��Ƭ��ʽ���� | Device and method for laser marking |
| JP2004333355A (en) * | 2003-05-09 | 2004-11-25 | Sumitomo Chem Co Ltd | Line width measuring method |
| CN1844846A (en) * | 2005-04-08 | 2006-10-11 | 株式会社日立国际电气 | Wire width measuring device |
| CN102628736A (en) * | 2012-04-20 | 2012-08-08 | 核工业理化工程研究院 | Laser linewidth measuring device |
| CN103389041A (en) * | 2013-07-30 | 2013-11-13 | 中节能太阳能科技（镇江）有限公司 | Method for measuring width of grating line |
| CN107883866A (en) * | 2016-09-30 | 2018-04-06 | 上海微电子装备（集团）股份有限公司 | A kind of optical measuring device and method |
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